JP5775550B2 - 撮像装置および撮像方法 - Google Patents

撮像装置および撮像方法 Download PDF

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Publication number
JP5775550B2
JP5775550B2 JP2013177573A JP2013177573A JP5775550B2 JP 5775550 B2 JP5775550 B2 JP 5775550B2 JP 2013177573 A JP2013177573 A JP 2013177573A JP 2013177573 A JP2013177573 A JP 2013177573A JP 5775550 B2 JP5775550 B2 JP 5775550B2
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Japan
Prior art keywords
light
imaging
unit
light emitting
image
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JP2013177573A
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Japanese (ja)
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JP2015045598A5 (enExample
JP2015045598A (ja
Inventor
森脇　三造
三造 森脇
藤本　博己
博己 藤本
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Screen Holdings Co Ltd
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Screen Holdings Co Ltd
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Priority to JP2013177573A priority Critical patent/JP5775550B2/ja
Priority to US14/314,603 priority patent/US9291551B2/en
Publication of JP2015045598A publication Critical patent/JP2015045598A/ja
Publication of JP2015045598A5 publication Critical patent/JP2015045598A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/064—Stray light conditioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/066—Modifiable path; multiple paths in one sample
    • G01N2201/0668—Multiple paths; optimisable path length

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
JP2013177573A 2013-08-29 2013-08-29 撮像装置および撮像方法 Active JP5775550B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013177573A JP5775550B2 (ja) 2013-08-29 2013-08-29 撮像装置および撮像方法
US14/314,603 US9291551B2 (en) 2013-08-29 2014-06-25 Imaging apparatus and imaging method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013177573A JP5775550B2 (ja) 2013-08-29 2013-08-29 撮像装置および撮像方法

Publications (3)

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JP2015045598A JP2015045598A (ja) 2015-03-12
JP2015045598A5 JP2015045598A5 (enExample) 2015-04-23
JP5775550B2 true JP5775550B2 (ja) 2015-09-09

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JP2013177573A Active JP5775550B2 (ja) 2013-08-29 2013-08-29 撮像装置および撮像方法

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US (1) US9291551B2 (enExample)
JP (1) JP5775550B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6535494B2 (ja) * 2015-03-31 2019-06-26 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置、撮像方法および培養容器
CN109991819B (zh) * 2018-01-03 2021-08-03 群创光电股份有限公司 曝光系统及其用于制造显示面板的方法
KR102550690B1 (ko) * 2018-05-28 2023-07-04 삼성디스플레이 주식회사 타원해석기

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005300439A (ja) * 2004-04-15 2005-10-27 Central Glass Co Ltd 透明板状体の欠陥検出方法およびその装置
JP2006098198A (ja) * 2004-09-29 2006-04-13 Futec Inc 透明部材の欠陥検査装置
WO2011144212A1 (en) * 2010-05-21 2011-11-24 Chemometec A/S A compact dark field light source and dark field image analysis at low magnification
JP5615247B2 (ja) * 2011-09-27 2014-10-29 大日本スクリーン製造株式会社 撮像装置、検出装置および撮像方法
WO2013069452A1 (ja) * 2011-11-08 2013-05-16 浜松ホトニクス株式会社 幹細胞の観察方法、分化傾向状態の細胞領域の除去方法、及び、幹細胞の観察装置

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US20150064737A1 (en) 2015-03-05
US9291551B2 (en) 2016-03-22
JP2015045598A (ja) 2015-03-12

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