JP5898488B2 - Probe bar - Google Patents

Description

The present invention relates to a probe bar used for measuring electrical characteristics of various electronic elements such as solar cells.

  As an electronic element, for example, a probe bar is used for measuring electrical characteristics of solar cells. As an example of a solar battery cell, a single crystal type or a polycrystalline crystal system is known. FIG. 10 shows an example of the electrode structure on the front and back surfaces of this crystalline solar cell. In this solar cell, the size of one side is about 150 [mm], for example.

  The surface of the solar battery cell 100 is irradiated with sunlight (including simulated sunlight, the same applies hereinafter). On the surface that receives sunlight, a large number of thin finger electrodes 102 and a relatively small number of bus bar electrodes 104 for taking out electric power are provided. The finger electrode 102 is set to a thin width that does not block sunlight, and the width is, for example, 0.1 [mm]. For this reason, the resistance of the finger electrode 102 is relatively high. The arrangement of the finger electrodes 102 is, for example, several [mm] intervals, and the number of the finger electrodes 102 is several tens. On the other hand, the bus bar electrode 104 has a width for taking out the electric power from the finger electrodes 102 together and taking it out with low loss. This width is thick, for example, 2 [mm]. The number of installed bus bar electrodes 104 is, for example, 1 to 3. The solar battery cell shown in FIG. 10 includes two bus bar electrodes 104.

  An electrode 106 is provided on the entire back surface of the solar battery cell 100. When the surface of the solar battery cell 100 is irradiated with sunlight, a voltage is generated between the electrode 106 on the back surface side and the electrode on the front surface side, that is, the finger electrode 102 and the bus bar electrode 104. Therefore, electric power can be taken out from the solar battery cell 100 by connecting a load between the electrode on the front surface side and the electrode on the back surface side and flowing a current through the load.

  As this solar cell, for example, regarding the output measurement of a crystalline solar cell, a method for obtaining an IV characteristic (relationship between current and voltage) by sweeping a voltage while irradiating pseudo-sunlight is known. (For example, Non-Patent Document 1). The result of this output measurement is as shown in FIG. 11A. The point D (open voltage) of the IV characteristic curve is 0.7 [V] as an example, and the point C (short circuit current) is an example. The number [A]. The measurement circuit for the IV characteristic curve is shown in FIG. In this measurement circuit, the solar cell 100 is provided with a current terminal and a voltage terminal separately. That is, a four-terminal measurement circuit is configured.

  For measuring the IV characteristics of solar cells, a method is known in which a probe is brought into contact with the back electrode and bus bar electrode of the solar cells (for example, FIG. 10 and FIG. 12 of Patent Document 1). In Patent Document 1, a stage as a current measuring probe is brought into surface contact with a back electrode. The voltage measurement probe pin insulated from the stage is in contact with the back electrode near the center of the stage. A probe unit (probe bar) is brought into contact with the bus bar electrode of the surface electrode. The probe unit includes a plurality of current measurement probe pins and one voltage measurement probe pin. This measuring circuit is configured to perform IV characteristic measurement by a four-terminal method as a whole.

  The reason why the bus bar electrode is used for the contact portion of the probe bar is that electric power is taken out from the bus bar electrode. Of course, this is because even if the sunlight irradiated to the bus bar electrode is blocked by the probe bar, it does not affect the electrical characteristics of the solar battery cell. When the width of the bus bar electrode is 2 [mm], for example, the probe bar having a thickness of 1 [mm] which is thinner than the width of the bus bar electrode is used in consideration of positioning accuracy.

  It is also known to provide a plurality of voltage measurement probes that are collectively connected in the probe bar for measuring the characteristics of the solar battery cells (for example, FIG. 11B of Patent Document 2). 12A and 12B of Patent Document 2, the same probe bar is in contact with the front electrode and the back electrode. In FIG. 4 of Patent Document 2, a plurality of independent voltage measurement probes are provided in the probe bar, and the potential distribution of each part in the solar battery cell is measured.

  The main body of such a probe bar is formed of a metal plate. That is, the current measuring probe pin is fixed to the metal plate and is electrically connected. Further, the voltage measuring probe pin is insulated and fixed from the metal plate (for example, [0003] and [0016] of Patent Document 1, the insulator 22d of FIGS. 2 and 3, and [0005] of Patent Document 2). ], [0017]).

This probe bar is configured by superposing a plurality of metal plate bodies in which grooves for fitting probe pins are formed (for example, Patent Document 3 and Patent Document 4). Non-Patent Document 2 shows a commercially available probe bar.

JP 2006-118983 A JP 2011-099746 A Design Registration No. 1349923 Design Registration No. 1378434

JIS C 8913: 1998 “Measurement method of crystalline solar cell output” Probe Bar KSM Series Catalog [Kyoshin Electric Co., Ltd. (http://www.kyoshin-electric.co.jp/products/pdf/probe_bar.pdf)]

  By the way, the conventional probe bar has the following problems in probe pin insulation, probe pin wiring, probe bar warpage, fixation, mass, connection, and light reflectance.

