JP6482223B2 - Light irradiation device and work inspection device - Google Patents

Light irradiation device and work inspection device Download PDF

Info

Publication number
JP6482223B2
JP6482223B2 JP2014196063A JP2014196063A JP6482223B2 JP 6482223 B2 JP6482223 B2 JP 6482223B2 JP 2014196063 A JP2014196063 A JP 2014196063A JP 2014196063 A JP2014196063 A JP 2014196063A JP 6482223 B2 JP6482223 B2 JP 6482223B2
Authority
JP
Japan
Prior art keywords
light
workpiece
reflecting portions
position information
relative position
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2014196063A
Other languages
Japanese (ja)
Other versions
JP2016065839A (en
Inventor
隆児 大原
隆児 大原
顕治 櫻井
顕治 櫻井
熊谷 直樹
直樹 熊谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CCS Inc
Original Assignee
CCS Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CCS Inc filed Critical CCS Inc
Priority to JP2014196063A priority Critical patent/JP6482223B2/en
Publication of JP2016065839A publication Critical patent/JP2016065839A/en
Application granted granted Critical
Publication of JP6482223B2 publication Critical patent/JP6482223B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

本発明は、例えば工場等において製品等の対象物(ワーク)に光を照射するものであって、その外観検査や表面に記載された記号読取の際に好適に用いられる光照射装置及び当該光照射装置を用いたワーク検査装置に関する。   The present invention irradiates light on an object (work) such as a product, for example, in a factory, and the like, and a light irradiation device suitably used for appearance inspection and reading of a symbol written on the surface, and the light The present invention relates to a workpiece inspection apparatus using an irradiation apparatus.

従来、例えば製品等の対象物に光を照射して好適な照明環境を作り出した上で、当該対象物をCCDカメラ等の撮像装置で撮像し、自動外観検査や自動記号読取を行うようにしたシステムが知られている。   Conventionally, for example, an object such as a product is irradiated with light to create a suitable illumination environment, and then the object is imaged with an imaging device such as a CCD camera to perform automatic appearance inspection and automatic symbol reading. The system is known.

このシステムに用いられる光照射装置としては、特許文献1に示すように、多数の微細な反射部を、互いの間に隙間が形成されるように、透明板の反対象物側の面に並べ設けるとともに、その透明板の側周端面からLED光を導入するようにしたものがある。光は、透明板の中を全反射しながら進行するが、そのうちの一部は、反射部で反射して透明板から対象物に向かって照射される。なお、撮像装置は、反射部の間に隙間があるため、網戸から明るい部屋の中を覗くように、反射部にほとんど影響されることなく、対象物を撮像することができる。   As a light irradiation apparatus used in this system, as shown in Patent Document 1, a large number of fine reflecting portions are arranged on the surface on the side opposite to the object of the transparent plate so that gaps are formed between them. There is one in which LED light is introduced from the side peripheral end face of the transparent plate. The light travels while being totally reflected in the transparent plate, but a part of the light is reflected by the reflecting portion and irradiated from the transparent plate toward the object. In addition, since there is a gap between the reflection units, the imaging apparatus can capture an image of the object with almost no influence from the reflection units so as to look into a bright room from the screen door.

特開2003−98093号公報JP 2003-98093 A

ところで、このような光照射装置を用いた場合、撮像装置側の倍率によっては、撮像画面にモアレ(干渉縞)が生じ、検査等に影響を及ぼす場合がある。このモアレを軽減するために、特許文献1では、例えば反射部を不均一なピッチで並べるといった手法が記載されている。   By the way, when such a light irradiation apparatus is used, a moire (interference fringe) may be generated on the imaging screen depending on the magnification on the imaging apparatus side, which may affect the inspection or the like. In order to reduce this moire, Japanese Patent Application Laid-Open No. H10-228667 describes a method of arranging the reflective portions at a non-uniform pitch, for example.

しかしながら、反射部を不均一なピッチで並べたからといって、撮像画面に生じるモアレが検査等に影響を及ぼさない程度に軽減されているとは限らず、モアレを所定未満に軽減するための反射部の配置設計及びその製作には、非常に時間及びコストがかかってしまうという問題がある。   However, just because the reflection parts are arranged at a non-uniform pitch, the moire generated on the imaging screen is not necessarily reduced to such an extent that it does not affect the inspection or the like. There is a problem that the layout design of the parts and the production thereof are very time consuming and expensive.

一方で、本願発明者は、モアレを所定未満に軽減するために、反射部の配置設計について鋭意検討を重ねた結果、各反射部同士の相対位置と撮像画面に生じるモアレとの間に相関があることを初めて見い出した。   On the other hand, the inventor of the present application has made extensive studies on the arrangement design of the reflecting portions in order to reduce the moire to less than a predetermined value. I found something for the first time.

そこで、本発明は、上記本願発明者の鋭意検討の結果なされたものであり、例えば撮像画面に生じるモアレが検査等に影響を及ぼさない程度にモアレを所定未満に軽減することをその主たる課題とするものである。   Therefore, the present invention has been made as a result of the above-mentioned diligent studies by the inventors of the present application. For example, the main problem is to reduce the moire below a predetermined level so that the moire generated on the imaging screen does not affect the inspection or the like. To do.

すなわち本発明に係る光照射装置は、一方面が光照射対象であるワークに対向するワーク対向面となる透光板と、前記透光板の他方面に、互いの間に隙間が形成されるように設けられた多数の反射部と、射出した光が前記透光板内を通り前記複数の反射部に到達する位置に設けられた光源部とを備え、前記多数の反射部で反射した光を前記ワークに照射可能に構成するとともに、前記ワークで反射した光を前記隙間を通して反対側に透過可能に構成された光照射装置であって、2つの反射部の間の距離と、所定の基準線に対する前記2つの反射部を結ぶ直線のなす角度とを相対位置情報としたときに、前記複数の反射部により得られる複数の相対位置情報のうち互いに異なる相対位置情報の種類数と、前記複数の反射部により得られる複数の距離のばらつきを示すばらつき量との積が所定値以上となるように、前記複数の反射部が並び設けられていることを特徴とする。   That is, in the light irradiation apparatus according to the present invention, a gap is formed between one side of the light-transmitting plate that is a work-facing surface that faces the work that is the object of light irradiation and the other surface of the light-transmitting plate. A plurality of reflection portions provided in the manner described above, and a light source portion provided at a position where the emitted light passes through the translucent plate and reaches the plurality of reflection portions, and is reflected by the multiple reflection portions Is configured to be able to irradiate the workpiece, and the light irradiation device is configured to be able to transmit the light reflected by the workpiece to the opposite side through the gap, and a distance between two reflecting portions and a predetermined reference When the angle formed by a straight line connecting the two reflecting parts with respect to a line is used as relative position information, the number of types of different relative position information among the plurality of relative position information obtained by the plurality of reflecting parts, and the plurality A plurality of reflection parts As the product of the variation amount indicating the variation of the release is equal to or greater than a predetermined value, characterized in that said a plurality of reflecting portions are provided list.

