JP5805930B2 - Ion beam control method for abnormal recovery - Google Patents

Description

Detailed Description of the Invention

〔Technical field〕
The present invention relates generally to ion implantation systems, and more particularly, arc extinguishing circuits that extinguish arcs formed between high voltage electrodes in an ion implantation system, and arc discharge to achieve more uniform ion implantation. The present invention relates to a method of recoating an ion beam to compensate for a loss in time.

[Background Technology]
The ion implantation system is used to add impurities known as a dopant element or the like to a semiconductor substrate or wafer (hereinafter referred to as “processed product”). In such a system, the ion source ionizes the desired dopant element and the ionized impurities are extracted from the ion source as a beam of ions. This ion beam is directed to (eg, passes through) each workpiece to add ionized dopant to the workpiece. Dopant ions change the composition of the workpiece to have the desired electrical characteristics and form individual semiconductor devices such as transistors on the substrate.

  The current trend is towards smaller electronic devices, which are very small, higher power, and more energy efficient semiconductor devices on individual wafers. This requires careful control during the semiconductor manufacturing process, and also requires uniform ion implantation into the wafer, particularly in ion implantation in the semiconductor manufacturing process. Furthermore, the semiconductor device is manufactured on a large processed product in order to increase the production yield. For example, the wafer has a dimension of 300 mm or more so that a large number of devices can be manufactured with one wafer. Such wafers are expensive, and therefore it is highly desirable to reduce waste, such as discarding the entire wafer due to non-uniform ion implantation. Larger wafers and high density properties are advantageous for uniform ion implantation, but the ion beam needs to be scanned at large angles and distances to reach the periphery of the wafer and has not yet been introduced.

  In addition, such an ion beam requires a high voltage to be supplied to the ion source, and thus arcing occurs occasionally between the various extraction and suppression electrodes and other nearby components. This arcing tendency often causes one or more affected HV power supplies to be completely discharged until the arc discharge naturally self-extinguishes at an excessively low voltage. During arc discharge, the beam current becomes very unstable, or is interrupted until the supply voltage returns, and ion implantation becomes intermittent or non-uniform. Therefore, to provide uniform ion implantation at large ion beam implantation angles and distances, it is necessary to mitigate the effects of HV arcing associated with the ion source or electrode of the ion implanter.

[Summary of the Invention]
The following is a brief summary for a basic understanding of one or more aspects of the present invention. This summary is not an extensive overview of the invention, and is not intended to understand features of the invention (or to understand key features) and to limit the scope of the invention. Rather, the primary purpose of this summary is to present some content of the invention in a simplified form as a prelude to the more detailed description that is presented later.

  The present invention is coupled to an ion source of an ion implantation system, for example, to reduce arc duration, to reduce ion implantation non-uniformity, and to reduce non-constant ion beam current. The present invention relates to a circuit for extinguishing an arc formed between high voltage (HV) electrodes. Some high voltage high speed (HVHS) switch circuit configurations have added an HVHS switch added in series between each high voltage power supply and its respective electrode coupled to the ion source to rapidly extinguish harmful arcs. Has been disclosed. Different forms of arcs in these regions tend to substantially discharge the high voltage capacitors in the HV power supply due to, for example, the ion source, extraction electrode power supply voltage (Vext), or suppression electrode power supply voltage (Vsup). is there.

  Thus, these “anomalies” in the ion beam current (Ibeam) dramatically affect the ion beam current, and therefore it takes considerable time for the power supply voltage and the ion beam current Ibeam to recover. Thus, the arc extinguishing circuit of the present invention reduces ion beam interruption and beam current recovery speed.

  Furthermore, the circuit and method facilitate reapplying the ion beam in those areas where an arc is detected to recover the dose loss during arcing. The circuit also controls the horizontal and vertical scan operations of the wafer implanted by the ion implanter, monitors the horizontal and vertical scan positions in relation to arc detection, and scans in relation to the arc detection. A motion control system capable of initiating the return to the initial position.

  The trigger control circuit of the present invention also receives a recoat command from the motion control system and recoats the ion beam between a first scan position and a last scan position associated with the detection of the arc. In addition, the HV switch is forcibly turned on or off in response to the recoating command to recover the administration loss during arc discharge.

  According to one or more aspects of the present invention, it is disclosed that an arc extinguishing circuit for an ion source of an ion implantation system can be suitably used for ion implantation into one or more workpieces. In one aspect of the invention, the ion source or electrode is connected in series to a high voltage power supply (HVPS) for an ion source (or several HV extraction or suppression electrodes) to extinguish the arc. Including a high voltage high speed (HS) switch capable of shutting down and recovering the HV power supply current. A large amount of ions extracted from the ion source in the form of an ion beam has a beam current. The system also includes a trigger control circuit that detects current or voltage changes associated with the ion source or HV electrode and controls opening and closing of the one or more HV switches based on the detection. One or more protection circuits also protect each HVHS switch, absorb energy from reactance elements external to each HV switch, and clamp overvoltages generated at the switch.

  According to another aspect of the present invention, the system further includes a synchronization circuit that synchronizes the trigger control circuit of two or more arc extinguishing circuits and measures time for opening and closing two or more high voltage switches. .

  According to yet another aspect of the present invention, the detection of a current change or voltage change detected in connection with the ion source includes a current surge of the HV power supply, a decrease in ion beam current, a decrease in suppression electrode voltage, and Including one of the drop in the extraction electrode voltage.

  According to yet another aspect of the invention, one of the protection circuits is connected in series with the HV switch that it protects.

  According to yet another aspect of the invention, one of the protection circuits is connected in parallel with the HV switch that it protects.

  According to yet another aspect of the invention, the system further includes an extraction suppression electrode disposed in close proximity to the ion source.

  According to yet another aspect of the invention, the detection of the current or voltage is performed during the ion implantation step facilitates a feedback or closed loop that regulates the current or voltage of the ion source.

  According to yet another aspect of the invention, the detection of the current or voltage is performed prior to the ion implantation step facilitates an open loop that regulates the current or voltage of the ion source.

  According to yet another aspect of the present invention, the detection of the current or voltage is performed during the ion implantation step facilitates an open loop that regulates the ion beam current.

  In accordance with one or more aspects of the present invention, an arc extinguishing circuit for a high voltage power source of an ion implantation system coupled to an ion implanter to extinguish an arc generated in the ion implantation system. A high voltage switch connected in series to a high voltage power supply for the electrode being active and capable of interrupting and restoring current to the electrode. The system also includes a trigger control circuit that detects current or voltage changes associated with the electrodes and controls opening and closing of the one or more HV switches based on the detection. Finally, the system includes one or more protection circuits coupled to one of the high voltage switches and absorbing energy from reactance elements external to the HV switch and limiting overvoltage at the switch. .

