JP6442741B2 - Shear test equipment - Google Patents

Description

  The present invention relates to a shear test apparatus.

  In touch panels, mobile devices, etc., there are increasing opportunities to use adhesive tapes and adhesives such as double-sided tapes for connecting parts from the viewpoint of thinning, weight reduction, structure simplification, and the like. When using adhesive tapes and adhesives, it is necessary to understand their physical properties and behavior.

  The basic form of stress applied to the adhesive layer or adhesive of the adhesive tape is classified into, for example, tensile shear, splitting, peeling, and adhesive strength. Among them, methods for testing adhesive shear and bond strength are described in JIS K6850, K6859, and the like. In the shear test, in particular, shear properties such as shear strength, shear creep properties, and shear viscoelasticity are important physical property values.

A test apparatus having the following structure is known for measuring shear characteristics.
For example, a shear test apparatus having a first holding member and a second holding member that are bonded to the front and back surfaces of a sheet-like test piece is known. Then, while applying pressure to the test piece by the first and second holding members, a parallel force in the opposite direction is applied to the first holding member and the second holding member along the plane direction of the test piece. Test the shear properties in the thickness direction of the test piece. It is also possible to test the shearing properties of adhesive tapes and adhesives using this test apparatus.

  In addition, the shear tester has a first mounting piece and a second mounting piece that are bonded to the left and right ends of the anti-vibration rubber instead of the adhesive tape, adhesive, and test piece as described above. It has been known. The first mounting piece is fixed to the first gripping tool on the surface opposite to the test target adhesive surface, and the second mounting piece is the second gripping tool on the surface opposite to the test target adhesive surface. It is fixed to. The lower end of the first gripping tool is connected to the output end of the actuator through a plurality of leaf springs and a base plate in order. Further, the upper end of the second gripping tool is fixed to the fixed rod with a bolt. In such a state, the output end of the actuator applies a load to the leaf spring in a direction parallel to the bonding surfaces of the first mounting piece and the second mounting piece with respect to the anti-vibration rubber to be tested. Apply shear to rubber. Further, a predetermined compressive load is applied to the anti-vibration rubber via the first gripping tool and the first mounting piece by the spring body, and the spring body is pressed against the second mounting piece.

  An adhesive tape or an adhesive may be used as a test object of this apparatus, and it is possible to generate a shear load or a shear strain on the test object and measure the response.

  Also known are devices for biaxial loading, shear, permeability, and peel testing that test flexible fabric laminate materials under various pressure conditions. This apparatus has a load generating mechanism that rotates a clamp rod in contact with the laminate material in a lateral direction in a state where a tensile force is applied to the laminate material from four directions via a fastener mechanism. Thereby, the load generating mechanism applies a load to the laminate material for simulating the pressure state in at least one of deformation, in-plane shear, periodic load, gas permeability, layer or film peeling.

JP 2008-1111739 A Japanese Utility Model Publication No. 05-40866 JP 2010-002411 A

  In actual use of adhesive tapes and adhesives, temperature changes may occur in the usage environment, so place the test sample in a temperature-controllable environment during the shear test and control the temperature of that environment to a specific temperature. In some cases, shear measurement under the environment or temperature increase shear measurement or temperature decrease shear measurement is performed by sequentially changing the environment temperature.

  When the environmental temperature is changed in this manner, the pressure-sensitive adhesive tape or adhesive that is the test sample is expanded or contracted due to the temperature change. When the above-described shear test apparatus is used during the test, the test sample is fixed between the first and second holding members, or is pushed by the spring in the thickness direction via the first and second mounting pieces. Or compressed by a load generating mechanism. For this reason, the test sample is further subjected to expansion and contraction stress in the thickness direction due to thermal changes. Here, the thickness of the test object is the thickness indicated in the vertical direction from one surface to the other surface of the first and second holding members and the first and second mounting pieces.

  By the way, since the adhesive tape and adhesive are often used in an unloaded state in which the load is not substantially applied in the thickness direction in actual use, in the unloaded state in the thickness direction according to the actual use state. It may be required to perform a shear test. However, the test apparatus as described above cannot avoid the influence of stress due to expansion or contraction in the thickness direction of the test sample due to such a temperature change.

  An object of the present invention is to provide a shear test apparatus for performing a shear test in a plane direction by releasing a load applied in a thickness direction of a test sample.