このような光照射装置であれば、複数の反射部により得られる複数の相対位置情報のうち互いに異なる相対位置情報の種類数と、複数の反射部により得られる複数の距離のばらつきを示すばらつき量との積が所定値以上となるように、複数の反射部がランダムに並び設けられているので、複数の反射部により生じるモアレを所定未満に軽減することができる。具体的にはデータとともに詳述する。また、複数の反射部をランダム配置させる際に、相対位置情報の種類数とばらつき量との積をパラメータとして複数の反射部を配置すればよいので、従来の試行錯誤的に設計する場合に比べて、反射部の配置設計及びその製作の時間及びコストを低減することができる。   If it is such a light irradiation apparatus, the variation amount which shows the dispersion | variation in the number of types of mutually different relative position information among several relative position information obtained by several reflective parts, and the several distance obtained by several reflective parts Since the plurality of reflecting portions are arranged in a random manner so that the product of and becomes a predetermined value or more, moire generated by the plurality of reflecting portions can be reduced below a predetermined value. Specifically, it will be described in detail together with the data. In addition, when arranging a plurality of reflection parts at random, it is only necessary to arrange a plurality of reflection parts using the product of the number of types of relative position information and the amount of variation as a parameter. Thus, it is possible to reduce the arrangement design of the reflection part and the time and cost of its production.

前記他方面が、前記複数の反射部の配置パターンを互いに同一とする複数の区画領域を有しており、前記各区画領域における前記種類数と前記ばらつき量との積が所定値以上となるように、前記複数の反射部が並び設けられていることが望ましい。
これならば、反射部の配置パターンを互いに同一とする複数の区画領域に分割し、各区画領域に含まれる複数の反射部により得られる前記種類数とばらつき量との積が所定値以上となるように配置設計すればよいので、他方面全体の複数の反射部の配置設計を行う場合に比べて、反射部の配置設計及びその製作の時間及びコストを低減することができる。
The other surface has a plurality of partition regions having the same arrangement pattern of the plurality of reflecting portions, and the product of the number of types and the variation amount in each partition region is a predetermined value or more. In addition, it is desirable that the plurality of reflecting portions be provided side by side.
In this case, the arrangement pattern of the reflecting portions is divided into a plurality of partitioned regions that are the same as each other, and the product of the number of types and the amount of variation obtained by the plurality of reflecting portions included in each partitioned region is a predetermined value or more. Therefore, it is possible to reduce the time and cost of the arrangement design of the reflecting portion and the production thereof as compared with the case where the arrangement design of the plurality of reflecting portions on the entire other surface is performed.

また、本発明に係るワーク検査装置は、上述した光照射装置と、前記ワークで反射し、前記隙間を通って前記透光板を通過した光を捕捉することにより、前記ワークを撮像する撮像装置とを備え、前記透光板の他方面における前記撮像装置の撮像領域が、3つ以上の反射部を互いに等間隔かつ直線状に配置した均一ドットを有さないように構成されていることを特徴とする。
このようなワーク検査装置によれば、複数の反射部により生じるモアレを所定未満に軽減することができ、外観検査や表面に記載された記号読取等の検査精度を向上させることができる。また、透光板の他方面における撮像装置の撮像領域が、3つ以上の反射部を互いに等間隔かつ直線状に配置した均一ドットを有さないように構成されているので、より一層モアレを軽減することができる。
Moreover, the workpiece inspection apparatus according to the present invention includes the light irradiation device described above and an imaging device that captures the workpiece by capturing the light reflected by the workpiece and passing through the transparent plate through the gap. The imaging area of the imaging device on the other surface of the translucent plate is configured so as not to have uniform dots in which three or more reflecting portions are arranged at equal intervals and in a straight line. Features.
According to such a workpiece inspection apparatus, it is possible to reduce moiré caused by a plurality of reflecting portions to less than a predetermined value, and it is possible to improve inspection accuracy such as appearance inspection and symbol reading written on the surface. In addition, since the imaging region of the imaging device on the other surface of the translucent plate is configured not to have uniform dots in which three or more reflecting portions are arranged at equal intervals and in a straight line, moire is further increased. Can be reduced.

このように構成した本発明によれば、多数の反射部で反射した光をワークに照射可能に構成するとともに、ワークで反射した光を隙間を通して反対側に透過可能に構成された光照射装置において、複数の反射部により生じるモアレを軽減することができる。   According to the present invention configured as described above, in the light irradiation device configured to be able to irradiate the workpiece with the light reflected by the many reflecting portions and configured to transmit the light reflected by the workpiece to the opposite side through the gap. Moire generated by a plurality of reflecting portions can be reduced.

本発明の一実施形態における光照射装置の内部構造を示す中央縦正端面図。The center vertical positive end view which shows the internal structure of the light irradiation apparatus in one Embodiment of this invention. 同実施形態における光照射装置の平面図。The top view of the light irradiation apparatus in the embodiment. 同実施形態における光照射装置の反射部を主として示す部分拡大縦正端面図。The partial expansion vertical positive end view which mainly shows the reflection part of the light irradiation apparatus in the embodiment. 図2におけるA部詳細図。FIG. 3 is a detailed view of part A in FIG. 2. 相対位置情報を説明するための模式図。The schematic diagram for demonstrating relative position information. 相対位置情報の種類数を説明するための模式図。The schematic diagram for demonstrating the number of types of relative position information. 同実施形態における複数の反射部の配置態様を示す図。The figure which shows the arrangement | positioning aspect of the some reflection part in the embodiment. センサの座標及び光量の関係を示す図。The figure which shows the relationship between the coordinate of a sensor, and light quantity. 「種類数」×「標準偏差(σ)」とモアレ量との関係を示すシミュレーション結果を示す図。The figure which shows the simulation result which shows the relationship between "the number of types" x "standard deviation ((sigma))", and a moire amount. モアレの発生メカニズムを示す模式図。The schematic diagram which shows the generation | occurrence | production mechanism of a moire.

