JP5922322B2 - Manufacturing method of gap adjusting type polishing tool - Google Patents

Manufacturing method of gap adjusting type polishing tool Download PDF

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JP5922322B2
JP5922322B2 JP2009248438A JP2009248438A JP5922322B2 JP 5922322 B2 JP5922322 B2 JP 5922322B2 JP 2009248438 A JP2009248438 A JP 2009248438A JP 2009248438 A JP2009248438 A JP 2009248438A JP 5922322 B2 JP5922322 B2 JP 5922322B2
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workpiece
base material
polishing
abrasive
gap
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JP2011093033A (en
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谷 泰弘
泰弘 谷
良一 広川
良一 広川
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Ritsumeikan Trust
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本発明は、工作物との間に研磨材を含有するスラリーを供給しながら前記工作物とを相対的に移動させて工作物を高精度に研磨(ラップ研磨)するラップ定盤や研磨パッドなどの隙間調整型研磨具の製造方法に関するものである。 The present invention provides a lapping surface plate or polishing pad for polishing a workpiece with high precision (lap polishing) by relatively moving the workpiece while supplying a slurry containing an abrasive between the workpiece and the like. This invention relates to a method for manufacturing the gap adjusting type polishing tool.

従来、ディスプレイ用の液晶硝子、板硝子、光学用のレンズプリズム、更には、半導体のウエハーのような工作物の表面および端面はきわめて高度な平滑度および平坦度が求められることから前工程のラップ研磨を含めて高精度の研磨仕上げが要求される。   Conventionally, liquid crystal glass for displays, plate glass, optical lens prisms, and surfaces and end faces of workpieces such as semiconductor wafers require extremely high smoothness and flatness. High-precision polishing finish is required.

そこで、例えば粒径が0.5〜10μm程度の研磨材を含有するスラリーを工作物との間に供給しながら前記工作物とを相対的に移動させて工作物を研磨する例えばラップ定盤や次工程に用いられる研磨パッドのような隙間調整型研磨具が知られている。   Therefore, for example, a lapping plate that polishes the workpiece by relatively moving the workpiece while supplying a slurry containing an abrasive having a particle size of about 0.5 to 10 μm to the workpiece. A gap adjusting type polishing tool such as a polishing pad used in the next process is known.

そして、研磨パッドに含有される研磨材の粒径を同じ範囲の径とすることにより、研磨スラリーによる研磨と研磨パッドによる研磨レートの差をなくし、加工面の平坦度を向上させる手段が特開2007−250166号公報に提示されている。   And means for improving the flatness of the processed surface by eliminating the difference between the polishing by the polishing slurry and the polishing rate by the polishing pad by setting the particle size of the abrasive contained in the polishing pad in the same range. It is presented in 2007-250166.

しかしながら、前述の如くきわめて高度な平滑度および平坦度が求められる工作部の表面を研磨するには前述の如く粒径が0.5〜2.0μm程度の研磨材を用いるものであり、研磨材と工作部との隙間も0.5〜2.0μm程度となり、使用する研磨粒の違いによる研磨斑は解消されるが、供給する研磨ラリーが研磨領域の表面全体に行き渡らず均質な研磨面を得られないという問題があり、特に、大型(広い研磨面を有する)工作物の研磨においてこのような事態が生じる。 However, as described above, an abrasive having a particle size of about 0.5 to 2.0 μm is used to polish the surface of a work part that requires extremely high smoothness and flatness as described above. and the gap between the work unit also becomes about 0.5 to 2.0 [mu] m, although the polishing unevenness by abrasive particles of differences to be used is eliminated, homogeneous polishing surface without polishing slurries is spread over the entire surface of the polishing region and supplies In particular, such a situation occurs in polishing a large-sized workpiece (having a wide polishing surface).

また、例えば特開2005−177945号公報に提示されているように、研磨パッドの研磨領域表面に一定の溝を形成して研磨スラリーが全体に行き渡るようにした研磨パッドが提示されている。   Further, as disclosed in, for example, Japanese Patent Application Laid-Open No. 2005-177945, a polishing pad is proposed in which a certain groove is formed on the surface of the polishing region of the polishing pad so that the polishing slurry can be spread over the entire surface.

