JP7144438B2 - 顕微鏡における高精度波長抽出用の位相板 - Google Patents

顕微鏡における高精度波長抽出用の位相板 Download PDF

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JP7144438B2
JP7144438B2 JP2019554390A JP2019554390A JP7144438B2 JP 7144438 B2 JP7144438 B2 JP 7144438B2 JP 2019554390 A JP2019554390 A JP 2019554390A JP 2019554390 A JP2019554390 A JP 2019554390A JP 7144438 B2 JP7144438 B2 JP 7144438B2
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phase plate
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wavelength
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JP2020515907A (ja
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ジェーソン マーティノー，
ジョーダン ガートン，
エリック ジョーゼンセン，
ティム アレン，
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ザ ユニバーシティ オブ ユタ リサーチ ファウンデイション
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
JP2019554390A 2017-04-04 2018-04-04 顕微鏡における高精度波長抽出用の位相板 Active JP7144438B2 (ja)

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US201762481505P 2017-04-04 2017-04-04
US62/481,505 2017-04-04
PCT/US2018/026010 WO2018187419A1 (en) 2017-04-04 2018-04-04 Phase plate for high precision wavelength extraction in a microscope

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JP2020515907A JP2020515907A (ja) 2020-05-28
JP2020515907A5 JP2020515907A5 (enExample) 2021-05-13
JP7144438B2 true JP7144438B2 (ja) 2022-09-29

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US (1) US11422090B2 (enExample)
EP (1) EP3607365A1 (enExample)
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WO (1) WO2018187419A1 (enExample)

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* Cited by examiner, † Cited by third party
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WO2018187419A1 (en) * 2017-04-04 2018-10-11 University Of Utah Research Foundation Phase plate for high precision wavelength extraction in a microscope
DE102019100184A1 (de) * 2019-01-07 2020-07-09 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
CN112762820A (zh) * 2020-12-11 2021-05-07 深圳市菲森科技有限公司 一种共聚焦三维测量系统的标定装置及标定方法

Citations (3)

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JP2003167198A (ja) 2002-08-28 2003-06-13 Japan Science & Technology Corp 顕微鏡
US20100315709A1 (en) 2007-02-07 2010-12-16 Baer Stephen C Forming light beams and patterns with zero intensity central points
JP2013539074A (ja) 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム

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US20100315709A1 (en) 2007-02-07 2010-12-16 Baer Stephen C Forming light beams and patterns with zero intensity central points
JP2013539074A (ja) 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム

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US11422090B2 (en) 2022-08-23
JP2020515907A (ja) 2020-05-28
EP3607365A1 (en) 2020-02-12
US20200110030A1 (en) 2020-04-09
WO2018187419A1 (en) 2018-10-11

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