以下に本発明に係る光照射装置の一実施形態について図面を参照して説明する。   An embodiment of a light irradiation apparatus according to the present invention will be described below with reference to the drawings.

本実施形態に係る光照射装置1は、図1及び図2に示すように、全体として薄い板状をなすもので、ワークWと撮像装置5との間の撮像軸C上に直交して配置され、ワークWを照明するとともに、ワークWからの光の一部を透過させて、撮像装置5によるワークWの撮像を可能ならしめるものである。なお、この光照射装置1と、撮像装置5とによりワーク検査装置100が構成される。   As shown in FIGS. 1 and 2, the light irradiation device 1 according to the present embodiment has a thin plate shape as a whole, and is arranged orthogonally on an imaging axis C between the workpiece W and the imaging device 5. Then, the work W is illuminated and a part of the light from the work W is transmitted, so that the image pickup of the work W can be performed by the imaging device 5. The light irradiation device 1 and the imaging device 5 constitute a workpiece inspection device 100.

具体的にこの光照射装置1は、矩形板状をなす光学部材2と、その光学部材2の側周囲から光を照射する光源部3と、前記光学部材2及び光源部3を保持する枠体4とを備えている。   Specifically, the light irradiation device 1 includes a rectangular plate-shaped optical member 2, a light source unit 3 that irradiates light from the periphery of the optical member 2, and a frame body that holds the optical member 2 and the light source unit 3. 4 is provided.

光学部材2は、特に図3に示すように、一方面をワーク対向面21aとして、光照射対象である製品等のワークWに向けて設置される透光板21と、前記透光板21における他方面(反ワーク対向面)21bに並べ設けた多数の反射部22とを有する。   In particular, as shown in FIG. 3, the optical member 2 includes a translucent plate 21 that is set toward a workpiece W such as a product that is a light irradiation target, with one surface being a workpiece facing surface 21 a, and the translucent plate 21. And a large number of reflecting portions 22 arranged side by side on the other surface (the surface opposite to the workpiece) 21b.

透光板21は、等厚で平面視正方形状の板状をなす無色透明のものであり、例えばアクリルやガラスなどを素材としている。   The translucent plate 21 is a colorless and transparent plate having a uniform thickness and a square plate shape in plan view, and is made of, for example, acrylic or glass.

反射部22は、図3及び図4に示すように、光を乱反射する反射層221と、光をほとんど反射しない光遮断層222との2層構造をなし、その一つ一つは、例えば平面視円形状をなし、径が数十〜数百μm、厚みがミクロンオーダーの極めて小さく薄いものである。そして、この反射部22を、互いの間に微細な隙間Sが形成されるように、前記透光板21における反ワーク対向面21bの、側周縁部を除く略全面に亘って、ランダムに多数並べ設けてある。なお、詳細な配置態様については、後述する。   As shown in FIGS. 3 and 4, the reflection unit 22 has a two-layer structure of a reflection layer 221 that irregularly reflects light and a light blocking layer 222 that hardly reflects light, and each of them is, for example, a plane surface. It has a circular shape, has a diameter of several tens to several hundreds of μm, and a thickness that is extremely small and thin on the order of microns. A large number of the reflection portions 22 are randomly distributed over substantially the entire surface excluding the side peripheral edge portion of the anti-work facing surface 21b of the translucent plate 21 so that a minute gap S is formed between them. They are arranged side by side. A detailed arrangement mode will be described later.

また、各反射部22は、前記反射層221がワークW側を向くように、すなわち前記反射層221を、透光板21の反ワーク対向面21bに付着させてある。なお、図3は理解のための模式図であり、反射部22の厚みを誇張し、また透光板21の厚みを実際より薄く表現してある。前記反射層221は、光拡散部材である粒子状の反射フィラ(図示しない)を含有させた例えば白色の顔料で形成したもので、その表面である光反射面において、主として光を反射するとともに、内部に侵入した光の一部を、前記反射フィラで拡散させて反射する。一方、光遮断層222は、酸化クロム(CrO)等のつや消し黒色系(例えば茶色や灰色等)素材を用いて形成したものである。なお、この実施形態では、前記反射層221を透過した光を反射する目的から、この光遮断層222と反射層221との間に鏡面状をなす薄いクロム層(図示しない)をさらに設けた構成である。 Further, each reflecting portion 22 has the reflecting layer 221 attached to the anti-work facing surface 21b of the translucent plate 21 so that the reflecting layer 221 faces the workpiece W side. FIG. 3 is a schematic diagram for understanding, in which the thickness of the reflecting portion 22 is exaggerated, and the thickness of the translucent plate 21 is expressed thinner than the actual thickness. The reflective layer 221 is formed of, for example, a white pigment containing a particulate reflective filler (not shown) that is a light diffusing member, and mainly reflects light on the light reflecting surface that is the surface thereof. A part of the light entering the inside is diffused and reflected by the reflection filler. On the other hand, the light blocking layer 222 is formed using a matte black material (for example, brown or gray) such as chromium oxide (CrO 2 ). In this embodiment, a thin chrome layer (not shown) having a mirror surface is further provided between the light blocking layer 222 and the reflective layer 221 for the purpose of reflecting light transmitted through the reflective layer 221. It is.

