JP2020176903A - Device for measuring background data, device for measuring stress light emission and method for measuring background data - Google Patents

Abstract

To provide a background data measuring device, a stress light emission measuring device and a background data measuring method, capable of simplifying work for acquiring background data.SOLUTION: A light receiving part 5 receives light from an object to be measured. A background measurement processing part 61 performs background measurement by acquiring a signal from the light receiving part 5 for every predetermined exposure time in a state in which no stress is generated in the object to be measured. During one background measurement by the background measurement processing part 61, a plurality of measurement periods with different exposure times are included, and the exposure time is shorter as the measurement period approaches the measurement start timing.SELECTED DRAWING: Figure 3

Description

The present invention includes a background data measuring device for measuring a change over time in the luminescence intensity of the stress-luminescent substance as background data in a state where no stress is generated on the measurement object having the stress-luminescent substance. It relates to a mechanoluminescence measuring device and a background data measuring method.

By applying a load to the object to be measured, stress is generated in the object to be measured, and a mechanoluminescent substance may be used when measuring the magnitude and distribution of the stress (see, for example, Patent Document 1 below). The stress-luminescent substance emits light with an intensity corresponding to the stress. When such a mechanoluminescent substance is applied or mixed with the object to be measured and then a load is applied to the object to be measured, stress is generated in the mechanoluminescent substance at the portion where the object to be measured is distorted, and that portion is distorted. It emits light with an intensity according to the amount. Therefore, the magnitude and distribution of stress generated in the object to be measured can be measured by receiving the light emitted from the stress-luminescent substance by the light receiving unit and analyzing the light emission intensity.

When stress is generated on a mechanoluminescent object to be measured, the object to be measured is irradiated with excitation light in order to increase the emission intensity of the mechanoluminescent material, and then stress is generated on the object to be measured. .. Since the stress-luminescent substance has an afterglow property, it emits light with high intensity immediately after the object to be measured is irradiated with excitation light, and then the emission intensity gradually decreases with the passage of time. If stress is generated in the object to be measured while the luminescence intensity of the stress-stimulated luminescent material is gradually decreasing in this way, the luminescence intensity of the stress-stimulated luminescent material temporarily increases, resulting in a stress having a peak. Luminescence data can be obtained.

If the object to be measured is irradiated with excitation light under the same conditions as when the object to be measured is stressed, and then the object to be measured is not stressed, the luminescence intensity of the stress-stimulated luminescent material is gradually attenuated and has no peak. Background data is obtained. Therefore, by subtracting the background data from the stress luminescence data, it is possible to calculate the increment of the luminescence intensity due to the stress generated in the measurement object.

When acquiring stress luminescence data or background data, signals from the light receiving unit are acquired at predetermined exposure times. As a result, the change over time in the luminescence intensity for each predetermined exposure time is acquired as stress luminescence data or background data.

JP-A-2015-75477

The mode of emission of the stress-stimulated substance differs depending on how a load is applied to the object to be measured. For example, even when the same load is applied to the object to be measured, the height and width of the peak appearing in the mechanoluminescent data differ depending on whether the load is applied at a high speed or a low speed.

Specifically, when the speed at which the load is applied to the object to be measured is high, the height of the peak appearing in the mechanoluminescent data is high and the width is narrow. Therefore, if the exposure time is too long, the signal from the light receiving unit may be saturated, or the peak that changes in a short time may not be accurately captured.

On the other hand, when the speed at which the load is applied to the object to be measured is slow, the height of the peak appearing in the mechanoluminescent data is low and the width is wide. Therefore, if the exposure time is too short, the number of signal data acquired from the light receiving unit may become enormous, or the S / N ratio may deteriorate.

Therefore, it is necessary to change the interval (exposure time) of the signal from the light receiving unit when acquiring the mechanoluminescent data or the background data according to how the load is applied to the object to be measured. When creating a calibration curve, it is necessary to change the way the load is applied to the object to be measured and perform the measurement multiple times, so background data must be acquired separately each time. It was complicated.

The present invention has been made in view of the above circumstances, and provides a background data measuring device, a stress luminescence measuring device, and a background data measuring method that can simplify the work of acquiring background data. The purpose.

