JP7119427B2 - Inspection device, inspection method, and inspection object support device - Google Patents

Description

The present invention relates to an inspection device, an inspection method, and a support device for an inspection target.

Conventionally, in the distribution process of goods such as product shipment and courier delivery, there is a so-called inspection process that inspects and identifies whether the target matches the delivery slip or order form when shipping and delivering. It is done.
In this process, one side of the object, for example, a hexahedral package, is optically read, and image data such as the outline of the side, or the trademark, identification number, mark, etc. printed on the side is compared with reference data to determine suitability of the object.

In Patent Document 1, products stacked on a pallet are specified by image recognition, and for the specified products, the number of products per tier that can be placed on the pallet and the packages that appear in the image are stacked. An inspection method is described for calculating the quantity of goods stacked on a pallet by the number of tiers. By using this inspection method, the workers can save labor in both checking the products and counting the quantity.

JP 2013-067499 A

By the way, the inspection performed by the inspection device described in Patent Literature 1 requires acquisition of an accurate image of the inspection target. On the other hand, with the diversification of goods in the distribution process, the shapes of goods to be inspected are diversifying.
In order to improve the efficiency of the work of inspecting a large number of articles, it is desirable to photograph and inspect a plurality of inspection objects placed on a single inspection table or pallet so as to capture images. Objects vary in shape and as a result, it may be difficult to focus on all inspection objects and the image of some items may be blurred. In addition, when trying to focus on each inspection object, the adjustment of the optical system and the photography are repeated for each article, which inevitably lengthens the inspection time.

An object of the present invention is to obtain accurate optical information for inspection from inspection objects of various shapes.

In order to solve the above problems, the present invention proposes the following means.
In the inspection apparatus shown in the first aspect of the present invention, the photographing of the plurality of inspection objects is provided at a position intersecting an optical path between the plurality of inspection objects and an imaging device that acquires optical data of the objects. It is characterized in that a linear index portion for contacting with a predetermined portion of the apparatus is provided so as to intersect the optical path.

In the inspection method shown in the second aspect of the present invention, a step of arranging a plurality of inspection objects on an optical path of an imaging device for obtaining optical data thereof; The method is characterized by comprising the step of providing a linear index portion with which the parts are brought into contact, and the step of moving the plurality of inspection objects toward the index portion and aligning them along the index portion.

An inspection object supporting device shown in a third aspect of the present invention comprises a mounting surface on which a plurality of inspection objects are placed, and a mounting surface provided on the mounting surface, comprising the plurality of inspection objects and optical data of the objects. and an index portion on a straight line that intersects with an optical path between an imaging device that acquires the .

According to the present invention, accurate optical information can be obtained from a plurality of inspection objects.

BRIEF DESCRIPTION OF THE DRAWINGS The conveying apparatus of 1st Embodiment concerning the minimum structure of this invention is shown, (a) is a side view, (b) is a top view. It is a perspective view of the inspection apparatus which concerns on 2nd Embodiment of this invention. It is explanatory drawing of the optical path of the inspection apparatus which concerns on 2nd Embodiment. It is a perspective view of the inspection object support apparatus applied to 2nd Embodiment. It is a side view of the modification of the test object support apparatus in 2nd Embodiment. Explanatory diagrams of the inspection method using the second embodiment, (a) shows the state before the inspection objects are aligned, and (b) shows the state after the inspection objects are aligned along the index. . It is a side view of the inspection object support apparatus of the inspection apparatus which concerns on 3rd Embodiment of this invention.

An inspection apparatus according to a first embodiment of the present invention will be described with reference to FIG.
Reference numeral 1 denotes an imaging device of an inspection apparatus. This imaging device 1 has, for example, an imaging section 2 and a convex lens 3 for condensing light onto the imaging section 2 . A linear index portion 4 is provided at a position intersecting the optical axis C of the convex lens 3 of the photographing device 1 . The index part 4 is, for example, linearly protruding slightly from a support surface 8 on which the inspection objects 5, 6, and 7 are placed.

In the inspection apparatus configured as described above, one surface of inspection objects 5, 6, and 7 having different lengths (dimensions in the left-right direction in FIG. It is arranged flush on top, so that all examination objects 5 , 6 , 7 can be imaged onto the imaging section 2 of the imaging device 1 . Note that the photographing device 1 is not necessarily capable of photographing accurate images of the inspection objects 5, 6, and 7, and may simply have a function of detecting the amount of light and contrast. Even with such simple light amount detection, it is possible to prevent the occurrence of errors due to non-uniform distances to the inspection objects 5, 6, and 7. FIG.

