JP6394543B2 - Radioactive substance removing apparatus and radioactive substance removing method - Google Patents

Description

  The present invention relates to a radioactive substance removing device and a radioactive substance removing method for removing a radioactive substance from an object.

  For example, the process which collect | recovers the objects which contain the radioactive substance adhering to topsoil or the radioactive substance absorbed by the plant, and lets all the collected objects pass to a radioactive substance adsorption apparatus is performed conventionally. For example, the soil can be decontaminated to a level where it can be returned to its original location by stripping the soil contaminated with radioactive material, putting it into an “elution tank”, dissolving the cesium with oxalic acid and collecting it with an adsorbent. In addition, the amount of the object can be reduced to 1-4% of the treated volume. The device can remove 97% of cesium from contaminated soil as well as sewage and garbage incineration ash.

  However, since all of these treatments are passed through the adsorption system up to the part that does not contain radioactive substances, the work efficiency is much worse and the amount of objects that come out in the decontamination work is overwhelmingly large. . At present, all of the topsoil is cut and collected by 5 cm, or all of the undergrowth is harvested, resulting in a huge amount of objects. And since it is processed sequentially as it is, processing may not be in time, and there is a possibility that the intermediate storage may be punctured.

  On the other hand, in recent years, for example, X-ray imaging apparatuses using a Talbot-Lau interferometer have been widely implemented. For example, Patent Document 1 discloses an apparatus using a Talbot-Lau interferometer. The Talbot-Lau interferometer used in such an X-ray imaging apparatus uses three gratings, an X-ray source capable of emitting ordinary X-rays, a zeroth grating, a first grating, and a second grating, and depends on the subject. Visualize X-ray refraction as moire fringes. For example, X-rays are irradiated from an X-ray source and pass through the 0th lattice, the subject, the first lattice, and the second lattice. As the irradiated X-rays pass through the 0th grating, the phases are aligned, and when the X-rays having the aligned phases pass through the subject, a phase change due to the subject occurs. The moire fringes formed when the X-rays pass through the first grating and the second grating reflect this phase change, and the moire fringes thus obtained are detected by an image detector, An image is generated by processing the data.

  Therefore, it is conceivable to detect a radioactive substance in the object by imaging the object using such a Talbot-Lau interferometer. If the radioactive substance can be removed from the object, the processing efficiency can be improved. .

JP 2013-85631 A

  However, when a mass of the object containing the collected radioactive material is emitted from the X-ray source, X-rays (source radiation X-rays) are emitted from the X-ray source, and the source radiation X-rays that are in phase and the radioactive material It is difficult to distinguish from X-rays (material emission X-rays) that are out of phase with each other, and it is difficult to detect the position of the radioactive substance as an image. In addition, when the X-ray source of the imaging apparatus is turned off and a mass of an object is imaged, the radioactive substance becomes an X-ray source, and a simple X-ray image of a non-radioactive substance existing between the radioactive substance and the image detector can be taken. Only.

  An object of the present invention is to provide a radioactive substance removing device and a radioactive substance removing method capable of identifying and removing a radioactive substance from an object using a Talbot-Lau interferometer.

  A radioactive substance removal device according to an aspect of the present invention includes a radioactive substance detection unit that detects the radioactive substance from a predetermined amount of an object including the radioactive substance, a placement part that places the object, and A radioactive substance position specifying unit that specifies a position of the radioactive substance in the object, wherein the radioactive substance detection unit captures at least two first and second Talbot-low interferences that image the object from different directions. The placement unit is disposed at an intersection position between the first Talbot-Lau interferometer and the second Talbot-Lau interferometer, and the radioactive substance position specifying unit is configured to include the first Talbot-Lau interferometer. A first side view position specifying unit that specifies the position of the radioactive substance in the first side view of the object viewed from the X-ray source side of the meter along the first direction; Second Talbot-Lau interferometer A second side view for specifying the position of the radioactive substance in a second side view of the object placed on the placement unit along a second direction intersecting the first direction from the X-ray source side A position specifying unit, and the first side view position specifying unit is detected by the first Talbot-Lau interferometer in a state where X-rays are emitted from the X-ray source of the first Talbot-Lau interferometer. Diffraction obtained from a synthesized wave frequency spectrum obtained by Fourier transforming the Talbot image and a diffraction image detected by the first Talbot-Lau interferometer in a state where X-rays are not emitted from the X-ray source of the first Talbot-Lau interferometer. Based on the converted Talbot image obtained by subtracting the diffraction image frequency from the synthetic wave frequency spectrum to obtain a source radiation X-ray frequency spectrum, and inverse Fourier transforming the source radiation X-ray frequency spectrum. The first side view position The second side view position specifying unit Fourier transforms a Talbot image detected by the second Talbot-Lau interferometer in a state where X-rays are emitted from the X-ray source of the second Talbot-Lau interferometer. A converted composite wave frequency spectrum and a diffraction image frequency obtained from a diffraction image detected by the second Talbot-Lau interferometer in a state where the source radiation X-ray is not emitted are obtained, and the diffraction wave is obtained from the composite wave frequency spectrum. A source radiation X-ray frequency spectrum is obtained by subtracting an image frequency, and the second side view position is specified based on a converted Talbot image obtained by performing inverse Fourier transform on the source radiation X-ray frequency spectrum. .

  According to this configuration, the first side view position specifying unit specifies the first side view position of the radioactive substance. Specifically, the X-ray from the X-ray source is obtained by Fourier transforming the Talbot image detected by the first Talbot-Lau interferometer in the state where X-rays are emitted from the X-ray source of the first Talbot-Lau interferometer. A synthetic wave frequency spectrum with X-rays from radioactive material is obtained. And the diffraction image frequency calculated | required from the diffraction image detected in the state in which X-rays are not radiated | emitted from an X-ray source is subtracted from the obtained synthetic wave frequency spectrum. Thereby, the frequency of the X-ray from the radioactive substance can be removed from the combined wave frequency spectrum of the X-ray from the X-ray source and the X-ray from the radioactive substance, and the source radiation X with respect to the frequency of only the X-ray from the X-ray source. A line frequency spectrum is obtained. Then, the obtained source radiation X-ray frequency spectrum is subjected to inverse Fourier transform. Thereby, the conversion Talbot image only by source radiation X-rays is obtained. Therefore, the radioactive substance can be regarded as a substance that does not emit X-rays, and the first side view position of the radioactive substance can be detected from the converted Talbot image.

