JP6437329B2 - Optical film defect inspection method - Google Patents

Optical film defect inspection method Download PDF

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JP6437329B2
JP6437329B2 JP2015019450A JP2015019450A JP6437329B2 JP 6437329 B2 JP6437329 B2 JP 6437329B2 JP 2015019450 A JP2015019450 A JP 2015019450A JP 2015019450 A JP2015019450 A JP 2015019450A JP 6437329 B2 JP6437329 B2 JP 6437329B2
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圭太 井村
圭太 井村
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Sumitomo Chemical Co Ltd
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Description

本発明は、光学フィルムの欠陥検査方法に関し、光学フィルムの欠陥検査装置、光学フィルムの製造方法、及び、光学フィルムの製造装置にも関するものである。   The present invention relates to an optical film defect inspection method, and also relates to an optical film defect inspection device, an optical film manufacturing method, and an optical film manufacturing device.

光学フィルムとして、偏光特性を有する偏光板や複屈折性を有する位相差板などの光学フィルム本体部を含み、これらの光学フィルム本体部における一方の主面にセパレートフィルム付き粘着材が貼付された光学フィルムが知られている。この様な光学フィルムは通常、帯状の光学フィルム本体部を長さ方向に連続的に搬送しながら、帯状のセパレートフィルム付き粘着材を連続的に貼付して生産され、得られた光学フィルムは連続的に搬送される。特許文献１〜３には、この種の光学フィルムの欠陥検査方法が開示されている。   An optical film including an optical film main body such as a polarizing plate having polarization characteristics and a phase difference plate having birefringence as an optical film, and an adhesive with a separate film attached to one main surface of these optical film main bodies Film is known. Such an optical film is usually produced by continuously sticking an adhesive with a strip-shaped separate film while continuously transporting the strip-shaped optical film main body in the length direction, and the obtained optical film is continuous. Is conveyed. Patent Documents 1 to 3 disclose this type of optical film defect inspection method.

光学フィルム本体部が偏光板である場合、欠陥検査方法では、光学フィルムにおける一方の主面（セパレートフィルム付き粘着材側）とは反対側の他方の主面側に設けられた光源によって、光学フィルムに光を照射する光照射工程と、光学フィルムの一方の主面側に設けられた透過検査器によって、光学フィルムと透過検査器との間に設けられた透過検査用偏光フィルタを介して、光学フィルムを透過した光を受光する受光工程とを含み、光学フィルム（偏光板）と透過検査用偏光フィルタとによるクロスニコル法透過検査によって、光学フィルムの欠陥検査を行う。   When the optical film body is a polarizing plate, in the defect inspection method, an optical film is provided by a light source provided on the other main surface side opposite to one main surface (adhesive material side with a separate film) in the optical film. The light irradiation process for irradiating light to the optical film and the transmission inspection device provided on the one main surface side of the optical film, through the transmission inspection polarizing filter provided between the optical film and the transmission inspection device. A light receiving step of receiving light transmitted through the film, and performing a defect inspection of the optical film by a crossed Nicols transmission inspection using an optical film (polarizing plate) and a transmission inspection polarizing filter.

光学フィルム本体部が位相差板である場合、欠陥検査方法では、光学フィルムにおける一方の主面（セパレートフィルム付き粘着材側）とは反対側の他方の主面側に設けられた光源によって、光学フィルムと光源との間に設けられた透過検査用補助偏光フィルタを介して、光学フィルムに光を照射する光照射工程と、光学フィルムの一方の主面側に設けられた透過検査器によって、光学フィルムと透過検査器との間に設けられた透過検査用偏光フィルタを介して、光学フィルムを透過した光を受光する受光工程とを含み、透過検査用補助偏光フィルタと透過検査用偏光フィルタとによるクロスニコル法透過検査によって、光学フィルムの欠陥検査を行う。   When the optical film body is a phase difference plate, the defect inspection method uses a light source provided on the other main surface side of the optical film opposite to the one main surface (adhesive material side with a separate film). The optical irradiation process is performed by irradiating the optical film with light through an auxiliary polarizing filter for transmission inspection provided between the film and the light source, and the transmission inspection device provided on one main surface side of the optical film. A light receiving step of receiving light transmitted through the optical film via a transmission inspection polarizing filter provided between the film and the transmission inspection device, and comprising a transmission inspection auxiliary polarizing filter and a transmission inspection polarizing filter. The optical film is inspected for defects by the crossed Nicols transmission inspection.

ところで、セパレートフィルム付き粘着材におけるセパレートフィルムとしては、延伸工程を経て生産されていて、比較的大きな複屈折性を示す延伸フィルムが用いられている。このため、セパレートフィルムは複屈折性に基づく配向角を有しており、これらのクロスニコル法透過検査では、セパレートフィルム付き粘着材におけるセパレートフィルムの配向角を考慮して、透過検査用偏光フィルタの偏光軸（例えば、透過検査用偏光フィルタの回転角度）を調整することによって、クロスニコル状態を実現する。   By the way, as a separate film in the adhesive material with a separate film, the stretched film which is produced through the extending process and shows comparatively large birefringence is used. For this reason, the separate film has an orientation angle based on birefringence, and in these crossed Nicol method transmission inspections, the orientation angle of the separate film in the adhesive material with a separate film is taken into consideration, and the polarizing filter for transmission inspection is used. A crossed Nicols state is realized by adjusting the polarization axis (for example, the rotation angle of the polarization filter for transmission inspection).

特開２００７−２１３０１６号公報Japanese Patent Laid-Open No. 2007-213061 国際公開第２０１１／１４８７９０号International Publication No. 2011/148790 特開２００１−３４９８３９号公報JP 2001-349839 A

ところで、この様な光学フィルムの生産に使用するセパレートフィルム付き粘着材として、例えば数千メートルほどの長さのものを用い、一方、偏光板や位相差板などの光学フィルム本体部として、例えば数万メートルほどの長さのものを用いると、セパレートフィルム付き粘着材は、一つの光学フィルム本体部に対して、繋ぎ合せながら連続的に貼付されることとなる。   By the way, as a pressure-sensitive adhesive with a separate film used for the production of such an optical film, for example, a material having a length of about several thousand meters is used. On the other hand, as an optical film body such as a polarizing plate or a retardation plate, for example, several When a material having a length of about 10,000 meters is used, the pressure-sensitive adhesive material with a separate film is continuously attached to one optical film main body while being joined.

このセパレートフィルム付き粘着材におけるセパレートフィルムとしては、例えば原料フィルムを延伸して得られた幅広の延伸フィルムを、貼付すべき光学フィルム本体部の幅に合せて、幅方向に複数に裁断されたものが用いられる。原料フィルムを延伸して延伸フィルムとする際、フィルムの幅方向で配向角が僅かに変化する、いわゆるボーイングと呼ばれる現象に起因して幅方向に配向角のばらつきが生じるため、貼付すべきセパレートフィルム付き粘着材ごとに、配向角が異なることとなる。   As a separate film in this adhesive material with a separate film, for example, a wide stretched film obtained by stretching a raw material film is cut into a plurality in the width direction according to the width of the optical film main body to be attached. Is used. When a raw film is stretched to obtain a stretched film, the orientation angle slightly changes in the width direction of the film, and the orientation angle varies in the width direction due to a phenomenon called so-called bowing. An orientation angle will differ for every adhesive material with attachment.

そのため、上記したように、偏光板や位相差板にセパレートフィルム付き粘着材を貼付した後にクロスニコル法透過検査を行う場合、使用するセパレートフィルム付き粘着材ごとに透過検査用偏光フィルタの偏光軸を調整する必要がある。   Therefore, as described above, when the cross-Nicol transmission test is performed after the adhesive material with a separate film is applied to a polarizing plate or a retardation plate, the polarization axis of the polarizing filter for transmission test is set for each adhesive material with a separate film to be used. Need to adjust.

しかしながら、連続的に生産される光学フィルム本体部に対して連続的に、すなわちインラインでクロスニコル法透過検査を行う場合、セパレートフィルム付き粘着材のロールを切り替えるために透過検査用偏光フィルタの偏光軸を調整しているときであっても、光学フィルム本体部は連続的に生成される。このため、この調整の間に得られる光学フィルムの領域は未検査領域となってしまう。例えば、透過検査用偏光フィルタの偏光軸の調整にかかる時間が約１分、ライン速度が約１０〜３０ｍ／分とすると、セパレートフィルム付き粘着材の切替１回において約１０〜３０ｍもの光学フィルムの領域が未検査となってしまう。   However, in the case of performing the cross-Nicol transmission inspection continuously on the optical film main body produced continuously, that is, in-line, the polarization axis of the polarization filter for transmission inspection is used to switch the roll of the adhesive material with a separate film. Even when adjusting the optical film body, the optical film body is continuously generated. For this reason, the region of the optical film obtained during this adjustment becomes an uninspected region. For example, if the time required for adjusting the polarization axis of a polarizing filter for transmission inspection is about 1 minute and the line speed is about 10 to 30 m / min, an optical film of about 10 to 30 m can be obtained in one switching of the adhesive with a separate film. The area becomes uninspected.