  According to another aspect of the present invention, an arc extinguishing circuit coupled to a high voltage power supply is used for the electrodes of the ion implantation system to extinguish the arc in the ion implantation system and to administer during arc discharge. A method of recoating an ion beam to recover a loss, the step of horizontally scanning a wafer before the ion beam, the step of vertically scanning the wafer before the ion beam, and an arc at the electrode Detecting a current change or a voltage change associated with, and monitoring a horizontal and vertical scan operation to obtain an initial detection position and a final detection position associated with the arc detection. The method further includes an HV switch connected between the electrode and the high voltage power source to extinguish the arc and interrupt the arc current to the electrode when the arc is detected. Controlling to open, and controlling to close the HV switch to restore the ion beam and to restore the connection between the electrode and the high voltage power source when the arc is not detected. And re-applying the ion beam after the arc.

  According to yet another aspect of the present invention, the method further comprises the step of recoating, moving the wafer to the first detection position associated with the arc detection, and enabling the ion beam. Closing the HV switch to scan, scanning the wafer horizontally and vertically before the ion beam until the last detection position associated with the arc detection is encountered, and disabling the ion beam. And opening the HV switch in order to make it easier.

  According to yet another aspect of the present invention, the method further comprises two or more high voltage switches used to extinguish an arc between the electrodes of each of the two or more high voltage power supplies of the ion implanter. A step of synchronizing two or more arc extinguishing circuits and a step of recoating the ion beam after the arc from the electrode.

  According to still another aspect of the present invention, the re-coating step is performed only if the detected arc duration is longer than a predetermined interval.

  According to yet another aspect of the invention, the re-coating step is delayed until the ion beam scan returns to the wafer loading and unloading position.

  According to yet another aspect of the invention, the re-coating step is delayed until the ion beam scan completes a current horizontal scan operation.

  According to yet another aspect of the invention, the horizontal and vertical scans are continued after detection of the arc.

  According to yet another aspect of the invention, the recoating step is delayed to the end of the ion beam scan, and the one or more arc detections are co-reapplied during one or more continuous scanning operations. .

  In order to accomplish the above and related ends, the following description and accompanying drawings illustrating in detail the form and implementation of the present invention will be used. These illustrate the principles of the invention utilized in several different ways. Other aspects, advantages, and novel features of the invention will be understood from the following details of the invention when considered in conjunction with the drawings.

[Brief description of the drawings]
FIG. 1 is a schematic block diagram illustrating the configuration of an ion implantation system according to one or more aspects of the present invention that extinguishes an arc associated with an ion source of an ion implanter.

  FIG. 2 is a simplified block diagram illustrating an exemplary ion implantation system using the arc extinguishing circuit of the present invention.

  FIG. 3 is a graph plotting changes in the beam current of the ion implanter and the extraction / suppression voltage during arc discharge of the high voltage electrode of the ion implantation system shown in FIG.

  FIG. 4 is a simplified schematic diagram illustrating an exemplary suppression electrode high voltage supply circuit having a conventional arc suppression circuit for use in an ion implantation system.

  FIG. 5 is a simplified block diagram illustrating an exemplary arc extinguishing circuit used in conjunction with a high voltage supply of an ion source used in an ion implantation system according to the present invention.

  6A and 6B show arc extinction results when the HVHS switch of the arc extinguishing circuit of the present invention is opened and closed, respectively, tested in air or in vacuum during arc discharge of the extraction electrode coupled to the ion source. It is a graph.

  FIG. 7 utilizes HVHS switches in the three high voltage power supplies of the ion implanter and orders the current and voltage recovery to each of the three electrodes, the illustrated high voltage supply circuit, and the associated ion implantation system. And a simplified schematic diagram illustrating an exemplary arc extinguishing circuit used in an ion implanter utilizing a synchronizing circuit to synchronize.

  FIG. 8 illustrates the switch in series to absorb energy from a reactive element external to each HVHS switch and to control the overcurrent of the switch, according to one or more aspects of the present invention. FIG. 2 is a schematic diagram illustrating an exemplary protection circuit being used across.

  9A and 9B are simplified diagrams illustrating an exemplary ion beam and relative scan operation between the wafer. Here, the wafer is automatically moved in the horizontal and vertical directions by the motion control system. When an arc is encountered, the ion beam may temporarily create a glitch hole or a glitch strip with a loss corresponding to long-term administration. Such areas are reapplied based on one or more aspects of the present invention.

  FIG. 10A is a simplified block diagram illustrating another exemplary arc extinguishing circuit used in conjunction with an ion source high voltage supply for use in an ion implantation system according to the present invention. Here, the trigger control circuit has an external trigger input for controlling the trigger of the HVHS switch from the outside, for example, together with the Faraday cup current input.

  FIG. 10B illustrates a waveform of a Faraday cup current used to supply a trigger voltage to the external trigger input of the exemplary arc extinguishing circuit shown in FIG. 10A, used in accordance with one or more aspects of the present invention. It is.

  FIG. 11 determines the utilization, sequence, control, synchronization of current or voltage recovery to one or more electrodes, and duration of arc loss, between HVHS switches between the high voltage power supply-injector electrodes. A model used in an ion implanter that uses a switch control circuit to perform and adjusts a reapplication command from an operation control system or a forced switch control command from an ion implantation system according to one or more aspects of the present invention. FIG. 2 is a simplified schematic block diagram illustrating a typical arc extinguishing controller.

  FIG. 12 is a flowchart illustrating an exemplary arc extinguishing method in an ion implantation system using the arc extinguishing circuit of the present invention according to some aspects of the present invention.

  FIG. 13 is a flowchart illustrating an exemplary arc extinguishing method in the ion implantation system using the arc extinguishing controller shown in FIG. 11 in accordance with one or more aspects of the present invention.

Detailed Description of the Invention
The present invention will be described with reference to the drawings. In the drawings, the same reference numerals are used for the same elements throughout. The drawings and the following description are exemplary in nature and are not intended to be limiting. Thus, it is understood that variations to the systems and methods illustrated, as well as other implementations apart from those shown herein, are considered to be within the scope of the invention and the appended claims. It will be.

  The present invention relates to the disappearance of an arc formed between high voltage extraction electrodes or high voltage suppression electrodes, for example, associated with an ion source of an ion implantation system. The arc extinguishing circuit shortens the arc duration. Therefore, for example, the continuation of an unstable ion beam can be reduced, and non-uniformity of ion implantation can be minimized.

  Furthermore, the circuit and method facilitates ion beam reapplication. The arc is detected to make up for the loss during the arc discharge. In one aspect, the circuit controls horizontal and vertical scan operations of a wafer implanted by an ion implanter, monitors horizontal and vertical scan positions in relation to arc detection, and relates to arc detection. Thus, an operation control circuit capable of performing initialization for returning the scan to the initial position is included or communicated with the operation control circuit.

  In accordance with the present invention, a high voltage high speed (HVHS) switching circuit includes an HVHS switch (eg, 65 KV for a 200 MHz MOSFET). This HVHS switch is connected in series and supplies, for example, a high voltage to the suppression and / or extraction electrode or the GND electrode in order to extinguish harmful arcs. When such an HV arc occurs, the high voltage capacitor of the HV power supply is substantially discharged. This large-scale discharge dramatically affects the ion beam current and requires a considerable amount of time to restore the power supply voltage and ion beam current. Such HVHS switches have recently become available as manufacturing items and therefore the arc extinguishing circuit of the present invention can be used immediately in such applications.