  Similarly, the second side view position of the radioactive substance is detected by the second side view position specifying unit. Therefore, for example, the positions of the radioactive substance in the three orthogonal directions in the object can be specified from the first side view position by the first side view position specifying unit and the second side view position by the second side view position specifying unit.

  Therefore, the radioactive substance can be detected and removed from the object, the non-radioactive substance that does not contain the radioactive substance and does not need to be passed through the adsorption system can be separated from the object, and the efficiency of the processing operation of the object is improved.

  In another aspect, the radioactive substance removing device further includes a radioactive substance extracting unit that extracts the radioactive substance detected by the radioactive substance detecting unit from the object, and the radioactive substance extracting unit includes the radioactive substance extracting unit, A suction port for sucking a radioactive substance; and a movable portion for moving the suction port, wherein the movable portion moves the suction port to the first direction, the second direction, the first direction, and the first direction. It is possible to move in a third direction orthogonal to the two directions.

  According to this configuration, from among the objects based on the first side view position specified by the first side view position specifying unit and the second side view position detected by the second side view position specifying unit. The radioactive substance can be sucked at the suction port of the radioactive substance take-out part and can be easily and reliably removed.

  In another aspect, in the radioactive substance removing device, the radioactive substance take-out part includes a pulverizing part for pulverizing the object on the distal end side of the suction port.

  According to this configuration, since the crushing portion is provided on the tip side of the suction port, for example, even when a tree branch or a long plant is absorbing radioactive material inside, it is finely crushed by the crushing portion. Can be sucked from the suction port. Therefore, the present radioactive substance removing device can suck various radioactive substances and has a wide application range.

  The radioactive substance removal method of the present invention includes at least two first and second Talbot-Lau interferometers for detecting a radioactive substance from a predetermined amount of an object containing the radioactive substance, and a radioactive substance position. And the placement unit is disposed at an intersection position of the first Talbot-Lau interferometer and the second Talbot-Lau interferometer, and the radioactive substance position specifying unit is configured to include the first Talbot-Lau interferometer. First side view position specifying unit for specifying the position of the radioactive substance in the first side view of the object placed on the placement unit along the first direction from the X-ray source side of the low interferometer And the second Talbot-Lau interferometer from the X-ray source side in the second side view of the object placed on the placement unit along the second direction intersecting the first direction. Second side view position specifying unit for specifying the position of the radioactive substance A radioactive substance removal method performed using a radioactive substance removal apparatus comprising: an X-ray emitted from an X-ray source of the first Talbot-Lau interferometer to the first side view position specifying unit. A synthesized frequency spectrum obtained by Fourier transforming the Talbot image detected by the first Talbot-Lau interferometer, and a diffraction image detected by the first Talbot-Lau interferometer without X-rays being emitted from the X-ray source. The diffraction image frequency obtained from the above is obtained, and the source radiation X-ray frequency spectrum is obtained by subtracting the diffraction image frequency from the synthetic wave frequency spectrum, and the source radiation X-ray frequency spectrum is obtained by inverse Fourier transform. The first side view position is specified based on the converted Talbot image, and the second side view position specifying unit is configured to emit the second X-ray in a state where X-rays are emitted from the X-ray source of the second Talbot-Lau interferometer. Talbot -The frequency spectrum of the synthesized wave obtained by Fourier transforming the Talbot image detected by the interferometer and the second Talbot-Lau interferometer detected without X-rays being emitted from the X-ray source of the second Talbot-Lau interferometer. And obtaining a diffracted image frequency obtained from the diffracted image, subtracting the diffracted image frequency from the synthesized wave frequency spectrum to obtain a source radiation X-ray frequency spectrum, and performing an inverse Fourier transform on the source radiation X-ray frequency spectrum. The second side view position is specified based on the converted Talbot image obtained in this manner.

  According to this configuration, the Talbot image detected by the first Talbot-Lau interferometer in a state where X-rays are emitted from the X-ray source of the first Talbot-Lau interferometer is Fourier-transformed from the X-ray source. A synthetic wave frequency spectrum of X-rays and X-rays from radioactive materials is obtained. And the diffraction image frequency calculated | required from the diffraction image detected in the state in which X-rays are not radiated | emitted from an X-ray source is subtracted from the obtained synthetic wave frequency spectrum. Thereby, the frequency of the X-ray from the radioactive substance can be removed from the combined wave frequency spectrum of the X-ray from the X-ray source and the X-ray from the radioactive substance, and the source radiation X with respect to the frequency of only the X-ray from the X-ray source. A line frequency spectrum is obtained. Then, the obtained source radiation X-ray frequency spectrum is subjected to inverse Fourier transform. Thereby, the conversion Talbot image only by the X-ray from an X-ray source is obtained. Therefore, the radioactive substance can be regarded as a substance that does not emit X-rays, and the first side view position of the radioactive substance can be detected from the converted Talbot image.

  Similarly, the second side view position of the radioactive substance is detected by the second side view position specifying unit. Therefore, for example, the positions of the radioactive substance in the three orthogonal directions in the object can be specified from the first side view position by the first side view position specifying unit and the second side view position by the second side view position specifying unit.

  Therefore, the radioactive substance can be removed from the object, the non-radioactive substance that does not contain the radioactive substance and does not need to be passed through the adsorption system can be separated from the object, and the efficiency of the processing operation of the object is improved.

