JP5893264B2 - Endoscope device - Google Patents

Description

The present invention is an endoscope KagamiSo location, and more particularly relates to endoscopic KagamiSo location for measuring the three-dimensional shape of projecting a pattern of fringes such as the surface of the test object in the test object.

  Conventionally, in order to inspect a test object, an endoscope having a long insertion portion and having observation means such as an optical system and an image sensor at the tip of the insertion portion is used. In such an endoscope, a plurality of fringe images obtained by projecting fringes on the test object are obtained while shifting the phase of the fringes, and a known phase shift method using the plurality of fringe images is used. What calculates the three-dimensional shape of a test object is known. For example, Patent Document 1 describes an endoscope apparatus in which two projection windows for projecting stripes are provided on the distal end surface of an insertion portion.

US Patent Application Publication No. 2009/0225321

  However, in the endoscope apparatus described in Patent Document 1, windows for emitting light from the fringe projection light source to the outside are provided at two positions on the distal end surface of the insertion portion of the endoscope apparatus. There is a limit to reducing the diameter of the insertion portion of the endoscope apparatus.

  The present invention has been made in view of the above-described circumstances, and an object of the present invention is to provide an endoscope apparatus in which an insertion portion is reduced in diameter, and an endoscope in which the insertion portion is reduced in diameter. An object of the present invention is to provide a measurement method that can accurately measure a three-dimensional shape even in a mirror device.

In order to solve the above problems, the present invention proposes the following means.
An endoscope apparatus according to an embodiment of the present invention is an endoscope apparatus that performs measurement of the test object using a pattern projection image of the test object on which a bright and dark pattern of light is projected, and includes an insertion unit An imaging unit that is provided at a distal end of the insertion unit and acquires an image of the test object, an illumination unit that emits illumination light that illuminates an observation field of view of the imaging unit, and the light-dark pattern on the test object An objective optical system that forms an image of the test object on the imaging unit, and at least one illumination that emits the illumination light A window and one projection window for projecting the light / dark pattern from the pattern projection unit onto the test object, the pattern projection unit including a pattern generation unit that generates the light / dark pattern, and the light / dark pattern The light and dark areas are arranged alternately and repeatedly. Distribution pattern der is, the objective optical system is parallel and eccentric to the objective optical system optical axis from the objective optical system exit side toward the imaging section of the optical axis of, the center axis of the insertion portion The projection optical system is a side-viewing objective optical system that is disposed on the outer peripheral surface of the distal end portion of the insertion portion, and whose optical axis on the incident side is disposed at a twisted position with respect to the central axis. Is exposed on the outer peripheral surface of the distal end portion of the insertion portion, and a center line extending in the thickness direction of the projection window through the center of the projection window when the projection window is viewed from the thickness direction of the projection window is characterized that you have arranged skewed relative to the central axis of the insertion portion.

An endoscope apparatus according to another embodiment of the present invention is an endoscope apparatus that performs measurement of the test object using a pattern projection image of the test object on which a light bright and dark pattern is projected. An insertion unit, an imaging unit that is provided at a distal end of the insertion unit, acquires an image of the test object, an illumination unit that emits illumination light that illuminates an observation field of view of the imaging unit, and the test object A pattern projection unit that projects the light / dark pattern; and an optical adapter that can be detachably attached to a distal end portion of the insertion portion, and an image of the test object on the imaging unit on a distal end surface of the insertion portion. An objective optical system that images the light, one or more illumination windows that emit the illumination light, and one projection window that projects the bright / dark pattern from the pattern projection unit onto the test object, pattern projection unit, a projection light source, provided in the optical adapter A pattern generation unit that changes the intensity distribution of the light emitted from the projection light source and generates the light / dark pattern, and the light / dark pattern is a distribution pattern in which bright parts and dark parts are repeatedly arranged alternately. It is characterized by being .

  The projection light source may be provided in the optical adapter.

  In addition, the endoscope apparatus of the present invention may include a switching unit that switches between the light for projecting the bright and dark pattern and the illumination light.

  According to the endoscope apparatus of the present invention, the diameter of the insertion portion can be reduced.

It is a block diagram which shows the structure of the endoscope apparatus of one Embodiment of this invention. It is a schematic diagram which shows the light-and-dark pattern projected by the same endoscope apparatus. It is a flowchart which shows the measuring method of one Embodiment of this invention. It is a schematic diagram which shows an example of arrangement | positioning of the front end surface of the insertion part of the same endoscope apparatus. It is a schematic diagram which shows the other example of arrangement | positioning of the front end surface of the insertion part of the same endoscope apparatus. It is a schematic diagram which shows the further another example of arrangement | positioning of the front end surface of the insertion part of the same endoscope apparatus. It is a schematic diagram which shows an example of a structure of the front-end | tip vicinity of the insertion part of the same endoscope apparatus. It is a schematic diagram which shows the other example of the structure of the front-end | tip vicinity of the insertion part of the same endoscope apparatus. It is a schematic diagram which shows the light-and-dark pattern projected by the endoscope apparatus of the modification of the embodiment. It is a schematic diagram which shows arrangement | positioning of the front end surface of the insertion part in the other modification of the same endoscope apparatus. It is a figure which shows the structure of the insertion part in the further another modification of the same endoscope apparatus, and is a schematic diagram of the insertion part in the endoscope apparatus which can observe a perpendicular direction with respect to the central axis of an insertion part. It is the figure which looked at the front end surface in which the cover member of the prism in the modification shown in FIG.

