JP6652455B2 - 非破壊試験機器の自動較正 - Google Patents

非破壊試験機器の自動較正 Download PDF

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Publication number
JP6652455B2
JP6652455B2 JP2016128382A JP2016128382A JP6652455B2 JP 6652455 B2 JP6652455 B2 JP 6652455B2 JP 2016128382 A JP2016128382 A JP 2016128382A JP 2016128382 A JP2016128382 A JP 2016128382A JP 6652455 B2 JP6652455 B2 JP 6652455B2
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Prior art keywords
test object
calibration
data
destructive
target position
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JP2016128382A
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English (en)
Japanese (ja)
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JP2017062226A (ja
JP2017062226A5 (enExample
Inventor
タイラー エム． ホームズ，
タイラー エム． ホームズ，
ジェフリー アール． コルゴード，
ジェフリー アール． コルゴード，
ゲイリー イー． ジョージソン，
ゲイリー イー． ジョージソン，
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Boeing Co
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Boeing Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002—Automatic recalibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4472—Mathematical theories or simulation

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Algebra (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2016128382A 2015-07-13 2016-06-29 非破壊試験機器の自動較正 Active JP6652455B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/797,462 US10345272B2 (en) 2015-07-13 2015-07-13 Automated calibration of non-destructive testing equipment
US14/797,462 2015-07-13

Publications (3)

Publication Number Publication Date
JP2017062226A JP2017062226A (ja) 2017-03-30
JP2017062226A5 JP2017062226A5 (enExample) 2019-08-08
JP6652455B2 true JP6652455B2 (ja) 2020-02-26

Family

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Family Applications (1)

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JP2016128382A Active JP6652455B2 (ja) 2015-07-13 2016-06-29 非破壊試験機器の自動較正

Country Status (4)

Country Link
US (1) US10345272B2 (enExample)
EP (1) EP3118618B1 (enExample)
JP (1) JP6652455B2 (enExample)
CN (1) CN106352910B (enExample)

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US10777018B2 (en) 2017-05-17 2020-09-15 Bespoke, Inc. Systems and methods for determining the scale of human anatomy from images
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CN107621245B (zh) * 2017-09-06 2019-12-31 深圳市华星光电技术有限公司 一种量测机点位自动补正方法及装置
KR102511342B1 (ko) * 2017-11-27 2023-03-17 대우조선해양 주식회사 위치확인 기능을 탑재한 휴대용 도막 두께 측정장치 및 상기 측정장치의 운용방법
US11486697B1 (en) * 2017-12-29 2022-11-01 II John Tyson Optical structural health monitoring
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CN109060966B (zh) * 2018-07-27 2020-05-05 西北工业大学 一种超声换能器自动校准装置
CN109187768B (zh) * 2018-10-10 2022-02-22 东南大学 一种高铁轨道板内部裂隙超声检测系统校准设备及方法
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US12072315B2 (en) 2020-03-30 2024-08-27 Verifi Technologies, Llc System and method for real-time visualization of defects in a material
US11754529B2 (en) 2020-03-30 2023-09-12 Verifi Technologies, Llc System and method for evaluating defects in a material
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US12535464B2 (en) 2020-03-30 2026-01-27 Baylor University System and method for real-time visualization of defects in a material
US11686707B2 (en) 2020-03-30 2023-06-27 Verifi Technologies, Llc System and method for real-time visualization of defects in a material
CN111678976B (zh) * 2020-06-22 2021-01-26 胡舟逸 一种电磁无损质量检测方法及其检测电路和系统
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Also Published As

Publication number Publication date
CN106352910B (zh) 2020-08-18
EP3118618B1 (en) 2019-04-24
EP3118618A3 (en) 2017-04-19
EP3118618A2 (en) 2017-01-18
US20170016862A1 (en) 2017-01-19
US10345272B2 (en) 2019-07-09
CN106352910A (zh) 2017-01-25
JP2017062226A (ja) 2017-03-30

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