  The radioactive substance removing apparatus and radioactive substance removing method of the present invention can identify and remove the position of a radioactive substance from an object using a Talbot-Lau interferometer.

It is a schematic perspective view of the radioactive substance removal apparatus of one embodiment of this invention. It is a block diagram which shows the structure of the radioactive substance removal apparatus of FIG. It is the schematic which represented typically the 1st and 2nd Talbot low interferometer used for the radioactive substance removal apparatus of FIG. It is an expansion perspective view of the 0th grating | lattice used for a 1st and 2nd Talbot low interferometer. It is a side view of the principal part of the radioactive substance extraction part used for the radioactive substance removal apparatus of FIG. FIG. 6 is a sectional view taken along line VI-VI in FIG. 5. It is explanatory drawing of the state by which the radioactive substance was mounted in the mounting part of a 1st Talbot low interferometer (2nd Talbot low interferometer), and the X-ray was radiated | emitted from the X-ray source. FIG. 8 is an explanatory diagram when it is assumed that X-rays are not emitted from a radioactive substance in the state of FIG. 7. It is explanatory drawing of the state by which a radioactive substance is mounted in the mounting part of a 1st Talbot low interferometer (2nd Talbot low interferometer), and an X-ray is not radiated | emitted from an X-ray source. It is a part of flowchart of an example which shows the flow of the process which removes a radioactive substance from a target object using a radioactive substance removal apparatus. It is other one part of the flowchart of an example which shows the flow of the process which removes a radioactive substance from a target object using a radioactive substance removal apparatus. It is a further another part of flowchart of an example which shows the flow of the process which removes a radioactive substance from a target object using a radioactive substance removal apparatus. It is the figure which represented typically the Talbot image detected by the image detector in the state of FIG. It is the figure which represented typically the diffraction image detected by the image detector in the state of FIG.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In each figure, the structure which attached | subjected the same code | symbol shows that it is the same structure, The description is abbreviate | omitted about the content which has already demonstrated the structure.

  1 is a perspective view of a main part of a radioactive substance removing device 1 according to an embodiment of the present invention, FIG. 2 is a block diagram showing a configuration of the radioactive substance removing device of FIG. 1, and FIG. 3 is a radioactive figure of FIG. It is the perspective view which represented typically the 1st and 2nd Talbot low interferometer used for a substance removal apparatus. The first direction is the X1-X2 direction, the second direction orthogonal to the first direction is the Y1-Y2 direction, and the third direction orthogonal to the first direction and the second direction is the Z1-Z2 direction. To do.

  The radioactive substance removal apparatus 1 of this embodiment is provided with the radioactive substance removal apparatus main body and the radioactive substance extraction part 4 as shown in FIGS.

  The radioactive substance removing device main body includes a radioactive substance detection unit 2 having two first and second Talbot-Lau interferometers 3a and 3b for imaging an object, a placement unit 6 for placing the object, and a later-described An X-ray power supply unit 14 that supplies power to the X-ray sources 31a and 31b of the first and second Talbot-Lau interferometers 3a and 3b, and first and second Talbot-Lau interferometers 3a and 3b described later, respectively. The X-ray source is controlled by controlling the power supply operation of the camera control unit 15 that controls the detection operation of the image detectors 35a and 35b, the processing unit 16 that controls the entire operation of the radioactive substance detection unit 2, and the X-ray power supply unit 14. And an X-ray control unit 17 that controls the X-ray emission operation in 31a and 31b.

  The first Talbot-Lau interferometer 3a includes an X-ray source 31a that emits X-rays, and a zeroth grating (G0 grating) 32a arranged along the X1-X2 direction (first direction) in order from the X-ray source 31a. , A first grating (G1 grating) 33a, a second grating (G2 grating) 34a, and an image detector 35a.

  As shown in FIG. 4, the zeroth lattice 32a has a predetermined thickness (depth) H in the X1-X2 direction and a plurality of X-ray absorptions extending linearly in the Y1-Y2 direction (second direction). Part 312 and a plurality of X-ray transmission parts 311 having the predetermined thickness H and extending linearly in the Y1-Y2 direction. In this embodiment, a plurality of grooves extending linearly in the Y1-Y2 direction are formed in a silicon material, and an X-ray absorbing portion 312 is formed by embedding a metal (not shown) in these grooves. Accordingly, the plurality of X-ray absorption units 312 and the plurality of X-ray transmission units 311 are alternately arranged in parallel. For this reason, the plurality of X-ray absorbers 312 are respectively arranged at predetermined intervals in the Z1-Z2 direction orthogonal to the Y1-Y2 direction. This interval (pitch) P is constant in this embodiment. That is, the plurality of X-ray absorbers 312 are arranged at equal intervals P in the Z1-Z2 direction (third direction).

  The plurality of X-ray absorption units 312 function to absorb X-rays, and the X-ray transmission units 311 function to transmit X-rays. The X-ray absorption unit 312 has an appropriate thickness H so that X-rays can be sufficiently absorbed according to specifications, for example. Since X-rays are generally highly transmissive, as a result, the ratio of the thickness H to the width W (aspect ratio = thickness / width) in the X-ray absorber 312 is, for example, a high aspect ratio of 5 or more. Has been. The width W in the X-ray absorber 312 is the length in the X-ray absorber 312 in the X1-X2 direction, and the thickness H is the length of the X-ray absorber 312 in the X1-X2 direction.

  Next, the first lattice 33a will be described. The first grating 33a is a diffraction grating that generates a Talbot effect by X-rays radiated from the X-ray source 31a (hereinafter, source radiation X-rays). Although not shown, the first grating 33a has a predetermined thickness (depth) in the X1-X2 direction, extends linearly in the Y1-Y2 direction, and is arranged alternately in parallel, like the zeroth grating 32a. A plurality of X-ray absorbing portions and a plurality of X-ray transmitting portions. The first grating 33a is configured to satisfy the conditions for causing the Talbot effect, and is a grating sufficiently coarser than the wavelength of the source radiation X-rays emitted from the X-ray source 31a, for example, a grating constant (of the diffraction grating). A phase type diffraction grating whose period is about 20 or more of the wavelength of the source radiation X-ray. The first grating 33a may be an amplitude type diffraction grating.