  These HVHS switches are also advantageous in that they can provide an ion implanter that can arbitrarily and easily switch the ion beam on and off. This switching is done automatically using commands from either the infusion device control system, its computer, or an external input, or a switch. The ion implanter takes a considerable amount of time to order through startup and preparation time to stabilize the level of ion beam used for implantation. This is because, after the above preparation, for example, when a new wafer is prepared / not prepared, at the start / end of a wafer scan, and, if necessary, an extra moving area part of the wafer column scan , The beam can be switched on and off, which is very advantageous. As a result, the system of the present invention facilitates this advantageous feature known as the “beam duty factor”. The “beam duty factor” is a ratio between the ON time and the OFF time of the ion beam. To reduce this beam duty factor, we also consider reducing the total number of particles on the wafer. This is because most of the beam will be effectively utilized on the wafer rather than the peripheral surface adjacent to the wafer.

  The high voltage switch is controlled by a trigger circuit that detects a current or voltage change from the HV power supply to the electrode. This change occurs in connection with arc formation at the electrodes. The arc extinguishing circuit also includes a protection circuit for one or more HV switches that absorbs excess energy from the reactive components around the HVHS switch and clamps the overvoltage from the HVHS switch. This protection circuit is connected in parallel and / or in series with the HVHS switch. The arc extinguishing circuit of the present invention further includes a synchronization circuit that sequences and synchronizes the restoration of current and voltage to each of the three electrodes and the high voltage power supply circuit associated with the ion implantation system.

  In order to facilitate re-application of the ion beam to the arced area, the circuit of the present invention also communicates with an ion implanter operational control system. In particular, during a typical implant scan, the horizontal (eg, column) and vertical motion of the wafer is typically monitored by the motion control system prior to the ion beam. If an arc occurs, for example, the initial and final horizontal and vertical positions associated with arc detection are recorded for the next repainting step. Thereafter, at the end of the particle train scan or at the end of the wafer scan, for example, around the load / unload position, the motion control system initializes the re-application process.

  In the recoating process, the ion beam is first disabled by opening the HVHS switch, and the wafer is moved to the first horizontal and vertical scan position in connection with the initial detection of the arc. Depending on the circumstances, the beam may scan the wafer if the implanter facilitates this type of scan. Alternatively, the recoating process may return the wafer operation to the beginning of the row (horizontal) scan. Here, the arc is initially detected, and the scanning operation can usually start from a row before the initial arc detection position. This modification is preferable in that the scanning operation is accelerated at the same speed when the arc is initially detected. Subsequently, if the ion beam is at the initial arc detection position, the beam is enabled by closing the HVHS switch while the wafer is being scanned horizontally and vertically to the second horizontal and vertical scan position associated with the final detection of the arc. To be. When this final detection point is reached, the HVHS switch is opened to disable the ion beam.

  The HVHS arc extinguishing circuit according to the present invention is illustrated and described in the light of an ion source and an ion implantation apparatus. However, those skilled in the art will recognize that such a high voltage fast arc extinguishing circuit is an HV fast arc extinguishing circuit. It will be appreciated that it is applicable to other applications that require it (eg, x-ray equipment, accelerators, other ion source applications). In this case, the undesired high voltage power supply arc short circuit may be extinguished before the high voltage power supply is sufficiently discharged, affecting the output of the associated system (eg, the ion source of the ion implanter). .

  FIG. 1 is a block diagram illustrating an exemplary arc extinguishing circuit 100 for a high voltage power supply for an ion source suitable as one or more aspects of the present invention. The arc extinguishing circuit 100 detects a current change in the high voltage power supply 102 in order to generate a large amount of ions that are extracted as the ion beam 130 by the high voltage power supply 102, the high voltage high speed HVHS switch 104, and the ion source 120. Current transformer (CT) 106. A change in the supply current of the ion source 120 is detected by the CT 106, and the trigger control circuit 108 opens the HVHS switch 104 when a surge current is detected.

  The HVHS switch 104 is protected by a parallel protection circuit 110 and a series protection circuit 115, respectively, to protect the switch from overvoltage damage and to absorb energy from reactive components around the switch 104. Protection circuits 110 and 115 also protect the switch 104 and other configurations of the ion implanter by attenuating signals induced by external reactance components in the switching transistor and HVHS switch 104.

  For example, the arc extinguishing circuit 100 operates by detecting a surge current in the CT 106 when an arc occurs in the ion source 120 as an ion beam current at the output of the ion source 120 or at the extraction electrode. The trigger control circuit 108 receives the surge current detected from the CT 106 and controls the HVHS switch 104 to open in order. When the HVHS switch 104 is opened, the arc current becomes close to zero via the CT 106 and extinguishes or quenches the arc.

  The inventors of the present invention have further found that the arc remains due to a limited period of time before the HVHS switch is closed again, or a more conductive gaseous by-product from the arc that remains in the area. Found to recur. Therefore, a delay time causes a delay in the trigger control circuit or the synchronization circuit (for example, reference numeral 740 in FIG. 7). Details will be described later. The switch may open and close rapidly until the arc does not recur.

  FIG. 2 is a diagram illustrating an exemplary ion implantation system 200 that can be used in an arc extinguishing circuit similar to the arc extinguishing circuit 100 shown in FIG. 1 according to the present invention. For example, the ion implantation system 200 includes an ion source 120 having a plurality of extraction electrodes 208 that provide a source of ions as the ion beam 130 of the implantation system 200. The ions in the ion beam 130 are first analyzed in the first region by a mass analysis magnet 212 with magnetic field detection that filters out ions of undesirable mass or energy. The mass analysis magnet 212 operates to provide a magnetic field across the beam path 130 so that ions can be detected from the ion beam 130 in a mass-based changing trajectory (eg, charge mass ratio). The movement of ions through the magnetic field is influenced by the force that guides individual ions of the desired mass along the beam path 130, and the deflected ions of the undesired mass move away from the beam path.

  The ions of the ion beam 130 having the desired mass and energy are then accelerated or decelerated in the second region 220 and focused by the determined resolve aperture / deceleration plate 232 and measured by the setup Faraday cup 234. Is done. In the region 230, the beam is adjusted by a plasma shower 236 provided for neutralizing the space charge. Finally, the ion beam 130 is input to a terminal station 240 for implantation into the wafer 242 at the level measured by the disk Faraday cup 244.

  During ion implantation, the arc 205 can occur between, for example, a high voltage extraction electrode, a high voltage suppression electrode, or a GND electrode associated with the ion source. In conventional injection systems, this arc tends to completely discharge the high voltage power supply before the arc self-extinguishes. The arc extinguishing circuit shown in FIG. 1 avoids this problem, for example.

  FIG. 3 is a diagram showing a plot 300 of changes in beam current when an arc is generated in the high voltage extraction / suppression electrode of the ion implantation apparatus similar to the ion implantation system shown in FIG.

