JP6876735B2 - Variable reduction equalizer, loss compensation method using it, error rate measuring device, and error rate measuring method - Google Patents

Variable reduction equalizer, loss compensation method using it, error rate measuring device, and error rate measuring method Download PDF

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JP6876735B2
JP6876735B2 JP2019047288A JP2019047288A JP6876735B2 JP 6876735 B2 JP6876735 B2 JP 6876735B2 JP 2019047288 A JP2019047288 A JP 2019047288A JP 2019047288 A JP2019047288 A JP 2019047288A JP 6876735 B2 JP6876735 B2 JP 6876735B2
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昂孝 南
昂孝 南
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Description

本発明は、伝送線路の損失を補償する可変低減イコライザ及びそれを用いた損失補償方法と伝送線路を含む被測定物の誤り率を測定する誤り率測定器及び誤り率測定方法に関する。 The present invention relates to a variable reduction equalizer for compensating for a loss on a transmission line, a loss compensation method using the same, an error rate measuring device for measuring an error rate of an object to be measured including a transmission line, and an error rate measuring method.

各種のディジタル通信装置は、利用者数の増加やマルチメディア通信の普及に伴い、より大容量の伝送能力が求められている。また、これらのディジタル通信装置におけるディジタル信号の品質評価の指標の一つとしては、受信データのうち符号誤りが発生した数と受信データの総数との比較として定義されるビット誤り率(以下、誤り率という)が知られている。 Various digital communication devices are required to have a larger capacity transmission capacity as the number of users increases and multimedia communication becomes widespread. Further, as one of the indexes for quality evaluation of digital signals in these digital communication devices, a bit error rate defined as a comparison between the number of received data in which a code error has occurred and the total number of received data (hereinafter, errors). The rate) is known.

また、上述したディジタル通信装置において、試験対象となる光電変換部品等の被試験デバイスに対して固定データを含むテスト信号を送信し、被試験デバイスを介して入力される被測定信号と基準となる参照信号とをビット単位で比較して、被測定信号の誤り率を測定する有線系の誤り率測定器として、例えば下記特許文献1に開示されるビット誤り測定装置が知られている。 Further, in the above-mentioned digital communication device, a test signal including fixed data is transmitted to a device under test such as a photoelectric conversion component to be tested, and serves as a reference with a signal under test input via the device under test. As a wired error rate measuring device that measures the error rate of the signal to be measured by comparing the reference signal in bit units, for example, the bit error measuring device disclosed in Patent Document 1 below is known.

ところで、上述した被測定信号の誤り率を測定するにあたって、高速デジタル信号をケーブルや基板といった伝送線路の中を通した場合、伝送する信号が高速になればなる程、伝送線路の導体損失と誘電体損失が大きくなって信号伝送が困難になる。 By the way, in measuring the error rate of the signal to be measured described above, when a high-speed digital signal is passed through a transmission line such as a cable or a substrate, the higher the speed of the transmitted signal, the more the conductor loss and dielectric loss of the transmission line. The body loss becomes large and signal transmission becomes difficult.

特に、数GHz(例えば1GHz)以下の低い周波数帯域では、高周波電流が導体内のインダクタンスによって導体の表面に近いところを多く流れ、中心付近にはあまり流れなくなる表皮効果という現象が生じ、この表皮効果の導体損失によるロスカーブを描くことになる。しかも、数GHz以下の低い周波数帯域のロスカーブは、数10GHz以上の高い周波数帯域のロスカーブよりも大きいカーブを描く傾向があり、ベースラインを太くするという問題がある。このため、特に誤り率測定器でPAM4信号の誤り率を測定する場合、ベースラインの細さが、そのままアイの開きに影響する。しかも、誤り率測定器では、様々な伝送線路のロスを介してPAM4信号を受けることが想定されており、伝送線路のロスを補償するための可変イコライザが必要とされている。 In particular, in a low frequency band of several GHz (for example, 1 GHz) or less, a phenomenon called a skin effect occurs in which a large amount of high-frequency current flows near the surface of the conductor due to the inductance in the conductor and does not flow much near the center. The loss curve due to the conductor loss of is drawn. Moreover, the loss curve in the low frequency band of several GHz or less tends to draw a curve larger than the loss curve in the high frequency band of several tens of GHz or more, and there is a problem that the baseline is thickened. Therefore, especially when measuring the error rate of the PAM4 signal with an error rate measuring device, the fineness of the baseline directly affects the opening of the eye. Moreover, the error rate measuring instrument is supposed to receive the PAM4 signal through the loss of various transmission lines, and a variable equalizer for compensating for the loss of the transmission line is required.

