JP6152970B2 - Measuring system and control device - Google Patents

Description

  The present invention relates to a measurement system and a control device that measure the thickness of a measurement object from a lower ground provided on a ground surface by, for example, urethane spraying.

  Conventionally, when measuring the finished thickness from the base surface (reference surface) in a resin film (measurement object) formed by urethane spraying, etc., whether or not the thickness management pin of a certain length is inserted and buried The finish thickness is measured from the length.

  In order to improve measurement accuracy and safety during measurement in the above-described thickness measurement, the position of the wall surface line (base surface) is measured and stored in advance, and the cutter head (thickness management pin) is placed on the surface of the measurement object. Discloses a technique for measuring a thickness by calculating a relative position between a measured value obtained by measuring the position of the cutter head in a state where the cutter head is in contact with or in proximity to the stored wall surface line. (For example, see Patent Document 1).

  Also disclosed is a technique for measuring the thickness by oscillating ultrasonic waves from the measurement member and receiving the ultrasonic waves returning from the base surface in a state where the measurement member is in contact with the surface of the measurement object. (For example, see Patent Document 2).

Japanese Patent Laid-Open No. 11-44529 JP 2009-47679 A

  However, in the technique disclosed in Patent Document 1, the position of the base surface must be measured in advance, and the cutter head is brought into contact with the surface of the measurement object while maintaining the measured reference position. Since measurement must be performed, restrictions on measurement are severe and efficient measurement cannot be performed.

  In the technique disclosed in Patent Document 2, there is a case where the reception accuracy due to the rebound of the ultrasonic wave is lowered due to the surface roughness of the base surface. Due to the decrease in the ultrasonic wave reception accuracy, the thickness measurement accuracy also decreases.

  The present invention has been made in view of the above, and an object of the present invention is to provide a measurement system and a control device that can efficiently and accurately measure the thickness of a measurement object from a reference surface.

In order to solve the above-described problems and achieve the object, distance information between the measurement object and the reference surface obtained by emitting light toward the measurement target surface and receiving return light of the emitted light An information acquisition device that generates a distance information signal based on the above, a support column, a thickness management pin provided at the tip of the support column, and a cylinder that covers the thickness management pin and is movable back and forth with respect to the support column and a Jo member, a support portion for supporting and fixing the information acquisition device, also the distance information signal generated by the information obtaining device in a state where the tip of the support portion abuts on the reference plane In addition, the distance between the tip of the support portion and the information acquisition device is calculated as a reference distance, and is generated by the information acquisition device with the tip of the support portion in contact with the surface of the measurement object. Based on the distance information signal, The distance between the information obtaining device and the surface of the measurement object is calculated as a distance measured to calculate the difference between the measured distance and the reference distance, further, calculates an inclination angle of the strut relative to the measurement target surface And a control device having a calculation unit that calculates the thickness of the measurement object by correcting the difference based on the tilt angle .

  In the measurement system according to the present invention, in the above invention, the information acquisition device generates an imaging signal by receiving light and performing photoelectric conversion, and the control device is a distance based on the distance information signal. The image processing unit further includes an image processing unit that generates an image signal and a captured image signal based on the imaging signal, and the image processing unit is configured to generate the distance image based on the distance information signal based on a magnitude setting with respect to a preset setting value. A feature of applying a color to each point of the image based on the signal is provided.

  In the measurement system according to the present invention as set forth in the invention described above, the image processing unit generates a composite image signal by combining the distance image signal and the captured image signal.

Further, the measurement system according to the present invention is the recording apparatus according to the above invention, wherein the thickness of the measurement object calculated by the calculation unit and the distance image signal generated by the image processing unit are recorded in association with each other. Is further provided.

  In the measurement system according to the present invention, in the above invention, an input / output terminal having a display unit capable of communicating with the control device and displaying at least an image based on the distance image signal received from the control device. It is further provided with a feature.

  In the measurement system according to the present invention as set forth in the invention described above, the input / output terminal is provided on the display screen of the display unit, and receives an input of the set value and an operation instruction of the input / output terminal. The apparatus further includes a section.

Further, the control device according to the present invention is based on distance information between the measurement object and a reference plane obtained by emitting light toward the measurement object and receiving return light of the emitted light. A control device that is communicably connected to an information acquisition device that generates a distance information signal and controls the information acquisition device, and includes a support, a thickness management pin provided at a tip of the support, and the thickness A cylindrical member that covers a management pin and is movable back and forth with respect to the support column, and acquires the information in a state in which a tip of a support portion that fixes and supports the information acquisition device is in contact with the reference surface Based on the distance information signal generated by the apparatus, the distance between the tip of the support part and the information acquisition device is calculated to obtain a reference distance, and the tip of the support part is moved to the measurement object. The information acquisition device in contact with the surface Therefore on the basis of the distance information signal generated, calculated by calculating the difference between the measured distance and the reference distance the distance between the information obtaining device and the surface of the measurement object as the measurement distance, Furthermore, it has the calculating part which calculates the thickness of the said measurement object by calculating the inclination angle of the said support | pillar with respect to the said measurement object surface, and correct | amending the said difference based on the said inclination angle .