  In the plot 300 of FIG. 3, for example, the arc discharges the extraction voltage 310 from about 2.2 KV to around 0 V in about 0 ms at time 315. At approximately the same time, while the beam current Ibeam 330 drops to near 0 mA, the suppression voltage 320 drops from about −9.3 KV to about 0 V. The extraction voltage 310 and the suppression voltage 320 are each near 0V and the arc self-extinguishes, thus allowing these voltages to be recharged to their original voltage level. As indicated by reference numeral 340, the extraction voltage 310 overshoots this original voltage, and the recovery of the beam current Ibeam 330 is disadvantageously delayed in about 67 ms until time 345. Here, the extraction voltage 310 generally recovers. It can be seen from plot 300 that the electrode voltage change is relatively large and has a long effect on the beam current. As a result, FIG. 3 demonstrates that it is effective to rapidly open the high voltage path between the electrodes for the ion beam, and that the high voltage power supply before the HV power supply produces a large discharge. The HVHS switch of the present invention achieves this goal.

  FIG. 4 shows a portion of a typical ion implantation system 400 having a high positive voltage extraction power supply 403 that provides an extraction slit 404 and a high negative voltage suppression power supply 406 that provides a suppression electrode 408 adjacent to the GND electrode 409. FIG. The HV suppression power supply 406 includes a conventional arc suppression or protection circuit 410. The arc suppression or protection circuit 410 includes a current limiting resistor 412 for limiting the arc current to the suppression electrode 408, a capacitor 414 for filtering and stabilizing the power supply voltage, and the arc repeatedly turning on and off. Meanwhile, a flyback diode 416 is used to limit the reverse voltage generated from the reactance element of the circuit. In the present invention, arc protection substrate 410 is also used in connection with the HVHS switch of the present invention (eg, reference numeral 104 in FIG. 1) to protect the HVHS switch from damage.

  FIG. 5 is a diagram illustrating an exemplary arc extinguishing circuit 500 used in conjunction with a high voltage power supply of an ion source as used in an ion implantation system according to the present invention. For example, the arc extinguishing circuit 500 includes a high voltage negative power supply (Vb) in which an HVHS switch 504 (eg, a series stack of MOSFET transistors) and a series switch protection circuit 510 that drives a load (eg, ion source 120) are connected in series. ) 503. The arc extinguishing circuit 500 detects a change in the current of the power supply 503 to the ion source 120 that is used to generate a large amount of ions that are extracted, for example, in the form of an ion beam (eg, the ion beam 130 of FIG. 1). It further includes a current transformer CT506.

  The circuit 500 also includes a trigger control unit 508 that detects a current change in the supply current (Iext) 509 to the ion source 120. If the current surge indicates an arc, a supply current (Iext) 509 is detected by CT 506 and then trigger control circuit 508 controls to open HVHS switch 504 and extinguish the arc. Therefore, the capacitor C1 518 in the load (eg, ion source 120) and the voltage at the load (Va) are isolated from the voltage Vb of the high voltage power supply 503 by the HVHS switch 504. Therefore, Va at C1 514 of the load is discharged due to the occurrence of an arc, but in general, the negative power supply voltage Vb is in a state of being charged with a voltage for insulation by the HVHS switch 504.

  Again, the HVHS switch 504 is protected by a parallel protection circuit 510 and a series protection circuit 515 that absorbs energy from reactance elements external to the switch 504, thereby protecting the switch from overvoltage damage. The arc extinguishing circuit 500 of the present invention may be used in any ion implanter or other application that uses a high voltage power source subject to arcing at the output of the power source.

  FIGS. 6A and 6B are diagrams of the present invention tested in air (eg, 600 in FIG. 6A) or in vacuum (eg, 650 in FIG. 6B), respectively, during arc discharge of an extraction electrode coupled to an ion source. It is a graph which shows the arc extinction effect at the time of opening and closing the HVHS switch of an arc extinction circuit. As shown by the plot, the arc shown by plot 650 in FIG. 6B is much more easily extinguished in an actual vacuum environment than the arc tested in air. This is due to the extra heat generated in the ionized air around the arc generated in air compared to the arc in the actual vacuum environment. However, the plot 600 of FIG. 6A is useful to show the stable effect that the HVHS switch circuit maintains the Vb negative supply voltage even in this more complex air filled environment.

  FIG. 6A shows the present invention during arc discharge of an extraction electrode (eg, reference numeral 208 in FIG. 2) coupled to an ion source (eg, reference numeral 120 in FIGS. 1 and 5) during testing in air. 6 is a plot 600 showing the effect of arc extinction when opening and closing the HVHS switch 610 (eg, reference numeral 504 of FIG. 5) of the arc extinguishing circuit (eg, reference numeral 500 of FIG. 5). FIG. 6A shows, for example, the voltage 610 in the HVHS switch 504 when closed 610a and open 610b, the high voltage power supply Vb 630 of the power supply 503, and the high voltage Va 620 that can be identified by a load (eg, reference numeral 120).

  Prior to time 0.0, the high voltage power supply Vb 630 is about -6 KV and the high voltage source Va 620 at the load is also about -6 KV. At time 0.0, an arc occurs at high voltage source Va 620 at the load. The voltage then drops rapidly from about 6 KV of reference number 620a to about 1.6 KV of reference number 620b. In response to this, the trigger control circuit 508 receives the current detected by the CT 506 and controls the HVHS switch 504 to open as indicated by reference numeral 610b. After about 0.6 ms, the arc begins to disappear as the HVHS switch opens. The power supply voltage at the load then begins to recover somewhat as indicated by Va 620c and switch voltage 610c. Since the arc is not completely extinguished and the HVHS switch is now closed, the arc recovers and reopens the switch 504, as indicated by the switch voltages 610b and Va 620b, between approximately 0.7 and 1.2 ms. Therefore, a sufficient current starts to be taken out again.

  Again, approximately 0.6 ms later, at time 1.2 ms, the HVHS switch opens, so the arc begins to disappear. The load power supply voltage then begins to recover somewhat as indicated by Va 620b and switch voltage 610d when switch 504 is closed again. At this time, however, Va 620 does not have a chance to fully recover and when the switch is closed again at reference numeral 610d, Va 620 discharges to approximately 0V. The arc extinguishing circuit responds again at about 1.3 ms by opening the HVHS switch 504 at reference number 610b. Va 620d then remains at about 1.6 KV at 620b until approximately 1.75 ms when HVHS switch 504 is closed again as indicated by switch voltage 610a and Va 620 recharges to about 6 KV at 620a. Rapid recovery of Va 620 is possible because the high voltage Vb 630 of the HV power supply 503 remains relatively stable and is isolated by the rapid switching action of the HVHS switch 504 controlled by the arc extinguishing circuit 500 of the present invention.

