JP6272042B2 - 広帯域幅の周波数範囲にわたる長期間における光路差(opd)でのファイバ安定化 - Google Patents

広帯域幅の周波数範囲にわたる長期間における光路差(opd)でのファイバ安定化 Download PDF

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JP6272042B2
JP6272042B2 JP2014005234A JP2014005234A JP6272042B2 JP 6272042 B2 JP6272042 B2 JP 6272042B2 JP 2014005234 A JP2014005234 A JP 2014005234A JP 2014005234 A JP2014005234 A JP 2014005234A JP 6272042 B2 JP6272042 B2 JP 6272042B2
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signal
light beam
telescope
fiber
optical telescope
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Japanese (ja)
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JP2014194526A5 (enExample
JP2014194526A (ja
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ポール ヴィー. ノールトン,
ポール ヴィー. ノールトン,
アンヘル アー. ポルティージョ,
アンヘル アー. ポルティージョ,
マイケル シー. ケイツ,
マイケル シー. ケイツ,
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Boeing Co
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Boeing Co
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062Active error reduction, i.e. varying with time
    • G01B9/02067Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/26Optical coupling means
    • G02B6/28Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
    • G02B6/293Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/10Astronomic interferometers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S359/00Optical: systems and elements
    • Y10S359/90Methods

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Telescopes (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
JP2014005234A 2013-01-18 2014-01-15 広帯域幅の周波数範囲にわたる長期間における光路差(opd)でのファイバ安定化 Active JP6272042B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/745,608 2013-01-18
US13/745,608 US9041992B2 (en) 2013-01-18 2013-01-18 Fiber stabilization of optical path differences (OPD) over a wide bandwidth frequency range for extended periods of time

Publications (3)

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JP2014194526A JP2014194526A (ja) 2014-10-09
JP2014194526A5 JP2014194526A5 (enExample) 2017-02-16
JP6272042B2 true JP6272042B2 (ja) 2018-01-31

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JP2014005234A Active JP6272042B2 (ja) 2013-01-18 2014-01-15 広帯域幅の周波数範囲にわたる長期間における光路差(opd)でのファイバ安定化

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US (1) US9041992B2 (enExample)
EP (1) EP2757396B1 (enExample)
JP (1) JP6272042B2 (enExample)
CN (1) CN103944055B (enExample)
RU (1) RU2642124C2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105446120A (zh) * 2015-11-25 2016-03-30 天津大学 基于飞秒激光的光纤链路时频分布装置及其稳定方法
CN107947859A (zh) * 2017-12-12 2018-04-20 北京无线电计量测试研究所 一种光纤传输时延补偿装置和系统
CN108828764A (zh) * 2018-03-30 2018-11-16 深圳市华讯方舟太赫兹科技有限公司 一种光纤拉伸装置及光纤延迟扫描系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4505588A (en) * 1983-02-09 1985-03-19 Ludman Jacques E Fiber stellar interferometer
FR2671868B1 (fr) * 1991-01-22 1993-04-30 Aerospatiale Dispositif interferometrique notamment stellaire, comportant une ligne a retard.
JPH0560781A (ja) * 1991-09-05 1993-03-12 Matsushita Electric Ind Co Ltd 加速度測定装置
JP2657018B2 (ja) * 1991-12-24 1997-09-24 日本電信電話株式会社 光コネクタ反射減衰量測定装置
FR2696545B1 (fr) * 1992-10-06 1994-12-30 Suisse Electronique Microtech Interféromètre comprenant un ensemble intégré et une unité réfléchissante séparés l'un de l'autre par une région de mesure.
US5515199A (en) * 1995-01-31 1996-05-07 Photonic Applications, Inc. Optical system employing near-incoherent processing for distortion correction
US6141099A (en) * 1998-11-17 2000-10-31 Trw Inc. Compact, variable length interferometer delay stage
US6823110B2 (en) * 2000-06-14 2004-11-23 3M Innovative Properties Company Method to stabilize and adjust the optical path length of waveguide devices
JP3629515B2 (ja) * 2000-09-11 2005-03-16 独立行政法人情報通信研究機構 モード同期レーザ装置
US7154608B1 (en) * 2003-10-29 2006-12-26 The Board Of Trustees Of Southern Illnois University Phase-preserving amplifier for a stellar interferometer
GB2411066B (en) * 2004-02-14 2009-04-29 Oti Ophthalmic Technologies Compact high resolution imaging apparatus
US7576868B2 (en) * 2007-06-08 2009-08-18 Zygo Corporation Cyclic error compensation in interferometry systems
JP5509001B2 (ja) * 2010-09-08 2014-06-04 日本電信電話株式会社 二重化光線路の光路長差検出調整装置

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Publication number Publication date
EP2757396B1 (en) 2017-03-22
CN103944055B (zh) 2018-11-13
US20140204439A1 (en) 2014-07-24
CN103944055A (zh) 2014-07-23
US9041992B2 (en) 2015-05-26
RU2642124C2 (ru) 2018-01-24
EP2757396A1 (en) 2014-07-23
JP2014194526A (ja) 2014-10-09
RU2014100684A (ru) 2015-07-20

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