According to one aspect of the present embodiment, a temperature control unit that controls the temperature of the test sample having adhesiveness, a first support having a first surface to which the first adhesive surface of the test sample is bonded, disposed opposite to the first surface of the first support, a second support which second adhesive surface different from the first adhesive surface of the test sample to have a second surface to be bonded, the temperature A friction reducing unit that allows the second support to move following the change in thickness of the test sample from the first surface to the second surface caused by the temperature change by the control unit; And a control unit that applies a shear stress to the first support in a first direction along the line.
The objects and advantages of the invention will be realized and attained by means of the elements and combinations particularly pointed out in the appended claims. It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention.

  According to the present embodiment, the load in the thickness direction of the test sample can be released and the shear test in the surface direction can be performed.

Fig.1 (a) is a sectional side view which shows an example of the shear test apparatus based on Embodiment, FIG.1 (b) is sectional drawing which shows some components of the shear test apparatus based on Embodiment. FIG. 2A is a plan view showing a state of an example of the shear test apparatus according to the embodiment as viewed from above, and FIG. 2B is a state of removing an upper cover of the example of the shear test apparatus according to the embodiment. FIG. 3A and 3B are side views showing the stress of the test sample in the conventional shear test apparatus, and FIG. 3C is a diagram showing the stress of the test sample in the shear test apparatus according to the embodiment. .

  Embodiments will be described below with reference to the drawings. In the drawings, similar components are given the same reference numerals.

  FIG. 1A is a side sectional view illustrating an example of a shear test apparatus according to the present embodiment. FIG.1 (b) is sectional drawing which shows a part of component provided in the shear test apparatus shown to Fig.1 (a). Moreover, Fig.2 (a) is a top view of the shear test apparatus based on embodiment, FIG.2 (b) is a top view which shows the state which removed the cover of the shear test apparatus shown to Fig.2 (a). It is. Fig.1 (a) is the II sectional view taken on the line of Fig.2 (a).

  In FIG. 1A, a substrate 1 has a shape in which a wall 1w is formed around a first surface 1a, and a first sample support is provided in the center of the first surface 1a and the sample placement region α above the vicinity. A tool 2 is arranged. The first sample support 2 is suspended by a support rod 3 connected to the upper end thereof so as to be movable at least in the A direction, for example, in the vertical direction. In addition, the direction from the 1st surface 1a in the board | substrate 1 to the 2nd surface 1b is made into the downward direction, and the reverse direction is made into the upward direction.

  The end of the support rod 3 away from the first sample support 2 is connected to a control unit 4 having an actuator, a load generation unit, a displacement sensor, a load sensor, and the like. Thus, the vertical load and movement are controlled.

  At both ends of the first sample support 2, a first sample bonding surface 2 a and a second sample bonding surface 2 b are formed so as to be parallel in opposite directions. Each of the first sample bonding surface 2a and the second sample bonding surface 2b is a surface to which an adhesive member that is a test sample, for example, a double-sided adhesive tape, an adhesive, or the like is bonded, and is formed to be substantially flat. It arrange | positions substantially perpendicular | vertical with respect to 1 surface 1a.

  Around the first sample support 2 on the first surface 1a on the substrate 1, the second sample support 5 is arranged in the direction in which the first sample adhesion surface 2a faces, and the second sample adhesion surface 2b is A third sample support 6 is arranged in the direction facing. The second sample support 5 and the third sample support 6 are formed in the same structure, for example, and are arranged in opposite directions.

  The second sample support 5 has a third sample adhesion surface 5a that opposes the first sample adhesion surface 2a of the first sample support 2, and the opposite side is provided at the first end of the wall 1w of the substrate 1. A protrusion 5b having a length protruding outward through the formed first recess 1u is formed. The protrusion 5b has such a size that a gap is generated between the protrusion 5b and the inner surface of the first recess 1u. Further, a knob portion 5c having a width wider than that of the first recess 1u is formed in a portion of the protrusion 5b protruding from the substrate 1.

  The third sample support 6 has a fourth sample adhesion surface 6a that is opposed to the second sample adhesion surface 2b of the first sample support 2, and the opposite side is provided at the second end of the wall 1w of the substrate 1. A protrusion 6b having a length protruding outwardly through the formed second recess 1v is formed. The protrusion 6b has such a size that a gap is generated between the protrusion 6b and the inner surface of the second recess 1v. In addition, a knob portion 6c having a width wider than that of the second recess 1v is formed in a portion of the protrusion 6b protruding from the substrate 1.