光源部3は、前記透光板21の4つの側周端面21cにそれぞれ対応する4つのユニットからなる。各ユニットは、帯状をなす1つの配線基板32とその配線基板32に等間隔1列で搭載した複数のLED31からなり、それらLED31が、透光板21の側周端面21cに臨むように配置され、当該側周端面21cから透光板21の内部に向かって光を照射する。   The light source unit 3 includes four units respectively corresponding to the four side peripheral end surfaces 21 c of the light transmitting plate 21. Each unit is composed of a single wiring board 32 having a belt shape and a plurality of LEDs 31 mounted on the wiring board 32 at a regular interval, and these LEDs 31 are arranged so as to face the side peripheral end face 21c of the translucent plate 21. Then, light is emitted from the side peripheral end face 21 c toward the inside of the light transmitting plate 21.

枠体4は、矩形(正方形)環状をなし、例えば内周面に開口する周回溝を有した金属製のもので、その周回溝の中に前記光源部3を保持収容する。またその溝の開口縁部で、前記透光板21の側周縁部を厚み方向から挟み込んで保持する。   The frame body 4 has a rectangular (square) ring shape, and is made of a metal having, for example, a circumferential groove opened on the inner circumferential surface, and holds and accommodates the light source unit 3 in the circumferential groove. Further, at the opening edge of the groove, the side peripheral edge of the translucent plate 21 is sandwiched and held from the thickness direction.

次に、このように構成した光照射装置1の作用を説明する。
まず、図1に示すように、ワークWと撮像装置5とを対向させて設置し、その間に、光照射装置1を、そのワーク対向面21aがワークWに向くようにして、撮像軸C上に設置する。
Next, the operation of the light irradiation device 1 configured as described above will be described.
First, as shown in FIG. 1, the workpiece W and the imaging device 5 are placed facing each other, and the light irradiation device 1 is placed on the imaging axis C so that the workpiece facing surface 21 a faces the workpiece W therebetween. Install in.

この状態で、光源部3から光が照射されると、その光は、透光板21の側周端面21cから内部に進入し、図3に示すように、中央部に向かって、ワーク対向面21aと反ワーク対向面21bとの間で全反射しながら進行する。その過程で、反ワーク対向面21bに貼り付けられた反射部22に到達した光は、そこで乱反射し、均一化された拡散光としてワーク対向面21aから出て、ワークWに向かって照射される。この光で、ワークWは一様に照明される。   In this state, when light is irradiated from the light source unit 3, the light enters the inside from the side peripheral end surface 21c of the translucent plate 21, and as shown in FIG. It progresses while totally reflecting between 21a and the anti-work opposing surface 21b. In the process, the light that has reached the reflecting portion 22 attached to the anti-work facing surface 21b is diffusely reflected there, exits from the work facing surface 21a as uniformed diffused light, and is irradiated toward the work W. . With this light, the workpiece W is illuminated uniformly.

一方、撮像装置5は、前記ワークWで反射し、反射部22の間の隙間Sを通って透光板21を通過した光を捕捉することにより、上述のごとくワークWを撮像し、当該ワークWの表面検査や記号読取を行う。なお、反射部22は微細であるために、網戸を介して明るい部屋の中を見ることができるように、この反射部22が撮像の邪魔にはなることは基本的にはない。このようにして、反射部22での反射光により撮像装置5の観測軸Cと同軸方向からの照明が行えるとともに、前記ワークWを、隙間Sを介して撮像装置5で撮像し、検査等を行うことができる。   On the other hand, the imaging device 5 captures the workpiece W as described above by capturing the light reflected by the workpiece W and passing through the transparent plate 21 through the gap S between the reflecting portions 22. W surface inspection and symbol reading. In addition, since the reflection part 22 is fine, this reflection part 22 does not interfere with imaging so that a bright room can be seen through a screen door. In this way, the reflected light from the reflecting section 22 can illuminate from the direction coaxial with the observation axis C of the imaging device 5, and the workpiece W is imaged by the imaging device 5 through the gap S to be inspected. It can be carried out.

ところで、複数の反射部が、等ピッチで縦横に多数並べ設けたものの場合において、この実施形態の撮像装置5であるCCDカメラのように、画像素子の縦(又は横)の配設ピッチが略均一である場合には、撮像した画像にモアレが生じることがある。本発明者が解明した限りにおいてのモアレの原因は、「反射部で反射してワークW側に向かい、その後、ワーク対向面で再度反射して撮像装置側に向かう光」である。より詳細には、図10に示すように、その光によって画像素子上に写る各反射部(裏面反射による各反射部の虚像)が、画像素子に写る各反射部の実像とほぼ重なり合うときに、モアレが生じ得る。   By the way, in the case where a plurality of reflecting portions are arranged in a row at an equal pitch, the vertical (or horizontal) arrangement pitch of the image elements is substantially the same as the CCD camera as the imaging device 5 of this embodiment. If it is uniform, moire may occur in the captured image. The cause of the moire as far as the present inventor has clarified is “light reflected by the reflecting portion and directed toward the workpiece W, and then reflected again by the workpiece facing surface and directed toward the imaging device”. More specifically, as shown in FIG. 10, when each reflection portion (virtual image of each reflection portion due to back surface reflection) reflected on the image element by the light substantially overlaps with a real image of each reflection portion reflected on the image element, Moire can occur.

しかして本実施形態では、2つの反射部22の間の距離Lと、所定の基準線Xに対する2つの反射部22を結ぶ直線のなす角度θとを相対位置情報(図5参照)としたときに、複数の反射部22により得られる複数の相対位置情報のうち互いに異なる相対位置情報の種類数と、複数の反射部22により得られる複数の距離Lのばらつきを示すばらつき量との積が所定値以上となるように、複数の反射部22がランダムに並び設けられている。   Thus, in the present embodiment, when the distance L between the two reflecting portions 22 and the angle θ formed by the straight line connecting the two reflecting portions 22 with respect to the predetermined reference line X are used as relative position information (see FIG. 5). Further, the product of the number of different types of relative position information among the plurality of relative position information obtained by the plurality of reflection units 22 and the variation amount indicating the variation of the plurality of distances L obtained by the plurality of reflection units 22 is predetermined. A plurality of reflecting portions 22 are randomly arranged so as to be equal to or greater than the value.