  According to the present invention, the distance information signal is output based on the distance information between the measurement object obtained by emitting light toward the measurement target surface and receiving the return light of the emitted light and the reference surface. An information acquisition device to be generated, a support portion for fixing and supporting the information acquisition device, and a support portion based on a distance information signal generated by the information acquisition device in a state where the tip of the support portion is in contact with the reference plane The distance between the tip of the information acquisition device and the information acquisition device is calculated as a reference distance, and information is acquired based on a distance information signal generated by the information acquisition device in a state where the tip of the support portion is in contact with the surface of the measurement object And a control device having a calculation unit that calculates a difference between the reference distance and the measurement distance, and calculates a difference between the surface of the measurement object and the surface of the measurement object as a measurement distance. Measuring thickness efficiently and accurately An effect that can be.

FIG. 1 is a schematic diagram showing a schematic configuration of a measurement system according to an embodiment of the present invention. FIG. 2 is a schematic diagram showing the configuration of the tip of the support part of the measurement system according to the embodiment of the present invention. FIG. 3 is a schematic diagram illustrating the configuration of the distal end portion of the support portion of the measurement system according to the embodiment of the present invention. FIG. 4 is a schematic diagram illustrating a configuration of a main part of the measurement system according to the embodiment of the present invention. FIG. 5 is a schematic diagram illustrating a configuration of a main part of the measurement system in the direction of arrow A in FIG. 4. FIG. 6 is a block diagram showing a functional configuration of the measurement system according to the embodiment of the present invention. FIG. 7 is a diagram for explaining a display mode of the input / output terminal of the measurement system according to the embodiment of the present invention. FIG. 8 is a schematic diagram illustrating a display example of the display unit in the input / output terminal of the measurement system according to the embodiment of the present invention. FIG. 9 is a flowchart showing calibration processing by the measurement system according to the embodiment of the present invention. FIG. 10 is a diagram for explaining calibration processing by the measurement system according to the embodiment of the present invention. FIG. 11 is a diagram for explaining calibration processing by the measurement system according to the embodiment of the present invention. FIG. 12 is a diagram for explaining calibration processing by the measurement system according to the embodiment of the present invention. FIG. 13 is a diagram for explaining calibration processing by the measurement system according to the embodiment of the present invention. FIG. 14 is a flowchart showing a thickness measurement process by the measurement system according to the embodiment of the present invention. FIG. 15 is a diagram for explaining a thickness measurement process by the measurement system according to the embodiment of the present invention. FIG. 16 is a diagram for explaining a thickness measurement process by the measurement system according to the embodiment of the present invention. FIG. 17 is a diagram for explaining the thickness measurement processing by the measurement system according to the embodiment of the present invention. FIG. 18 is a diagram for explaining the thickness measurement process by the measurement system according to the embodiment of the present invention. FIG. 19 is a diagram for explaining a display mode of the input / output terminal of the measurement system according to the embodiment of the present invention. FIG. 20 is a schematic diagram illustrating a display example of the display unit in the input / output terminal of the measurement system according to the embodiment of the present invention. FIG. 21 is a schematic diagram illustrating a display example of the display unit in the input / output terminal of the measurement system according to the embodiment of the present invention.

  DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the drawings. In addition, this invention is not limited by the following embodiment. Moreover, in the following description, each figure has shown only the shape, the magnitude | size, and positional relationship so that the content of this invention can be understood, Therefore, this invention was illustrated in each figure. It is not limited to only the shape, size, and positional relationship.

  First, a measurement system according to an embodiment of the present invention will be described. FIG. 1 is a schematic diagram illustrating a schematic configuration of a measurement system according to the present embodiment. A measurement system 1 shown in FIG. 1 is for measuring the thickness of a measurement object provided on a base surface, and includes a support unit 10, a measurement unit 20, a battery 30, a holder 40, Input / output terminal 50.

  The support portion 10 is a tubular support column 11 made of, for example, aluminum, is provided at one end in the longitudinal direction of the support column 11, and is held by a user, and a needle is provided at the other end in the longitudinal direction of the support column 11. And a cylindrical member 14 that is provided at the other end in the longitudinal direction of the column 11 and that can be inserted through the thickness management pin 13 and that can be moved forward and backward with respect to the column 11. And having.

  FIG. 2 is a schematic diagram showing the configuration of the tip of the support part of the measurement system according to the present embodiment, and shows a state where no load is applied to the cylindrical member 14. FIG. 3 is a schematic diagram showing the configuration of the tip of the support part of the measurement system according to the present embodiment, and shows a state in which a load is applied to the cylindrical member 14. The cylindrical member 14 can move forward and backward along the longitudinal direction of the column 11. As the tubular member 14 moves back and forth, the exposure amount of the thickness management pin 13 from the tip of the tubular member 14 changes. The cylindrical member 14 is biased in the direction away from the column 11 along the longitudinal direction of the column 11, and when the external load is not applied, the entire thickness management pin 13 is covered. Maintain state.

  FIG. 4 is a schematic diagram illustrating a configuration of a main part (near the measurement unit 20) of the measurement system according to the present embodiment. FIG. 5 is a schematic diagram illustrating the configuration of the measurement unit in the direction of arrow A in FIG. The measurement unit 20 includes a control device 21, an information acquisition device 22, and a recording device 23.