(First embodiment)
Hereinafter, an endoscope apparatus 1 and a measurement method according to an embodiment of the present invention will be described.
First, the configuration of the endoscope apparatus 1 according to the present embodiment will be described. FIG. 1 is a block diagram illustrating a configuration of an endoscope apparatus 1 according to the present embodiment. FIG. 2 is a schematic diagram showing a light / dark pattern projected by the endoscope apparatus 1.
The endoscope apparatus 1 is used for internal observation of a test object, observation of a test object at a position where a normal observation apparatus is difficult to access, and the like. And a main body 20 to which 10 base ends are connected.

As shown in FIG. 1, the insertion part 10 is formed in a tubular shape, and is inserted into the inside of the test object or an access path to the test object. The insertion unit 10 includes an imaging unit 30 that acquires an image of the test object, an illumination unit 40 that illuminates the observation field of view in front of the insertion unit 10, and a pattern projection unit 50 that projects a light / dark pattern onto the test object. It has been. In this embodiment, the pattern projection part 50 shall project a fringe pattern on a test thing as a light-dark pattern.
In addition, the distal end surface 10a of the insertion unit 10 is provided with an opening 11 for allowing external light to enter the objective optical system 32 of the imaging unit 30, and illumination for irradiating illumination light from the illumination unit 40 forward of the insertion unit. A window 12 and a projection window 13 for irradiating the stripes from the pattern projection unit 50 in front of the insertion unit are provided.

  The imaging unit 30 includes an imager 31 disposed near the distal end of the insertion unit 10, an objective optical system 32 disposed in front of the imager 31, and an imager control unit 33 connected to the imager 31. .

  As the imager 31, various known configurations including various image sensors such as a CCD and a CMOS can be appropriately selected and used.

  The objective optical system 32 is disposed in the opening 11 of the insertion unit 10. Reflected light within an observation field having a predetermined field angle and defined by the field angle is incident on the imager 31 to form an image of the test object. The objective optical system 32 includes a light transmissive cover member 32 a that seals the opening 11.

  The imager control unit 33 is provided in the main body unit 20 and is connected to the imager 31 by a wiring 34 extending through the insertion unit 10. The imager control unit 33 performs various controls such as driving of the imager 31 and setting for acquiring a video signal.

  The illumination unit 40 includes a first light source 41, an illumination optical system 42, a first fiber bundle 43 that guides light from the first light source 41 to the illumination optical system 42, and between the first light source 41 and the first fiber bundle 43. And a first incident optical system 44.

  The first light source 41 is a general white light source and is disposed inside the main body 20. As the first light source 41, a light emitting element such as an LED or a laser, a halogen lamp, or the like can be employed.

  The illumination optical system 42 is attached at or near the distal end of the insertion portion 10. The illumination optical system 42 includes a light transmissive cover member 42 a provided in the illumination window 12 of the insertion unit 10 and a lens group (not shown). The illumination optical system 42 spreads the light emitted from the first light source 41 in the field of view suitable for the angle of view of the objective optical system 32 and emits it from the illumination window 12 to illuminate the observation field evenly.

  The first fiber bundle 43 extends from the vicinity of the illumination optical system 42 to the vicinity of the first light source 41 in the main body 20 through the insertion portion 10. There is no restriction | limiting in particular in the kind of 1st fiber bundle 43, A general light guide can be used.

  The first incident optical system 44 converges the light emitted from the first light source 41 to the same extent as the diameter of the first fiber bundle 43 and efficiently introduces it into the first fiber bundle 43.

  The pattern projection unit 50 includes a second light source 51 (projection light source), a projection optical system 52, a second fiber bundle 53 that guides light from the second light source 51 to the projection optical system 52, a second light source 51, and a second light source 51. A second incident optical system 54 disposed between the fiber bundle 53 and a pattern generation unit 55 disposed on the optical path of the light emitted from the second light source 51 is provided.

  The second light source 51 is a white light source similar to the first light source 41 and is disposed inside the main body 20. The second light source 51 may be a light source that emits light having a wavelength different from that of the first light source 41.

  The projection optical system 52 is attached at or near the distal end of the insertion unit 10. The projection optical system 52 includes a light transmissive cover member 52 a provided in the projection window 13 of the insertion unit 10. Note that the cover member 52a provided in the projection window 13 may have a lens shape. The projection optical system 52 projects the light emitted from the second light source 51 into a field of view suitable for the angle of view of the objective optical system 32 and projects it from one projection window 13 into the observation field.

  The second fiber bundle 53 extends from the vicinity of the projection optical system 52 through the insertion portion 10 to the vicinity of the second light source 51 in the main body portion 20. As the second fiber bundle 53, a general light guide can be used similarly to the first fiber bundle 43.

  The second incident optical system 54 converges the light emitted from the second light source 51 to the same extent as the diameter of the second fiber bundle 53 and efficiently introduces it into the second fiber bundle 53.

  The pattern generation unit 55 is capable of forming a plurality of fringe patterns whose phases are shifted. For example, the pattern generation unit 55 moves a slit plate having a plurality of slits with an actuator, or a transparent plate made of glass, resin, or the like. A known configuration in which a plurality of shifted stripe patterns are moved by an actuator can be used.