  A first flat bearing (flat ball bearing) 11 is movably sandwiched between the first surface 1 a of the substrate 1 and the second sample support 5, and the first surface 1 a of the substrate 1 and the third sample support 5 6, the second flat bearing 12 is movably sandwiched.

  As illustrated in FIG. 1B, each of the first and second flat bearings 11 and 12 has a structure in which a sphere 10c is easily fitted into each of a plurality of holes 10b formed in the thin plate 10a. Have. The inner surface of the hole 10b has a structure in which the spherical body 10c cannot be removed, for example, a curved taper 10d that receives the spherical surface of the spherical body 10c. The taper 10d is disposed, for example, so that the direction of gravity is wide.

  On the substrate 1, a lid body 7 that covers the second sample support tool 5, the third sample support tool 6, and the like is attached in an overlapping manner, and the periphery of the lower surface 7 b that is disposed facing the substrate 1 in the lid body 7. A wall 7w protrudes from the part. Further, the lid 7 is formed with an opening 7a for exposing the sample setting area α of the substrate 1, and the opening 7a is sized so that the first sample support 2 can be set in the sample setting area α. have. The wall portion 7w of the lid 7 and the wall portion 1w of the substrate 1 have a planar shape that is attached so as to overlap each other.

  A restriction projection 1c for preventing the first and second flat bearings 11 and 12 from moving to the sample setting region α is formed on a portion of the first surface 1a of the substrate 1 surrounding the sample setting region α. Yes. The restricting protrusion 1c is formed at a height equal to or lower than that of the first and second flat bearings 11 and 12. Accordingly, the second sample support 5 can be freely changed on the first flat bearing 11, and the third sample support 6 can be changed on the second flat bearing 12.

  Also, one end of a rod-shaped fixing component 9 that fixes the substrate 1 is attached to the approximate center of the second surface 1b of the substrate 1. The other end of the fixed component 9 is fixed to a fixed base (not shown).

  A third flat bearing 13 is sandwiched between the second sample support 5 and the lower surface 7b of the lid 7 so as to be easily movable. Similarly, a fourth flat bearing 14 is sandwiched between the third sample support 6 and the lower surface 7b of the lid 7 so as to be easily movable. In addition, on the lower surface 7b of the lid body 7, around the sample installation region α, there are formed restriction projections 7c for preventing the third and fourth flat bearings 13 and 14 from being exposed from the opening 7a. The restricting projection 7c is formed at a height equal to or lower than that of the third and fourth flat bearings 13 and 14.

  The first movement of a size that allows the second sample support 5, the first flat bearing 11, and the third flat bearing 13 to move smoothly from one end of the space between the substrate 1 and the lid 7 to the sample setting area α. It is a space (space) 15. Further, in the space between the wall 1w of the substrate 1 and the wall 7w of the lid 7, the third sample support 6, the second flat bearing 12, and the fourth flat bearing 14 are provided from the other end to the sample setting area α. Is a second movement space (space) 16 that can move smoothly. As a result, the substrate 1 and the lid body 7 serve as a housing that houses the first to third sample supports 2, 5, and 6. .

  Screw holes 1n are formed at a plurality of locations above the wall portion 1w of the substrate 1, and screw through holes 7n through which the screws 8 are passed are formed in the wall portion 7w of the lid 7 so as to overlap the screw holes 1n. . Further, the lid body 7 is fixed to the substrate 1 by screws 8 screwed to the screw holes 1n through the screw through holes 7n. A ring washer 18 through which the screw 8 is passed is sandwiched between the lid 7 and the substrate 1, and the interval between the substrate 1 and the lid 7 is adjusted by adjusting the tightening of the screw 8. In addition, you may adjust the clearance gap between the board | substrate 1 and the cover body 7 using a spring member like a spring pushing spring (not shown) instead of the ring washer 18. FIG.

  Thereby, the 1st, 2nd flat bearings 11 and 12 which contact the 1st surface 1a of the board | substrate 1 and the lower surface of the 2nd, 3rd sample support tools 5 and 6 can move smoothly. Similarly, the third and fourth flat bearings 13 and 14 that are in contact with the lower surface 7b of the lid 7 and the upper surfaces of the second and third sample supports 5 and 6 can move smoothly.

  In addition, although the above-described shear test apparatus for adhesive members is described in a bilaterally symmetric structure around the center of the sample installation region α as shown in FIGS. 2 (a) and 2 (b), it is asymmetric. It may be a structure.

