JP6040920B2 - Electron beam irradiation apparatus and electron beam irradiation method - Google Patents

Electron beam irradiation apparatus and electron beam irradiation method Download PDF

Info

Publication number
JP6040920B2
JP6040920B2 JP2013242958A JP2013242958A JP6040920B2 JP 6040920 B2 JP6040920 B2 JP 6040920B2 JP 2013242958 A JP2013242958 A JP 2013242958A JP 2013242958 A JP2013242958 A JP 2013242958A JP 6040920 B2 JP6040920 B2 JP 6040920B2
Authority
JP
Japan
Prior art keywords
electron
electron beam
guns
scanning
electron gun
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2013242958A
Other languages
Japanese (ja)
Other versions
JP2015101758A (en
Inventor
泰成 古賀
泰成 古賀
赤木 功
功 赤木
重宏 ▲高▼城
重宏 ▲高▼城
健嗣 松田
健嗣 松田
順一 齋木
順一 齋木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
JFE Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JFE Steel Corp filed Critical JFE Steel Corp
Priority to JP2013242958A priority Critical patent/JP6040920B2/en
Publication of JP2015101758A publication Critical patent/JP2015101758A/en
Application granted granted Critical
Publication of JP6040920B2 publication Critical patent/JP6040920B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Manufacturing Of Steel Electrode Plates (AREA)

Description

本発明は、金属ストリップに電子ビームを照射する電子ビーム照射装置および電子ビーム照射方法に関するものである。   The present invention relates to an electron beam irradiation apparatus and an electron beam irradiation method for irradiating a metal strip with an electron beam.

従来から、金属ストリップに電子ビームを連続的に照射して金属ストリップの特性を改善する技術が知られている。例えば、特許文献1または特許文献2に開示された従来技術では、所定の表面処理が行われた金属ストリップの表面に対して、その圧延方向を横切る向きに電子ビームを照射し、これにより、この金属ストリップの鉄損を低減している。以下、金属ストリップの表面に電子ビームを連続的に照射することを「電子ビーム走査」と適宜いう。すなわち、金属ストリップの表面に対して所定方向に連続的に電子ビームを照射することは、金属ストリップの表面に対して所定方向に電子ビームを走査することを意味する。   2. Description of the Related Art Conventionally, a technique for improving characteristics of a metal strip by continuously irradiating the metal strip with an electron beam is known. For example, in the prior art disclosed in Patent Document 1 or Patent Document 2, the surface of a metal strip that has been subjected to a predetermined surface treatment is irradiated with an electron beam in a direction transverse to the rolling direction. The iron loss of the metal strip is reduced. Hereinafter, continuously irradiating the surface of the metal strip with an electron beam is appropriately referred to as “electron beam scanning”. That is, continuously irradiating the surface of the metal strip with an electron beam in a predetermined direction means scanning the surface of the metal strip with an electron beam in a predetermined direction.

一般に、電子ビームは、フィラメント、集束コイル、および偏向コイル等を備えた電子銃によって出力される。電子銃は、フィラメントから電子ビームを放出し、放出した電子ビームの径を集束コイルによって絞り、この集束後の電子ビームの進行方向を偏向コイルによって変える。電子銃は、金属ストリップに対して電子ビームを偏向しつつ照射し、これにより、金属ストリップの表面に電子ビームを走査する。なお、このような電子銃には、例えば、タングステン製のリボン状フィラメントを備えたものがある(特許文献3参照)。また、金属ストリップの幅を等分する走査幅に設定された複数の電子銃をこの金属ストリップの長手方向を斜めに横切る斜線上に配設し、これら複数の電子銃により、走行する金属ストリップの幅方向に連続して電子ビームの走査を行う電子ビーム照射装置がある(特許文献4参照)。   In general, an electron beam is output by an electron gun including a filament, a focusing coil, a deflection coil, and the like. The electron gun emits an electron beam from a filament, the diameter of the emitted electron beam is reduced by a focusing coil, and the traveling direction of the focused electron beam is changed by a deflection coil. The electron gun irradiates the metal strip while deflecting the electron beam, thereby scanning the surface of the metal strip with the electron beam. Such an electron gun includes, for example, a tungsten ribbon filament (see Patent Document 3). Also, a plurality of electron guns set to a scanning width that equally divides the width of the metal strip are arranged on diagonal lines that obliquely cross the longitudinal direction of the metal strip, and the plurality of electron guns are used to There is an electron beam irradiation apparatus that continuously scans an electron beam in the width direction (see Patent Document 4).

特開昭63−96218号公報JP-A-63-96218 特開昭63−186826号公報JP-A 63-186826 特開平6−2042号公報Japanese Patent Laid-Open No. 6-2042 特開平5−209215号公報Japanese Patent Laid-Open No. 5-209215

一方、上述したような電子銃には電子ビームを照射可能な寿命があり、この電子銃の動作寿命は、フィラメント等の部品の寿命に応じて決まる。すなわち、順次搬送される金属ストリップの表面に電子銃によって電子ビームを順次照射(走査)する操業期間中に、フィラメント切れ等の部品の故障に起因して、予期せず電子銃が電子ビームを照射不能になる可能性がある。この場合、上述した従来技術では、たとえ特許文献4に記載のように複数の電子銃を用いても、切れたフィラメント等の故障部品を交換して照射不能な電子銃を補修しなければ、金属ストリップの特性改善に好適な電子ビームの照射処理を継続することはできない。さらには、照射不能な電子銃を補修するために、電子ビームの照射処理の操業を急遽停止せざるを得ない。この結果、電子ビームの照射処理を行う操業ラインを、定期修理、点検等の予定されたメンテナンス期間を除く予定外の期間に停止する事態が起こり、これに起因して、金属ストリップ製品の生産効率の低下を招来するという問題がある。   On the other hand, the electron gun as described above has a life that can be irradiated with an electron beam, and the operation life of the electron gun is determined according to the life of a component such as a filament. That is, the electron gun unexpectedly irradiates the electron beam due to a failure of parts such as filament breakage during the operation period in which the electron gun sequentially irradiates (scans) the electron beam onto the surface of the metal strip that is sequentially conveyed. May become impossible. In this case, in the above-described prior art, even if a plurality of electron guns are used as described in Patent Document 4, if a faulty part such as a broken filament is replaced to repair an unirradiated electron gun, An electron beam irradiation process suitable for improving the properties of the strip cannot be continued. Furthermore, in order to repair an electron gun that cannot be irradiated, the operation of the electron beam irradiation process must be stopped suddenly. As a result, the operation line that performs the electron beam irradiation process stops during an unscheduled period excluding scheduled maintenance periods such as periodic repairs and inspections, resulting in the production efficiency of metal strip products. There is a problem of inviting a decline.

本発明は、上記の事情に鑑みてなされたものであって、金属ストリップ製品の生産効率を損なうことなく、金属ストリップの特性改善に好適な電子ビームの照射処理の操業を安定して行うことが可能な電子ビーム照射装置および電子ビーム照射方法を提供することを目的とする。   The present invention has been made in view of the above circumstances, and it is possible to stably perform an electron beam irradiation process suitable for improving the properties of a metal strip without impairing the production efficiency of the metal strip product. An object is to provide an electron beam irradiation apparatus and an electron beam irradiation method.

上述した課題を解決し、目的を達成するために、本発明にかかる電子ビーム照射装置は、順次搬送される金属ストリップの表面に対して電子ビームを前記金属ストリップの材幅方向に連続的に照射する電子ビーム走査を行う電子ビーム照射装置において、前記金属ストリップの表面に照射する電子ビームの走査可能幅の1/2以下となる間隔をもって各々隣り合い、且つ前記材幅方向に等間隔に配置される複数の電子銃と、前記金属ストリップの表面に対する前記電子ビーム走査を前記材幅方向に分担して行うように前記複数の電子銃を制御し、前記複数の電子銃の中に電子ビームを照射不能な電子銃がある場合、前記複数の電子銃のうち、前記照射不能な電子銃と隣り合う正常な電子銃の電子ビームの走査幅を、前記照射不能な電子銃の電子ビームの走査範囲全域に拡大し、前記照射不能な電子銃を除く残りの電子銃に、前記金属ストリップの表面に対する前記電子ビーム走査を前記材幅方向に分担して行わせる制御部と、を備えたことを特徴とする。   In order to solve the above-described problems and achieve the object, an electron beam irradiation apparatus according to the present invention continuously irradiates the surface of a metal strip that is sequentially conveyed in the width direction of the metal strip. In the electron beam irradiating apparatus for performing the electron beam scanning, the metal strips are arranged adjacent to each other with an interval of ½ or less of the scannable width of the electron beam irradiated on the surface of the metal strip and at equal intervals in the material width direction. A plurality of electron guns, and the plurality of electron guns are controlled so that the electron beam scanning with respect to the surface of the metal strip is performed in the material width direction, and an electron beam is irradiated into the plurality of electron guns When there is an impossible electron gun, the electron beam scanning width of a normal electron gun adjacent to the non-irradiable electron gun among the plurality of electron guns is set to the electron gun's non-irradiable electron gun. A control unit that expands the entire scanning range of the beam and causes the remaining electron guns other than the unirradiable electron gun to share the electron beam scanning with respect to the surface of the metal strip in the material width direction. It is characterized by that.

また、本発明にかかる電子ビーム照射装置は、上記の発明において、前記制御部は、前記照射不能な電子銃と前記材幅方向の両側に隣り合う双方の正常な電子銃の各電子ビームの走査幅を、前記照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように拡大することを特徴とする。   In the electron beam irradiation apparatus according to the present invention, in the above invention, the control unit scans each electron beam of the electron gun that cannot be irradiated and both normal electron guns adjacent to both sides in the material width direction. The width is enlarged so as to cooperatively supplement the entire scanning range of the electron beam of the non-irradiable electron gun.

また、本発明にかかる電子ビーム照射装置は、上記の発明において、前記照射不能な電子銃が発生した旨を報知する報知部をさらに備え、前記制御部は、前記複数の電子銃の中から前記照射不能な電子銃を特定可能な特定情報を報知するように前記報知部を制御することを特徴とする。   The electron beam irradiation apparatus according to the present invention further includes a notifying unit for notifying that the non-irradiable electron gun is generated in the above invention, and the control unit is configured to select the electron gun from the plurality of electron guns. The notification unit is controlled to notify specific information that can specify an electron gun that cannot be irradiated.

また、本発明にかかる電子ビーム照射方法は、順次搬送される金属ストリップの表面に照射する電子ビームの走査可能幅の1/2以下となる間隔をもって各々隣り合い且つ前記金属ストリップの材幅方向に等間隔に配置した複数の電子銃により、前記金属ストリップの表面に対して電子ビームを前記材幅方向に連続的に照射する電子ビーム走査を、前記材幅方向に分担して行う電子ビーム照射ステップと、前記複数の電子銃の中に電子ビームを照射不能な電子銃がある場合、前記複数の電子銃のうち、前記照射不能な電子銃と隣り合う正常な電子銃の電子ビームの走査幅を、前記照射不能な電子銃の電子ビームの走査範囲全域に拡大する走査幅拡大ステップと、を含み、前記電子ビーム照射ステップは、前記照射不能な電子銃がある場合、前記複数の電子銃のうちの前記照射不能な電子銃を除く残りの電子銃により、前記金属ストリップの表面に対する前記電子ビーム走査を前記材幅方向に分担して行うことを特徴とする。   Also, the electron beam irradiation method according to the present invention is arranged adjacent to each other and in the material width direction of the metal strip with an interval of 1/2 or less of the scannable width of the electron beam irradiated onto the surface of the metal strip that is sequentially conveyed. An electron beam irradiation step in which electron beam scanning for continuously irradiating the surface of the metal strip with an electron beam in the material width direction is performed in the material width direction by a plurality of electron guns arranged at equal intervals. And when there is an electron gun that cannot irradiate an electron beam among the plurality of electron guns, the scanning width of an electron beam of a normal electron gun adjacent to the non-irradiable electron gun among the plurality of electron guns is A scanning width expanding step for expanding the entire scanning range of the electron beam of the non-irradiable electron gun, and the electron beam irradiation step includes The rest of the electron gun other than the irradiation non electron gun of the plurality of electron guns, and performing by sharing the electron beam scanning of the surface of the metal strip to the material width direction.

また、本発明にかかる電子ビーム照射方法は、上記の発明において、前記走査幅拡大ステップは、前記照射不能な電子銃と前記材幅方向の両側に隣り合う双方の正常な電子銃の各電子ビームの走査幅を、前記照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように拡大することを特徴とする。   Further, in the electron beam irradiation method according to the present invention, in the above invention, the scanning width expansion step includes the electron beams of the electron gun that cannot be irradiated and the normal electron guns adjacent to both sides in the material width direction. The scanning width is expanded so as to cooperatively supplement the entire scanning range of the electron beam of the non-irradiable electron gun.