In addition, a liquid crystal shutter module that can switch between transmission and non-transmission of light for each element, a MEMS (microelectronic device system) mirror module that includes a fine reflection mirror for each element, and the like may be used as the pattern generation unit 55. Good. In this case, since control is performed for each element, a plurality of fringe patterns whose phases are shifted can be formed without moving the entire pattern generation unit 55, so that the configuration of the pattern projection unit 50 can be simplified. There are advantages. The fringe pattern is switched by the pattern control unit 56 connected to the pattern generation unit 55.
Further, the shape of the light / dark pattern is not limited to the stripe pattern, but may be a plurality of line-like parallel lines as shown in FIG. 2, and other examples include, for example, one line as shown in FIG. 9. It may be a line (described later), a plurality of points, a lattice pattern in which a plurality of vertical lines and horizontal lines intersect, or a concentric pattern.

Other mechanisms provided in the main body 20 will be described. The 1st light source 41 and the 2nd light source 51 are connected to the light source control part 21 which controls on / off of these light sources. The imager control unit 33, the pattern control unit 56, and the light source control unit 21 are connected to a main control unit 22 that controls the entire endoscope apparatus 1. The main control unit 22 is connected to an operation unit 23 for a user to make various inputs to the endoscope apparatus 1. The main control unit 22 is connected to a main storage device (RAM 24). In the present embodiment, for example, an auxiliary storage device 25 such as a storage device having a rewritable nonvolatile memory or a magnetic storage device is electrically connected to the main control unit 22.
Note that a ROM 26 (or EPROM, EEPROM, or the like) that records firmware or the like may be connected to the main control unit 22 as necessary.

  Further, a video processor 27 that processes the video signal acquired by the imager 31 is connected to the imager control unit 33 and the main control unit 22, and a monitor 28 that displays the video signal processed by the video processor 27 as an image. Are connected to the video processor 27.

Next, the measurement method of the present embodiment will be described using an example in which measurement is performed using the endoscope apparatus 1 described above.
The measurement method of the present embodiment is a measurement method for measuring the three-dimensional shape of a test object using the endoscope apparatus 1. When using the endoscope apparatus 1, first, the user inserts the insertion portion 10 into the inside of the test object or an access path to the test object such as a duct, and the like, until the predetermined observation site is reached. Advance the tip. The user switches the observation mode for observing a desired part of the test object and the measurement mode for measuring the three-dimensional shape of the test part, as necessary, to inspect the test object.

  In the observation mode, the light source controller 21 turns on the first light source 41 and turns off the second light source 51 in response to a command from the main controller 22. As a result, the fringe pattern is not projected from the pattern projection unit 50, and the observation field is illuminated with white light from the illumination unit 40, and the observation field is illuminated (hereinafter, this illumination state is referred to as “observation state”). . The illuminated image of the object is formed on the imager 31 through the objective optical system 32. The video signal sent from the imager 31 is processed by the video processor 27 and displayed on the monitor 28. The user can observe the test object from the image of the test object displayed on the monitor 28, and can store the image as necessary.

When switching from the observation mode to the measurement mode, the user inputs an instruction to switch the mode. In order to input an instruction for switching the mode, a known input device such as a switch in the operation unit 23 or a software switch having the monitor 28 as a touch panel can be employed.
When an input for switching from the observation mode to the measurement mode is performed by the user, the measurement image photographing process (see FIG. 3) is started in the main control unit 22.

In the measurement image photographing process, first, it is determined whether or not the endoscope apparatus 1 is in an observation state (step S1 shown in FIG. 3).
If it is determined in step S1 that it is in the observation state, the process proceeds to step S3, and if it is in a state other than the observation state (for example, a measurement state described later) in step S1, the process proceeds to step S2.
This ends step S1.

Step S2 is a step of switching the endoscope apparatus 1 to the observation state.
In step S2, the first light source 41 is on-controlled and the second light source 51 is off-controlled. As a result, the pattern projection unit 50 does not project the fringe pattern, and the illumination unit 40 irradiates the observation field with white light, and the observation field is illuminated.
Step S2 is complete | finished now and it progresses to step S3.

Step S <b> 3 is a step of capturing an image of the test object that is not projected with the fringe pattern and is illuminated with white light from the illumination unit 40.
In step S <b> 3, an image is acquired by the imager 31 of the imaging unit 30 in a state where the test object is illuminated with white light from the illumination unit 40 (hereinafter, an image captured in the observation state is referred to as a “bright field image”). Called).
The bright field image photographed in step S3 is temporarily stored in the RAM 24.
Step S3 is complete | finished now and it progresses to step S4.

Step S4 is a branching step for capturing a desired number of pattern projection images.
In step S4, the predetermined number N of pattern projection images to be captured is compared with the number of pattern projection images currently stored in the RAM 24, and the number of pattern projection images stored in the RAM 24 is less than the number N of planned projection images. If so, the process proceeds to step S5. On the other hand, if the number of pattern projection images stored in the RAM 24 is the scheduled number N, the process proceeds to step S7.
This ends step S4.

Step S5 is a step of projecting the fringe pattern onto the test object.
In step S <b> 5, the first light source 41 is turned off and the second light source 51 is turned on based on a command from the main control unit 22. Then, the white light irradiated from the illumination unit 40 is turned off, and the fringe pattern is projected from the pattern projection unit 50 onto the test object. As shown in FIG. 2, the fringe pattern projected on the test object is a pattern in which bright portions R <b> 1 due to a white light source and dark portions R <b> 2 shielded by the pattern generation unit 55 are alternately arranged. The pattern generation unit 55 operates the actuator to set the phase of the fringe pattern to an appropriate phase. As a result, a state in which appropriate stripes are projected onto the test object from one place (hereinafter, this state is referred to as a “pattern projection state”).
Step S5 is complete | finished now and it progresses to step S6.

