JP7219382B2 - ライン障害シグネチャ解析 - Google Patents

ライン障害シグネチャ解析 Download PDF

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JP7219382B2
JP7219382B2 JP2019532754A JP2019532754A JP7219382B2 JP 7219382 B2 JP7219382 B2 JP 7219382B2 JP 2019532754 A JP2019532754 A JP 2019532754A JP 2019532754 A JP2019532754 A JP 2019532754A JP 7219382 B2 JP7219382 B2 JP 7219382B2
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JP2020502522A (ja
JP2020502522A5 (enExample
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ユー ラジャゴパル プラサナ
エム スレーニヴァサ カリクッパ
ジー クンバシ アミット
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テキサス インスツルメンツ インコーポレイテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2513—Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2612—Circuits therefor for testing bipolar transistors for measuring frequency response characteristics, e.g. cut-off frequency thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
  • Locating Faults (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2019532754A 2016-12-16 2017-12-18 ライン障害シグネチャ解析 Active JP7219382B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662435621P 2016-12-16 2016-12-16
US62/435,621 2016-12-16
US15/844,235 US10401412B2 (en) 2016-12-16 2017-12-15 Line fault signature analysis
US15/844,235 2017-12-15
PCT/US2017/067030 WO2018112462A1 (en) 2016-12-16 2017-12-18 Line fault signature analysis

Publications (3)

Publication Number Publication Date
JP2020502522A JP2020502522A (ja) 2020-01-23
JP2020502522A5 JP2020502522A5 (enExample) 2021-01-28
JP7219382B2 true JP7219382B2 (ja) 2023-02-08

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JP2019532754A Active JP7219382B2 (ja) 2016-12-16 2017-12-18 ライン障害シグネチャ解析

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US (3) US10401412B2 (enExample)
EP (1) EP3555643A4 (enExample)
JP (1) JP7219382B2 (enExample)
CN (2) CN109923422B (enExample)
WO (1) WO2018112462A1 (enExample)

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US10382030B2 (en) * 2017-07-12 2019-08-13 Texas Instruments Incorporated Apparatus having process, voltage and temperature-independent line transient management
JP7217491B2 (ja) * 2018-06-12 2023-02-03 インフォメティス株式会社 計測システム
US10996728B2 (en) * 2019-01-04 2021-05-04 Sigmasense, Llc. Power supply signal conditioning system based on drive-sense circuit (DSC) processing
CN112444704B (zh) * 2019-08-28 2025-05-02 国网青海省电力公司海北供电公司 一种配电网行波故障定位方法及装置
JP7492859B2 (ja) * 2020-05-19 2024-05-30 株式会社日立製作所 電力系統制御装置および発電システム
CN112557816A (zh) * 2020-11-27 2021-03-26 广东电网有限责任公司肇庆供电局 一种配电线路故障检测和分析定位系统
DE102021204357B4 (de) * 2021-04-30 2024-02-15 Vitesco Technologies GmbH Verfahren und Vorrichtung zur Auswertung eines Signals

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Also Published As

Publication number Publication date
WO2018112462A1 (en) 2018-06-21
EP3555643A1 (en) 2019-10-23
EP3555643A4 (en) 2020-01-22
CN109923422B (zh) 2022-03-29
CN114563735A (zh) 2022-05-31
US10794963B2 (en) 2020-10-06
US20200150192A1 (en) 2020-05-14
US20190346499A1 (en) 2019-11-14
JP2020502522A (ja) 2020-01-23
US10401412B2 (en) 2019-09-03
US10564206B2 (en) 2020-02-18
CN109923422A (zh) 2019-06-21
US20180172750A1 (en) 2018-06-21

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