JP6938335B2 - Stress detection system, stress detection method and stress detection program - Google Patents

Description

The present invention relates to a stress detection system, a stress detection method and a stress detection program for detecting a load on a stress luminescent material.

Conventionally, a stress-luminescent substance that emits light according to an applied load is applied to a measurement target, and stress detection that detects stress according to the degree of light emission detects strain that is difficult to detect and the degree of load applied. We are doing things like detecting. In the detection of this mechanoluminescence, an object to which a load is applied is imaged, and the stress is detected by the change in the brightness value on the time series. The degree of this mechanoluminescence may change for some reason. For example, Patent Document 1 discloses that in pressure measurement using a pressure-sensitive paint, an error occurs in pressure measurement depending on the temperature. In order to solve this problem, Patent Document 1 discloses a technique for correcting pressure measurement according to a temperature change.

Japanese Unexamined Patent Publication No. 2006-64600

By the way, in mechanoluminescence, the stress is calculated based on the emission intensity of the emission according to the stress, that is, the brightness value of the captured image, but if the emission contains other light components, it is accurate. There was a problem that it was not possible to calculate the stress. Although the technique described in Patent Document 1 can correct the pressure measurement based on the temperature change, it is accurate when light other than the light caused by the stress in the mechanoluminescent measurement target is imaged. There is a problem that stress cannot be measured.

Therefore, the present invention has been made in view of the above problems, and an object of the present invention is to provide a stress detection system capable of detecting stress without including light components other than light emission according to stress. ..

In order to solve the above problems, the stress detection system according to one aspect of the present invention stores a residual light response model in which the brightness value of the main emission and the brightness value of the residual light generated for the main emission are defined. Based on the residual light response model, the luminance value of the residual light is calculated from the storage unit, the reception unit that receives the input of the captured image of the stress-stimulated luminescent material, and the brightness value of each pixel of the captured image of the stress-stimulated luminescent material. It includes a luminance value calculation unit that removes and obtains the luminance value of the main emission, and a detection unit that detects the stress generated in the mechanoluminescent body based on the luminance value calculated by the luminance value calculation unit.

In order to solve the above problems, the stress detection method according to one aspect of the present invention is executed by a computer, and the luminance value of the main emission and the luminance value of the residual light generated for the main emission are determined. From the storage step for storing the defined residual light response model, the reception step for accepting the input of the captured image of the stress-stimulated luminescent material, and the brightness value of each pixel of the captured image of the stress-stimulated luminescent material, the residual light response model is created. Based on the luminance value calculation step of removing the luminance value of the residual light to obtain the luminance value of the main emission, and the detection of detecting the stress generated in the mechanoluminescent body based on the luminance value calculated in the luminance value calculation step. Including steps.

In order to solve the above problems, the stress detection program according to one aspect of the present invention is a residual light response model in which the luminance value of the main emission and the luminance value of the residual light generated for the main emission are defined in the computer. Based on the residual light response model, the residual light is based on the storage function that memorizes the light, the reception function that accepts the input of the captured image of the stress-stimulated luminescent material, and the brightness value of each pixel of the captured image of the stress-stimulated luminescent material. A brightness value calculation function for removing the brightness value to obtain the brightness value of the main emission and a detection function for detecting the stress generated in the mechanoluminescent body based on the brightness value calculated by the brightness value calculation function are realized.

In the stress detection system, the residual light response model shows a change in time series between the main emission and the residual light, which is the light in which the main emission remains after the timing of the main emission. It is a model with one main light emission as a unit, the reception unit accepts the input of a moving image of the stress-stimulated luminescent material as the captured image, and the brightness value calculation unit receives each pixel of the captured image received by the reception unit. The brightness value of the main emission may be obtained from the number of units including the residual light response model.

The stress detection system according to one aspect of the present invention can accurately detect stress based on the luminance value obtained by removing the residual light component due to the main light emission.