そこで、本発明は、セパレートフィルムの配向角のばらつきに起因して必要となるクロスニコル法透過検査用偏光フィルタの偏光軸の調整時間を短縮することが可能な光学フィルムの欠陥検査方法を提供することを目的とする。また、本発明は、光学フィルムの欠陥検査装置、光学フィルムの製造方法、及び、光学フィルムの製造装置を提供することをも目的とする。   Therefore, the present invention provides an optical film defect inspection method capable of shortening the adjustment time of the polarization axis of the polarizing filter for crossed Nicol method transmission inspection required due to variations in the orientation angle of the separate film. For the purpose. Another object of the present invention is to provide an optical film defect inspection apparatus, an optical film manufacturing method, and an optical film manufacturing apparatus.

本発明の光学フィルムの欠陥検査方法は、光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼付してなる光学フィルムにおけるセパレートフィルム付き粘着材側となる一方の主面側又は他方の主面側に設けられた光源と、光学フィルムに対して光源と反対側に設けられた透過検査器と、光学フィルムの一方の主面と光源又は透過検査器との間に設けられた透過検査用の偏光フィルタとを備える欠陥検査装置を用いて光学フィルムの欠陥を検査する方法であって、欠陥検査装置は、光学フィルムの一方の主面側に設けられた配向角測定器を更に備え、欠陥検査方法は、配向角測定器によって、セパレートフィルムの配向角を測定する配向角測定工程と、配向角測定工程において測定された配向角に基づいて、偏光フィルタの偏光軸を調整する調整工程と、光源によって、光学フィルムに光を照射する光照射工程と、透過検査器によって、偏光フィルタを介して光学フィルムを透過した光を受光し、受光した透過光に基づいて光学フィルムの欠陥検査を行う欠陥検査工程とを含む。   In the optical film defect inspection method of the present invention, an optical film formed by attaching a separate film-attached adhesive material to one main surface of the optical film main body portion, one main surface side or the other of the adhesive film-attached adhesive material side. A light source provided on the main surface side, a transmission inspection device provided on the opposite side of the light source with respect to the optical film, and a transmission inspection provided between one main surface of the optical film and the light source or transmission inspection device A method for inspecting a defect of an optical film using a defect inspection apparatus comprising a polarizing filter for the defect, the defect inspection apparatus further comprising an orientation angle measuring device provided on one main surface side of the optical film, The defect inspection method includes an orientation angle measuring step of measuring the orientation angle of a separate film with an orientation angle measuring device, and a polarizing filter based on the orientation angle measured in the orientation angle measuring step. An adjustment process for adjusting the optical axis, a light irradiation process for irradiating the optical film with light by a light source, and a light transmitted through the optical film through a polarizing filter by a transmission inspection device, and based on the received transmitted light And a defect inspection process for inspecting the optical film for defects.

また、本発明の光学フィルムの欠陥検査装置は、光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼付してなる光学フィルムの欠陥検査装置であって、光学フィルムにおけるセパレートフィルム付き粘着材側の一方の主面側又は他方の主面側に設けられ、光学フィルムに光を照射する光源と、光学フィルムに対して光源と反対側に設けられ、光学フィルムを透過した光を受光する透過検査器と、光学フィルムの一方の主面と光源又は透過検査器との間に設けられた透過検査用の偏光フィルタと、光学フィルムの一方の主面側に設けられ、セパレートフィルムの配向角を測定する配向角測定器とを備え、配向角測定器によって測定された配向角に基づいて偏光フィルタの偏光軸を調整した後に、透過検査器によって受光した透過光に基づいて光学フィルムの欠陥検査を行う。   Further, the optical film defect inspection apparatus of the present invention is an optical film defect inspection apparatus in which an adhesive material with a separate film is attached to one main surface of an optical film main body, and is an adhesive with a separate film in an optical film. Provided on one main surface side of the material side or the other main surface side, and a light source for irradiating the optical film with light, and provided on the side opposite to the light source with respect to the optical film, and receives light transmitted through the optical film. Transmission inspection device, polarizing filter for transmission inspection provided between one main surface of optical film and light source or transmission inspection device, and orientation angle of separate film provided on one main surface side of optical film And adjusting the polarization axis of the polarizing filter based on the orientation angle measured by the orientation angle measuring device, and then receiving the light by the transmission inspection device. A defect inspection of the optical film, based on the over-light.

この光学フィルムの欠陥検査方法及び欠陥検査装置によれば、配向角測定器によってセパレートフィルムの配向角を測定し、測定した配向角に基づいて偏光フィルタの偏光軸を調整するので、セパレートフィルムの配向角のばらつきに起因して必要となるクロスニコル法透過検査用の偏光フィルタの偏光軸の調整時間を短縮することができる。その結果、インラインでクロスニコル法透過検査を行う場合に、セパレートフィルム付き粘着材のロールを切り替えるために透過検査用偏光フィルタの偏光軸を調整しているときに連続的に生成される光学フィルムの未検査領域を削減することができ、無駄を低減することができる。   According to the defect inspection method and the defect inspection apparatus for this optical film, the orientation angle of the separation film is measured by the orientation angle measuring device, and the polarization axis of the polarizing filter is adjusted based on the measured orientation angle. It is possible to shorten the adjustment time of the polarization axis of the polarizing filter for crossed Nicols transmission inspection required due to the variation in the angle. As a result, when the cross-Nicol method transmission inspection is performed in-line, the optical film continuously generated when the polarization axis of the polarization filter for transmission inspection is adjusted to switch the roll of the adhesive material with a separate film. Uninspected areas can be reduced, and waste can be reduced.

なお、この光学フィルムの欠陥検査方法及び欠陥検査装置は、偏光板本体部の一方の主面にセパレートフィルム付き粘着材を貼付してなる偏光板の欠陥検査であって、この偏光板と透過検査用偏光フィルタとによるクロスニコル法透過検査に適用可能である。   The defect inspection method and the defect inspection apparatus for the optical film are defect inspection of a polarizing plate formed by attaching an adhesive material with a separate film to one main surface of the polarizing plate main body, and the polarizing plate and the transmission inspection It can be applied to the crossed Nicols transmission inspection with a polarizing filter for use.

上記した光学フィルムの欠陥検査装置は、光学フィルムの他方の主面と光源又は透過検査器との間に設けられた透過検査用の補助偏光フィルタを更に備えてもよい。また、上記した光学フィルムの欠陥検査方法における欠陥検査工程では、偏光フィルタ及び補助偏光フィルタを介して光学フィルムを透過した光を受光し、受光した透過光に基づいて光学フィルムの欠陥検査を行ってもよい。   The optical film defect inspection apparatus described above may further include an auxiliary polarizing filter for transmission inspection provided between the other main surface of the optical film and the light source or transmission inspection device. In the defect inspection step in the optical film defect inspection method described above, the light transmitted through the optical film is received through the polarizing filter and the auxiliary polarizing filter, and the optical film is inspected based on the received transmitted light. Also good.

この光学フィルムの欠陥検査方法及び欠陥検査装置は、位相差板本体部の一方の主面にセパレートフィルム付き粘着材を貼付してなる位相差板の欠陥検査であって、透過検査用偏光フィルタと透過検査用補助偏光フィルタとによるクロスニコル法透過検査に適用可能である。   This optical film defect inspection method and defect inspection apparatus is a retardation inspection for a retardation plate in which an adhesive material with a separate film is attached to one main surface of a retardation plate main body, and includes a polarizing filter for transmission inspection and The present invention can be applied to a crossed Nicols transmission inspection using an auxiliary polarizing filter for transmission inspection.

また、上記した光学フィルムの欠陥検査方法では、配向角測定工程において測定された配向角の情報を光学フィルム上に記録する記録工程を更に含み、調整工程では、記録工程において光学フィルム上に記録された配向角の情報に基づいて、偏光フィルタの偏光軸を調整してもよい。また、上記した光学フィルムの欠陥検査装置では、配向角測定器によって測定された配向角の情報を光学フィルム上に記録する記録部を更に備え、記録部によって光学フィルム上に記録された配向角の情報に基づいて偏光フィルタの偏光軸を調整した後に、透過検査器によって受光した透過光に基づいて光学フィルムの欠陥検査を行ってもよい。   The defect inspection method for an optical film described above further includes a recording step of recording information on the orientation angle measured in the orientation angle measurement step on the optical film, and the adjustment step is recorded on the optical film in the recording step. The polarization axis of the polarizing filter may be adjusted based on the information on the orientation angle. The optical film defect inspection apparatus further includes a recording unit that records information on the orientation angle measured by the orientation angle measuring device on the optical film, and the orientation angle recorded on the optical film by the recording unit. After adjusting the polarization axis of the polarizing filter based on the information, a defect inspection of the optical film may be performed based on the transmitted light received by the transmission inspection device.