また、本発明にかかる電子ビーム照射方法は、上記の発明において、前記複数の電子銃の中から前記照射不能な電子銃を特定可能な特定情報を報知して、前記照射不能な電子銃が発生した旨を報知する報知ステップをさらに含むことを特徴とする。   Further, in the electron beam irradiation method according to the present invention, in the above invention, the specific information that can identify the non-irradiable electron gun among the plurality of electron guns is notified, and the non-irradiable electron gun is generated. It is further characterized by further including a notifying step for notifying that it has been performed.

本発明によれば、金属ストリップ製品の生産効率を損なうことなく、金属ストリップの特性改善に好適な電子ビームの照射処理の操業を安定して行うことができるという効果を奏する。   According to the present invention, it is possible to stably carry out an electron beam irradiation process suitable for improving the properties of a metal strip without impairing the production efficiency of the metal strip product.

図1は、本発明の実施の形態にかかる電子ビーム照射装置の一構成例を示す図である。FIG. 1 is a diagram showing a configuration example of an electron beam irradiation apparatus according to an embodiment of the present invention. 図2は、本実施の形態における複数の電子銃の配置構成例を示す図である。FIG. 2 is a diagram illustrating an arrangement configuration example of a plurality of electron guns in the present embodiment. 図3は、本発明の実施の形態にかかる電子ビーム照射方法の一例を示すフローチャートである。FIG. 3 is a flowchart showing an example of the electron beam irradiation method according to the embodiment of the present invention. 図4は、本発明による電子ビームの照射処理の一具体例を説明するための図である。FIG. 4 is a diagram for explaining a specific example of the electron beam irradiation processing according to the present invention. 図5は、本発明による電子ビームの照射処理の別の具体例を説明するための図である。FIG. 5 is a diagram for explaining another specific example of the electron beam irradiation processing according to the present invention.

以下に、添付図面を参照して、本発明にかかる電子ビーム照射装置および電子ビーム照射方法の好適な実施の形態について詳細に説明する。なお、以下では、処理対象の金属ストリップの一例として鋼帯を示し、8つの電子銃を備えた電子ビーム照射装置を例示して本発明を説明するが、本実施の形態により、本発明が限定されるものではない。また、各図面において、同一構成部分には同一符号を付している。   Exemplary embodiments of an electron beam irradiation apparatus and an electron beam irradiation method according to the present invention will be explained below in detail with reference to the accompanying drawings. In the following, the present invention will be described by illustrating a steel strip as an example of a metal strip to be processed and an electron beam irradiation apparatus including eight electron guns. However, the present invention is limited by this embodiment. Is not to be done. Moreover, in each drawing, the same code | symbol is attached | subjected to the same component.

(電子ビーム照射装置)
まず、本発明の実施の形態にかかる電子ビーム照射装置の構成について説明する。図1は、本発明の実施の形態にかかる電子ビーム照射装置の一構成例を示す図である。図1には、上方(処理対象の鋼帯の厚さ方向)から見た電子ビーム照射装置の要部が模式的に図示されている。
(Electron beam irradiation device)
First, the structure of the electron beam irradiation apparatus concerning embodiment of this invention is demonstrated. FIG. 1 is a diagram showing a configuration example of an electron beam irradiation apparatus according to an embodiment of the present invention. FIG. 1 schematically shows the main part of the electron beam irradiation apparatus viewed from above (in the thickness direction of the steel strip to be processed).

図1に示すように、本実施の形態にかかる電子ビーム照射装置1は、電子ビームの照射に好適な真空環境を整える真空槽2と、処理対象の鋼帯8に対する電子ビーム走査を行う複数(本実施の形態においては8つ)の電子銃3a〜3hと、電子ビームの照射処理の操業に有用な情報を報知する報知部5と、電子銃3a〜3hおよび報知部5を各々制御する制御部6とを備える。   As shown in FIG. 1, an electron beam irradiation apparatus 1 according to this embodiment includes a vacuum chamber 2 for preparing a vacuum environment suitable for electron beam irradiation, and a plurality (for performing electron beam scanning on a steel strip 8 to be processed. In this embodiment, eight) the electron guns 3a to 3h, the notifying unit 5 for notifying information useful for the operation of the electron beam irradiation process, and the control for controlling the electron guns 3a to 3h and the notifying unit 5, respectively. Part 6.

真空槽2は、排気口等の真空排気系(図示せず)を有し、鋼帯8に対する電子ビームの照射に好適な真空室を形成する。また、真空槽2は、入側開口部および出側開口部(双方とも図示せず)を有する。真空槽2は、図1に示す搬送方向に向かって順次搬送される鋼帯8を入側開口部から受け入れる。電子銃3a〜3hによる電子ビームの照射処理が鋼帯8の表面に施された後、真空槽2は、この鋼帯8を、上記搬送方向に向かって出側開口部から順次送出する。この鋼帯8に対する電子ビームの照射処理の実行期間、真空槽2は、その槽内部を高真空状態に維持する。なお、上記搬送方向は鋼帯8の長手方向と同じ方向である。この搬送方向への鋼帯8の搬送は、搬送ロール等の搬送装置(図示せず)によって行われる。真空槽2の出側開口部から送出された鋼帯8は、この搬送装置によって電子ビーム照射装置1の下流側へ順次搬送される。   The vacuum chamber 2 has a vacuum exhaust system (not shown) such as an exhaust port, and forms a vacuum chamber suitable for irradiating the steel strip 8 with an electron beam. Moreover, the vacuum chamber 2 has an entrance opening and an exit opening (both not shown). The vacuum chamber 2 receives the steel strip 8 sequentially conveyed toward the conveyance direction shown in FIG. 1 from the entrance side opening. After the electron beam irradiation treatment by the electron guns 3a to 3h is performed on the surface of the steel strip 8, the vacuum chamber 2 sequentially sends out the steel strip 8 from the exit opening in the transport direction. During the execution period of the electron beam irradiation process for the steel strip 8, the vacuum chamber 2 maintains the interior of the chamber in a high vacuum state. The transport direction is the same as the longitudinal direction of the steel strip 8. The steel strip 8 is transported in the transport direction by a transport device (not shown) such as a transport roll. The steel strip 8 delivered from the outlet side opening of the vacuum chamber 2 is sequentially transported to the downstream side of the electron beam irradiation device 1 by this transport device.

電子銃3a〜3hは、順次搬送される鋼帯8の表面に対して電子ビームを鋼帯8の幅方向(以下、材幅方向と適宜いう)に連続的に照射する電子ビーム走査を行うための装置である。具体的には、電子銃3a〜3hの各々は、電源、フィラメント、集束コイル、および偏向コイル等を用いて実現され、所定の規則に沿って真空槽2の上部に配置される。なお、電子銃3a〜3hの配置構成については、後述する。真空槽2の上部に配置された電子銃3a〜3hの各々において、フィラメントは、電源から電流を供給されることによって放出する。集束コイルは、フィラメントから放出された電子ビームの径を絞る。偏向コイルは、集束コイルによって集束された電子ビームの進行方向を材幅方向に変化させる。これら電子銃3a〜3hの各々は、このように電子ビームを材幅方向に偏向しつつ、真空槽2の内部において鋼帯8の表面に電子ビームを照射し、これにより、この鋼帯8の表面に対する材幅方向の電子ビーム走査を材幅方向に分担して行う。詳細には、電子銃3a〜3hは、鋼板8の分割帯8a〜8hの各表面に対して、各々、電子ビームを材幅方向に連続的に照射する。この場合、電子銃3a〜3hの各電子ビームの走査幅W1〜W8は、図1に示すように、これら分割帯8a〜8hの各幅と各々同程度である。例えば、本実施の形態において、走査幅W1〜W8は、鋼帯8の材幅Wtの1/8倍に等しい。なお、分割帯8a〜8hは、8つの電子銃3a〜3hに対応して鋼板8を材幅方向に等分割(本実施の形態においては8等分)した帯状領域である。   The electron guns 3a to 3h perform electron beam scanning in which an electron beam is continuously irradiated in the width direction of the steel strip 8 (hereinafter appropriately referred to as the material width direction) onto the surface of the steel strip 8 that is sequentially conveyed. It is a device. Specifically, each of the electron guns 3a to 3h is realized using a power source, a filament, a focusing coil, a deflection coil, and the like, and is arranged on the upper part of the vacuum chamber 2 in accordance with a predetermined rule. The arrangement of the electron guns 3a to 3h will be described later. In each of the electron guns 3 a to 3 h arranged on the upper part of the vacuum chamber 2, the filament is discharged by being supplied with a current from a power source. The focusing coil reduces the diameter of the electron beam emitted from the filament. The deflection coil changes the traveling direction of the electron beam focused by the focusing coil in the material width direction. Each of these electron guns 3a to 3h irradiates the surface of the steel strip 8 with the electron beam inside the vacuum chamber 2 while deflecting the electron beam in the material width direction in this way. Electron beam scanning in the material width direction with respect to the surface is performed in the material width direction. Specifically, the electron guns 3a to 3h continuously irradiate the respective surfaces of the divided bands 8a to 8h of the steel plate 8 with an electron beam in the material width direction. In this case, the scanning widths W1 to W8 of the electron beams of the electron guns 3a to 3h are approximately the same as the widths of the divided bands 8a to 8h as shown in FIG. For example, in the present embodiment, the scanning widths W1 to W8 are equal to 1/8 times the material width Wt of the steel strip 8. The divided bands 8a to 8h are band-like regions obtained by equally dividing the steel plate 8 in the material width direction (in the present embodiment, equal to eight) corresponding to the eight electron guns 3a to 3h.

また、電子銃3a〜3hは、鋼帯8の材幅方向に隣り合う電子銃同士において、鋼帯8の表面に対する電子ビーム走査の不足を補う。すなわち、電子銃3a〜3hの中から電子ビームを照射不能な電子銃が発生した場合、電子銃3a〜3hは、照射不能な電子銃を除く残りの正常な電子銃によって、上述した鋼帯8に対する電子ビーム走査を材幅方向に分担して行う。この場合、電子銃3a〜3hのうちの照射不能な電子銃と材幅方向に隣り合う全ての正常な電子銃は、この照射不能な電子銃が本来担う鋼帯8の表面における電子ビームの走査範囲全域を単独または協同して補うように、自身の電子ビームの走査幅を拡大する。   Further, the electron guns 3 a to 3 h make up for the lack of electron beam scanning on the surface of the steel strip 8 between the electron guns adjacent to each other in the material width direction of the steel strip 8. That is, when an electron gun that cannot irradiate an electron beam is generated from the electron guns 3a to 3h, the electron guns 3a to 3h are moved by the remaining normal electron guns except for the electron gun that cannot be irradiated by the steel strip 8 described above. Electron beam scanning is performed in the material width direction. In this case, all of the normal electron guns adjacent to the non-irradiable electron gun in the material width direction among the electron guns 3a to 3h are scanned with the electron beam on the surface of the steel strip 8 which the non-irradiable electron gun originally takes. The scanning width of its own electron beam is expanded so as to supplement the entire range independently or in cooperation.

報知部5は、電子銃3a〜3hの中に電子ビームを照射不能な電子銃が存在する場合、照射不能な電子銃が発生した旨を報知するものである。具体的には、報知部5は、液晶ディスプレイ等の表示装置を用いて実現される。報知部5は、複数の電子銃3a〜3hの中から照射不能な電子銃を特定可能な特定情報を表示し、これにより、照射不能な電子銃が発生した旨を報知する。なお、上述した照射不能な電子銃の特定情報として、例えば、照射不能な電子銃の位置を示す情報、電子銃3a〜3hの各々に固有のシリアル番号またはマークを示す情報等が挙げられる。   When the electron gun 3a to 3h includes an electron gun that cannot irradiate an electron beam, the notification unit 5 notifies that an electron gun that cannot be irradiated is generated. Specifically, the notification unit 5 is realized using a display device such as a liquid crystal display. The notification unit 5 displays specific information that can specify an electron gun that cannot be irradiated from among the plurality of electron guns 3a to 3h, thereby notifying that an electron gun that cannot be irradiated has been generated. Examples of the specific information of the non-irradiable electron gun described above include information indicating the position of the non-irradiable electron gun, information indicating a serial number or mark unique to each of the electron guns 3a to 3h, and the like.

制御部6は、上述した電子銃3a〜3hおよび報知部5の各動作を制御する。具体的には、制御部6は、真空槽2の内部に位置する鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行うように電子銃3a〜3hを制御する。特に、電子銃3a〜3hの中に電子ビームを照射不能な電子銃が存在しない場合、制御部6は、鋼帯8の分割帯8a〜8hの各幅と各々同程度に設定した走査幅W1〜W8の各電子ビーム走査を分割帯8a〜8hの各表面に対して各々行うように電子銃3a〜3hを制御する。   The control unit 6 controls each operation of the electron guns 3 a to 3 h and the notification unit 5 described above. Specifically, the control unit 6 controls the electron guns 3 a to 3 h so as to perform electron beam scanning with respect to the surface of the steel strip 8 located inside the vacuum chamber 2 in the material width direction. In particular, when there is no electron gun that cannot irradiate an electron beam among the electron guns 3a to 3h, the control unit 6 sets the scanning width W1 set to be approximately the same as the widths of the divided bands 8a to 8h of the steel strip 8. The electron guns 3a to 3h are controlled so that each electron beam scan of .about.W8 is performed on each surface of the divided bands 8a to 8h.

