JP6356920B2 - 故障診断装置、故障診断方法、及び故障診断プログラム - Google Patents

故障診断装置、故障診断方法、及び故障診断プログラム Download PDF

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JP6356920B2
JP6356920B2 JP2017541474A JP2017541474A JP6356920B2 JP 6356920 B2 JP6356920 B2 JP 6356920B2 JP 2017541474 A JP2017541474 A JP 2017541474A JP 2017541474 A JP2017541474 A JP 2017541474A JP 6356920 B2 JP6356920 B2 JP 6356920B2
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failure
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installation environment
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JPWO2017051631A1 (ja
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瑞希 武井
瑞希 武井
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Fujifilm Corp
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    • GPHYSICS
    • G16INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16HHEALTHCARE INFORMATICS, i.e. INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR THE HANDLING OR PROCESSING OF MEDICAL OR HEALTHCARE DATA
    • G16H40/00ICT specially adapted for the management or administration of healthcare resources or facilities; ICT specially adapted for the management or operation of medical equipment or devices
    • G16H40/40ICT specially adapted for the management or administration of healthcare resources or facilities; ICT specially adapted for the management or operation of medical equipment or devices for the management of medical equipment or devices, e.g. scheduling maintenance or upgrades
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/32Operator till task planning
    • G05B2219/32287Medical, chemical, biological laboratory
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267Fault communication, e.g. human machine interface [HMI]

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  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Business, Economics & Management (AREA)
  • Biomedical Technology (AREA)
  • General Business, Economics & Management (AREA)
  • Primary Health Care (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Measuring And Recording Apparatus For Diagnosis (AREA)
JP2017541474A 2015-09-24 2016-08-10 故障診断装置、故障診断方法、及び故障診断プログラム Active JP6356920B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015187381 2015-09-24
JP2015187381 2015-09-24
PCT/JP2016/073625 WO2017051631A1 (ja) 2015-09-24 2016-08-10 故障診断装置、故障診断方法、及び故障診断プログラム

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JP2018112879A Division JP6745840B2 (ja) 2015-09-24 2018-06-13 故障診断装置、故障診断方法、及び故障診断プログラム

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JPWO2017051631A1 JPWO2017051631A1 (ja) 2018-01-18
JP6356920B2 true JP6356920B2 (ja) 2018-07-11

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JP2018112879A Active JP6745840B2 (ja) 2015-09-24 2018-06-13 故障診断装置、故障診断方法、及び故障診断プログラム

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US (1) US10796796B2 (enExample)
JP (2) JP6356920B2 (enExample)
WO (1) WO2017051631A1 (enExample)

Cited By (1)

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WO2020027560A1 (ko) * 2018-07-31 2020-02-06 삼성전자주식회사 전자 장치 및 전자 장치의 결함 진단 방법

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US10641681B2 (en) * 2015-10-13 2020-05-05 Nec Corporation Structure abnormality detection system, structure abnormality detection method, and storage medium
EP3279756B1 (de) * 2016-08-01 2019-07-10 Siemens Aktiengesellschaft Diagnoseeinrichtung und verfahren zur überwachung des betriebs einer technischen anlage
JP6909670B2 (ja) * 2017-08-03 2021-07-28 日立グローバルライフソリューションズ株式会社 異常検知方法および異常検知システム
KR20210030680A (ko) 2019-09-10 2021-03-18 삼성전자주식회사 디스플레이 장치 및 그 제어 방법
CN110955226B (zh) * 2019-11-22 2021-04-13 深圳市通用互联科技有限责任公司 设备故障预测方法、装置、计算机设备和存储介质
KR102129480B1 (ko) * 2020-04-23 2020-07-02 호서대학교 산학협력단 무인 자율주행차량의 예지보전장치 및 이의 예지보전방법
CN112235924A (zh) * 2020-09-25 2021-01-15 深圳星标科技股份有限公司 传感器故障处理方法及相关装置
CN113779247B (zh) * 2021-08-27 2023-07-18 北京邮电大学 基于意图驱动的网络故障诊断方法及系统
DE102022103586A1 (de) * 2022-02-15 2023-08-17 Olympus Winter & Ibe Gmbh Verfahren zur Handhabung von Statusinformationen medizinischer Geräte, und System
CN118588264B (zh) * 2024-06-07 2025-01-28 深圳微子医疗有限公司 一种基于云平台的医疗设备自动化管理系统及方法

Family Cites Families (9)

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JP2001306131A (ja) * 2000-04-21 2001-11-02 Toshiba Corp タービン保守管理支援装置
JP5242959B2 (ja) * 2007-07-11 2013-07-24 シャープ株式会社 異常要因特定方法およびシステム、上記異常要因特定方法をコンピュータに実行させるためのプログラム、並びに上記プログラムを記録したコンピュータ読み取り可能な記録媒体
JP5039739B2 (ja) 2009-03-27 2012-10-03 東日本電信電話株式会社 故障位置確認装置及び故障位置確認方法
JP5528125B2 (ja) * 2010-01-08 2014-06-25 キヤノン株式会社 管理装置、画像形成装置の管理方法、及び、プログラム
WO2012009804A1 (en) * 2010-07-23 2012-01-26 Corporation De L'ecole Polytechnique Tool and method for fault detection of devices by condition based maintenance
JP5507527B2 (ja) * 2011-11-11 2014-05-28 シャープ株式会社 電力管理装置、電力管理装置の制御方法および制御プログラム
JP5530019B1 (ja) * 2013-11-01 2014-06-25 株式会社日立パワーソリューションズ 異常予兆検知システム及び異常予兆検知方法
JP5530020B1 (ja) * 2013-11-01 2014-06-25 株式会社日立パワーソリューションズ 異常診断システム及び異常診断方法
US10579460B2 (en) * 2016-11-28 2020-03-03 Electronics And Telecommunications Research Institute Method and apparatus for diagnosing error of operating equipment in smart farm

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020027560A1 (ko) * 2018-07-31 2020-02-06 삼성전자주식회사 전자 장치 및 전자 장치의 결함 진단 방법
US11720435B2 (en) 2018-07-31 2023-08-08 Samsung Electronics Co., Ltd. Electronic device and fault diagnosis method of electronic device

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Publication number Publication date
JP6745840B2 (ja) 2020-08-26
JP2018173970A (ja) 2018-11-08
US20180190378A1 (en) 2018-07-05
US10796796B2 (en) 2020-10-06
JPWO2017051631A1 (ja) 2018-01-18
WO2017051631A1 (ja) 2017-03-30

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