ところが、前記溝を有する研磨パッドやラップ定盤のような隙間調整型研磨具は溝の形状が工作物に転写してうねりを生じさせる、という問題がある。   However, a gap adjusting type polishing tool such as a polishing pad having a groove or a lapping surface plate has a problem that the shape of the groove is transferred to a workpiece to cause undulation.

特開2007−250166号公報JP 2007-250166 A 特開2005−177945号公報JP 2005-177945 A

本発明は、前記従来の研磨パッド及びラップ定盤のような隙間調整型研磨具が有している問題点を解決するためになされたものであり、きわめて高度な滑度および平坦度が求められる高精度の研磨仕上げを行うことはいうまでもく、大型の工作物にあっても中心部と周辺部で研磨特性の差がなく研磨が行る隙間調整型研磨具の製造方法を提供することを課題とする。 The present invention, wherein has been made to solve the clearance adjustment type polishing tool is being problems have, such as a conventional polishing pad and the lap plate, extremely high flat Namerado and flatness are determined is also rather than to say that performing final polishing of high accuracy, polishing no difference in polishing characteristics at the central portion and the peripheral portion even in a large workpiece manufacturing method of the row e Ru clearance adjustment type grinding tool The issue is to provide.

前記課題を解決するためになされた本発明は、研磨パッドを形成する基材と工作物との間に直径0.5〜10μmの粒径を有する研磨材を含有するスラリーを供給しながら前記基材と工作物とを相対的に移動させるとともに工作物に圧力を掛けて前記基材と工作物との間を流動する研磨材により前記工作物を研磨す隙間調整型研磨具の製造方法であって直径0.05〜0.mmの粒径で前記工作物の材質よりは軟らかくて、前記基材よりは硬く形成された硬質粒子を含有させて研磨面である基材表面を切削処理して基材表面に突出している前記硬質粒子により前記工作物と基材表面との間に形成される隙間を介して前記研磨材を含有するスラリーを前記工作物の表面全体に円滑に供給して前記工作物の表面全体を均一な仕上げ面にすることを特徴とする。 The present invention has been made to solve the above problems, the base while supplying a slurry containing abrasive material having a particle size diameter 0.5~10μm between the workpiece and the base material to form a polishing pad method for manufacturing a gap-adjusting polishing tool you polish the workpiece by abrasive flowing between wood and the workpiece and the relatively moving Rutotomoni workpiece to the substrate under pressure and the workpiece With a diameter of 0 . 05 to 0.5 softer than the material of the workpiece with a grain size of mm, the base harder formed substrate surface cutting treatment to the substrate surface is a polished surface contain a hard particles than material The slurry containing the abrasive is smoothly supplied to the entire surface of the workpiece through a gap formed between the workpiece and the substrate surface by the hard particles protruding to the workpiece. It is characterized in that the entire surface is a uniform finished surface.

また、本発明において、配合される硬質粒子は加工される材質よりは軟らかく、研磨パッド及びラップ定盤よりは硬い、例えばガラスビーズ、ポリスチレン、酸化チタン、EVA、PP、PET等の各種熱可塑性ポリマ−、アパタイト粒子、シリカ多孔質体、他の砥粒である場合が好ましく、前記硬質粒子の配合量が1〜20体積%であるとよい。   Further, in the present invention, the hard particles to be blended are softer than the material to be processed and harder than the polishing pad and the lapping plate, for example, various thermoplastic polymers such as glass beads, polystyrene, titanium oxide, EVA, PP, and PET. -, Apatite particles, porous silica, and other abrasive grains are preferable, and the blending amount of the hard particles is preferably 1 to 20% by volume.

本発明によれば、工作物との隙間を確保することが可能となり、研磨スラリーの流動性が改善されて、うねりを発生することがなく、均一な研磨特性を得ることができる。   According to the present invention, it is possible to ensure a gap with the workpiece, improve the fluidity of the polishing slurry, and generate uniform polishing characteristics without generating undulations.