また、制御部6は、電子銃3a〜3hについて電子ビームを照射不能な電子銃の有無を判断する。電子銃3a〜3hの中に電子ビームを照射不能な電子銃がある場合、制御部6は、これらの電子銃3a〜3hのうち、照射不能な電子銃と材幅方向に隣り合う正常な電子銃に対して走査幅の拡大指令信号を送信する。これにより、制御部6は、上記正常な電子銃の電子ビームの走査幅を、この照射不能な電子銃の電子ビームの走査範囲全域に拡大する。詳細には、制御部6は、電子銃3a〜3hのうち、照射不能な電子銃と材幅方向の両側に隣り合う双方の正常な電子銃に対して走査幅の拡大指令信号を各々送信する。これにより、制御部6は、これら双方の正常な電子銃の各電子ビームの走査幅を、この照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように拡大する。また、制御部6は、電子銃3a〜3hのうち、照射不能な電子銃と材幅方向の片側に隣り合う単一の正常な電子銃に対して走査幅の拡大指令信号を送信する。これにより、制御部6は、この単一の正常な電子銃の電子ビームの走査幅を、この照射不能な電子銃の電子ビームの走査範囲全域を補うように拡大する。制御部6は、上述したように電子銃3a〜3hの各走査幅W1〜W8を適宜拡大させた後、これら電子銃3a〜3hのうちの照射不能な電子銃を除く残りの電子銃に、鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行わせる。   Moreover, the control part 6 judges the presence or absence of the electron gun which cannot irradiate an electron beam about the electron guns 3a-3h. When there is an electron gun that cannot irradiate an electron beam among the electron guns 3a to 3h, the control unit 6 has a normal electron adjacent to the electron gun that cannot be irradiated among the electron guns 3a to 3h in the material width direction. A scanning width enlargement command signal is transmitted to the gun. Thereby, the control unit 6 expands the scanning width of the electron beam of the normal electron gun to the entire scanning range of the electron beam of the electron gun that cannot be irradiated. Specifically, the control unit 6 transmits a scanning width enlargement command signal to both of the electron guns 3a to 3h that are not irradiated and the normal electron guns adjacent to both sides in the material width direction. . Thereby, the control unit 6 expands the scanning width of each electron beam of both of these normal electron guns so as to complement the entire scanning range of the electron beam of the electron gun that cannot be irradiated. In addition, the control unit 6 transmits a scanning width enlargement command signal to a single normal electron gun adjacent to one of the electron guns 3a to 3h that cannot be irradiated and one side in the material width direction. Thereby, the control unit 6 expands the scanning width of the electron beam of the single normal electron gun so as to compensate for the entire scanning range of the electron beam of the electron gun that cannot be irradiated. As described above, the control unit 6 appropriately enlarges the scanning widths W1 to W8 of the electron guns 3a to 3h, and then, to the remaining electron guns other than the non-irradiable electron guns among these electron guns 3a to 3h, Electron beam scanning with respect to the surface of the steel strip 8 is performed in the material width direction.

さらに、制御部6は、上述した判断処理の結果、電子銃3a〜3hの中に照射不能な電子銃がある場合、これら電子銃3a〜3hの中から照射不能な電子銃を特定可能な特定情報を報知(例えば表示)するように報知部5を制御する。これにより、制御部6は、照射不能な電子銃が発生した旨を報知部5に報知させる。   Further, when there is an electron gun that cannot be irradiated among the electron guns 3a to 3h as a result of the determination process described above, the control unit 6 can specify the electron gun that cannot be irradiated from these electron guns 3a to 3h. The notification unit 5 is controlled so as to notify (for example, display) information. Thereby, the control part 6 notifies the alerting | reporting part 5 that the electron gun which cannot be irradiated generate | occur | produced.

(複数の電子銃の配置構成)
つぎに、本実施の形態にかかる電子ビーム照射装置1が備える複数の電子銃3a〜3hの配置構成について説明する。図2は、本実施の形態における複数の電子銃の配置構成例を示す図である。図2には、図1に示した電子ビーム照射装置1の真空槽2および電子銃3a〜3hを鋼帯8の搬送方向から見たものが模式的に図示されている。本実施の形態における電子銃3a〜3hは、鋼帯8の表面に照射する電子ビームの走査可能幅の1/2以下となる間隔をもって各々隣り合い、且つ、鋼帯8の材幅方向に等間隔となるように真空槽2の上部に配置される。
(Arrangement of multiple electron guns)
Next, an arrangement configuration of the plurality of electron guns 3a to 3h included in the electron beam irradiation apparatus 1 according to the present embodiment will be described. FIG. 2 is a diagram illustrating an arrangement configuration example of a plurality of electron guns in the present embodiment. FIG. 2 schematically shows the vacuum chamber 2 and the electron guns 3 a to 3 h of the electron beam irradiation apparatus 1 shown in FIG. 1 as viewed from the conveying direction of the steel strip 8. The electron guns 3a to 3h in the present embodiment are adjacent to each other with an interval that is 1/2 or less of the scannable width of the electron beam applied to the surface of the steel strip 8, and in the material width direction of the steel strip 8 or the like. It arrange | positions at the upper part of the vacuum chamber 2 so that it may become a space | interval.

具体的には、図2に示すように、電子銃3a〜3hは、電子ビーム射出口を真空槽2の内部に向けた状態にして、鋼帯8の材幅方向に隣り合う各電子銃同士の間隔d1〜d7をなして真空槽2の上部に等間隔に配置される。すなわち、間隔d1〜d7は、互いに同じ値である。また、材幅方向の一端部側の電子銃3aは、材幅方向の片側に間隔d1をもって電子銃3bと隣り合い、材幅方向の他端部側の電子銃3hは、材幅方向の片側に間隔d7をもって電子銃3gと隣り合う。これらの電子銃3a,3hの間において、電子銃3bは、材幅方向の両側に間隔d1,d2をもって電子銃3a,3cと各々隣り合い、電子銃3cは、材幅方向の両側に間隔d2,d3をもって電子銃3b,3dと各々隣り合う。電子銃3dは、材幅方向の両側に間隔d3,d4をもって電子銃3c,3eと各々隣り合い、電子銃3eは、材幅方向の両側に間隔d4,d5をもって電子銃3d,3fと各々隣り合う。電子銃3fは、材幅方向の両側に間隔d5,d6をもって電子銃3e,3gと各々隣り合い、電子銃3gは、材幅方向の両側に間隔d6,d7をもって電子銃3f,3hと各々隣り合う。これらの電子銃3a〜3hの各々において、電子ビーム射出口の中心を電子銃の中心位置とし、材幅方向に隣り合う電子銃同士の各中心位置間の距離を電子銃3a〜3hの各間隔d1〜d7とする。   Specifically, as shown in FIG. 2, the electron guns 3 a to 3 h are arranged so that the electron beam exits face the inside of the vacuum chamber 2 and the electron guns adjacent in the material width direction of the steel strip 8 Are arranged at equal intervals on the upper part of the vacuum chamber 2. That is, the intervals d1 to d7 have the same value. Further, the electron gun 3a on one end side in the material width direction is adjacent to the electron gun 3b with a distance d1 on one side in the material width direction, and the electron gun 3h on the other end side in the material width direction is on one side in the material width direction. Is adjacent to the electron gun 3g with a distance d7. Between these electron guns 3a and 3h, the electron gun 3b is adjacent to the electron guns 3a and 3c at intervals d1 and d2 on both sides in the material width direction, and the electron gun 3c is spaced at intervals d2 on both sides in the material width direction. , D3 are adjacent to the electron guns 3b, 3d, respectively. The electron gun 3d is adjacent to the electron guns 3c and 3e at intervals d3 and d4 on both sides in the material width direction, and the electron gun 3e is adjacent to the electron guns 3d and 3f at intervals d4 and d5 on both sides in the material width direction. Fit. The electron gun 3f is adjacent to the electron guns 3e and 3g at intervals d5 and d6 on both sides in the material width direction, and the electron gun 3g is adjacent to the electron guns 3f and 3h at intervals d6 and d7 on both sides in the material width direction. Fit. In each of these electron guns 3a to 3h, the center of the electron beam exit is set as the center position of the electron gun, and the distance between the center positions of the electron guns adjacent in the material width direction is the distance between the electron guns 3a to 3h. d1 to d7.

ここで、電子銃3aには、鋼帯8の表面に照射する電子ビーム4aの通常の走査幅W1が設定される。また、電子銃3aには、照射する電子ビーム4aの偏向可能な最大の走査幅として、この走査幅W1の2倍以上となる走査可能幅W11が設定される。これと同様に、電子銃3bには、照射する電子ビーム4bの通常の走査幅W2と、この走査幅W2の2倍以上となる走査可能幅W12とが設定され、電子銃3cには、照射する電子ビーム4cの通常の走査幅W3と、この走査幅W3の2倍以上となる走査可能幅W13とが設定される。電子銃3dには、照射する電子ビーム4dの通常の走査幅W4と、この走査幅W4の2倍以上となる走査可能幅W14とが設定され、電子銃3eには、照射する電子ビーム4eの通常の走査幅W5と、この走査幅W5の2倍以上となる走査可能幅W15とが設定される。電子銃3fには、照射する電子ビーム4fの通常の走査幅W6と、この走査幅W6の2倍以上となる走査可能幅W16が設定され、電子銃3gには、照射する電子ビーム4gの通常の走査幅W7と、この走査幅W7の2倍以上となる走査可能幅W17とが設定される。電子銃3hには、照射する電子ビーム4hの通常の走査幅W8と、この走査幅W8の2倍以上となる走査可能幅W18とが設定される。   Here, the normal scanning width W1 of the electron beam 4a irradiated to the surface of the steel strip 8 is set to the electron gun 3a. In addition, a scannable width W11 that is at least twice the scan width W1 is set in the electron gun 3a as the maximum deflectable scan width of the irradiated electron beam 4a. Similarly, a normal scanning width W2 of the electron beam 4b to be irradiated and a scannable width W12 that is at least twice the scanning width W2 are set for the electron gun 3b. A normal scanning width W3 of the electron beam 4c to be scanned and a scannable width W13 that is twice or more the scanning width W3 are set. The electron gun 3d is set with a normal scanning width W4 of the irradiating electron beam 4d and a scannable width W14 which is at least twice the scanning width W4. The electron gun 3e has a scanning width W14 of the irradiating electron beam 4e. A normal scanning width W5 and a scannable width W15 that is twice or more the scanning width W5 are set. The electron gun 3f has a normal scanning width W6 of the irradiating electron beam 4f and a scannable width W16 that is twice or more the scanning width W6. The electron gun 3g has a normal scanning width W16. And a scannable width W17 that is at least twice as large as the scan width W7. The electron gun 3h is set with a normal scanning width W8 of the irradiating electron beam 4h and a scannable width W18 that is at least twice the scanning width W8.

なお、これら電子銃3a〜3hの走査幅W1〜W8の各中心位置は、上述した走査可能幅W11〜W18の各中心位置と各々一致する。また、電子銃3a〜3hの各中心位置は、これら走査幅W1〜W8および走査可能幅W11〜W18の各中心位置と各々同一直線上にある。例えば、走査幅W1の中心位置と走査可能幅W11の中心位置とは一致し、且つ、電子銃3aの中心位置は、走査幅W1および走査可能幅W11の各中心位置と同一直線上にある。   Note that the center positions of the scanning widths W1 to W8 of the electron guns 3a to 3h respectively coincide with the center positions of the scannable widths W11 to W18 described above. The center positions of the electron guns 3a to 3h are on the same straight line as the center positions of the scan widths W1 to W8 and the scannable widths W11 to W18. For example, the center position of the scanning width W1 coincides with the center position of the scannable width W11, and the center position of the electron gun 3a is collinear with the center positions of the scan width W1 and the scannable width W11.

