JP7061335B2 - Fluorescent material evaluation device - Google Patents

Description

The present invention relates to a phosphor evaluation device.

In recent years, LEDs, which are also representative of devices that apply fluorescent materials, have been acceleratingly improved in emission power and efficiency, and have exceeded 100 lumens / watt, which was a technical barrier until a long time ago. On the other hand, light sources other than LEDs, for example, light sources for high-intensity projectors used in movie theaters and projection mapping, and in-vehicle headlights, are attracting attention as laser-excited high-intensity fluorescent light sources.

In these high-intensity LEDs and laser-excited high-intensity fluorescent light sources, the input and output powers are very large. Therefore, even if there is a slight energy loss, the heat generated by the energy loss causes the phosphor to generate heat, and a phenomenon called temperature quenching occurs in which the emission intensity is significantly reduced. In addition, heat generation also becomes a factor for shortening the life of the phosphor. Therefore, in the development of a fluorescent substance, it has become extremely important to intentionally heat the fluorescent substance to evaluate the characteristics when evaluating the characteristics of the fluorescent substance. The measurement of the fluorescent substance is described in, for example, Patent Document 1.

Japanese Patent Application Laid-Open No. 10-0734886

In Patent Document 1, a double integral sphere is used. In a double integral sphere, it is not easy to heat the phosphor without blocking the light emitted from the phosphor. Therefore, it is desirable to provide a fluorophore evaluation device capable of heating the fluorophore without blocking the light emitted from the fluorophore.

The fluorophore evaluation device according to the embodiment of the present invention is arranged between the two integrating spheres and the two integrating spheres, and can heat the phosphor while holding the end portion of the phosphor. The contact heating device, the non-contact heating device capable of blowing the heated gas onto the phosphor when the phosphor is held in the contact heating device, and the phosphor are held in the contact heating device. It is equipped with a light source device capable of irradiating the phosphor with excitation light.

According to the fluorophore evaluation device according to the embodiment of the present invention, a contact-type heating device capable of heating the fluorophore while holding the end portion of the fluorophore and a heated gas are sprayed onto the fluorophore. Since it is provided with a non-contact heating device capable of heating the phosphor, it is possible to heat the phosphor without blocking the light emitted from the phosphor.

It is a figure which shows the schematic structural example of the fluorescent substance evaluation apparatus which concerns on one Embodiment of this invention. It is a figure which shows an example of the cross-sectional structure of the contact type heating apparatus of FIG. It is a figure which shows the state which developed the heating apparatus of FIG. It is a figure which shows the plane structure example of one hold of the heating device of FIG. It is a figure which shows the plane structure example of the other hold of the heating device of FIG. It is a figure which shows the state that the gas flows into the heating device of FIG. It is a figure which shows the state that the gas flows into one hold of the heating device of FIG. It is a figure which shows the state that the gas flows into the other hold of the heating device of FIG. It is a figure which shows an example of the relationship between the distance from a heater and the temperature of an excited part. It is an enlarged figure which shows one modification of the heating apparatus of FIG.

Hereinafter, embodiments for carrying out the invention will be described in detail with reference to the drawings. The following description is a specific example of the present invention, and the present invention is not limited to the following aspects. Further, the present invention is not limited to the arrangement, dimensions, dimensional ratio, etc. of each component shown in each figure.
<1. Embodiment>
[Constitution]
The fluorescent substance evaluation apparatus 1 according to the embodiment of this technique will be described. FIG. 1 shows a schematic configuration example of the phosphor evaluation device 1. The phosphor evaluation device 1 heats a region (hereinafter referred to as a “target region”) to be irradiated with the excitation light Le of the sample 100 to be evaluated with a uniform temperature distribution, and emits light characteristics of the sample 100. It is a device to evaluate. Sample 100 is, for example, obtained by sintering a powdered fluorescent substance into a lump using an inorganic binder. The sample 100 may be, for example, a powdered fluorescent material sintered into a lump using a binder such as a resin.