(1) Probe Pin Insulation FIG. 12 shows a cross section of the main part of a conventional probe bar. In this probe bar 200, the probe pin 203 of the current measuring probe 202 is connected to the probe bar main body 204 formed of metal. For this reason, in the voltage measurement probe 206, it is necessary to insulate between the probe bar main body 204 and the probe pin 208. Since the probe bar main body 204 is made of metal, a special structure for electrical insulation is required between the probe pin 208 of the voltage measurement probe 206 and the probe bar main body 204, such as interposition of an insulator 210. There are challenges.

  The voltage measurement probe 206 insulated from the probe bar main body is connected from the probe pin 208 to a voltage measurement means or the like outside the probe bar 200 through an electric wire. This is described in Non-Patent Document 2 and FIGS. 11 and 12 of Patent Document 2.

(2) Wiring of probe pins In the conventional probe bar, as shown in FIG. 4 of Patent Document 2, when measuring a plurality of potentials with a plurality of probe pins, the potential of each probe pin is individually measured by voltage measuring means. An electric wire for connecting to the cable is necessary, and the number of wires increases. If the number of wires increases and the wires become thicker than the bus bar electrodes, the wires block the sunlight to the power generation part of the solar cell being measured, affecting the power generation capacity and accurately measuring the electrical characteristics. There is a problem that it cannot be done.

(3) Warping of probe bar, etc. In the probe bar of the prior art, the probe bar main body is made of metal, and the metal has the property of being easily plastically deformed. For this reason, when the probe bar undergoes deformation such as warping or distortion, there is a problem that the deformation cannot be corrected and the probe pin cannot be brought into contact with the bus bar electrode accurately.

(4) Fixing the probe bar In the conventional probe bar, since the probe bar body is made of metal, it is necessary to electrically insulate the test bar and the probe bar body from each other when mounting the probe bar to the test apparatus. is there. That is, the necessity of this insulation restricts the selection of methods and materials for fixing the probe bar, and there is a problem that the degree of freedom in design is low.

(5) Mass of probe bar The mass of a conventional probe bar is heavy because the probe bar body is metal. For this reason, when it is incorporated into an automatic test apparatus or the like, a large amount of driving force is required to move the probe bar. For this reason, downsizing of the apparatus is hindered, and there is a problem that energy saving and cost reduction cannot be performed.

(6) Connecting the probe bar Since the probe bar main body is made of metal, the conventional probe bar has a metal wire with a crimp terminal attached to the probe bar. Must be soldered directly to the metal part of the probe bar (see [Reference Figure 1 showing the state of use] of Patent Document 4 or the photograph of Non-Patent Document 2). In such a connection method, when replacing the probe bar, there is a problem that it takes time to remove and attach the electric wire.

(7) Light Reflectance of Probe Bar As described above, the conventional probe bar has a probe bar body made of metal. Metals generally have a property of easily reflecting light. Moreover, the sunlight irradiated to a photovoltaic cell is not necessarily a perfect parallel light. For this reason, the sunlight irradiated to the probe bar main body part out of the sunlight irradiated to the solar cell as the object to be measured is reflected, and is generated on the power generation possible part around the bus bar electrode with which the probe bar is in contact. The reflected light is additionally irradiated. For this reason, the electric power generation amount of a photovoltaic cell may increase rather than the case where there is no probe bar. On the contrary, the power generation amount of the solar cell may be reduced as compared with the case where there is no probe bar because the shadow of the probe bar is generated in the power generation possible portion around the bus bar electrode with which the probe bar is in contact. . Thus, the presence of the probe bar changes the relationship between the intensity of irradiated sunlight and the power generation amount of the solar battery cell, and thus there is a problem that the power generation efficiency of the solar battery cell cannot be measured accurately.

An object of the probe bar of the present invention is to simplify the insulating structure of the probe pin in view of the above problems.

  The configuration for solving the above problems is as follows.

: (1) a plurality of conductive layers are disposed between the layers of the plurality of conductive layers, an insulating layer for insulating said plurality of conductive layers is disposed on at least one surface of the conductor layer of the plurality of conductive layers, A probe bar comprising a probe pin attached to and connected to a side surface of the probe pin.
(2) A plurality of conductor layers, an insulating layer that is installed between the plurality of conductor layers and insulates the plurality of conductor layers, and a removal portion formed in at least one conductor layer of the plurality of conductor layers. A probe bar comprising: a conductor layer that is installed and has a removal layer formed thereon or a probe pin connected to a conductor layer different from the conductor layer.

( 3 ) A current measurement probe for measuring a current to be measured and a voltage measurement probe for measuring a voltage of the measurement target, wherein the plurality of conductor layers connect a probe pin of the current measurement probe. The probe bar according to (1) or (2) , including one conductor layer and a second conductor layer that connects a probe pin of the voltage measurement probe.
(4) The first conductor layer is thicker than the second conductor layer, wider than the second conductor layer, or thicker and wider than the second conductor layer. The described probe bar.

( 5 ) The probe bar according to any one of (1) to (4), wherein the plurality of conductor layers and the insulating layer are formed of a printed board.