この光学フィルムの欠陥検査方法及び欠陥検査装置によれば、配向角測定工程から記録工程まで同一ラインで行い、調整工程、光照射工程及び欠陥検査工程を別ラインで行うことが可能となる。   According to the defect inspection method and the defect inspection apparatus for the optical film, it is possible to perform the alignment process, the light irradiation process, and the defect inspection process on separate lines from the orientation angle measurement process to the recording process.

本発明の光学フィルムの製造方法は、上記した光学フィルムの欠陥検査方法を含み、配向角測定工程及び欠陥検査工程前に、光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼付する貼付工程を含む形態であってもよいし、配向角測定工程後であって欠陥検査工程前に、光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼付する貼付工程を含む形態であってもよい。   The optical film manufacturing method of the present invention includes the optical film defect inspection method described above, and an adhesive material with a separate film is attached to one main surface of the optical film main body before the orientation angle measurement step and the defect inspection step. In a form including an attaching step, or after an orientation angle measuring step and before a defect inspection step, including an attaching step of attaching an adhesive material with a separate film to one main surface of the optical film main body. There may be.

また、本発明の光学フィルムの製造装置は、上記した光学フィルムの欠陥検査装置を備え、配向角測定器及び透過検査器の上流側において、光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼り合わせる形態であってもよいし、配向角測定器の下流側であって透過検査器の上流側において、光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼り合わせる形態であってもよい。   In addition, the optical film manufacturing apparatus of the present invention includes the above-described optical film defect inspection apparatus, and is provided with an adhesive with a separate film on one main surface of the optical film main body on the upstream side of the orientation angle measurement device and the transmission inspection device. It may be in the form of laminating materials, or in the form of laminating an adhesive material with a separate film on one main surface of the optical film body on the downstream side of the orientation angle measuring device and upstream of the transmission inspection device. There may be.

本発明によれば、セパレートフィルムの配向角のばらつきに起因して必要となるクロスニコル法透過検査用偏光フィルタの偏光軸の調整時間を短縮することができる。その結果、インラインでクロスニコル法透過検査を行う場合に、セパレートフィルム付き粘着材のロールを切り替えるための透過検査用偏光フィルタの偏光軸を調整しているときに連続的に生成される光学フィルムの未検査領域を削減することができ、無駄を低減することができる。   ADVANTAGE OF THE INVENTION According to this invention, the adjustment time of the polarization axis of the polarizing filter for cross Nicol method transmission inspection required due to the dispersion | variation in the orientation angle of a separate film can be shortened. As a result, when the cross-Nicol method transmission inspection is performed in-line, the optical film continuously generated when the polarization axis of the polarizing filter for transmission inspection for switching the roll of the adhesive material with a separate film is adjusted. Uninspected areas can be reduced, and waste can be reduced.

本発明の第１の実施形態に係る偏光板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに偏光板（光学フィルム）の製造装置及び製造方法を示す図である。It is a figure which shows the defect inspection apparatus and defect inspection method of a polarizing plate (optical film) which concern on the 1st Embodiment of this invention, and the manufacturing apparatus and manufacturing method of a polarizing plate (optical film). 図１に示す製造装置及び製造方法によって製造される偏光板を示す図である。It is a figure which shows the polarizing plate manufactured by the manufacturing apparatus and manufacturing method shown in FIG. 図１に示すセパレートフィルムの配向角ばらつきを示す図である。It is a figure which shows the orientation angle dispersion | variation of the separate film shown in FIG. 本発明の第２の実施形態に係る偏光板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに偏光板（光学フィルム）の製造装置及び製造方法を示す図である。It is a figure which shows the defect inspection apparatus and defect inspection method of a polarizing plate (optical film) which concern on the 2nd Embodiment of this invention, and the manufacturing apparatus and manufacturing method of a polarizing plate (optical film). 本発明の第３の実施形態に係る位相差板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに位相差板（光学フィルム）の製造装置及び製造方法を示す図である。It is a figure which shows the defect inspection apparatus and defect inspection method of a phase difference plate (optical film) which concern on the 3rd Embodiment of this invention, and the manufacturing apparatus and manufacturing method of a phase difference plate (optical film). 図５に示す製造装置及び製造方法によって製造される位相差板を示す図である。It is a figure which shows the phase difference plate manufactured by the manufacturing apparatus and manufacturing method shown in FIG. 本発明の第４の実施形態に係る位相差板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに位相差板（光学フィルム）の製造装置及び製造方法を示す図である。It is a figure which shows the defect inspection apparatus and defect inspection method of a phase difference plate (optical film) which concern on the 4th Embodiment of this invention, the manufacturing apparatus and manufacturing method of a phase difference plate (optical film). 本発明の変形例に係る偏光板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに偏光板（光学フィルム）の製造装置及び製造方法を示す図である。It is a figure which shows the defect inspection apparatus and defect inspection method of a polarizing plate (optical film) which concerns on the modification of this invention, and the manufacturing apparatus and manufacturing method of a polarizing plate (optical film). 本発明の変形例に係る偏光板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに偏光板（光学フィルム）の製造装置及び製造方法を示す図である。It is a figure which shows the defect inspection apparatus and defect inspection method of a polarizing plate (optical film) which concerns on the modification of this invention, and the manufacturing apparatus and manufacturing method of a polarizing plate (optical film).

以下、図面を参照して本発明の好適な実施形態について詳細に説明する。なお、各図面において同一又は相当の部分に対しては同一の符号を附すこととする。
［第１の実施形態］ DESCRIPTION OF EMBODIMENTS Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. In the drawings, the same or corresponding parts are denoted by the same reference numerals.
[First Embodiment]

図１は、本発明の第１の実施形態に係る偏光板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに偏光板（光学フィルム）の製造装置及び製造方法を示す図であり、図２は、図１に示す製造装置及び製造方法によって製造される偏光板を示す図である。   FIG. 1 is a diagram showing a polarizing plate (optical film) defect inspection apparatus and defect inspection method, and a polarizing plate (optical film) manufacturing apparatus and manufacturing method according to the first embodiment of the present invention. These are figures which show the polarizing plate manufactured by the manufacturing apparatus and manufacturing method shown in FIG.

図１に示す製造装置１０は、図２に示す偏光板１００を製造するためのものである。まず、製造装置１０は、偏光子１１１の主面両側に保護フィルム１１２を貼りあわせて、偏光板本体部（光学フィルム本体部）１１０を生成する。次いで、製造装置１０は、セパレートフィルム（離型フィルム）１２１が粘着材１２２に貼り合わされたセパレートフィルム付き粘着材１２０を偏光板本体部１１０に貼り合わせて、偏光板１００を生成する。次いで、製造装置１０は、生成した偏光板１００を原反巻取１１によって巻き取る。   The manufacturing apparatus 10 shown in FIG. 1 is for manufacturing the polarizing plate 100 shown in FIG. First, the manufacturing apparatus 10 bonds the protective film 112 on both sides of the main surface of the polarizer 111 to generate a polarizing plate main body (optical film main body) 110. Next, the manufacturing apparatus 10 bonds the adhesive film 120 with a separate film in which the separate film (release film) 121 is bonded to the adhesive material 122 to the polarizing plate main body 110 to generate the polarizing plate 100. Next, the manufacturing apparatus 10 winds up the produced polarizing plate 100 with the raw fabric winding 11.

偏光子１１１の材料としては、ポリビニルアルコール（Polyvinyl Alcohol：ＰＶＡ）等が挙げられ、保護フィルム１１２の材料としては、トリアセチルセルロース（Triacetylcellulose：ＴＡＣ）等が挙げられる。また、セパレートフィルム１２１の材料としては、ポリエチレンテレフタレート（Polyethylene Terephthalate：ＰＥＴ）等が挙げられる。セパレートフィルム１２１を剥がすことにより、偏光板１００は、粘着材１２２によって液晶パネルや他の光学フィルム等に貼り合わせることが可能となる。   Examples of the material of the polarizer 111 include polyvinyl alcohol (PVA), and examples of the material of the protective film 112 include triacetylcellulose (TAC). Examples of the material of the separate film 121 include polyethylene terephthalate (PET). By peeling the separate film 121, the polarizing plate 100 can be bonded to a liquid crystal panel, another optical film, or the like with the adhesive material 122.

また、製造装置１０は欠陥検査装置２０を含む。欠陥検査装置２０は、配向角測定器２１と、光源２２と、透過検査器２３と、透過検査用偏光フィルタ２４とを備え、インラインにて偏光板１００の欠陥検査を行う。   The manufacturing apparatus 10 includes a defect inspection apparatus 20. The defect inspection apparatus 20 includes an orientation angle measuring device 21, a light source 22, a transmission inspection device 23, and a transmission inspection polarizing filter 24, and performs a defect inspection of the polarizing plate 100 in-line.