  Similarly, FIG. 6B illustrates an extraction electrode (eg, see FIG. 2) coupled to an ion source (eg, reference numeral 120 in FIGS. 1 and 5), for example when testing the ion implanter in an actual vacuum environment. FIG. 6 shows a plot 650 of the relative amplitude level of a signal provided by an arc extinguishing circuit according to the present invention (e.g., reference numeral 500 in FIG. 5) during an arc discharge at number 208). FIG. 6B also has a suppression voltage Vsup 690 supplied by a high negative power supply voltage, triggered by a Vex trigger control signal 680 derived from the current of a Vex power supply (eg, from CT 506) and supplied by a high positive power supply voltage. Fig. 6 shows a Faraday current 660 detected during opening and closing of an HVHS switch (e.g., reference numeral 504 in Fig. 5), measured at an extracted electrode voltage Vex670. Further, FIG. 6B shows that the voltage 670 at the HVHS switch 504, the high voltage source Vb 630 of the power supply 503, and the load (eg, reference number 120) can be confirmed when the switch is closed at 670a and opened at 670b. Voltage Va620 is shown.

  When an arc occurs before time 0.0, the detected Faraday current I-faraday 660 is at the high level 660a, the high positive power supply voltage of the electrode voltage Vex670 is at the high positive voltage level 670a, and the high and negative of the electrode voltage Vsup690 is high. The power supply voltage is at a high positive voltage level 690a, and the Vex trigger control signal 680 is at a high level 680a. At time 0.0, an arc occurs at a high voltage source (eg, Va 620), for example, at the Vex electrode. The Vex 670 and Vsup 690 voltages then rapidly drop to a low level voltage as indicated by reference numbers 670b and 690b. In response, the current detected by the CT 506 is received by, for example, the trigger control circuit 508, and the Vex trigger control signal 680 is set to a low level to control the HVHS switch 504 to open as indicated by reference numeral 670b. 680b. Further, the detected Faraday current I-faraday 660 falls to the low current level 660b. After approximately 0.3 ms with the HVHS switch open, the Vex trigger control signal 680 returns to the level 680a indicating that the arc has disappeared. The Vex trigger control signal 680 controls the HVHS switch to close again, and in response, the Vex 670 returns to the 670a level.

  Thereafter, in the vicinity of 0.6 ms, since the arc disappears, the power supply voltage at the load recovers again to the Vsep 690a level, so that sufficient recovery to Vsup 690 is started. That is, thereafter, at 0.65 ms to 0.7 ms, the beam current recovers as indicated by I-faraday 660 recovering to the 660a level. Therefore, the arc extinguishing circuit of the present invention can extinguish the arc at the high voltage electrode of the ion implantation apparatus, and for example, the abnormal period of the ion beam can be reduced to about 0.7 ms. Recognize.

  FIG. 7 shows a simplified schematic diagram of an exemplary arc extinguishing circuit 700 used in an ion implanter according to some aspects of the present invention. The arc extinguishing circuit 700 is similar to the circuits of FIGS. 1, 4 and 5 and will not be fully described again for the sake of brevity. Circuit 700 is an HVHS switch (A, B, and C) 704 (eg, a series stack of MOSFET transistors) with three separate high voltage power supplies (Vext 703, -Vsup1 731, and -Vsup2 732) of the ion implanter. We are using. Arc extinguishing circuit 700 also includes current transformers (CT1, CT2, and CT3) 706. Current transformers (CT1, CT2, and CT3) 706 detect current surges indicative of arc 725 at each ion beam electrode, eg, extraction electrode or arc slit 720, suppression electrode 721, 722, or GND electrode 724. Thus, it is received by a trigger control circuit 708 that controls to open the switches A, B, C 704, and detects a current surge at each high voltage source. As shown, according to one aspect of the invention, each independent electrode power source (eg, Vext 703, -Vsup1 731, and -Vsup2 732) independently arcs the GND electrode or other electrodes. Thus, each HV power supply will be protected by another HVHS switch.

  Arc extinguishing circuit 700 further includes arc protection circuit 715. The arc protection circuit 715 includes current limiting resistors (R1, R2, and R3) 712 to protect the HVHS switch 704 from temporary switching and overvoltage damage caused by reactance elements of the circuit coupled to each HV power source. It has a filter capacitor (C1, C2, and C3) 714 and a flyback diode (D1, D2, and D3) 716.

  The circuit 700 also uses a synchronization circuit 740 that synchronizes and orders the reapplication of the power supply voltage to each of the three high voltage electrodes 720, 721, 722. For example, it is discussed that the synchronization circuit 740 should close switches B and C704 again before closing switch A again. Furthermore, the synchronization circuit 740 provides a delay time suitable for re-application of each individual HV power supply. Some continuous or timing relationships between the power supplies include re-application and / or re-opening of composite switches with several HVHS switches connected in series or in parallel to each other or to each HV power supply. ,is expected.

  It is used in the present invention as a variation of the synchronization circuit 740 (such as changing current, voltage, infrared or other wavelengths of light energy, or other changes that indicate or are associated with the arc 725) and can adapt itself. It will be appreciated that the switching and synchronization control is monitored and used to adjust the order and / or timing of synchronization to further reduce or compensate for arcing power supply changes.

  It is also understood that the HVHS switch can be switched at one or more specific frequencies to provide or modulate several electrode voltages and / or dynamic pulse width control of beam current in response to arc detection. The In addition to electrode arc detection and extinction, HV power supply modulation is also provided in response to known non-uniformities of the system (eg, specific beam currents produce predictable non-uniform results). The use of modulation or the like is the achievement of uniform dosing to the wafer, and uniformity is achieved by a predetermined dopant profile that is a subset of the entire case.

  It will also be appreciated that the arc extinguishing circuit of the present invention is used prior to implantation as well as during implantation.

  Also, the beam current is monitored to control the arc extinguishing circuit, or to define a relatively constant beam current in response to deformation of the HV power source when an electrode arc occurs. .

  FIG. 8 illustrates a cross-over or series across HVHS switch 804 to absorb energy from reactance elements external to each HV switch 804 and to limit overvoltage in the switch according to one or more aspects of the present invention. An exemplary protection circuit 810, as used, is shown. Protection circuit 810 protects switch 804 and other related components by attenuating ringing caused by temporary switching from HVHS switch 804. The protection circuit 810 is similar to the protection circuit 110 in FIG. 1 and the protection circuit 510 in FIG. Protection circuit 810 includes a series capacitor Cs connected in series with a parallel combination of series diode Ds and series resistor Rs. The protection circuit 810 is wired in parallel with the HVHS switch 804. The HVHS switch 804 includes an HVHS switch (eg, a series stack of MOSFET transistors) and a diode Dp connected in parallel to the switch. The HVHS switch 804 is provided, for example, with or without a parallel diode Dp.

  Two or more HVHS switches, etc., are connected in series with each other or with the HV power supply to extinguish arcs generated in connection with, for example, an ion source, an ion implanter, or other equipment using a high voltage power supply. Or it will be understood in the present invention that they are connected in parallel.