  The control device 21 is electrically connected to the information acquisition device 22, the recording device 23, and the battery 30 via cables 61, 62, and 63, respectively. The control device 21 and the recording device 23 are mounted and fixed on the information acquisition device 22. The information acquisition device 22 is fixed and supported on the column 11.

  FIG. 6 is a block diagram showing a functional configuration of the measurement system according to the present embodiment. The control device 21 includes a control unit 211, a transmission / reception unit 212, a calculation unit 213, an image processing unit 214, a condition setting unit 215, and a recording unit 216.

  The control unit 211 controls various operations of the information acquisition device 22, the recording device 23, and the input / output terminal 50. The control unit 211 is configured using a CPU (Central Processing Unit) or the like. In addition, the control unit 211 performs control for generating information to be displayed on the input / output terminal 50 and transmitting a signal related to an image to be displayed.

  The transmission / reception unit 212 is an interface connectable to a communication network such as a wireless LAN, and transmits / receives information to / from the outside through the communication network under the control of the control unit 211.

  The calculation unit 213 calculates the distance from the measurement unit 20 to the surface of the measurement object based on the information (distance information signal) received from the information acquisition device 22.

The image processing unit 214 performs predetermined image processing based on the electrical signal including the image information acquired by the information acquisition device 22 to generate a captured image signal displayed by the input / output terminal 50. Further, the image processing unit 214 generates a distance image signal including image information related to the thickness of the measurement target based on the calculation result by the calculation unit 213.
In addition, the image processing unit 214 combines the generated captured image signal and the distance image signal to generate one combined image signal.

  The condition setting unit 215 performs various conditions setting processing in the measurement processing based on the control unit 211 and information input from the outside. Specifically, the condition setting unit 215 sets a display mode on the input / output terminal 50 in addition to setting a reference value for measurement processing and setting a measurement range.

  The recording unit 216 includes a ROM that records various programs and a volatile memory (such as a RAM) that temporarily records information acquired by the control device 21.

  The information acquisition device 22 includes a control unit 221, an emission unit 222a, a light receiving unit 222b, and an image acquisition unit 223.

  The control unit 221 controls various operations of the information acquisition device 22. The control unit 221 is configured using a CPU or the like. Further, the control unit 221 controls the emission unit 222 a, the light receiving unit 222 b, and the image acquisition unit 223 based on the control signal from the control unit 211.

  The emission unit 222 a emits infrared light under the control of the control unit 221.

  Under the control of the control unit 221, the light receiving unit 222b receives infrared light (returned light) reflected by the measurement object among the infrared light emitted by the emission unit 222a. The light receiving unit 222b generates a distance information signal based on the information regarding the received light, and outputs the distance information signal to the control unit 221.

  The image acquisition unit 223 includes an imaging element in which a plurality of pixels that generate an imaging signal by receiving light and performing photoelectric conversion are arranged in a two-dimensional matrix, and outputs the generated imaging signal to the control unit 221. To do. The imaging element is, for example, a CCD (Charge Coupled Device) image sensor or a CMOS (Complementary Metal Oxide Semiconductor) image sensor.

  The recording device 23 detachably holds the recording medium 23a and writes various information output from the control device 21 to the recording medium 23a. The recording medium 23a is realized by a compact flash (registered trademark), an SD memory card (registered trademark), a memory stick (registered trademark), or the like. The recording device 23 may be realized using a semiconductor memory such as a flash memory or a DRAM (Dynamic Random Access Memory).

  The holder 40 detachably holds the input / output terminal 50. Specifically, the holder 40 has a plurality of claws for locking the input / output terminal 50, and holds the outer edge of the input / output terminal 50 by the claws.

  The input / output terminal 50 includes a control unit 51, a transmission / reception unit 52, an input unit 53, and a display unit 54. In this embodiment, the input / output terminal 50 will be described as having a tethering function serving as a router.

  The control unit 51 controls various operations of the input / output terminal 50. The control unit 51 is configured using a CPU or the like. The control unit 51 displays an image based on the control signal received from the control device 21.

  The transmission / reception unit 52 is an interface connectable to a communication network such as a wireless LAN, and transmits / receives information to / from the outside via the communication network under the control of the control unit 51.

  The input unit 53 includes a touch panel that is provided on the display screen of the display unit 54 so as to receive an input of a signal corresponding to the contact position of an object from the outside.

  The display unit 54 is configured using a display panel made of liquid crystal, organic EL (Electro Luminescence), or the like. The display unit 54 displays an image corresponding to image data input via the transmission / reception unit 52 and various types of information.

  FIG. 7 is a schematic diagram illustrating a configuration of the input / output terminal of the measurement system according to the present embodiment, and is a diagram for explaining a display mode on the display unit 54 of the input / output terminal 50. The display unit 54 displays an image subjected to image processing by the image processing unit 214 in a measurement image display area 541 provided on the display screen.

  FIG. 8 is a schematic diagram illustrating a display example of the display unit in the input / output terminal of the measurement system according to the present embodiment, and is a diagram illustrating a captured image 541a corresponding to the captured image signal. In the captured image 541a, the tip of the column 11 is displayed in the vicinity of the approximate center C of the image.