( 6 ) The probe bar according to any one of (1) to ( 5 ), further comprising a connector that electrically connects part or all of the probe pins to an external circuit.

( 7 ) The probe bar according to any one of (1) to ( 6 ), wherein a part or the whole of the surface of the probe bar is covered with an insulator.

( 8 ) The probe bar according to any one of (1) to ( 7 ), wherein a part or the whole of the surface of the probe bar has a light reflectance adjusted by a surface treatment.
(9) The shield is formed of a conductor layer disposed between the plurality of conductor layers via the insulating layer, or a conductor layer disposed outside at least one of the conductor layers, The probe bar according to any one of (1) to (8).
(10) The probe bar according to any one of (1) to (9), wherein one conductor layer connects a plurality of the probe pins.

  According to the probe bar of the present invention, any of the following effects can be obtained.

  (1) Regarding probe pin insulation, the probe bar of the present invention is composed of a plurality of conductor layers sandwiching an insulator layer, and the conductor layer connecting the current measurement probe and the conductor layer connecting the voltage measurement probe are Since they are insulated from each other, it is not necessary to individually isolate the probe pins of the voltage measurement probe. Thereby, an assembly man-hour can be reduced and a yield can be improved.

  (2) Regarding the wiring from the probe pin, the voltage measuring probe is connected to the voltage measuring means outside the probe bar through the conductor layer connected to the voltage measuring probe, so that no wiring for connecting the voltage measuring probe is required. .

  When measuring a plurality of potentials with a plurality of probe pins, since a plurality of conductor layers are provided, a conductor layer can be associated with each pin and laminated via an insulating layer. Further, when a printed board is used, a print pattern corresponding to each pin or a plurality of conductor layers can be made to correspond. In any configuration, wiring outside the probe bar is unnecessary, so that the thickness of the probe bar can be reduced and set to be equal to or less than the width of the bus bar electrode of the solar battery cell. In other words, since it is possible to prevent the sunlight to be irradiated to the power generation unit of the solar battery cell by the electric wire outside the probe bar, it is possible to increase the measurement accuracy of the measurement of electrical characteristics.

  (3) Regarding the warping of the probe bar and the like, if a printed circuit board is used, the property that the printed circuit board has good flatness can be used. In addition, since the elasticity of the printed circuit board can be used, warping can be corrected by applying tensile stress to the printed circuit board and mounting and fixing it on the test apparatus. Also, when an insulating layer thicker than the conductor layer is provided, the elasticity of the insulating layer can be used, and the same effect can be obtained.

  (4) With regard to fixing the probe bar, if a printed circuit board is used, or if the structure is made of a thin conductor with a thick insulator sandwiched between them, the insulator part can be attached to the test device. No electrical insulation is required when fixing. Thereby, there is no restriction on the probe bar fixing method and the selection of the fixing material, and the degree of freedom of design is expanded.

  (5) With respect to the mass of the probe bar, if the configuration is made of a printed circuit board or a thin conductor layer sandwiching a thick insulator, the mass of the probe bar can be reduced compared to a case where the probe bar body is made of metal. Thereby, when it is incorporated into an automatic test apparatus or the like, the driving force for moving the probe bar is small, and the apparatus can be reduced in size, energy saving and cost reduction.

  (6) With respect to the connection of the probe bar, if a printed circuit board connector is used for external connection, the electric wires can be easily attached and detached by inserting and removing the connector. Thereby, the work time and labor required for probe bar replacement can be reduced. When taking out the potential of each of multiple voltage measurement probes to the outside, it is not necessary to connect multiple wires individually, and if a connector with multiple contacts is used, for example, it can be easily attached and detached with only a single connector it can.

(7) Regarding the light reflectivity of the probe bar, if the light reflectivity of the probe bar surface is adjusted by surface treatment, the decrease or change in the amount of power generated by the solar cell by the probe bar can be prevented. Power generation efficiency can be measured accurately.

It is a figure which shows the probe bar which concerns on 1st Embodiment. It is a figure which shows the probe bar which concerns on 2nd Embodiment. It is a figure which shows the probe bar which concerns on 3rd Embodiment. It is a figure which shows the probe bar which concerns on 4th Embodiment. It is a figure which shows the VV sectional view of FIG. It is a figure which shows the probe bar which concerns on 5th Embodiment. It is a figure which shows the VII-VII line cross section of FIG. It is a figure which shows the probe bar which concerns on 6th Embodiment. It is a figure which shows the probe bar which concerns on 7th Embodiment. It is a figure which shows a photovoltaic cell. It is a figure which shows an IV characteristic curve and a measurement circuit. It is a figure which shows the cross section of the conventional probe bar.

[First Embodiment]

  FIG. 1 shows a probe bar according to the first embodiment. FIG. 1A shows one side plane of the probe bar. FIG. 1B shows a cross section taken along line IB-IB in FIG. FIG. 1C shows a cross section of another probe bar.