  FIG. 9A shows a simplified diagram 900 illustrating a wafer scan of a relative scan operation between an exemplary ion beam 130 and a wafer 910. FIG. 9B shows a simplified diagram 950 illustrating a wafer scan of a relative scan operation between the exemplary ion beam 130 and the wafer 910. The wafer is moved simultaneously in the vertical direction 920 and the horizontal direction 930 by the motion control system. The illustrated vertical scan operation 920 is slower than the horizontal scan operation 930. The scan operation provided by this exemplary motion control system results in an operation that includes a scan vector 936 that is somewhat oblique across the wafer 910. These scans repeat the horizontal scan of each horizontal scan and the overscan beyond the edge of the wafer 910 up to the load / unload position 935. These scans are performed at the end of the wafer 910, one endpoint of the vertical scan 920. To be achieved. Dotted line 937 shows an exemplary path for the next scan 937 after the ion beam 130 reaches the load / unload position 935, the lower endpoint of the vertical scan 920. If an arc is encountered along the scan, the ion beam 130 may temporarily generate an abnormal hole 940 (short break) or an abnormal groove 960 with a loss corresponding to long-term administration. . Such dose loss areas are reapplied in accordance with one or more aspects of the present invention.

  For example, if an arc occurs at the time of injection, the horizontal and vertical motor driven encoder positions by the motion control system are monitored, and therefore the first detection position 940a and the last detection position 940b associated with the arc are recorded. The arc extinguishing circuit functions as described above to extinguish the arc between the first detection position 940a and the last detection position 940b. After arc detection and extinction, wafer scanning and ion implantation continue as usual. Thereafter, at the end of a vertical scan 920, eg, load / unload position 935, or at the end of an individual column scan 936, as described above, a trigger control circuit (eg, reference numeral 508 in FIG. 5 or The recoating process is started by modulating the reference number 708 in FIG. 7 or a synchronization circuit (eg, reference number 740 in FIG. 7). Such modulation is triggered by the trigger control circuit receiving instructions (see reference numeral 506 in FIG. 10A and reference numeral 1108 in FIG. 11) from the infusion device computer or motion control circuit to initiate the recoating process. Is done.

  In the recoating step, first, the ion beam 130 from, for example, the ion source (for example, reference number 120 in FIG. 5) and the extraction / suppression electrodes 720 and 722 is turned off via the HVHS switch (for example, reference numbers 504 and 704). The process of carrying out is included. Thereafter, the ion beam 130 or wafer 910, for example, first returns the beam at the beginning of a row (horizontal) scan 936 where the arc was first detected, thereby providing a first horizontal / vertical scan position where the arc was first detected ( For example, moved to reference number 940a or reference number 940b) or rescanned 945. In this way, the scanning operation can be started from the row as usual before the first arc detection position is encountered. As a result, the wafer will then be fully accelerated to the same speed as when the arc was first detected. While the wafer 910 is performing a vertical scan 920 and a horizontal scan 930, respectively, in front of the ion beam 130 at the position of the former initial arc detection 940a, 960a, the ion beam 130 is switched to the HVHS switch (eg, reference numeral 504). , 704) is enabled. If a second horizontal and vertical scan position (eg, reference number 940b or 960b) associated with the last detection of the arc is encountered, the HVHS switches 504 and 704 are opened to disable the ion beam 130 again.

  The ion beam may be rescanned 945 in a direction opposite to the initial scan direction, for example, starting from the last detection position 940b or 960b, or continuing the scan in the direction of the first detection position 940a or 960a. . However, this direction is as accurate as achieved by recoating the ion beam 130 in the same direction as the original scan direction (see original direction indicated by arrows in short abnormal holes 940 and long abnormal grooves 960). May not be able to play the loss.

  FIG. 10A is a diagram illustrating an exemplary arc extinguishing circuit used in conjunction with a high voltage power supply 503 of an ion source 120 used in an ion implantation system (eg, reference numeral 200 of FIG. 2) according to the present invention. . The trigger control circuit 508 has an external trigger input 1010 for controlling the trigger of the HVHS switch circuit 504 from the outside together with a Faraday cup current (Ifaraday) input used as a sample of, for example, an ion beam current (Ibeam).

  FIG. 10B illustrates a Faraday cup current (Ifaraday), such as used to provide a trigger voltage 1070 for the external trigger input 1010 of the exemplary arc extinguishing circuit 1000 of FIG. 10A, in accordance with one or more aspects of the present invention. It is a figure which shows the waveform 1060. FIG. For example, at some instant, it is desired that the ion beam 130 generate a high level Faraday current 1060a and a low level trigger voltage 1070a. However, instead of arc development, when the Faraday current 1070 only generates a low-level Faraday current 1060a and, as a result, applied to the external trigger input 1010, the HVHS switch 504 is switched OFF to extinguish the arc. , A high level trigger voltage 1070b is generated.

  11 is used in an ion implantation apparatus (for example, reference numeral 200 in FIG. 2), and an arc extinguishing circuit 1102 (for example, using an HVHS switch 504 between a high voltage power supply 503 and an electrode (not shown) of the apparatus 200. FIG. 3 shows an exemplary arc extinguishing controller 1100 having the reference number 200) of FIG. The arc extinguishing controller 1100 is similar to the arc extinguishing circuit shown in FIGS. 5, 7, and 10A and will not be fully described again for convenience. Arc extinction controller 1100 orders, controls, and synchronizes current and voltage recovery from other switches 1110 to one or more electrodes, and determines the duration of arc loss by long-term anomaly detector 1120, and A switch control circuit 1108 is used to adjust a forced switch control command 1140 from an ion implantation system or a recoat command 1130 from an operation control system 1150 according to one or more aspects of the present invention.

  Optionally, other HVHS switches 1110 may be from other electrode power sources of the same ion implanter, or from other HVHS switches (not shown) of other similar arc extinguishing circuits (AQCs). These switches need to be synchronized to establish the desired order and timing for opening and closing the switch 1110. As described above, the abnormality duration or the loss of the ion beam is detected by the long-term abnormality detection device 1120 in order to determine whether the abnormality is a sufficiently long abnormality that requires the recoating process described above. Conversely, if the abnormality is sufficiently short, it is determined that the loss is ignored. Such a determination level is set, for example, on the user side of the ion implantation apparatus. When a long abnormality (reference number 960 in FIG. 9B) is detected, the ion beam 130 needs to be reapplied, and the HVHS switch 504 is forcibly turned off at the time of abnormality to extinguish the arc.

  Further, when a long abnormality 960 is detected by the long-term abnormality detection device 1120, the reapplication process is first performed according to a reapplication command 1130 from the scan operation control system 1150. During this re-coating process, the HVHS switch control is forcibly turned on / off according to the re-coating command 1130 according to the position achieved by the operation control system 1150 as described above.

  In addition, since the HVHS switch 504 is present in the circuit of the present invention for extinguishing the arc, the injection system can also be switched manually or from one of its computer or external input control system. The command 1140 in FIG. 1 can optionally switch the ion beam 130 on and off easily. This is because after a substantial warm-up time, when loading or unloading a new wafer 910, when changing various types of wafers, at the start / end of each wafer scan 936, or extra for each column scan 936 of the wafer 910 This is particularly advantageous because the beam 130 can be turned on and off in the smooth movement region 965. Thus, the arc extinguishing controller 1100 of the present invention facilitates a reduction in “beam duty factor” that should reduce the particle count of other surface wafers of the implanter. This is because the beam is used effectively on a large percentage on the wafer, with less on other surfaces of the implanter adjacent to the wafer 910 (eg, extra moving area 965).