Step S6 is a step of capturing a pattern projection image in the pattern projection state.
In step S6, the fringe pattern projected onto the test object is a pattern that changes according to the three-dimensional shape of the test object. In this state, an image is acquired by the imager 31 of the imaging unit 30 (hereinafter, an image photographed in a pattern projection state is referred to as a “pattern projection image”).
The pattern projection image photographed in step S6 is temporarily stored in the RAM 24.
Step S6 is completed now and it progresses to Step S4.
Steps S4 to S6 are repeated until the number of pattern projection images to be shot reaches the planned number of shots N. At this time, in step S5, the phase of the fringe pattern is changed as appropriate, and, for example, a total of N images of the test object on which the fringes having different phases are projected are taken one by one.

Step S7 is a step of switching the endoscope apparatus 1 to the observation state.
In step S7, the first light source 41 is on-controlled and the second light source 51 is off-controlled. As a result, the pattern projection unit 50 does not project the fringe pattern, and the illumination unit 40 irradiates the observation field with white light, and the observation field is illuminated.
Step S7 is complete | finished now and it progresses to step S8.

Step S <b> 8 is a step of capturing an image of the test object illuminated with white light from the illuminating unit 40 without a stripe pattern being projected.
In step S <b> 8, a bright field image is captured by the imager 31 of the imaging unit 30 in a state where the test object is illuminated with white light from the illumination unit 40.
The bright field image photographed in step S8 is temporarily stored in the RAM 24.
Step S8 is complete | finished now and it progresses to step S9.

In step S9, based on the images (bright field image and pattern projection image) photographed between step S3 and step S8, the relative movement between the insertion unit 10 and the subject between step S3 and step S8 ( (Hereinafter referred to as “blur”).
In step S9, first, two images are selected from at least one of the bright field image and the stripe image stored in the RAM 24. For example, in the present embodiment, a bright field image captured before capturing N pattern projection images and a bright field image captured after capturing N pattern projection images are selected.
Subsequently, the same feature point is detected from the two selected images, and the coordinates of the feature point in the two images are calculated.
Step S9 is completed now and it progresses to Step S10.

Step S10 is a step of branching the processing by determining blurring of the two images using the feature points detected in step S9.
In step S10, if the coordinates of the feature points in the two images are the same in each image, it is determined that there is no blur between the first image and the subsequent image, and the process proceeds to step S11. On the other hand, if the coordinates of the feature points in the two images are different in each image, it is determined that there is a blur between the first image and the subsequent image, and a blur has occurred. Is displayed on the monitor 28 (step S14), and the series of processes is terminated.
This ends step S10.

Step S11 is a step in which the user selects whether to perform three-dimensional measurement using the captured pattern projection image now or later.
In step S11, for example, an inquiry such as “Perform measurement?” Is displayed on the monitor 28, and the user is prompted to input whether to perform three-dimensional measurement using the captured pattern projection image.
If there is an input that the measurement can be performed, the process proceeds to step S12.
If there is an input that the measurement is not performed, the process proceeds to step S15.
This ends step S11.

Step S12 is a step of performing analysis for performing three-dimensional measurement.
In step S12, the three-dimensional shape is analyzed based on the pattern projection image stored in the RAM 24. For example, in the present embodiment, the three-dimensional shape of the test object is analyzed by using, for example, a known temporal phase shift method, using N pattern projection images having different phases.
The analysis result of the three-dimensional shape is generated as a text file or a binary file, and is stored in the auxiliary storage device 25 together with N pattern projection images. Note that step S12 may be performed as the background process of step S11 simultaneously with the start of step S11.
Step S12 is completed now and it progresses to Step S13.

In step S13, the display on the monitor 28 is shifted to the screen of various measurement modes, and the measurement result is displayed on the monitor 28 using the information stored in step S12.
In step S13, the result of analysis in step S12 is overlaid on the bright field image acquired in step S3 (or the bright field image acquired in step S8). The three-dimensional shape is displayed on the monitor 28. Thereby, the user can know the three-dimensional shape of the test object.
Step S13 is complete | finished now and a series of processes are complete | finished.

Step S15 is a step branched from step S11 described above, and is a step for performing information processing necessary for displaying the measurement result later.
In step S15, as in step S12, the three-dimensional shape is analyzed based on the pattern projection image stored in the RAM 24. For example, in this embodiment, the three-dimensional shape of the test object is analyzed by the temporal phase shift method using N pattern projection images having different phases.
Further, the bright field image, the pattern projection image, the analysis result of the three-dimensional shape, and the optical parameters used for the analysis are stored in the auxiliary storage device 25 as a binary file or a text file, respectively. In this case, for example, by sharing a part of the file name or by collectively storing these files in one directory (folder), the auxiliary storage device 25 can be read out at a time. These files are saved.
Step S15 is complete | finished now and a series of processes are complete | finished.

  As described above, according to the endoscope apparatus 1 and the measurement method of the present embodiment, since the projection window 13 of the pattern projection unit 50 is provided at one place on the distal end surface 10a of the insertion unit 10, the insertion unit Compared to the case where two projection windows 13 are provided on the tip surface 10a of the tenth insertion surface 10, the insertion portion 10 can be made thinner.