The phosphor evaluation device 1 is a phosphor evaluation device using a double integral sphere. The phosphor evaluation device 1 includes, for example, two integrating spheres 10, 20, two spectrophotometers 30, 40, two heating devices 50, 60, a light source device 70, a non-contact thermometer 80, and an information processing device 90. ing.

The integrating sphere 10 is arranged on the optical path of the excitation light Le. The integrating sphere 10 has a window 11 for incidenting the excitation light Le inside the integrating sphere 10 on the optical path of the excitation light Le. The integrating sphere 10 further has a window 12 on the optical path of the excitation light Le for irradiating the sample 100 with the excitation light Le incident through the window 11. The integrating sphere 20 is arranged at a position facing the integrating sphere 10 via the heating device 50 in a direction parallel to the optical path of the excitation light Le. The integrating sphere 20 has a window 21 for measuring the temperature of the sample 100 by the non-contact thermometer 80. The integrating sphere 20 further has a window 22 at a position facing the window 12 of the integrating sphere 10.

The integrating spheres 10 and 20 are arranged at symmetrical positions with the heating device 50 interposed therebetween. The integrating spheres 10 and 20, respectively, are in direct contact with the heating device 50 or are arranged via a predetermined gap. The integrating sphere 10 has a window 12 at a position facing the opening 122 (described later) of the heating device 50. The integrating sphere 20 has a window 22 at a position facing the opening 112 (described later) of the heating device 50. The integrating spheres 10 and 20 are made of, for example, a material capable of achieving both high reflectivity and heat resistance. Examples of the material used for the integrating spheres 10 and 20 include Teflon (registered trademark) (PEFE) -based materials.

The spectroscopic measuring machine 30 measures the spectral intensity of the fluorescent Lf emitted from the sample 100 to the integrating sphere 10 side by the irradiation of the excitation light Le on the inner wall surface of the integrating sphere 10, and processes the data obtained by the measurement. Output to device 90. The spectroscopic measuring machine 40 measures the spectral intensity of the fluorescent Lr emitted from the sample 100 to the integrating sphere 20 side by the irradiation of the excitation light Le on the inner wall surface of the integrating sphere 20, and processes the data obtained by the measurement. Output to device 90. The non-contact thermometer 80 measures the temperature of the sample 100 fixed by the heating device 50 in a non-contact manner, and outputs the data obtained by the measurement to the information processing device 90. The non-contact thermometer 80 is, for example, a far-infrared radiation thermometer.

The light source device 70 is a light source device capable of irradiating the sample 100 with the excitation light Le while the sample 100 is held in the heating device 50. The light source device 70 irradiates the sample 100 with the excitation light Le through the windows 11 and 12. The light source device 70 includes, for example, a light source 71, a monochromator 72, a half mirror 73, and a detector 74. The light source 71 is a light source capable of emitting light L1 including light having a wavelength applicable to the excitation of the sample 100, and is configured to include, for example, a xenon lamp. The monochromator 72 is a device that extracts (selects) light having a specific wavelength (for example, a wavelength applicable to excitation of the sample 100) from the light L1 input from the light source 71. The half mirror 73 transmits a part of the light L2 extracted (selected) by the monochromator 72, reflects a part of the light L2, and inputs the light L2 to the detector 74. The light source device 70 outputs the light transmitted through the half mirror 73 to the outside as excitation light Le. The detector 74 detects the input light and outputs a detection signal according to the intensity of the detected light to the information processing apparatus 90. The light source device 70 may have a lens that focuses the light transmitted through the half mirror 73 on a desired beam. In this case, the light source device 70 outputs the light focused by the lens to the outside as the excitation light Le.