  The arc extinguishing circuit and arc extinguishing controller of the present invention are illustrated in relation to the HV power supply voltage of the ion source and extraction electrode. Such a circuit, in view of the present invention, is associated with other ion sources and accelerators, including ion implanter electrodes and other HV power supply voltages, or other HV applications subject to HV arcing ( It will be understood and anticipated that they may be used in combination.

  In one aspect of the invention, an arc extinguishing and ion beam recoating method is disclosed. In one implementation of the present invention, the high voltage generated at the electrode of the ion implanter is opened by opening a high voltage fast switch wired in series between the electrode and a high voltage power supply that supplies the potential for controlling the ion beam. Eliminate arcs efficiently. Thereafter, when the arc disappears, the potential is restored before the HV power supply is completely discharged.

  Thereafter, the ion beam / wafer is returned to the position where the arc is generated, the ion beam is reapplied to such an area, and the ion beam is turned ON / OFF during the recoating operation using the same HVHS switch, The dose loss incurred during the arc discharge is restored.

  FIG. 12 illustrates an arc extinguishing controller of the present invention (eg, reference number 1100 in FIG. 11) or an arc extinguishing circuit of the present invention (eg, reference numbers 500 and 7 in FIG. 5) according to some aspects of the invention. FIG. 10A shows an exemplary arc extinguishing method in the ion implantation apparatus using the reference number 700 of FIG. 10 and the reference number 1000 of FIG. 10A. Although the exemplary method 1200 is illustrated and disclosed below as a series of actions or events, the present invention is not limited to the order of such actions or events illustrated. In this regard, some acts may occur with other acts or events illustrated and / or different from those disclosed herein and / or in a different order in accordance with the present invention. In addition, not all illustrated steps require the use of the method according to the invention. Furthermore, the method according to the present invention may be used in connection with the illustrated wafers, wafer cassettes, wafer sensors, wafer manual systems, and modeling systems as well as other devices and structures not shown.

  The method 1200 uses an arc extinguishing circuit similar to the circuit 1000 of FIG. 10A to extinguish an exemplary arc for extinguishing the arc generated at the ion beam control electrode of an ion implanter (eg, reference numeral 200 in FIG. 2). It shows how to disappear. For example, optionally, at reference numeral 1210, a wafer 910 is scanned vertically 920 and 930 by an ion beam 130 (either wafer or ion beam movement). At reference numeral 1220, a current or voltage change associated with the arc (eg, Va 620 of FIG. 6A) is detected at the electrode of the implanter 200 (eg, the extraction electrode 208 of FIG. 2) (FIGS. 5, 10A, And by the CT 506 of FIG. 11 or by the Faraday cup 244 for supplying the I-faraday 1060 of FIG. 10B in relation to the ion beam current Ibeam).

  Thereafter, if an arc occurs during implantation, the encoder position of the horizontal and vertical motion drive by the motion control system of the implanter 200 (eg, reference number 1150 in FIG. 11) is monitored at reference number 1230 and therefore The associated first detection position 940a and last detection position 940b are recorded for any reapplication process. At reference numeral 1240, the duration of such an arc is optionally detected (eg, by the detection device 1120 of FIG. 11) and used for determination if the next re-application is desired. After detection of the arc, at reference numeral 1250, the arc current to the electrode 208 is cut off and the arc is extinguished by opening the HVHS switch 504 connected between the high voltage power supply 503 of the injection device 200 and the electrode 208. . If the arc is no longer detected, at reference numeral 1260, the HVHS switch 504 is closed again and the high voltage power source and electrode are reconnected to restore the ion beam.

  Optionally, wafer scan and ion implantation are performed as usual, for example, to the end of column scan 936, to the end of vertical scan 920, to load / unload position 935, or to the end of all expected scans of wafer 910. I can continue. Thereafter, the re-coating process is initiated, for example, by a modulated synchronization circuit (eg, reference numeral 740 in FIG. 7) or switch control unit 1108, as described above. The switch control circuit 1108 receives instructions (see reference number 508 in FIG. 10A and reference number 1108 in FIG. 11) from the motion control system 1150 or the computer of the infusion device to initiate the re-application process.

  FIG. 13 reapplies an ion beam 130 to recover a dose loss due to arcing in the ion implanter 200 using, for example, the arc extinguishing controller 1100 of FIG. 11, in accordance with one or more aspects of the present invention. An exemplary method 1300 is shown.

  The method 1300 uses an exemplary arc extinction controller 1100 of FIG. 11 to reconstruct the exemplary dose re-use that is used to recover the ion dose loss during discharge in an ion implanter (eg, reference numeral 200 of FIG. 2). Includes application methods. After the arc is extinguished, the recoating process is started, for example, at the end of the horizontal scan 930 or at the end of the vertical scan 920. First, at reference numeral 1310, an ion beam 130 to, for example, an ion source (eg, reference numeral 120 in FIG. 5) and extraction / suppression electrodes 720, 722 is generated using, for example, an HVHS switch (eg, reference numerals 504, 704). It is turned off again.

  Thereafter, the ion beam 130 or wafer 910 is moved at reference numeral 1320 to a first horizontal / vertical scan position (eg, reference number 940a or reference number 960a) where, for example, an arc was first detected, or rescanned 945. . This operation to the first scan position 940a / 960a is performed by first returning the beam at the beginning of the row (horizontal) scan 936 where the arc was first detected. In this way, the scanning operation can be started from the row as usual before encountering the first arc detection position (eg, reference numbers 940a, 960a). As a result, the wafer will then be fully accelerated to the same speed as when the arc was first detected. In the former initial arc detection 940a, 960a position, the ion beam 130 is also enabled at reference numeral 1320 by closing the HVHS switch (eg, reference numerals 504, 704). At reference numeral 1330, prior to the ion beam 130, a second horizontal and vertical scan position (eg, reference number) associated with the last detection of the arc while the wafer 910 is performing a vertical scan 920 and a horizontal scan 930, respectively. If 940b or 960b) is encountered, the HVHS switches 504, 704 are opened to disable the ion beam 130 again.

  Thereafter, other arc detection holes 940 or grooves 960 that occur during ion implantation are reapplied in the same manner, and a single scan is performed jointly or a plurality of scans are individually performed as necessary.

  It will be appreciated that the configurations described herein are equally applicable to main electron beam currents in “soft ionization” ion sources, RF, RF microwave power sources, or microwave ion sources, as well as non-arc discharge sources. .