  The display unit 54 displays the input button as an image. As input buttons, for example, as shown in FIG. 7, a calibration instruction input button 542, a condition setting instruction input button 543, a display setting instruction input button 544, and a measurement instruction input button 545 are displayed.

  When an object comes into contact with an area overlapping with the calibration instruction input button 542 on the touch panel (hereinafter, this is referred to as pressing of the input button), the input unit 53 inputs an instruction signal for performing the calibration process. Accept. When the input unit 53 receives an input of an instruction signal for performing the calibration process, the instruction signal is wirelessly transmitted from the input / output terminal 50 to the control device 21.

  When the condition setting instruction input button 543 is pressed, the input unit 53 receives an input of an instruction signal for performing the condition setting process. When the input unit 53 receives an input of an instruction signal for performing the condition setting process, the input unit 53 displays a condition setting input screen on the display unit 54. On the condition setting input screen, for example, a reference value setting image and a measurement range setting image for measurement processing, and an input image for performing numerical input are displayed. The user can input and set conditions on the condition setting input screen. Thereafter, when the input unit 53 receives an input of an instruction signal for performing processing for setting the input condition, the instruction signal is wirelessly transmitted from the input / output terminal 50 to the control device 21.

  When the display setting instruction input button 544 is pressed, the input unit 53 receives an input of an instruction signal for performing display setting processing. When the input unit 53 receives an input of an instruction signal for performing display setting processing, the input unit 53 displays a display setting input image on the display unit 54. In the display setting input image, for example, a selection image to be displayed is displayed among an image according to the image signal, an image according to the distance image signal, and an image according to the composite image signal. When the input unit 53 receives an input of an instruction signal for performing the display setting process, the instruction signal is wirelessly transmitted from the input / output terminal 50 to the control device 21.

  When the measurement instruction input button 545 is pressed, the input unit 53 receives an input of an instruction signal for performing a thickness measurement process described later. When the input unit 53 receives an input of an instruction signal for performing the thickness measurement process, the instruction signal is wirelessly transmitted from the input / output terminal 50 to the control device 21.

  In the measurement system 1 described above, when starting the system, first, the control device 21 and the battery 30 are connected by the cable 663 to start the control device 21. Thereafter, the URL (address) of the control device 21 is input via the input unit 53 of the input / output terminal 50, and the wireless communication with the control device 21 is established to start the operation of the entire system.

  Next, processing related to thickness measurement by the measurement system 1 will be described. When performing thickness measurement, after performing a calibration process as a measurement pre-process, a thickness measurement process is performed on the measurement object. FIG. 9 is a flowchart showing calibration processing by the measurement system according to the present embodiment. 10 and 11 are diagrams for explaining calibration processing by the measurement system according to the present embodiment. The calibration process is performed, for example, when the control device 21 receives an instruction signal output when the calibration instruction input button 542 is pressed.

The user brings the tip of the thickness management pin 13 into contact with a hard plane P ₁ such as a floor surface. At this time, the user preferably holds the column 11 so that the longitudinal direction of the column 11 is substantially perpendicular to the plane P ₁ on which the thickness management pin 13 is brought into contact.

Thereafter, the user, the tip of the thickness of the management pin 13 being in contact with the plane P _1, and presses the calibration instruction input button 542 displayed on the display unit 54 of the input and output terminal 50. When the input unit 53 receives an input of an instruction signal for performing the calibration process, the instruction signal is wirelessly transmitted from the input / output terminal 50 to the control device 21.

  Upon receiving the instruction signal related to the calibration instruction, the control unit 211 outputs a control signal to the information acquisition device 22 and acquires distance information signals from the emission unit 222a and the light receiving unit 222b (step S101).

FIG. 12 is a diagram for explaining calibration processing by the measurement system according to the present embodiment, and is a diagram for explaining processing for determining the tip position of the support portion 10 (tubular member 14). In the light receiving part 222b, there are parts (signal non-acquisition areas S ₁ and S ₂ ) where the light (distance information) from the emitting part 222a cannot be acquired by the support column 11. The signal non-acquisition areas S ₁ and S ₂ correspond to the shadows of the pillars 11 in the image W1, as shown in FIG.

Calculation unit 213 acquires the distance information signal, based on the formation region of the signal non-acquisition area _S 1, _{S 2,} this signal non-acquisition area _S 1, _{S 2} of the center line (straight line _{L 1, L} 2) Is calculated (step S102). Specifically, for example, when the image W1 is viewed as the XY plane, the calculation unit 213 has a center (center point) of the width in the X direction in the formation region of the shadows S ₁ and S ₂ at a predetermined interval along the Y direction. Are respectively calculated, and linear equations are calculated from the set of centers by the method of least squares.

The calculation unit 213 obtains the intersection of the straight lines L ₁ and L ₂ from the calculated equation of the center lines (straight lines L ₁ and L ₂ ) of the signal non-acquisition regions S ₁ and S ₂ , and determines the intersection as the support unit 10 (tubular shape). The tip position R of the member 14) is determined (step S103).