ここで、2つの反射部22の間の距離Lとは、当該2つの反射部22の中心点の間の直線距離である。また、所定の基準線Xとは、複数の反射部22それぞれにおいて同一であり、本実施形態では、反射部22の中心点を通り、紙面右方向に延びるX軸線である。   Here, the distance L between the two reflecting portions 22 is a linear distance between the center points of the two reflecting portions 22. Further, the predetermined reference line X is the same in each of the plurality of reflecting portions 22, and in the present embodiment, is an X-axis line that passes through the center point of the reflecting portion 22 and extends in the right direction on the paper surface.

次に、「複数の反射部22により得られる複数の相対位置情報のうち互いに異なる相対位置情報の種類数」について具体的に説明する。   Next, “the number of different types of relative position information among a plurality of pieces of relative position information obtained by the plurality of reflecting units 22” will be specifically described.

図6に示すように、5つの反射部A〜Eについて考えた場合、ある1つの反射部Aとその他の反射部B〜Eそれぞれとの相対位置情報は、(L(A→B),θ(A→B))、(L(A→C),θ(A→C))、(L(A→D),θ(A→D))、(L(A→E),θ(A→E))の4つである。また、別の反射部Bとその他の反射部A、C〜Eそれぞれとの相対位置情報は、(L(B→A),θ(B→A))、(L(B→C),θ(B→C))、(L(B→D),θ(B→D))、(L(B→E),θ(B→E))の4つである。その他の反射部C〜Eについても同様にして考えると5つの反射部A〜Eにより得られる複数の相対位置情報は、計20個となる。 As shown in FIG. 6, when the five reflection parts A to E are considered, the relative position information between one reflection part A and each of the other reflection parts B to E is (L (A → B) , θ (A → B) ), (L (A → C) , θ (A → C) ), (L (A → D) , θ (A → D) ), (L (A → E) , θ (A → E) ). Further, the relative position information between another reflecting portion B and each of the other reflecting portions A and C to E is (L (B → A) , θ (B → A) ), (L (B → C) , θ (B → C) ), (L (B → D) , θ (B → D) ), (L (B → E) , θ (B → E) ). Considering the other reflection parts C to E in the same manner, a plurality of pieces of relative position information obtained by the five reflection parts A to E are 20 in total.

この複数の相対位置情報のうち、Aから見たBの相対位置情報(L(A→B),θ(A→B))及びBから見たAの相対位置情報(L(B→A),θ(B→A))、Aから見たCの相対位置情報(L(A→C),θ(A→C))及びCから見たAの相対位置情報(L(C→A),θ(C→A))等のように、一対の反射部により得られる2つの相対位置情報を同一とする。一対の反射部により得られる2つの相対位置情報を同一とした場合、互いに異なる相対位置情報の種類数は、計10(=)個となる。その他、一対の反射部により得られる相対位置情報以外にも、同一の相対位置情報があれば、前記互いに異なる相対位置情報の種類数(計10個)から差し引く。 Among the plurality of relative position information, B relative position information viewed from A (L (A → B) , θ (A → B) ) and A relative position information viewed from B (L (B → A)) , Θ (B → A) ), C relative position information viewed from A (L (A → C) , θ (A → C) ) and A relative position information viewed from C (L (C → A)) , Θ (C → A) ), and the like, the two pieces of relative position information obtained by the pair of reflecting portions are the same. When the two pieces of relative position information obtained by the pair of reflecting portions are the same, the number of types of relative position information different from each other is 10 (= 5 C 2 ). In addition, if there is the same relative position information other than the relative position information obtained by the pair of reflecting portions, it is subtracted from the number of types of different relative position information (a total of 10).

つまり、複数(N個)の反射部22により得られる互いに異なる相対位置情報の最大値は、計(=N×(N−1)/2)個である。なお、一対の反射部22により得られる相対位置情報以外にも、同一の相対位置情報があれば、前記互いに異なる相対位置情報の種類数(計個)から差し引く。このとき、相対位置情報の種類数を可及的に多くする、つまり、互いに異なる相対位置情報の種類数を、計個とするためには、複数の反射部22が、3つ以上の反射部22を互いに等間隔かつ直線状に配置した均一ドットを有さないように構成することが必須となる。本実施形態では、透光板21の他方面21bにおける撮像装置5の撮像領域が、3つ以上の反射部22を互いに等間隔かつ直線状に配置した均一ドットを有さないように構成している。 That is, the maximum value of the different relative position information obtained by the plurality (N) of reflection units 22 is a total of N C 2 (= N × (N−1) / 2). If there is the same relative position information other than the relative position information obtained by the pair of reflecting portions 22, it is subtracted from the number of different types of relative position information (total N C 2 ). At this time, to increase as much as possible the number of types of relative positional information, i.e., the number of types of different relative position information with each other, in order to two meter N C has a plurality of reflecting portions 22, three or more It is essential that the reflection portions 22 are configured so as not to have uniform dots arranged at equal intervals and in a straight line. In the present embodiment, the imaging region of the imaging device 5 on the other surface 21b of the translucent plate 21 is configured not to have uniform dots in which three or more reflecting portions 22 are arranged at regular intervals and in a straight line. Yes.

また、「複数の距離Lのばらつきを示すばらつき量」とは、複数(個)の距離Lの標準偏差である。 The “variation amount indicating the variation of the plurality of distances L” is a standard deviation of a plurality ( N C 2 ) of distances L.

そして、本実施形態では、図7に示すように、他方面(反ワーク対向面)21bが、複数の反射部22の配置パターンを互いに同一とする複数の区画領域2Rを有しており、各区画領域2Rにおいて、「相対位置情報の種類数」×「距離の標準偏差(σ)」が所定値以上となるように、複数の反射部22を並び設ける構成としている。なお、図7では、他方面(反ワーク対向面21b)を、平面視形状が互いに同一である16個の区画領域2Rに分割した場合を示している。これならば、反射部22の配置パターンを互いに同一とする複数の区画領域2Rに分割し、各区画領域2Rに含まれる複数の反射部22により得られる前記種類数とばらつき量との積が所定値以上となるように配置設計すればよいので、他方面全体の複数の反射部22の配置設計を行う場合に比べて、反射部22の配置設計及びその製作の時間及びコストを低減することができる。   And in this embodiment, as shown in FIG. 7, the other surface (anti-work opposing surface) 21b has a plurality of partition regions 2R having the same arrangement pattern of the plurality of reflecting portions 22, and each In the partitioned area 2R, a plurality of reflecting portions 22 are arranged side by side so that “the number of types of relative position information” × “standard deviation of distance (σ)” is a predetermined value or more. FIG. 7 shows a case where the other surface (the anti-work facing surface 21b) is divided into 16 partition regions 2R having the same shape in plan view. If this is the case, the arrangement pattern of the reflecting portions 22 is divided into a plurality of partitioned regions 2R that are identical to each other, and the product of the number of types and the amount of variation obtained by the plurality of reflecting portions 22 included in each partitioned region 2R is predetermined. Since it is only necessary to design the arrangement so as to be greater than or equal to the value, it is possible to reduce the arrangement design of the reflecting portion 22 and the time and cost for manufacturing the reflecting portion 22 as compared with the case where the arrangement design of the plurality of reflecting portions 22 on the entire other surface is performed. it can.