  The probe bar 2 has a rectangular shape. The probe bar 2 includes first and second conductor layers 4-1 and 4-2 and an insulating layer 6. In this example, the insulating layer 6 is provided between the two conductor layers 4-1 and 4-2. The conductor layers 4-1 and 4-2 are made of a good conductor material such as a copper plate having a low electric resistance, and the insulating layer 6 is made of an insulator material. In this example, the configuration of two sheets having the smallest number of conductor layers 4-1 and 4-2 is illustrated, but the present invention is not limited to this. Three or more conductor layers may be provided (the same applies to the following).

  Furthermore, you may install the conductor layer which is not provided with the probe pin through an insulating layer. Such a conductor layer can be used for the shield of the conductor layers 4-1, 4-2, for example. If a shield is formed of a conductor layer that does not include a probe pin between the conductor layers 4-1 and 4-2, electrical interference between the conductor layers 4-1 and 4-2 can be prevented. Moreover, if a shield is formed with a conductor layer outside the conductor layers 4-1 and 4-2, the influence of external noise and the like on the conductor layers 4-1 and 4-2 can be reduced (the same applies to the following).

  Each of the conductor layers 4-1 and 4-2 is set to be thicker than the insulating layer 6. If the diameters of the probe pins 8-1 and 8-2 are, for example, 0.5 [mm], the thickness of the conductor layers 4-1 and 4-2 is, for example, about 0.5 [mm], and the insulating layer 6 For example, the thickness may be set to less than 0.1 mm, but is not limited to these values.

  As shown in FIG. 1B, a plurality of probe pins 8-1 of the current measuring probe 10 are connected to the upper conductor layer 4-1 in the figure, and the lower conductor layer 4-2 in the figure is connected to the lower conductor layer 4-2. A plurality of probe pins 8-2 of the voltage measurement probe 12 are connected. The probe pins 8-1 and the probe pins 8-2 are alternately arranged.

  On the side of the current measuring probe 10 in FIG. 1B, the conductor layer 4-1 is partially removed leaving the conductor layer 4-2 and the insulating layer 6. The probe pin 8-1 of the current measuring probe 10 is installed at this removed portion. The probe pin 8-1 is connected to the inner wall surface of the conductor layer 4-1. For example, solder 11 may be used for this connection.

  On the voltage measurement probe 12 side, the conductor layer 4-2 and the insulating layer 6 are left and the conductor layer 4-2 is partially removed. The probe pin 8-2 of the voltage measurement probe 12 is installed at the removed portion. The probe pin 8-2 is connected to the inner wall surface of the conductor layer 4-2.

  In the first embodiment, the probe pins 8-1 and 8-2 are not completely arranged on a straight line, and the probe pins 8-1 and 8-2 are positioned at the positions of the probe pins 8-1 and 8-2. Deviation of about the diameter of However, such a shift is not a problem in practice.

  A plurality of fixing holes 14 are formed in the laminated body of the conductor layers 4-1 and 4-2 and the insulating layer 6. An independent current measurement terminal connection portion 16-1 and voltage measurement terminal connection portion 16-2 are formed at the end portions of the respective conductor layers 4-1 and 4-2. A connection hole 18-1 connected to the current measurement terminal of the solar battery cell is formed in the current measurement terminal connection portion 16-1. A connection hole 18-2 is formed in the voltage measurement terminal connection portion 16-2. Therefore, the current measuring terminal of the solar battery cell is connected to the conductor layer 4-1. A voltage measurement terminal of the solar battery cell is connected to the conductor layer 4-2. For these connections, a method such as screwing an electric wire equipped with a crimp terminal is used. An external power source, a measuring instrument, and the like are connected to each of the conductor layers 4-1 and 4-2 through the current measurement terminal connection unit 16-1 and the voltage measurement terminal connection unit 16-2.

  In this embodiment, the probe bar 2 used for electrical measurement of solar cells (measurement of IV characteristics by the four-terminal method) is configured, but the present invention is not limited to this. You may use for the measurement of electronic elements other than a photovoltaic cell.

  As shown in FIG. 1C, the probe pin 8-1 and the conductor layer 4-1 may be connected to the exposed surface of the conductor layer 4-1 in the removed portion of the conductor layer 4-2. The connection between the probe pin 8-2 and the exposed surface of the conductor layer 4-2 at the removed portion of the conductor layer 4-1 may be the same. Moreover, you may use together the connection method of B of FIG. 1, and the connection method of C of FIG.

[Second Embodiment]

  2nd Embodiment has shown the probe bar provided with the probe pin from which the thickness of the conductor layers 4-1, 4-2 and the insulating layer 6 differs, and the probe pin from which a conductor layer differs as a voltage measurement probe. .

  FIG. 2 shows a cross section of the probe bar according to the second embodiment. The probe bar 2 shown in FIG. 2A has a three-layer structure of a conductor layer 4-1, an insulating layer 6, and a conductor layer 4-2. The conductor layer 4-1 is formed thicker than the insulating layer 6 and the conductor layer 4-2.