そこで、従来、伝送線路のロスを補償する可変イコライザとして、例えばFFEやDFEといったものが一般的に知られている。これらのイコライザは、高速デジタル信号の遷移に対して信号レートのナイキスト周波数付近の信号成分を補償するのに適している。 Therefore, conventionally, as variable equalizers for compensating for loss of transmission lines, for example, FFE and DFE are generally known. These equalizers are suitable for compensating for signal components near the Nyquist frequency of the signal rate for high-speed digital signal transitions.

なお、下記特許文献2には、出力信号の高周波帯域での波形劣化を抑制するエンファシス回路が開示され、下記特許文献3には、低損失かつ幅広いビットレートに対応したマルチバンドイコライザが開示されている。 The following Patent Document 2 discloses an emphasis circuit that suppresses waveform deterioration in a high frequency band of an output signal, and the following Patent Document 3 discloses a multi-band equalizer that has low loss and supports a wide range of bit rates. There is.

特開2007−274474号公報Japanese Unexamined Patent Publication No. 2007-274474 特許第5859168号公報Japanese Patent No. 5859168 特許第6226945号公報Japanese Patent No. 6226945

しかしながら、FFEやDFEによる可変イコライザでは、表皮効果による低い周波数帯域でのロスを補償するためにはタップ数を多くする必要があり、回路規模が大きくなるという問題があった。 However, in the variable equalizer by FFE or DFE, it is necessary to increase the number of taps in order to compensate for the loss in the low frequency band due to the skin effect, and there is a problem that the circuit scale becomes large.

また、特許文献2に開示される送信側のエンファシス回路を受信側の可変イコライザとして採用した場合、表皮効果による低い周波数帯域でのロスを補償するためには回路規模が大きくなってしまうという問題があった。同様に、特許文献3に開示されるマルチバンドイコライザを用いた場合でも、表皮効果による低い周波数帯域でのロスを補償するための回路を複数並べて構成する必要があり、回路規模が大きくなるという問題がある。 Further, when the emphasis circuit on the transmitting side disclosed in Patent Document 2 is adopted as the variable equalizer on the receiving side, there is a problem that the circuit scale becomes large in order to compensate for the loss in the low frequency band due to the skin effect. there were. Similarly, even when the multi-band equalizer disclosed in Patent Document 3 is used, it is necessary to arrange and configure a plurality of circuits for compensating for loss in a low frequency band due to the skin effect, which causes a problem that the circuit scale becomes large. There is.

そこで、本発明は上記問題点に鑑みてなされたものであって、簡素な回路構成により低い周波数帯域でのロスを補償することができる可変低減イコライザ及びそれを用いた損失補償方法と誤り率測定器及び誤り率測定方法を提供することを目的としている。 Therefore, the present invention has been made in view of the above problems, and is a variable reduction equalizer capable of compensating for loss in a low frequency band by a simple circuit configuration, a loss compensation method using the variable reduction equalizer, and an error rate measurement. It is an object of the present invention to provide a device and a method for measuring an error rate.

上記目的を達成するため、本発明の請求項1に記載された可変低域イコライザは、高速デジタル信号を伝送する伝送線路Waに接続されるインダクタL1と、
前記インダクタに接続され、減衰量が可変可能な可変減衰器2と、
前記可変減衰器の減衰量を前記伝送線路の損失に応じて可変制御する制御部3とを備え
前記可変減衰器は、前記インダクタに複数並列接続されることを特徴とする。
In order to achieve the above object, the variable low frequency equalizer according to claim 1 of the present invention includes an inductor L1 connected to a transmission line Wa for transmitting a high-speed digital signal and an inductor L1.
A variable attenuator 2 connected to the inductor and capable of varying the amount of attenuation,
A control unit 3 that variably controls the amount of attenuation of the variable attenuator according to the loss of the transmission line is provided .
A plurality of the variable attenuators are connected in parallel to the inductor .