次に、本実施形態の光照射装置1におけるモアレ量を所定未満とするための「相対位置情報の種類数」×「距離の標準偏差(σ)」のシミュレーション結果について説明する。   Next, a simulation result of “the number of types of relative position information” × “standard deviation of distance (σ)” for making the moire amount in the light irradiation apparatus 1 of the present embodiment less than a predetermined amount will be described.

このシミュレーションにおいて、反射部22のサイズ及び形状は、直径0.21mm又は直径0.30mmの円形のものとした。ここで、直径0.21mmのものを用いたシミュレーションと、直径0.30mmのものを用いたシミュレーションとをそれぞれ同回数行った。また、透光板21は、その光学有効エリアサイズが50mm×50mmであり、その厚みが10mmのものとした。さらに、1つの区画領域2R内の反射部22の個数は、4個〜88個の範囲内で任意の個数とした。その上、1つの区画領域2Rのサイズ及び形状は、1辺が1.0mm〜2.8mmの正方形であり、具体的には、1辺が1.0mm、1.3mm、1.6mm、2.0mm、2.4mm、2.8mmの正方形とした。そして、上記に示す反射部の形状及びサイズ、区画領域内の反射部の個数、区画領域の形状及びサイズを任意に組み合わせて、シミュレーションを行った。また、光照射装置1及び撮像装置5の距離は、実使用上で設置する範囲(50mm〜200mm)で数点確認し、モアレ量が一番大きくなる距離でのモアレ量を採用した。   In this simulation, the size and the shape of the reflecting portion 22 are circular with a diameter of 0.21 mm or a diameter of 0.30 mm. Here, the simulation using the 0.21 mm diameter and the simulation using the 0.30 mm diameter were each performed the same number of times. The translucent plate 21 had an optical effective area size of 50 mm × 50 mm and a thickness of 10 mm. Furthermore, the number of the reflection portions 22 in one partition region 2R is an arbitrary number within the range of 4 to 88. In addition, the size and shape of one partition region 2R is a square having one side of 1.0 mm to 2.8 mm, and specifically, one side is 1.0 mm, 1.3 mm, 1.6 mm, 2 A square of 0.0 mm, 2.4 mm, and 2.8 mm was used. Then, the simulation was performed by arbitrarily combining the shape and size of the reflection portion, the number of reflection portions in the partition region, and the shape and size of the partition region described above. In addition, the distance between the light irradiation device 1 and the imaging device 5 was confirmed at several points in a range (50 mm to 200 mm) installed in actual use, and the moire amount at the distance where the moire amount was the largest was adopted.

このとき、図8に示すように、横軸をセンサ(画像素子)の座標とし、縦軸をセンサ(画像素子)により得られた光量としたときに、山(peak)と当該山(peak)に隣接する両側のうち一方の谷(valley)との差(「peak」−「valley」)が最大値となる「peak」−「valley」をモアレ量と定義している。ここで、山(peak)とは、当該山に隣接する両側の谷(valley)との最初の変曲点を両端とした範囲であり、山(peak)の光量は、両端の変曲点の間の値を平均化したものである。なお、図8における縦軸の光量はシミュレーション上の値であって単位がない値であるが、実際に測定された光量とは1対1の比例相関関係にあり、実物を用いて測定しても同様の傾向を示す。   At this time, as shown in FIG. 8, when the horizontal axis is the coordinates of the sensor (image element) and the vertical axis is the amount of light obtained by the sensor (image element), the peak and the peak are concerned. "Peak"-"valley" in which the difference ("peak"-"valley") from one of the two sides adjacent to the maximum value is defined as the moire amount. Here, the peak is a range with the first inflection points on both sides of the valley adjacent to the mountain as both ends, and the light amount of the peak is the inflection point at both ends. The value between is averaged. Note that the light amount on the vertical axis in FIG. 8 is a value with no unit in the simulation, but has a one-to-one proportional correlation with the actually measured light amount. Shows a similar trend.

このシミュレーションにより得られた「相対位置情報の種類数」×「距離の標準偏差(σ)」と、モアレ量との関係を図9に示す。
図9から分かるように、「相対位置情報の種類数」×「距離の標準偏差(σ)」の値が大きくなるに連れてモアレ量が減少していることが分かる。例えば、モアレ量を5未満に軽減するためには、「相対位置情報の種類数」×「距離の標準偏差(σ)」を400以上に設定すれば良いことが分かる。
なお、前記シミュレーションに示す反射部の個数でなくても、同様に、「相対位置情報の種類数」×「距離の標準偏差(σ)」の値が大きくなるほど、モアレ量が軽減されるため、「相対位置情報の種類数」×「距離の標準偏差(σ)」を所定値以上となるようにすることで、モアレ量を所定値未満に軽減することができる。
FIG. 9 shows the relationship between the “number of types of relative position information” × “standard deviation of distance (σ)” obtained by this simulation and the moire amount.
As can be seen from FIG. 9, the moire amount decreases as the value of “number of types of relative position information” × “standard deviation of distance (σ)” increases. For example, in order to reduce the moire amount to less than 5, it is understood that “the number of types of relative position information” × “standard deviation of distance (σ)” may be set to 400 or more.
In addition, even if it is not the number of reflection parts shown in the simulation, similarly, as the value of “number of types of relative position information” × “standard deviation of distance (σ)” increases, the amount of moire is reduced. By making “the number of types of relative position information” × “standard deviation of distance (σ)” equal to or greater than a predetermined value, the amount of moire can be reduced to less than the predetermined value.