  The probe bar 2 shown in FIG. 2B has a five-layer structure of a conductor layer 4-1, an insulating layer 6-1, a conductor layer 4-2, an insulating layer 6-2, and a conductor layer 4-3. The conductor layer 4-1 is formed thicker than each of the other four layers. The probe pin 8-1 is connected to the conductor layer 4-1. The probe pin 8-2 is connected to the conductor layer 4-2. The probe pin 8-3 is connected to the conductor layer 4-3. That is, the voltage measuring probe 12 is provided with a plurality of probe pins 8-2 and 8-3 corresponding to the conductor layers 4-2 and 4-3.

  In the configuration shown in FIG. 2A, the probe pins 8-2 can be connected together and used. In the configuration shown in FIG. 2B, the potentials of the probe pins 8-2 and 8-3 of the plurality of voltage measurement probes 12 can be taken out to the outside. In order to extract a larger number of potentials to the outside, the number of conductor layers 4-2 and 4-3 may be increased in accordance with the number of potentials to be extracted. At that time, the thickness of the conductor layers 4-2 and 4-3 may be reduced.

  For example, several [A] of current flows through the probe pin 8-1 of the current measuring probe 10. For this reason, the conductor layer 4-1 to which the probe pin 8-1 of the current measurement probe 10 is connected is desirably formed thick in order to reduce the electric resistance. Since almost no current flows through the probe pins 8-2 and 8-3 of the voltage measurement probe 12, the conductor layers 4-2 and 4-3 to which the probe pins 8-2 and 8-3 of the voltage measurement probe 12 are connected. May be formed thin.

  For this reason, the conductor layer 4-1 to which the probe pin 8-1 of the current measuring probe 10 is connected is thick, so that an external measuring instrument or the like can be obtained by screwing an electric wire equipped with a crimp terminal to the conductor layer. Connected. Each of the conductor layers 4-2 and 4-3 to which the voltage measurement probe 12 is connected is thin. Therefore, for these connections, for example, connection means such as a printed circuit board connector may be used.

[Third Embodiment]

  The third embodiment shows a probe bar having an insulating layer thicker than the conductor layer. FIG. 3 shows a cross section of the probe bar 2 according to the third embodiment.

  The probe bar 2 shown in FIGS. 3A to 3C has a three-layer structure of a conductor layer 4-1, an insulating layer 6, and a conductor layer 4-2, and the insulating layer 6 is in relation to the conductor layers 4-1 and 4-2. It is set thick. The conductor layer 4-1 is set on the current measurement probe 10 side, and the conductor layer 4-2 is set on the voltage measurement probe 12 side.

  In the probe bar 2 shown in FIG. 3A, the insulating layer 6 and the conductor layer 4-2 are partially removed while leaving the conductor layer 4-1 on the current measuring probe 10 side. The probe pin 8-1 of the current measuring probe 10 is installed at this removed portion. This probe pin 8-1 is connected to the inside of the conductor layer 4-1 by solder 11.

  On the voltage measurement probe 12 side, the insulating layer 6 and the conductor layer 4-1 are partially removed while leaving the conductor layer 4-2. A probe pin 8-2 of the voltage measurement probe 12 is installed in the removed portion. The probe pin 8-2 is connected to the inner side of the conductor layer 4-2 by solder 11.

  In the probe bar 2 shown in FIG. 3B, the conductor layer 4-1 is cut at the removed insulating layer 6, the conductor layer 4-1 is folded into the recessed portion of the insulating layer 6, and the current measuring probe 10. The probe pin 8-1 is connected. Similarly, on the side of the voltage measurement probe 12, the conductor layer 4-2 is cut at the removed insulating layer 6, and the conductor layer 4-2 is folded into the recessed portion of the insulation layer 6. The probe pin 8-2 is connected.

  In the probe bar 2 shown in FIG. 3C, a groove 20 is formed in the removed portion of the insulating layer 6 and the conductor layer 4-2 by pressing or the like within the removal interval of the insulating layer 6 of the conductor layer 4-1. A probe pin 8-1 of the current measuring probe 10 is disposed in the groove 20 and is connected to the conductor layer 4-1 by solder 11. The same applies to the voltage measuring probe 12 side, and a groove 20 is formed in the removed portion of the insulating layer 6 and the conductor layer 4-1 by pressing or the like within the removal interval of the insulating layer 6 of the conductor layer 4-2. The probe pin 8-2 of the voltage measuring probe 12 is disposed in the groove 20 and is connected to the conductor layer 4-2 by the solder 11. In this case, the probe pins 8-1 and 8-2 of the current measurement probe 10 and the voltage measurement probe 12 need to be connected from different surfaces of the probe bar 2, but the configuration shown in FIG. And may be connected from one side of the probe bar 2.

  Each of the conductor layers 4-1 and 4-2 can be independently connected to an external measuring instrument by a method such as screwing an electric wire equipped with a crimp terminal to the probe bar 2 together with the insulator layer 6. it can. Moreover, you may connect with an external measuring device etc. by mounting | wearing with a connector.

  Based on the first to third embodiments, various combinations of the thicknesses of the conductor layers and insulating layers, the number of conductor layers or insulating layers, the arrangement of probe pins, etc. Is included in the probe bar of the present invention.

[Fourth Embodiment]

  The fourth embodiment shows a probe bar using a printed circuit board that includes a thick insulating layer and a thin conductor layer. Among the plurality of probe pins, one at the center is a voltage measurement probe, and the other is a current measurement probe, and a plurality of probe pins are provided.