The information processing device 90 has, for example, an arithmetic unit 91 and a storage device 92. The arithmetic unit 91 stores the data obtained by the spectroscopic measuring machines 30 and 40 in the storage device 92. The arithmetic unit 91 evaluates the light emission characteristics of the sample 100 based on the data obtained by the spectrophotometers 30 and 40. The arithmetic unit 91 stores the data obtained by the non-contact thermometer 80 in the storage device 92. The arithmetic unit 91 controls at least one of the heating device 50 and the heating device 60 so that the temperature of the sample 100 becomes a desired temperature based on the data obtained by the non-contact thermometer 80. When the arithmetic unit 91 can control the gas flow rate, the arithmetic unit 91 sets the temperature of the sample 100 to a desired temperature based on the data obtained by the non-contact thermometer 80. The gas flow rate may be controlled. When the heating device 60 has a mechanism for controlling the gas flow rate, the arithmetic unit 91 is a heating device so that the gas flow rate becomes a desired magnitude based on the data obtained by the non-contact thermometer 80. 60 may be controlled.

The arithmetic unit 91 controls the heating device 50 so that the temperature of the heating device 50 (specifically, the heaters 113 and 123 described later) does not exceed the threshold value at which self-luminous light is generated by the heaters 113 and 123. The arithmetic unit 91 estimates the light intensity of the excitation light Le emitted from the light source device 70 based on the detection signal input from the detector 74. The arithmetic unit 91 controls the light output of the light source 71 based on the detection signal input from the detector 74 so that the light intensity of the excitation light Le becomes a desired light intensity. The arithmetic unit 91 controls the light output of the light source 71 so that the light intensity of the excitation light Le becomes a desired magnitude based on the light intensity obtained by estimation.

The heating device 50 is a contact-type heating device capable of heating the sample 100 while holding the end portion of the sample 100. The heating device 50 is arranged between the two integrating spheres 10 and 20. FIG. 2 shows an example of the cross-sectional structure of the heating device 50. FIG. 2 illustrates how the sample 100 is fixed to the heating device 50. FIG. 3 shows a state in which the heating device 50 is deployed. The heating device 50 has a mechanism capable of holding the sample 100. The heating device 50 has, for example, two holds 110, 120 (more specifically, plates 111, 121 described later) as such a mechanism. The heating device 50 holds the sample 100, for example, by sandwiching the sample 100 between two holds 110 and 120. The hold 110 is arranged on the integrating sphere 20 side, for example, and the hold 120 is arranged on the integrating sphere 10 side, for example. FIG. 4 shows an example of the plan configuration of the hold 110. FIG. 5 shows an example of the plan configuration of the hold 120.

(Hold 110)
The hold 110 has a plate 111 provided with an opening 112 and an accommodating portion 116. The plate 111 has, for example, an annular shape and has an opening 112 and an accommodating portion 116 in the central portion. The plate 111 is made of a material having high thermal conductivity. The opening 112 is provided on the surface of the hold 110 on the side opposite to the hold 120 (for example, the integrating sphere 20 side), and has a tapered side surface 112A. Since the side surface 112A is tapered, the emission angle of the fluorescent Lr is defined by the inclination angle of the side surface 112A. Therefore, it is preferable that the inclination angle of the side surface 112A is as large as possible. The bottom of the opening 112 is missing and communicates with the accommodating portion 116. The accommodating portion 116 is provided on the surface of the hold 110 on the hold 120 side (for example, the integrating sphere 10 side), and is a recess having the same shape as that of the sample 100. A part of the bottom surface of the accommodating portion 116 is open and communicates with the opening 112. Therefore, when the sample 100 is housed in the housing portion 116, the surface of the portion of the sample 100 facing the target region is exposed on the bottom surface of the opening 112. That is, the plate 111 has an opening 112 in the sample 100 at a position facing the target region irradiated with the excitation light Le. When the sample 100 is accommodated in the accommodating portion 116, the hold 110 (plate 111) is in contact with the end portion of the sample 100 and is not in contact with the portion of the sample 100 facing the target region.

The hold 110 further has an annular heater 113 having an inner diameter larger than the diameter of the opening 112. The heater 113 is provided inside the plate 111 or in contact with the plate 111, and is arranged close to the perimeter of the opening 112 and the accommodating portion 116. The heater 113 is a contact type heater capable of contacting the sample 100 via the plate 111 and heating the sample 100 via the plate 111. The heater 113 is not particularly limited, but is composed of, for example, a ceramic heater, a rubber heater, a cartridge heater, a sheathed heater, and the like.