  Thereafter, based on the distance information and the like measured this time, the calculation unit 213 has a parallel relationship between the center axis (camera optical axis) of the image sensor of the image acquisition unit 223 and the center line (longitudinal direction) of the column 11. The angle of view, distortion, and the like of the image sensor are corrected with reference to preset setting values, and the coordinates of the distance from the image sensor, the elevation angle, and the azimuth are set to the actual orthogonal coordinates (X, Y, Z (Step S104). The elevation angle and azimuth angle of each pixel are known angles set in advance and are recorded in the recording unit 216 and the like. Thereby, the actual distance in the Z direction at the desired pixel can be obtained.

FIG. 13 is a diagram for explaining calibration processing by the measurement system according to the present embodiment, and is a diagram for explaining distance information extraction processing. Calculation unit 213, after the conversion process, for example, around the tip position R of the strut 11 which is determined, (corresponding to a pixel corresponding to the straight line _{L 3} of the image W2 as shown in FIG. 13) X-direction to 160 pixels, Y direction to extract the 120 pixels (corresponding to the pixel corresponding to the straight line _{L 4)} partial distance information (step S105). The extracted distance information includes the actual Z-direction distance corresponding to each pixel. In the extraction process, distance information outside the set distance range is excluded from the extraction target.

Calculation unit 213, based on the distance of the actual size of the Z direction included in the distance information extracted in each pixel corresponding to the straight line L _3, calculates the equation of a straight line by the least square method. After calculating the straight line equation, the calculation unit 213 reads the distance at the pixel corresponding to the reference position from the equation, thereby obtaining the information acquisition device 22 (light receiving surface) based on the distance information extracted in the X direction (straight line L ₃ ). To the tip position R of the support portion 10 (tubular member 14).

Calculation unit 213, like the flow of calculating the linear equation in the X direction as described above, based on the distance of the actual size of the Z direction included in the distance information extracted in each pixel corresponding to the straight line L _4, Y-direction Calculate the linear equation at. The calculation unit 213 calculates a straight line equation, and then reads the distance at the pixel corresponding to the reference position from the equation, thereby the support unit 10 from the information acquisition device 22 based on the distance information extracted in the Y direction (straight line L ₄ ). The distance to the tip position R is obtained (step S106).

The calculation unit 213 obtains an average value of the distances from the information acquisition device 22 acquired in the X and Y directions to the tip position R of the support unit 10, and calculates the average value from the information acquisition device 22 to the tip position R of the column 11. Determine as the distance to. The calculation unit 213 outputs the determined distance from the information acquisition device 22 to the distal end position R of the support unit 10 (cylindrical member 14) as a reference distance d ₁ (see FIG. 11) by calibration to the control unit 211. The control unit 211 records the output reference distance on the recording medium 23a or the recording unit 216, and ends the calibration process in the calibration mode (step S107).

  After the calibration process described above, the user performs a thickness measurement process for the measurement object provided on the base surface. FIG. 14 is a flowchart showing a thickness measurement process by the measurement system according to the present embodiment. FIG. 15 is a diagram for explaining a thickness measurement process by the measurement system according to the present embodiment.

In thickness measurement process, first by the user, the tip of the thickness of the management pin 13, until it abuts against the base surface P ₂ of the surface of the measurement object B, prick measurement object B. At this time, the tubular member 14, with the puncture thickness administrative pin 13, on the surface P ₃ of the measurement object B while abutting, housed inside the support column 11.

Thereafter, the user being in contact with the tip of the thickness of the management pin 13 on the base surface P _2, presses the measurement instruction input button 545 displayed on the display unit 54 of the input and output terminal 50. When the input unit 53 receives an input of an instruction signal for performing the thickness measurement process, the instruction signal is wirelessly transmitted from the input / output terminal 50 to the control device 21.

  When the control unit 211 receives an instruction signal related to a measurement instruction from the input / output terminal 50, the control unit 211 instructs the arithmetic unit 213 to perform a thickness measurement process.

  When receiving the measurement instruction, the calculation unit 213 outputs a control signal to the information acquisition device 22 and acquires distance information signals from the emission unit 222a and the light receiving unit 222b, similarly to the calibration process described above (step S201). .

Calculation unit 213 acquires the distance information signal, based on the signal non-acquisition area S _1, S ₂ of forming regions, calculates the equation of the signal non-acquisition area S _1, S ₂ of the center line (straight line) (Step S202).

Calculation unit 213 obtains the calculated signal unobtained area _S 1, the intersection of the _{S 2} straight lines, to determine the intersection point as the end position R of the support portion 10 (cylindrical member 14) (step S203).

  Thereafter, based on the distance information measured this time, the calculation unit 213 has a parallel relationship between the central axis (camera optical axis) of the image sensor of the image acquisition unit 223 and the central axis (longitudinal direction) of the column 11. The angle of view, distortion, and the like of the image sensor are corrected with reference to preset setting values, and the coordinates of the distance from the image sensor, the elevation angle, and the azimuth are set to the actual orthogonal coordinates (X, Y, Z (Step S204). Thereby, the actual distance in the Z direction at the desired pixel can be obtained.