電子銃3a〜3hは、上述した間隔d1〜d7が電子銃3a〜3hの各電子ビーム4a〜4hの走査可能幅W11〜W18の1/2倍以下となるように、等間隔に配置される。具体的には、電子銃3aと電子銃3bとの間隔d1は、電子銃3a,3bの各走査可能幅W11,W12の1/2倍以下である。このことは、電子銃3b〜3hの各間隔d2〜d7についても同様である。このように配置された電子銃3a〜3hは、鋼帯8の材幅方向に隣り合う電子銃の走査幅の各中心位置(以下、走査幅中心と適宜いう)を走査可能幅W11〜W18の各範囲内に各々含める。すなわち、電子銃3aは、隣り合う電子銃3bの走査幅中心を走査可能幅W11の範囲内に含める。これと同様に、電子銃3bは、隣り合う電子銃3a,3cの各走査幅中心を走査可能幅W12の範囲内に含め、電子銃3cは、隣り合う電子銃3b,3dの各走査幅中心を走査可能幅W13の範囲内に含める。電子銃3dは、隣り合う電子銃3c,3eの各走査幅中心を走査可能幅W14の範囲内に含め、電子銃3eは、隣り合う電子銃3d,3fの各走査幅中心を走査可能幅W15の範囲内に含める。電子銃3fは、隣り合う電子銃3e,3gの各走査幅中心を走査可能幅W16の範囲内に含め、電子銃3gは、隣り合う電子銃3f,3hの各走査幅中心を走査可能幅W17の範囲内に含める。電子銃3hは、隣り合う電子銃3gの走査幅中心を走査可能幅W18の範囲内に含める。   The electron guns 3a to 3h are arranged at equal intervals so that the distances d1 to d7 are equal to or less than ½ times the scannable widths W11 to W18 of the electron beams 4a to 4h of the electron guns 3a to 3h. . Specifically, the distance d1 between the electron gun 3a and the electron gun 3b is equal to or less than ½ times the scannable widths W11 and W12 of the electron guns 3a and 3b. The same applies to the intervals d2 to d7 of the electron guns 3b to 3h. The electron guns 3a to 3h arranged in this way have respective scanning positions W11 to W18 at the center positions of the scanning widths of the electron guns adjacent to each other in the material width direction of the steel strip 8 (hereinafter referred to as scanning width centers as appropriate). Include within each range. That is, the electron gun 3a includes the center of the scanning width of the adjacent electron gun 3b within the scannable width W11. Similarly, the electron gun 3b includes the scanning width centers of the adjacent electron guns 3a and 3c within the scannable width W12, and the electron gun 3c includes the scanning width centers of the adjacent electron guns 3b and 3d. Is included within the range of the scannable width W13. The electron gun 3d includes the scanning width centers of the adjacent electron guns 3c and 3e within the range of the scannable width W14, and the electron gun 3e scans the scanning width centers of the adjacent electron guns 3d and 3f. Include in the range. The electron gun 3f includes the scan width centers of the adjacent electron guns 3e and 3g within the scannable width W16, and the electron gun 3g scans the scan width centers of the adjacent electron guns 3f and 3h. Include in the range. The electron gun 3h includes the scanning width center of the adjacent electron gun 3g within the range of the scannable width W18.

図2においては、一例として、電子銃3a〜3hの間隔d1〜d7の各々が各走査可能幅W11〜W18の1/2倍となるように、電子銃3a〜3hが等間隔に配置されている。これにより、例えば電子銃3aと電子銃3bとの間隔d1は、電子銃3a,3bの各走査可能幅W11,W12の1/2倍となる。すなわち、電子銃3a〜3hの走査可能幅W11〜W18の各端部は、図2に示すように、隣り合う電子銃同士の走査幅中心上に位置する。例えば、電子銃3aの走査可能幅W11の端部は、隣り合う電子銃3bの走査幅中心上に位置し、電子銃3bの走査可能幅W12の両端部は、隣り合う電子銃3a,3cの各走査幅中心上に各々位置する。   In FIG. 2, as an example, the electron guns 3a to 3h are arranged at equal intervals so that the intervals d1 to d7 of the electron guns 3a to 3h are each ½ times the scannable widths W11 to W18. Yes. Thereby, for example, the distance d1 between the electron gun 3a and the electron gun 3b is ½ times the scannable widths W11 and W12 of the electron guns 3a and 3b. That is, each end of the scannable widths W11 to W18 of the electron guns 3a to 3h is located on the center of the scan width between adjacent electron guns as shown in FIG. For example, the end of the scannable width W11 of the electron gun 3a is positioned on the center of the scan width of the adjacent electron gun 3b, and the both ends of the scannable width W12 of the electron gun 3b are located between the adjacent electron guns 3a and 3c. Each is located on the center of each scan width.

(電子ビーム照射方法)
つぎに、本発明の実施の形態にかかる電子ビーム照射方法について説明する。図3は、本発明の実施の形態にかかる電子ビーム照射方法の一例を示すフローチャートである。図1に示した電子ビーム照射装置1は、図3に示すステップS101〜S104の各処理ステップを行うことにより、処理対象の鋼帯8の表面に対する電子ビーム走査を実行する。以下、図1〜3を適宜参照して、本実施の形態にかかる電子ビームの照射方法を詳細に説明する。
(Electron beam irradiation method)
Next, an electron beam irradiation method according to an embodiment of the present invention will be described. FIG. 3 is a flowchart showing an example of the electron beam irradiation method according to the embodiment of the present invention. The electron beam irradiation apparatus 1 shown in FIG. 1 performs the electron beam scanning with respect to the surface of the steel strip 8 to be processed by performing each processing step of steps S101 to S104 shown in FIG. Hereinafter, the electron beam irradiation method according to the present embodiment will be described in detail with reference to FIGS.

本実施の形態にかかる電子ビームの照射方法において、電子ビーム照射装置1は、図3に示すように、まず、順次搬送される鋼帯8の表面に対して電子ビームを鋼帯8の材幅方向に連続的に照射する(ステップS101)。電子ビーム照射装置1が備える電子銃3a〜3hは、上述したように、順次搬送される鋼帯8の表面に照射する電子ビーム4a〜4hの走査可能幅W11〜W18の1/2以下となる間隔d1〜d7をもって各々隣り合い、且つ、この鋼帯8の材幅方向に等間隔に配置されている(図2参照)。電子ビーム照射装置1は、このように配置した電子銃3a〜3hにより、鋼帯8の表面に対して電子ビーム4a〜4hを材幅方向に連続的に照射する電子ビーム走査を、鋼帯8の材幅方向に分担して行う。   In the electron beam irradiation method according to the present embodiment, as shown in FIG. 3, the electron beam irradiation apparatus 1 first applies an electron beam to the surface of the steel strip 8 that is sequentially transported. Irradiate continuously in the direction (step S101). As described above, the electron guns 3a to 3h included in the electron beam irradiation apparatus 1 are ½ or less of the scannable widths W11 to W18 of the electron beams 4a to 4h that are irradiated onto the surface of the steel strip 8 that is sequentially conveyed. They are adjacent to each other at intervals d1 to d7, and are arranged at equal intervals in the material width direction of the steel strip 8 (see FIG. 2). The electron beam irradiation apparatus 1 uses the electron guns 3a to 3h arranged in this manner to perform electron beam scanning for continuously irradiating the surface of the steel strip 8 with the electron beams 4a to 4h in the material width direction. This is done in the material width direction.

具体的には、ステップS101において、制御部6は、真空槽2の内部に順次搬送される鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行うように、電子銃3a〜3hを制御する。例えば、電子銃3a〜3hの中に電子ビームを照射不能な電子銃が存在しない場合、制御部6は、電子ビームの通常の走査範囲を設定する指令信号を電子銃3a〜3hに各々送信し、これにより、電子銃3a〜3hに対して電子ビーム4a〜4hの通常の走査幅W1〜W8を各々設定する。ついで、制御部6は、鋼帯8の表面に対して通常の走査幅W1〜W8の電子ビーム走査を行うように電子銃3a〜3hを制御する。電子銃3a〜3hは、制御部6の制御に基づいて、鋼帯8の分割帯8a〜8hの各表面に対し、各々、走査幅W1〜W8の電子ビーム4a〜4hを材幅方向に連続的に照射する。   Specifically, in step S101, the control unit 6 performs electron beam scanning with respect to the surface of the steel strip 8 sequentially conveyed into the vacuum chamber 2 in the material width direction so as to perform the electron guns 3a to 3h. To control. For example, when there is no electron gun that cannot irradiate an electron beam among the electron guns 3a to 3h, the control unit 6 transmits a command signal for setting a normal scanning range of the electron beam to each of the electron guns 3a to 3h. Thereby, the normal scanning widths W1 to W8 of the electron beams 4a to 4h are set for the electron guns 3a to 3h, respectively. Next, the control unit 6 controls the electron guns 3 a to 3 h so that the surface of the steel strip 8 is scanned with an electron beam having a normal scanning width W1 to W8. Under the control of the control unit 6, the electron guns 3a to 3h continuously apply electron beams 4a to 4h having scanning widths W1 to W8 in the material width direction on the respective surfaces of the divided bands 8a to 8h of the steel strip 8. Irradiate.

ステップS101を実行後、電子ビーム照射装置1は、電子ビームを照射不能な電子銃の有無を判断する(ステップS102)。このステップS102において、制御部6は、電子銃3a〜3hの各電流値等の駆動情報を電子銃3a〜3hの各々から取得する。ついで、制御部6は、取得した電子銃3a〜3hの各駆動情報をもとに、電子銃3a〜3hの各電子ビーム照射状況を検知する。例えば、制御部6は、電子銃3a〜3hのうち、フィラメント切れ等の部品故障に起因して電子ビームを照射不能となった電子銃の電子ビーム照射状況を「照射不能」として検知する。制御部6は、電子銃3a〜3hの中から電子ビームの照射状況が照射不能となった電子銃を検知しなかった場合、電子銃3a〜3hの中に電子ビームを照射不能な電子銃がないと判断する。一方、制御部6は、電子銃3a〜3hの中から電子ビームの照射状況が照射不能となった電子銃を検知した場合、電子銃3a〜3hの中に電子ビームを照射不能な電子銃があると判断する。   After executing step S101, the electron beam irradiation apparatus 1 determines whether or not there is an electron gun that cannot irradiate an electron beam (step S102). In step S102, the control unit 6 acquires drive information such as current values of the electron guns 3a to 3h from the electron guns 3a to 3h. Next, the control unit 6 detects the electron beam irradiation status of the electron guns 3a to 3h based on the acquired drive information of the electron guns 3a to 3h. For example, among the electron guns 3a to 3h, the control unit 6 detects an electron beam irradiation state of an electron gun that has become unable to irradiate an electron beam due to a component failure such as filament breakage as “irradiation impossible”. When the control unit 6 does not detect an electron gun whose electron beam irradiation status has become unirradiable from the electron guns 3a to 3h, the electron gun 3a to 3h has an electron gun that cannot emit an electron beam. Judge that there is no. On the other hand, when the control unit 6 detects an electron gun in which the irradiation state of the electron beam is impossible to irradiate from among the electron guns 3a to 3h, an electron gun that cannot irradiate the electron beam is present in the electron guns 3a to 3h. Judge that there is.

ステップS102において、電子銃3a〜3hの中に電子ビームを照射不能な電子銃がない場合(ステップS102,No)、電子ビーム照射装置1は、上述したステップS101に戻り、このステップS101以降の処理ステップを繰り返す。   In step S102, when there is no electron gun that cannot irradiate the electron beam among the electron guns 3a to 3h (No in step S102), the electron beam irradiation apparatus 1 returns to the above-described step S101, and the processes after step S101 are performed. Repeat steps.

一方、ステップS102において、電子銃3a〜3hの中に電子ビームを照射不能な電子銃がある場合(ステップS102,Yes)、電子ビーム照射装置1は、電子銃3a〜3hのうち、検知した照射不能な電子銃と隣り合う正常な電子銃の電子ビームの走査幅を、この照射不能な電子銃の電子ビームの走査範囲の全域に拡大する(ステップS103)。このステップS103において、制御部6は、予め設定された電子銃3a〜3hの特定情報を参照し、上述したステップS102の判断処理(例えば電子銃3a〜3hの各駆動情報)に基づき、電子銃3a〜3hの中から照射不能な電子銃の特定情報を確認する。例えば、制御部6は、照射不能な電子銃3の特定情報として、電子銃3a〜3hの配置構成における照射不能な電子銃の位置情報、照射不能な電子銃に予め付されたシリアル番号またはマーク等の固有情報を確認する。これにより、制御部6は、電子銃3a〜3hのうちの何れの電子銃が照射不能であるかを把握する。制御部6は、電子銃3a〜3hのうち、上述したように所在を把握した照射不能な電子銃と材幅方向に隣り合う全ての正常な電子銃に対し、この照射不能な電子銃の電子ビームの走査範囲を補うように走査幅を拡大する指令を与える。   On the other hand, in step S102, when there is an electron gun that cannot irradiate an electron beam among the electron guns 3a to 3h (Yes in step S102), the electron beam irradiation apparatus 1 detects the detected irradiation among the electron guns 3a to 3h. The scanning width of the electron beam of the normal electron gun adjacent to the impossible electron gun is expanded to the entire scanning range of the electron beam of the non-irradiated electron gun (step S103). In step S103, the control unit 6 refers to the specific information of the electron guns 3a to 3h set in advance, and based on the determination processing in step S102 described above (for example, each driving information of the electron guns 3a to 3h), the electron gun The specific information of the electron gun that cannot be irradiated is confirmed from 3a to 3h. For example, the control unit 6 includes, as the specific information of the non-irradiable electron gun 3, positional information of the non-irradiable electron gun in the arrangement configuration of the electron guns 3a to 3h, a serial number or a mark given in advance to the non-irradiable electron gun Confirm unique information such as. Thereby, the control part 6 grasps | ascertains which of the electron guns 3a-3h cannot be irradiated. The control unit 6 applies, to the electron guns 3a to 3h, all the normal electron guns adjacent in the material width direction to the non-irradiable electron gun whose location is known as described above, and the electrons of this non-irradiable electron gun. A command to increase the scanning width so as to supplement the scanning range of the beam is given.