Further, when the projection windows 13 for projecting the stripe pattern are provided at a plurality of positions as in the conventional case, the area occupied by the projection window 13 on the distal end surface 10a of the insertion portion 10 of the endoscope apparatus 1 is large, and the illumination window 12 It is difficult to increase the occupation area of the objective optical system 32. For example, if the area occupied by the illumination window 12 is small, the amount of illumination light may be insufficient. If the area occupied by the objective optical system 32 is small, it may be difficult to increase the aperture of the lens and the image may become dark.
On the other hand, in the endoscope apparatus 1 of the present embodiment, since there is one projection window 13 for projecting the fringe pattern, the area occupied by the illumination window 12 and the objective optical system 32 can be increased. As a result, it is possible to obtain a brighter image even with the insertion portion 10 having the same thickness as the conventional one, and it is possible to obtain an image with a brightness equal to or higher than the conventional one even with the insertion portion 10 having a smaller diameter than the conventional one. it can.

  Further, according to the measurement method of the present embodiment, even in an environment in which the insertion unit 10 is an endoscope apparatus 1 having a reduced diameter and a fringe pattern is projected from one projection window 13, it is accurately three-dimensional. The shape can be measured.

  In the measurement method of the present embodiment, blur is detected using bright field images before and after pattern projection images are captured, and a three-dimensional shape analysis is performed when it is determined that there is no blur. Analysis is not performed with the fringe pattern on the projected image shifted. For this reason, the analysis precision of a three-dimensional shape can be improved. Further, it is possible to suppress a positional deviation when the measurement result using the pattern projection image is displayed as an overlay on the bright field image.

(Modification 1)
Next, a modification of the endoscope apparatus 1 and the measurement method described in the above embodiment will be described.
This modification differs from the above-described embodiment in that a pattern generation unit 55A (see FIG. 1) is provided instead of the pattern generation unit 55. The pattern generation unit 55A cannot project a light / dark pattern having a different phase, and can project a light / dark pattern having a specific phase onto a test object. That is, the pattern generation unit 55A of the present modification is configured in a small size without an actuator that moves a slit plate or the like.

In this modification, the method for measuring the three-dimensional shape of the test object is also different. Hereinafter, the measurement method of the present modification will be described focusing on differences in processing content from the above-described embodiment.
In the measurement method of the present modification, the scheduled number of shots N in step S4 is 1, and one pattern projection image is shot without repeating steps S4 to S6 in the above-described embodiment, and the process proceeds to step S7.

  Further, the three-dimensional shape analysis method in step S12 and step S15 is also different from the above-described embodiment. In this modification, in step S12 and step S15, a three-dimensional shape is analyzed by a spatial phase shift method or a Fourier transform method using one pattern projection image.

  In the present modification, since the three-dimensional shape is analyzed using one pattern projection image, compared to the case where N striped images are acquired in the above-described embodiment, image capturing is started. The time until the analysis result is obtained can be shortened.

  Note that the measurement method of this modification is a method that can be similarly applied even if the pattern generation unit 55 includes an actuator that moves a slit plate or the like, and a temporal phase shift method using a plurality of pattern projection images. 3D shape can be analyzed quickly compared to.

(Modification 2)
Next, another modification of the endoscope apparatus 1 and the measurement method described in the above embodiment will be described.
In this modification, a pattern generation unit 55A (see FIG. 1) is provided, and the pattern projection unit 50 projects a single pattern of bright or dark lines as shown in FIG. 9 onto the test object. Can be done. FIG. 9 shows a case where one streak-like dark portion R2 is projected in the bright portion R1. Note that one streaky bright portion R1 may be projected in the dark portion R2.
The one pattern itself projected from the pattern projection unit 50 does not move or change its shape or direction.
That is, the pattern generation unit 55A of the present modification is configured in a small size without an actuator that moves a slit plate or the like.

  In this modification, the method for measuring the three-dimensional shape of the test object is also different. Hereinafter, the measurement method of the present modification will be described focusing on the points of difference in processing content from the above-described modification 1 of the embodiment.

  In this modification, in step S12 and step S15, a three-dimensional shape is analyzed by a light cutting method using one pattern projection image. In the present modification, since a three-dimensional shape is analyzed on one pattern using one pattern projection image, in the above-described embodiment, the entire pattern analysis image is analyzed. In comparison, the portion where the three-dimensional shape can be measured is limited, but the analysis time can be greatly shortened.

  Note that the measurement method of this modification is a method that can be similarly applied even if the pattern generation unit 55 includes an actuator that moves a slit plate or the like. By using a plurality of pattern projection images, it is possible to quickly analyze a three-dimensional shape not only in a part of the field of view range (on the screen) but also in a plurality of different parts (positions).

(Modification 3)
Next, another modified example of the endoscope apparatus 1 described in the above embodiment will be described.
In the present modification, the second light source 51 is not provided, but switching means for causing the light emitted from the first light source 41 to enter the second fiber bundle 53 is provided.
As the switching means, for example, a device that switches the optical path of the light emitted from the first light source 41 in a plurality of directions, such as a MEMS mirror module, can be employed.
Even with such a configuration, the same effects as those of the endoscope apparatus 1 described in the above-described embodiment can be obtained. Moreover, since only one light source is required, the number of parts of the endoscope apparatus 1 can be reduced.