本発明の請求項3に記載された可変低域イコライザを用いた損失補償方法は、高速デジタル信号を伝送する伝送線路WaにインダクタL1を接続するステップと、
減衰量が可変可能な可変減衰器2を前記インダクタに接続するステップと、
前記可変減衰器の減衰量を前記伝送線路の損失に応じて可変制御するステップと
前記インダクタに前記可変減衰器を複数並列接続するステップとを含むことを特徴とする。
The loss compensation method using the variable low-frequency equalizer according to claim 3 of the present invention includes a step of connecting the inductor L1 to a transmission line Wa for transmitting a high-speed digital signal and a step of connecting the inductor L1.
A step of connecting a variable attenuator 2 having a variable amount of attenuation to the inductor, and
A step of variably controlled in accordance with the attenuation amount of the variable attenuator to the loss of the transmission line,
It is characterized by including a step of connecting a plurality of the variable attenuators in parallel to the inductor.

本発明の請求項に記載された誤り率測定器は、請求項1の可変低域イコライザ1により被測定物Wの伝送線路Waの損失を補償して前記被測定物から伝送される信号を受信し、受信した信号と前記被測定物に入力した既知の信号との比較結果に基づいて前記被測定物の誤り率を測定することを特徴とする。 The error rate measuring instrument according to claim 3 of the present invention compensates for the loss of the transmission line Wa of the measured object W by the variable low frequency equalizer 1 of claim 1 and obtains a signal transmitted from the measured object. It is characterized in that the error rate of the measured object is measured based on the result of comparison between the received signal and the known signal input to the measured object.

本発明の請求項に記載された誤り率測定方法は、請求項の可変低域イコライザを用いた誤り率測定方法により被測定物Wの伝送線路Waの損失を補償して前記被測定物から伝送される信号を受信し、受信した信号と前記被測定物に入力した既知の信号との比較結果に基づいて前記被測定物の誤り率を測定することを特徴とする。 The error rate measuring method according to claim 4 of the present invention compensates for the loss of the transmission line Wa of the measured object W by the error rate measuring method using the variable low frequency equalizer according to claim 2, and is said to be the measured object. It is characterized in that the signal transmitted from is received and the error rate of the measured object is measured based on the comparison result between the received signal and the known signal input to the measured object.

本発明によれば、伝送線路の損失に応じて可変減衰器の減衰量を可変制御することにより、幅広い伝送線路のロスに対し、特に低周波数帯域にフォーカスして波形補償を簡素な構成で行うことができる。 According to the present invention, by variably controlling the attenuation amount of the variable attenuator according to the loss of the transmission line, waveform compensation is performed with a simple configuration by focusing on a wide frequency band in particular for the loss of a wide transmission line. be able to.

(a)本発明に係る可変低域イコライザの概略構成を示す図、(b)バリアブルアッテネータの回路構成図である。(A) It is a figure which shows the schematic structure of the variable low-pass equalizer which concerns on this invention, and (b) is the circuit structure figure of the variable attenuator. 本発明に係る可変低域イコライザの他の構成を示す図である。It is a figure which shows the other structure of the variable low-pass equalizer which concerns on this invention. 本発明に係る可変低域イコライザを用いた損失補償方法のフローチャートである。It is a flowchart of the loss compensation method using the variable low-pass equalizer which concerns on this invention. 本発明に係る可変低域イコライザを用いて損失補償する場合の具体例を示す図である。It is a figure which shows the specific example in the case of loss compensation using the variable low-pass equalizer which concerns on this invention. (a)図4においてナイキスト周波数25GHzでの損失が1.5dBの伝送線路とナイキスト周波数25GHzでの損失が4.5dBの伝送線路の周波数特性を示す図、(b)図4において減衰量が1dBと10dBのときの可変低域イコライザの周波数特性を示す図である。FIG. 4A shows the frequency characteristics of a transmission line having a loss of 1.5 dB at a Nyquist frequency of 25 GHz and a transmission line having a loss of 4.5 dB at a Nyquist frequency of 25 GHz, and FIG. 4B shows an attenuation of 1 dB in FIG. It is a figure which shows the frequency characteristic of the variable low region equalizer at the time of 10dB. ナイキスト周波数25GHzでの損失が1.5dBの伝送線路における図4の各部のアイ波形を示す図である。It is a figure which shows the eye waveform of each part of FIG. 4 in the transmission line which the loss at a Nyquist frequency 25GHz is 1.5dB. ナイキスト周波数25GHzでの損失が4.5dBの伝送線路における図5の各部のアイ波形を示す図である。It is a figure which shows the eye waveform of each part of FIG. 5 in the transmission line which the loss at a Nyquist frequency 25GHz is 4.5dB. 本発明に係る可変低域イコライザを用いた誤り率測定器のブロック構成図である。It is a block block diagram of the error rate measuring instrument using the variable low-pass equalizer which concerns on this invention.