本発明の好ましい実施の形態を示す斜視図。The perspective view which shows preferable embodiment of this invention. 本発明の実施例(GB−A)の表面についての顕微鏡による拡大写真。The enlarged photograph by the microscope about the surface of the Example (GB-A) of this invention. 本発明の実施例(GB−B)の表面についての顕微鏡による拡大写真。The enlarged photograph by the microscope about the surface of the Example (GB-B) of this invention. 本発明の実施例(GB−C)の表面についての顕微鏡による拡大写真。The enlarged photograph by the microscope about the surface of the Example (GB-C) of this invention. 比較例(KSP−66A)の表面についての顕微鏡による拡大写真。The enlarged photograph by the microscope about the surface of a comparative example (KSP-66A). 比較例(FQ)の表面についての顕微鏡による拡大写真。The enlarged photograph by the microscope about the surface of a comparative example (FQ). 実施例及び比較例についてのガラスビーズの粒径と隙間形状との関係図。The relationship figure of the particle size of a glass bead and a clearance gap shape about an Example and a comparative example. 表面に溝を入れた比較例についての表面図。The surface view about the comparative example which put the groove | channel on the surface. 実施例及び比較例についてのガラスビーズの粒径と工作物の仕上げ面との関係図。The relationship figure of the particle size of the glass bead and the finishing surface of a workpiece about an Example and a comparative example. 本発明の実施例における研磨時のスラリーの流れを示す説明図。Explanatory drawing which shows the flow of the slurry at the time of grinding | polishing in the Example of this invention. 実施例及び比較例についてのガラスビーズの粒径と工作物の表面うねりとの関係図。The relationship figure of the particle size of the glass bead and the surface waviness of a workpiece about an Example and a comparative example.

次に本発明の最良の形態について図面を参照して説明する。   Next, the best mode of the present invention will be described with reference to the drawings.

図1は回転式の研磨台に取り付けられる研磨パッドである隙間調整型研磨具1の好ましい実施の形態を示すものであり、隙間調整型研磨具1は全体が薄形円柱形の研磨パッド基材2に直径が0.05〜0.5mm程度の硬質粒子3が例えば1〜20体積%配合されている。   FIG. 1 shows a preferred embodiment of a gap adjusting type polishing tool 1 which is a polishing pad attached to a rotary polishing table. The gap adjusting type polishing tool 1 is a thin cylindrical column-shaped polishing pad substrate. 2 is mixed with, for example, 1 to 20% by volume of hard particles 3 having a diameter of about 0.05 to 0.5 mm.

更に詳しく説明すると、本実施の形態は、例えば基材としてウレタン樹脂と、発泡剤との混合物に、直径が0.05〜0.5mm程度のガラスビーズからなる砥粒を1〜20体積%の割合で配合し、これを均一な混合物として硬化剤を加え、金型内で発泡させて離型し、室温で二次乾燥して製造する。   More specifically, in the present embodiment, for example, 1 to 20% by volume of abrasive grains made of glass beads having a diameter of about 0.05 to 0.5 mm are added to a mixture of a urethane resin as a base material and a foaming agent. It mix | blends in a ratio, a hardening | curing agent is added as a uniform mixture, it is made to foam in a metal mold | die, mold release, and secondary drying at room temperature manufactures.