<本実施形態の効果>
このように構成した本実施形態に係る光照射装置1によれば、複数の反射部22により得られる複数の相対位置情報のうち互いに異なる相対位置情報の種類数と、複数の反射部22により得られる複数の距離のばらつきを示す標準偏差との積が所定値以上となるように、複数の反射部22がランダムに並び設けられているので、複数の反射部22により生じるモアレを所定未満に軽減することができる。
<Effect of this embodiment>
According to the light irradiation device 1 according to the present embodiment configured as described above, the number of types of different relative position information among the plurality of relative position information obtained by the plurality of reflection units 22 and the plurality of reflection units 22 are obtained. Since the plurality of reflecting portions 22 are randomly arranged so that the product of the standard deviation indicating the variation in the plurality of distances is equal to or greater than a predetermined value, the moire generated by the plurality of reflecting portions 22 is reduced to less than a predetermined value. can do.

また、複数の反射部22をランダム配置させる際に、相対位置情報の種類数とばらつき量との積をパラメータとして複数の反射部22を配置すればよいので、従来の試行錯誤的に設計する場合に比べて、複数の反射部22の配置設計及びその製作の時間及びコストを低減することができる。   Further, when the plurality of reflecting portions 22 are randomly arranged, the plurality of reflecting portions 22 may be arranged using the product of the number of types of relative position information and the variation amount as a parameter. Compared to the above, it is possible to reduce the layout design and the manufacturing time and cost of the plurality of reflecting portions 22.

さらに、複数の反射部22により生じるモアレを所定未満に軽減することができるので、外観検査や表面に記載された記号読取等の検査精度を向上させることができる。また、透光板21の他方面21bにおける撮像装置5の撮像領域が、3つ以上の反射部22を互いに等間隔かつ直線状に配置した均一ドットを有さないように構成されているので、より一層モアレを軽減することができる。   Furthermore, since the moire generated by the plurality of reflecting portions 22 can be reduced below a predetermined level, it is possible to improve inspection accuracy such as appearance inspection and reading of symbols written on the surface. In addition, since the imaging region of the imaging device 5 on the other surface 21b of the translucent plate 21 is configured not to have uniform dots in which three or more reflecting portions 22 are arranged at regular intervals and in a straight line, Moire can be further reduced.

なお、本発明は前記実施形態に限られるものではない。
例えば、前記実施形態では、他方面(反ワーク対向面)全体において、「相対位置情報の種類数」×「距離の標準偏差(σ)」が所定値以上となるように、複数の反射部を並び設ける構成であったが、他方面(反ワーク対向面)の一部において、「相対位置情報の種類数」×「距離の標準偏差(σ)」が所定値以上となるように、複数の反射部を並び設ける構成としても良い。具体的には、撮像装置の有効撮像領域において、「相対位置情報の種類数」×「距離の標準偏差(σ)」が所定値以上となるように、複数の反射部を並び設ける構成とすることが考えられる。
The present invention is not limited to the above embodiment.
For example, in the above-described embodiment, the plurality of reflecting portions are arranged so that “the number of types of relative position information” × “standard deviation of distance (σ)” is equal to or greater than a predetermined value in the entire other surface (the surface opposite to the workpiece). Although the arrangement is arranged side by side, in a part of the other side (the surface opposite to the workpiece), a plurality of “relative position information types” × “distance standard deviation (σ)” is set to a predetermined value or more. It is good also as a structure which provides a reflection part side by side. Specifically, in the effective imaging region of the imaging device, a configuration in which a plurality of reflection units are arranged so that “the number of types of relative position information” × “standard deviation of distance (σ)” is equal to or greater than a predetermined value. It is possible.

なお、図7では、複数の区画領域2Rの全てが同一の配置パターンを有するものであったが、複数の区画領域2Rにおける一部の区画領域2Rと、その他の一部の区画領域2Rとの配置パターンが互いに異なるものとしても良い。また、一部の区画領域2Rの平面視形状と、その他の一部の区画領域2Rの平面視形状とが互いに異なるように分割したものであっても良い。
反射部は、前記実施形態の他、透光板の反ワーク対向面に設けた、例えば凹部などでもよく、要は透光板端面から入射した光がワーク側に向かって反射するように構成したドットであればよい。
In FIG. 7, all of the plurality of partition regions 2R have the same arrangement pattern. However, a part of the partition regions 2R in the plurality of partition regions 2R and the other part of the partition regions 2R The arrangement patterns may be different from each other. Moreover, it may be divided so that the planar view shape of some of the partitioned areas 2R and the planar view shape of other partially partitioned areas 2R are different from each other.
In addition to the above-described embodiment, the reflecting portion may be, for example, a concave portion provided on the surface opposite to the workpiece of the translucent plate. In short, the light incident from the end surface of the translucent plate is reflected toward the workpiece side. Any dot can be used.

その他、本発明は前記実施形態に限られず、その趣旨を逸脱しない範囲で種々の変形が可能である。   In addition, the present invention is not limited to the above embodiment, and various modifications can be made without departing from the spirit of the present invention.

100・・・検査装置
W・・・ワーク
1・・・光照射装置
2・・・光学部材
21・・・透光板
21a・・・一方の面(ワーク対向面)
21b・・・他方の面(反ワーク対向面)
S・・・隙間
22・・・反射部
3・・・光源部
L・・・2つの反射部の間の距離
X・・・所定の基準線
θ・・・2つの反射部を結ぶ直線のなす角度
5・・・撮像装置
DESCRIPTION OF SYMBOLS 100 ... Inspection apparatus W ... Work 1 ... Light irradiation apparatus 2 ... Optical member 21 ... Translucent plate 21a ... One surface (work opposing surface)
21b... The other surface (surface facing the workpiece)
S ... Gap 22 ... Reflecting part 3 ... Light source part L ... Distance X between two reflecting parts ... Predetermined reference line θ ... A straight line connecting the two reflecting parts Angle 5 ... Imaging device

Claims (3)