An inspection apparatus according to a second embodiment of the present invention will be described with reference to FIGS. In addition, the same code|symbol is attached|subjected to the component which is common in 1st Embodiment in a figure, and description is simplified.
Reference numeral 11 denotes a scale (scale), on which a support base 12 is placed. The upper surface 13 of the support table 12 is inclined and serves as a support surface on which the inspection objects 5, 6 and 7 are placed. The inspection objects 5, 6, 7, and 9 (in addition, the inspection object 9 is placed on the inspection object 6) are, for example, rectangular parallelepiped packages for home delivery. It is also assumed that gravity acts in the vertical direction in FIG.
A flat plate transparent plate 20 is provided at the tip of the support table 12, and one surface of the inspection objects 5, 6, 7, and 9 is in contact. That is, the inspection objects 5, 6, 7, and 9 serve as index portions for aligning them flush with each other when they come into contact with each other. In the illustrated example, one face refers to one end face in the longitudinal direction of a rectangular parallelepiped. refers to the surface that has been

The transparent plate 20 is made of glass, and is provided so as to intersect an optical path extending from the camera 21 to the inspection objects 5, 6, 7 and 9 via the reflecting mirrors 22 and 23 as indicated by the arrows in the drawing. ing. In the illustrated example, it is arranged so as to be orthogonal to the light reflected by the final reflecting mirror 23 . The material of the transparent plate 20 is glass in consideration of transparency, flatness, and rigidity required to maintain the flatness, but transparent synthetic resin may also be used.

The optical path through camera 21, reflecting mirrors 22 and 23, and transparent plate 20 shown in FIG. 2 can also be expressed as an equivalent optical path indicated by broken lines in FIG.
That is, as indicated by the dashed line in the figure, the transparent plate 20 is arranged in a direction perpendicular to the straight line that coincides with the optical axis C of the camera 21', and the image of the object on the upper surface 13 is captured by the camera 21'. It is designed to be This optical system is realized by an optical path from the camera 21 to the transparent plate 20 via the reflecting mirrors 22 and 23, as indicated by solid arrows in the drawing.

The operation of the inspection apparatus configured as described above and the inspection method using this inspection apparatus will be described.
As shown in FIG. 6( a ), inspection objects 5 , 6 , 7 and 9 are placed on the upper surface 13 of the support table 12 .
Since the upper surfaces 13 of the inspection objects 5, 6, 7, and 9 are inclined, the gravity acting on the inspection objects 5, 6, 7, and 9 is converted into leftward force in the figure. Due to such action of gravity, the inspection objects 5, 6, 7 and 9 are pressed against the transparent plate 20 as shown in FIG. 6(b).
In this state, the bottom surfaces of the inspection objects 5, 6, 7, and 9 are flush with the surface of the transparent plate 20 on the inspection object side (the right surface in FIG. 2).

In this state, light rays reflected from the bottom surfaces of the inspection objects 5, 6, 7, and 9 (images such as trademarks and identification marks printed on the bottom surfaces of the inspection objects 5, 6, 7, and 9, or the lower surfaces) are 2 and 3 through the transparent plate 20 and photographed by the camera 21. As shown in FIG.
The photographed image is compared with reference data by an image analysis device (not shown), and it is determined whether or not it matches the data of the object to be inspected recorded in, for example, an order form.
Here, since the bottom surfaces of the inspection objects 5, 6, 7, and 9 are flush with each other, they are kept at a constant distance from the camera 21. For example, even when a fixed-focus camera is used, , a good image can be obtained. Also, even with a camera that can change the focal length, the time required for focusing can be shortened.

Further, the scale 11 measures the total weight of the inspection objects 5, 6, 7 and 9 simultaneously with the optical inspection. This weight data is compared with reference data by a weight inspection device (not shown) to determine, for example, whether it matches or disagrees with the total weight data of the objects to be inspected described in the order form.
By placing the inspection objects 5, 6, 7, and 9 on the scale 11 one by one, measuring the weight each time, and calculating the difference, the weights of the inspection objects 5, 6, 7, and 9 are calculated. can be measured, and by comparing with reference data on the individual weights of the inspection objects 5, 6, 7 and 9, more accurate inspection can be performed.
By using weight measurement together in this way, highly accurate inspection can be performed. In other words, even if it is optically determined to be true from the bottom image, if it is determined that the weight is less than the predetermined weight, the measured box may be empty or underweight. can decide to do.

FIG. 5 shows a modified example of the support base 12. The upper surface 13 may be configured to be rotatable around the pivot O at the base end portion, and the inclination angle θ thereof may be changed.

Further, the index portion is not limited to the transparent plate 20 shown in FIG. 2, and may be of the following specifications.
(1) A straight line displayed on the upper surface 13 of the support table 12, which is simply used as an index for the operator when arranging the inspection objects 5, 6, 7 and 9 on the support table. In this case, the index is merely a guideline, and does not require that the inspection objects 5, 6, and 7 actually come into contact with each other.
(2) Linear protrusions that slightly protrude from the upper surface 13 of the support table 12 to prevent the inspection objects 5, 6 and 7 from slipping on the upper surface 13;
(3) A linear friction member provided on the upper surface 13 of the support table 12 to apply a frictional force to the lower surfaces of the inspection objects 5, 6, and 7;
(4) A linear body extending in a plane including the transparent plate 20 above the support base 12 to support the bottom surfaces of the objects to be inspected 5, 6, 7, 9, or included in the same plane as the transparent plate 20. net
(5) In the above embodiment, the object to be inspected has a rectangular parallelepiped shape. The intended purpose can be achieved by making it follow the plate 20 or the index portion 4 . If the object to be inspected does not have a straight side, it is brought into point contact with the index portion, or a jig having a straight portion corresponding to the index portion is interposed between the index portion to determine the position. You may make it adjust.