(Modification 4)
Next, still another modification of the endoscope apparatus 1 described in the above embodiment will be described.
In this modification, the configuration of the distal end surface 10a of the endoscope apparatus 1 is different from that of the above-described embodiment.
FIGS. 4 to 6 are diagrams showing the configuration of the direct-view insertion section 10 that includes the illumination window 12, the projection window 13, and the like on the distal end surface 10a.
As shown in FIGS. 4 to 6, there are various modes of arrangement of the components on the distal end surface 10 a of the insertion portion 10 of the endoscope apparatus 1.

  For example, as shown in FIG. 4, the objective optical system 32 is disposed on the central axis O of the insertion unit 10, and the illumination window 12 is provided so as to surround the objective optical system 32 by a half circumference of the outer periphery of the objective optical system 32. A projection window 13 is arranged on the side opposite to the illumination window 12 with respect to the objective optical system 32. In such an arrangement, the area occupied by the illumination window 12 can be increased. Further, since the shape of the objective optical system 32 is generally a circle or a shape close to a circle, the arrangement area is limited by arranging the illumination window 12 and the projection window 13 around the objective optical system 32. The endoscope can be efficiently arranged at the distal end portion, and the distal end portion of the endoscope can be easily reduced in diameter. Furthermore, since the center of the endoscopic image coincides with the central axis O of the insertion unit 10, the operator can insert the endoscope without feeling uncomfortable while observing the image of the subject on the monitor.

  A pattern generation unit 55 is provided on the back side of the projection window 13. The pattern generation unit 55 is arranged so that a line pattern is positioned in a direction perpendicular to the arrangement direction of the projection window 13 and the objective optical system. Such an arrangement is an arrangement relationship in which the distance between the projection window and the objective optical system is the closest, while keeping the distance of the perpendicular from the center point of the objective optical system to the line pattern (hereinafter referred to as the baseline length) as long as possible. It has become. Since the measurement accuracy is improved as the baseline length is longer, according to the present modification, a three-dimensional shape can be measured with high accuracy even in an endoscope apparatus in which the insertion portion has a reduced diameter.

  Further, as shown in FIG. 5, unlike the arrangement shown in FIG. 4, the objective optical system 32 is arranged at a position decentered with respect to the central axis O of the insertion portion 10, and the objective optical system 32 and the projection window 13 are interposed therebetween. It can also be set as the arrangement | positioning by which the illumination window 12 was provided in two places which pinch | interpose. The objective optical system 32 is arranged so that the optical axis on the emission side of reflected light in the observation field from the objective optical system 32 toward the imager 31 is parallel to the central axis O and decentered.

  Further, as shown in FIG. 6, the opening 11, the illumination window 12, and the projection window 13 in which the objective optical system 32 is disposed are decentered with respect to the central axis O of the insertion unit 10 on the distal end surface 10 a of the insertion unit 10. It may be arranged at the position. Further, the vertical axis P1 and the left and right axis Q1 passing through the optical axis L of the objective optical system 32 may be disposed at a position where the vertical axis P2 and the left and right axis Q2 passing through the central axis of the insertion portion 10 do not overlap.

  Since the opening 11, the illumination window 12, and the projection window 13 are provided at positions decentered with respect to the central axis O of the insertion unit 10, for example, the objective optical system 32 is on the central axis O of the insertion unit 10. Compared to a conventional endoscope apparatus, the insertion portion 10 can be further reduced in diameter.

(Modification 5)
Next, still another modification of the endoscope apparatus 1 described in the above embodiment will be described.
In the present modification, the first light source 41 and the second light source 51 are disposed in the vicinity of the distal end of the insertion portion 10.

  For example, as shown in FIG. 7, in this modification, the first fiber bundle 43 is not provided, the light from the first light source 41 is directly irradiated toward the illumination window 12, the second fiber bundle 53 is not provided, and the first The light from the two light sources 51 is directly irradiated toward the stripe pattern generation unit 55.

  Further, as shown in FIG. 8, the first light source 41, the second light source 51, and the imager 31 are provided in the vicinity of the distal end of the insertion portion 10, and the removable optical adapter 10 </ b> A is provided at the distal end portion of the insertion portion 10. It can also be.

The optical adapter 10A accommodates part of the illumination window 12, the projection window 13, and the objective optical system 32, and the distal end surface 10a of the optical adapter 10A corresponds to the distal end surface 10a of the insertion portion 10 in the above-described embodiment. To do.
The first light source 41 and the illumination window 12 are connected by an optical fiber 43A arranged in the optical adapter 10A, and the second light source 51 and the pattern generation unit 55 are connected by an optical fiber 53A arranged in the optical adapter 10A. Yes.

Even with the configuration as shown in FIG. 7 and FIG. 8, the same effect as described in the above-described embodiment can be obtained.
Further, since the first light source 41 and the second light source 51 are provided in the vicinity of the distal end of the insertion portion 10, when the insertion portion 10 has a length exceeding, for example, several tens of meters, the first fiber bundle 43 and Light loss is less than when the second fiber bundle 53 is used, and a bright image can be acquired.

(Modification 6)
Next, still another modification of the endoscope apparatus 1 described in the above embodiment will be described. FIG. 10 is a modified example of another arrangement obtained by further modifying the arrangement of FIG. This modification is an example of an endoscope apparatus having a configuration having an optical adapter 10A, and FIG. 10 shows a view of a distal end surface of the optical adapter.

  An objective optical system 32 is disposed on the central axis O of the insertion unit 10, and an illumination window 12 and a projection window 13 are disposed on both sides of the objective optical system 32, respectively. A contact pin 14 for supplying power from the main body side to the first light source and the second light source is provided on the back side of the optical adapter 10A.