(A) and (b) are block diagrams showing a configuration example of a stress detection system. (A) to (c) are diagrams showing an example of a residual light response model. It is the schematic which shows the generation of the residual light response model schematically. It is a flowchart which shows the operation of a stress detection system. (A) is an example of a residual light response model. (B) to (g) are diagrams for explaining the identification of the luminance value using the residual light response model. (A) is an example of a residual light response model. (H) to (m) are diagrams for explaining the identification of the luminance value using the residual light response model. It is a block diagram which shows the structural example of a stress detection system.

<Findings obtained by the inventors>
The inventors have found that when measuring stress based on luminescence in stress luminescence, luminescent components other than stress-based luminescence are imaged. This is a problem that can be found because there is an error between the stress measurement using a sensor such as a strain gauge and the stress measurement based on mechanoluminescence. Then, as the cause, in the captured image, in addition to the main light emission due to the load applied to the stress-stimulated luminescent material, the residual light in a state in which the main light emission remains is imaged. I found that it was. Then, it is found that an error occurs in the stress measurement because the residual light is imaged together with the main light emission, and the invention of a stress detection system that removes the influence of the residual light and performs the stress measurement is performed. I arrived.

Hereinafter, the stress detection system according to one embodiment of the present invention will be described in detail with reference to the drawings.

<Embodiment>
The stress detection system according to the present invention is a system that specifies the load applied to the stress luminescent material based on the emission brightness of the stress luminescent material. As shown in FIG. 1A, the reception unit 131 and the brightness A value calculation unit 132, a detection unit 133, and a storage unit 140 are provided.

The reception unit 131 has a function of receiving an input of a captured image obtained by imaging a stress-stimulated luminescent material. The reception unit 131 is, for example, an input interface of a computer that is connected to a camera that captures an captured image and receives the captured image to identify stress, an input port of a computer system that receives input of the captured image and detects stress, and the like. However, the present invention is not limited to these. Although it is explained here that the reception unit 131 accepts the input of the captured image obtained by capturing the stress-stimulated luminescent material, it may be possible to accept the input of the moving image of the stress-stimulated luminescent material. Needless to say.

The storage unit 140 has a function of storing a residual light response model in which the brightness value of the main light emission and the brightness value of the residual light generated for the main light emission are defined. The main luminescence refers to the main luminescence of mechanoluminescence, that is, the light emitted by the mechanoluminescent body in response to the load applied to the mechanoluminescent body. On the other hand, residual light is a state in which light emission due to main emission remains (even if a force is applied to the stress-stimulated luminescent material to emit light and then the force is completely removed, the main emission light is emitted. It refers to the light that remains and shines), and refers to the light that is not directly caused by the load applied to the mechanoluminescent material.

The brightness value calculation unit 132 removes the brightness value of the residual light from the brightness value of each pixel of the image captured by the mechanoluminescent body based on the residual light response model stored in the storage unit 140 to emit the main light. It has a function of obtaining the brightness value of. The luminance value calculation unit 132 can be realized by, for example, a processor, a dedicated circuit, or the like.

The detection unit 133 has a function of detecting the stress generated in the stress luminescent material based on the brightness value calculated by the brightness value calculation unit 132. The detection unit 133 detects the emission intensity of the stress-stimulated luminescent material based on the pixel value of each pixel of the captured image, and a conventional emission intensity detection technique can be used. The detection unit 133 can be realized by, for example, a processor, a dedicated circuit, or the like. Hereinafter, a detailed description will be given.

<Structure>
FIG. 1B is a block diagram showing the configuration of the stress detection system 100 according to the present embodiment. As shown in FIG. 1B, the stress detection system 100 includes an imaging unit 110, a control unit 130, and a storage unit 140. The image pickup unit 110, the control unit 130, and the storage unit 140 are connected to each other via a connection line 150.

