JP6724484B2 - 検品処理装置、検品システム、商品マスタ登録装置、検品処理方法及びプログラム - Google Patents

検品処理装置、検品システム、商品マスタ登録装置、検品処理方法及びプログラム Download PDF

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Publication number
JP6724484B2
JP6724484B2 JP2016069899A JP2016069899A JP6724484B2 JP 6724484 B2 JP6724484 B2 JP 6724484B2 JP 2016069899 A JP2016069899 A JP 2016069899A JP 2016069899 A JP2016069899 A JP 2016069899A JP 6724484 B2 JP6724484 B2 JP 6724484B2
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Japan
Prior art keywords
inspection
product
image
unit
data
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JP2016069899A
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Japanese (ja)
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JP2017178574A (ja
Inventor
康 日高
康 日高
克彦 近藤
克彦 近藤
友宏 小南
友宏 小南
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NEC Corp
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NEC Corp
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Priority to JP2016069899A priority Critical patent/JP6724484B2/ja
Priority to PCT/JP2017/012121 priority patent/WO2017170260A1/ja
Priority to SG11201807007PA priority patent/SG11201807007PA/en
Priority to TW106110272A priority patent/TWI770015B/zh
Publication of JP2017178574A publication Critical patent/JP2017178574A/ja
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Publication of JP6724484B2 publication Critical patent/JP6724484B2/ja
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G1/00—Storing articles, individually or in orderly arrangement, in warehouses or magazines
    • B65G1/02—Storage devices
    • B65G1/04—Storage devices mechanical
    • B65G1/137—Storage devices mechanical with arrangements or automatic control means for selecting which articles are to be removed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G19/00—Weighing apparatus or methods adapted for special purposes not provided for in the preceding groups
    • G01G19/52—Weighing apparatus combined with other objects, e.g. furniture
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
JP2016069899A 2016-03-31 2016-03-31 検品処理装置、検品システム、商品マスタ登録装置、検品処理方法及びプログラム Active JP6724484B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2016069899A JP6724484B2 (ja) 2016-03-31 2016-03-31 検品処理装置、検品システム、商品マスタ登録装置、検品処理方法及びプログラム
PCT/JP2017/012121 WO2017170260A1 (ja) 2016-03-31 2017-03-24 検品処理装置、検品システム、商品マスタ登録装置、検品処理方法及びプログラム
SG11201807007PA SG11201807007PA (en) 2016-03-31 2017-03-24 Inspection processing device, inspection system, commodity master registration device, inspection processing method, and program
TW106110272A TWI770015B (zh) 2016-03-31 2017-03-28 物品檢查處理裝置、物品檢查系統、商品基本資料登錄裝置、物品檢查處理方法及程式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016069899A JP6724484B2 (ja) 2016-03-31 2016-03-31 検品処理装置、検品システム、商品マスタ登録装置、検品処理方法及びプログラム

Publications (2)

Publication Number Publication Date
JP2017178574A JP2017178574A (ja) 2017-10-05
JP6724484B2 true JP6724484B2 (ja) 2020-07-15

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JP2016069899A Active JP6724484B2 (ja) 2016-03-31 2016-03-31 検品処理装置、検品システム、商品マスタ登録装置、検品処理方法及びプログラム

Country Status (4)

Country Link
JP (1) JP6724484B2 (zh)
SG (1) SG11201807007PA (zh)
TW (1) TWI770015B (zh)
WO (1) WO2017170260A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7291264B2 (ja) * 2017-11-02 2023-06-14 株式会社オービック 計算処理装置、計算処理方法および計算処理プログラム
US11966435B2 (en) 2018-03-20 2024-04-23 Nec Corporation Information processing apparatus, control method, and program
CN110443553B (zh) * 2019-08-15 2022-08-23 深圳市海思睿科技有限公司 一种基于物品存储箱的无人值守物品管理方法
JP7388871B2 (ja) * 2019-10-18 2023-11-29 株式会社キッツ 判定装置、判定方法および判定プログラム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0891543A (ja) * 1994-09-28 1996-04-09 Omron Corp 画像処理方法およびその装置
JP2004318488A (ja) * 2003-04-16 2004-11-11 Konica Minolta Photo Imaging Inc 製品検査方法及び製品検査装置
US8131055B2 (en) * 2008-01-31 2012-03-06 Caterpillar Inc. System and method for assembly inspection
BRPI0800754A2 (pt) * 2008-03-25 2020-09-24 Sicpa Holding S.A. Sistema de controle de produção integrado por meio de processamento de imagem e codificação automatizada
JP2011039872A (ja) * 2009-08-13 2011-02-24 Komatsu Denshi Kk 物品計数装置及び物品計数方法
CN103901489B (zh) * 2012-12-27 2017-07-21 清华大学 检查物体的方法、显示方法和设备

Also Published As

Publication number Publication date
SG11201807007PA (en) 2018-09-27
WO2017170260A1 (ja) 2017-10-05
TW201804381A (zh) 2018-02-01
TWI770015B (zh) 2022-07-11
JP2017178574A (ja) 2017-10-05

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