JP5723967B2 - ソリッド・ステート・ストレージ・デバイスのｓレベル・ストレージに入力データを記録するための方法、エンコーダ装置、およびソリッド・ステート・ストレージ・デバイス - Google Patents

ソリッド・ステート・ストレージ・デバイスのｓレベル・ストレージに入力データを記録するための方法、エンコーダ装置、およびソリッド・ステート・ストレージ・デバイス Download PDF

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JP5723967B2
JP5723967B2 JP2013501998A JP2013501998A JP5723967B2 JP 5723967 B2 JP5723967 B2 JP 5723967B2 JP 2013501998 A JP2013501998 A JP 2013501998A JP 2013501998 A JP2013501998 A JP 2013501998A JP 5723967 B2 JP5723967 B2 JP 5723967B2
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JP2013524609A (ja
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シデシヤン、ロイ、ディー
エレフテリオス、エバンゲロス、エス
ミッテルホルツァー、トーマス
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International Business Machines Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1072—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in multilevel memories
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/13—Linear codes
    • H03M13/15—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
    • H03M13/151—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
    • H03M13/152—Bose-Chaudhuri-Hocquenghem [BCH] codes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/29—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
    • H03M13/2906—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes using block codes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/29—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
    • H03M13/2942—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes wherein a block of parity bits is computed only from combined information bits or only from parity bits, e.g. a second block of parity bits is computed from a first block of parity bits obtained by systematic encoding of a block of information bits, or a block of parity bits is obtained by an XOR combination of sub-blocks of information bits

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Probability & Statistics with Applications (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Algebra (AREA)
  • Pure & Applied Mathematics (AREA)
  • Error Detection And Correction (AREA)
  • Detection And Correction Of Errors (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
JP2013501998A 2010-03-30 2011-03-23 ソリッド・ステート・ストレージ・デバイスのｓレベル・ストレージに入力データを記録するための方法、エンコーダ装置、およびソリッド・ステート・ストレージ・デバイス Active JP5723967B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP10158438.1 2010-03-30
EP10158438 2010-03-30
PCT/IB2011/051219 WO2011121490A1 (en) 2010-03-30 2011-03-23 Two -level bch codes for solid state storage devices

Publications (3)

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JP2013524609A JP2013524609A (ja) 2013-06-17
JP2013524609A5 JP2013524609A5 (enExample) 2015-03-12
JP5723967B2 true JP5723967B2 (ja) 2015-05-27

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US (1) US8930798B2 (enExample)
JP (1) JP5723967B2 (enExample)
CN (1) CN102823141B (enExample)
DE (1) DE112011101116B4 (enExample)
GB (1) GB2492708B (enExample)
WO (1) WO2011121490A1 (enExample)

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RU2013128346A (ru) * 2013-06-20 2014-12-27 ИЭмСи КОРПОРЕЙШН Кодирование данных для системы хранения данных на основе обобщенных каскадных кодов
US9219503B2 (en) * 2013-10-16 2015-12-22 Avago Technologies General Ip (Singapore) Pte. Ltd. Systems and methods for multi-algorithm concatenation encoding and decoding
GB2525430B (en) 2014-04-25 2016-07-13 Ibm Error-correction encoding and decoding
US9524207B2 (en) * 2014-09-02 2016-12-20 Micron Technology, Inc. Lee metric error correcting code
US9710199B2 (en) 2014-11-07 2017-07-18 International Business Machines Corporation Non-volatile memory data storage with low read amplification
US10162700B2 (en) 2014-12-23 2018-12-25 International Business Machines Corporation Workload-adaptive data packing algorithm
US9647694B2 (en) 2014-12-28 2017-05-09 International Business Machines Corporation Diagonal anti-diagonal memory structure
US9712190B2 (en) 2015-09-24 2017-07-18 International Business Machines Corporation Data packing for compression-enabled storage systems
US9870285B2 (en) 2015-11-18 2018-01-16 International Business Machines Corporation Selectively de-straddling data pages in non-volatile memory
US10333555B2 (en) * 2016-07-28 2019-06-25 Micron Technology, Inc. Apparatuses and methods for interleaved BCH codes
US10275309B2 (en) 2017-04-26 2019-04-30 Western Digital Technologies, Inc. Multi-layer integrated zone partition system error correction
CN109857340B (zh) * 2019-01-14 2022-05-06 普联技术有限公司 Nor flash中文件的存储和读取方法、装置及存储介质
US11139827B2 (en) 2019-03-15 2021-10-05 Samsung Electronics Co., Ltd. Conditional transcoding for encoded data
US10871910B1 (en) * 2019-09-27 2020-12-22 Western Digital Technologies, Inc. Non-volatile memory with selective interleaved coding based on block reliability
US11694761B2 (en) * 2021-09-17 2023-07-04 Nxp B.V. Method to increase the usable word width of a memory providing an error correction scheme

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US5942005A (en) 1997-04-08 1999-08-24 International Business Machines Corporation Method and means for computationally efficient error and erasure correction in linear cyclic codes
US5946328A (en) * 1997-11-17 1999-08-31 International Business Machines Corporation Method and means for efficient error detection and correction in long byte strings using integrated interleaved Reed-Solomon codewords
US6275965B1 (en) * 1997-11-17 2001-08-14 International Business Machines Corporation Method and apparatus for efficient error detection and correction in long byte strings using generalized, integrated, interleaved reed-solomon codewords
EP1496519B1 (en) * 1998-01-21 2006-08-23 Sony Corporation Encoding method and memory apparatus
JPH11212876A (ja) 1998-01-21 1999-08-06 Sony Corp 符号化方法およびそれを利用したメモリ装置
IT1321049B1 (it) * 2000-11-07 2003-12-30 St Microelectronics Srl Metodo di costruzione di un codice a controllo dell'errore polivalenteper celle di memoria multilivello funzionanti a un numero variabile di
US7231578B2 (en) 2004-04-02 2007-06-12 Hitachi Global Storage Technologies Netherlands B.V. Techniques for detecting and correcting errors using multiple interleave erasure pointers
US7844877B2 (en) * 2005-11-15 2010-11-30 Ramot At Tel Aviv University Ltd. Method and device for multi phase error-correction
TWM314385U (en) * 2006-10-23 2007-06-21 Genesys Logic Inc Apparatus for inspecting and correcting encoding random error of BCH
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Publication number Publication date
DE112011101116B4 (de) 2017-09-21
GB2492708B (en) 2017-01-25
DE112011101116T5 (de) 2013-01-10
US20130013974A1 (en) 2013-01-10
CN102823141A (zh) 2012-12-12
CN102823141B (zh) 2015-09-16
US8930798B2 (en) 2015-01-06
WO2011121490A1 (en) 2011-10-06
GB201219123D0 (en) 2012-12-05
GB2492708A (en) 2013-01-09
JP2013524609A (ja) 2013-06-17

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