  Further, when the optical adapter 10A is attached to the distal end portion of the insertion portion 10, a positioning groove 15 or an alternative structure is provided on the back side of the optical adapter 10A for positioning in the rotational direction with respect to the central axis of the insertion portion. It has been.

  Such contact pins 14 and positioning grooves 15 are respectively provided on the side where the illumination window 12 and the projection window 13 are not disposed with respect to the objective optical system 32. Thereby, even if it is an optical adapter type, the contact pin 14, the positioning groove 15, the illumination window 12, and the projection window 13 are arranged at the distal end portion of the small-diameter endoscope without interfering with each other. Can do.

(Modification 7)
Next, still another modification of the endoscope apparatus 1 described in the above embodiment will be described. FIG. 11 is a modification of the distal end portion in the endoscope apparatus that can observe a direction perpendicular to the central axis of the insertion portion.
In this modification, instead of the distal end surface 10 a, a distal end surface 10 b whose normal is a straight line perpendicular to the central axis of the insertion portion 10 is formed on a part of the outer peripheral surface of the distal end portion of the insertion portion 10. The illumination window 12, the projection window 13, and the cover member 32a are all disposed on the distal end surface 10b.
The objective optical system 32 includes a prism 16 that directs the incident-side optical axis L1 in a direction intersecting the outgoing-side optical axis L2 from the objective optical system 32 toward the imager 31. In this modification, the prism 16 is one of the optical elements constituting the objective optical system 32.
The optical axis L1 on the incident side is an optical axis when the reflected light in the observation field enters the prism 16, and the optical axis L2 on the emission side reflects the reflected light in the observation field from the prism 16 to the imager 31. Is the optical axis when incident on the optical axis.
In the present modification, the incident-side optical axis L <b> 1 is in a twisted position with respect to the central axis O of the insertion portion 10. Furthermore, the optical axis L2 on the emission side is parallel to the central axis O of the insertion portion 10.

  12A and 12B are views of the distal end surface 10b in the endoscope of FIG. 11 as viewed from a direction perpendicular to the distal end surface 10b. The arrangement of the illumination window 12, the projection window 13, and the objective optical system 32 is shown in FIGS. It is a top view which shows an example.

As shown in FIGS. 11 and 12 (a), the tip surface 10b is a substantially flat plane. As shown in FIG. 12A, in this modification, the objective optical system 32 and the projection window 13 are arranged on the central axis O of the insertion portion 10 in plan view, and the two illumination windows 12 are the cover member 32a. It is arranged on the side. Both the objective optical system 32 and the projection window 13 are exposed on the distal end surface 10b which is the outer peripheral surface of the distal end portion of the insertion portion. In this modification, a line obtained by projecting the center axis O perpendicularly to the tip surface 10b is defined as a virtual center line PL. That is, in FIG. 12A, the objective optical system 32 and the projection window 13 are arranged at a position where their centers intersect with the virtual center line PL. In this case, the projection window 13 is a plane in which the center of the projection window when the projection window 13 is viewed from the thickness direction of the projection window 13 is defined by the central axis O of the insertion portion 10 and the optical axis L1 on the incident side. It is a positional relationship that exists within.
Further, as shown in FIG. 12B, the cover member 32a is arranged at a position where the center does not intersect with the virtual center line PL, the illumination window 12 is arranged on the virtual center line PL of the insertion portion 10, and The projection window 13 may be arranged at a position whose center does not intersect with the virtual center line PL. At this time, the center of the cover member 32a and the optical axis L1 of the prism 16 are arranged to coincide with each other, and the objective optical system 32 is arranged so that the optical axis L1 and the virtual center line PL do not intersect. .
FIGS. 12C and 12D are views when the insertion portion 10 is viewed from the direction indicated by reference sign D in FIGS. 12A and 12B, and are front views of the insertion portion 10. As shown in FIGS. 12C and 12D, in this modification, the optical axis L2 when the reflected light in the observation field enters the imager 31 from the prism 16 and the central axis O of the insertion portion 10 are decentered. The objective optical system 32 and the imager 31 are arranged.

As shown in these figures, even in the case of an endoscope for observing the lateral direction, the projection window is 1 in comparison with the case where the projection windows 13 for projecting the light and dark pattern are provided in a plurality of places as in the prior art. It is easy to reduce the diameter of the tip.
In addition, about the shape and arrangement position of each component arrange | positioned at a front end surface, it is not restricted only to the example of Fig.12 (a) (b). For example, in the present modification, the case where the optical axis L1 and the optical axis L2 are orthogonal to each other is illustrated, but the optical axis L1 and the optical axis L2 may intersect at an angle other than orthogonal.

(Modification 8)
Next, still another modification of the endoscope apparatus 1 described in the above embodiment will be described. In this modification, the control operation by the main control unit 22 is different from the above-described embodiment and modification.

  In the present modification, the second light source 51 is provided on the distal end side of the insertion portion 10 as shown in FIG. 7, and is a high-luminance light source such as a laser. In this case, in step S5, the second light source 51 is turned on while the first light source 41 is kept on based on a command from the main control unit 22, and an appropriate fringe is projected from one place onto the test object. The state that has been made may be referred to as a “stripe projection state”. In step S5 described above, when the captured image is nth and n + 1th, the light amount is changed by controlling the second light source 51 without changing the phase of the light / dark pattern. Alternatively, stripe images with different stripe brightness may be taken.