The imaging unit 110 is a camera that images a stress-stimulated luminescent material. The image pickup unit 110 is, for example, a CMOS camera, but is not limited thereto. A stress luminescent body is an object that emits light of an intensity corresponding to an applied force, and an object that shines more strongly as the applied force increases. The stress-stimulated luminescent material is, for example, an object coated with a stress-stimulated luminescent substance. In addition, stress-stimulated luminescent substances (paints, materials) emit light when various loads such as friction, impact, vibration, compression, tension, and twist are applied as mechanical stimuli, and stress luminescence is added. It refers to a phenomenon in which light is emitted with brightness according to the applied load (stress).

Examples of the stress-luminescent substance include strontium aluminate (SrAl204: Eu) whose structure is controlled by doping with europium, zinc sulfide (ZnS: Mn) doped with transition metal and rare earth, and barium calcium titanate ((Ba, Ca)). ) TiO3: Pr), calcium aluminate yttrium (CaYAl3O7: Ce) and the like can be used, but the present invention is not limited to these as long as it emits light with brightness corresponding to the stress.

The control unit 130 is a processor having a function of controlling each unit of the stress detection system 100. The control unit 130 detects the stress generated in the stress-stimulated luminescent material captured in the captured image by executing the stress detection program stored in the storage unit 140. The control unit 130 converts the brightness values of the reception unit 131 that receives the input of the captured image of the mechanoluminescent body and the luminance value of each pixel of the imaged image of the mechanoluminescent body into the residual light response model stored in the storage unit 140. Based on this, the luminance value calculation unit 132 that removes the luminance value of the residual light to obtain the luminance value of the main emission, and the mechanoluminescent unit detects the stress generated in the mechanoluminescent body based on the luminance value calculated by the luminance value calculation unit 132. It functions as a detection unit 133.

The reception unit 131 receives an image captured by the image pickup unit 110 from the image pickup unit 110 via the connection line 150.

The brightness value calculation unit 132 calculates the brightness value from which the residual light component is removed by using the residual light response model stored in the storage unit 140 for each pixel of the captured image received by the reception unit 131. The luminance value calculation unit 132 calculates a tentative luminance value based on the captured image for each frame in the time series order of the captured image (moving image) received by the receiving unit 131, and with respect to the tentative luminance value. The brightness value from which the residual light is removed is calculated depending on how many units of the residual light response model are included. The details of the residual light response model will be described later.

The detection unit 133 detects the emission intensity of the stress-stimulated luminescent material based on the brightness value calculated by the brightness value calculation unit 132 from which the residual light component is removed from the captured image showing the stress-stimulated luminescent material imaged by the imaging unit 110. The detection unit 133 detects the emission intensity of the stress-stimulated luminescent material based on the pixel value of each pixel of the captured image, and a conventional emission intensity detection technique can be used. For example, the detection unit 133 holds a conversion coefficient between the brightness obtained from the captured image for which the brightness value calculation unit 132 has calculated the brightness value in advance and the actual brightness, and the brightness value of each pixel constituting the captured image. The actual luminance value can be calculated by multiplying the above-mentioned conversion coefficient. The detection unit 133 can be realized by a processor that reads and executes a luminance value calculation program stored in advance in the storage unit 140. Further, for example, the detection unit 133 may calculate the emission intensity of the stress luminescent body based on the difference from the brightness value of the image captured when the stress luminescent body does not emit light.

The storage unit 140 has a function of storing various programs and data required for operation by the stress detection system 100. The storage unit 140 can be realized by, for example, an HDD (Hard Disc Drive), an SSD (Solid State Drive), a flash memory, or the like, but the storage unit 140 is not limited thereto. The storage unit 140 stores a stress detection program for detecting the stress generated in the stress luminescent material based on the captured image, and a residual light response model showing the relationship between the main light emission and the residual light. Here, the residual light response model will be described with reference to FIG.