The hold 110 further has a plurality of flow paths 114 inside the plate 111. FIG. 4 illustrates a case where four flow paths 114 are provided. Each flow path 114 has an inflow port 114A into which the gas flows in and an outflow port 114B in which the gas is ejected. The inflow port 114A of each flow path 114 is provided, for example, on the peripheral surface of the plate 111. The outlet 114B of each flow path 114 is provided, for example, on the side surface 112A of the opening 112. The outlet 114B of each flow path 114 is provided, for example, at a position closest to the bottom surface of the opening 112 in the side surface 112A of the opening 112.

Each flow path 114 is a flow path for supplying (or blowing) gas that has flowed in from the outside through the heating device 60 to the sample 100. As shown in FIG. 4, for example, the plurality of flow paths 114 are arranged so as to extend radially around the opening 112. When a plurality of flow paths 114 are arranged radially with respect to the opening 112, for example, as shown in FIGS. 6 and 7, the gas flows Fa1 to Fa4 ejected from each outlet 114B are samples. It flows along the surface of 100 toward the center of the opening 112, collides with the center of the opening 112, and is dissipated in the normal direction of the sample 100.

As described above, each flow path 114 is formed inside the plate 111. Therefore, the plate 111 has a role of transferring the heat of the plate 111 to the gas flowing through the flow path 114 when the plate 111 is heated by the heater 113. Therefore, since the gas is heated by the heat of the plate 111 while flowing through each flow path 114, there is no possibility that the gas is rapidly cooled in the path from the nozzle of the heating device 60 to the sample 100.

The hold 110 further has a plurality of flow paths 115 extending in the normal direction of the plate 111 inside the plate 111. Each flow path 115 connects each flow path 114 and each flow path 124 in the hold 120 to each other when the holds 110 and 120 are overlapped with each other.

(Hold 120)
The hold 120 has a plate 121 provided with an opening 122. The plate 121 has, for example, an annular shape and has an opening 122 in the central portion. The plate 121 is made of a material having high thermal conductivity. The opening 122 is provided so as to penetrate the plate 121, and has a side surface 122A that is tapered when the plate 121 is viewed from the side opposite to the hold 110. Since the side surface 122A is tapered, the emission angle of the fluorescent Lf is defined by the inclination angle of the side surface 122A. Therefore, it is preferable that the inclination angle of the side surface 122A is as large as possible. When the holds 110 and 120 are superposed on each other, the opening 122 communicates with the accommodating portion 116. Therefore, when the holds 110 and 120 are overlapped with each other while the sample 100 is housed in the housing portion 116, the surface (target region) of the sample 100 is exposed on the bottom surface of the opening 122. That is, the plate 121 has an opening 122 in the sample 100 at a position facing the target region irradiated with the excitation light Le.

In the laminated body consisting of the plates 111 and 121 stacked on each other, the voids consisting of the opening 112, the accommodating portion 116 and the opening 122 form an opening penetrating the laminated body. At this time, the opening penetrating the laminated body is provided at a position facing the target region. The openings penetrating the laminate include an opening 122 in which the side surface 122A near the integrating sphere 10 is tapered, an opening 112 in which the side surface 112A near the integrating sphere 20 is tapered, and an opening 122. And the opening 112 are communicated with each other, and the housing portion 116 capable of accommodating the sample 100 is included.

When the holds 110 and 120 are overlapped with each other in a state where the sample 100 is housed in the storage portion 116, the hold 120 (plate 121) is in contact with the end portion of the sample 100, and the target of the sample 100 It does not touch the part facing the area. Therefore, the heating device 50 (plates 111, 121) holds the end portion of the sample 100 when the holds 110, 120 are overlapped with each other in a state where the sample 100 is accommodated in the accommodating portion 116. Fix the sample 100.

The hold 120 further has an annular heater 123 whose inner diameter is at least larger than the diameter of the opening 122. The heater 123 is provided inside the plate 121 or in contact with the plate 121, and is arranged close to the periphery of the opening 122. The heater 123 is a contact type heater capable of contacting the sample 100 via the plate 121 and heating the sample 100 via the plate 121. The heater 123 is not particularly limited, but is composed of, for example, a ceramic heater, a rubber heater, a cartridge heater, a sheathed heater, and the like.