  The first grating 33a is disposed in parallel with the 0th grating 32a at a distance that is an integral multiple of the wavelength of the source radiation X-ray.

  Next, the second grating 34a will be described. The second grating 34a is a transmission-type amplitude diffraction grating that is disposed at a position approximately a Talbot distance from the first grating 33a and diffracted by the first grating 33a, for example, that diffracts source radiation X-rays. Similarly to the first grating 33a, the second grating 34a has a predetermined thickness (depth) in the X1-X2 direction, extends linearly in the Y1-Y2 direction, and is alternately arranged in parallel. A plurality of X-ray absorbing portions and a plurality of X-ray transmitting portions are provided.

The second grating 34a is arranged so as to satisfy the following expressions 1 and 2 with the first grating 33a that is a phase type diffraction grating.
l = λ / (a / (L1 + L2 + L3)) (Formula 1)
Z1 = (m + 1/2) × (d2 / λ) (Formula 2)
Here, l is the coherence distance, λ is the wavelength of X-ray (usually the center wavelength), and a is the aperture diameter of the X-ray source 31a in the direction substantially perpendicular to the diffraction member of the diffraction grating. Yes, L1 is the distance from the X-ray source 31a to the first grating 33a, L2 is the distance from the first grating 33a to the second grating 34a, and L3 is the image detector 35a from the second grating 34a. M is an integer, and d is the period of the diffraction member (diffraction grating period, grating constant, distance between centers of adjacent diffraction members, the pitch P).

  The image detector 35a is, for example, a flat panel detector (FPD) including a two-dimensional image sensor in which a thin film layer including a scintillator that absorbs X-ray energy and emits fluorescence is formed on a light receiving surface, or incident photons are photoelectrically detected. The image is converted into electrons on the surface, the electrons are doubled by the microchannel plate, and the image intensifier unit that emits light by colliding the doubled electron group with the phosphor, and the output light of the image intensifier unit are imaged An image intensifier camera equipped with a two-dimensional image sensor.

  In this embodiment, the X-ray source 31a, the 0th grating 32a, the first grating 33a, the second grating 34a, and the image detector 35a are housed in the casing 36.

  Similarly to the first Talbot-Lau interferometer 3a, the second Talbot-Lau interferometer 3b is, in order from the X-ray source 31b and the X-ray source 31b, the Y1-Y2 direction (second direction) orthogonal to the X1-X2 direction. ) Are arranged along the 0th grating 32b, the first grating 33b, the second grating 34b, and the image detector 35b.

  The X-ray source 31b, the zeroth grating 32b, the first grating 33b, the second grating 34b, and the image detector 35b are the X-ray source 31a, the zeroth grating 32a, and the first grating of the first Talbot-Lau interferometer 3a. 33a, the second grating 34a, and the image detector 35a.

  In the second Talbot-Lau interferometer 3b formed in this way, the second Talbot-Lau interferometer shaft 30b (shown in FIG. 2) has the 0th grating 32a and the first grating 33a of the first Talbot-Lau interferometer 3a. And the first Talbot-Lau interferometer shaft 30a (shown in FIG. 2) of the first Talbot-Lau interferometer 3a is connected to the 0th grating 32b and the first grating of the second Talbot-Lau interferometer 3b. 33b is arranged so as to be orthogonal (cross). The second Talbot-Lau interferometer axis 30b is an axis that passes through the X-ray source 31b, the 0th grating 32b, the first grating 33b, the second grating 34b, and the image detector 35b and is parallel to the Y1-Y2 direction. The first Talbot-Lau interferometer axis 30a passes through the X-ray source 31a, the 0th grating 32a, the first grating 33a, the second grating 34a, and the image detector 35a of the first Talbot-Lau interferometer 3a in the X1-X2 direction. Is an axis parallel to

  In this embodiment, the X-ray source 31b, the zeroth grating 32b, the first grating 33b, the second grating 34b, and the image detector 35b of the second Talbot-Lau interferometer 3b are also housed in the casing 36.

  The placement unit 6 is located between the zeroth grating 32a and the first grating 33a of the first Talbot-Lau interferometer 3a and between the zeroth grating 32b and the first grating 33b of the second Talbot-Lau interferometer 3b. It is formed between (intersecting positions). Accordingly, the first Talbot-low interferometer shaft 30 a and the second Talbot-low interferometer shaft 30 b intersect at the mounting portion 6.

  In this embodiment, the object S <b> 1 is stored in the storage container 100 and is placed on the placement unit 6 via the storage container 100. In addition, the mounting part 6 shall be provided with the storage container part fixedly attached, and you may make it place the target object S1 by accommodating the target object S1 in the storage container part.

  The processing unit 16 is a device that controls the operation of the entire radioactive substance removing device 1 by controlling each part of the radioactive substance removing device 1. For example, the processing unit 16 includes a microprocessor and its peripheral circuits, and is functionally A radioactive substance position specifying unit 160, an image processing unit 161, and a system control unit 162 are provided.

  The radioactive substance position specifying unit 160 is configured to detect the radioactive substance S2 in the first side view of the object S1 placed on the placement unit 6 in the X2 direction from the X-ray source 31a side of the first Talbot-Lau interferometer 3a. The first side view position specifying unit 1601 for detecting the position and the position of the radioactive substance S2 in the second side view when the object S1 is viewed in the Y2 direction from the X-ray source 31b side of the second Talbot-Lau interferometer 3b And a second side view position specifying unit 1602.

  The first side view position specifying unit 1601 acquires, for example, a Talbot image 351 shown in FIG. 13A by the image detector 35a of the first Talbot-Lau interferometer 3a with the X-ray source 31a turned on. The Talbot image 351 is emitted from the source radiation X-ray radiated from the X-ray source 31a of the first Talbot-Lau interferometer 3a and the radioactive substance S2 in the object S1 placed on the placement unit 6. It is an image by X-rays (hereinafter, material emission X-rays).