(1) The background data measuring apparatus according to the present invention measures a change over time in the luminescence intensity of the stress-luminescent substance as background data in a state where no stress is generated on the measurement object having the stress-luminescent substance. This is a background data measuring device of the above, and includes a light receiving unit and a background measurement processing unit. The light receiving unit receives light from the measurement object. The background measurement processing unit performs background measurement by acquiring a signal from the light receiving unit at predetermined exposure times in a state where stress is not generated on the measurement object. A plurality of measurement periods having different exposure times are included in one background measurement by the background measurement processing unit, and the measurement period closer to the measurement start timing has a shorter exposure time.

According to such a configuration, background data can be acquired by one background measurement including a plurality of measurement periods having different exposure times. Since the exposure time is shorter for the measurement period closer to the measurement start timing, if the calculation is performed based on the background data for the measurement period with the shorter exposure time, the background data when the exposure time for the measurement period is lengthened is calculated. It is possible. This makes it possible to calculate the background data for each exposure time corresponding to each measurement period based on the result of one background measurement, so that the work of acquiring the background data can be simplified. Can be done.

(2) The background data measuring device may further include a measurement period determination processing unit. The measurement period determination processing unit sets each of the plurality of measurement periods based on a plurality of stress luminescence data representing changes over time in the luminescence intensity of the stress-stimulated luminescent material when different stresses are generated in the measurement object. decide.

According to such a configuration, based on each mechanoluminescent data, it is possible to determine the measurement period required to calculate the increment of the luminescence intensity based on the stress from the stress luminescent data. Therefore, it is possible to appropriately determine a plurality of measurement periods and perform background measurement.

(3) The measurement period determination processing unit may determine the plurality of measurement periods based on the peak positions in the plurality of stress luminescence data.

According to such a configuration, the minimum measurement period required to calculate the stress-based increment of luminescence intensity from each stress luminescence data is determined based on each peak position. Therefore, it is possible to more appropriately determine a plurality of measurement periods and perform background measurement.

(4) The background data measuring device may further include a background data calculation processing unit. The background data calculation processing unit calculates background data for each exposure time corresponding to each measurement period based on the result of one background measurement by the background measurement processing unit.

According to such a configuration, the background data for each exposure time corresponding to each measurement period can be automatically calculated based on the result of one background measurement, so that the work of acquiring the background data Can be further simplified.

(5) The mechanoluminescent measurement device according to the present invention includes the background data measurement device, a mechanoluminescence measurement processing unit, and a mechanoluminescence intensity calculation processing unit. The mechanoluminescent measurement processing unit measures the time-dependent change in the mechanoluminescent intensity of the mechanoluminescent material when stress is generated in the mechanoluminescent object as stress mechanoluminescent data. The luminescence intensity calculation processing unit calculates an increment of luminescence intensity due to the stress generated in the measurement object by performing an operation of subtracting the background data from the stress luminescence data.

(6) The background data measuring method according to the present invention is for measuring a change over time in the luminescence intensity of the stress-luminescent substance as background data in a state where no stress is generated on the measurement object having the stress-luminescent substance. A method for measuring background data, which includes a background measurement step. In the background measurement step, background measurement is performed by acquiring a signal from a light receiving unit that receives light from the measurement object at predetermined exposure times in a state where no stress is generated on the measurement object. Do. A plurality of measurement periods having different exposure times are included in one background measurement by the background measurement step, and the measurement period closer to the measurement start timing has a shorter exposure time.

(7) The background data measurement method may further include a measurement period determination step. In the measurement period determination step, the plurality of measurement periods are determined based on a plurality of stress luminescence data representing changes over time in the luminescence intensity of the stress-stimulated luminescent material when different stresses are generated in the measurement object. To do.

(8) In the measurement period determination step, the plurality of measurement periods may be determined based on the peak positions in the plurality of stress luminescence data.

(9) The background data measurement method may further include a background data calculation step. In the background data calculation step, background data for each exposure time corresponding to each measurement period is calculated based on the result of one background measurement by the background measurement step.

According to the present invention, background data can be acquired by one background measurement including a plurality of measurement periods having different exposure times, so that the work of acquiring background data can be simplified.