  4 and 5 show a probe bar according to the fourth embodiment. FIG. 4A shows the probe bar viewed from one side. FIG. 4B shows the probe bar viewed from the other side. FIG. 5 shows a cross section taken along line V-V in FIG. 4 and 5, the same parts as those in FIG. 1 are denoted by the same reference numerals.

  The probe bar 2 is composed of a double-sided board. A multilayer substrate can also be used as needed. Further, if a jumper or the like for connecting patterns is used in combination, the same function can be realized even with a single-sided board.

  As shown to A and B of FIG. 4, the copper foil pattern 24 and the copper foil pattern 25 are installed in the surface of the board | substrate part 22 of the printed circuit board 21 as a conductor layer as stated above. The substrate part 22 is an insulating layer. The copper foil pattern 24 is connected to the current measurement terminal connection portion 16-1 formed at the end of the printed circuit board 21 and the probe pins 8-1 of the plurality of current measurement probes 10. The copper foil pattern 25 is connected to the voltage measurement terminal connection portion 16-2 at the end of the printed circuit board 21 and the probe pin 8-2 of the voltage measurement probe 12 at the center of the substrate. The electric current measurement terminal connection part 16-1 and the voltage measurement terminal connection part 16-2 are each screwed with an electric wire. There is no copper foil around the fixing holes 14 formed at the four corners of the printed circuit board 21, and it is directly fixed to the test apparatus or the like at the insulated substrate portion 22.

  As shown in FIG. 5, the probe pins 8-1 and 8-2 are connected to the notch portion of the substrate portion 22 by the solder 11. In order to connect the probe pins 8-1 and 8-2 more securely and firmly, a through-hole plating 26 is applied to the notch portion of the substrate portion 22. The through-hole plating 26 is an example, and the present invention is not limited to this.

  In this embodiment, the copper foil pattern 24 to the current measurement probe 10 through which a large current flows forms a wide pattern in order to reduce the resistance. In order to further reduce the resistance, it is also possible to use a multilayer substrate and make the inner layer a plurality of conductor layers in the same pattern as in FIG.

[Fifth Embodiment]

  In the fifth embodiment, a probe bar is configured using a printed circuit board. The probe pins of the current measurement probe and the voltage measurement probe are alternately arranged, and the current measurement probe and the voltage measurement probe are connected in common.

  FIG. 6 shows a probe bar according to the fifth embodiment. FIG. 6A shows the probe bar viewed from one side. FIG. 6B shows the probe bar viewed from the other side. FIG. 7 shows a cross section taken along line VII-VII in FIG.

  In this probe bar 2, a printed circuit board connector 28 (three-pole lead component) is used to connect the current measurement probe 10 and the voltage measurement probe 12 to the outside. As described above, several [A] current flows through the current measurement probe 10 as an example, but almost no current flows through the voltage measurement probe 12. In this probe bar 2, as shown in FIG. 6A, in addition to the copper foil pattern 24, about one third of the copper foil pattern 24 shown in FIG. 6B is also assigned to the connection to the current measuring probe 10. . The copper foil patterns 24 on the front and back surfaces are connected by through-holes 26, and are configured so that a large current can be passed by further reducing the resistance. In this case, two of the three-pole printed circuit board connectors 28 are assigned for the same reason.

  The copper foil pattern 25 connected to the voltage measurement probe 12 has a fine pattern because almost no current flows, and only one of the three-pole printed circuit board connectors 28 is assigned.

  As shown in FIG. 7, probe pins 8-1 and 8-2 are connected by solder 11. The connecting means may be a connecting means other than the solder 11. In order to maintain the physical strength of the connection portions of the copper foil pattern 24 and the copper foil pattern 25 connected to the probe pins 8-1 and 8-2, A wide copper foil pattern 24 and a copper foil pattern 25 are arranged. Furthermore, if necessary, the physical strength of the copper foil pattern 24 at the probe pin connection portion may be enhanced by appropriately arranging the through holes 26 and connecting the copper foil patterns 24 on the front and back surfaces.

  In this embodiment, the probe pins 8-1 and 8-2 are connected to one side, but the present invention is not limited to this. Thus, the method of connecting the probe pins 8-1 and 8-2 to one side of the printed board 21 uses a thin board such as a flexible printed board (FPC), covers the printed board 21 with an insulating material, Thereby, it can utilize also when supporting the probe pins 8-1 and 8-2, and fixing to the main body of the probe bar 2. FIG.

[Sixth Embodiment]

  The sixth embodiment shows another probe bar using a printed circuit board. A plurality of current measurement probes and voltage measurement probes are alternately arranged. Although the current measurement probes are commonly connected, the voltage measurement probes can be independently connected to the outside.

  FIG. 8 shows a probe bar according to the sixth embodiment. FIG. 8A shows the probe bar viewed from one side. FIG. 8B shows the probe bar viewed from the other side.