Next, a shear test method for the sample samples S ₁ and S ₂ will be described using the above shear test apparatus.

  First, the first flat bearing 11 is placed on the first surface 1 a of the substrate 1 in the first moving space 15, and the second flat bearing 12 is placed on the first surface 1 a of the substrate 1 in the second moving space 16. Further, the second sample support 5 is mounted on the first flat bearing 11, and the third sample support 6 is mounted on the second flat bearing 12.

  In this case, the projection 5b of the second sample support 5 is placed in the first recess 1u of the substrate 1, and the projection 6b of the third sample support 6 is placed in the second recess 1v. The protrusions 5b and 6b have shapes and sizes that can be separated from the first and second recesses 1u and 1v and from the lid 7. Further, the third sample adhesion surface 5a of the second sample support 5 and the fourth sample adhesion surface 6a of the third sample support 6 are opposed to each other, and the knob portions 5c and 6c are positioned outside the substrate 1.

  The lengths of the protrusions 5b and 6b are formed so that the third sample adhesion surface 5a and the fourth sample adhesion surface 6a are separated in a state where the knob portions 5c and 6c are applied to the outer peripheral surface of the wall portion 1w of the substrate 1. This will facilitate later work.

  A third flat bearing 13 is mounted on the second sample support 5, and a fourth flat bearing 14 is mounted on the third sample support 6. Then, after the lid body 7 is overlaid on the substrate 1, the lid body 7 is screwed to the substrate 1 using screws 8. In this case, the wall portions of the lid body 7 and the substrate 1 are arranged so that the first to fourth flat bearings 11 to 14 contacting the first surface 1a of the substrate 1 and the lower surface 7a of the lid body 7 can move freely. The upper and lower intervals of 7w and 1w are adjusted. Further, it is confirmed that the first sample support 2 is attached to one end of the support rod 3 and the other end is connected to the control unit 4.

  In such a state, a test sample, for example, an adhesive or a double-sided pressure-sensitive adhesive tape is bonded to each of the first and second sample bonding surfaces 2 a and 2 b of the first sample support 2. In the case of a double-sided pressure-sensitive adhesive tape, the adhesive layer exposed on both surfaces is the adhesive surface. Moreover, in the case of an adhesive agent, the part which contacts the 1st-4th sample adhesion surface 2a, 2b, 5a, 6a of the 1st-3rd sample support tools 2,5,6 becomes an adhesion surface.

Further, the test sample adhered to the first sample adhesive surface 2a as a first sample S _1, the test sample adhered to the second sample adhesive surface 2b and the second sample S _2, they may be the same as May be different. The first first sample adhesive surface 2a of the sample support 2 the first adhesive surface of the first sample S ₁ is bonded, the first second sample adhesive surface 2b of the sample support 2 of the second sample S ₂ The first bonding surface is bonded.

  Further, the substrate 1 is fixed via a fixing component 9 attached to the second surface 1b of the substrate 1. In such a state, the first sample support 2 at one end of the support rod 3 is inserted into the sample setting region α on the first surface 1 a on the substrate 1 through the opening 7 a of the lid 7.

Further, the position of the support rod 3 is adjusted by the control unit 4, and the height of the first sample S ₁ bonded to the first sample bonding surface 2 a of the first sample support 2 and the third sample of the second sample support 5. The heights of the bonding surfaces 5a are made equal and separated from each other. Similarly, the height of the second sample S2 bonded to the second sample bonding surface 2b of the first sample support _{2 and} the height of the fourth sample bonding surface 6a of the third sample support 6 are aligned and separated from each other. To face each other. The support rod 3 is stopped by the control unit 4 so as to be in such a position.

From this state by operating the second knob portion 5a of the sample support 5, approach the second sample support 5 on the first sample S _1, finally the third second sample adhesive surface 5a of the first sample S ₁ The first sample S ₁ is sandwiched between the first sample support 2 and the second sample support 5 by bonding to the bonding surface. Thus the same operation, close the third sample support 6 to the second sample S _2, and finally the fourth sample adhering surface 6a adhered to the second adhesive surface of the second sample S _2, the first sample support ingredients 2 and the third sample support 6 to sandwich the second sample S _2.

As a result, the first bonding surface of the first sample S ₁ is bonded to the first sample bonding surface ₁ a of the first sample support 2, and the opposite second bonding surface is the third sample bonding of the second sample support 5. Adhere to the surface 5a. Similarly, the first bonding surface of the second sample S ₂ is bonded to the second sample bonding surface 1 b of the first sample support 2, and the opposite second bonding surface is the fourth sample bonding of the third sample support 6. Adhere to surface 6a.