以下、本発明を実施するための形態について、添付した図面を参照しながら詳細に説明する。 Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the attached drawings.

[本発明の概要について]
インダクタ(コイル)Lと抵抗Rを備えたLRイコライザは、少ないインダクタLで数GHzから効く低域イコライザとして知られており、回路規模も少なくて済む。
[Overview of the present invention]
The LR equalizer provided with the inductor (coil) L and the resistor R is known as a low-frequency equalizer that works from several GHz with a small inductor L, and the circuit scale can be small.

しかしながら、インダクタLは可変することが難しい。そこで、抵抗Rを可変することを考えると、例えばデジタルポテンショメータなどの電子制御による可変抵抗は、無視できない寄生容量を持っており、この寄生容量とインダクタの不要共振による性能劣化を避けることができない。 However, it is difficult to change the inductor L. Therefore, considering that the resistor R is variable, for example, an electronically controlled variable resistor such as a digital potentiometer has a parasitic capacitance that cannot be ignored, and performance deterioration due to this parasitic capacitance and unnecessary resonance of the inductor cannot be avoided.

そこで、本発明では、抵抗Rの代わりとして、数GHzまで周波数帯域を持つ可変アッテネータを用いることで可変低域イコライザを実現する。これにより、幅広い伝送線路のロスに対して補償を行うことできる。また、これを用いた誤り率測定器により、幅広い伝送線路のロスに対応しながら誤り率の測定が可能となる。 Therefore, in the present invention, a variable low frequency equalizer is realized by using a variable attenuator having a frequency band up to several GHz instead of the resistor R. This makes it possible to compensate for the loss of a wide range of transmission lines. Further, the error rate measuring device using this makes it possible to measure the error rate while dealing with the loss of a wide range of transmission lines.

[可変低域イコライザの構成について]
図1(a)に示すように、本実施の形態の可変低域イコライザ1(1A)は、減衰量を可変することで低周波帯域の減衰量を変化させるため、インダクタ(コイル)L1、可変減衰器2、制御部3を備えて概略構成される。
[About the configuration of the variable low-frequency equalizer]
As shown in FIG. 1A, the variable low-frequency equalizer 1 (1A) of the present embodiment changes the attenuation amount in the low frequency band by changing the attenuation amount, so that the inductor (coil) L1 is variable. It is roughly configured with an attenuator 2 and a control unit 3.

インダクタL1は、例えば円錐コイルやワイヤボンディングによる微小なインダクタンスを含み、目的とする伝送線路Waの損失に応じて任意のインダクタンスに設定される。インダクタL1は、図1(a)に示すように、一端が伝送線路Waに接続され、他端が可変減衰器2に接続される。 The inductor L1 includes, for example, a minute inductance due to a conical coil or wire bonding, and is set to an arbitrary inductance according to the loss of the target transmission line Wa. As shown in FIG. 1A, one end of the inductor L1 is connected to the transmission line Wa, and the other end is connected to the variable attenuator 2.

可変減衰器2は、電子制御による減衰量の可変が可能なアッテネータで構成され、伝送線路WaからインダクタL1を介して入力される高速デジタル信号(例えば50Gbaud、1Vpp)を所定の減衰量で減衰する。 The variable attenuator 2 is composed of an attenuator capable of varying the amount of attenuation by electronic control, and attenuates a high-speed digital signal (for example, 50 Gbaud, 1 Vpp) input from the transmission line Wa via the inductor L1 with a predetermined amount of attenuation. ..

可変減衰器2は、端子2a,2bおよび制御端子(不図示)を有し、端子2aがインダクタL1に接続され、端子2bには反射の影響を防ぐための片側直流終端用抵抗RLが接続される。 The variable attenuator 2 has terminals 2a and 2b and a control terminal (not shown), the terminal 2a is connected to the inductor L1, and the one-sided DC termination resistor RL for preventing the influence of reflection is connected to the terminal 2b. To.

なお、可変減衰器2の端子2bは、減衰量の可変量を大きくするためには高い抵抗が必要となるので、開放(オープン)してもよい。 The terminal 2b of the variable attenuator 2 may be opened because a high resistance is required to increase the variable amount of the attenuation.

可変減衰器2は、図1(b)に示すように、例えばバリアブルアッテネータ2Aで構成することができる。 As shown in FIG. 1 (b), the variable attenuator 2 can be configured by, for example, a variable attenuator 2A.