  Although the invention has been illustrated and described with respect to specific forms and implementations, it will be understood that those skilled in the art will make equivalent modifications and improvements upon understanding the specification and the accompanying drawings. In particular, the terms (including “means”) used to describe such a configuration are not shown, given the various functions performed by the configuration described above (assemblies, devices, circuits, systems, etc.). As long as a particular function of the disclosed configuration (ie, functionally equivalent) is performed, even if not structurally equivalent to the disclosed structure, which performs the functions of the illustrated exemplary implementation of the invention. It is intended to correspond to any configuration that is to be performed. In addition, certain features of the invention are disclosed for only one of a number of implementations, and such features may be combined with one or more features of other implementations for specific or specific applications. It is advantageous. Further, to the extent that the terms “includes”, “including”, “has”, “having”, “with” and variations thereof are used in either the detailed description or the claims, these terms are term “ It is included in the same usage as “comprising”. Also, as used herein, the term “exemplary” refers to a simple example rather than an optimal implementation.

1 is a schematic block diagram illustrating the configuration of an ion implantation system according to one or more aspects of the present invention that extinguishes an arc associated with an ion source of an ion implanter. FIG. 3 is a simplified block diagram illustrating an exemplary ion implantation system using the arc extinguishing circuit of the present invention. It is the figure which plotted the change of the beam current of the ion implantation apparatus at the time of arc discharge of the high voltage electrode of the ion implantation system shown in FIG. 2, and the extraction / suppression voltage. 1 is a simplified schematic diagram illustrating an exemplary suppression electrode high voltage supply circuit having a conventional arc suppression circuit for use in an ion implantation system. FIG. FIG. 3 is a simplified block diagram illustrating an exemplary arc extinguishing circuit used in conjunction with a high voltage supply of an ion source used in an ion implantation system according to the present invention. It is a graph which shows the arc extinction result at the time of opening and closing the HVHS switch of the arc extinction circuit of this invention tested in the air at the time of the arc discharge of the extraction electrode couple | bonded with the ion source. It is a graph which shows the arc extinction result when opening and closing the HVHS switch of the arc extinction circuit of the present invention tested in a vacuum at the time of arc discharge of the extraction electrode coupled to the ion source. Order and synchronize current and voltage recovery to HVHS switches in the three high voltage power supplies of the ion implanter and to each of the three electrodes, the illustrated high voltage supply circuit, and the associated ion implantation system. FIG. 6 is a simplified schematic diagram illustrating an exemplary arc extinguishing circuit used in an ion implanter utilizing a synchronous circuit. In order to absorb energy from reactance elements external to each HVHS switch and to control the overcurrent of the switch, in accordance with one or more aspects of the invention, the switch is in series or across ( 1 is a schematic diagram illustrating an exemplary protection circuit used. FIG. 5 is a simplified diagram illustrating an exemplary ion beam and relative scanning operation between a wafer. Here, the wafer is automatically moved in the horizontal and vertical directions by the motion control system. When an arc is encountered, the ion beam may temporarily create a glitch hole or a glitch strip with a loss corresponding to long-term administration. Such areas are reapplied based on one or more aspects of the present invention. FIG. 5 is a simplified diagram illustrating an exemplary ion beam and relative scanning operation between a wafer. Here, the wafer is automatically moved in the horizontal and vertical directions by the motion control system. When an arc is encountered, the ion beam may temporarily create a glitch hole or a glitch strip with a loss corresponding to long-term administration. Such areas are reapplied based on one or more aspects of the present invention. FIG. 6 is a simplified block diagram illustrating another exemplary arc extinguishing circuit used in conjunction with a high voltage supply of an ion source for use in an ion implantation system according to the present invention. Here, the trigger control circuit has an external trigger input for controlling the trigger of the HVHS switch from the outside, for example, together with the Faraday cup current input. FIG. 10B illustrates a waveform of a Faraday cup current used to supply a trigger voltage to the external trigger input of the exemplary arc extinguishing circuit shown in FIG. 10A used in accordance with one or more aspects of the present invention. HVHS switch between high voltage power supply-injector electrodes, switch control circuit to determine sequence, control, synchronization of current or voltage recovery to one or more electrodes, and duration of arc loss And an exemplary arc extinction used in an ion implanter that re-applies and adjusts a re-application command from an operation control system or a forced switch control command from an ion implantation system in accordance with one or more aspects of the present invention. FIG. 2 is a simplified schematic block diagram illustrating a controller. 6 is a flowchart illustrating an exemplary arc extinguishing method in an ion implantation system using the arc extinguishing circuit of the present invention, according to some aspects of the present invention. 12 is a flowchart illustrating an exemplary arc extinguishing method in an ion implantation system using the arc extinguishing controller shown in FIG. 11 in accordance with one or more aspects of the present invention.

Claims (8)

An arc extinction circuit coupled to an HV power supply that supplies a high voltage to the electrodes of the ion implantation system is used to extinguish the arc in the ion implantation system and to restore the ion beam in order to recover the dose loss during arc discharge. A method of painting,
Using the ion beam to horizontally scan the wafer;
Using the ion beam to vertically scan the wafer;
Detecting a current change or voltage change associated with the arc in the electrode;
Monitoring horizontal and vertical scan operations to obtain a first detection position and a last detection position associated with the detection of an arc when an arc is detected while the scan is continuing ;
When the arc is detected , opening the HV switch connected between the electrode and the HV power source to extinguish the arc and interrupt the arc current to the electrode;
Then, when the above-mentioned arc is no longer detected, along with turning on the ion beam, in order to connecting the electrode and the HV power supply, a step of closing the HV switch,
On SL ion beam and a step of re-painting,
The repainting step is
Turning off the ion beam by opening the HV switch;
Moving the wafer to the first detection position associated with the detection of the arc;
Closing the HV switch to turn on the ion beam;
Scanning the wafer horizontally and vertically with the ion beam until the last detection position associated with the detection of the arc is reached;
Opening the HV switch to turn off the ion beam,
A method in which one or more regions in which an arc is detected are repainted by one or more ion beams during one continuous scan .   And further comprising the step of synchronizing two or more arc extinguishing circuits comprising two or more HV switches used to extinguish an arc between the electrodes of each of the two or more HV power supplies of the ion implanter. The method of claim 1. Further comprising monitoring the duration of the detected arc;
The method of claim 1, wherein the repainting step is performed when the duration of the detected arc is longer than a predetermined interval.   The method of claim 1, wherein the repainting step begins after the ion beam has passed the edge of the wafer, which is one endpoint of a vertical scan.   The method according to claim 1, wherein the repainting step is started after the scanning of the ion beam completes a horizontal scanning operation.   The method of claim 1, wherein the ion beam is forcibly turned on or off by the HV switch. Monitoring the horizontal and vertical scan positions associated with the detection of the arc,
Monitoring encoders coupled to horizontal and vertical scan motors;
The method of claim 1 including the step of recording encoder position data associated with a first detection of the arc and a last detection of the arc. (A) When the end of the wafer, which is one end point of the vertical scan, is passed,
(B) when manually turning off the ion beam; and
(C) During wafer replacement,
To turn off the ion beam in any one of the cases, and
(A) When manually turning on the ion beam,
(B) At the next wafer exchange, after the loading operation, and (C) At the time of another wafer injection command
In order to turn on the ion beam in any one of the cases, the ion beam is forcibly turned on in response to a beam duty factor command to reduce the beam duty factor from either the operation control system or the ion implantation system. The method of claim 1, wherein the method is turned off.

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