120℃で予熱して粘度を低下させたウレタン樹脂(三井化学ポリウレタン株式会社製、ハイプレインU−51)150gに、発泡剤(永和化成化学工業株式会社製、吸熱分解型セルボンSC−K)5gとガラスビーズ(三昌研磨株式会社製、GB−A:粒径106〜150μm、GB−B:粒径250〜425μm、GB−C:粒径425〜600μm)を混合物に対して5容量%を混入し、機械式攪拌機(キーエンス株式会社製、ハイブリッドミキサーHM−500)を用いて撹拌し均一な混合物を作成した。   150 g of urethane resin pre-heated at 120 ° C. and reduced in viscosity (Mitsui Chemicals Polyurethane Co., Ltd., High Plain U-51), 5 g of foaming agent (Yewa Kasei Chemical Co., Ltd., endothermic decomposition type cellbon SC-K) And glass beads (manufactured by Sansho Abrasive Co., Ltd., GB-A: particle size 106-150 μm, GB-B: particle size 250-425 μm, GB-C: particle size 425-600 μm) It mixed and stirred using the mechanical stirrer (the Keyence Corporation make, hybrid mixer HM-500), and the uniform mixture was created.

次に、前記混合物に、120℃で予熱して粘度を低下させた硬化剤(セイカ工業株式会社製、ビスアミンA)を20gを混入し30秒間撹拌した後、剥型剤としてフッ素樹脂シートを予め貼り付けた円柱形の金型に注型し、真空脱泡機(安井インターテック株式会社製)により脱泡して、170℃に25分間保持して一次硬化させた後、金型から離型し、室温で一日程度放置することにより二次硬化を行った。   Next, 20 g of a curing agent (Seika Industry Co., Ltd., bisamine A) preheated at 120 ° C. to reduce the viscosity is mixed into the mixture and stirred for 30 seconds, and then a fluororesin sheet is preliminarily used as a release agent. Pour into the attached cylindrical mold, defoam with a vacuum defoamer (manufactured by Yasui Intertec Co., Ltd.), hold at 170 ° C. for 25 minutes, and first cure, then release from mold Then, secondary curing was carried out by leaving it to stand at room temperature for about a day.

得られた研磨パッドである隙間調整型研磨具(GB−A(粒径106〜150μm)、GB−B(粒径250〜425μm)、GB−C(粒径425〜600μm))の表面についての拡大写真を図2乃至図4に示す。   About the surface of the gap adjusting type polishing tool (GB-A (particle size: 106 to 150 μm), GB-B (particle size: 250 to 425 μm), GB-C (particle size: 425 to 600 μm))) which is the obtained polishing pad Enlarged photographs are shown in FIGS.

次に前記隙間調整型研磨具GB−A、GB−B、GB−Cにつき、表面をフェーシングした後、表面粗さ測定器(ミツトヨ株式会社製、SURFTEST SV−600)を用いてパッド表面の形状を測定し、高域フィルタを施し、その粗さ曲線を、比較例としてセリア(九重電気株式会社製、KSP−66A)入り研磨パッド(KSP−66A)、前記ガラスビーズの代わりに粒径3.5μmのシリカ粒子(フジミインコーポレーテッド株式会社製、FQ3000)を混入した研磨パッド(FQ)とともに測定した。   Next, after facing the surfaces of the gap adjusting type polishing tools GB-A, GB-B, and GB-C, the shape of the pad surface is measured using a surface roughness measuring instrument (SURFTEST SV-600 manufactured by Mitutoyo Corporation). A high-pass filter was applied, and the roughness curve was compared with a polishing pad (KSP-66A) containing ceria (KSP-66A, manufactured by Kuju Electric Co., Ltd.) as a comparative example. The measurement was performed together with a polishing pad (FQ) mixed with 5 μm silica particles (FQ3000, manufactured by Fujimi Incorporated).

その結果、図7に示したガラスビーズの粒経と隙間形状との関係図から、研磨パッドに含有させるガラスビーズの粒径が大きくなるほど最大高さRy(mm)が高くなっており、逆に、凹凸の平均間隔が小さくなる傾向にあり、含有させるガラスビーズの粒径の大きさと隙間調整型研磨具の隙間寸法には高い相関性があることが確認された。   As a result, the maximum height Ry (mm) increases as the particle size of the glass beads contained in the polishing pad increases from the relationship between the particle size of the glass beads and the gap shape shown in FIG. It has been confirmed that the average interval between the irregularities tends to be small, and the size of the particle size of the glass beads to be contained and the gap size of the gap adjusting type polishing tool have a high correlation.