具体的には、制御部6は、電子銃3a〜3hのうち、所在を把握した照射不能な電子銃と材幅方向の両側に隣り合う双方の正常な電子銃に対して走査幅の拡大指令信号を各々送信する。これにより、制御部6は、これら双方の正常な電子銃に対し、この照射不能な電子銃の電子ビームの走査範囲全域に亘り走査幅を協同して拡大する指令を各々与える。これら双方の正常な電子銃、すなわち、電子銃3a〜3hのうちの照射不能な電子銃を材幅方向に挟む2つの電子銃は、上記制御部6の制御に基づき、この照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように、自身の走査幅を各々拡大する。一方、制御部6は、電子銃3a〜3hのうち、所在を把握した照射不能な電子銃と材幅方向の片側に隣り合う単一の正常な電子銃に対して走査幅の拡大指令信号を送信する。これにより、制御部6は、この単一の正常な電子銃に対し、この照射不能な電子銃の電子ビームの走査範囲全域に亘り走査幅を拡大する指令を与える。この単一の正常な電子銃は、上記制御部6の制御に基づき、この照射不能な電子銃の電子ビームの走査範囲全域を補うように、自身の走査幅を拡大する。   Specifically, the control unit 6 commands the scanning width expansion command to the electron guns 3a to 3h that are unirradiated and whose normal position is adjacent to both sides in the material width direction. Each signal is transmitted. As a result, the control unit 6 gives commands to both of these normal electron guns to cooperatively expand the scanning width over the entire scanning range of the electron beam of the non-irradiated electron gun. Both of these normal electron guns, that is, the two electron guns sandwiching the non-irradiable electron gun among the electron guns 3a to 3h in the material width direction, are based on the control of the control unit 6 and are not capable of irradiation. Each of the scanning widths is expanded so as to cooperatively supplement the entire scanning range of the electron beam. On the other hand, the control unit 6 sends a scanning width enlargement command signal to the non-irradiable electron gun whose position is known and the single normal electron gun adjacent to one side in the material width direction among the electron guns 3a to 3h. Send. As a result, the control unit 6 gives a command to the single normal electron gun to expand the scanning width over the entire scanning range of the electron beam of the non-irradiated electron gun. The single normal electron gun expands its scanning width based on the control of the control unit 6 so as to compensate for the entire scanning range of the electron beam of the non-irradiated electron gun.

ステップS103を実行後、電子ビーム照射装置1は、電子銃3a〜3hの中から照射不能な電子銃を特定可能な特定情報を報知して、照射不能な電子銃が発生した旨を報知する(ステップS104)。このステップS104において、制御部6は、上述したステップS103に基づき把握した照射不能な電子銃の特定情報を表示するように報知部5を制御する。報知部5は、制御部6の制御に基づいて、この照射不能な電子銃の特定情報を表示し、これにより、電子銃3a〜3hの中に照射不能な電子銃が発生した旨を外部(作業者等)に報知する。   After executing Step S103, the electron beam irradiation apparatus 1 notifies specific information that can specify the electron gun that cannot be irradiated from the electron guns 3a to 3h, and notifies that the electron gun that cannot be irradiated has been generated ( Step S104). In step S104, the control unit 6 controls the notification unit 5 to display the specific information of the electron gun that cannot be irradiated, which is grasped based on the above-described step S103. Based on the control of the control unit 6, the notification unit 5 displays the specific information of the non-irradiated electron gun, thereby indicating that an unirradiated electron gun has occurred in the electron guns 3a to 3h (externally ( To the workers).

ステップS104を実行後、電子ビーム照射装置1は、上述したステップS101に戻り、このステップS101移行の処理ステップを適宜繰り返し行う。このステップS104を実行後のステップS101において、電子ビーム照射装置1は、電子銃3a〜3hの中に照射不能な電子銃がある場合、これら電子銃3a〜3hのうちの照射不能な電子銃を除く残りの正常な電子銃により、鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行う。この場合、制御部6は、上述したステップS103によって照射不能な電子銃と隣り合う正常な電子銃の走査幅を拡大させた状態を維持しつつ、電子銃3a〜3hのうちの照射不能な電子銃を除く残りの電子銃に、鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行わせる。なお、上記残りの電子銃には、電子銃3a〜3hのうちの走査幅を拡大していない電子銃(照射不能な電子銃と隣り合っていない正常な電子銃)が含まれることは勿論、ステップS103において走査幅を拡大した電子銃(照射不能な電子銃と隣り合う正常な電子銃)が含まれる。   After executing Step S104, the electron beam irradiation apparatus 1 returns to Step S101 described above and repeats the processing steps of Step S101 as appropriate. In Step S101 after executing Step S104, when there are electron guns that cannot be irradiated among the electron guns 3a to 3h, the electron beam irradiation apparatus 1 selects an electron gun that cannot be irradiated among these electron guns 3a to 3h. The remaining normal electron guns perform electron beam scanning on the surface of the steel strip 8 in the material width direction. In this case, the control unit 6 maintains the state in which the scanning width of the normal electron gun adjacent to the non-irradiable electron gun is increased in step S103 described above, and the non-irradiable electrons among the electron guns 3a to 3h. The remaining electron guns other than the gun are caused to perform electron beam scanning on the surface of the steel strip 8 in the material width direction. The remaining electron guns include, of course, the electron guns of the electron guns 3a to 3h whose scanning width is not enlarged (normal electron guns that are not adjacent to non-irradiable electron guns). In step S103, an electron gun whose scanning width is expanded (a normal electron gun adjacent to an unirradiated electron gun) is included.

(電子ビームの照射処理の具体例)
つぎに、本実施の形態にかかる電子ビーム照射装置1の電子銃3a〜3hの各間隔d1〜d7(図2参照)を各々走査可能幅W11〜W18の1/2倍とした場合を例示して、上述したステップS101〜S104による電子ビームの照射処理を具体的に説明する。図4は、本発明による電子ビームの照射処理の一具体例を説明するための図である。図4に示すように、電子銃3a〜3hの中に照射不能な電子銃が存在しない場合、電子銃3a〜3hは、鋼帯8の表面に対し、通常の走査幅W1〜W8に応じた各走査範囲内に電子ビーム4a〜4hを各々走査する。これにより、電子銃3a〜3hは、この鋼帯8の表面に対する電子ビーム走査を分割帯8a〜8hに各々分けて行う(状態A1)。
(Specific example of electron beam irradiation processing)
Next, an example in which the distances d1 to d7 (see FIG. 2) of the electron guns 3a to 3h of the electron beam irradiation apparatus 1 according to the present embodiment are set to ½ times the scannable widths W11 to W18, respectively. The electron beam irradiation process in steps S101 to S104 described above will be specifically described. FIG. 4 is a diagram for explaining a specific example of the electron beam irradiation processing according to the present invention. As shown in FIG. 4, when there is no non-irradiable electron gun among the electron guns 3 a to 3 h, the electron guns 3 a to 3 h correspond to the normal scanning widths W1 to W8 with respect to the surface of the steel strip 8. The electron beams 4a to 4h are scanned within each scanning range. Thereby, the electron guns 3a to 3h perform the electron beam scanning on the surface of the steel strip 8 in the divided zones 8a to 8h, respectively (state A1).

上述した状態A1の後、これら電子銃3a〜3hのうち、電子銃3bにフィラメント切れ等の部品故障が予期せず発生した場合、図4に示すように、電子銃3bは、電子ビーム4bを照射不能な状態となって、鋼帯8の分割帯8bに対する電子ビーム4bの照射を停止する(状態A2)。この状態A2において、照射不能な電子銃3bと材幅方向の両側に隣り合う2つの正常な電子銃3a,3cは、この照射不能な電子銃3bの電子ビームの走査範囲内に向けて自身の走査幅W1,W3を各々拡大する。詳細には、これら両隣の電子銃3a,3cは、この照射不能な電子銃3bの走査幅中心まで自身の走査幅W1,W3を各々拡大する。これにより、これら両隣の電子銃3a,3cは、この照射不能な電子銃3bが本来担うべき分割帯8bに対する電子ビームの走査範囲の全域を協同して補う。   After the above-described state A1, among these electron guns 3a to 3h, when a component failure such as filament breakage occurs unexpectedly in the electron gun 3b, the electron gun 3b emits an electron beam 4b as shown in FIG. Irradiation becomes impossible, and irradiation of the electron beam 4b to the divided band 8b of the steel strip 8 is stopped (state A2). In this state A2, the non-irradiable electron gun 3b and the two normal electron guns 3a, 3c adjacent on both sides in the material width direction are directed toward the scanning range of the electron beam of the non-irradiable electron gun 3b. The scanning widths W1 and W3 are enlarged. Specifically, these adjacent electron guns 3a and 3c expand their own scanning widths W1 and W3 to the center of the scanning width of the unirradiated electron gun 3b. As a result, the adjacent electron guns 3a and 3c cooperate to supplement the entire scanning range of the electron beam with respect to the divided band 8b that the electron gun 3b that cannot be irradiated by itself.

このような状態A2においては、電子銃3a〜3hのうちの照射不能な電子銃3bを除く残りの正常な電子銃3a,3c〜3hにより、鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行う。すなわち、図4に示すように、電子銃3aは、拡大後の走査幅W21に応じた走査範囲内に電子ビーム4aを走査する。これにより、電子銃3aは、本来担う分割帯8aの表面と、照射不能な電子銃3bの代わりに担う分割帯8bの一部分(具体的には半分)の表面とに対して材幅方向に連続的に電子ビーム4aを照射する。また、電子銃3cは、拡大後の走査幅W22に応じた走査範囲内に電子ビーム4cを走査する。これにより、電子銃3cは、本来担う分割帯8cの表面と、照射不能な電子銃3bの代わりに担う分割帯8bの残部分(具体的には半分)の表面とに対して材幅方向に連続的に電子ビーム4cを照射する。一方、電子銃3d〜3hは、上述した状態A1の場合と同様に、分割帯8d〜8hの各表面に対して各々電子ビーム4d〜4hを材幅方向に連続的に照射する。   In such a state A2, the electron beam scanning with respect to the surface of the steel strip 8 is performed in the material width direction by the remaining normal electron guns 3a and 3c to 3h except the non-irradiable electron gun 3b among the electron guns 3a to 3h. To share. That is, as shown in FIG. 4, the electron gun 3a scans the electron beam 4a within a scanning range corresponding to the enlarged scanning width W21. As a result, the electron gun 3a is continuous in the material width direction with respect to the surface of the division band 8a originally responsible and the surface of a part (specifically half) of the division band 8b to be substituted for the electron gun 3b that cannot be irradiated. The electron beam 4a is irradiated. Further, the electron gun 3c scans the electron beam 4c within a scanning range corresponding to the enlarged scanning width W22. Thereby, the electron gun 3c is arranged in the material width direction with respect to the surface of the divided band 8c that is originally assumed and the surface of the remaining part (specifically half) of the divided band 8b that is assumed instead of the electron gun 3b that cannot be irradiated. The electron beam 4c is continuously irradiated. On the other hand, the electron guns 3d to 3h continuously irradiate the respective surfaces of the divided bands 8d to 8h with the electron beams 4d to 4h in the material width direction as in the state A1 described above.

さらに、上述した状態A2の後、照射不能な電子銃3bを除く残りの電子銃3a,3c〜3hのうち、電子銃3fに部品故障が予期せず発生した場合、図4に示すように、電子銃3fは、電子ビーム4fを照射不能な状態となって、鋼帯8の分割帯8fに対する電子ビーム4fの照射を停止する(状態A3)。この状態A3において、新たに照射不能な電子銃3fと材幅方向の両側に隣り合う2つの正常な電子銃3e,3gは、この照射不能な電子銃3fの電子ビームの走査範囲内に向けて自身の走査幅W5,W7を各々拡大する。詳細には、これら両隣の電子銃3e,3gは、この照射不能な電子銃3fの走査幅中心まで自身の走査幅W5,W7を各々拡大する。これにより、これら両隣の電子銃3e,3gは、この照射不能な電子銃3fが本来担うべき分割帯8fに対する電子ビームの走査範囲の全域を協同して補う。   Furthermore, after the above-described state A2, when a component failure occurs unexpectedly in the electron gun 3f among the remaining electron guns 3a, 3c to 3h excluding the non-irradiable electron gun 3b, as shown in FIG. The electron gun 3f becomes unable to irradiate the electron beam 4f, and stops irradiating the electron beam 4f on the divided band 8f of the steel strip 8 (state A3). In this state A3, the newly unirradiable electron gun 3f and the two normal electron guns 3e and 3g adjacent on both sides in the material width direction are directed toward the scanning range of the electron beam of this unirradiable electron gun 3f. The respective scanning widths W5 and W7 are enlarged. More specifically, these adjacent electron guns 3e and 3g expand their scanning widths W5 and W7 to the center of the scanning width of the unirradiable electron gun 3f. As a result, the adjacent electron guns 3e and 3g cooperate to supplement the entire scanning range of the electron beam with respect to the divided band 8f that the electron gun 3f that cannot be irradiated is supposed to play.