配向角測定器２１は、透過検査器２３よりも製造ラインの上流側において、偏光板１００におけるセパレートフィルム付き粘着材１２０側の一方の主面１０１側に設けられており、セパレートフィルム１２１の配向角を測定する。配向角測定器２１は、測定した配向角の情報を透過検査用偏光フィルタ２４へ提供する。配向角測定器２１としては、インライン軸測定器（例えば、大塚電子製ＲＥ−２００）などが使用可能である。配向角測定器２１よりも製造ラインの下流側には、光源２２及び透過検査器２３が設けられている。   The orientation angle measuring device 21 is provided on the one main surface 101 side of the polarizing film 100 on the side of the pressure-sensitive adhesive material with a separate film 120 on the upstream side of the transmission test device 23, and the orientation angle of the separate film 121. Measure. The orientation angle measuring device 21 provides information of the measured orientation angle to the transmission inspection polarizing filter 24. As the orientation angle measuring device 21, an inline axis measuring device (for example, RE-200 manufactured by Otsuka Electronics Co., Ltd.) or the like can be used. A light source 22 and a transmission inspection device 23 are provided on the downstream side of the production line from the orientation angle measuring device 21.

光源２２は、偏光板１００の他方の主面１０２側に設けられており、偏光板１００の他方の主面１０２側に光を照射する。一方、透過検査器２３は、偏光板１００の一方の主面１０１側に設けられており、透過検査用偏光フィルタ２４を介して偏光板１００を透過した光を受光する。   The light source 22 is provided on the other main surface 102 side of the polarizing plate 100 and irradiates light on the other main surface 102 side of the polarizing plate 100. On the other hand, the transmission inspection device 23 is provided on the one main surface 101 side of the polarizing plate 100, and receives light transmitted through the polarizing plate 100 via the transmission inspection polarizing filter 24.

透過検査用偏光フィルタ２４は、偏光板１００の一方の主面１０１と透過検査器２３との間に設けられている。透過検査用偏光フィルタ２４は、偏光軸調整機構を有しており、配向角測定器２１からのセパレートフィルム１２１の配向角の情報に基づいて、偏光板本体部１１０の偏光軸に対する偏光フィルタ２４の偏光軸（例えば、偏光フィルタ２４の回転角度）を調整して、クロスニコル状態を形成する。例えば、偏光軸調整機構は、セパレートフィルム１２１の配向角に関連付けて偏光フィルタ２４の偏光軸の調整量を予めルックアップテーブルとして記憶し、このルックアップテーブルに基づいて、測定したセパレートフィルム１２１の配向角に対応した偏光フィルタ２４の偏光軸を自動的に決定する。   The transmission inspection polarizing filter 24 is provided between one main surface 101 of the polarizing plate 100 and the transmission inspection device 23. The transmission inspection polarizing filter 24 has a polarization axis adjusting mechanism, and based on the orientation angle information of the separate film 121 from the orientation angle measuring device 21, the polarization filter 24 with respect to the polarization axis of the polarizing plate main body 110 is provided. The polarization axis (for example, the rotation angle of the polarization filter 24) is adjusted to form a crossed Nicols state. For example, the polarization axis adjustment mechanism stores the adjustment amount of the polarization axis of the polarization filter 24 in advance as a lookup table in association with the orientation angle of the separate film 121, and the orientation of the separated film 121 measured based on this lookup table. The polarization axis of the polarization filter 24 corresponding to the angle is automatically determined.

偏光フィルタ２４の偏光軸の調整後、透過検査器２３によって、受光した透過光に基づいてクロスニコル法透過検査によって、偏光板１００の欠陥検査を行う。クロスニコル法透過検査とは、２つの偏光子（本実施形態では、偏光板１００及び偏光フィルタ２４）の吸収軸を略直交させた状態（クロスニコル）での透過光像をカメラ（例えば、ラインセンサ）を用いて観察し、光抜けする欠陥（輝点）を検出する検査である。   After adjusting the polarization axis of the polarizing filter 24, the transmission inspection device 23 performs a defect inspection of the polarizing plate 100 by a crossed Nicols transmission inspection based on the received transmitted light. The crossed Nicols transmission inspection refers to a transmitted light image in a state (crossed Nicols) in which the absorption axes of two polarizers (in this embodiment, the polarizing plate 100 and the polarizing filter 24) are substantially orthogonal (for example, a line). This is an inspection for detecting defects (bright spots) that are observed using a sensor) and light is lost.

なお、本実施形態では、配向角測定器２１及び透過検査器２３の上流側において、偏光板本体部１１０の一方の主面にセパレートフィルム付き粘着材１２０を貼り合わせている。   In the present embodiment, the adhesive 120 with a separate film is bonded to one main surface of the polarizing plate main body 110 on the upstream side of the orientation angle measuring device 21 and the transmission inspection device 23.

次に、本発明の第１の実施形態に係る偏光板の欠陥検査方法、及び、製造方法を説明する。まず、偏光板本体部１１０の一方の主面にセパレートフィルム付き粘着材１２０を貼付する（貼付工程）。   Next, a polarizing plate defect inspection method and manufacturing method according to the first embodiment of the present invention will be described. First, the adhesive material 120 with a separate film is stuck on one main surface of the polarizing plate main body 110 (sticking step).

次いで、配向角測定器２１によって、セパレートフィルム１２１の配向角を測定する（配向角測定工程）。次いで、透過検査用偏光フィルタ２４における偏光軸調整機構によって、測定されたセパレートフィルム１２１の配向角の情報に基づいて、偏光板本体部１１０の偏光軸に対する偏光フィルタ２４の偏光軸を調整する（調整工程）。   Next, the orientation angle of the separate film 121 is measured by the orientation angle measuring device 21 (orientation angle measuring step). Next, the polarization axis of the polarization filter 24 with respect to the polarization axis of the polarizing plate main body 110 is adjusted (adjusted) based on the measured orientation angle information of the separation film 121 by the polarization axis adjustment mechanism in the transmission inspection polarization filter 24 (adjustment). Process).

次いで、光源２２によって、偏光板１００に光を照射する（光照射工程）。次いで、透過検査器２３によって、偏光フィルタ２４を介して偏光板１００を透過した光を受光し、受光した透過光に基づいて偏光板１００の欠陥検査を行う（欠陥検査工程）。   Next, the light source 22 irradiates the polarizing plate 100 with light (light irradiation step). Next, the transmission inspection device 23 receives the light transmitted through the polarizing plate 100 via the polarizing filter 24, and performs a defect inspection of the polarizing plate 100 based on the received transmitted light (defect inspection step).

ところで、セパレートフィルム付き粘着材１２０を、例えば１０００ｍ以上の長さでロール形態で提供し、一方、偏光板１００を、例えばセパレートフィルム付き粘着材１２０の長さを超える長さで連続生成すると、セパレートフィルム付き粘着材１２０は、一つの偏光板１００に対して、ロール同士を繋ぎ目１２３において繋ぎ合せながら連続的に貼付することとなる。   By the way, if the pressure-sensitive adhesive material 120 with a separate film is provided in a roll form with a length of, for example, 1000 m or more, while the polarizing plate 100 is continuously generated with a length exceeding the length of the pressure-sensitive adhesive material 120 with a separate film, for example, The film-attached adhesive 120 is continuously applied to one polarizing plate 100 while joining the rolls at the joint 123.

セパレートフィルム付き粘着材１２０におけるセパレートフィルム１２１としては、図３に示すように、例えば原料フィルムを延伸して得られた幅広の延伸フィルムを、貼付すべき偏光板１００の幅に合せて、幅方向に複数Ａ，Ｂ，Ｃに裁断されたものが用いられる。原料フィルムを延伸して延伸フィルムとする際、ボーイングＤに起因して幅方向に配向角Ｅのばらつきが生じるため、貼付すべきセパレートフィルム付き粘着材１２０のロールＡ，Ｂ，Ｃごとに配向角が異なることとなる。   As the separate film 121 in the pressure-sensitive adhesive material with a separate film 120, as shown in FIG. 3, for example, a wide stretched film obtained by stretching a raw material film is aligned with the width of the polarizing plate 100 to be pasted. In addition, a material cut into a plurality of A, B, and C is used. When the raw film is stretched to obtain a stretched film, the orientation angle E varies in the width direction due to Boeing D. Therefore, the orientation angle for each roll A, B, C of the adhesive film 120 with a separate film to be attached Will be different.

そのため、上記したように、偏光板本体部１１０にセパレートフィルム付き粘着材１２０を貼付した後にクロスニコル法透過検査を行う場合、使用するセパレートフィルム付き粘着材１２０のロールごとに透過検査用偏光フィルタ２４の偏光軸を調整する必要がある。   Therefore, as described above, when the cross-Nicol transmission test is performed after the adhesive film-attached adhesive material 120 is applied to the polarizing plate main body 110, the transmission-inspection polarizing filter 24 is used for each roll of the separate film-attached adhesive material 120 to be used. It is necessary to adjust the polarization axis.