It is a block diagram which showed the schematic structure of the stress luminescence measuring apparatus which concerns on one Embodiment of this invention. It is a figure which showed an example of the time-dependent change of the luminescence intensity of a stress luminescent substance, and shows the state in which stress is not generated in the object to be measured. It is a figure which showed an example of the time-dependent change of the luminescence intensity of a stress luminescent substance, and shows the state where stress is generated in the object to be measured. It is a block diagram for concretely explaining the electrical structure of the stress luminescence measuring apparatus of FIG. It is a figure for demonstrating a specific example of background data. It is a figure for demonstrating a specific example of stress mechanoluminescence data. It is a figure for demonstrating the mode of the background measurement in this embodiment. It is a figure for demonstrating the calculation method of the background data.

1. 1. Schematic configuration of the stress luminescence measuring device FIG. 1 is a block diagram showing a schematic configuration of the stress luminescence measuring device according to an embodiment of the present invention. The sample (measurement object 1) to be measured by this mechanoluminescent measuring device has a mechanoluminescent substance 2 having a property of emitting light when stress is generated. The stress-luminescent substance 2 may be applied to the surface of the object to be measured 1 or may be mixed inside.

The stress-luminescent substance 2 is produced from, for example, a spinel-structured, chorandum-structured or β-alumina-structured stress-luminescent substance, a silicate stress-luminescent substance, a defect-controlled aluminate high-intensity stress-luminescent substance, or a high-intensity mechanoluminescent material. Examples thereof include mechanoluminescent substances. The high-luminance mechanoluminescence material has a structure in which a wurtzite type structure and a sphalerite type structure coexist, and is composed mainly of an oxide, a sulfide, a selenium product, or a tellurium product. When a stress is generated, the stress-luminescent substance 2 emits light with an intensity corresponding to the stress.

A load is applied to the measurement object 1 having the mechanoluminescent substance 2 by the load applying device 3. When a load is applied to the measurement object 1, stress is generated in the stress-stimulated luminescent material 2 at the strained portion of the measurement object 1, and the portion emits light with an intensity corresponding to the amount of strain. As the load application device 3, for example, a tensile tester that applies a tensile force to the object 1 to be measured is used, but the load application device 3 is not limited to this and is used by other testers such as a compression tester, a bending tester, or a shear tester. May be done.

The stress luminescence measuring device according to the present embodiment includes an excitation light irradiation unit 4, a light receiving unit 5, a data processing unit 6, a storage unit 7, and the like. The excitation light irradiation unit 4 includes a light source such as an LED (Light Emitting Diode) or a fluorescent lamp. The excitation light irradiation unit 4 irradiates the measurement object 1 with excitation light for exciting the mechanoluminescent substance 2.

The light receiving unit 5 includes an image sensor such as a CCD (Charge Coupled Device) camera or a CMOS (Complementary Metal Oxide Semiconductor) image sensor. The image pickup device has, for example, a plurality of pixels, and the intensity of the light received in each pixel is detected as the emission intensity of the stress-stimulated luminescent substance 2. The emission intensity detected in each pixel of the light receiving unit 5 increases as the exposure time to the stress-stimulated luminescent substance 2 increases. In this stress luminescence measuring device, the light from the measurement object 1 (stress luminescent material 2) is received by the light receiving unit 5, and the magnitude and distribution of the stress generated in the measurement object 1 are measured by analyzing the luminescence intensity. be able to.

The data processing unit 6 is composed of, for example, a personal computer. The signal from the light receiving unit 5 is input to the data processing unit 6, and the data processing unit 6 performs data processing. The storage unit 7 is composed of, for example, a hard disk or a RAM (Random Access Memory), and stores data generated by the data processing unit 6.

2. Time-dependent change in luminescence intensity FIG. 2A is a diagram showing an example of a time-dependent change in luminescence intensity of the stress-stimulated luminescent substance 2, and shows a state in which stress is not generated in the measurement object 1. FIG. 2B is a diagram showing an example of a change over time in the emission intensity of the stress-stimulated luminescent substance 2, and shows a state in which stress is generated in the measurement object 1.

When the measurement object 1 is measured, the stress-luminescent substance 2 emits light when the measurement object 1 is irradiated with the excitation light from the excitation light irradiation unit 4. The stress-stimulated luminescent substance 2 has a property (afterglow) of continuing to emit light even after the irradiation of the excitation light is completed. Therefore, as shown in FIG. 2A, the emission intensity of the stress-stimulated luminescent substance 2 detected by the light receiving unit 5 is high immediately after the excitation light is irradiated, and then the emission intensity gradually decreases with the passage of time.