このような状態A3では、電子銃3a〜3hのうちの照射不能な電子銃3b,3fを除く残りの正常な電子銃3a,3c〜3e,3g,3hにより、鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行う。すなわち、図4に示すように、電子銃3eは、拡大後の走査幅W23に応じた走査範囲内に電子ビーム4eを走査する。これにより、電子銃3eは、本来担う分割帯8eの表面と、照射不能な電子銃3fの代わりに担う分割帯8fの一部分(具体的には半分)の表面とに対して材幅方向に連続的に電子ビーム4eを照射する。また、電子銃3gは、拡大後の走査幅W24に応じた走査範囲内に電子ビーム4gを走査する。これにより、電子銃3gは、本来担う分割帯8gの表面と、照射不能な電子銃3fの代わりに担う分割帯8fの残部分(具体的には半分)の表面とに対して材幅方向に連続的に電子ビーム4gを照射する。一方、電子銃3a,3cは、上述した状態A2の場合と同様に、分割帯8bに対する電子ビーム走査の不足を協同して補うように電子ビーム4a,4cを分割帯8bの表面に走査しつつ、分割帯8a,8cの各表面に対して各々電子ビーム4a,4cを材幅方向に連続的に照射する。他方、電子銃3d,3hは、上述した状態A1の場合と同様に、分割帯8d,8hの各表面に対して各々電子ビーム4d,4hを材幅方向に連続的に照射する。   In such a state A3, the remaining normal electron guns 3a, 3c to 3e, 3g, and 3h other than the non-irradiable electron guns 3b and 3f among the electron guns 3a to 3h are used to apply an electron beam to the surface of the steel strip 8. Scanning is performed in the material width direction. That is, as shown in FIG. 4, the electron gun 3e scans the electron beam 4e within a scanning range corresponding to the enlarged scanning width W23. As a result, the electron gun 3e is continuous in the material width direction with respect to the surface of the divided band 8e originally responsible and the surface of a part (specifically half) of the divided band 8f instead of the electron gun 3f that cannot be irradiated. The electron beam 4e is irradiated. Further, the electron gun 3g scans the electron beam 4g within a scanning range corresponding to the enlarged scanning width W24. As a result, the electron gun 3g extends in the material width direction with respect to the surface of the divided band 8g that is originally responsible and the surface of the remaining part (specifically half) of the divided band 8f that is carried instead of the electron gun 3f that cannot be irradiated. The electron beam 4g is continuously irradiated. On the other hand, the electron guns 3a and 3c scan the surface of the divided band 8b with the electron beams 4a and 4c so as to cooperatively compensate for the lack of electron beam scanning with respect to the divided band 8b, as in the state A2 described above. The electron beams 4a and 4c are continuously irradiated in the material width direction on the surfaces of the divided bands 8a and 8c, respectively. On the other hand, the electron guns 3d and 3h continuously irradiate the respective surfaces of the divided bands 8d and 8h with the electron beams 4d and 4h in the material width direction as in the state A1 described above.

一方、上述した実施の形態では、電子銃3a〜3hの各間隔d1〜d7を各々走査可能幅W11〜W18の1/2倍とした場合を本発明の具体例として示したが、本発明において、電子銃3a〜3hの各間隔d1〜d7は、各々、各走査可能幅W11〜W18の1/2倍以下に設定される。図5は、本発明による電子ビームの照射処理の別の具体例を説明するための図である。図5に示すように、電子銃3a〜3hの中に照射不能な電子銃が存在しない状態A1において、電子銃3a〜3hは、図4に示した状態A1の場合と同様に、鋼帯8の分割帯8a〜8hの各表面に対し、通常の走査幅W1〜W8に応じた各走査範囲内に電子ビーム4a〜4hを各々走査する。   On the other hand, in the above-described embodiment, the case where the intervals d1 to d7 of the electron guns 3a to 3h are each ½ times the scannable widths W11 to W18 is shown as a specific example of the present invention. The intervals d1 to d7 of the electron guns 3a to 3h are set to ½ times or less of the scannable widths W11 to W18, respectively. FIG. 5 is a diagram for explaining another specific example of the electron beam irradiation processing according to the present invention. As shown in FIG. 5, in the state A1 where there is no non-irradiable electron gun among the electron guns 3a to 3h, the electron guns 3a to 3h are similar to the state A1 shown in FIG. Electron beams 4a to 4h are scanned in the scanning ranges corresponding to the normal scanning widths W1 to W8, respectively, on the surfaces of the divided bands 8a to 8h.

上述した状態A1の後、これら電子銃3a〜3hのうち、電子銃3aにフィラメント切れ等の部品故障が予期せず発生した場合、図5に示すように、電子銃3aは、電子ビーム4aを照射不能な状態となって、鋼帯8の分割帯8aに対する電子ビーム4aの照射を停止する(状態A4)。この状態A4において、照射不能な電子銃3aと材幅方向の片側に隣り合う単一の正常な電子銃3bは、この照射不能な電子銃3aの電子ビームの走査範囲内に向けて自身の走査幅W2を拡大する。詳細には、この片側隣の電子銃3bは、この照射不能な電子銃3aの走査範囲全域に自身の走査幅W2を拡大する。これにより、この片側隣の電子銃3bは、この照射不能な電子銃3aが本来担うべき分割帯8aに対する電子ビームの走査範囲の全域を補う。   After the state A1 described above, when a component failure such as filament breakage occurs unexpectedly in the electron gun 3a among these electron guns 3a to 3h, the electron gun 3a emits the electron beam 4a as shown in FIG. Irradiation becomes impossible, and irradiation of the electron beam 4a to the divided band 8a of the steel strip 8 is stopped (state A4). In this state A4, the non-irradiable electron gun 3a and the single normal electron gun 3b adjacent to one side in the material width direction scan its own toward the scanning range of the electron beam of the non-irradiable electron gun 3a. The width W2 is increased. Specifically, the electron gun 3b adjacent to this one side expands its scanning width W2 over the entire scanning range of the electron gun 3a that cannot be irradiated. As a result, the electron gun 3b adjacent to this one side supplements the entire scanning range of the electron beam with respect to the divided band 8a that the electron gun 3a that cannot be irradiated is supposed to bear.

このような状態A4においては、電子銃3a〜3hのうちの照射不能な電子銃3aを除く残りの正常な電子銃3b〜3hにより、鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行う。すなわち、図5に示すように、電子銃3bは、拡大後の走査幅W25に応じた走査範囲内に電子ビーム4bを走査する。これにより、電子銃3bは、本来担う分割帯8bの表面と、照射不能な電子銃3aの代わりに担う分割帯8aの表面とに対して材幅方向に連続的に電子ビーム4bを照射する。一方、電子銃3c〜3hは、上述した状態A1の場合と同様に、分割帯8c〜8hの各表面に対して各々電子ビーム4c〜4hを材幅方向に連続的に照射する。   In such a state A4, the electron beam scanning with respect to the surface of the steel strip 8 is shared in the material width direction by the remaining normal electron guns 3b to 3h except the non-irradiable electron gun 3a among the electron guns 3a to 3h. And do it. That is, as shown in FIG. 5, the electron gun 3b scans the electron beam 4b within a scanning range corresponding to the enlarged scanning width W25. Thereby, the electron gun 3b continuously irradiates the electron beam 4b in the material width direction with respect to the surface of the division band 8b originally responsible and the surface of the division band 8a instead of the electron gun 3a that cannot be irradiated. On the other hand, the electron guns 3c to 3h continuously irradiate the respective surfaces of the divided bands 8c to 8h with the electron beams 4c to 4h in the material width direction as in the state A1 described above.

一方、上述した状態A1の後、電子銃3a〜3hのうち、互いに隣り合う電子銃3b,3cに予期せぬ部品故障が連続的または時間をあけて断続的に発生した場合、図5に示すように、電子銃3b,3cは、電子ビームを照射不能な状態となって、鋼帯8の分割帯8b,8cに対する電子ビーム4b,4cの照射を各々停止する(状態A5)。この状態A5において、照射不能な電子銃3aと材幅方向の片側に隣り合う単一の正常な電子銃3aは、この照射不能な電子銃3bの電子ビームの走査範囲内に向けて自身の走査幅W2を拡大する。詳細には、この片側隣の電子銃3aは、この照射不能な電子銃3bの走査範囲全域に自身の走査幅W1を拡大する。これにより、この片側隣の電子銃3aは、この照射不能な電子銃3bが本来担うべき分割帯8bに対する電子ビームの走査範囲の全域を補う。一方、照射不能な電子銃3cと材幅方向の片側に隣り合う単一の正常な電子銃3dは、この照射不能な電子銃3cの電子ビームの走査範囲内に向けて自身の走査幅W4を拡大する。詳細には、この片側隣の電子銃3dは、この照射不能な電子銃3cの走査範囲全域に自身の走査幅W4を拡大する。これにより、この片側隣の電子銃3dは、この照射不能な電子銃3cが本来担うべき分割帯8cに対する電子ビームの走査範囲の全域を補う。   On the other hand, after the above-described state A1, among the electron guns 3a to 3h, when unexpected component failures occur continuously or intermittently in the adjacent electron guns 3b and 3c, as shown in FIG. As described above, the electron guns 3b and 3c are unable to irradiate the electron beam, and stop the irradiation of the electron beams 4b and 4c to the divided bands 8b and 8c of the steel strip 8 (state A5). In this state A5, the non-irradiable electron gun 3a and the single normal electron gun 3a adjacent to one side in the material width direction scan its own toward the scanning range of the electron beam of the non-irradiable electron gun 3b. The width W2 is increased. Specifically, the electron gun 3a adjacent to one side expands its scanning width W1 over the entire scanning range of the electron gun 3b that cannot be irradiated. As a result, the electron gun 3a adjacent to one side supplements the entire scanning range of the electron beam with respect to the divided band 8b that should be assumed by the electron gun 3b that cannot be irradiated. On the other hand, the single normal electron gun 3d adjacent to the non-irradiable electron gun 3c on one side in the material width direction has its own scanning width W4 toward the scanning range of the electron beam of the non-irradiable electron gun 3c. Expanding. Specifically, the electron gun 3d adjacent to one side expands its scanning width W4 over the entire scanning range of the electron gun 3c that cannot be irradiated. As a result, the electron gun 3d adjacent to this one side compensates for the entire scanning range of the electron beam with respect to the divided band 8c that the electron gun 3c that cannot be irradiated by itself.

このような状態A5においては、電子銃3a〜3hのうちの照射不能な電子銃3b,3cを除く残りの正常な電子銃3a,3d〜3hにより、鋼帯8の表面に対する電子ビーム走査を材幅方向に分担して行う。ここで、電子銃3a,3dは、図5に示す状態A5において、照射不能な隣り合う電子銃3b,3cに対し材幅方向の両側に隣り合う正常な電子銃である。これら両隣の電子銃3a,3dは、図5に示すように、照射不能な電子銃3b,3c双方の電子ビームの走査範囲全域を協同して補うように走査幅W1,W4を各々拡大し、この走査範囲全域の電子ビーム走査の不足を協同して補う。すなわち、図5に示すように、電子銃3aは、拡大後の走査幅W26に応じた走査範囲内に電子ビーム4aを走査する。これにより、電子銃3aは、本来担う分割帯8aの表面と、照射不能な電子銃3bの代わりに担う分割帯8bの表面とに対して材幅方向に連続的に電子ビーム4aを照射する。電子銃3dは、拡大後の走査幅W27に応じた走査範囲内に電子ビーム4dを走査する。これにより、電子銃3dは、本来担う分割帯8dの表面と、照射不能な電子銃3cの代わりに担う分割帯8cの表面とに対して材幅方向に連続的に電子ビーム4dを照射する。一方、電子銃3e〜3hは、上述した状態A1の場合と同様に、分割帯8e〜8hの各表面に対して各々電子ビーム4c〜4hを材幅方向に連続的に照射する。   In such a state A5, the remaining normal electron guns 3a and 3d to 3h excluding the unirradiated electron guns 3b and 3c among the electron guns 3a to 3h are used to scan the surface of the steel strip 8 with an electron beam. Share in the width direction. Here, the electron guns 3a and 3d are normal electron guns adjacent to each other in the material width direction with respect to the adjacent electron guns 3b and 3c that cannot be irradiated in the state A5 shown in FIG. As shown in FIG. 5, these adjacent electron guns 3a and 3d respectively expand the scanning widths W1 and W4 so as to supplement the entire scanning range of the electron beams of the electron guns 3b and 3c that cannot be irradiated. This shortage of electron beam scanning over the entire scanning range is compensated by cooperation. That is, as shown in FIG. 5, the electron gun 3a scans the electron beam 4a within a scanning range corresponding to the enlarged scanning width W26. Thereby, the electron gun 3a continuously irradiates the electron beam 4a in the material width direction with respect to the surface of the divided band 8a originally responsible and the surface of the divided band 8b instead of the electron gun 3b that cannot be irradiated. The electron gun 3d scans the electron beam 4d within a scanning range corresponding to the enlarged scanning width W27. Thereby, the electron gun 3d continuously irradiates the electron beam 4d in the material width direction with respect to the surface of the division band 8d originally responsible and the surface of the division band 8c instead of the electron gun 3c that cannot be irradiated. On the other hand, the electron guns 3e to 3h continuously irradiate the respective surfaces of the divided bands 8e to 8h with the electron beams 4c to 4h in the material width direction as in the state A1 described above.