  In this embodiment, the portion connecting the probe pin 8-1 of the current measurement probe 10 that handles a large current to the outside is configured so that the electric wire can be screwed to the current measurement terminal connection portion 16-1. The probe pins 8-2 of the voltage measurement probe 12 use a printed circuit board connector 29 (multi-polar surface mount component) in order to independently connect to the outside. The connection means is not limited to this.

  In this embodiment, each of the probe pins 8-2 of the voltage measurement probe 12 and the printed circuit board connector 29 are connected by a copper foil pattern 25. When using a multilayer substrate, you may comprise some or all of these copper foil patterns 25 by the inner conductor layer as needed.

[Seventh Embodiment]

  The seventh embodiment shows another probe bar using a printed circuit board. The surface of the probe bar is covered with an insulating material.

  FIG. 9 shows a probe bar according to the seventh embodiment. FIG. 9A shows the side of the probe bar. FIG. 9B shows the plane of the probe bar. FIG. 9C shows the side of FIG. 9B. FIG. 9D shows the inside of the IXB part of FIG. 9B.

  In this embodiment, the printed circuit board 21 is installed in a case 30 formed of an insulator material. The case 30 is an example of an exterior member, and the printed circuit board 21 is sealed with a sealing resin 32 injected into the case 30. By using the case 30 and the sealing resin 32 as described above, the printed circuit board 21 is insulated from the outside, and the probe pins 8-1 and 8-2 are positioned and fixed at appropriate positions.

  As shown in FIG. 9C, probe pins 8-1 and 8-2 are connected to the probe bar 2 on a printed circuit board 21 installed in the case 30. According to the probe bar 2 configured as described above, the case 30 formed of an insulating material can be attached to a test apparatus or the like, and the surface of the printed board 21 can be insulated.

  The printed circuit board connector 34 installed on the probe bar 2 is, for example, a two-pole lead component. The probe pins 8-1 and 8-2 of the current measurement probe and the voltage measurement probe can be externally connected via the printed circuit board connector 34 described above. In addition to mounting the printed circuit board 21 to the case 30 formed of an insulating material, an insulating film or sheet may be bonded to the outer surface of the printed circuit board 21, or by laminating with an insulating resin, The surface of the printed circuit board 21 may be insulated.

  The configuration shown in the seventh embodiment, that is, the probe bar 2 whose surface is covered with an insulator material is not limited to the fourth to sixth embodiments described above, but the first The present invention can also be applied to the third to third embodiments.

[Eighth Embodiment]

  In the eighth embodiment, the light reflectance of the probe bar surface is adjusted by surface treatment in the probe bar 2 of each of the above-described embodiments.

  The probe bar 2 of the first to third embodiments has a metal surface. Metal generally reflects light easily, and its light reflectance and color change over time due to oxidation of its surface. The probe bar 2 of the fourth to sixth embodiments is composed of a printed circuit board 21 and the surface thereof is often covered with a solder resist. Even this solder resist has a color unique to the material and reflects light to some extent. The printed circuit board 21 covered with the solder resist has different appearance colors depending on whether the copper foil pattern is present or not. The probe bar 2 of the seventh embodiment covers the surface with an insulating layer, but can reflect light although it differs depending on the material, color, surface state, etc. of the insulator.

  When measuring the electrical characteristics of the solar battery cell, the probe bar 2 is brought into contact with the bus bar electrode of the solar battery cell. The probe bar 2 is installed on the bus bar electrode because the probe bar 2 does not affect the electrical characteristics of the solar cell even if the probe bar 2 blocks sunlight. However, sunlight and simulated sunlight are not completely parallel light. When such sunlight or pseudo-sunlight is reflected by the probe bar 2, the reflected light is irradiated around the bus bar electrode. In addition, a shadow of the probe bar 2 may be generated around the bus bar electrode. The increase in the amount of light due to the reflection and the decrease in the amount of light due to the shadow affect the power generation efficiency of the solar battery cell (ratio of the intensity of sunlight to be irradiated and the power generation output of the solar battery cell). This causes measurement errors.

  To solve such a problem, the probe bar 2 may be subjected to a surface treatment to adjust the light reflectance of the probe bar 2 surface. This surface treatment includes painting treatment, plating treatment, blackening treatment, and other surface treatments.

  (1) Painting treatment

  Paint is applied to the surface of the probe bar 2 to adjust the light reflectance of the surface of the probe bar 2. More specifically, a change in the power generation output of the solar battery cell due to the presence or absence of the probe bar 2 is monitored. A paint that does not increase or decrease the power generation output depending on the presence or absence of the probe bar 2 and does not affect the power generation output may be selected.

  If the power generation output of the solar battery cell is increased when the probe bar 2 is present due to light reflection as compared with the case where the probe bar 2 is not present, the paint having a low light reflectance is selected. In order to suppress light reflection, a dark matte paint is preferred. In order to suppress light reflection more highly, for example, a black body paint may be selected.

  In the case where the power generation output of the solar battery cell is reduced due to the presence of the probe bar 2, coating is performed to increase the light reflectance. In this case, a light-colored paint that is not matte may be selected to enhance light reflection.

  Note that the object whose light reflectance is adjusted by the surface treatment by painting may be any of the above embodiments.