  A Talbot image 351 of the present embodiment shown in FIG. 13A is an image detector 35a, and an image S2a when the radioactive substance S2 is a non-radioactive substance shown in FIG. 13C, and FIG. The image shown in FIG. However, the Talbot image 351 shown in FIG. 13A is a case where the pitch of the sensor provided in the image detector 35a is larger than the G2 pattern 341 provided in the second grating 34b. This G2 pattern 341 projects a pattern (not shown) provided on the first grating 33a by the source radiation X-ray from the X-ray source 31a where the waves are aligned at the 0th grating 32b without the object S1. This pattern is a pattern formed by further projecting onto the image detector 35a with the substance radiation X-rays emitted from the radioactive substance S2. On the other hand, when the sensor pitch of the image detector 35a is smaller than the G2 pattern 341 of the second grating 34b, as shown in FIG. 13B, the Talbot image 352 has the above-mentioned non-radioactive substance shown in FIG. The image S2a and an image shown in FIG.

  And the 1st side view position specific | specification part 1601 acquires a synthetic wave frequency spectrum by Fourier-transforming this Talbot image.

  Further, the first side view position specifying unit 1601 is the image detector 35a of the first Talbot-Lau interferometer 3a in a state where the source radiation X-ray is not emitted, that is, in a state where the X-ray source 31a is turned off. A diffraction image 353 shown in FIG. This diffraction image 353 is an image of substance radiation X-rays emitted from the radioactive substance S2 in the object S1 placed on the placement unit 6.

  As shown in FIG. 14A, the diffraction image 353 of this embodiment is a portion where the G2 pattern of the second grating 34b is closest to the radioactive substance S2 in the image detector 35a (the central portion in FIG. 14A). ) It looks brighter. However, since the G2 pattern 341 is finer than the sensor pitch of the image detector 35a, the G2 pattern is actually used as a mask, and the entire surface is slightly bright with the light amount dropped to about ½. 14A is an image when the sensor pitch of the image detector 35a is larger than the G2 pattern 341, and the sensor pitch of the image detector 35a is larger than the G2 pattern 341. When it is small, as shown in FIG. 14B, the diffraction image 354 is an image in which the center portion is bright and the G2 pattern 341 appears.

  And the 1st side view position specific | specification part 1601 extracts the frequency linked | related with the diffraction image in the look-up table 1603 which linked | related and recorded the position of the diffraction image and the diffraction image frequency previously from this diffraction image. Obtain the frequency of material radiation X-rays.

  And the 1st side view position specific | specification part 1601 subtracts a diffraction image frequency from the said synthetic wave frequency spectrum, and obtains a source radiation X-ray frequency spectrum. This source radiant X-ray frequency spectrum detector is a radioactive substance S2 (radioactive substance in this case) detected by the image detector 35a of the first Talbot-Lau interferometer 3a only by the source radiant X-ray without emitting the substance radiant X-ray. Is the data on the frequency of the non-radioactive material.

  The first side view position specifying unit 1601 obtains a converted Talbot image by performing inverse Fourier transform on the source radiation X-ray frequency spectrum. This converted Talbot image is an image obtained by assuming that the radioactive substance S2 does not emit X-rays. And the 1st side view position is specified by calculating | requiring the 1st side view position from the obtained conversion X-ray Talbot image from well-known Talbot processing.

  The second side view position specifying unit 1602 detects the position of the radioactive substance S2 in the second side view in the same manner as the first side view position specifying unit 1601.

  Specifically, the second side view position specifying unit 1602 acquires a Talbot image by the image detector 35b of the second Talbot-Lau interferometer 3b with the X-ray source 31a turned on. And this Talbot image is Fourier-transformed and a synthetic wave frequency spectrum is acquired.

  In addition, the second side view position specifying unit 1602 performs a diffraction image by the image detector 35b of the second Talbot-Lau interferometer 3b in a state where the source radiation X-rays are not emitted, that is, in a state where the X-ray source 31a is turned off. To get. From this diffraction image, the frequency of the material radiation X-ray is obtained by extracting the frequency associated with the diffraction image in the look-up table 1603 recorded in association with the position of the diffraction image and the diffraction image frequency in advance.

  And the 2nd side view position specific | specification part 1602 subtracts a diffraction image frequency from the said synthetic wave frequency spectrum, and obtains a source radiation X-ray frequency spectrum.

  The second side view position specifying unit 1602 obtains a converted Talbot image by performing inverse Fourier transform on the source radiation X-ray frequency spectrum. And the 1st side view position is specified by calculating | requiring the 1st side view position from the obtained conversion X-ray Talbot image from well-known Talbot processing.

  The system control unit 162 controls the radiation operation of the source radiation X-rays in the X-ray sources 31a and 31b via the X-ray power source unit 14 by transmitting and receiving control signals to and from the X-ray control unit 17, and the camera. The source radiation X-rays are emitted toward the object S1 that is the subject under the control of the system control unit 162 that controls the imaging operation of the image detectors 35a and 35b by transmitting and receiving control signals to and from the control unit 15. Images generated thereby are captured by the image detectors 35 a and 35 b, and an image signal is input to the processing unit 16 via the camera control unit 15.

  In addition, the system control unit 162 extracts a radioactive substance to be described later based on the first side view position and the second side view position specified by the first side view position specifying unit 1601 and the second side view position specifying unit 1602. The first drive motor 434 to the third drive motor 436 in the unit 4 are controlled.

  The image processing unit 161 processes the image signal detected by the image detectors 35a and 35b, and generates an image of the object S1.

  Next, the radioactive substance extraction unit 4 will be described. As shown in FIG. 1, the radioactive substance take-out unit 4 includes a storage part 41 that stores the radioactive substance, a conveyance path 42 that conveys the radioactive substance to the storage part 41, and a movable part 43 that moves the tip of the conveyance path. I have.