上述した状態A4,A5における電子ビームの照射処理を電子ビーム照射装置1が実行可能となるためには、この電子ビーム照射装置1に設けられる電子銃3a〜3hの各走査可能幅W11〜W18を、電子銃3a〜3hの各間隔d1〜d7(図2参照)の3倍以上の走査幅に設定すればよい。すなわち、これら電子銃3a〜3hの各間隔d1〜d7は、各々、各走査可能幅W11〜W18の1/3倍以下に設定すればよい。   In order for the electron beam irradiation apparatus 1 to execute the electron beam irradiation processing in the states A4 and A5 described above, the scannable widths W11 to W18 of the electron guns 3a to 3h provided in the electron beam irradiation apparatus 1 are set. The scanning width may be set to three times or more of the intervals d1 to d7 (see FIG. 2) of the electron guns 3a to 3h. That is, the distances d1 to d7 of the electron guns 3a to 3h may be set to 1/3 times or less of the scannable widths W11 to W18, respectively.

以上、説明したように、本発明の実施の形態では、順次搬送される鋼帯の表面に電子ビームを照射する複数の電子銃を、電子ビームの走査可能幅の1/2以下となる間隔をもって各々隣り合い且つ鋼帯の材幅方向に等間隔に配置し、これら複数の電子銃により、鋼帯表面に対して電子ビームを材幅方向に連続的に照射する電子ビーム走査を材幅方向に分担して行い、これら複数の電子銃の中に電子ビームを照射不能な電子銃がある場合、これら複数の電子銃のうち、照射不能な電子銃と隣り合う正常な電子銃の電子ビームの走査幅を照射不能な電子銃の電子ビームの走査範囲全域に拡大し、走査幅拡大後の電子銃を含み且つ照射不能な電子銃を除く残りの電子銃により、鋼帯表面に対する電子ビーム走査を材幅方向に分担して行っている。   As described above, in the embodiment of the present invention, a plurality of electron guns that irradiate an electron beam onto the surface of a steel strip that is sequentially conveyed are provided with an interval that is 1/2 or less of the scannable width of the electron beam. Electron beam scanning is performed in the material width direction, which is adjacent to each other and arranged at equal intervals in the material width direction of the steel strip, and with the plurality of electron guns, the electron beam is continuously irradiated in the material width direction on the surface of the steel strip. If there is an electron gun that cannot be irradiated with an electron beam among the plurality of electron guns, scanning of the electron beam of a normal electron gun adjacent to the electron gun that cannot be irradiated among the plurality of electron guns The width of the electron beam of the non-irradiable electron gun is expanded over the entire scanning range of the electron beam, and the remaining electron gun including the electron gun after the scanning width expansion and excluding the non-irradiable electron gun is used to scan the surface of the steel strip. Shares in the width direction.

このため、搬送方向に走行する鋼帯の表面に対して電子ビームの照射処理(電子ビーム走査)を順次行う操業期間中、フィラメント切れ等の部品故障に例示される突発的な不具合に起因して、複数の電子銃のうちの何れの電子銃が予期せず電子ビームを照射不能になった場合であっても、この電子ビーム走査の操業を停止することなく、照射不能な電子銃が本来担うべき鋼帯表面の電子ビーム走査範囲の不足を、この照射不能な電子銃と隣り合う正常な電子銃の電子ビーム走査によって補うことができる。これにより、照射不能な電子銃の補修等に起因して電子ビーム走査の操業ラインを予定外の期間に急遽停止する事態を回避できるとともに、複数の電子銃同士が電子ビームの照射に影響を与え合う(例えば電子ビームの走査範囲を重ね合う)ことなく、処理対象の鋼帯表面の全材幅に亘って電子ビームの照射処理を安定して継続することができる。この結果、鋼帯製品の生産効率を損なうことなく、鉄損の低減化等の鋼帯の特性改善に好適な電子ビームの照射処理の操業を安定して行うことができる。   For this reason, during the operation period in which the electron beam irradiation process (electron beam scanning) is sequentially performed on the surface of the steel strip traveling in the conveyance direction, due to a sudden failure exemplified by component failure such as filament breakage. Even if any of the plurality of electron guns unexpectedly becomes unable to irradiate an electron beam, the electron gun that cannot be irradiated is inherently responsible without stopping the operation of the electron beam scanning. The shortage of the electron beam scanning range on the surface of the steel strip can be compensated by the electron beam scanning of a normal electron gun adjacent to the non-irradiable electron gun. As a result, it is possible to avoid a situation where the operation line of the electron beam scanning is suddenly stopped during an unscheduled period due to repair of an unirradiated electron gun or the like, and a plurality of electron guns affect the irradiation of the electron beam. Without matching (for example, overlapping the scanning range of the electron beam), the irradiation process of the electron beam can be stably continued over the entire width of the steel strip surface to be processed. As a result, it is possible to stably carry out the operation of the electron beam irradiation treatment suitable for improving the properties of the steel strip such as reduction of iron loss without impairing the production efficiency of the steel strip product.

また、本発明の実施の形態では、照射不能な電子銃と材幅方向の両側に隣り合う双方の正常な電子銃の各電子ビームの走査幅を、照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように拡大している。このため、これら両隣の正常な電子銃同士が電子ビームの走査範囲を不用意に重ね合うことなく、照射不能な電子銃に起因する電子ビーム走査範囲の不足を確実に補うことができる。この結果、処理対象の鋼帯表面の全材幅に亘って電子ビームの照射処理を過不足なく安定して継続することができる。   In the embodiment of the present invention, the scanning width of each electron beam of the electron gun that cannot be irradiated and both normal electron guns adjacent to both sides in the material width direction is set to the scanning range of the electron beam of the electron gun that cannot be irradiated. It is expanding to make up for the entire area in cooperation. For this reason, it is possible to reliably make up for the shortage of the electron beam scanning range caused by the electron gun that cannot be irradiated, without inadvertently overlapping the scanning ranges of the electron beams between the normal electron guns on both sides. As a result, the electron beam irradiation process can be continued stably over and over the entire width of the steel strip surface to be processed.

さらに、本発明の実施の形態では、複数の電子銃の中に照射不能な電子銃が発生した場合、これら複数の電子銃の中から照射不能な電子銃を特定可能な特定情報を報知することにより、照射不能な電子銃が発生した旨を報知している。このため、これら複数の電子銃による電子ビームの照射状況を常時確認できるとともに、報知された特定情報をもとに照射不能な電子銃を容易に特定する(見分ける)ことができる。これにより、照射不能な電子銃が過度に多発する以前の適切なタイミングに、照射不能な電子銃の補修を行うことができる。この結果、電子ビーム走査の操業ラインの予定外な停止を一層確実に回避できるとともに、処理対象の鋼帯表面の全材幅に亘る電子ビームの照射処理の安定操業を促進することができる。   Furthermore, in the embodiment of the present invention, when an electron gun that cannot be irradiated is generated in the plurality of electron guns, the specific information that can specify the electron gun that cannot be irradiated from the plurality of electron guns is notified. Is informing that an unirradiated electron gun has occurred. Therefore, it is possible to always confirm the irradiation state of the electron beam by the plurality of electron guns, and to easily identify (distinguish) an electron gun that cannot be irradiated based on the notified specific information. This makes it possible to repair the non-irradiated electron gun at an appropriate timing before the non-irradiated electron gun is excessively generated. As a result, it is possible to more reliably avoid an unexpected stop of the operation line of the electron beam scanning, and it is possible to promote the stable operation of the electron beam irradiation process over the entire width of the steel strip surface to be processed.

なお、上述した実施の形態では、8つの電子銃3a〜3hを備えた電子ビーム照射装置1を例示していたが、本発明は、これに限定されるものではない。すなわち、本発明において、電子ビーム照射装置1に設ける電子銃の配置数は、特に8つに限定されず、複数(2つ以上)であればよい。これに対応して、鋼帯8を材幅方向に等分割する分割帯の数は、特に8つ(8等分)に限定されず、電子ビーム照射装置1に設ける電子銃の配置数と同数であればよい。   In the above-described embodiment, the electron beam irradiation apparatus 1 including the eight electron guns 3a to 3h has been exemplified. However, the present invention is not limited to this. That is, in the present invention, the number of electron guns provided in the electron beam irradiation apparatus 1 is not particularly limited to eight, and may be a plurality (two or more). Correspondingly, the number of dividing bands for equally dividing the steel strip 8 in the material width direction is not particularly limited to eight (equivalent to eight), and is the same as the number of electron guns provided in the electron beam irradiation apparatus 1. If it is.

また、上述した実施の形態では、図1等に例示されるように、鋼帯8の搬送方向に対して垂直な材幅方向に等間隔に複数の電子銃を配置していたが、本発明は、これに限定されるものではない。本発明において、鋼帯8に例示される金属ストリップの材幅方向は、金属ストリップの両側の側端部の一端から他端に向かう方向である。この材幅方向には、金属ストリップの搬送方向に対して垂直な方向は勿論、この搬送方向に対し傾斜して金属ストリップの両側の側端部の一端から他端に向かう方向が含まれる。すなわち、本発明にかかる電子ビーム照射装置に設けられる複数の電子銃は、金属ストリップの搬送方向に対して傾斜する材幅方向に等間隔に配置されてもよい。   In the above-described embodiment, as illustrated in FIG. 1 and the like, a plurality of electron guns are arranged at equal intervals in the material width direction perpendicular to the conveying direction of the steel strip 8, but the present invention However, the present invention is not limited to this. In the present invention, the material width direction of the metal strip exemplified in the steel strip 8 is a direction from one end to the other end of the side end portions on both sides of the metal strip. The material width direction includes not only a direction perpendicular to the conveying direction of the metal strip but also a direction inclined from the one end to the other end of the side end on both sides of the metal strip. That is, the plurality of electron guns provided in the electron beam irradiation apparatus according to the present invention may be arranged at equal intervals in the material width direction inclined with respect to the transport direction of the metal strip.

さらに、上述した実施の形態では、照射不能な電子銃と材幅方向の両側に隣り合う双方の正常な電子銃の各走査幅を、照射不能な電子銃の電子ビームの走査幅中心まで拡大する等によって、互いに同じ幅分、拡大していたが、本発明は、これに限定されるものではない。すなわち、本発明において、これら両隣の正常な電子銃の各走査幅は、照射不能な電子銃の走査範囲に向けて互いに同じ幅分、拡大してもよいし、互いに異なる幅分、拡大してもよい。何れの場合であっても、照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように、これら両隣の正常な電子銃の各走査幅を拡大すればよい。   Furthermore, in the above-described embodiment, the scanning widths of the electron gun that cannot be irradiated and the normal electron guns adjacent to both sides in the material width direction are expanded to the center of the scanning width of the electron beam of the electron gun that cannot be irradiated. However, the present invention is not limited to this. That is, in the present invention, the respective scanning widths of the normal electron guns on both sides may be enlarged by the same width or by different widths toward the scanning range of the non-irradiated electron gun. Also good. In any case, the scanning widths of the normal electron guns on both sides may be enlarged so that the entire scanning range of the electron beam of the non-irradiated electron gun is cooperatively compensated.

