JP6827340B2 - ソフトウェア試験装置、ソフトウェア試験システム、ソフトウェア試験方法およびプログラム - Google Patents

ソフトウェア試験装置、ソフトウェア試験システム、ソフトウェア試験方法およびプログラム Download PDF

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JP6827340B2
JP6827340B2 JP2017027927A JP2017027927A JP6827340B2 JP 6827340 B2 JP6827340 B2 JP 6827340B2 JP 2017027927 A JP2017027927 A JP 2017027927A JP 2017027927 A JP2017027927 A JP 2017027927A JP 6827340 B2 JP6827340 B2 JP 6827340B2
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program
general
test
plc
subroutine
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JP2018133034A (ja
JP2018133034A5 (https=
Inventor
広昴 岡崎
広昴 岡崎
法貴 ▲柳▼井
法貴 ▲柳▼井
山田　昌弘
昌弘 山田
裕 宮嶋
裕 宮嶋
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Mitsubishi Heavy Industries Engineering Ltd
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Mitsubishi Heavy Industries Engineering Ltd
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Priority to JP2017027927A priority Critical patent/JP6827340B2/ja
Priority to SG11201906881QA priority patent/SG11201906881QA/en
Priority to PCT/JP2018/005583 priority patent/WO2018151277A1/ja
Priority to US16/481,485 priority patent/US10915438B2/en
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/04—Program control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
    • G05B19/056—Programming the PLC
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3668—Testing of software
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3698—Environments for analysis, debugging or testing of software
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/40—Transformation of program code
    • G06F8/51—Source to source
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/10—Plc systems
    • G05B2219/13—Plc programming
    • G05B2219/13022—Convert source program to intermediate program

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Automation & Control Theory (AREA)
  • Software Systems (AREA)
  • Programmable Controllers (AREA)
  • Debugging And Monitoring (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Stored Programmes (AREA)
JP2017027927A 2017-02-17 2017-02-17 ソフトウェア試験装置、ソフトウェア試験システム、ソフトウェア試験方法およびプログラム Active JP6827340B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017027927A JP6827340B2 (ja) 2017-02-17 2017-02-17 ソフトウェア試験装置、ソフトウェア試験システム、ソフトウェア試験方法およびプログラム
SG11201906881QA SG11201906881QA (en) 2017-02-17 2018-02-16 Software-testing device, software-testing system, software-testing method, and program
PCT/JP2018/005583 WO2018151277A1 (ja) 2017-02-17 2018-02-16 ソフトウェア試験装置、ソフトウェア試験システム、ソフトウェア試験方法およびプログラム
US16/481,485 US10915438B2 (en) 2017-02-17 2018-02-16 Software-testing device, software-testing system, software-testing method, and program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017027927A JP6827340B2 (ja) 2017-02-17 2017-02-17 ソフトウェア試験装置、ソフトウェア試験システム、ソフトウェア試験方法およびプログラム

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JP2018133034A JP2018133034A (ja) 2018-08-23
JP2018133034A5 JP2018133034A5 (https=) 2019-12-26
JP6827340B2 true JP6827340B2 (ja) 2021-02-10

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US (1) US10915438B2 (https=)
JP (1) JP6827340B2 (https=)
SG (1) SG11201906881QA (https=)
WO (1) WO2018151277A1 (https=)

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CN110515840A (zh) * 2019-08-05 2019-11-29 华东师范大学 一种面向plc程序的自动化测试用例生成方法
CN110532177A (zh) * 2019-08-05 2019-12-03 华东师范大学 一种面向plc程序的自动化测试用例生成系统
JP7199754B2 (ja) * 2019-12-05 2023-01-06 株式会社アクセル 設計支援装置、設計支援方法、設計支援プログラム及び設計支援システム
CN111104205A (zh) * 2019-12-24 2020-05-05 浙江中控技术股份有限公司 一种st语言的解释执行方法及系统
EP3889703B1 (en) * 2020-03-31 2023-02-01 Mitsubishi Electric R&D Centre Europe B.V. Method and apparatus for expressing and verifying functional specifications of a programmable logic controller program
CN116615720A (zh) 2020-12-21 2023-08-18 发那科株式会社 梯形图程序解析装置
EP4047482A1 (en) * 2021-02-19 2022-08-24 Mitsubishi Electric R&D Centre Europe B.V. Improved checking of correctness of a plc program
CN114610622B (zh) * 2022-03-14 2024-05-28 浙江中控技术股份有限公司 一种系统功能块自动化测试分层设计方法及相关装置
DE102023203626A1 (de) * 2023-04-20 2024-10-24 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Berücksichtigung einer Rückmeldung bei einem Softwaretest
US12608299B2 (en) 2023-07-13 2026-04-21 Cloudblue Llc System and method for automated unit test generation for programming source code

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JP2018133034A (ja) 2018-08-23
US10915438B2 (en) 2021-02-09
SG11201906881QA (en) 2019-09-27
US20190391910A1 (en) 2019-12-26
WO2018151277A1 (ja) 2018-08-23

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