バリアブルアッテネータ2Aは、第1可変抵抗R1、第2可変抵抗R2、第3可変抵抗R3がT型接続されたものである。すなわち、第1可変抵抗R1は、一端が端子2aに接続され、他端が第2可変抵抗R2の一端に接続される。第2可変抵抗R2は、一端が第1可変抵抗R1の他端に接続され、他端が端子2bに接続される。第3可変抵抗R3は、一端が第1可変抵抗R1と第2可変抵抗R2との間に接続され、他端が接地される。 The variable attenuator 2A is a T-type connection of a first variable resistor R1, a second variable resistor R2, and a third variable resistor R3. That is, one end of the first variable resistor R1 is connected to the terminal 2a, and the other end is connected to one end of the second variable resistor R2. One end of the second variable resistor R2 is connected to the other end of the first variable resistor R1, and the other end is connected to the terminal 2b. One end of the third variable resistor R3 is connected between the first variable resistor R1 and the second variable resistor R2, and the other end is grounded.

バリアブルアッテネータ2Aは、制御部3により、第1乃至第3可変抵抗R1,R2,R3のそれぞれの抵抗値が可変制御され、減衰量を所定ステップ(例えば0.5dBステップ)で連続的に可変する。 In the variable attenuator 2A, the resistance values of the first to third variable resistors R1, R2, and R3 are variably controlled by the control unit 3, and the attenuation amount is continuously changed in a predetermined step (for example, 0.5 dB step). ..

制御部3は、伝送線路Waの損失に応じて可変減衰器2の減衰量を可変制御する。制御部3は、例えば可変減衰器2として図1(b)のバリアブルアッテネータ2Aを用いた場合、第1乃至第3可変抵抗R1,R2,R3のそれぞれの抵抗値を伝送線路Waの損失に応じて可変制御する。 The control unit 3 variably controls the amount of attenuation of the variable attenuator 2 according to the loss of the transmission line Wa. When the variable attenuator 2A shown in FIG. 1B is used as the variable attenuator 2, the control unit 3 sets the resistance values of the first to third variable resistors R1, R2, and R3 according to the loss of the transmission line Wa. Variable control.

なお、可変減衰器2は、図1(b)のバリアブルアッテネータ2Aに限定されるものではない。例えば複数の減衰器を組み合わせ、スイッチング動作により所望の減衰量を得る切り替え式のステップアッテネータを可変減衰器2として用いることもできる。 The variable attenuator 2 is not limited to the variable attenuator 2A shown in FIG. 1 (b). For example, a switching type step attenuator that combines a plurality of attenuators and obtains a desired amount of attenuation by a switching operation can be used as the variable attenuator 2.

また、図1(a)の可変低域イコライザ1Aは、1つの可変減衰器2がインダクタL1を介して伝送線路Waに接続された構成であるが、複数の可変減衰器2がインダクタL1を介して伝送線路Waに接続された構成としてもよい。例えば図2に示すように、2つの可変減衰器2がインダクタL1に並列接続して可変低域イコライザ1(1B)を構成すれば、可変減衰器2が1つの場合よりも減衰量の可変範囲を広げることができる。なお、図2において図1(a)と同一の構成要素には同一番号を付している。 Further, the variable low frequency equalizer 1A of FIG. 1A has a configuration in which one variable attenuator 2 is connected to the transmission line Wa via the inductor L1, but a plurality of variable attenuators 2 are connected via the inductor L1. It may be configured to be connected to the transmission line Wa. For example, as shown in FIG. 2, if two variable attenuators 2 are connected in parallel to the inductor L1 to form a variable low frequency equalizer 1 (1B), a variable range of attenuation is obtained as compared with the case where one variable attenuator 2 is used. Can be expanded. In FIG. 2, the same components as those in FIG. 1 (a) are assigned the same numbers.

[損失補償方法について]
次に、上記のように構成される可変低域イコライザ1(1A,1B)を用いた損失補償方法の一例について図3を参照しながら説明する。
[About loss compensation method]
Next, an example of the loss compensation method using the variable low-frequency equalizer 1 (1A, 1B) configured as described above will be described with reference to FIG.

制御部3は、伝送線路Waを介して高速デジタル信号(例えばPAM4信号)を受信する場合、伝送線路Waの損失が基準損失より低いか否かに応じて可変減衰器2の減衰量を可変制御する。 When the control unit 3 receives a high-speed digital signal (for example, a PAM4 signal) via the transmission line Wa, the control unit 3 variably controls the amount of attenuation of the variable attenuator 2 depending on whether or not the loss of the transmission line Wa is lower than the reference loss. To do.