  The storage unit 41 includes a storage layer 411 that stores a radioactive substance, and a suction unit 412 that draws the radioactive substance into the storage layer 411. The suction part 412 includes a motor (not shown), and is formed so that the inside of the reservoir 411 becomes a negative pressure by the operation of the motor.

  In this embodiment, the conveyance path 42 is formed inside a pipe 44 that extends from the storage layer 411 to the storage container 100. The pipe pipe 44 includes a first pipe 45 extending from the storage container 100 to the movable portion 44, and a second pipe that is connected to the first pipe 45 and extends from the movable portion 43 to the storage layer 411 and can be deformed into a curved shape. And a pipe 46.

  In this embodiment, the first pipe 45 is formed so as not to be deformed as a whole. The first pipe 45 is arranged in a substantially horizontal shape by being bent at a right angle to the vertical portion 451 arranged in a substantially vertical shape. The horizontal portion 452 is provided.

  As shown in FIG. 5, the vertical portion 451 includes a suction port 4511 and a pulverizing portion 4512 at the tip on the lower end side. The pulverizing part 4512 is for pulverizing an object containing the radioactive substance S2. In this embodiment, the pulverizing part 4512 is provided with two pieces rotatably attached to the vertical part 451 on the distal end side of the suction port 4511. It consists of a rotating blade.

  As shown in FIGS. 5 and 6, the movable portion 43 includes a column 431, a moving member 432 that is movably held by the column 431, and a horizontal portion 452 of the first pipe 45 that is movably held by the moving member 432. And a pipe holding portion 433 that is fixedly held.

  The support column 431 includes a first support column 4311 and a second support column 4312 that are opposed to each other with an interval in the X1-X2 direction, a first guide shaft 4313, a second guide shaft 4314, and a first drive shaft 4315. ing.

  The first guide shaft 4313 extends in the Z1-Z2 direction and is fixedly held by the first support post 4311.

  The second guide shaft 4314 is disposed in parallel with the first guide shaft 4313 and is fixedly held by the second support post 4312.

  The first drive shaft 4315 includes a male screw 4315a on the outer periphery. The first drive shaft 4315 extends in the Z1-Z2 direction and is rotatably held by the second support post 4312. The first drive shaft 4315 is connected to a first drive motor 434 (illustrated in FIG. 5) attached to the support column 431, and rotates in accordance with the operation of the first drive motor 434.

  In this embodiment, the moving member 432 includes a rectangular tubular frame body 4321, and a second drive shaft 4322 and a third drive shaft 4323 arranged inside the frame body 4321.

  The frame body 4321 is configured such that the first guide shaft 4313 and the second guide shaft 4314 are slidably fitted into the frame body 4321 and screwed with the first drive shaft 3315, respectively. Between the support post 4312, it is arranged so as not to rotate. Then, by rotation of the first drive shaft 4315 accompanying the operation of the first drive motor 434, the frame body 4321 is guided by the first guide shaft 4313 and the second guide shaft 4314 and can move in the Z1-Z2 direction. It has become.

  The second drive shaft 4322 includes a male screw 4322a on the outer periphery. The second drive shaft 4322 extends along the Y1-Y2 direction, and is held by the frame body 4321 so as to be rotatable and movable in the X1-X2 direction. The second drive shaft 4322 is connected to a second drive motor 435 attached to the frame body 4321 and is rotated by the operation of the second drive motor 435.

  The third drive shaft 4323 has substantially the same configuration as the second drive shaft 4322, and has a male screw 4323a on the outer periphery. The third drive shaft 4323 extends along the X1-X2 direction, and is held by the frame body 4321 so as to be rotatable and movable in the Y1-Y2 direction. The third drive shaft 4322 is connected to a third drive motor 436 attached to the frame 4321 and is rotated by the operation of the third drive motor 436.

  The pipe holding portion 433 is screwed into each of the second drive shaft 4322 and the third drive shaft 4323, and is attached to the second drive shaft 4322 as the second drive shaft 4322 is rotated by the operation of the second drive motor 435. Along the Y1-Y2 direction along the third drive shaft 4323 as the third drive shaft 4323 is rotated by the operation of the third drive motor 436.

  Next, a method for removing the radioactive substance S2 using the radioactive substance removing apparatus 1 of the present embodiment will be described. By placing the storage container 100 in which the target object S1 is stored on the mounting unit 6, the target object S1 as a subject is formed between the 0th grating 32a and the first grating 33a of the first Talbot-Lau interferometer 3a. And between the 0th grating 32b and the first grating 33b of the second Talbot-Lau interferometer 3b.

  In this state, when the user (operator) of the radioactive substance removing device 1 instructs the imaging of the object S1 from an operation unit (not shown), the system control unit 162 of the processing unit 16 causes the first Talbot-Lau interferometer 3a. A control signal is output to the X-ray control unit 17 to irradiate the source radiation X-ray from the X-ray source 31a toward the object S1. With this control signal, the X-ray control unit 17 causes the X-ray power supply unit 14 to supply power to the X-ray source 31a, and the X-ray source 31a emits source radiation X-rays and emits source radiation X-rays toward the object S1. Irradiate (FIG. 10, step S1).

  The irradiated source radiation X-ray passes through the first grating 33a via the zeroth grating 32a and the object S1, and is diffracted by the first grating 33a.

  At that time, the substance radiation X-ray is emitted from the radioactive substance S2 included in the object S1, and is diffracted by the first grating 33a.

  Accordingly, the image detector 35a of the first Talbot-Lau interferometer 3a includes a Talbot formed by a combined wave of source radiation X-rays and material radiation X-rays as shown in FIG. 13 (a) (or FIG. 13 (b)). An image is detected (FIG. 10, step S2).