次に、前記得られた各隙間調整型研磨具GB−A、GB−B、GB−Cにつき、工作物4(直径20mm、厚さ10mmのソーダガラスをラッピングして、梨地面の前加工として粗さをRa=約35mmに揃えたもの、加工面の粗さ0.2μm)を卓上型精密ラッピング装置(株式会社ナノファクタ社製)の定盤に取り付け、研磨圧力20kPa、工具回転数60rpm、工作物回転数60rpm、加工時間30min.スラリー供給量25mL/min.砥粒(酸化セリウム 昭和電工株式会社製 SHOROX A−10 平均粒径1.2μm)、砥粒添加率3.0重量%)の研磨条件で強制回転駆動させて研磨加工を行った。   Next, for each of the obtained gap adjusting type polishing tools GB-A, GB-B, and GB-C, a workpiece 4 (soda glass having a diameter of 20 mm and a thickness of 10 mm is wrapped to prepare a pear ground pre-process. Roughness Ra = approx. 35 mm, processed surface roughness 0.2 μm) is attached to the surface plate of a tabletop precision lapping machine (manufactured by Nano Factor Co., Ltd.), polishing pressure 20 kPa, tool rotation speed 60 rpm, Workpiece rotation speed 60rpm, machining time 30min. Slurry supply rate 25 mL / min. Polishing was carried out by forcibly rotating driving under polishing conditions of abrasive grains (Cerium oxide Showa Denko Corporation SHOROX A-10 average particle size 1.2 μm, abrasive grain addition rate 3.0 wt%).

その結果、研磨面の粗さの測定結果を、前記FQ3000(粒径3.5μmのシリカ粒子をガラスビーズの代わりに含有させた研磨パッド(FQ)と、このFQ3000の研磨パッドの表面に図8に示した形状の格子状の溝を入れた研磨パッドである隙間調整型研磨具(FQ溝入)を比較例として図9に示す。   As a result, the measurement result of the roughness of the polishing surface is shown on the surface of the FQ3000 (a polishing pad (FQ) containing silica particles having a particle size of 3.5 μm instead of glass beads) and the polishing pad of this FQ3000. FIG. 9 shows a gap adjusting type polishing tool (FQ grooved) which is a polishing pad having lattice-shaped grooves of the shape shown in FIG. 9 as a comparative example.

尚、仕上げ面の測定には白色光干渉式非接触式3次元表面形状・粗さ測定器(Zygo Corporation製、Zygo New View5032)を用いて、研磨後のガラス中央部、周辺部、それらの中間における表面の断面曲線から算術平均高さを求めた。   The finished surface is measured using a white light interference type non-contact type three-dimensional surface shape / roughness measuring device (Zygo Corporation, Zygo New View 5032). The arithmetic average height was obtained from the cross-sectional curve of the surface at.

図9から、比較例である溝入の研磨パッドである隙間調整型研磨具を用いた場合に仕上面の粗さが改善されていることが確認され、また、比較的大きなガラスビーズを含有させた研磨パッドである隙間調整型研磨具の場合が前記溝入隙間調整型研磨具と同等またはそれ以上の面粗さの向上効果が得られることが確認され、特に、隙間調整型研磨具GB−B(粒径250〜425μmのガラスビーズを適用)の場合には、工作物4の中央部、周辺部、中間部分のバラツキが殆どみられず非常に高い研磨特製が得られた。   From FIG. 9, it was confirmed that the roughness of the finished surface was improved when a gap adjusting type polishing tool which is a grooved polishing pad as a comparative example was used, and a relatively large glass bead was included. In the case of the gap adjusting type polishing tool which is a polishing pad, it has been confirmed that the effect of improving the surface roughness equal to or higher than that of the grooved gap adjusting type polishing tool is obtained. In particular, the gap adjusting type polishing tool GB- In the case of B (applying glass beads having a particle size of 250 to 425 μm), the center 4, the peripheral part, and the intermediate part of the workpiece 4 were hardly observed, and a very high polishing special product was obtained.