As shown in FIG. 2A, the residual light response model has a time axis on the horizontal axis and a luminance value on the vertical axis. The time axis is linked to the imaging cycle of the frame by the imaging unit 110, and one time axis is assigned to one frame. As shown in FIG. 2B, the residual light response model is a model including the main light emission and the residual light remaining in the subsequent frames due to the main light emission. That is, as shown in FIG. 2B, the component of the main light emission at time T (the shaded area on the right in the figure) and the component of the residual light that can be imaged in the same frame based on the main light emission (left in the figure). The shaded portion) and the subsequent frame, that is, the component of the residual light (the shaded portion on the left in the figure) associated with the main emission and the residual light at the time T + 1 (both the main emission and the residual light at the time T). The residual light at time T is light that is generated in the same frame of the captured image although it is generated with a slight delay from the main emission. Therefore, in the stress detection system 100, only the main light emission from which the residual light is removed is specified by specifying how many units of the residual light response model are included in the intensity (luminance value) of the captured light from the captured image (moving image). Component can be detected, and as a result, accurate stress can be detected. Needless to say, the residual light response model is not limited to the one shown in FIG. 2 (a). For example, as shown in FIG. 2 (c), the residual light is divided into a plurality of time units. It may straddle, and the brightness value may change with time.

As an example, the residual light response model can be generated as follows. This will be described with reference to FIG. FIG. 3 is a schematic diagram schematically showing the generation of a residual light response model. A strain gauge or the like is provided in the stress luminescent material in advance so that the stress generated for the applied load can be detected. Then, if a momentary force as shown in the upper left of FIG. 3 is applied, the value of the force obtained from the strain gauge is acquired (see the lower part on the left of FIG. 3). At this time, the residual light response model assumed when this force is applied is estimated (estimated by the user). Then, the value obtained from the strain gauge and the residual light response model estimated and generated by the user are used as inputs to perform a convolution operation (for example, the residual light response model is multiplied by the force output from the strain gauge). Then, the obtained calculated value is compared with the actual mechanoluminescence (data showing the time change of the brightness value obtained by imaging the stress-stimulated luminescent material), the difference is fed back, and the convolution calculation is performed. This iterative operation is repeated until the difference between the calculated value and the actual mechanoluminescence becomes equal to or less than a predetermined threshold value. This makes it possible to bring the estimated residual light response model closer to the actual residual light response model and generate a residual light response model when a force as shown in FIG. 3 is applied. The generated residual light response model is stored in the storage unit 140.

The above is the configuration of the stress detection system 100.

<Operation>
FIG. 4 is a flowchart showing the operation of the stress detection system 100.

(Step S401)
In step S401, the control unit 130 (reception unit 131) receives the input of the captured image from the image capturing unit 110. After that, the stress detection system 100 shifts to the process of step S402.

(Step S402)
In step S402, the control unit 130 determines whether or not the frame (captured image) for the time length indicated by the residual light response model is accepted. If it is accepted (YES), the stress detection system 100 shifts to the process of step S403, and if it is not accepted (NO), the stress detection system 100 returns to the process of step S401.

(Step S403)
In step S403, the control unit 130 maps the change in the brightness value of each pixel in time series based on the obtained captured image. After that, the stress detection system 100 shifts to the process of step S404.

(Step S404)
In step S404, the control unit 130 (luminance value calculation unit 132) specifies the brightness value of the pixel of the frame from the number of units in which the mapped brightness value includes the residual light response model. After that, the stress detection system 100 shifts to the process of step S405.

(Step S405)
In step S405, the control unit 130 (detection unit 133) detects the stress of the frame based on the luminance value specified for each pixel of the frame of the captured image, that is, the captured image from which the residual light component is removed. After that, the stress detection system 100 shifts to the process of step S406.

(Step S406)
In step S406, the stress detection system 100 detects whether there is a stop input of the stress detection process from the operator. This may be an input for canceling the imaging to the imaging unit 110, or may be an input for canceling the stress calculation process based on the captured image to the detecting unit 133, or a combination thereof. May be good. If there is an input to stop the stress detection process (YES), the process ends, and if there is no input, the stress detection system 100 returns to the process of step S401.

