JP6631867B2 - マイクロ流路中の液体の温度測定方法 - Google Patents
マイクロ流路中の液体の温度測定方法 Download PDFInfo
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- JP6631867B2 JP6631867B2 JP2015022426A JP2015022426A JP6631867B2 JP 6631867 B2 JP6631867 B2 JP 6631867B2 JP 2015022426 A JP2015022426 A JP 2015022426A JP 2015022426 A JP2015022426 A JP 2015022426A JP 6631867 B2 JP6631867 B2 JP 6631867B2
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| Application Number | Priority Date | Filing Date | Title |
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| JP2015022426A JP6631867B2 (ja) | 2015-02-06 | 2015-02-06 | マイクロ流路中の液体の温度測定方法 |
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| Application Number | Priority Date | Filing Date | Title |
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| JP2015022426A JP6631867B2 (ja) | 2015-02-06 | 2015-02-06 | マイクロ流路中の液体の温度測定方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016145737A JP2016145737A (ja) | 2016-08-12 |
| JP2016145737A5 JP2016145737A5 (cg-RX-API-DMAC7.html) | 2017-12-07 |
| JP6631867B2 true JP6631867B2 (ja) | 2020-01-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| JP2015022426A Active JP6631867B2 (ja) | 2015-02-06 | 2015-02-06 | マイクロ流路中の液体の温度測定方法 |
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| JP (1) | JP6631867B2 (cg-RX-API-DMAC7.html) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7205123B2 (ja) * | 2018-09-14 | 2023-01-17 | 横河電機株式会社 | 温度測定装置、温度測定システム、及び温度測定方法 |
| JP2022146239A (ja) * | 2021-03-22 | 2022-10-05 | アズビル株式会社 | 濃度測定方法および装置 |
| JP7534244B2 (ja) * | 2021-03-22 | 2024-08-14 | アズビル株式会社 | 故障検知方法 |
| CN113218463B (zh) * | 2021-05-08 | 2023-12-12 | 安图实验仪器(郑州)有限公司 | 微流控芯片微孔液量测量方法 |
| JP7540564B1 (ja) | 2023-09-21 | 2024-08-27 | Toppanホールディングス株式会社 | 流速測定方法およびマイクロ流体システム |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2194232A1 (en) * | 1994-07-01 | 1996-01-18 | Hans Van Der Woord | A method for monitoring performance of an incubator module, said incubator module being comprised in an automated system for assaying multiple samples and a kit suitable for use in said method |
| JP4166091B2 (ja) * | 2001-05-07 | 2008-10-15 | 財団法人神奈川科学技術アカデミー | マイクロチップ熱反応装置 |
| JP2005233802A (ja) * | 2004-02-20 | 2005-09-02 | Yokogawa Electric Corp | 物理量計測装置およびその装置を用いて行う物理量校正方法 |
| JP2009128024A (ja) * | 2007-11-20 | 2009-06-11 | Sony Corp | 流路内を通流する液体の温度制御方法 |
| JP2013113614A (ja) * | 2011-11-25 | 2013-06-10 | Nagoya Univ | 蛍光温度計測方法及び蛍光温度計測システム |
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| JP2016145737A (ja) | 2016-08-12 |
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