The hold 120 further has a plurality of flow paths 124 inside the plate 121. The hold 120 is provided with, for example, the same number of flow paths 124 as the number of flow paths 114. FIG. 5 illustrates a case where four flow paths 124 are provided. Each flow path 124 has an inflow port 124A into which the gas flows in and an outflow port 124B in which the gas is ejected. The inflow port 124A of each flow path 124 is provided, for example, on the surface of the plate 121 on the plate 111 side, and is connected to each flow path 115 when the plates 111, 121 are overlapped with each other. The outlet 124B of each flow path 124 is provided, for example, on the side surface 122A of the opening 122. The outlet 124B of each flow path 124 is provided, for example, at a position closest to the bottom surface of the opening 122 in the side surface 122A of the opening 122.

Each flow path 124 is a flow path for supplying (or blowing) gas that has flowed in from the outside through the heating device 60 to the sample 100. The plurality of flow paths 124 are arranged radially around the opening 122, for example, as shown in FIG. When a plurality of flow paths 124 are arranged radially with respect to the opening 122, for example, as shown in FIGS. 6 and 8, the gas streams Fb1 to Fb4 ejected from each outlet 124B are samples. It flows along the surface of 100 toward the center of the opening 122, collides with the center of the opening 122, and is dissipated in the normal direction of the sample 100.

As described above, each flow path 124 is formed inside the plate 121. Therefore, the plate 121 has a role of transferring the heat of the plate 121 to the gas flowing through the flow path 124 when the plate 121 is heated by the heater 123. Therefore, since the gas is heated by the heat of the plate 121 while flowing through each flow path 124, there is no possibility that the gas is rapidly cooled in the path from the nozzle of the heating device 60 to the sample 100.

The heating device 50 is used to preheat the sample 100. “Preheating” means that when the region (target region) irradiated with the excitation light Le in the sample 100 is heated to a desired temperature, the target region is slightly lower than the desired temperature by heating by the heating device 50. Refers to heating at temperature. For example, when it is desired to heat the target region to 350 ° C., the heating device 50 heats the sample 100 so that the target region is about 300 ° C. The heating device 50 heats the heaters 113 and 123 at about 350 ° C. and heats the target region at about 300 ° C. in consideration of the temperature gradients of the plates 111 and 121, for example. By preheating, the heating device 50 heats the heaters 113 and 123 at a temperature at which the heaters 113 and 123 themselves do not emit light (for example, about 350 ° C.), whereby the target region is heated from a desired temperature. Also heat at a slightly lower temperature.

The heating device 50 is further used to heat (or keep warm) the gas flowing through the flow paths 114 and 124. The heating device 50 heats (or keeps warm) the gas flowing through the flow paths 114 and 124 by circulating the gas through the flow paths 114 and 124 during the preheating. The heating device 50 may have a thermal insulator in contact with or in the vicinity of the integrating spheres 10 and 20 to prevent the heat of the heating device 50 from being directly transferred to the integrating spheres 10 and 20. ..

The heating device 60 is a non-contact heating device capable of blowing the heated gas onto the sample 100 while the sample 100 is held in the heating device 50. The heating device 60 has a gas heater that heats the gas supplied to the heating device 50. The gas is, for example, air or nitrogen. The heating device 60 (specifically, the nozzle of the heating device 60) is connected to the inflow port 114A. The heating device 60 can heat an object at a position of about 5 mm from the outlet of the nozzle up to about 900 ° C. in a non-contact manner. The heating device 60 heats the gas by, for example, resistance heating, electromagnetic heating, or high frequency heating. If the light component does not matter, the heating device 60 may heat the gas by, for example, infrared heating or laser heating. The heating device 60 is used to heat the target region of the sample 100 preheated by the heating device 50 to a desired temperature. The heating device 60 heats the target region of the sample 100 to a desired temperature while the heating device 50 is performing preheating.