The above is a description of the operation related to stress detection in which the influence of residual light of the stress detection system 100 is removed.

<Specific example>
The calculation of the luminance value will be described with reference to FIGS. 5 and 6 with reference to a specific example. It is assumed that the residual light response model to be used is shown in FIG. 5 (a) (FIG. 6 (a)). Then, it is assumed that a captured image (moving image) showing a change in brightness as shown in FIG. 5B is obtained at a certain pixel in the captured image. The residual light response model shown in FIG. 5A shows an example in which the luminance value of 2 units is obtained at the time T1 and the luminance value is obtained by 1 unit at the time T2. In FIGS. 5 and 6, the horizontal axis represents the time axis and the vertical axis represents the brightness value of the pixel. Further, the upper part of FIGS. 5 (b) to 5 (g) and the upper part of FIGS. 6 (h) to 6 (m) show the luminance value of the processing target based on the captured image, and the lower part shows the residual light from which the residual light has been removed. It shows the brightness value of only the main emission at the time.

The control unit 130 maps the change in the luminance value in time series for each pixel of each frame of the captured image. That is, for example, it is assumed that the luminance value can be mapped for a certain pixel from time T1 to T4 as shown in FIG. 5 (b).

First, the control unit 130 applies a residual light response model based on the time T1 as shown in FIG. 5 (c). Then, since one residual light response model can be applied, it is extracted as the main emission for one unit at time T1. Therefore, as the brightness value at time T1, the brightness value B1 is first obtained.

Next, the control unit 130 obtains the luminance value shown in FIG. 5D as a mapping of the luminance value after extracting one unit of the residual light response model from the luminance value in the state shown in FIG. 5B. Similarly, with respect to the luminance value shown in FIG. 5D, it is first determined whether or not the residual light response model can be applied based on the time T1 (the earliest time in which the luminance exists). In this case, as shown in FIG. 5E, since one residual light response model can be applied based on the time T1, it is extracted as the main emission for one unit of the time T1. Then, it is added as a brightness value for one unit to the brightness value extracted in FIG. 5 (c). Therefore, the luminance value B2 is obtained as the luminance value at the time T1.

Next, the control unit 130 obtains the luminance value shown in FIG. 5 (f) as a mapping of the luminance value after extracting one unit of the residual light response model from the luminance value in the state shown in FIG. 5 (d). Similarly, with respect to the luminance value shown in FIG. 5 (f), it is first determined whether or not the residual light response model can be applied based on the time T1. In this case, as shown in FIG. 5 (g), since one residual light response model can be applied based on the time T1, it is extracted as the main emission for one unit of the time T1. Then, it is added as a brightness value for one unit to the brightness value extracted up to FIG. 5 (e). That is, at this point, the luminance value at time T1 is B3.

Next, the control unit 130 obtains the luminance value shown in FIG. 6 (h) as a mapping of the luminance value after extracting one unit of the residual light response model from the luminance value in the state shown in FIG. 5 (f). .. With respect to the brightness value shown in FIG. 6H, it is determined whether or not the residual light response model can be applied based on the earliest time when the brightness exists. In the case of FIG. 6H, since the luminance value does not exist at the time T1, the control unit 130 determines whether the residual light response model can be applied based on the time T2. In this case, as shown in FIG. 6 (i), since one residual light response model can be applied based on the time T2, it is extracted as the main emission for one unit of the time T2. As a result, the brightness value of this pixel at time T1 is fixed at B3. Further, the luminance value at the time T2 at this time is B1.

