JP7126670B2 - スペックル画像を用いる欠陥検出方法およびその装置 - Google Patents

スペックル画像を用いる欠陥検出方法およびその装置 Download PDF

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JP7126670B2
JP7126670B2 JP2017170670A JP2017170670A JP7126670B2 JP 7126670 B2 JP7126670 B2 JP 7126670B2 JP 2017170670 A JP2017170670 A JP 2017170670A JP 2017170670 A JP2017170670 A JP 2017170670A JP 7126670 B2 JP7126670 B2 JP 7126670B2
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defect
defect detection
sheet material
images
coating film
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JP2019045398A5 (enExample
JP2019045398A (ja
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元治 藤垣
滉平 川原
栄 目黒
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University of Fukui NUC
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JP2017170670A 2017-09-05 2017-09-05 スペックル画像を用いる欠陥検出方法およびその装置 Active JP7126670B2 (ja)

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TWI756811B (zh) * 2019-09-03 2022-03-01 日商新川股份有限公司 振動檢測系統
CN110987765B (zh) * 2019-09-07 2022-10-11 西安科技大学 一种基于三维数字散斑的岩体细观裂隙测试方法
CN114981652A (zh) * 2020-01-23 2022-08-30 株式会社岛津制作所 缺陷检查装置及缺陷检查方法
NL2027331B1 (en) * 2021-01-18 2022-07-25 Univ Twente Handheld laser-based perfusion imaging apparatus and method of using said apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001343481A (ja) 2000-03-31 2001-12-14 Hitachi Ltd 原子炉炉内構造物の亀裂診断方法
JP2006300763A (ja) 2005-04-21 2006-11-02 Mitsutoyo Corp 変位検出装置
JP2007024674A (ja) 2005-07-15 2007-02-01 Hitachi Ltd 表面・表層検査装置、及び表面・表層検査方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2734933B2 (ja) * 1993-04-26 1998-04-02 日本鋼管株式会社 防食被膜の付着評価方法及び装置
JPH07218449A (ja) * 1994-02-04 1995-08-18 Toyota Motor Corp 光学的表面欠陥検出方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001343481A (ja) 2000-03-31 2001-12-14 Hitachi Ltd 原子炉炉内構造物の亀裂診断方法
JP2006300763A (ja) 2005-04-21 2006-11-02 Mitsutoyo Corp 変位検出装置
JP2007024674A (ja) 2005-07-15 2007-02-01 Hitachi Ltd 表面・表層検査装置、及び表面・表層検査方法

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