JP5966351B2 - 磁場計測装置 - Google Patents

磁場計測装置 Download PDF

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JP5966351B2
JP5966351B2 JP2011283013A JP2011283013A JP5966351B2 JP 5966351 B2 JP5966351 B2 JP 5966351B2 JP 2011283013 A JP2011283013 A JP 2011283013A JP 2011283013 A JP2011283013 A JP 2011283013A JP 5966351 B2 JP5966351 B2 JP 5966351B2
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magnetic field
light
phase difference
periodic signal
measurement apparatus
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JP2013134086A (ja
JP2013134086A5 (enExample
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長坂 公夫
公夫 長坂
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Seiko Epson Corp
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Seiko Epson Corp
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JP2011283013A 2011-12-26 2011-12-26 磁場計測装置 Active JP5966351B2 (ja)

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JP2011283013A JP5966351B2 (ja) 2011-12-26 2011-12-26 磁場計測装置

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JP2011283013A JP5966351B2 (ja) 2011-12-26 2011-12-26 磁場計測装置

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JP2013134086A JP2013134086A (ja) 2013-07-08
JP2013134086A5 JP2013134086A5 (enExample) 2015-02-26
JP5966351B2 true JP5966351B2 (ja) 2016-08-10

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6299128B2 (ja) * 2013-09-24 2018-03-28 セイコーエプソン株式会社 測定装置および磁気測定装置
JP6391370B2 (ja) * 2014-08-29 2018-09-19 キヤノン株式会社 光ポンピング磁力計及び磁気センシング方法
US10396809B2 (en) 2016-02-19 2019-08-27 Seiko Epson Corporation Atomic cell, atomic cell manufacturing method, quantum interference device, atomic oscillator, electronic apparatus, and vehicle
CN114217249B (zh) * 2021-12-16 2023-01-24 中国人民解放军军事科学院国防科技创新研究院 一种基于激光偏振调制的无盲区磁场测量装置及测量方法
JP2025127696A (ja) * 2024-02-21 2025-09-02 シチズンファインデバイス株式会社 磁界センサ装置
CN118033499B (zh) * 2024-02-23 2024-09-20 北京航空航天大学 一种单光束nmor原子磁强计三轴矢量磁场测量方法

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JPS61195372A (ja) * 1985-02-26 1986-08-29 Toshiba Corp 磁界測定装置

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