具体的に、受信する高速デジタル信号が50Gbaud,1Vppであって、ナイキスト周波数25GHzの所定の損失(例えば−3dB)を基準損失とすると、この基準損失より低い場合(ST1−Yes)は、可変減衰器2の減衰量を下げる方向に所定ステップ毎に減衰量を可変制御する(ST2)。これに対し、基準損失より高い場合は(ST1−No)、可変減衰器2の減衰量を上げる方向に所定ステップ毎に減衰量を可変制御する(ST3)。 Specifically, if the received high-speed digital signal is 50 Gbaud, 1 Vpp, and a predetermined loss (for example, -3 dB) at a Nyquist frequency of 25 GHz is used as the reference loss, the variable attenuation is lower than this reference loss (ST1-Yes). The attenuation amount is variably controlled for each predetermined step in the direction of lowering the attenuation amount of the device 2 (ST2). On the other hand, when it is higher than the reference loss (ST1-No), the attenuation amount is variably controlled for each predetermined step in the direction of increasing the attenuation amount of the variable attenuator 2 (ST3).

そして、制御部3は、ベースラインが細く、最もアイの開いた最適な信号波形が出力されると(ST4−Yes、ST5−Yes)、可変減衰器2の減衰量の可変制御を停止する(ST6)。 Then, when the optimum signal waveform having a narrow baseline and the most open eye is output (ST4-Yes, ST5-Yes), the control unit 3 stops the variable control of the attenuation amount of the variable attenuator 2 (ST4-Yes, ST5-Yes). ST6).

なお、可変減衰器2の減衰量は、0dBまたは前回停止した減衰量から所定ステップ毎に可変制御してもよい。また、予めシミュレーションにより伝送線路Waの損失に適した可変減衰器2の減衰量を記憶部に記憶しておき、使用する伝送線路Waの損失が判っている場合には、使用する伝送線路Waの損失に対応した可変減衰器2の減衰量を制御部3が記憶部から読み出して可変減衰器2の減衰量を制御することもできる。 The amount of attenuation of the variable attenuator 2 may be variably controlled at each predetermined step from 0 dB or the amount of attenuation stopped last time. Further, the attenuation amount of the variable attenuator 2 suitable for the loss of the transmission line Wa is stored in the storage unit in advance by simulation, and when the loss of the transmission line Wa to be used is known, the transmission line Wa to be used is used. It is also possible for the control unit 3 to read the attenuation amount of the variable attenuator 2 corresponding to the loss from the storage unit and control the attenuation amount of the variable attenuator 2.

[シミュレーション結果について]
次に、図4に示すように、伝送線路Waと信号源Wbを有する被測定物Wに可変低域イコライザ1(1A)を接続してシミュレーションを行ったときの結果について説明する。
[Simulation results]
Next, as shown in FIG. 4, the result when the variable low-frequency equalizer 1 (1A) is connected to the object W having the transmission line Wa and the signal source Wb and the simulation is performed will be described.

ここでは、高速デジタル信号の一例として50Gbaud,1VppのPAM4信号を発生する信号源Wbを有する被測定物Wを用い、図5(a)に示すように、ナイキスト周波数25GHzでの伝送線路Waの損失が低い条件a(伝送線路Waの損失:1.5dBとナイキスト周波数25GHzでの伝送線路Waの損失が高い条件b(伝送線路Waの損失:4.5dB)について可変低域イコライザ1(1A)によるシミュレーションを行った。 Here, as an example of a high-speed digital signal, an object W having a signal source Wb that generates a PAM4 signal of 50 Gbaud and 1 Vpp is used, and as shown in FIG. 5 (a), a loss of a transmission line Wa at a Nyquist frequency of 25 GHz is used. According to the variable low frequency equalizer 1 (1A) under the condition a (loss of transmission line Wa: 1.5 dB and loss of transmission line Wa at Nyquist frequency 25 GHz) is high (loss of transmission line Wa: 4.5 dB). A simulation was performed.

なお、このシミュレーションでは、インダクタL1のインダクタンスを8nHとし、可変低域イコライザ1(1A)の可変減衰器2の減衰量が1dBと10dBの場合についてそれぞれ測定した。 In this simulation, the inductance of the inductor L1 was set to 8 nH, and the attenuation amounts of the variable attenuator 2 of the variable low frequency equalizer 1 (1A) were measured at 1 dB and 10 dB, respectively.

