JP6032369B2 - 情報処理装置、診断方法、診断プログラム、及び情報処理システム - Google Patents

情報処理装置、診断方法、診断プログラム、及び情報処理システム Download PDF

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JP6032369B2
JP6032369B2 JP2015529290A JP2015529290A JP6032369B2 JP 6032369 B2 JP6032369 B2 JP 6032369B2 JP 2015529290 A JP2015529290 A JP 2015529290A JP 2015529290 A JP2015529290 A JP 2015529290A JP 6032369 B2 JP6032369 B2 JP 6032369B2
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information processing
diagnosis
unit
processing apparatus
abnormality
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JPWO2015015621A1 (ja
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金野　雄次
雄次 金野
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Fujitsu Ltd
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Fujitsu Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2015529290A 2013-08-01 2013-08-01 情報処理装置、診断方法、診断プログラム、及び情報処理システム Active JP6032369B2 (ja)

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PCT/JP2013/070923 WO2015015621A1 (fr) 2013-08-01 2013-08-01 Dispositif de traitement d'informations, procédé de diagnostic, programme de diagnostic, et système de traitement d'informations

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JP6032369B2 true JP6032369B2 (ja) 2016-11-24
JPWO2015015621A1 JPWO2015015621A1 (ja) 2017-03-02

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JP (1) JP6032369B2 (fr)
WO (1) WO2015015621A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6402619B2 (ja) * 2014-12-24 2018-10-10 富士通株式会社 情報処理装置、情報処理システム及び監視方法
JP7436060B2 (ja) 2022-02-24 2024-02-21 Ｎｅｃプラットフォームズ株式会社 管理装置、制御方法、及びプログラム

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08129495A (ja) * 1994-11-01 1996-05-21 Toshiba Corp コンピュータシステム及びそのセルフテスト方法
JPH11306039A (ja) * 1998-04-23 1999-11-05 Fujitsu Ltd 試験プログラム実行制御装置，試験プログラム実行制御方法およびその方法をコンピュータに実行させるプログラムを記録したコンピュータ読み取り可能な記録媒体
JP2000066916A (ja) * 1998-08-26 2000-03-03 Minolta Co Ltd 自己診断装置及び方法並びに自己診断プログラムを記録したコンピュータ読み取り可能な記録媒体
JP2008077378A (ja) * 2006-09-21 2008-04-03 Nec Corp 起動診断方式、起動診断方法およびプログラム
WO2008120309A1 (fr) * 2007-03-28 2008-10-09 Fujitsu Limited Appareil électronique, procédé pour commander un appareil électronique, programme pour commander un appareil électronique
JP2009003557A (ja) * 2007-06-19 2009-01-08 Hitachi Computer Peripherals Co Ltd 装置起動時診断方法、診断プログラム及び起動時診断装置
JP2010122790A (ja) * 2008-11-18 2010-06-03 Mitsubishi Electric Corp 診断装置及びコンピュータプログラム及び診断方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08129495A (ja) * 1994-11-01 1996-05-21 Toshiba Corp コンピュータシステム及びそのセルフテスト方法
JPH11306039A (ja) * 1998-04-23 1999-11-05 Fujitsu Ltd 試験プログラム実行制御装置，試験プログラム実行制御方法およびその方法をコンピュータに実行させるプログラムを記録したコンピュータ読み取り可能な記録媒体
JP2000066916A (ja) * 1998-08-26 2000-03-03 Minolta Co Ltd 自己診断装置及び方法並びに自己診断プログラムを記録したコンピュータ読み取り可能な記録媒体
JP2008077378A (ja) * 2006-09-21 2008-04-03 Nec Corp 起動診断方式、起動診断方法およびプログラム
WO2008120309A1 (fr) * 2007-03-28 2008-10-09 Fujitsu Limited Appareil électronique, procédé pour commander un appareil électronique, programme pour commander un appareil électronique
JP2009003557A (ja) * 2007-06-19 2009-01-08 Hitachi Computer Peripherals Co Ltd 装置起動時診断方法、診断プログラム及び起動時診断装置
JP2010122790A (ja) * 2008-11-18 2010-06-03 Mitsubishi Electric Corp 診断装置及びコンピュータプログラム及び診断方法

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JPWO2015015621A1 (ja) 2017-03-02
WO2015015621A1 (fr) 2015-02-05

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