In this way, the background data as illustrated in FIG. 2A can be measured by measuring the change over time in the luminescence intensity of the stress-stimulated luminescent substance 2 in a state where no stress is generated in the object 1 to be measured. it can. On the other hand, if stress is generated in the object 1 to be measured while the emission intensity of the stress-stimulated luminescent material 2 is gradually decreasing, the emission intensity of the stress-luminescent substance 2 is temporary as illustrated in FIG. 2B. The mechanoluminescence data having a peak can be obtained. Therefore, by subtracting the background data (FIG. 2A) from the stress luminescence data (FIG. 2B), it is possible to calculate the increment of the luminescence intensity due to the stress generated in the measurement object 1.

3. 3. Electrical configuration of the mechanoluminescent measuring device FIG. 3 is a block diagram for specifically explaining the electrical configuration of the mechanoluminescent measuring device of FIG.

The data processing unit 6 has a configuration including a CPU (Central Processing Unit). The data processing unit 6 has a background measurement processing unit 61, a background data calculation processing unit 62, a stress luminescence measurement processing unit 63, a luminescence intensity calculation processing unit 64, and a measurement period determination processing unit 65 when the CPU executes a program. Functions as such. A background data storage unit 71, a mechanoluminescent data storage unit 72, and the like are assigned to the storage area of the storage unit 7.

As illustrated in FIG. 2A, the background measurement processing unit 61 performs measurement in a state where stress is not generated in the measurement object 1 (background measurement step). The measurement performed by the background measurement processing unit 61 is the background measurement. In the background measurement, the signal from the light receiving unit 5 is acquired at predetermined exposure times in a state where no stress is generated in the measurement object 1, so that the light receiving intensity at each timing is the light emitting intensity of the stress-stimulated luminescent material 2. Measured as.

In the present embodiment, a plurality of measurement periods having different exposure times are included in one background measurement. That is, during one background measurement, the signal from the light receiving unit 5 is not always acquired at a constant exposure time, but the signal from the light receiving unit 5 is acquired at each exposure time while changing the exposure time. It has become like.

The background data calculation processing unit 62 calculates the background data for each exposure time corresponding to each measurement period based on the result of one background measurement (background data calculation step). The background data corresponding to each calculated exposure time is stored in the background data storage unit 71. The method of calculating the background data by the background data calculation processing unit 62 will be described in detail later.

As illustrated in FIG. 2B, the stress luminescence measurement processing unit 63 measures the luminescence intensity of the stress luminescent substance 2 when stress is generated in the measurement object 1 (stress luminescence measurement step). The measurement performed by the stress luminescence measurement processing unit 63 is the stress luminescence measurement. In the mechanoluminescent measurement, the light-receiving intensity at each timing is measured as the mechanoluminescent substance 2 by generating stress in the object 1 to be measured while acquiring the signal from the light-receiving unit 5 at predetermined exposure times. To.

In the present embodiment, the same mechanoluminescence measurement is performed a plurality of times for the same measurement object 1. In each mechanoluminescence measurement, different stresses are generated on the measurement object 1 by changing how the load is applied to the measurement object 1. Further, in each mechanoluminescence measurement, signals from the light receiving unit 5 are acquired at different exposure times depending on how a load is applied to the measurement object 1. The stress mechanoluminescence data acquired in each mechanoluminescence measurement is stored in the stress mechanoluminescence data storage unit 72.

The luminescence intensity calculation processing unit 64 performs an operation of subtracting background data from the stress luminescence data (luminescence intensity calculation step). Specifically, a calculation is performed in which the emission intensity of the background data corresponding to each exposure time is subtracted from the emission intensity of the mechanoluminescent data for each exposure time. Thereby, it is possible to calculate the increment of the emission intensity due to the stress generated in the measurement object 1 at each exposure time.

The measurement period determination processing unit 65 determines each measurement period when the background measurement processing unit 61 performs one background measurement (measurement period determination step). In the present embodiment, each measurement period in one background measurement is determined based on each mechanoluminescent data when different stresses are generated in the measurement object 1.

