JP6411877B2 - コンピュータ断層撮影データにビームハードニング補正を行うためのビームハードニング補正係数を取得する方法およびデバイス - Google Patents

コンピュータ断層撮影データにビームハードニング補正を行うためのビームハードニング補正係数を取得する方法およびデバイス Download PDF

Info

Publication number
JP6411877B2
JP6411877B2 JP2014245446A JP2014245446A JP6411877B2 JP 6411877 B2 JP6411877 B2 JP 6411877B2 JP 2014245446 A JP2014245446 A JP 2014245446A JP 2014245446 A JP2014245446 A JP 2014245446A JP 6411877 B2 JP6411877 B2 JP 6411877B2
Authority
JP
Japan
Prior art keywords
sinogram
beam hardening
original
hardening correction
error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2014245446A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015112478A (ja
JP2015112478A5 (enExample
Inventor
シューリ・ワン
ヤンリン・クー
ダン・リュウ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Medical Systems Global Technology Co LLC
Original Assignee
GE Medical Systems Global Technology Co LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GE Medical Systems Global Technology Co LLC filed Critical GE Medical Systems Global Technology Co LLC
Publication of JP2015112478A publication Critical patent/JP2015112478A/ja
Publication of JP2015112478A5 publication Critical patent/JP2015112478A5/ja
Application granted granted Critical
Publication of JP6411877B2 publication Critical patent/JP6411877B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
JP2014245446A 2013-12-06 2014-12-04 コンピュータ断層撮影データにビームハードニング補正を行うためのビームハードニング補正係数を取得する方法およびデバイス Active JP6411877B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201310655322.5A CN104700377B (zh) 2013-12-06 2013-12-06 获得对计算机断层扫描数据进行射束硬化校正的射束硬化校正系数的方法和装置
CN201310655322.5 2013-12-06

Publications (3)

Publication Number Publication Date
JP2015112478A JP2015112478A (ja) 2015-06-22
JP2015112478A5 JP2015112478A5 (enExample) 2018-01-18
JP6411877B2 true JP6411877B2 (ja) 2018-10-24

Family

ID=53347465

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014245446A Active JP6411877B2 (ja) 2013-12-06 2014-12-04 コンピュータ断層撮影データにビームハードニング補正を行うためのビームハードニング補正係数を取得する方法およびデバイス

Country Status (2)

Country Link
JP (1) JP6411877B2 (enExample)
CN (1) CN104700377B (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170039735A1 (en) * 2015-08-06 2017-02-09 General Electric Company Computed tomography self-calibration without calibration targets
KR102158920B1 (ko) * 2018-12-28 2020-09-22 연세대학교 산학협력단 광자계수형 검출기 기반 다중에너지 ct 영상 보정 장치 및 방법
CN117315071B (zh) * 2023-11-30 2024-03-15 赛诺威盛科技(北京)股份有限公司 一种散焦伪影的校正方法、装置及计算机可读介质

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6040940A (ja) * 1983-08-16 1985-03-04 Toshiba Corp 断層撮影装置
JP3204701B2 (ja) * 1991-11-14 2001-09-04 ジーイー横河メディカルシステム株式会社 ビームハードニング補正方法
JP3414471B2 (ja) * 1994-01-24 2003-06-09 株式会社東芝 X線ct装置
JP3950811B2 (ja) * 2003-04-17 2007-08-01 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー X線ct装置およびビームハードニング後処理方法
CN100453044C (zh) * 2004-11-16 2009-01-21 北京航空航天大学 基于原始投影正弦图的ct射束硬化校正方法
DE102009051384A1 (de) * 2009-10-30 2011-05-12 Friedrich-Alexander-Universität Erlangen-Nürnberg Strahlaufhärtungskorrektur für CT-Perfusionsmessungen
CN102609908B (zh) * 2012-01-13 2014-02-12 中国人民解放军信息工程大学 基于基图像tv模型的ct射束硬化校正方法
CN102768759B (zh) * 2012-07-04 2014-11-26 深圳安科高技术股份有限公司 一种术中ct图像射束硬化伪影校正方法及装置
CN103445803B (zh) * 2013-09-09 2015-09-30 深圳先进技术研究院 基于正弦图的ct系统射束硬化消除方法及其系统

Also Published As

Publication number Publication date
CN104700377A (zh) 2015-06-10
JP2015112478A (ja) 2015-06-22
CN104700377B (zh) 2019-07-30

Similar Documents

Publication Publication Date Title
US9437018B2 (en) Method and apparatus for reducing artifacts in computed tomography image reconstruction
JP6416572B2 (ja) コンピュータ断層撮影(ct)画像再構成におけるアーチファクトを低減するための方法および装置
JP5122801B2 (ja) マルチ・モダリティ撮像の方法及び装置
US10561391B2 (en) Methods and systems for computed tomography
US8507869B2 (en) Methods and systems for adaptive tomographic imaging
JP5571317B2 (ja) マルチ・モダリティ撮像データを補正する方法
US7920670B2 (en) Keyhole computed tomography
US9165385B2 (en) Imaging procedure planning
US20130294570A1 (en) Truncation compensation for iterative cone-beam ct reconstruction for spect/ct systems
CN109770933B (zh) 通过三维定位改进图像质量的系统和方法
US20110007980A1 (en) Dose reduction and image enhancement in tomography through the utilization of the objects surroundings as dynamic constraints
JP2010527741A (ja) 画像再構成において利得変動の補正を容易にする方法及びシステム
US12070348B2 (en) Methods and systems for computed tomography
JP4729519B2 (ja) 器官に基づく放射線プロファイル設定を設けた放射線撮像の方法及びシステム
US20230077083A1 (en) Imaging system and method
JP4347651B2 (ja) マルチ・モダリティ・イメージング方法及び装置
JP6411877B2 (ja) コンピュータ断層撮影データにビームハードニング補正を行うためのビームハードニング補正係数を取得する方法およびデバイス
US20070274581A1 (en) Methods and apparatus for BIS correction
US9836862B2 (en) Methods and systems for contrast enhanced imaging with single energy acquisition
US9715744B2 (en) Method and device of obtaining beam hardening correction coefficient for carrying out beam hardening correction on computed tomography data
KR101517770B1 (ko) 방사선 영상 장치 및 그 동작 방법
CN116490896A (zh) 用于在x射线ct图像重建中使用的方法
JP2011099716A (ja) 核医学イメージング装置および画像処理装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150319

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20171201

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20171201

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20180315

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20180327

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180625

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20180904

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180927

R150 Certificate of patent or registration of utility model

Ref document number: 6411877

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250