その結果、伝送線路Waの損失が低い条件aでは、可変減衰器2の減衰量が1dB(Set1)の方が10dB(Set2)のときよりもPAM4波形のアイが開いた。 As a result, under the condition a where the loss of the transmission line Wa is low, the eye of the PAM4 waveform was opened when the attenuation amount of the variable attenuator 2 was 1 dB (Set1) as compared with when the loss amount was 10 dB (Set2).

これに対し、伝送線路Waの損失が高い条件bでは、可変減衰器2の減衰量が10dB(Set2)の方が1dB(Set1)よりもPAM4波形のアイが開いた。 On the other hand, under the condition b in which the loss of the transmission line Wa is high, when the attenuation amount of the variable attenuator 2 is 10 dB (Set2), the eye of the PAM4 waveform is opened more than when the loss amount is 1 dB (Set1).

以上のことから、高速デジタル信号を受信するにあたって、伝送線路Waの損失に応じて可変減衰器2の減衰量を可変制御することで伝送線路Waの損失を補償することができる。 From the above, when receiving a high-speed digital signal, the loss of the transmission line Wa can be compensated by variably controlling the amount of attenuation of the variable attenuator 2 according to the loss of the transmission line Wa.

上述した可変低域イコライザ1は、被測定物Wに既知のパターン信号(高速デジタル信号、例えばPAM4信号)を入力し、この既知のパターン信号に伴って被測定物Wから折り返されるパターン信号を受信し、受信したパターン信号と被測定物Wに入力した既知のパターン信号との比較結果に基づいて被測定物Wの誤り率を測定する図8の誤り率測定器11に組み込んで用いることができる。 The variable low frequency equalizer 1 described above inputs a known pattern signal (high-speed digital signal, for example, PAM4 signal) to the object W to be measured, and receives a pattern signal folded back from the object W to be measured along with the known pattern signal. Then, it can be incorporated into the error rate measuring device 11 of FIG. 8 for measuring the error rate of the measured object W based on the comparison result between the received pattern signal and the known pattern signal input to the measured object W. ..

この誤り率測定器11では、被測定物Wの誤り率測定を行うにあたって、操作表示部12にて誤り率測定に関わる各種パラメータの設定を行う。そして、パターン発生部13は、制御部14の制御により、設定に基づく既知のパターン信号(高速デジタル信号)をテスト信号として被測定物Wに送信する。 In the error rate measuring device 11, when measuring the error rate of the object W to be measured, the operation display unit 12 sets various parameters related to the error rate measurement. Then, the pattern generation unit 13 transmits a known pattern signal (high-speed digital signal) based on the setting to the object W to be measured as a test signal under the control of the control unit 14.

続いて、可変低域イコライザ1は、制御部14の制御により、被測定物Wの伝送線路の損失を補償し、パターン発生部13から被測定物Wへのテスト信号の送信に伴って被測定物Wから折り返されるパターン信号を受信してエラー検出部14に出力する。 Subsequently, the variable low-frequency equalizer 1 compensates for the loss of the transmission line of the object to be measured W by the control of the control unit 14, and is measured as the pattern generation unit 13 transmits the test signal to the object W to be measured. The pattern signal returned from the object W is received and output to the error detection unit 14.

その後、エラー検出部15は、制御部14の制御により、可変低域イコライザ1を介して被測定物Wから伝送線路Waの損失を補償して受信した信号と既知の信号とをビット比較してエラーを検出し、その結果を操作表示部12に表示する。 After that, the error detection unit 15 bit-compares the signal received by compensating for the loss of the transmission line Wa from the object W via the variable low-frequency equalizer 1 and the known signal under the control of the control unit 14. An error is detected and the result is displayed on the operation display unit 12.

このように、本実施の形態によれば、数GHzまで周波数帯域を持つ可変減衰器2を抵抗の代わりに用い、伝送線路の損失に応じて可変減衰器2の減衰量を可変制御することにより、幅広い伝送線路のロスに対し、特に低周波数帯域にフォーカスして波形補償を簡素な構成で行うことができる。 As described above, according to the present embodiment, the variable attenuator 2 having a frequency band up to several GHz is used instead of the resistor, and the attenuation amount of the variable attenuator 2 is variably controlled according to the loss of the transmission line. For the loss of a wide range of transmission lines, waveform compensation can be performed with a simple configuration by focusing on the low frequency band in particular.