As described above, the mechanoluminescent measuring device according to the present embodiment is background data for measuring the time-dependent change in the mechanoluminescent intensity of the mechanoluminescent substance 2 as background data in a state where no stress is generated in the object 1 to be measured. It constitutes a measuring device. However, the background data measuring device is configured separately from the stress luminescence measuring device, and the background data measured by the background data measuring device is used to emit light due to the stress generated in the object 1 to be measured by the stress luminescence measuring device. The configuration may be such that the strength is measured.

4. Specific Examples of Background Data and Mechanoluminescent Data FIG. 4 is a diagram for explaining specific examples of background data. FIG. 4 shows an example of background data D11, D12, and D13 when a signal from the light receiving unit 5 is always acquired at a constant exposure time without changing the exposure time during background measurement.

The background data D11 shows a change over time in the signal from the light receiving unit 5 when the signal from the light receiving unit 5 is acquired at a constant exposure time T11. The background data D12 shows a change over time in the signal from the light receiving unit 5 when the signal from the light receiving unit 5 is acquired with an exposure time T12 twice that of the background data D11. The background data D13 shows a change over time in the signal from the light receiving unit 5 when the signal from the light receiving unit 5 is acquired with an exposure time T13 twice that of the background data D12. In this way, when the exposure time is doubled, the signal intensity (emission intensity) at each timing of acquiring the signal from the light receiving unit 5 is doubled.

FIG. 5 is a diagram for explaining a specific example of the stress luminescence data. In FIG. 5, when signals are acquired from the light receiving unit 5 at the same exposure times T11, T12, and T13 as the background data D11, D12, and D13, stress is generated in the measurement object 1 in different modes. An example of the stress luminescence data D21, D22, and D23 of is shown.

In each of the mechanoluminescent data D21, D22, and D23, the timing TA for generating stress in the object 1 to be measured is the same, but the speed (tensile speed) at which stress is generated is different. Specifically, the speed at which stress is generated is slower when the stress luminescence data D22 is acquired than when the stress luminescence data D21 is acquired. Further, the speed at which stress is generated is slower when the stress luminescence data D23 is acquired than when the stress luminescence data D22 is acquired. As described above, it is preferable that the exposure times T11, T12, and T13 are lengthened as the speed at which stress is generated in the measurement object 1 (the speed at which the load is applied to the measurement object 1) is slower.

The timing TC at which the peak intensity in the stress luminescence data D22 becomes the highest is later than the timing TB at which the peak intensity in the stress luminescence data D21 becomes the highest. Further, the timing TD at which the peak intensity in the stress luminescence data D23 becomes the highest is later than the timing TC at which the peak intensity in the stress luminescence data D22 becomes the highest.

When calculating the increment of the luminescence intensity due to the stress generated in the measurement object 1 by performing the calculation of subtracting the background data D11, D12, D13 from the stress luminescence data D21, D22, D23, at least each of them is used. It suffices if there is data from the peak start timing TA in the stress luminescence data D21, D22, D23 to the timing TB, TC, and TD where the peak intensity becomes the highest. That is, the mechanoluminescent data D21 may have data of timings TA to TB, the mechanoluminescent data D22 may have data of timings TA to TC, and the mechanoluminescent data D23 may have data of timings TA to TD. All you need is.

Therefore, in the present embodiment, the background measurement is not performed separately at each exposure time T11, T12, and T13 as shown in FIG. 4, but as described below, each timing is performed during one background measurement. The exposure times T11, T12, and T13 are changed in TB, TC, and TD, and the background data corresponding to each exposure time T11, T12, and T13 is calculated based on the measurement result.

5. Method of calculating background data FIG. 6 is a diagram for explaining an aspect of background measurement in the present embodiment. As shown in FIG. 6, in the present embodiment, a plurality of measurement periods T21, T22, and T23 having different exposure times T11, T12, and T13 are included in one background measurement, and each measurement period T21, Data D31, D32, and D33 are acquired at different exposure times T11, T12, and T13 at T22 and T23.

The measurement period T21 is a period from the peak start timing TA in the stress luminescence data D21 to the timing TB in which the peak intensity in the stress luminescence data D21 becomes the highest. The measurement period T22 is a period from the timing TB at which the peak intensity in the stress luminescence data D21 is highest to the timing TC at which the peak intensity in the stress luminescence data D22 is highest. The measurement period T23 is a period from the timing TC at which the peak intensity in the stress luminescence data D22 is highest to the timing TD at which the peak intensity in the stress luminescence data D23 is highest.