一方面が光照射対象であるワークに対向するワーク対向面となる透光板と、
前記透光板の他方面に、互いの間に隙間が形成されるように設けられた多数の反射部と、
射出した光が前記透光板内を通り前記複数の反射部に到達する位置に設けられた光源部とを備え、
前記多数の反射部で反射した光を前記ワークに照射可能に構成するとともに、前記ワークで反射した光を前記隙間を通して反対側に透過可能に構成された光照射装置であって、
2つの反射部の間の距離と、所定の基準線に対する前記2つの反射部を結ぶ直線のなす角度とを相対位置情報としたときに、
前記複数の反射部により得られる複数の相対位置情報のうち互いに異なる相対位置情報の種類数と、前記複数の反射部により得られる複数の距離の標準偏差との積が400以上となるように、前記複数の反射部がランダムに並び設けられている光照射装置。
A light-transmitting plate whose one surface is a workpiece-facing surface facing a workpiece that is a light irradiation target;
A number of reflecting portions provided on the other surface of the light-transmitting plate so that gaps are formed between each other;
A light source unit provided at a position where the emitted light passes through the translucent plate and reaches the plurality of reflection units;
A light irradiation device configured to irradiate the workpiece with the light reflected by the multiple reflecting portions, and configured to transmit the light reflected by the workpiece to the opposite side through the gap,
When the distance between the two reflecting portions and the angle formed by a straight line connecting the two reflecting portions with respect to a predetermined reference line are used as relative position information,
The product of the number of types of relative position information different from each other among the plurality of relative position information obtained by the plurality of reflection parts and the standard deviation of the plurality of distances obtained by the plurality of reflection parts is 400 or more. The light irradiation apparatus in which the plurality of reflection units are arranged at random .
前記他方面が、前記複数の反射部の配置パターンを互いに同一とする複数の区画領域を有しており、
前記各区画領域における前記種類数と前記ばらつき量との積が所定値以上となるように、前記複数の反射部が並び設けられている請求項1記載の光照射装置。
The other surface has a plurality of partition regions having the same arrangement pattern of the plurality of reflecting portions,
The light irradiation apparatus according to claim 1, wherein the plurality of reflection units are arranged side by side so that a product of the number of types and the amount of variation in each partition region is equal to or greater than a predetermined value.
請求項1又は2記載の光照射装置と、
前記ワークで反射し、前記隙間を通って前記透光板を通過した光を捕捉することにより、前記ワークを撮像する撮像装置とを備えるワーク検査装置。
The light irradiation device according to claim 1 or 2,
The reflected at the workpiece, by capturing light passing through the transparent plate through the gap, obtain Preparations and an imaging device for imaging the workpiece workpiece inspection device.
JP2014196063A 2014-09-26 2014-09-26 Light irradiation device and work inspection device Active JP6482223B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014196063A JP6482223B2 (en) 2014-09-26 2014-09-26 Light irradiation device and work inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014196063A JP6482223B2 (en) 2014-09-26 2014-09-26 Light irradiation device and work inspection device

Publications (2)

Publication Number Publication Date
JP2016065839A JP2016065839A (en) 2016-04-28
JP6482223B2 true JP6482223B2 (en) 2019-03-13

Family

ID=55805427

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014196063A Active JP6482223B2 (en) 2014-09-26 2014-09-26 Light irradiation device and work inspection device

Country Status (1)

Country Link
JP (1) JP6482223B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6584454B2 (en) 2017-06-14 2019-10-02 キヤノン株式会社 Image processing apparatus and method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3402138B2 (en) * 1996-09-27 2003-04-28 株式会社日立製作所 Liquid crystal display
JP2000162595A (en) * 1998-11-30 2000-06-16 Kyocera Corp Liquid crystal display device
JP2002148444A (en) * 2000-11-10 2002-05-22 Nichia Chem Ind Ltd Light guide plate for surface light emitting device and method for making its light diffusing dot pattern
US6784856B2 (en) * 2001-12-13 2004-08-31 International Business Machines Corp. System and method for anti-moire display
WO2007023894A1 (en) * 2005-08-26 2007-03-01 Ccs Inc. Light irradiation apparatus and optical member

Also Published As

Publication number Publication date
JP2016065839A (en) 2016-04-28

Similar Documents

Publication Publication Date Title
JP4584312B2 (en) Light irradiation apparatus and optical member
JP6818702B2 (en) Optical inspection equipment and optical inspection method
CN1720444B (en) Device and method for evaluating optical distortion of transparent plate body
JPH0355501A (en) Lens array plate
WO2009154182A1 (en) Edge surface observation apparatus
JP2012242268A (en) Inspection device and inspection method
US20180365821A1 (en) Image processing apparatus, method, and storage medium
JP5034891B2 (en) Apparatus for measuring shape of transparent plate and method for producing plate glass
JP6482223B2 (en) Light irradiation device and work inspection device
TWI691714B (en) Inspection device and inspection method
US9958262B2 (en) System for measuring three-dimensional profile of transparent object or refractive index by fringe projection
CN110118776B (en) Image inspection apparatus and illumination apparatus
JP4630945B1 (en) Defect inspection equipment
JP6938093B2 (en) A method for inspecting the boundary of an object to be inspected and its inspection device
JP2014169988A (en) Defect inspection device of transparent body or reflection body
JP2013205041A (en) Lighting device, inspection device, and manufacturing method of substrate
CN111272761A (en) Method and apparatus for inspecting surface defect of light-transmitting member
JP7043577B2 (en) Optical inspection equipment, methods and programs
CN111272762B (en) Surface defect inspection device for light-transmitting member
JP5437016B2 (en) Lighting device for image processing
TW202344906A (en) Method for inspecting optical member, inspection device, and manufacturing method
JP2024070555A (en) Light irradiation device and imaging system
TWI655405B (en) Non-contact surface contour scanning device
TWI654426B (en) Optical inspection equipment
TW202210825A (en) Method and device for inspecting object defects capable of directly capturing a grating image that is refracted to and then reflected by only a single light source, thereby avoiding interference caused by direct illumination of the light source

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170922

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20180523

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20180605

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180803

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20190124

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20190212

R150 Certificate of patent or registration of utility model

Ref document number: 6482223

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250