CN106352910B - 无损检测设备的自动校准 - Google Patents

无损检测设备的自动校准 Download PDF

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Publication number
CN106352910B
CN106352910B CN201610536698.8A CN201610536698A CN106352910B CN 106352910 B CN106352910 B CN 106352910B CN 201610536698 A CN201610536698 A CN 201610536698A CN 106352910 B CN106352910 B CN 106352910B
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test object
calibration
calibration file
target location
data
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Chinese (zh)
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CN106352910A (zh
Inventor
T·M·福尔摩斯
J·R·科勒戈尔德
G·E·乔治森
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Boeing Co
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Boeing Co
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002Automatic recalibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/30Arrangements for calibrating or comparing, e.g. with standard objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045Correction of measurements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654Imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4472Mathematical theories or simulation

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Algebra (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
CN201610536698.8A 2015-07-13 2016-07-07 无损检测设备的自动校准 Active CN106352910B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/797,462 US10345272B2 (en) 2015-07-13 2015-07-13 Automated calibration of non-destructive testing equipment
US14/797,462 2015-07-13

Publications (2)

Publication Number Publication Date
CN106352910A CN106352910A (zh) 2017-01-25
CN106352910B true CN106352910B (zh) 2020-08-18

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CN201610536698.8A Active CN106352910B (zh) 2015-07-13 2016-07-07 无损检测设备的自动校准

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US (1) US10345272B2 (enExample)
EP (1) EP3118618B1 (enExample)
JP (1) JP6652455B2 (enExample)
CN (1) CN106352910B (enExample)

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CN107621245B (zh) * 2017-09-06 2019-12-31 深圳市华星光电技术有限公司 一种量测机点位自动补正方法及装置
KR102511342B1 (ko) * 2017-11-27 2023-03-17 대우조선해양 주식회사 위치확인 기능을 탑재한 휴대용 도막 두께 측정장치 및 상기 측정장치의 운용방법
US11486697B1 (en) * 2017-12-29 2022-11-01 II John Tyson Optical structural health monitoring
US12007220B2 (en) * 2017-12-29 2024-06-11 II John Tyson Optical structural health monitoring
DE102018109696A1 (de) 2018-04-23 2019-10-24 Endress+Hauser Conducta Gmbh+Co. Kg Vorrichtung und Verfahren zur Verifizierung, Kalibrierung und/oder Justierung eines Inline-Messgeräts
CN109060966B (zh) * 2018-07-27 2020-05-05 西北工业大学 一种超声换能器自动校准装置
CN109187768B (zh) * 2018-10-10 2022-02-22 东南大学 一种高铁轨道板内部裂隙超声检测系统校准设备及方法
CN110032979A (zh) * 2019-04-18 2019-07-19 北京迈格威科技有限公司 Tof传感器的工作频率的控制方法、装置、设备及介质
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US12529683B2 (en) 2020-03-30 2026-01-20 Baylor University System and method for real-time visualization of defects in a material
US11650183B2 (en) 2020-03-30 2023-05-16 Verifi Technologies, Llc System and method for real-time degree of cure evaluation in a material
US12055519B2 (en) 2020-03-30 2024-08-06 Verifi Technologies, Llc System and method for real-time visualization of foreign objects within a material
US12072315B2 (en) 2020-03-30 2024-08-27 Verifi Technologies, Llc System and method for real-time visualization of defects in a material
US11754529B2 (en) 2020-03-30 2023-09-12 Verifi Technologies, Llc System and method for evaluating defects in a material
US11726065B2 (en) 2020-03-30 2023-08-15 Verifi Technologies, Llc System and method for real-time visualization of defects in a material
US11860131B2 (en) 2020-03-30 2024-01-02 Verifi Technologies, Llc System and method for portable ultrasonic testing
US12535464B2 (en) 2020-03-30 2026-01-27 Baylor University System and method for real-time visualization of defects in a material
US11686707B2 (en) 2020-03-30 2023-06-27 Verifi Technologies, Llc System and method for real-time visualization of defects in a material
CN111678976B (zh) * 2020-06-22 2021-01-26 胡舟逸 一种电磁无损质量检测方法及其检测电路和系统
CA3140347A1 (en) * 2020-12-17 2022-06-17 The Boeing Company Structural inconsistency detection using distance data
US11502729B1 (en) * 2021-08-10 2022-11-15 The Boeing Company Methods for through-structure power and data transfer between mobile robots and sensor nodes
US20240094878A1 (en) * 2022-09-19 2024-03-21 Baker Hughes Holdings Llc Configurable non-destructive testing device

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Publication number Publication date
JP6652455B2 (ja) 2020-02-26
EP3118618B1 (en) 2019-04-24
EP3118618A3 (en) 2017-04-19
EP3118618A2 (en) 2017-01-18
US20170016862A1 (en) 2017-01-19
US10345272B2 (en) 2019-07-09
CN106352910A (zh) 2017-01-25
JP2017062226A (ja) 2017-03-30

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