Next, the control unit 130 obtains the luminance value shown in FIG. 6 (j) as a mapping of the luminance value after extracting one unit of the residual light response model from the luminance value in the state shown in FIG. 6 (h). .. It is determined whether or not the residual light response model can be applied to the luminance value shown in FIG. 6J with reference to the time T2. As shown in FIG. 6 (k), since one residual light response model can be applied based on the time T2, it is extracted as the main emission for one unit of the time T2. As a result, the luminance value at the time T2 at this time becomes B2.

Then, the control unit 130 obtains the luminance value shown in FIG. 6 (l) as a mapping of the luminance value after extracting one unit of the residual light response model from the luminance value shown in FIG. 6 (j). With respect to the brightness value shown in FIG. 6 (l), it is determined whether or not the residual light response model can be applied based on the earliest time when the brightness exists. In the case of FIG. 6 (l), since the luminance value no longer exists at the time T2, the control unit 130 determines whether the residual light response model can be applied based on the time T3. In this case, as shown in FIG. 6 (m), since one residual light response model can be applied based on the time T3, it is extracted as the main emission for one unit of the time T3. As a result, the brightness value of this pixel at time T2 is fixed at B2. Further, since the mapped luminance value disappears by the same processing, the control unit 130 finishes the processing, and the luminance value of this pixel at the time T3 is fixed at B1.

Therefore, in the stress detection system 100, the luminance value obtained from the captured image captured by the imaging unit 110 shown in FIG. 6 (h) is actually the luminance value at time T1 as shown in the lower part of FIG. 6 (m). Is B3, the luminance value at time T2 is B2, and the luminance value at time T3 is B1.

Then, the control unit 130 (detection unit 133) detects the stress of the mechanoluminescent body based on the specified luminance value, that is, the luminance value from which the residual light component is removed.

<Summary>
According to the stress detection system 100 according to the above embodiment, the stress can be detected after removing the residual light component associated with the main light emission from the captured image (video), so that more accurate stress detection can be performed. It can be carried out. Therefore, it is possible to measure the stress with a more accurate value, reduce the possibility of detecting an erroneous stress when there is residual light, and reduce the possibility of causing a defect in the design of the product or the like. ..

<Supplement>
Needless to say, the stress detection system according to the above embodiment is not limited to the above embodiment, and may be realized by another method. Hereinafter, various modification examples will be described.

(1) In the above embodiment, the stress detection system 100 is provided with the imaging unit 110, but the imaging unit 110 does not necessarily have to be provided. The stress detection system 100 only needs to acquire an image captured by imaging the stress luminescent material. For example, the stress detecting system 100 may acquire an image captured by imaging the stress luminescent material stored in some memory such as on a network. ..

(2) In the above embodiment, in the flowchart shown in FIG. 3, an example of detecting stress while imaging is shown, but this is not the case. The stress may be detected after acquiring an image captured for a certain period of time or longer by imaging the stressed mechanoluminescent body under load. In this case, it is only necessary to repeatedly execute the processes of steps S403 to S405 of FIG. 3 for each frame of the captured image.

(3) Although not particularly described in the above embodiment, the storage unit 140 stores a plurality of residual light response models according to various conditions, and the control unit 130 stores the residual light according to the conditions. The response model may be used to remove the residual light component and detect the stress. That is, the storage unit 140 includes the magnitude of the force that was the basis for generating the residual light response model, the time when the force was applied, the material of the stress-stimulated luminescent material, the material of the stress-stimulated luminescent material, the environment such as temperature and humidity, and the like. The residual light response model based on various conditions may be stored, and the stress detection system 100 may acquire the conditions for detecting the stress and detect the stress. The conditions for detecting the stress may be input by the user, or may be specified by the system by providing the stress detection system 100 with various sensors.