In this way, each measurement period T21, T22, T23 is a measurement period determination processing unit based on each peak position (timing TB, TC, TD at which the peak intensity becomes the highest) in each stress luminescence data D21, D22, D23. Determined by 65. In each of the measurement periods T21, T22, and T23, the exposure time is shorter as the measurement period is closer to the measurement start timing. That is, the exposure time T12 in the measurement period T22 is shorter than the exposure time T13 in the measurement period T23, and the exposure time T11 in the measurement period T21 is shorter than the exposure time T12 in the measurement period T22.

FIG. 7 is a diagram for explaining a method of calculating background data. In the present embodiment, the background data D41, D42, D43 as shown in FIG. 7 is calculated based on the data D31, D32, D33 shown in FIG. 6 obtained by the background measurement.

The data D31 of the measurement period T21 obtained by the background measurement becomes the background data D41 corresponding to the stress luminescence data D21 as it is.

The background data D42 corresponding to the mechanoluminescent data D22 includes data D32 of the measurement period T22 obtained by background measurement and data calculated from the data D31 of the measurement period T21. Specifically, the data during the measurement period T21 in the case of the exposure time T12 is calculated by multiplying the emission intensity for each exposure time T11 in the data D31 of the measurement period T21 by the ratio of the exposure time T12 / T11. Will be done. By combining the data in the measurement period T21 calculated in this way with the data D32 in the measurement period T22 obtained by the background measurement, the background data D42 corresponding to the mechanoluminescent data D22 can be obtained.

The background data D43 corresponding to the mechanoluminescent data D23 is composed of the data D33 of the measurement period T23 obtained by the background measurement and the data calculated from the data D31 and D32 of the measurement periods T21 and T22. Specifically, the data during the measurement period T21 in the case of the exposure time T13 is calculated by multiplying the emission intensity for each exposure time T11 in the data D31 of the measurement period T21 by the ratio of the exposure time T13 / T11. Will be done. Further, by multiplying the emission intensity for each exposure time T12 in the data D32 of the measurement period T22 by the ratio of the exposure time T13 / T12, the data in the measurement period T22 in the case of the exposure time T13 is calculated. By combining the data in the measurement periods T21 and T22 calculated in this way with the data D33 in the measurement period T23 obtained by the background measurement, the background data D43 corresponding to the mechanoluminescent data D23 is obtained. Be done.

Using the background data D41, D42, and D43 calculated in this way, an operation is performed in which the background data D41, D42, and D43 are subtracted from the mechanoluminescent data D21, D22, and D23. Specifically, the increment of the emission intensity in the stress luminescence data D21 is calculated by performing an operation of subtracting the background data D41 from the timing TA to TB data in the stress luminescence data D21. Further, the increment of the emission intensity in the stress luminescence data D22 is calculated by performing the calculation of subtracting the background data D42 from the timing TA to TC data in the stress luminescence data D22. Further, the increment of the luminescence intensity in the stress luminescence data D23 is calculated by performing the calculation of subtracting the background data D43 from the timing TA to TD data in the stress luminescence data D23.

6. Action effect (1) In the present embodiment, as shown in FIG. 6, background data is acquired by one background measurement including a plurality of measurement periods T21, T22, T23 having different exposure times T11, T12, and T13. can do. Since the exposure time is shorter for the measurement period closer to the measurement start timing, if the calculation is performed based on the background data of the measurement period with the shorter exposure time, as shown in FIG. 7, when the exposure time in the measurement period is lengthened. It is possible to calculate the background data of. As a result, it becomes possible to calculate the background data for each exposure time T11, T12, T13 corresponding to each measurement period T21, T22, T23 based on the result of one background measurement. The work of acquiring data can be simplified.

(2) In the present embodiment, based on the stress luminescence data D21, D22, D23, the measurement period T21, required to calculate the increment of the luminescence intensity based on the stress from the stress luminescence data D21, D22, D23, T22 and T23 can be determined respectively. Therefore, the background measurement can be performed by appropriately determining a plurality of measurement periods T21, T22, and T23.

(3) In the present embodiment, the minimum measurement period T21, T22, T23 necessary for calculating the increment of the luminescence intensity based on the stress from the stress luminescence data D21, D22, D23 is the peak position (peak intensity is It is determined based on the highest timing TB, TC, TD). Therefore, it is possible to more appropriately determine the plurality of measurement periods T21, T22, and T23 and perform background measurement.