[effect]
Next, the effect of the phosphor evaluation device 1 according to the present embodiment will be described.

In recent years, LEDs, which are also representative of devices that apply fluorescent materials, have been acceleratingly improved in emission power and efficiency, and have exceeded 100 lumens / watt, which was a technical barrier until a long time ago. On the other hand, light sources other than LEDs, for example, light sources for high-intensity projectors used in movie theaters and projection mapping, and in-vehicle headlights, are attracting attention as laser-excited high-intensity fluorescent light sources.

In these high-intensity LEDs and laser-excited high-intensity fluorescent light sources, the input and output powers are very large. Therefore, even if there is a slight energy loss, the heat generated by the energy loss causes the phosphor to generate heat, and a phenomenon called temperature quenching occurs in which the emission intensity is significantly reduced. In addition, heat generation also becomes a factor for shortening the life of the phosphor. Therefore, in the development of a fluorescent substance, it has become extremely important to intentionally heat the fluorescent substance to evaluate the characteristics when evaluating the characteristics of the fluorescent substance.

Conventionally, as an evaluation device for a fluorescent material or a fluorescent device such as an LED, for example, the device described below has been used. That is, in the conventional evaluation device, the fluorescence emitted from the phosphor is collected by using an optical device called an integrating sphere, and the emitted fluorescence is made uniform by spatially integrating the fluorescence. The homogenized light is taken into a spectrophotometer and its intensity is measured for different wavelengths of light.

When the input energy is excitation light instead of electricity as in the case of LED, an excitation light source is required. The excitation light source includes a laser light source having a fixed wavelength and a lamp and a monochrome meter that can be combined to irradiate a phosphor while changing the light wavelength of the excitation light. In order to evaluate the characteristics of the phosphor based on the operating temperature, it is necessary to intentionally heat the phosphor and perform measurement while accurately grasping the actual temperature of the phosphor. For example, a sample heating device is attached to the port of the integrating sphere, and the phosphor set in the heating device is contact-heated directly from the back side of the excitation light irradiation surface with a heater.

The above-mentioned evaluation device measures the amount of fluorescence emitted from the surface of the phosphor. When the evaluation target is an LED, the light emitted toward the back surface of the light emitting element is reflected by the reflective film provided on the back surface. At this time, the LED has a device structure that radiates light from the surface of the element. The above-mentioned evaluation device is suitable for evaluation of a fluorescent device having such a structure. However, the above-mentioned evaluation device does not measure the characteristics of the phosphor itself, but merely evaluates the characteristics of a structure constructed of a light emitting element and a reflective film, that is, a device. On the other hand, measuring the characteristics of the fluorescent material itself is important for the development of the fluorescent material, and in this case, an evaluation device using a double integral sphere is used.

In this device, two spectrophotometers mounted on each integrating sphere are used, and the fluorescence emitted from the front surface of the phosphor and the fluorescence emitted from the back surface are separately used for each integrating sphere. Measure at the same time. However, the problem here is the method of heating the phosphor. Since the light emitted from the back surface of the phosphor cannot be blocked, it becomes difficult to bring the heater into contact with the back surface of the phosphor to heat it. Therefore, as the heating means, a method of bringing the heater into contact with the vicinity of the vicinity of the excited portion and heating from the surroundings is used. However, since the excited portion is cooled by the outside air, a temperature gradient is generated between the heating portion and the irradiation portion of the excitation light, and it is difficult to accurately control the target heating temperature.

FIG. 9 shows the results of deriving the temperature of the excited portion when the fluorescent plates having different thicknesses t are heated from the periphery of the excited portion by simulation. Fluorescent materials have various thermal conductivitys depending on the method of use. Generally, since the fluorescent material is a powder, when it is used, it is sintered in a lump using a binder such as a resin having a thermal conductivity lower than that of the fluorescent material by about two orders of magnitude. Therefore, the thermal conductivity deteriorates. Therefore, there is an example of using an inorganic binder to increase the thermal conductivity. In this simulation, assuming the case of an inorganic binder, the thermal conductivity of the phosphor material was calculated to be equivalent to that of quartz (1.35 W / mK).