(2) Plating treatment

  In the probe bar 2 according to the first to third embodiments, when the surface is a metal, the metal surface may be plated to improve the light reflectivity or reduce the light reflectivity. May be. The color of the reflected light may be changed depending on the color of the plating. In order to adjust the light reflectance and the like, an appropriate region on the metal surface or a conductor pattern may be selected as a place to be plated.

(3) Blackening treatment

  In the probe bar 2 of the first to third embodiments, when the surface is a metal, the light reflectance may be lowered by applying a blackening process to the metal surface. Also in this blackening process, in order to adjust the light reflectance, an appropriate region on the metal surface or a conductor pattern can be selected as a place where the blackening process is performed.

 (4) Other surface treatment

  When the printed circuit board 21 is used like the probe bar 2 of the fourth to sixth embodiments, the selection may be made in consideration of the light reflectance such as the coloring of the solder resist. A black resist or a dark solder resist is suitable for reducing the light reflectance, and a light solder resist is suitable for improving the light reflectance.

  In the probe bar 2 of the seventh embodiment, the light reflectance is adjusted by selecting the color, material, surface smoothness, presence / absence of unevenness of the case 30 covering the surface, film, resin sheet, etc. do it.

  In any of the above embodiments, the light reflectance may be adjusted by roughening or smoothing the surface.

  In this way, the light reflectance of the surface of the probe bar 2 can be adjusted by performing any one of the coating treatment, plating treatment, blackening treatment, and other surface treatments. That is, the influence of the presence or absence of the probe bar 2 on the output power amount of the solar battery cell can be avoided, and the measurement accuracy such as the output of the solar battery cell can be increased.

  In this embodiment, when the probe bar 2 is brought into contact with the bus bar electrode of the solar battery cell, the portion protruding from the solar battery cell is not affected (or reduced) even if the surface treatment is performed. It is not necessary to treat the entire surface. The light reflectance of the surface treatment of the probe bar 2 may be adjusted so that the power generation output of the solar battery cell does not change depending on the presence or absence of the probe bar 2. When the wavelength of the pseudo-sunlight irradiated to the solar battery cell is limited, the light reflectance may be adjusted by surface treatment considering the color, paying attention to the limited wavelength.

  [Other Embodiments]

  In the above embodiment, the probe bar used for the measurement of the solar battery cell has been described, but the present invention is not limited to this probe bar. The probe bar of the present invention can be widely used for measuring electronic elements other than solar cells.

  The probe bar of the present invention can be used for measuring the electrical characteristics of electronic elements in solar cells and the like, and has electrical characteristics performed by bringing a plurality of probe pins into contact with linear positions. It can be widely used for measurement.

According to the probe bar using the printed circuit board, it is easy to independently connect each of the plurality of probe pins to the outside of the probe bar, so that it can be used for, for example, obtaining a potential distribution.

2 Probe bars 4-1, 4-2, 4-3 Conductor layers 6, 6-1, 6-2 Insulating layers 8-1, 8-2, 8-3 Probe pin 10 Current measurement probe 12 Voltage measurement probe 24, 25 Copper foil pattern

Claims (10)

A plurality of conductor layers;
Placed between layers of said plurality of conductive layers, an insulating layer for insulating said plurality of conductive layers,
Wherein the plurality of installed on at least one surface of the conductor layer of the conductor layer, and the probe pin side portion of the probe pin connected with attached to said surface,
Characterized by comprising,
Probe bar. A plurality of conductor layers;
An insulating layer installed between layers of the plurality of conductor layers, and insulating the plurality of conductor layers;
A probe pin installed in a removal portion formed in at least one conductor layer of the plurality of conductor layers and connected to a conductor layer in which the removal portion is formed or a conductor layer different from the conductor layer;
Characterized by comprising,
Probe bar. A current measuring probe for measuring the current of the measurement target; and a voltage measurement probe for measuring the voltage of the measurement target;
The plurality of conductor layers are:
A first conductor layer connecting probe pins of the current measuring probe;
A second conductor layer connecting probe pins of the voltage measurement probe;
Including,
The probe bar according to claim 1 or claim 2 . The first conductor layer is thicker than the second conductor layer, or wider than the second conductor layer, or thicker and wider than the second conductor layer,
The probe bar according to claim 3. The plurality of conductor layers and the insulating layer are formed of a printed circuit board,
It claims 1 to probe bar according to claim 4. It comprises a connector for electrically connecting a part or all of the probe pins to an external circuit,
The probe bar according to any one of claims 1 to 5 . A part or the whole of the surface of the probe bar is covered with an insulator,
The probe bar according to any one of claims 1 to 6 . A part or the whole of the surface of the probe bar is characterized in that light reflectance is adjusted by surface treatment.
Probe bar according to any one of claims 1 to 7. A shield is formed of a conductor layer installed via the insulating layer between the plurality of conductor layers, or a conductor layer installed outside at least one of the conductor layers,
The probe bar according to claim 1. One conductor layer connects a plurality of the probe pins,
The probe bar according to any one of claims 1 to 9.

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