(4) In the present embodiment, the background data for each exposure time T11, T12, T13 corresponding to each measurement period T21, T22, T23 can be automatically calculated based on the result of one background measurement. Therefore, the work of acquiring background data can be further simplified.

7. Modifications In the above embodiment, the case where three measurement periods T21, T22, and T23 having different exposure times T11, T12, and T13 are included in one background measurement by the background measurement processing unit 61 has been described. However, the present invention is not limited to this, and two measurement periods or four or more measurement periods may be included in one background measurement.

The measurement period determination processing unit 65 determines a plurality of measurement periods T21, T22, T23, respectively, based on the timings TB, TC, and TD at which the peak intensities in the plurality of stress luminescence data D21, D22, and D23 are highest. The configuration was explained. However, the present invention is not limited to this, and if the measurement period is determined based on the position of each peak, the measurement period may be determined based on a timing other than the timing at which the peak intensity becomes the highest.

1 Measurement target 2 Stress luminescent material 3 Load application device 4 Excitation light irradiation unit 5 Light receiving unit 6 Data processing unit 7 Storage unit 61 Background measurement processing unit 62 Background data calculation processing unit 63 Stress luminescence measurement processing unit 64 Emission intensity calculation Processing unit 65 Measurement period determination processing unit 71 Background data storage unit 72 Mechanoluminescent data storage unit

Claims (9)

A background data measuring device for measuring a change over time in the luminescence intensity of the stress-luminescent substance as background data in a state where no stress is generated in the object to be measured having the stress-luminescent substance.
A light receiving unit that receives light from the measurement object and
It is provided with a background measurement processing unit that performs background measurement by acquiring a signal from the light receiving unit at predetermined exposure times in a state where stress is not generated on the measurement object.
One background measurement by the background measurement processing unit includes a plurality of measurement periods having different exposure times, and the measurement period closer to the measurement start timing is characterized in that the exposure time is shorter. Ground data measuring device. A measurement period determination processing unit that determines each of the plurality of measurement periods based on a plurality of stress luminescence data representing changes over time in the luminescence intensity of the stress-stimulated luminescent material when different stresses are generated in the measurement object. The background data measuring device according to claim 1, further comprising. The background data measuring device according to claim 2, wherein the measurement period determination processing unit determines each of the plurality of measurement periods based on each peak position in the plurality of stress luminescence data. A claim characterized by further including a background data calculation processing unit that calculates background data for each exposure time corresponding to each measurement period based on the result of one background measurement by the background measurement processing unit. Item 8. The background data measuring device according to any one of Items 1 to 3. The background data measuring device according to any one of claims 1 to 4.
A stress luminescence measurement processing unit that measures the change over time in the luminescence intensity of the stress luminescent material when stress is generated in the measurement object as stress luminescence data.
Stress luminescence measurement characterized by comprising a mechanoluminescent intensity calculation processing unit that calculates an increment of luminescence intensity due to stress generated in the measurement object by performing an operation of subtracting the background data from the stress luminescence data. apparatus. This is a background data measuring method for measuring a change over time in the luminescence intensity of the stress-luminescent substance as background data in a state where no stress is generated in the object to be measured having the stress-luminescent substance.
Includes a background measurement step in which background measurement is performed by acquiring a signal from a light receiving unit that receives light from the measurement object at predetermined exposure times in a state where no stress is generated on the measurement object. ,
A single background measurement by the background measurement step includes a plurality of measurement periods having different exposure times, and the background is characterized in that the measurement period closer to the measurement start timing has a shorter exposure time. Data measurement method. Further, a measurement period determination step for determining each of the plurality of measurement periods is performed based on a plurality of stress luminescence data representing changes over time in the luminescence intensity of the stress-stimulated luminescent material when different stresses are generated in the measurement object. The background data measuring method according to claim 6, further comprising. The background data measurement method according to claim 7, wherein in the measurement period determination step, the plurality of measurement periods are determined based on the respective peak positions in the plurality of stress luminescence data. 6. The claim 6 further includes a background data calculation step for calculating background data for each exposure time corresponding to each measurement period based on the result of one background measurement by the background measurement step. The background data measuring method according to any one of 8 to 8.

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