From the results of the simulation, for example, even if a plate-shaped phosphor having a thickness t of 0.2 mm is heated to 350 ° C. at a position 5 mm away from the center of the excited portion, it is cooled by the outside air and cooled to 200 ° C. until it reaches the center of the excited portion. You can see that it goes down below. When investigating the temperature characteristics of a phosphor, it is said that it is desirable to evaluate at a heating temperature of 300 ° C. or higher in consideration of the occurrence of temperature quenching. From the above simulation results, in order to make the excited portion 300 ° C., it is necessary to heat the ambient temperature to around 500 ° C. in consideration of the temperature drop.

However, at a high temperature of 400 ° C. or higher, the component itself constituting the heater causes self-luminous emission, and the light emitted from the heater becomes a disturbance in measuring the amount of fluorescence from the phosphor. As another heating means, there is also an example of using a method of bringing a phosphor into contact with a transparent plate-type heater called a glass heater to heat it. The glass heater is made by depositing a transparent conductive film on quartz glass, and can be heated to about 500 ° C. when energized. In this method, it is desirable that all the fluorescence emitted from the side (back surface) in contact with the glass heater passes through the transparent glass plate and is radiated into the integrating sphere. However, under the present circumstances, a part of the light emitted from the back surface repeatedly reflects inside the front and back surfaces of the glass plate and escapes to the end portion of the glass plate. The light that escapes from the end cannot be radiated into the integrating sphere and becomes lost light. Therefore, it is difficult to measure the amount of fluorescence accurately.

On the other hand, in the present embodiment, the contact type heating device 50 capable of heating the sample 100 while holding the end portion of the sample 100 and the non-contact type heating device 50 capable of blowing the heated gas onto the sample 100. The heating device 60 of the above is provided. This makes it possible to heat the target region of the sample 100 without blocking the fluorescent Lf and Lr emitted from the sample 100.

Further, in the present embodiment, the plates 111, 121 capable of holding the end portion of the sample 100, the flow paths 114, 124 provided inside the plates 111, 121, and the plates 111, 121 are used. Heaters 113 and 123 capable of heating the sample 100 are provided, and the nozzle of the heating device 60 is connected to the flow path 114. As a result, when the plates 111 and 121 are heated by the heaters 113 and 123, the heat of the plates 111 and 121 is transferred to the gas flowing through the flow paths 114 and 124. While flowing through 124, it is heated (or kept warm) by the heat of the plate 111. As a result, there is no possibility that the gas will be rapidly cooled in the path from the nozzle of the heating device 60 to the sample 100. Therefore, the target region of the sample 100 can be effectively heated without blocking the fluorescent Lf and Lr emitted from the sample 100.

Further, in the present embodiment, openings 112 and 122 are provided at locations facing the target region. Each flow path 114, 124 has outlets 114B, 124B on the side surfaces 112A, 122A of the openings 112, 122, and extends radially around the openings 112, 122. As a result, when gas is supplied to each of the flow paths 114 and 124, the gas flows Fa1 to Fa4 and Fb1 to Fb4 flow toward the center of the openings 112 and 122 along the surface of the sample 100, and the openings It collides with the center of 112, 122 and dissipates in the normal direction of sample 100. As a result, the surface of the sample 100 is covered with the gas streams Fa1 to Fa4 and Fb1 to Fb4, and is blocked from the outside air by the gas streams Fa1 to Fa4 and Fb1 to Fb4. Further, the surface of the sample 100 is efficiently heated by the gas flows Fa1 to Fa4 and Fb1 to Fb4. Further, since the preheating is performed by the heating device 50, the efficiency of heating by the gas flows Fa1 to Fa4 and Fb1 to Fb4 is very good. Therefore, the target region of the sample 100 can be effectively heated without blocking the fluorescent Lf and Lr emitted from the sample 100.

Further, in the present embodiment, the plate 111, 121 has an opening 122 in which the side surface 122A closer to the integrating sphere 10 is tapered and an opening 112 in which the side surface 112A closer to the integrating sphere 20 is tapered. It is provided in. As a result, the fluorescent Lf and Lr emitted from the sample 100 can be efficiently radiated to the inner walls of the integrating spheres 10 and 30.