以上、本発明に係る可変低減イコライザ及びそれを用いた損失補償方法と誤り率測定器及び誤り率測定方法の最良の形態について説明したが、この形態による記述および図面により本発明が限定されることはない。すなわち、この形態に基づいて当業者等によりなされる他の形態、実施例および運用技術などはすべて本発明の範疇に含まれることは勿論である。 The best form of the variable reduction equalizer according to the present invention, the loss compensation method using the same, the error rate measuring device, and the error rate measuring method has been described above, but the present invention is limited by the description and drawings in this form. There is no. That is, it goes without saying that all other forms, examples, operational techniques, and the like made by those skilled in the art based on this form are included in the scope of the present invention.

1(1A,1B) 可変低域イコライザ
2 可変減衰器
2a,2b 端子
2A バリアブルアッテネータ
3 制御部
11 誤り率測定器
12 操作表示部
13 パターン発生部
14 制御部
15 エラー検出部
L1 インダクタ
R1.R2,R3 可変抵抗
RL 片側直流終端用抵抗
W 被測定物
Wa 伝送線路
Wb 信号源
1 (1A, 1B) Variable low-frequency equalizer 2 Variable attenuator 2a, 2b terminal 2A Variable attenuator 3 Control unit 11 Error rate measuring instrument 12 Operation display unit 13 Pattern generator 14 Control unit 15 Error detection unit L1 Inductor R1. R2, R3 Variable resistor RL One-sided DC termination resistor W Measured object Wa Transmission line Wb Signal source

Claims (4)

高速デジタル信号を伝送する伝送線路(Wa)に接続されるインダクタ(L1)と、
前記インダクタに接続され、減衰量が可変可能な可変減衰器(2)と、
前記可変減衰器の減衰量を前記伝送線路の損失に応じて可変制御する制御部(3)とを備え
前記可変減衰器は、前記インダクタに複数並列接続されることを特徴とする可変低域イコライザ。
An inductor (L1) connected to a transmission line (Wa) that transmits high-speed digital signals,
A variable attenuator (2) connected to the inductor and capable of varying the amount of attenuation,
A control unit (3) that variably controls the amount of attenuation of the variable attenuator according to the loss of the transmission line is provided .
The variable attenuator is a variable low frequency equalizer characterized in that a plurality of the variable attenuators are connected in parallel to the inductor.
高速デジタル信号を伝送する伝送線路(Wa)にインダクタ(L1)を接続するステップと、
減衰量が可変可能な可変減衰器(2)を前記インダクタに接続するステップと、
前記可変減衰器の減衰量を前記伝送線路の損失に応じて可変制御するステップと
前記インダクタに前記可変減衰器を複数並列接続するステップとを含むことを特徴とする可変低域イコライザを用いた損失補償方法。
The step of connecting the inductor (L1) to the transmission line (Wa) that transmits high-speed digital signals, and
A step of connecting a variable attenuator (2) having a variable amount of attenuation to the inductor, and
A step of variably controlled in accordance with the attenuation amount of the variable attenuator to the loss of the transmission line,
A loss compensation method using a variable low-frequency equalizer, which comprises a step of connecting a plurality of the variable attenuators in parallel to the inductor.
請求項1の可変低域イコライザ(1)により被測定物(W)の伝送線路(Wa)の損失を補償して前記被測定物から伝送される信号を受信し、受信した信号と前記被測定物に入力した既知の信号との比較結果に基づいて前記被測定物の誤り率を測定することを特徴とする誤り率測定器。 The variable low frequency equalizer (1) of claim 1 compensates for the loss of the transmission line (Wa) of the object to be measured (W), receives the signal transmitted from the object to be measured, and receives the received signal and the object to be measured. An error rate measuring device for measuring an error rate of the object to be measured based on a comparison result with a known signal input to the object. 請求項の可変低域イコライザを用いた誤り率測定方法により被測定物(W)の伝送線路(Wa)の損失を補償して前記被測定物から伝送される信号を受信し、受信した信号と前記被測定物に入力した既知の信号との比較結果に基づいて前記被測定物の誤り率を測定することを特徴とする誤り率測定方法。 The error rate measuring method using the variable low frequency equalizer according to claim 2 compensates for the loss of the transmission line (Wa) of the measured object (W), receives the signal transmitted from the measured object, and receives the received signal. An error rate measuring method, characterized in that the error rate of the measured object is measured based on the result of comparison with a known signal input to the measured object.
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