これは隙間調整型研磨具上に形成されたガラスビーズによる工作物との隙間を介して研磨スラリー大口径の工作物の中央部まで円滑に供給され、工作物の表面全体において均一な仕上げ面が得られた結果である(図10参照)。   This is smoothly supplied to the center of the workpiece with a large abrasive slurry diameter through the gap with the workpiece by the glass beads formed on the gap-adjusting type polishing tool, and a uniform finished surface is obtained on the entire surface of the workpiece. This is the result obtained (see FIG. 10).

次に、前記条件で研磨した際の工作物4表面の「うねり」について測定した結果を、比較例として、研磨パッドFQ(粒径3.5μmのシリカ粒子をガラスビーズの代わりに含有させた研磨パッドおよびこの研磨パッドFQの表面に図8に示した形状の格子状の溝を入れたFQ溝入研磨パッドとともに図11に示す。   Next, as a comparative example, the measurement result of “swell” on the surface of the workpiece 4 when polished under the above conditions is used as a comparative example. Polishing pad FQ (polishing containing silica particles having a particle size of 3.5 μm instead of glass beads) FIG. 11 shows the pad and the FQ grooved polishing pad in which lattice-like grooves having the shape shown in FIG. 8 are formed on the surface of the polishing pad FQ.

図11より、比較例である研磨パッドFQは、工作物の中心部において大きなうねりが認められ、また、研磨パッドFQ溝入りでは中央部のうねりは減少するが全体的なうねりは解消されないことが確認されるが、本発明の実施例である隙間調整型研磨具GB−AおよびGB−B(粒径106〜425μmのガラスビーズを含有)については全体的なうねりが解消されていることが確認される。   From FIG. 11, the polishing pad FQ as a comparative example shows a large swell at the center of the workpiece, and when the polishing pad FQ is provided, the swell at the center is reduced but the overall swell is not eliminated. Although it is confirmed, it is confirmed that the overall waviness is eliminated for the gap adjusting type polishing tools GB-A and GB-B (containing glass beads having a particle size of 106 to 425 μm) which are examples of the present invention. Is done.

これらのことから、従来有効といわれていた溝入研磨パッドに比べて本発明の研磨パッドである隙間調整型研磨具がうねりに関して有効であることが確認された。   From these facts, it was confirmed that the gap-adjusting type polishing tool, which is the polishing pad of the present invention, is more effective in terms of swell than the grooved polishing pad that has been said to be effective conventionally.

尚、前記実施例は隙間調整型研磨具として研磨パッドを用いた場合を示したが、本発明は隙間調整型研磨具としてラップ定盤を用いた場合にも同じ原理で有効であり、本実施例ではラップ定盤であ隙間調整型研磨具は直径0.4〜0.8mmの鋳鉄粒子と研磨パッドに使用した同様のガラスビ−ズを焼結して製造した。 In addition, although the said Example showed the case where a polishing pad was used as a clearance adjustment type | mold polishing tool, this invention is effective on the same principle also when a lapping surface plate is used as a clearance adjustment type polishing tool, and this implementation is carried out. in the example a gap adjustment type grinding tool Ru lap plate Dare similar glass beads used in the polishing pad and cast iron particles having a diameter of 0.4 to 0.8 mm - were prepared by sintering's.

製造条件:成形圧500MPa,1100℃,1時間アルゴンガス中
焼結後の比重は約6g/cmで、気孔率は10%
また、本実施例では焼結法によりラップ定盤を製造したが鋳造法によっても製造が可能である。
Production conditions: Molding pressure 500 MPa, 1100 ° C., 1 hour in argon gas Specific gravity after sintering is about 6 g / cm 3 and porosity is 10%.
In this embodiment, the lapping platen is manufactured by a sintering method, but can also be manufactured by a casting method.

1 研磨パッド、2 ウレタン基材、3 砥粒   1 polishing pad, 2 urethane substrate, 3 abrasive grains

尚、本発明は独立行政法人新エネルギ−・産業技術総合開発機構(NEDO技術総合開
発機構)の支援によるものである。
The present invention is supported by the New Energy and Industrial Technology Development Organization (NEDO Technology Development Organization).