FIG. 16 is a diagram for explaining thickness measurement processing by the measurement system according to the present embodiment. The computing unit 213 extracts a distance from the information acquisition device 22 (plane P ₀ ) in the Z direction to the surface P ₃ of the measurement object (distance in the Z direction, for example, the measurement point E ₁ ) for each pixel, and these distances. Is determined as the measurement distance d ₂ from the information acquisition device 22 to the surface P ₃ of the measurement object B.

Calculation unit 213 calculates the measurement distance _d After determining _2, difference distance _{d 3} is a difference between the reference distance _{d 1} and the measurement distance _{d 2 (d} 1 -d ₂₎ (step S205). Difference distance _{d 3} corresponds to the distance from the surface _{P 3} of the measurement object B to the underlying surface _{P 2} (see FIG. 15). That is, the difference distance d ₃ corresponds to the thickness of the measurement object B. By calculating section 213 calculates the difference distance d _3, it is possible to measure the thickness of the measurement object B. The arithmetic unit 213 outputs a difference distance _{d 3} calculated in the control unit 211. Control unit 211, the recording device 23, and an image signal subjected to this thickness measurement process, in association with the difference distance d ₃ by the calculation unit 213 has calculated to perform processing to be recorded on the recording medium 23a.

Here, when the measurement process is performed in a state where the longitudinal direction of the support column 11 is inclined with respect to the surface P ₃ (or the base surface P ₂ ) of the measurement object, the calculation unit 213 calculates the inclined angle. Process to correct the thickness.

Figure 17 is a diagram illustrating a thickness measuring process by such measurement system to the embodiment of the present invention, with the thickness administrative pin 13 abuts against the underlying surface P _2, the edge of the strut 11 is measured it is a diagram showing a case where the surface P ₃ of the object is in contact with. As illustrated in FIG. 17, when the measurement process is performed in a state where the longitudinal direction (center axis N) of the support column 11 is inclined with respect to the surface P ₃ (or the base surface P ₂ ) of the measurement target B, the calculation unit 213 is performed. Calculates the tilted angle and corrects it to the correct thickness.

First, the calculation unit 213 is a surface located between the straight line L ₃ and the straight line L ₄ from the equation of the straight line L ₃ in the X direction and the equation of the straight line L _{4 in} the Y direction obtained in the thickness measurement process. An equation of the calculation plane _Pc is calculated, and an inclination angle between the calculation plane _Pc and the optical axis (center axis N) of the camera is obtained based on this equation. In the present embodiment, the base surface P ₂ and calculating surface P ₃ is a substantially parallel, and assuming that the surface P ₃ of the measurement object B and calculating surface P _c substantially coincides, In the following description, it is assumed that the angle θ ₁ formed by the lower ground P ₂ and the central axis N corresponds to the inclination angle.

The calculator 213 calculates the angle θ ₂ from the obtained angle θ ₁ . The angle θ ₂ is an inclination angle of the central axis with respect to a direction (thickness direction) perpendicular to the base surface P ₂ and the calculation surface P _c , and is calculated by θ ₂ = 90 (degrees) −θ ₁ . The angle θ ₂ corresponds to an angle formed between the edge surface of the support 11 and the surface P ₃ of the measurement target. Here, if the diameter of the column 11 (the length in the direction orthogonal to the central axis N) is T, the radius t of the column 11 is t = T / 2. The calculation unit 213 calculates −distance d ₂ ′ by d ₂ ′ = tsin θ ₂ , where d ₂ ′ is the distance from the end surface of the support 11 to the surface P ₃ in the thickness management pin 13.

After calculating the distance d ₂ ′, the calculation unit 213 calculates a difference distance d ₃ by obtaining a difference (d ₁ −d ₂ ′) between the reference distance d ₁ and the distance d ₂ ′. The computing unit 213 calculates a correction distance d ₃ ′ by d ₃ ′ = d ₃ cos θ ₁ based on the difference distance d ₃ and the angle θ ₁ . The correction distance d ₃ ′ corresponds to the thickness of the measurement object B. Accordingly, even when the longitudinal support bar 11 is subjected to measurement processing in a state of being inclined relative to the surface P ₃ of the measurement object _(or the underlying surface P _2), in the direction perpendicular to the underlying surface P ₂ The thickness of the measurement object B can be measured.

Figure 18 is a diagram illustrating a thickness measuring process by such measurement system to the embodiment of the present invention, while the thickness of the management pin 13 abuts against the underlying surface P _2, the edge of the strut 11 is measured the surface P ₃ of the object is a diagram showing a case where not in contact.

First, the calculation unit 213 calculates the equation of the calculation surface P _c described above, and based on this equation, calculates the inclination angle (angle θ ₁ ) between the calculation surface P _c and the optical axis (center axis N) of the camera. Ask.

In addition, the calculation unit 213 calculates a difference distance d ₃ by obtaining a difference (d ₁ −d ₂ ) between the reference distance d ₁ and the distance d ₂ from the measurement distance d ₂ measured in the thickness measurement process. Thereafter, the calculation unit 213 calculates a correction distance d ₃ ′ by d ₃ ′ = d ₃ cos θ ₁ based on the difference distance d ₃ and the angle θ ₁ . Even in the case shown in FIG. 18, by measuring the correction distance d ₃ ′ as the thickness of the measurement target B, the thickness of the measurement target B in the direction orthogonal to the base surface P ₂ can be measured. it can.