(Modification 9)
Next, still another modification of the endoscope apparatus 1 described in the above embodiment will be described. In this modification, the control operation by the main control unit 22 is different from the above-described embodiment and modification.

In the present modification, in step S9 described above, a bright field image captured before capturing N striped images and a bright field image captured after capturing N striped images are selected, and these The sum of the differences in luminance values between the two images is calculated.
Further, in the above-described step S10, if the sum of the differences between the luminance values calculated in step S9 is smaller than the threshold value, it is determined that there is no blur between the first image and the subsequent image, and the process proceeds to step S11. move on. Conversely, if the sum of the differences between the brightness values calculated in step S9 is greater than the threshold value, it is determined that there is a blur between the first image and the subsequent image. Is displayed on the monitor 28 (step S14), and the series of processes is terminated.
The above example is an example in which the difference is calculated over the entire image. Note that processing may be performed on only a part of the image. Alternatively, the luminance difference may be calculated using one bright field image and one striped image.

(Modification 10)
Next, still another modification of the endoscope apparatus 1 described in the above embodiment will be described. In this modification, the control operation by the main control unit 22 is different from the above-described embodiment and modification.
In this modification, the second light source 51 (see FIG. 7) is composed of a plurality of minute light emitting elements. The plurality of light emitting elements provided in the second light source 51 are controlled to be turned on every two or more groups.

  For example, if a plurality of groups of light emitting elements are arranged in the phase direction of the stripe pattern provided on the light / dark pattern generation unit 55, the light / dark pattern generation unit 55 cannot change the stripe phase arbitrarily. It may be a board with, or something similar. In this case, in step S5, a plurality of different stripes are projected onto the test object by sequentially switching the group of light emitting elements to be lit. Further, in step S6, each of these striped images can be taken.

As mentioned above, although embodiment of this invention was explained in full detail with reference to drawings, the concrete structure is not restricted to this embodiment, The design change etc. of the range which does not deviate from the summary of this invention are included.
For example, in the above-described embodiment, an example is shown in which two bright-field images are selected as images used for detecting blur. However, a stripe image may be used as an image used for detecting blur. Also, more than two bright field images can be taken. If there are more than two bright field images, the necessary number of images can be selected from these bright field images to detect blur. can do.
In addition, the constituent elements shown in the above-described embodiment and each modification can be combined as appropriate.

DESCRIPTION OF SYMBOLS 1 Endoscope apparatus 10 Insertion part 10a Tip surface 11 Opening 12 Illumination window 13 Projection window 20 Operation part 30 Imaging part 32 Objective optical system 40 Illumination part 50 Pattern projection part O Center axis line PL Virtual center line

Claims (4)

An endoscope apparatus for measuring the test object using a pattern projection image of the test object on which a light-dark pattern is projected,
An insertion part;
An imaging unit that is provided at a distal end of the insertion unit and acquires an image of the test object;
An illumination unit that emits illumination light that illuminates the observation field of view of the imaging unit;
A pattern projection unit for projecting the light and dark pattern onto the test object;
With
On the distal end surface of the insertion portion,
An objective optical system that forms an image of the test object on the imaging unit;
One or more illumination windows for emitting the illumination light;
One projection window for projecting the light-dark pattern from the pattern projection unit onto the test object;
Is provided,
The pattern projection unit comprises a pattern generator for generating said unique pattern, the bright and dark patterns, Ri distribution pattern der that the bright portion and dark portion are arranged in repeated alternately,
The objective optical system is arranged such that, among the optical axes of the objective optical system, the optical axis on the exit side from the objective optical system toward the imaging unit is parallel and decentered with respect to the central axis of the insertion unit, A side-view objective optical system that is exposed on the outer peripheral surface of the distal end portion of the insertion portion, and the optical axis on the incident side is arranged at a twisted position with respect to the central axis,
The projection window is exposed on the outer peripheral surface of the distal end portion of the insertion portion,
A center line extending in the thickness direction of the projection window through the center of the projection window when the projection window is viewed from the thickness direction of the projection window is arranged at a twisted position with respect to the central axis of the insertion portion. Endoscope apparatus characterized by being made .   An endoscope apparatus for measuring the test object using a pattern projection image of the test object on which a light-dark pattern is projected,
  An insertion part;
  An imaging unit that is provided at a distal end of the insertion unit and acquires an image of the test object;
  An illumination unit that emits illumination light that illuminates the observation field of view of the imaging unit;
  A pattern projection unit for projecting the light and dark pattern onto the test object;
  An optical adapter that can be detachably attached to the distal end of the insertion portion;
  With
  On the distal end surface of the insertion portion,
    An objective optical system that forms an image of the test object on the imaging unit;
    One or more illumination windows for emitting the illumination light;
    One projection window for projecting the light-dark pattern from the pattern projection unit onto the test object;
  Is provided,
  The pattern projection unit
    A projection light source;
    A pattern generation unit that is provided in the optical adapter, changes an intensity distribution of light emitted from the projection light source, and generates the light-dark pattern;
  With
  The light / dark pattern is a distribution pattern in which bright portions and dark portions are alternately and repeatedly arranged.
  An endoscope apparatus characterized by that. The endoscope apparatus according to claim 2 ,
The endoscope apparatus characterized in that the projection light source is provided in the optical adapter. The endoscope apparatus according to any one of claims 1 to 3 ,
An endoscope apparatus comprising switching means for switching between light for projecting the bright and dark pattern and illumination light.

Images