Thereafter, when the restraints of the respective knob portions 5c and 6c of the second and third sample support tools 5 and 6 are released, the B direction from the first sample support tool 2 to the second and third sample support tools 5 and 6 is obtained. That is, almost no force is applied in the thickness direction of the first and second samples S ₁ and S ₂ . This is because the friction of the second and third sample supports 5 and 6 with respect to the substrate 1 and the lid 7 is greatly reduced by the first to fourth flat bearings 11 to 14, and the second and third sample supports 5, This is because the change in the B direction to 6 becomes smooth. The thickness of the first sample S _{1 is} the thickness in the direction from the first sample bonding surface 2 a of the first sample support 2 to the third sample bonding surface 5 a of the second sample support 5. The thickness of the second sample S _{2 is} the thickness in the direction from the second sample adhesion surface 2 b of the first sample support 2 to the fourth sample adhesion surface 6 a of the third sample support 6. Further, the B direction is a two-dimensional direction along the first surface 1 a of the substrate 1.

Next, a displacement or load in the A direction is generated on the first sample support 2 via the support rod 3 by an actuator (not shown) or a load generator (not shown) of the control unit 4. Thereby, strain and stress in the shear direction can be applied to the first sample S ₁ and the second sample S ₂ , and data measured by a displacement sensor (not shown) or a load sensor (not shown) of the control unit 4. For example, shear properties such as shear strength, shear creep properties, and shear viscoelasticity are obtained.

When a load is applied to the first sample support 2 in one of the A directions via the support rod 3, the second and third sample supports 5 and 6 are connected to the A via the _first and second samples S ₁ and S _2. Pulled in one direction. However, since the second and third sample supports 5 and 6 are pressed against the lid body 7 via the third and fourth flat bearings 13 and 14, the movement in the A direction is restricted, but the first to fourth The state in which the flat bearings 11 to 14 are movable in the B direction is maintained.

By the way, depending on the test, the temperature of the first and second samples S ₁ and S ₂ is changed in the temperature adjustment chamber 19 to perform the test while changing the high temperature environment, the low temperature environment, or the environmental temperature sequentially. Measurement and temperature drop may be performed. At this time, the first and second samples S ₁ and S ₂ undergo thermal expansion, thermal contraction, cold contraction, etc. due to changes in the environmental temperature. As shown in FIGS. When the expansion and contraction of the second samples S ₁ and S ₂ are suppressed by the sample support tools 25 and 26, the stress generated in the B direction due to the expansion shown in FIG. 3A or the contraction shown in FIG. Since the load in the A direction is affected, the accuracy of the shear test is adversely affected.

On the other hand, in this embodiment, as shown in FIG.3 (c), the 2nd, 3rd sample support tools 5 and 6 are 1st, 1st by the friction reduction effect of the 1st-4th flat bearings 11-14. The two samples S ₁ and S ₂ can move in the B direction following the change in thickness. For this reason, a shear test can be performed without adding stress in the thickness direction to the _first and second samples S ₁ and S ₂ .

In other words, in the thickness direction of the first and second samples S ₁ and S ₂ , the distance between the second and third sample supports 5 and 6 with respect to the first sample support 2 is the first, second sample S ₁ , changes following the deformation of the S _2. As a result, the shear test can be performed in a no-load state without applying a load to the B direction of the thickness of the first and second samples S ₁ and S ₂ .

  Accordingly, the second and third sample supports 5 and 6 which are movable jigs absorb displacement such as expansion and contraction of the test sample accompanying the change in the measurement environment due to temperature increase or decrease, humidification or drying. Thus, the shear test can be performed without applying a load in the thickness direction to the test sample. The test sample is not limited to the double-sided pressure-sensitive adhesive tape or adhesive as described above, but an adhesive sample, for example, a resin or metal member attached with an adhesive or rubber having adhesiveness, It may be a resin or the like.