Further, in the present embodiment, the heating device 50 is provided with the reflective film 117 covering the side surface 112A and the reflective film 127 covering the side surface 122A. As a result, light loss on the side surfaces 112A and 121A can be suppressed.

<2. Modification example>
Hereinafter, a modified example of the fluorescent substance evaluation device 1 of the above-described embodiment will be described. In the following, the same reference numerals as those given in the above-described embodiment are attached to the components common to the above-described embodiment. In addition, the description of the components different from the above-described embodiment will be mainly described, and the description of the components common to the above-described embodiment will be omitted as appropriate.

FIG. 10 is an enlarged view of a part of the heating device 50 according to the modified example. In the above embodiment, the side surface 122A of the opening 122 is exposed inside the integrating sphere 10, and the side surface 112A of the opening 112 is exposed inside the integrating sphere 20. Therefore, when the reflectance of the side surfaces 112A and 122A of the openings 112 and 122 is smaller than the reflectance of the inner walls of the integrating spheres 10 and 20, the light loss on the side surfaces 112A and 122A of the openings 112 and 122 can be ignored. It disappears.

Therefore, in this modification, the heating device 50 has a reflective film 117 that covers the side surface 112A and a reflective film 127 that covers the side surface 122A. As a result, the optical loss on the side surfaces 112A and 122A can be reduced. The reflective films 117 and 127 are preferably a strong film that can withstand the thermal expansion and contraction of the plates 111 and 121, for example, by a dielectric multilayer film, a ceramic sprayed film, a heat-resistant alumite, or a plating film. It is preferably configured.

1 ... Fluorescent material evaluation device, 10,20 ... Integrating sphere, 11,12,21,22 ... Window, 30,40 ... Spectrometer, 50,60 ... Heating device, 70 ... Light source device, 71 ... Light source, 72 ... Monochromator, 73 ... Half mirror, 74 ... Detector, 80 ... Non-contact thermometer, 90 ... Information processing device, 91 ... Computational device, 92 ... Storage device, 100 ... Sample, 110, 120 ... Hold, 111, 121 ... Plate , 112, 122 ... opening, 112A, 122A ... side surface, 113, 123 ... heater, 114, 115, 124 ... flow path, 114A, 124A ... inlet, 114B, 124B ... outlet, 116 ... accommodating part 117, 127 ... Reflective film, Fa1, Fa2, Fa3, Fa4, Fb1, Fb2, Fb3, Fb4 ... Gas flow, L1, L2, L3 ... Light, Le ... Excitation light, Lf, Lr ... Fluorescence.

Claims (5)

Two integrating spheres and
A contact-type heating device arranged between the two integrating spheres and capable of heating the fluorescent substance while holding the end portion of the fluorescent substance, and a contact-type heating device.
A non-contact heating device capable of blowing the heated gas onto the fluorescent substance while the fluorescent substance is held in the contact type heating device.
A fluorescence evaluation device including a light source device capable of irradiating the phosphor with excitation light when the phosphor is held in the contact heating device. The contact type heating device can heat the fluorescent substance through a mechanism capable of holding an end portion of the fluorescent substance, a flow path provided inside the mechanism, and the mechanism. With a heater,
The phosphor evaluation device according to claim 1, wherein the non-contact heating device is connected to the flow path. The mechanism has an opening in the phosphor facing a target region to which the excitation light is irradiated.
The fluorescent substance evaluation device according to claim 2, wherein the flow path has an outlet on a side surface of the opening and has a plurality of first flow paths extending radially around the opening. The opening is
On the other hand, the first opening whose first side surface closer to the integrating sphere is tapered, and
The phosphor evaluation apparatus according to claim 3, further comprising a second opening having a tapered second side surface closer to the integrating sphere. The contact type heating device is
The first reflective film covering the first side surface and
The phosphor evaluation apparatus according to claim 4, further comprising a second reflective film covering the second side surface.

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