Claims (3)

研磨パッドを形成する基材と工作物との間に直径0.5〜10μmの粒径を有する研磨材を含有するスラリーを供給しながら前記基材と工作物とを相対的に移動させるとともに工作物に圧力を掛けて前記基材と工作物との間を流動する研磨材により前記工作物を研磨する隙間調整型研磨具の製造方法であって、直径0.05〜0.5mmの粒径で前記工作物の材質よりは軟らかくて、前記基材よりは硬く形成された硬質粒子を基材内に含有させて研磨面である基材表面を切削処理して基材表面に突出している前記硬質粒子により前記工作物と基材表面との間に形成される隙間を介して前記研磨材を含有するスラリーを前記工作物の表面全体に円滑に供給して前記スラリーを流動させることで前記工作物の表面全体を均一な仕上げ面にすることを特徴とする隙間調整型研磨具の製造方法While supplying a slurry containing an abrasive having a particle diameter of 0.5 to 10 μm between the base material forming the polishing pad and the work piece, the base material and the work piece are relatively moved and the work piece is moved. A method for manufacturing a gap-adjusting type polishing tool for polishing a workpiece with an abrasive flowing between the base material and the workpiece by applying pressure to the workpiece, the particle diameter having a diameter of 0.05 to 0.5 mm The material of the workpiece is softer than the material of the workpiece, and hard particles formed harder than the base material are contained in the base material, and the surface of the base material, which is a polishing surface, is cut to protrude from the base material surface. By smoothly supplying the slurry containing the abrasive to the entire surface of the workpiece through a gap formed between the workpiece and the substrate surface by the hard particles, the slurry is caused to flow. It is characterized by a uniform finish on the entire surface of the object. Method for producing a clearance adjustment type grinding tool to. ラップ定盤を形成する基材と工作物との間に直径0.5〜10μmの粒径を有する研磨材を含有するスラリーを供給しながら前記基材と工作物とを相対的に移動させるとともに工作物に圧力を掛けて前記基材と工作物との間を流動する研磨材により前記工作物を研磨する隙間調整型研磨具の製造方法であって、直径0.05〜0.5mmの粒径で前記工作物の材質よりは軟らかくて、前記基材よりは硬く形成された硬質粒子を基材内に含有させて研磨面である基材表面を切削処理して基材表面に突出している前記硬質粒子により前記工作物と基材表面との間に形成される隙間を介して前記研磨材を含有するスラリーを前記工作物の表面全体に円滑に供給して前記スラリーを流動させることで前記工作物の表面全体を均一な仕上げ面にすることを特徴とする隙間調整型研磨具の製造方法 While supplying a slurry containing an abrasive having a particle diameter of 0.5 to 10 μm between the base material forming the lapping plate and the workpiece, the base material and the workpiece are relatively moved. A method for manufacturing a gap-adjusting type polishing tool in which a workpiece is polished by an abrasive that flows between the substrate and the workpiece by applying pressure to the workpiece, the particle having a diameter of 0.05 to 0.5 mm It is softer than the material of the workpiece in diameter, and hard particles formed harder than the base material are contained in the base material, and the base material surface that is a polishing surface is cut to protrude from the base material surface. The slurry containing the abrasive is smoothly supplied to the entire surface of the workpiece through a gap formed between the workpiece and the substrate surface by the hard particles, thereby causing the slurry to flow. A feature that makes the entire surface of the workpiece a uniform finish. Method for producing a clearance adjustment type grinding tool to. 前記硬質粒子の配合量が1〜20体積%であることを特徴とする請求項1または2に記載の隙間調整型研磨具の製造方法 The method for producing a gap adjusting type polishing tool according to claim 1 or 2, wherein the amount of the hard particles is 1 to 20% by volume .
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JPH02232173A (en) * 1989-03-02 1990-09-14 Rodeele Nitta Kk Polishing pad
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