  The first side view position specifying unit 1601 performs Fourier transform on the detected Talbot image to obtain a composite wave frequency spectrum of a composite wave of the source radiation X-ray and the material radiation X-ray (FIG. 10, step S3).

  Further, after a predetermined time, the system control unit 162 of the processing unit 16 turns off the X-ray source 31a of the first Talbot-Lau interferometer 3a so that the source radiation X-rays are not irradiated. In this state, as shown in FIG. 9, only the substance radiation X-ray is radiated from the radioactive substance S2 and diffracted by the first grating 33a, and the image detector 35a of the first Talbot-Lau interferometer 3a has the structure shown in FIG. As shown in (a) (or FIG. 14 (b)), a diffraction image by the substance radiation X-ray is detected (FIG. 10, step S4).

  Here, as shown in FIG. 9, the substance radiation X-ray is a wave having a natural frequency with a constant amplitude and uneven phases. On the other hand, the source radiation X-ray is a wave having a constant amplitude and a constant phase by passing through the 0th grating 32a in a state where the amplitude is constant and the phases are not uniform as shown in FIG. When passing through S2, it is combined with the substance radiation X-rays to become a composite wave having an uneven amplitude and an uneven phase. Therefore, as described above, the Talbot image by the combined wave of the source radiation X-ray and the material radiation X-ray is detected by the image detector 35a of the first Talbot-Lau interferometer 3a.

  The first side view position specifying unit 1601 obtains the substance emission X-ray frequency of the substance emission X-ray by extracting the frequency recorded in the lookup table 1603 in association with the diffraction image detected in step S4 ( FIG. 11, step S5).

  And the 1st side view position specific | specification part 1601 calculates | requires the source radiation X-ray frequency spectrum only by source radiation X-rays by subtracting a substance radiation X-ray frequency from a synthetic wave frequency spectrum (FIG. 11, step S6). As a result, as shown in FIG. 8, the radiation material in the state of FIG. 7 is not radiated with substance radiation X-rays, that is, the radiation material is replaced with a non-radioactive material, and passes through the 0th lattice 32a. Thus, when the source radiation X-ray having a constant amplitude and a constant phase passes through the radioactive substance S2, it can be in a state equivalent to a state where the phase is not uniform and the phase is not uniform.

  The first side view position specifying unit 1601 obtains a converted Talbot image by performing inverse Fourier transform on the source radiation X-ray frequency spectrum (FIG. 11, step S7). And the 1st side view position of radioactive substance S2 is pinpointed from the conversion Talbot image using the well-known image processing technique in a Talbot low interferometer (FIG. 11, step S8).

  Further, the system control unit 162 of the processing unit 16 performs the same processing as that of the first Talbot-low interferometer 3a on the second Talbot-low interferometer 3b in parallel.

  Specifically, the system control unit 162 of the processing unit 16 irradiates source radiation X-rays from the X-ray source 31b of the second Talbot-Lau interferometer 3b toward the object S1 (FIG. 10, step S9).

  A Talbot image is detected by a combined wave of the irradiated source radiation X-ray and material radiation X-ray (FIG. 10, step S10).

  And the 2nd side view position specific | specification part 1602 acquires the synthetic wave frequency spectrum of the synthetic wave of a source radiation X-ray and a substance radiation X-ray by carrying out Fourier transform of the detected Talbot image (FIG. 10, step S11). .

  After a predetermined time, the system control unit 162 of the processing unit 16 turns off the X-ray source 31b of the second Talbot-low interferometer 3b so that the source radiation X-rays are not irradiated, and the second Talbot-low interferometer. The diffraction image by the substance radiation X-ray is detected by the image detector 35b of 3b (FIG. 10, step S12).

  In addition, the second side view position specifying unit 1602 extracts the substance radiation X of the substance radiation X-ray by extracting the frequency recorded in the lookup table 1603 in association with the diffraction image from the detected diffraction image. A line frequency is obtained (FIG. 11, step S13).

  And the 2nd side view position specific | specification part 1602 calculates | requires the source radiation X-ray frequency spectrum only by source radiation X-rays by subtracting a substance radiation X-ray frequency from a synthetic wave frequency spectrum (FIG. 11, step S14).

  The second side view position specifying unit 1602 obtains a converted Talbot image by performing inverse Fourier transform on the source radiation X-ray frequency spectrum (FIG. 11, step S15), and a known image in the Talbot-Lau interferometer from the converted Talbot image. The first side view position of the radioactive substance S2 is specified using the processing technique (FIG. 11, step S16).

  In addition, the processing unit 16 includes a first side view position of the radioactive substance S2 specified by the first side view position specifying unit 1601, and a second side view position of the radioactive substance S2 specified by the second side view position specifying unit 1602. Based on the above, the positions of the three orthogonal directions of the X1-X2 direction, the Y1-Y2 direction, and the Z1-Z2 direction that are orthogonal to each other are obtained (FIG. 11, step S17).

  Then, the system control unit 162 of the processing unit 16 operates the first drive motor 434 to the third drive motor 436 of the radioactive substance extraction unit 4 based on the obtained position information in the three directions, and the radioactive substance extraction unit 4 The suction ports 4511 are arranged at the positions in the three directions orthogonal to each other (FIG. 12, step S18).

  Thereafter, the system control unit 162 of the processing unit 16 operates the suction unit 412 to suck the radioactive substance S2 at the position obtained from the suction port 4511 (FIG. 12, step S19). At the time of the suction, the pulverizing unit 4512 pulverizes the object containing the radioactive substance S2, so that, for example, even when a tree branch or a long plant is absorbing the radioactive substance S2, the pulverizing part finely pulverizes the suction port. Can be sucked from. Therefore, the radioactive substance removing device 1 can suck various objects and has a wide application range. The above processing is performed for the positions of a plurality of radioactive substances detected.

  In the above-described embodiment, the processing unit 16 operates the radioactive substance extraction unit 4. However, the present invention is not limited to this configuration, and can be changed as appropriate. For example, the user (operator) of the radioactive substance removing device 1 may operate the radioactive substance extracting unit 4.

