JP6531295B2 - 反射光検出装置及び反射光検出方法 - Google Patents

反射光検出装置及び反射光検出方法 Download PDF

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Publication number
JP6531295B2
JP6531295B2 JP2016101747A JP2016101747A JP6531295B2 JP 6531295 B2 JP6531295 B2 JP 6531295B2 JP 2016101747 A JP2016101747 A JP 2016101747A JP 2016101747 A JP2016101747 A JP 2016101747A JP 6531295 B2 JP6531295 B2 JP 6531295B2
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Japan
Prior art keywords
light
polarizing plate
polarization
reflected
measurement
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English (en)
Japanese (ja)
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JP2017207447A5 (enExample
JP2017207447A (ja
Inventor
林　宏樹
宏樹 林
伊知郎 石丸
伊知郎 石丸
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Kagawa University NUC
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Kagawa University NUC
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Priority to JP2016101747A priority Critical patent/JP6531295B2/ja
Priority to US15/597,544 priority patent/US10386236B2/en
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Publication of JP2017207447A5 publication Critical patent/JP2017207447A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0224—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using polarising or depolarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N2021/217—Measuring depolarisation or comparing polarised and depolarised parts of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/559—Determining variation of specular reflection within diffusively reflecting sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/064—Stray light conditioning
    • G01N2201/0642—Light traps; baffles

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2016101747A 2016-05-20 2016-05-20 反射光検出装置及び反射光検出方法 Active JP6531295B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016101747A JP6531295B2 (ja) 2016-05-20 2016-05-20 反射光検出装置及び反射光検出方法
US15/597,544 US10386236B2 (en) 2016-05-20 2017-05-17 Reflected light detecting device and reflected light detecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016101747A JP6531295B2 (ja) 2016-05-20 2016-05-20 反射光検出装置及び反射光検出方法

Publications (3)

Publication Number Publication Date
JP2017207447A JP2017207447A (ja) 2017-11-24
JP2017207447A5 JP2017207447A5 (enExample) 2018-03-15
JP6531295B2 true JP6531295B2 (ja) 2019-06-19

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US (1) US10386236B2 (enExample)
JP (1) JP6531295B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102877637B1 (ko) * 2019-03-29 2025-10-27 삼성전자주식회사 다파장 광을 이용한 광학 장치 및 그 동작 방법
EP3719565B1 (en) * 2019-04-01 2021-07-14 C.R.F. Società Consortile per Azioni Device for detecting the sparkle effect of a transparent sample
TWI739431B (zh) * 2019-12-09 2021-09-11 大陸商廣州印芯半導體技術有限公司 資料傳輸系統及其資料傳輸方法
WO2022006752A1 (zh) * 2020-07-07 2022-01-13 深圳市速腾聚创科技有限公司 激光接收装置、激光雷达及智能感应设备
JP7604298B2 (ja) * 2021-03-24 2024-12-23 株式会社ディスコ レーザー加工装置
CN114689601B (zh) * 2022-04-18 2024-07-26 杭州海康机器人股份有限公司 表面检测装置和表面检测方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH057555A (ja) * 1991-07-05 1993-01-19 Kao Corp 皮膚表面解析方法
US5495429A (en) * 1993-02-12 1996-02-27 West Virginia University Method and apparatus for measuring the color of three dimensional objects
JPH09329542A (ja) * 1996-06-10 1997-12-22 Kao Corp 光沢測定方法及び光沢測定装置
JP3870494B2 (ja) * 1997-06-30 2007-01-17 スズキ株式会社 表面欠陥検査装置
JP2000009440A (ja) * 1998-06-18 2000-01-14 Kao Corp 三次元物体の計測方法及び装置
JP3877959B2 (ja) 2000-12-28 2007-02-07 花王株式会社 肌色測定装置および肌画像処理装置
EP1262751B1 (de) * 2001-06-01 2011-04-06 Ivoclar Vivadent AG Vorrichtung und Verfahren zur Lichtanalyse
DE102005035700A1 (de) * 2005-05-13 2006-11-16 Leica Microsystems Semiconductor Gmbh Messvorrichtung und Verfahren zur Bestimmung von Relativpositionen eines in mindestens eine Richtung bewegbar angeordneten Positioniertischs
US8610767B2 (en) 2008-03-18 2013-12-17 Koninklijke Philips N.V. Apparatus for skin imaging, system for skin analysis
US8570149B2 (en) * 2010-03-16 2013-10-29 Lumidigm, Inc. Biometric imaging using an optical adaptive interface
JP5721195B2 (ja) * 2011-02-28 2015-05-20 国立大学法人 香川大学 光学特性測定装置及び光学特性測定方法
JP6156787B2 (ja) * 2012-07-25 2017-07-05 パナソニックＩｐマネジメント株式会社 撮影観察装置
KR101683408B1 (ko) * 2012-10-05 2016-12-06 고쿠리츠다이가쿠호우징 카가와다이가쿠 분광 측정 장치

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Publication number Publication date
US10386236B2 (en) 2019-08-20
US20170336263A1 (en) 2017-11-23
JP2017207447A (ja) 2017-11-24

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