また、上述した実施の形態では、照射不能な電子銃の特定情報を画面表示することにより、複数の電子銃の中に照射不能な電子銃が発生した旨を報知する報知部5を例示したが、本発明は、これに限定されるものではない。すなわち、報知部5は、光源またはスピーカ等を用いて実現され、照射不能な電子銃が発生した旨を報知する際、光の点灯位置、点灯色、点灯方式(例えば点滅等)等の光出力状態によって上記特定情報を報知してもよいし、音声またはブザー音等の音情報の出力によって上記特定情報を報知してもよい。あるいは、報知部5は、画面表示、光出力、および音情報の出力を適宜組み合わせて上記特定情報を報知し、これにより、照射不能な電子銃が発生した旨を報知してもよい。   Further, in the above-described embodiment, the notification unit 5 that notifies that the non-irradiable electron gun has occurred in the plurality of electron guns by displaying the specific information of the non-irradiable electron gun on the screen is illustrated. However, the present invention is not limited to this. That is, the notification unit 5 is realized by using a light source, a speaker, or the like, and outputs a light output such as a light lighting position, a lighting color, a lighting method (for example, blinking) when notifying that an unirradiated electron gun has occurred. The specific information may be notified depending on the state, or the specific information may be notified by outputting sound information such as sound or buzzer sound. Alternatively, the notification unit 5 may notify the specific information by appropriately combining screen display, light output, and sound information output, thereby notifying that an unirradiated electron gun has occurred.

さらに、上述した実施の形態では、処理対象の金属ストリップとして鋼帯を例示したが、これに限らず、本発明にかかる電子ビーム照射装置および電子ビーム照射方法によって電子ビームの照射処理が行われる金属ストリップは、鋼以外の鉄合金の帯体であってもよいし、銅またはアルミニウム等の鉄合金以外の帯体であってもよい。すなわち、本発明において、処理対象の金属ストリップは、鋼帯、鋼帯以外の鉄合金帯、鉄合金帯以外の金属帯のいずれであってもよく、また、鋼種等の金属帯の種類(例えば強度や組成等)も特に問われない。   Furthermore, in the above-described embodiment, the steel strip is exemplified as the metal strip to be processed. However, the present invention is not limited thereto, and the metal subjected to the electron beam irradiation processing by the electron beam irradiation apparatus and the electron beam irradiation method according to the present invention. The strip may be a band of an iron alloy other than steel, or may be a band other than an iron alloy such as copper or aluminum. That is, in the present invention, the metal strip to be treated may be a steel strip, an iron alloy strip other than the steel strip, or a metal strip other than the iron alloy strip, and the type of metal strip such as a steel type (for example, The strength and composition are not particularly limited.

また、上述した実施の形態により本発明が限定されるものではなく、上述した各構成要素を適宜組み合わせて構成したものも本発明に含まれる。その他、上述した実施の形態に基づいて当業者等によりなされる他の実施の形態、実施例および運用技術等は全て本発明に含まれる。   Further, the present invention is not limited by the above-described embodiment, and the present invention includes a configuration in which the above-described constituent elements are appropriately combined. In addition, all other embodiments, examples, operation techniques, and the like made by those skilled in the art based on the above-described embodiments are included in the present invention.

1 電子ビーム照射装置
2 真空槽
3a〜3h 電子銃
4a〜4h 電子ビーム
5 報知部
6 制御部
8 鋼帯
8a〜8h 分割帯
DESCRIPTION OF SYMBOLS 1 Electron beam irradiation apparatus 2 Vacuum chamber 3a-3h Electron gun 4a-4h Electron beam 5 Notification part 6 Control part 8 Steel strip 8a-8h Division | segmentation zone

Claims (6)

順次搬送される金属ストリップの表面に対して電子ビームを前記金属ストリップの材幅方向に連続的に照射する電子ビーム走査を行う電子ビーム照射装置において、
前記金属ストリップの表面に照射する電子ビームの走査可能幅の1/2以下となる間隔をもって各々隣り合い、且つ前記材幅方向に等間隔に配置される複数の電子銃と、
前記金属ストリップの表面に対する前記電子ビーム走査を前記材幅方向に分担して行うように前記複数の電子銃を制御し、前記複数の電子銃の中に電子ビームを照射不能な電子銃がある場合、前記複数の電子銃のうち、前記照射不能な電子銃と隣り合う正常な電子銃の電子ビームの走査幅を、前記正常な電子銃の電子ビームの走査範囲全域を含むと同時に前記照射不能な電子銃の電子ビームの走査範囲全域を補うように拡大し、前記照射不能な電子銃を除く残りの電子銃に、前記金属ストリップの表面に対する前記電子ビーム走査を前記材幅方向に分担して行わせる制御部と、
を備えたことを特徴とする電子ビーム照射装置。
In an electron beam irradiation apparatus that performs electron beam scanning in which an electron beam is continuously irradiated in the material width direction of the metal strip onto the surface of the metal strip that is sequentially conveyed,
A plurality of electron guns that are adjacent to each other with an interval of ½ or less of the scannable width of the electron beam applied to the surface of the metal strip and arranged at equal intervals in the material width direction;
When the plurality of electron guns are controlled so that the electron beam scanning with respect to the surface of the metal strip is performed in the material width direction, and among the plurality of electron guns, there is an electron gun that cannot emit an electron beam The scanning width of the normal electron gun adjacent to the non-irradiable electron gun among the plurality of electron guns includes the entire scanning range of the normal electron gun, and at the same time the non-irradiable The electron gun is expanded so as to cover the entire scanning range of the electron beam, and the electron beam scanning with respect to the surface of the metal strip is performed in the material width direction for the remaining electron guns excluding the non-irradiable electron gun. A control unit,
An electron beam irradiation apparatus comprising:
前記制御部は、前記照射不能な電子銃と前記材幅方向の両側に隣り合う双方の正常な電子銃の各電子ビームの走査幅を、前記照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように拡大することを特徴とする請求項1に記載の電子ビーム照射装置。   The controller controls the scanning width of each electron beam of the non-irradiable electron gun and both normal electron guns adjacent to both sides in the material width direction, and the entire scanning range of the electron beam of the non-irradiable electron gun. The electron beam irradiation apparatus according to claim 1, wherein the electron beam irradiation apparatus is enlarged so as to supplement in cooperation. 前記照射不能な電子銃が発生した旨を報知する報知部をさらに備え、
前記制御部は、前記複数の電子銃の中から前記照射不能な電子銃を特定可能な特定情報を報知するように前記報知部を制御することを特徴とする請求項1または2に記載の電子ビーム照射装置。
A notification unit for notifying that the non-irradiable electron gun has occurred;
3. The electron according to claim 1, wherein the control unit controls the notification unit so as to notify specific information capable of specifying the electron gun that cannot be irradiated from the plurality of electron guns. Beam irradiation device.
順次搬送される金属ストリップの表面に照射する電子ビームの走査可能幅の1/2以下となる間隔をもって各々隣り合い且つ前記金属ストリップの材幅方向に等間隔に配置した複数の電子銃により、前記金属ストリップの表面に対して電子ビームを前記材幅方向に連続的に照射する電子ビーム走査を、前記材幅方向に分担して行う電子ビーム照射ステップと、
前記複数の電子銃の中に電子ビームを照射不能な電子銃がある場合、前記複数の電子銃のうち、前記照射不能な電子銃と隣り合う正常な電子銃の電子ビームの走査幅を、前記正常な電子銃の電子ビームの走査範囲全域を含むと同時に前記照射不能な電子銃の電子ビームの走査範囲全域を補うように拡大する走査幅拡大ステップと、
を含み、
前記電子ビーム照射ステップは、前記照射不能な電子銃がある場合、前記複数の電子銃のうちの前記照射不能な電子銃を除く残りの電子銃により、前記金属ストリップの表面に対する前記電子ビーム走査を前記材幅方向に分担して行うことを特徴とする電子ビーム照射方法。
A plurality of electron guns arranged adjacent to each other at equal intervals in the material width direction of the metal strip with an interval of 1/2 or less of the scannable width of the electron beam irradiated on the surface of the metal strip that is sequentially conveyed, An electron beam irradiation step in which electron beam scanning for continuously irradiating the surface of the metal strip with an electron beam in the material width direction is performed in the material width direction;
If there is an electron gun for disabling an electron beam into said plurality of electron guns, among the plurality of electron guns, the scan width of the electron beam normal electron gun adjacent to the irradiation non electron gun, the to include scanning the entire range of normal electron gun of the electron beam and the scanning width expansion step of expanding simultaneously to compensate for scanning the whole range of the irradiation non electron gun of the electron beam,
Including
In the electron beam irradiation step, when there is an electron gun that cannot be irradiated, the electron beam scanning with respect to the surface of the metal strip is performed by the remaining electron guns except the non-irradiable electron gun among the plurality of electron guns. An electron beam irradiation method, which is performed in the material width direction.
前記走査幅拡大ステップは、前記照射不能な電子銃と前記材幅方向の両側に隣り合う双方の正常な電子銃の各電子ビームの走査幅を、前記照射不能な電子銃の電子ビームの走査範囲全域を協同して補うように拡大することを特徴とする請求項4に記載の電子ビーム照射方法。   In the scanning width expansion step, the scanning width of each electron beam of the non-irradiable electron gun and both normal electron guns adjacent to both sides in the material width direction is set to the scanning range of the electron beam of the non-irradiable electron gun. 5. The electron beam irradiation method according to claim 4, wherein the entire area is enlarged so as to supplement the entire area. 前記複数の電子銃の中から前記照射不能な電子銃を特定可能な特定情報を報知して、前記照射不能な電子銃が発生した旨を報知する報知ステップをさらに含むことを特徴とする請求項4または5に記載の電子ビーム照射方法。
The information processing method further includes a notification step of notifying that the non-irradiable electron gun is generated by notifying specific information capable of specifying the unirradiable electron gun from the plurality of electron guns. 6. The electron beam irradiation method according to 4 or 5.
JP2013242958A 2013-11-25 2013-11-25 Electron beam irradiation apparatus and electron beam irradiation method Active JP6040920B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013242958A JP6040920B2 (en) 2013-11-25 2013-11-25 Electron beam irradiation apparatus and electron beam irradiation method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013242958A JP6040920B2 (en) 2013-11-25 2013-11-25 Electron beam irradiation apparatus and electron beam irradiation method

Publications (2)

Publication Number Publication Date
JP2015101758A JP2015101758A (en) 2015-06-04
JP6040920B2 true JP6040920B2 (en) 2016-12-07

Family

ID=53377728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013242958A Active JP6040920B2 (en) 2013-11-25 2013-11-25 Electron beam irradiation apparatus and electron beam irradiation method

Country Status (1)

Country Link
JP (1) JP6040920B2 (en)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0467654A (en) * 1990-07-09 1992-03-03 Nec Kyushu Ltd Repair device provided with parallel processing function
JPH04160115A (en) * 1990-10-24 1992-06-03 Kawasaki Steel Corp Device for irradiation with electron beam
JPH05209215A (en) * 1991-11-22 1993-08-20 Kawasaki Steel Corp Electron beam illuminator
JPH06116654A (en) * 1992-08-20 1994-04-26 Kawasaki Steel Corp Method for irradiating running strip with energy beam
JPH09245712A (en) * 1996-03-13 1997-09-19 Mitsubishi Electric Corp Cathode heating monitoring device and monitoring method thereof
JP3352361B2 (en) * 1997-07-10 2002-12-03 本田技研工業株式会社 Laser welding method and apparatus
JP5533415B2 (en) * 2010-08-06 2014-06-25 Jfeスチール株式会社 Electron beam irradiation method
JP5870580B2 (en) * 2011-09-26 2016-03-01 Jfeスチール株式会社 Method for producing grain-oriented electrical steel sheet

Also Published As

Publication number Publication date
JP2015101758A (en) 2015-06-04

Similar Documents

Publication Publication Date Title
JP2011110567A5 (en) Laser processing method and laser processing apparatus
US9962789B2 (en) Welding method
US10076807B2 (en) Welding method
WO2002066197A1 (en) Laser processing device and processing method
JP2009183970A (en) Laser welding method, laser welding apparatus, and welding member
JP5877649B2 (en) Sorting device
WO2011105022A1 (en) Alternating-current welding method and alternating-current welding device
JP2008105043A (en) Plasma cutting machine and plasma power source system
JP6040920B2 (en) Electron beam irradiation apparatus and electron beam irradiation method
EP3639966B1 (en) Material cutting using laser pulses
KR20140118151A (en) welder of exclusive use of ship block
EP3677374B1 (en) Manufacturing method for join body and manufacturing apparatus for join body
JP2015139819A (en) Padding method, and turbine blade
JP2006181621A (en) Spot resistance welding equipment
JP6689238B2 (en) Temporary welding method and temporary welding apparatus
JP2007283337A (en) Method of manufacturing butt-welded metal plate
CN115138873A (en) Multi-laser scanning printing system and multi-laser synchronous coupling scanning printing method
JP2008213005A (en) Laser welding method
JP6012326B2 (en) Electron beam welding method
JP2016196016A (en) Welding method
KR20200008088A (en) Laser cutting system
JP2016030289A (en) Welding device and welding method
JPH10113782A (en) Laser beam welding equipment and method therefor
JP2015229175A (en) Arc-welding system, arc-welding method, and welded article manufacturing method
JPH11267855A (en) Electron beam deflecting device and deflection processing method by electron beam

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20150624

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20160318

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160412

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160530

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20161011

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20161024

R150 Certificate of patent or registration of utility model

Ref document number: 6040920

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250