  At that time, the processing unit 16 colors the radioactive substance whose first side view position is specified on the display screen, and also colors the radioactive substance whose second side view position is specified on the display screen. The position of the suction port 4511 of the radioactive substance extraction unit 4 may be operated while viewing the display screen.

  In the above embodiment, the first Talbot-Lau interferometer 3a and the second Talbot-Lau interferometer 3b are used. However, three or more Talbot-Lau interferometers may be used and can be changed as appropriate. it can.

DESCRIPTION OF SYMBOLS 1 Radioactive substance removal apparatus 2 Radioactive substance detection part 4 Radioactive substance extraction part 3a 1st Talbot low interferometer 3b 2nd Talbot low interferometer 6 Placement part 31a, 31b X-ray source 32a, 32b 0th grating | lattice 33a, 33b First grid 34a, 34b Second grid 35a, 35b Image detector 1601 First side view position specifying unit 1602 Second side view position specifying unit 4511 Suction port 4512 Grinding unit

Claims (4)

A radioactive substance detection unit that detects the radioactive substance from a predetermined amount of the object including the radioactive substance, a placement unit that places the object, and a radioactivity that specifies a position of the radioactive substance in the object A substance location specifying unit,
The radioactive substance detection unit includes at least two first and second Talbot-Lau interferometers that image the object from different directions.
The placement unit is disposed at an intersection between the first Talbot-Lau interferometer and the second Talbot-Lau interferometer.
The radioactive substance position specifying unit is configured to display the radioactive substance in a first side view of the object placed on the mounting unit along the first direction from the X-ray source side of the first Talbot-Lau interferometer. A first side view position specifying unit that specifies the position of the substance, and a second position that intersects the first direction from the X-ray source side of the second Talbot-Lau interferometer; A second side view position specifying unit that specifies the position of the radioactive substance in the second side view of the object.
The first side view position specifying unit performs a Fourier transform on a Talbot image detected by the first Talbot-Lau interferometer in a state where X-rays are emitted from the X-ray source of the first Talbot-Lau interferometer. Obtaining a wave frequency spectrum and a diffraction image frequency obtained from a diffraction image detected by the first Talbot-Lau interferometer in a state where X-rays are not emitted from the X-ray source of the first Talbot-Lau interferometer, A source radiation X-ray frequency spectrum is obtained by subtracting the diffraction image frequency from a synthesized wave frequency spectrum, and the first side view position is determined based on a converted Talbot image obtained by inverse Fourier transforming the source radiation X-ray frequency spectrum. Identify,
The second side view position specifying unit performs a Fourier transform on a Talbot image detected by the second Talbot-Lau interferometer in a state where X-rays are emitted from the X-ray source of the second Talbot-Lau interferometer. Obtaining a wave frequency spectrum and a diffraction image frequency obtained from the diffraction image detected by the second Talbot-Lau interferometer in a state where the source radiation X-ray is not emitted, and obtaining the diffraction image frequency from the combined wave frequency spectrum. Subtracting to obtain a source radiation X-ray frequency spectrum, and specifying the second side view position based on a converted Talbot image obtained by performing an inverse Fourier transform on the source radiation X-ray frequency spectrum. apparatus. A radioactive substance extraction unit for extracting the radioactive substance detected by the radioactive substance detection unit from the object;
The radioactive substance extraction unit includes a suction port for sucking the radioactive substance, and a movable unit for moving the suction port,
The movable portion moves the suction port in the first direction, the second direction, and a third direction orthogonal to the first direction and the second direction, respectively. The radioactive substance removing device according to 1.   The radioactive substance removing device according to claim 2, wherein the radioactive substance extraction unit includes a pulverization unit for pulverizing the object on a distal end side of the suction port. A radioactive substance detection unit having at least two first and second Talbot-Lau interferometers for detecting the radioactive substance from a predetermined amount of an object including the radioactive substance, a placement unit, and a radioactive substance position specifying unit; The placement unit is disposed at a crossing position of the first Talbot-Lau interferometer and the second Talbot-Lau interferometer, and the radioactive substance position specifying unit is an X of the first Talbot-Lau interferometer. A first side view position specifying unit that specifies a position of the radioactive substance in a first side view of the object placed on the placement unit along the first direction from the radiation source side; and the second The position of the radioactive substance in a second side view of the object placed on the placement unit along the second direction intersecting the first direction from the X-ray source side of the Talbot-Lau interferometer. Radioactive substance removal provided with a second side view position specifying part to be specified A radioactive substance removing method using the apparatus,
The first side view position specifying unit is a Fourier transform of the Talbot image detected by the first Talbot-Lau interferometer in the state where X-rays are emitted from the X-ray source of the first Talbot-Lau interferometer A wave frequency spectrum and a diffraction image frequency obtained from a diffraction image detected by the first Talbot-Lau interferometer in a state where X-rays are not emitted from the X-ray source are acquired, and the diffraction frequency is obtained from the synthesized wave frequency spectrum. Subtracting the image frequency to obtain the source radiation X-ray frequency spectrum, specifying the first side view position based on the converted Talbot image obtained by inverse Fourier transforming the source radiation X-ray frequency spectrum,
The second side view position specifying unit is a composition obtained by Fourier transforming a Talbot image detected by the second Talbot-Lau interferometer in a state where X-rays are emitted from the X-ray source of the second Talbot-Lau interferometer A wave frequency spectrum and a diffraction image frequency obtained from a diffraction image detected by the second Talbot-Lau interferometer in a state where X-rays are not emitted from the X-ray source of the second Talbot-Lau interferometer, The second side view is based on a converted Talbot image obtained by subtracting the diffraction image frequency from the synthetic wave frequency spectrum to obtain a source radiation X-ray frequency spectrum and performing inverse Fourier transform on the source radiation X-ray frequency spectrum. A method for removing a radioactive substance, characterized in that a position is specified.

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