Thereafter, the calculation unit 213 calculates an evaluation value based on the difference distance d ₃ (or the correction distance d ₃ ′) calculated in step S205. When the evaluation value is calculated, the image processing unit 214 generates a distance image signal and a composite image signal related to the thickness in the light receiving region based on the evaluation value (step S207), and ends the thickness measurement process. .

The image processing unit 214 generates a distance image signal by adding color information according to the magnitude relationship of the difference distance d ₃ with respect to the set thickness based on the evaluation value calculated by the calculation unit 213. Thereby, an image capable of visually recognizing the measured thickness can be displayed on the display unit 54.

Specifically, the calculation unit 213 calculates the evaluation value D from the following formula (1), where d ₄ is the set reference thickness and α is the absolute value of the thickness measurement range.
D = [(d ₄ −d ₃ ) / α] × 255 (1)
The image processing unit 214 assigns a color according to the evaluation value D (numerical value) obtained by Expression (1).

  For example, the image processing unit 214 gives white when the evaluation value D is D = 0. The image processing unit 214 gives blue when the evaluation value D is −255 ≦ D <0, and gives red when the evaluation value D is 0 <D ≦ 255. At this time, the shading (gradation) of the color is also changed according to the numerical value. Note that the image processing unit 214 does not add a color when the evaluation value D is D <−255, 255 <D.

  FIG. 19 is a diagram illustrating a display mode of the input / output terminal of the measurement system according to the present embodiment, and is a diagram illustrating a distance information image 541b corresponding to the distance information signal.

  In the distance information image 541b, a process of giving a color having a different color or darkness according to the evaluation value D is performed, and a color corresponding to the distance information is displayed. Specifically, based on the acquired distance information signal, a color based on the evaluation value D calculated by the calculation unit 213 according to each pixel (the pixel from which the distance information is extracted) is given, so that the measurement object The relationship of the thickness of each place in is expressed.

  Further, when the value is larger than the set value (reference thickness), the image processing is performed so as to display in red, and when the value is smaller than the set value (reference thickness), the image processing is performed so as to display in blue. Thus, the magnitude relationship with respect to the set reference thickness is expressed. For example, in FIG. 17, the region Er (represented only by gradation) located on the right in the drawing is displayed in red, and the region Eb (represented by gradation and hatching) located on the left in the drawing is displayed in blue.

  Here, coordinates are assigned to each pixel in the light receiving unit 222b, and the distance information image 541b including the color information described above is generated corresponding to the coordinates of each pixel. The coordinates given to each pixel of the light receiving unit 222b are associated with the coordinates given to each pixel in the image acquisition unit 223.

  In the distance information image 541b, in the signal non-acquisition region generated by the support 11, the distance information signal cannot be acquired, and thus no color information is given.

  FIG. 20 is a diagram illustrating a display mode of the input / output terminal of the measurement system according to the present embodiment, and is a diagram illustrating a synthesized image 541c obtained by synthesizing the distance information signal and the captured image signal. The composite image 541c corresponding to the composite image signal is formed by pasting the above-described captured image 541a and the distance information image 541b in accordance with the associated coordinates.

  As described above, the image processing unit 214 assigns color information based on the evaluation value D, thereby visually confirming the magnitude relation of the thickness of each location of the measurement object based on the presence / absence of color and the change in color shade. can do.

  Next, display of measurement results obtained by the thickness measurement process will be described. FIG. 21 is a schematic diagram illustrating a display example of the display unit in the input / output terminal of the measurement system according to the present embodiment, and is a diagram illustrating a display mode in the display unit 54 of the input / output terminal 50. In the display unit 54 shown in FIG. 21, an image corresponding to the distance image signal generated by the image processing unit 214 is displayed in the measurement image display region 541 described above.

  In the display unit 54 shown in FIG. 21, whether the image displayed in the measurement image display area 541 is an image corresponding to the captured image signal, an image corresponding to the distance image signal, or an image corresponding to the composite image signal. Is displayed (the image corresponding to the distance image signal in FIG. 21), and the thickness of the measurement target (for example, the thickness of the tip position) is displayed as a measurement result. Further, the image to be displayed can be changed by pressing the ◯ mark (input button) corresponding to each image signal.

According to the above-described embodiment, the calculation unit 213 uses the signal non-acquisition regions S ₁ and S ₂ (shadows of the support column 11) based on the distance information signal to determine the support unit 10 (tubular member 14). A tip position is calculated, a distance from the measurement unit 20 to the surface of the measurement object is obtained based on the calculated distance information in the vicinity of the tip position, and a difference between the obtained reference distance and the measured distance is calculated. Since the thickness of the measurement object is measured by the method, the thickness of the measurement object from the reference plane can be measured efficiently and accurately.

  Further, according to the present embodiment, based on the measured thickness, a distance image signal that can express the magnitude relationship with respect to the set thickness by color information is generated, and the distance image signal corresponding to the distance image signal is generated. Since the image is displayed, the measurement result can be visually expressed and the result can be easily confirmed. Thereby, the confirmation mistake of a measurement result can be prevented.