(4) In the above embodiment, as a method for the stress detection system to detect stress, the functions of the functional units constituting the stress detection system 100 are realized by the processor executing a stress detection program or the like. However, this is realized by logic circuits (hardware), dedicated circuits, FPGAs (Field Programmable Gate Arrays), etc. formed by integrated circuits (IC (Integrated Circuit) chips, LSIs (Large Scale Integration)), etc. in the equipment. You may. Further, these circuits may be realized by one or a plurality of integrated circuits, and the functions of the plurality of functional units shown in the above-described embodiment may be realized by one integrated circuit. LSIs are sometimes called VLSIs, super LSIs, ultra LSIs, etc., depending on the degree of integration. That is, as shown in FIG. 4, each functional unit constituting the stress detection system 100 may be realized by a physical circuit. That is, as shown in FIG. 7B, the stress detection system 100 includes an image pickup circuit 110, a reception circuit 131, a luminance value calculation circuit 132, a control circuit 130 that functions as a detection circuit 133, and a storage circuit 140a. Each circuit may have the same function as each functional unit having the same name as described above.

Further, the stress detection program may be recorded on a recording medium that can be read by a processor, and the recording medium may be a "non-temporary tangible medium" such as a tape, a disk, a card, a semiconductor memory, or a programmable logic. A circuit or the like can be used. Further, the stress detection program may be supplied to the processor via an arbitrary transmission medium (communication network, broadcast wave, etc.) capable of transmitting the stress detection program. The present invention can also be realized in the form of a data signal embedded in a carrier wave, in which the stress detection program is embodied by electronic transmission.

The stress detection program can be implemented using, for example, a script language such as ActionScript or JavaScript (registered trademark), an object-oriented programming language such as Objective-C or Java (registered trademark), or a markup language such as HTML5. ..

(5) The above-described embodiment and the configurations shown in each supplement may be combined as appropriate.

100 Stress detection system 110 Imaging unit 130 Control unit 131 Reception unit 132 Luminance value calculation unit 133 Detection unit 140 Storage unit

Claims (4)

A main light emission luminance value stress is light emitters Added to responsive to the load on the stress light-emitting body, the luminance of the main light emission is light that the main emission remaining in after a timing residual light A storage unit that stores a residual light response model that defines values and
A reception unit that accepts input of captured images of stress-stimulated luminescent materials,
A luminance value calculation unit that obtains a luminance value of the main emission by removing the luminance value of the residual light from the luminance value of each pixel of the captured image obtained by imaging the stress luminescent body based on the residual light response model.
A stress detection system including a detection unit that detects stress generated in the stress luminescent material based on the brightness value calculated by the brightness value calculation unit. It said residual optical response model, principal emission and, there is shown a change in the time series of the residual Tomeko is a model for one of the main emission units,
The reception unit receives input of a moving image of the stress-stimulated luminescent material as the captured image.
The first aspect of claim 1, wherein the luminance value calculation unit obtains a luminance value of the main emission from each pixel of the captured image received by the reception unit based on the number of units including the residual light response model. Stress detection system. A storage step for storing a residual light response model that defines a luminance value of the main emission and a luminance value of the residual light generated for the main emission.
A reception step that accepts input of a captured image of a stress-stimulated luminescent material,
A luminance calculation step of removing the luminance value of the residual light from the luminance value of each pixel of the captured image obtained by imaging the mechanoluminescent body to obtain the luminance value of the main emission based on the residual light response model.
Stress detection method computer comprising a detection step of detecting the bright Dosan out stress occurring in the stress emission based on the calculated brightness value in step executes. On the computer
A main light emission luminance value stress is light emitters Added to responsive to the load on the stress light-emitting body, the luminance of the main light emission is light that the main emission remaining in after a timing residual light A storage function that stores a residual light response model that defines values and
A reception function that accepts input of captured images of stress-stimulated luminescent materials,
Based on the residual light response model, a brightness value calculation function for removing the brightness value of the residual light from the brightness value of each pixel of the captured image obtained by imaging the stress-stimulated luminescent material to obtain the brightness value of the main emission is used.
A stress detection program that realizes a detection function that detects the stress generated in the stress luminescent material based on the brightness value calculated by the brightness value calculation function.

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