従来、インラインでクロスニコル法透過検査を行う場合、セパレートフィルム付き粘着材のロールを切り替えるために透過検査用偏光フィルタの偏光軸を調整しているときにも、偏光板は連続的に生成される。このため、この調整の間に得られる偏光板の領域は未検査領域となってしまい、製品として使用できず、無駄となってしまう。例えば、透過検査用偏光フィルタの偏光軸の調整にかかる時間が約１分、ライン速度が約１０〜３０ｍ／分とすると、セパレートフィルム付き粘着材のロール切替１回において約１０〜３０ｍもの偏光板の領域が未検査となってしまい、無駄となってしまうこととなる。   Conventionally, when performing a crossed Nicols transmission inspection in-line, a polarizing plate is continuously generated even when the polarization axis of a polarizing filter for transmission inspection is adjusted in order to switch the roll of an adhesive material with a separate film. . For this reason, the area | region of the polarizing plate obtained during this adjustment becomes an uninspected area | region, cannot be used as a product, and becomes useless. For example, if the time required for adjusting the polarization axis of a polarizing filter for transmission inspection is about 1 minute and the line speed is about 10 to 30 m / min, a polarizing plate of about 10 to 30 m in one roll switching of the adhesive with a separate film This area becomes uninspected and is wasted.

しかしながら、この第１の実施形態の偏光板の欠陥検査方法及び欠陥検査装置、並びに偏光板の製造方法及び製造装置によれば、配向角測定器２１によってセパレートフィルム１２１の配向角を事前に測定し、測定した配向角に基づいて偏光フィルタ２４の偏光軸を自動的に調整するので、セパレートフィルム１２１の配向角のばらつきに起因して必要となるクロスニコル法透過検査用の偏光フィルタ２４の偏光軸の調整時間を短縮することができる。   However, according to the defect inspection method and defect inspection apparatus for the polarizing plate and the manufacturing method and apparatus for the polarizing plate of the first embodiment, the orientation angle of the separate film 121 is measured in advance by the orientation angle measuring device 21. Since the polarization axis of the polarization filter 24 is automatically adjusted based on the measured orientation angle, the polarization axis of the polarization filter 24 for crossed Nicols transmission inspection required due to the variation in the orientation angle of the separate film 121 is required. The adjustment time can be shortened.

その結果、インラインでクロスニコル法透過検査を行う場合に、セパレートフィルム付き粘着材１２０のロールを切り替えるために透過検査用偏光フィルタ２４の偏光軸を調整しているときに連続的に生成される偏光板１００の未検査領域を削減することができ、無駄を低減することができる。
［第２の実施形態］ As a result, when in-line crossed Nicol transmission inspection is performed, polarized light generated continuously when the polarization axis of the transmission inspection polarizing filter 24 is adjusted to switch the roll of the adhesive 120 with a separate film. The uninspected area of the plate 100 can be reduced, and waste can be reduced.
[Second Embodiment]

図４は、本発明の第２の実施形態に係る偏光板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに偏光板（光学フィルム）の製造装置及び製造方法を示す図である。   FIG. 4 is a diagram showing a polarizing plate (optical film) defect inspection apparatus and defect inspection method, and a polarizing plate (optical film) manufacturing apparatus and manufacturing method according to the second embodiment of the present invention.

図４に示す第２の実施形態の製造装置１０Ａは、配向角測定器２１よりも下流側であって透過検査器２３よりも上流側において、偏光板本体部１１０の一方の主面にセパレートフィルム付き粘着材１２０を貼り合わせている点で第１の実施形態と異なっている。第２の実施形態の製造装置１０Ａのその他の構成は、第１の実施形態の製造装置１０と同一である。   The manufacturing apparatus 10 </ b> A of the second embodiment shown in FIG. 4 has a separate film on one main surface of the polarizing plate main body 110 on the downstream side of the orientation angle measuring device 21 and on the upstream side of the transmission inspection device 23. It differs from 1st Embodiment by the point which sticks the adhesive material 120 with. Other configurations of the manufacturing apparatus 10A of the second embodiment are the same as those of the manufacturing apparatus 10 of the first embodiment.

換言すれば、第２の実施形態の製造方法では、配向角測定工程後であって欠陥検査工程前に、偏光板本体部１１０の一方の主面にセパレートフィルム付き粘着材１２０を貼付する貼付工程を含む点で第１の実施形態と異なっている。   In other words, in the manufacturing method of the second embodiment, the sticking step of sticking the adhesive material 120 with a separate film to one main surface of the polarizing plate main body 110 after the orientation angle measurement step and before the defect inspection step. This is different from the first embodiment in that

この第２の実施形態の偏光板の欠陥検査方法及び欠陥検査装置、並びに偏光板の製造方法及び製造装置でも、第１の実施形態の偏光板の欠陥検査方法及び欠陥検査装置、並びに偏光板の製造方法及び製造装置と同様の利点を得ることができる。
［第３の実施形態］ Also in the defect inspection method and defect inspection apparatus for the polarizing plate and the manufacturing method and manufacturing apparatus for the polarizing plate of the second embodiment, the defect inspection method and defect inspection apparatus for the polarizing plate of the first embodiment, and the polarizing plate Advantages similar to those of the manufacturing method and the manufacturing apparatus can be obtained.
[Third Embodiment]

図５は、本発明の第３の実施形態に係る位相差板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに位相差板（光学フィルム）の製造装置及び製造方法を示す図であり、図６は、図５に示す製造装置及び製造方法によって製造される位相差板を示す図である。   FIG. 5 is a view showing a retardation plate (optical film) defect inspection apparatus and defect inspection method, and a retardation plate (optical film) manufacturing apparatus and manufacturing method according to the third embodiment of the present invention. FIG. 6 is a diagram showing a retardation plate manufactured by the manufacturing apparatus and the manufacturing method shown in FIG.

図５に示す製造装置１０Ｂは、図６に示す位相差板１００Ｂを製造するためのものである。製造装置１０Ｂは、セパレートフィルム（離型フィルム）１２１が粘着材１２２に貼り合わされたセパレートフィルム付き粘着材１２０を位相差板本体部１１０Ｂに貼り合わせて、位相差板１００Ｂを生成する。次いで、製造装置１０は、生成した位相差板１００Ｂを原反巻取１１によって巻き取る。位相差板の材料としては、ＴＡＣ、ポリカーボネート、ＰＥＴ、ＣＯＰ（シクロオレフィンポリマー）等が挙げられる。   A manufacturing apparatus 10B shown in FIG. 5 is for manufacturing the phase difference plate 100B shown in FIG. The manufacturing apparatus 10B produces | generates the phase difference plate 100B by bonding the adhesive material 120 with a separate film in which the separate film (release film) 121 was bonded to the adhesive material 122 to the phase difference plate main body 110B. Next, the manufacturing apparatus 10 winds up the generated retardation plate 100 </ b> B with the raw fabric winding 11. Examples of the material of the retardation plate include TAC, polycarbonate, PET, COP (cycloolefin polymer) and the like.

また、製造装置１０Ｂは欠陥検査装置２０Ｂを含む。欠陥検査装置２０Ｂは、欠陥検査装置２０において透過検査用補助偏光フィルタ２５及び位相差補償フィルタ２６を更に備える点で第１の実施形態と異なっている。   The manufacturing apparatus 10B includes a defect inspection apparatus 20B. The defect inspection apparatus 20B is different from the first embodiment in that the defect inspection apparatus 20 further includes a transmission inspection auxiliary polarizing filter 25 and a phase difference compensation filter 26.

透過検査用補助偏光フィルタ２５は、位相差板１００Ｂの他方の主面１０２と光源２２との間に設けられており、位相差補償フィルタ２６は、位相差板１００Ｂの他方の主面１０２と透過検査用補助偏光フィルタ２５との間に設けられている。   The auxiliary polarizing filter 25 for transmission inspection is provided between the other main surface 102 of the phase difference plate 100B and the light source 22, and the phase difference compensation filter 26 is transmitted through the other main surface 102 of the phase difference plate 100B. It is provided between the auxiliary polarizing filter for inspection 25.

これにより、透過検査器２３は、透過検査用補助偏光フィルタ２５、位相差補償フィルタ２６、及び、透過検査用偏光フィルタ２４を介して位相差板１００Ｂを透過した光を受光する。   As a result, the transmission inspection device 23 receives the light transmitted through the retardation plate 100B via the transmission inspection auxiliary polarizing filter 25, the phase difference compensation filter 26, and the transmission inspection polarizing filter 24.

また、透過検査用偏光フィルタ２４における偏光軸調整機構は、配向角測定器２１からのセパレートフィルム１２１の配向角の情報に基づいて、透過検査用補助偏光フィルタ２５の偏光軸に対する偏光フィルタ２４の偏光軸（例えば、偏光フィルタ２４の回転角度）を調整して、クロスニコル状態を形成する。すなわち、本実施形態では、２つの偏光子（透過検査用補助偏光フィルタ２５及び偏光フィルタ２４）によってクロスニコル状態を形成する。   Further, the polarization axis adjusting mechanism in the transmission inspection polarizing filter 24 is based on the information on the orientation angle of the separate film 121 from the orientation angle measuring device 21, and the polarization of the polarization filter 24 with respect to the polarization axis of the transmission inspection auxiliary polarizing filter 25. An axis (for example, the rotation angle of the polarizing filter 24) is adjusted to form a crossed Nicols state. That is, in this embodiment, the crossed Nicols state is formed by two polarizers (transmission inspection auxiliary polarizing filter 25 and polarizing filter 24).