  Further, according to the present embodiment, the image based on the acquired image signal and distance information signal, and the measurement result (thickness) calculated by the calculation unit 213 are displayed and recorded on the recording medium 23a or the like. Therefore, in addition to visual confirmation, the measured numerical value can be confirmed. In addition, by automatically creating a measurement record or the like based on these data, post-processing after the thickness measurement process is not necessary, and the processing time for overall thickness measurement can be shortened.

  In the present embodiment, the input / output terminal 50 has been described as displaying an image and inputting an instruction signal. However, the monitor for displaying the image and the input unit for receiving the input of the instruction signal have different configurations. It may be provided as.

  In the present embodiment, the input / output terminal 50 has been described as having a tethering function serving as a router. However, the input / output terminal 50 may not have a tethering function. When the input / output terminal 50 does not have a tethering function, information may be transmitted / received to / from the outside via a predetermined router.

  Further, in the present embodiment, it has been described that the thickness measurement process is performed after the calibration process is performed as the measurement pre-processing when the thickness measurement is performed. However, the calibration is performed every time the thickness measurement process is performed. Processing may be performed, or calibration processing is automatically performed at system startup, and then only thickness measurement processing is performed multiple times during startup using the reference distance obtained by calibration processing at startup. You may do it.

  Moreover, the cylindrical member 14 concerning this Embodiment may have a locking mechanism which locks the advance / retreat operation | movement with respect to the support | pillar 11. FIG.

  As described above, the measurement system and the control device according to the above-described embodiment are useful for efficiently and accurately measuring the thickness of the measurement object from the reference surface, for example.

DESCRIPTION OF SYMBOLS 1 Measuring system 10 Support part 11 Support | pillar 12 Gripping part 13 Thickness management pin 14 Cylindrical member 20 Measuring part 21 Control apparatus 22 Information acquisition apparatus 23 Recording apparatus 23a Recording medium 30 Battery 40 Holder 50 Input / output terminal 51, 211, 221 Control unit 52, 212 Transmission / reception unit 53 Input unit 54 Display unit 61-63 Cable 222a Emitting unit 222b Light receiving unit 223 Image acquisition unit 213 Calculation unit 214 Image processing unit 215 Condition setting unit 216 Recording unit 542 Calibration instruction input button 543 Condition setting Instruction input button 544 Display setting instruction input button 545 Measurement instruction input button

Claims (7)

An information acquisition device that emits light toward a measurement target surface and generates a distance information signal based on distance information between the measurement target obtained by receiving return light of the emitted light and a reference surface; ,
A column, a thickness management pin provided at the tip of the column, and a cylindrical member that covers the thickness management pin and is movable forward and backward with respect to the column; A supporting part to support;
Based on the distance information signal generated by the information acquisition device in a state where the tip of the support portion is in contact with the reference surface, the distance between the tip of the support portion and the information acquisition device is calculated as a reference distance. And, based on the distance information signal generated by the information acquisition device in a state where the tip of the support part is in contact with the surface of the measurement target, the information acquisition device and the surface of the measurement target the distance between the calculated as the distance measured to calculate the difference between the measured distance and the reference distance, further, calculates an inclination angle of the strut relative to the measurement target surface, the difference based on the tilt angle A control device having a calculation unit for calculating the thickness of the measurement object by correcting ;
A measurement system characterized by comprising: The information acquisition device generates an imaging signal by receiving light and performing photoelectric conversion,
The control device further includes an image processing unit that generates a distance image signal based on the distance information signal and a captured image signal based on the imaging signal, respectively.
The image processing unit performs processing for assigning a color to each point of an image based on the distance image signal based on the distance information signal based on a magnitude relationship with a preset setting value. The measurement system described in 1.   The measurement system according to claim 2, wherein the image processing unit generates a combined image signal by combining the distance image signal and the captured image signal. The recording apparatus according to claim 1, further comprising: a recording device that records the thickness of the measurement object calculated by the calculation unit and the distance image signal generated by the image processing unit in association with each other. The measurement system according to any one of the above.   The input / output terminal further comprising a display unit capable of communicating with the control device and performing at least an image display based on the distance image signal received from the control device. The measurement system as described in one.   The input / output terminal is further provided on a display screen of the display unit, and further includes an input unit that receives an input of the setting value and an operation instruction of the input / output terminal. Measurement system. An information acquisition device that emits light toward a measurement object and generates a distance information signal based on distance information between the measurement object and a reference plane obtained by receiving return light of the emitted light A control device that is communicably connected to and controls the information acquisition device,
A column, a thickness management pin provided at the tip of the column, and a cylindrical member that covers the thickness management pin and is movable forward and backward with respect to the column; Based on the distance information signal generated by the information acquisition device in a state where the tip of the support portion to be supported is in contact with the reference plane, the distance between the tip of the support portion and the information acquisition device is calculated. And obtaining the reference distance, and based on the distance information signal generated by the information acquisition device in a state where the tip of the support part is in contact with the surface of the measurement object, the information acquisition device and the measurement A distance between the surface of the object is calculated as a measurement distance, a difference between the reference distance and the measurement distance is calculated, and an inclination angle of the support column with respect to the measurement target surface is calculated. Correct the difference based on Control apparatus characterized by comprising a calculator for calculating the thickness of the measurement object by.