  By the way, in the above-described shear test apparatus, two test samples can be tested at the same time, the balance between both ends of the first sample support 2 is improved, and so on. Third sample supports 5 and 6 are arranged. However, only one of the second and third sample supports 5 and 6 may be arranged. Further, in the above-described shearing device, the sample sample is attached to the surfaces of both ends of the first sample support 2, but the sample sample is attached to a plurality of surfaces, for example, four side surfaces of a cube, and these surfaces are attached. A plurality of second and third sample supporters 5 and 6 that face each other may be disposed. The flat bearings 11 to 14 are disposed in contact with at least the surface in the A direction of the second and third sample supports, but are disposed between both side surfaces and the wall portions 1w and 7w. May be. Moreover, as a temperature control part which controls the environmental temperature of a test sample, you may arrange | position the blowing part of a hot air and cold air other than the above temperature control chamber 19. FIG.

  All examples and conditional expressions given here are intended to help the reader understand the inventions and concepts that have contributed to the promotion of technology, such examples and It is interpreted without being limited to the conditions, and the organization of such examples in the specification is not related to showing the superiority or inferiority of the present invention. While embodiments of the present invention have been described in detail, it will be understood that various changes, substitutions and variations can be made thereto without departing from the spirit and scope of the invention.

Next, features of the embodiment of the present invention will be described.
(Supplementary Note 1) A temperature control unit that controls the temperature of the test sample having adhesiveness, a first support having a first surface to which the first adhesive surface of the test sample is bonded, and the first support The first surface which is arranged to face the first surface and has a second surface to which a second adhesive surface different from the first adhesive surface of the test sample is bonded, and is generated by the temperature change by the temperature control unit. A movable second support that follows a change in thickness of the test sample from a surface to the second surface, and a controller that applies shear stress to the first support in a first direction along the first surface. And a shear test apparatus.
(Supplementary note 2) The shear test according to claim 1, wherein a plurality of the first surfaces are formed on the first support part, and a plurality of the second support parts are arranged around the first support part. apparatus.
(Additional remark 3) It has a bearing which touches the said 2nd support tool, and assists the movement of the said 2nd support tool to the said thickness direction of the said test sample, The shear of Claim 1 or Claim 2 characterized by the above-mentioned. Test equipment.
(Supplementary note 4) The shear test apparatus according to any one of supplementary notes 1 to 3, wherein the bearing is arranged so as to be movable in a direction intersecting the first direction.
(Supplementary Note 5) The second support is placed between the substrate and the lid, and the bearings are respectively between the second support and the substrate, and between the second support and the lid. The shear test apparatus according to appendix 4, which is placed.
(Appendix 6) The shear test apparatus according to appendix 5, wherein a space for moving the bearing and the second support is secured in a direction in which the bear rig slides between the substrate and the lid. .
(Additional remark 7) As for the said 2nd support tool, the protrusion for position adjustment is attached to the position different from the surface which supports the said test sample, It is any one of Additional remark 1 thru | or 6 characterized by the above-mentioned. Shear test equipment.
(Additional remark 8) In at least one of the said board | substrate and the said cover body, the protrusion which regulates the contact to the said test sample of the said bearing is provided in the circumference | surroundings of the said 1st support tool, The additional remark 5 characterized by the above-mentioned. To the shear test device according to any one of appendix 7.
(Additional remark 9) The said cover body is provided with the opening part which inserts a said 1st support tool toward the said board | substrate, The shear test apparatus as described in any one of Additional remark 5 thru | or Additional remark 8 characterized by the above-mentioned .

DESCRIPTION OF SYMBOLS 1 Substrate 1w Wall part 2 1st sample support tool 3 Support rod 4 Control part 5 2nd sample support tool 6 3rd sample support tool 7 Lid 7a Opening part 7w Wall part 8 Screws 11-14 Flat bearings 15 and 16 Movement space

Claims (4)

A temperature control unit for controlling the temperature of the test sample having adhesiveness;
A first support having a first surface to which a first adhesive surface of the test sample is bonded;
Disposed opposite to the first surface of the first support, a second support which second adhesive surface different from the first adhesive surface of the test sample to have a second surface to be bonded,
A friction reduction unit that allows the second support to move following a change in the thickness of the test sample from the first surface to the second surface caused by the temperature change by the temperature control unit;
A controller for applying a shear stress to the first support in a first direction along the first surface;
Shear test device. The shear test apparatus according to claim 1, wherein a plurality of the first surfaces of the first support tool are formed, and a plurality of the second support tools are arranged around the first support tool . Said second support in contact, according to claim 1 or claim 2 wherein the friction reducing unit to assist the movement of the second support to the thickness direction of the test sample is characterized by bearing der Rukoto Shear test equipment.   The shear test apparatus according to claim 3, wherein the bearing is disposed so as to be movable in a direction intersecting the first direction.

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