なお、本実施形態では、配向角測定器２１及び透過検査器２３の上流側において、位相差板本体部１１０Ｂの一方の主面にセパレートフィルム付き粘着材１２０を貼り合わせている。   In the present embodiment, the adhesive 120 with a separate film is bonded to one main surface of the retardation plate main body 110B on the upstream side of the orientation angle measuring device 21 and the transmission inspection device 23.

次に、本発明の第３の実施形態に係る位相差板の欠陥検査方法、及び、製造方法を説明する。まず、上記した貼付工程及び配向角測定工程が行われる。   Next, a defect inspection method and a manufacturing method for a retardation plate according to a third embodiment of the present invention will be described. First, the above-described pasting step and orientation angle measuring step are performed.

次いで、透過検査用偏光フィルタ２４における偏光軸調整機構によって、測定されたセパレートフィルム１２１の配向角の情報に基づいて、透過検査用補助偏光フィルタ２５の偏光軸に対する偏光フィルタ２４の偏光軸を調整する（調整工程）。   Next, the polarization axis of the polarization filter 24 is adjusted with respect to the polarization axis of the auxiliary polarization filter 25 for transmission inspection based on the measured orientation angle information of the separation film 121 by the polarization axis adjustment mechanism of the polarization filter 24 for transmission inspection. (Adjustment process).

次いで、光源２２によって、位相差板１００Ｂに光を照射する（光照射工程）。次いで、透過検査器２３によって、補助偏光フィルタ２５、位相差補償フィルタ２６、及び、偏光フィルタ２４を介して位相差板１００Ｂを透過した光を受光し、受光した透過光に基づいて位相差板１００Ｂの欠陥検査を行う（欠陥検査工程）。   Next, the light source 22 irradiates light to the phase difference plate 100B (light irradiation step). Next, the transmission inspection device 23 receives the light transmitted through the phase difference plate 100B via the auxiliary polarizing filter 25, the phase difference compensation filter 26, and the polarization filter 24, and the phase difference plate 100B based on the received transmitted light. The defect inspection is performed (defect inspection process).

この第３の実施形態の位相差板の欠陥検査方法及び欠陥検査装置、並びに位相差板の製造方法及び製造装置でも、配向角測定器２１によってセパレートフィルム１２１の配向角を事前に測定し、測定した配向角に基づいて偏光フィルタ２４の偏光軸を自動的に調整するので、セパレートフィルム１２１の配向角のばらつきに起因して必要となるクロスニコル法透過検査用の偏光フィルタ２４の偏光軸の調整時間を短縮することができる。   In the retardation plate defect inspection method and defect inspection apparatus, and retardation plate manufacturing method and manufacturing apparatus of the third embodiment, the orientation angle of the separate film 121 is measured in advance by the orientation angle measuring device 21 and measured. Since the polarization axis of the polarizing filter 24 is automatically adjusted based on the orientation angle, the adjustment of the polarization axis of the polarizing filter 24 for crossed Nicol transmission inspection required due to the variation in the orientation angle of the separate film 121 is required. Time can be shortened.

その結果、インラインでクロスニコル法透過検査を行う場合に、セパレートフィルム付き粘着材１２０のロールを切り替えるために透過検査用偏光フィルタ２４の偏光軸を調整しているときに連続的に生成される位相差板１００Ｂの未検査領域を削減することができ、無駄を低減することができる。
［第４の実施形態］ As a result, when the cross-Nicol transmission inspection is performed in-line, it is continuously generated when the polarization axis of the transmission inspection polarizing filter 24 is adjusted to switch the roll of the adhesive 120 with the separate film. The uninspected area of the phase difference plate 100B can be reduced, and waste can be reduced.
[Fourth Embodiment]

図７は、本発明の第４の実施形態に係る位相差板（光学フィルム）の欠陥検査装置及び欠陥検査方法、並びに位相差板（光学フィルム）の製造装置及び製造方法を示す図である。   FIG. 7 is a diagram showing a retardation plate (optical film) defect inspection apparatus and defect inspection method, and a retardation plate (optical film) manufacturing apparatus and manufacturing method according to the fourth embodiment of the present invention.

図７に示す第４の実施形態の製造装置１０Ｃは、配向角測定器２１よりも下流側であって透過検査器２３よりも上流側において、位相差板本体部１１０Ｂの一方の主面にセパレートフィルム付き粘着材１２０を貼り合わせている点で第３の実施形態と異なっている。第４の実施形態の製造装置１０Ｃのその他の構成は、第３の実施形態の製造装置１０Ｂと同一である。   The manufacturing apparatus 10C of the fourth embodiment shown in FIG. 7 is separated on one main surface of the retardation plate main body 110B on the downstream side of the orientation angle measuring device 21 and the upstream side of the transmission inspection device 23. The third embodiment is different from the third embodiment in that the adhesive material with film 120 is bonded. Other configurations of the manufacturing apparatus 10C of the fourth embodiment are the same as those of the manufacturing apparatus 10B of the third embodiment.

換言すれば、第４の実施形態の製造方法では、配向角測定工程後であって欠陥検査工程前に、位相差板本体部１１０Ｂの一方の主面にセパレートフィルム付き粘着材１２０を貼付する貼付工程を含む点で第３の実施形態と異なっている。   In other words, in the manufacturing method of the fourth embodiment, the adhesive film-attached adhesive material 120 is attached to one main surface of the retardation plate main body 110B after the orientation angle measurement process and before the defect inspection process. It differs from the third embodiment in that it includes a process.

この第４の実施形態の位相差板の欠陥検査方法及び欠陥検査装置、並びに位相差板の製造方法及び製造装置でも、第３の実施形態の位相差板の欠陥検査方法及び欠陥検査装置、並びに位相差板の製造方法及び製造装置と同様の利点を得ることができる。   In the retardation plate defect inspection method and defect inspection apparatus, and retardation plate manufacturing method and manufacturing apparatus of the fourth embodiment, the retardation plate defect inspection method and defect inspection apparatus of the third embodiment, and Advantages similar to those of the retardation plate manufacturing method and manufacturing apparatus can be obtained.

なお、本発明は上記した第１の実施形態〜第４の実施形態（以下、これらを合せて本実施形態と称することがある。）に限定されることなく種々の変形が可能である。例えば、本実施形態では、光源２２が偏光板１００又は位相差板１００Ｂの他方の主面１０２側に設けられ、透過検査器２３が偏光板１００又は位相差板１００Ｂの一方の主面１０１側に設けられる形態を例示したが、光源２２が偏光板１００又は位相差板１００Ｂの一方の主面１０１側に設けられ、透過検査器２３が偏光板１００又は位相差板１００Ｂの他方の主面１０２側に設けられてもよい（例えば、図８：第１の実施形態の変形を参照）。この場合、第１及び第２の実施形態では、透過検査用偏光フィルタ２４は、偏光板１００の一方の主面１０１と光源２２との間に設けられればよい。一方、第３及び第４の実施形態では、透過検査用偏光フィルタ２４は、位相差板１００Ｂの一方の主面１０１と光源２２との間に設けられればよく、透過検査用補助偏光フィルタ２５及び位相差補償フィルタ２６は、位相差板１００Ｂの他方の主面１０２と透過検査器２３との間に設けられればよい。   The present invention is not limited to the first to fourth embodiments described above (hereinafter, these may be collectively referred to as this embodiment), and various modifications can be made. For example, in the present embodiment, the light source 22 is provided on the other main surface 102 side of the polarizing plate 100 or the retardation plate 100B, and the transmission inspection device 23 is provided on the one main surface 101 side of the polarizing plate 100 or the retardation plate 100B. Although the form provided is illustrated, the light source 22 is provided on one main surface 101 side of the polarizing plate 100 or the phase difference plate 100B, and the transmission inspection device 23 is on the other main surface 102 side of the polarizing plate 100 or the phase difference plate 100B. (See, for example, FIG. 8: Modification of First Embodiment). In this case, in the first and second embodiments, the transmission inspection polarizing filter 24 may be provided between the one main surface 101 of the polarizing plate 100 and the light source 22. On the other hand, in the third and fourth embodiments, the transmission inspection polarizing filter 24 may be provided between the one main surface 101 of the phase difference plate 100B and the light source 22, and the transmission inspection auxiliary polarizing filter 25 and The phase difference compensation filter 26 may be provided between the other main surface 102 of the phase difference plate 100 </ b> B and the transmission inspection device 23.