Further, instead of tilting the support table 12, an elastic body (cushion material) may be used to press the inspection objects 5, 6, 7 and 9 against the transparent plate 20. FIG. Alternatively, the support base 12 may be omitted and the direct cost inspection objects 5, 6, 7 and 9 may be placed on the upper surface of the scale 11. FIG.

An inspection apparatus according to a third embodiment of the present invention will be described with reference to FIG. In addition, the same code|symbol is attached|subjected to the component which is common in 1st Embodiment and 2nd Embodiment in a figure, and description is simplified.
This third embodiment has a configuration in which a transparent plate 20 is provided on a supporting member 30 erected on the upper surface 13 of the scale 11 in parallel with the upper surface 13 at a predetermined interval. The transparent plate 20 is oriented in a direction orthogonal to the optical axis of the camera or the like indicated by the arrow in FIG.
A height adjusting member 31 for supporting the inspection object 5 is provided on the upper surface 13 so that the upper surface of the inspection object 5 and the inspection object 7 are flush with each other.

That is, if the distance between the upper surface 12 and the lower surface of the transparent plate 20 is H, the height of the inspection object 5 is h1, and the height of the support member 30 is h2, then
h1+h2=H
is set to a height that
Between the upper surface 13 and the inspection object 6, an elastic member 32 such as a rubber plate bent in a U shape is provided. The elastic body 32 elastically deforms in its own thickness direction and elastically deforms so as to open the U-shape, thereby pressing the inspection object 6 against the transparent plate 20 and making the upper surface of the inspection object 6 the inspection object. It is flush with object 7.
Of course, either one of the support base 31 and the elastic body 32 may be used, or both of them may be used together.

Thus, even when an optical system such as a camera is provided above, the upper surfaces of the inspection objects 5, 6 and 7 can be aligned flush with the transparent plate 20. , 7, a good photographed image can be obtained.

Even in the case of the third embodiment, instead of the transparent plate 20, the inspection objects 5, 6 and 7 are placed on linear bodies or nets stretched in a plane perpendicular to the optical axis of the camera. A similarly good photographed image can be obtained by pressing.
In addition, in the above-described second and third embodiments, photographing is performed with the support base 12 placed on the scale 11, but without placing the support base 12 on the scale 11, that is, without using weight measurement together. Of course, the present invention can also be applied to the case where the inspection is performed simply from the image of the object to be inspected.

It should be noted that the optical path from the photographing device to the index section is not limited to the above-described embodiment, and may of course be changed according to the purpose and function of the device without departing from the gist of the present invention. be.

As described above, the embodiment of the present invention has been described in detail with reference to the drawings, but the specific configuration is not limited to this embodiment, and design changes and the like are included within the scope of the present invention.

INDUSTRIAL APPLICABILITY The present invention can be used for an inspection device, an inspection method, and a support device to be inspected, which are suitably used for re-inspection such as delivery and shipment.

REFERENCE SIGNS LIST 1 imaging device 2 imaging unit 3 convex lens 4 index unit 5, 6, 7, 9 object to be inspected 8 supporting surface 11 scale 12 supporting base 13 upper surface 20 transparent plate 21, 21' camera 22, 23 reflecting mirror 30 supporting member 31 height Adjustment member 32 Elastic body C Optical axis 0 Pivot

Claims (9)

A straight line for making predetermined portions of the plurality of inspection objects on the side of the imaging device contact a position intersecting an optical path between the plurality of inspection objects and an imaging device that acquires optical data of the objects. providing an index portion to intersect the optical path;
The inspection apparatus according to claim 1, wherein the index portion is provided on a support base on which the plurality of inspection objects are placed . 2. The inspection apparatus according to claim 1 , wherein the index portion protrudes upward from the support surface of the support base . 3. The inspection apparatus according to claim 1, wherein the index portion is a transparent plate provided on the support surface of the support base . The inspection apparatus according to any one of claims 1 to 3 , further comprising urging means for urging the object to be inspected toward the index portion. The inspection apparatus according to any one of claims 1 to 4 , wherein the support base is provided so as to be inclined toward the index portion. The inspection apparatus according to any one of claims 1 to 5 , further comprising a scale for measuring the weight of the object to be inspected placed on the support table. 3. An adjusting means is provided between said support base and said transparent plate for raising an inspection object having a smaller height to a height of an inspection object having a large height dimension. The inspection device described in . A step of arranging a plurality of inspection objects on an optical path of an imaging device for acquiring optical data thereof;
a step of providing an index portion for aligning predetermined portions of the plurality of inspection objects on the imaging device side in a straight line;
and a step of moving the plurality of inspection objects toward the index portion and aligning them along the index portion. a mounting surface on which a plurality of inspection objects are placed;
An inspection object provided on the placement surface and having a linear index section that intersects an optical path between the plurality of inspection objects and an imaging device that acquires optical data of the objects. support device.

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