また、本実施形態では、配向角測定器２１によって測定された配向角の情報を偏光フィルタ２４に直接供給したが、配向角測定器２１によって測定されたセパレートフィルム１２１の配向角の情報を、記録部２７によって偏光板１００又は位相差板１００Ｂ上に記録し、原反巻取１２によって一旦巻き取り、その後再度巻き出す際に、偏光フィルタ２４における偏光軸調整機構によって、偏光板１００又は位相差板１００Ｂ上に記録した情報を読み取り、この情報に基づいて光フィルタの偏光軸の調整を行ってもよい。換言すれば、配向角測定工程において測定されたセパレートフィルム１２１の配向角の情報を偏光板１００又は位相差板１００Ｂ上に記録する記録工程を含み、調整工程では、記録工程において偏光板１００又は位相差板１００Ｂ上に記録されたセパレートフィルム１２１の配向角の情報に基づいて、偏光フィルタ２４の偏光軸を調整する（例えば、図９：第１の実施形態の変形を参照）。   In this embodiment, the information on the orientation angle measured by the orientation angle measuring device 21 is directly supplied to the polarizing filter 24. However, the information on the orientation angle of the separate film 121 measured by the orientation angle measuring device 21 is recorded. When recording on the polarizing plate 100 or the phase difference plate 100B by the unit 27, once winding by the raw film winding 12, and then unwinding again, the polarizing plate 100 or the phase difference plate by the polarization axis adjusting mechanism in the polarizing filter 24. Information recorded on 100B may be read, and the polarization axis of the optical filter may be adjusted based on this information. In other words, it includes a recording step of recording the information on the orientation angle of the separate film 121 measured in the orientation angle measurement step on the polarizing plate 100 or the retardation plate 100B, and the adjustment step includes the polarizing plate 100 or the position in the recording step. Based on the orientation angle information of the separate film 121 recorded on the phase difference plate 100B, the polarization axis of the polarizing filter 24 is adjusted (for example, see FIG. 9: Modification of the First Embodiment).

偏光板１００又は位相差板１００Ｂ上に記録する情報は、識別コード（一次元バーコード、二次元コード、ＱＲコード（登録商標）など）などであればよく、偏光板１００又は位相差板１００Ｂ上における幅方向の端部に記録されればよい。   Information to be recorded on the polarizing plate 100 or the retardation plate 100B may be an identification code (one-dimensional barcode, two-dimensional code, QR code (registered trademark), etc.), and the information on the polarizing plate 100 or the retardation plate 100B. May be recorded at the end in the width direction.

これによれば、配向角測定工程から記録工程まで同一ラインで行い、調整工程、光照射工程及び欠陥検査工程を別ラインで行うことが可能となる。   According to this, it is possible to perform the alignment process, the light irradiation process, and the defect inspection process on separate lines from the alignment angle measurement process to the recording process.

また、配向角測定器２１として、上記と同様の透過検査器、透過検査用偏光フィルタ、位相差補償フィルタおよび光源を組合せ、第２の実施形態（図４）、第３の実施形態（図５）および第４の実施形態（図７）の場合には更に上記と同様の透過検査用補助偏光フィルタを組み合わせて用いてもよい。この場合、例えば配向角測定器（２１）を配置する位置に透過検査器を配置し、透過検査器とセパレートフィルム付き粘着材（１２０）との間に透過検査用偏光フィルタを配置し、セパレートフィルム付き粘着材（１２０）の透過検査器側とは反対側に光源を配置し、セパレートフィルム付き粘着材（１２０）と光源との間にセパレートフィルム付き粘着材（１２０）側から順に位相差補償フィルタおよび透過検査用補助偏光フィルタを配置する。例えば光源からの光が透過検査器に届かなくなるように、透過検査用偏光フィルタの偏光軸、位相差補償フィルタの遅相軸および光学検査用補助偏光フィルタの偏光軸の向きを変え、これらの軸の向きからセパレートフィルムの配向角を求めることができる。   Further, as the orientation angle measuring device 21, a transmission inspection device, a transmission inspection polarizing filter, a phase difference compensation filter, and a light source similar to the above are combined, and the second embodiment (FIG. 4) and the third embodiment (FIG. 5) are combined. ) And the fourth embodiment (FIG. 7), the auxiliary polarizing filter for transmission inspection similar to the above may be used in combination. In this case, for example, a transmission inspection device is disposed at a position where the orientation angle measuring device (21) is disposed, and a transmission inspection polarizing filter is disposed between the transmission inspection device and the adhesive material with a separate film (120). A light source is arranged on the opposite side to the transmission tester side of the attached adhesive material (120), and a phase difference compensation filter is sequentially provided between the adhesive material with a separate film (120) and the adhesive material with a separate film (120) side. And an auxiliary polarizing filter for transmission inspection. For example, change the direction of the polarization axis of the polarization filter for transmission inspection, the slow axis of the phase difference compensation filter, and the polarization axis of the auxiliary polarization filter for optical inspection so that light from the light source does not reach the transmission inspection device. The orientation angle of the separate film can be determined from the orientation of

ところで、一般に、偏光板１００又は位相差板１００Ｂ（光学フィルム）の長さは、セパレートフィルム付き粘着材１２０の長さに対して１０倍以下である。換言すれば、一般に、連続生成される偏光板本体部１１０又は位相差板本体部１１０Ｂ（光学フィルム本体部）の長さは、セパレートフィルム付き粘着材１２０の長さに対して１０倍以下である。具体的には、偏光板１００又は位相差板１００Ｂの長さ（換言すれば、偏光板本体部１１０又は位相差板本体部１１０Ｂの長さ）は１０００ｍ以上２００００ｍ以下であり、セパレートフィルム付き粘着材１２０の長さは５００ｍ以上５０００ｍ以下であることが多い。このように、偏光板１００又は位相差板１００Ｂの長さ（換言すれば、偏光板本体部１１０又は位相差板本体部１１０Ｂの長さ）がセパレートフィルム付き粘着材１２０の長さに対して３倍以上、更には５倍以上であると、１本の偏光板１００又は位相差板１００Ｂ（換言すれば、偏光板本体部１１０又は位相差板本体部１１０Ｂ）に対してセパレートフィルム付き粘着材１２０を繋ぎ合せる頻度が多くなる。このように、偏光板１００又は位相差板１００Ｂの長さ（換言すれば、偏光板本体部１１０又は位相差板本体部１１０Ｂの長さ）とセパレートフィルム付き粘着材１２０の長さとが大きく異なり、セパレートフィルム付き粘着材１２０を繋ぎ合せる頻度が多くなる場合に、本発明の方法及び装置が、好適に適用可能であり、上記した顕著な効果を発揮する。   By the way, generally, the length of the polarizing plate 100 or the retardation film 100B (optical film) is 10 times or less with respect to the length of the adhesive material 120 with a separate film. In other words, generally, the length of the polarizing plate main body 110 or the retardation plate main body 110B (optical film main body) that is continuously generated is 10 times or less than the length of the adhesive material 120 with a separate film. . Specifically, the length of the polarizing plate 100 or the retardation plate 100B (in other words, the length of the polarizing plate main body 110 or the retardation plate main body 110B) is 1000 m or more and 20000 m or less, and an adhesive with a separate film The length of 120 is often 500 m or more and 5000 m or less. Thus, the length of the polarizing plate 100 or the retardation plate 100B (in other words, the length of the polarizing plate main body 110 or the retardation plate main body 110B) is 3 with respect to the length of the pressure-sensitive adhesive material 120 with a separate film. When it is more than double, and further 5 times or more, the pressure-sensitive adhesive material 120 with a separate film with respect to one polarizing plate 100 or retardation plate 100B (in other words, the polarizing plate main body 110 or the retardation plate main body 110B). The frequency of linking each other increases. Thus, the length of the polarizing plate 100 or the retardation plate 100B (in other words, the length of the polarizing plate main body 110 or the retardation plate main body 110B) and the length of the adhesive 120 with a separate film are greatly different. The method and apparatus of the present invention can be suitably applied when the frequency of joining the pressure-sensitive adhesive material with separate film 120 is increased, and exhibits the above-described remarkable effects.

１０，１０Ａ…偏光板（光学フィルム）の製造装置、１０Ｂ，１０Ｃ…位相差板（光学フィルム）の製造装置、１１，１２…原反巻取、２０…偏光板（光学フィルム）の欠陥検査装置、２０Ｂ…位相差板（光学フィルム）の欠陥検査装置、２１…配向角測定器、２２…光源、２３…透過検査器、２４…透過検査用偏光フィルタ、２５…透過検査用補助偏光フィルタ、２６…位相差補償フィルタ、２７…記録部、１００…偏光板（光学フィルム）、１００Ｂ…位相差板（光学フィルム）、１０１…一方の主面、１０２…他方の主面、１１０…偏光板本体部（光学フィルム本体部）、１１０Ｂ…位相差板本体部（光学フィルム本体部）、１２０…セパレートフィルム付き粘着材、１２１…セパレートフィルム、１２２…粘着材、１２３…繋ぎ目。   DESCRIPTION OF SYMBOLS 10,10A ... Manufacturing apparatus of polarizing plate (optical film), 10B, 10C ... Manufacturing apparatus of phase difference plate (optical film), 11, 12 ... Raw film winding, 20 ... Defect inspection apparatus of polarizing plate (optical film) , 20B: phase difference plate (optical film) defect inspection device, 21: orientation angle measuring device, 22: light source, 23: transmission inspection device, 24: transmission inspection polarizing filter, 25: transmission inspection auxiliary polarizing filter, 26 ... retardation compensation filter, 27 ... recording section, 100 ... polarizing plate (optical film), 100B ... retardation plate (optical film), 101 ... one main surface, 102 ... other main surface, 110 ... polarizing plate main body (Optical film main body part), 110B ... retardation plate main body part (optical film main body part), 120 ... adhesive material with separate film, 121 ... separate film, 122 ... adhesive material, 123 ... joint.

Claims (10)

光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼付してなる光学フィルムにおける前記セパレートフィルム付き粘着材側となる一方の主面側又は他方の主面側に設けられた光源と、前記光学フィルムに対して前記光源と反対側に設けられた透過検査器と、前記光学フィルムの前記一方の主面と前記光源又は前記透過検査器との間に設けられた透過検査用の偏光フィルタとを備える欠陥検査装置を用いて前記光学フィルムの欠陥を検査する方法であって、
前記欠陥検査装置は、前記光学フィルムの前記一方の主面側に設けられた配向角測定器を更に備え、
前記欠陥検査方法は、
前記配向角測定器によって、前記セパレートフィルムの配向角を測定する配向角測定工程と、
前記配向角測定工程において測定された前記配向角に基づいて、前記偏光フィルタの偏光軸を調整する調整工程と、
前記光源によって、前記光学フィルムに光を照射する光照射工程と、
前記透過検査器によって、前記偏光フィルタを介して前記光学フィルムを透過した光を受光し、受光した透過光に基づいて前記光学フィルムの欠陥検査を行う欠陥検査工程と、
を含む、
光学フィルムの欠陥検査方法。 A light source provided on one main surface side or the other main surface side which is the side of the adhesive material with a separate film in an optical film formed by attaching an adhesive material with a separate film on one main surface of the optical film main body; A transmission inspection device provided on the side opposite to the light source with respect to the optical film, and a polarization filter for transmission inspection provided between the one main surface of the optical film and the light source or the transmission inspection device A method for inspecting a defect of the optical film using a defect inspection apparatus comprising:
The defect inspection apparatus further includes an orientation angle measuring device provided on the one main surface side of the optical film,
The defect inspection method includes:
An orientation angle measuring step for measuring an orientation angle of the separate film by the orientation angle measuring device,
An adjustment step of adjusting the polarization axis of the polarizing filter based on the orientation angle measured in the orientation angle measurement step;
A light irradiation step of irradiating the optical film with light by the light source;
A defect inspection step of receiving light transmitted through the optical film through the polarizing filter by the transmission inspection device, and performing a defect inspection of the optical film based on the received transmitted light;
including,
Optical film defect inspection method. 前記欠陥検査装置は、前記光学フィルムの前記他方の主面と前記光源又は前記透過検査器との間に設けられた透過検査用の補助偏光フィルタを更に備え、
前記欠陥検査工程では、前記偏光フィルタ及び前記補助偏光フィルタを介して前記光学フィルムを透過した光を受光し、受光した透過光に基づいて前記光学フィルムの欠陥検査を行う、
請求項１に記載の光学フィルムの欠陥検査方法。 The defect inspection apparatus further includes an auxiliary polarizing filter for transmission inspection provided between the other main surface of the optical film and the light source or the transmission inspection device,
In the defect inspection step, the light transmitted through the optical film is received through the polarizing filter and the auxiliary polarizing filter, and the optical film is inspected based on the received transmitted light.
The optical film defect inspection method according to claim 1. 前記配向角測定工程において測定された前記配向角の情報を前記光学フィルム上に記録する記録工程を更に含み、
前記調整工程では、前記記録工程において前記光学フィルム上に記録された前記配向角の情報に基づいて、前記偏光フィルタの偏光軸を調整する、
請求項１又は２に記載の光学フィルムの欠陥検査方法。 Further comprising a recording step of recording information on the orientation angle measured in the orientation angle measurement step on the optical film,
In the adjustment step, the polarization axis of the polarizing filter is adjusted based on the orientation angle information recorded on the optical film in the recording step.
The defect inspection method of the optical film of Claim 1 or 2. 請求項１又は２に記載の光学フィルムの欠陥検査方法を含み、
前記配向角測定工程及び前記欠陥検査工程前に、前記光学フィルム本体部の前記一方の主面に前記セパレートフィルム付き粘着材を貼付する貼付工程を含む、
光学フィルムの製造方法。 A defect inspection method for an optical film according to claim 1 or 2,
Before the orientation angle measurement step and the defect inspection step, including a pasting step of pasting the separate film-attached adhesive material on the one main surface of the optical film main body,
Manufacturing method of optical film. 請求項１又は２に記載の光学フィルムの欠陥検査方法を含み、
前記配向角測定工程後であって前記欠陥検査工程前に、前記光学フィルム本体部の前記一方の主面に前記セパレートフィルム付き粘着材を貼付する貼付工程を含む、
光学フィルムの製造方法。 A defect inspection method for an optical film according to claim 1 or 2,
After the orientation angle measurement step and before the defect inspection step, including a pasting step of pasting the adhesive material with a separate film on the one main surface of the optical film main body part,
Manufacturing method of optical film. 光学フィルム本体部の一方の主面にセパレートフィルム付き粘着材を貼付してなる光学フィルムの欠陥検査装置であって、
前記光学フィルムにおける前記セパレートフィルム付き粘着材側の一方の主面側又は他方の主面側に設けられ、前記光学フィルムに光を照射する光源と、
前記光学フィルムに対して前記光源と反対側に設けられ、前記光学フィルムを透過した光を受光する透過検査器と、
前記光学フィルムの前記一方の主面と前記光源又は前記透過検査器との間に設けられた透過検査用の偏光フィルタと、
前記光学フィルムの前記一方の主面側に設けられ、前記セパレートフィルムの配向角を測定する配向角測定器と、
を備え、
前記配向角測定器によって測定された前記配向角に基づいて前記偏光フィルタの偏光軸を調整した後に、前記透過検査器によって受光した透過光に基づいて前記光学フィルムの欠陥検査を行う、
光学フィルムの欠陥検査装置。 An optical film defect inspection device comprising an adhesive material with a separate film attached to one main surface of the optical film main body,
A light source for irradiating light to the optical film, provided on one main surface side or the other main surface side of the adhesive film-attached adhesive material side in the optical film;
A transmission inspection device that is provided on the opposite side of the light source with respect to the optical film and receives light transmitted through the optical film;
A polarizing filter for transmission inspection provided between the one main surface of the optical film and the light source or the transmission inspection device;
An orientation angle measuring device that is provided on the one main surface side of the optical film and measures the orientation angle of the separate film;
With
After adjusting the polarization axis of the polarizing filter based on the orientation angle measured by the orientation angle measuring device, the defect inspection of the optical film is performed based on the transmitted light received by the transmission inspection device.
Optical film defect inspection device. 前記光学フィルムの前記他方の主面と前記光源又は前記透過検査器との間に設けられた透過検査用の補助偏光フィルタを更に備える、
請求項６に記載の光学フィルムの欠陥検査装置。 An auxiliary polarizing filter for transmission inspection provided between the other main surface of the optical film and the light source or the transmission inspection device;
The optical film defect inspection apparatus according to claim 6. 前記配向角測定器によって測定された前記配向角の情報を前記光学フィルム上に記録する記録部を更に備え、
前記記録部によって前記光学フィルム上に記録された前記配向角の情報に基づいて前記偏光フィルタの偏光軸を調整した後に、前記透過検査器によって受光した透過光に基づいて前記光学フィルムの欠陥検査を行う、
請求項６又は７に記載の光学フィルムの欠陥検査装置。 A recording unit for recording information on the orientation angle measured by the orientation angle measuring device on the optical film;
After adjusting the polarization axis of the polarizing filter based on the orientation angle information recorded on the optical film by the recording unit, the optical film is inspected for defects based on the transmitted light received by the transmission inspection device. Do,
The defect inspection apparatus of the optical film of Claim 6 or 7. 請求項７又は８に記載の光学フィルムの欠陥検査装置を備え、
前記配向角測定器及び前記透過検査器の上流側において、前記光学フィルム本体部の前記一方の主面に前記セパレートフィルム付き粘着材を貼り合わせる、
光学フィルムの製造装置。 The optical film defect inspection apparatus according to claim 7 or 8,
On the upstream side of the orientation angle measuring device and the transmission inspection device, the adhesive material with a separate film is bonded to the one main surface of the optical film main body.
Optical film manufacturing equipment. 請求項７又は８に記載の光学フィルムの欠陥検査装置を備え、
前記配向角測定器の下流側であって前記透過検査器の上流側において、前記光学フィルム本体部の前記一方の主面に前記セパレートフィルム付き粘着材を貼り合わせる、
光学フィルムの製造装置。 The optical film defect inspection apparatus according to claim 7 or 8,
On the downstream side of the orientation angle measuring device and the upstream side of the transmission inspection device, the adhesive material with a separate film is bonded to the one main surface of the optical film main body,
Optical film manufacturing equipment.
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