JP5640761B2 - Projection apparatus, projection method, and program - Google Patents

Description

  The present invention relates to a projection apparatus, a projection method, and a program suitable for, for example, a DLP (Digital Light Processing) (registered trademark) projector apparatus.

  Conventionally, white light from a light source is emitted as time-division colored light by passing through a color wheel having a plurality of color filters arranged on the peripheral surface, and an image for each color is projected using the light. Various projectors and products that project color images in a field sequential manner have been developed.

  As a light source element for this type of projector, LED (light emitting diode) and LD (laser diode), which are superior in terms of power consumption, size, heat generation, etc., are used in place of discharge lamps such as high-pressure mercury lamps that have been widely used in the past. It is considered to use a semiconductor light emitting device such as

  When these semiconductor light emitting devices are used as light sources for projectors, a spot light beam with a large amount of light is irradiated onto the color wheel, which may cause thermal deterioration and damage to the color filter constituting the color wheel. There are concerns.

  Therefore, for example, by reciprocating the rotational axis position of the color wheel in the radial direction, the incident position of the light applied to the color wheel is changed, and the light is not concentrated and irradiated only at the same circumferential position. Such a technique is considered. (For example, Patent Document 1)

JP 2005-156607 A

  However, the technique described in the above-mentioned patent document requires a mechanism for moving the color wheel and its drive motor integrally in a predetermined cycle, and the entire apparatus becomes large and complicated. If the color filter is damaged, the projection operation in a normal state cannot be continued after that point.

  The present invention has been made in view of the above circumstances, and its purpose is to continue the projection operation in a normal state while avoiding the influence even if a part of the color filter is damaged. It is an object of the present invention to provide a projection apparatus, a projection method, and a program that can perform the above-described process.

  According to the first aspect of the present invention, a phosphor layer is formed at the same peripheral position of the semiconductor light emitting element and the peripheral surface, and the phosphor layer is irradiated with light from the semiconductor light emitting element and generated from the phosphor layer. A rotating body that emits light to be detected, a detecting means that detects a reference rotational position of the rotating body, and a measurement that measures the intensity of light emitted from the phosphor layer of the rotating body in association with the detection result of the detecting means A selection means for selecting the irradiation timing of the light of the semiconductor light emitting element to the phosphor layer of the rotating body based on a measurement result of the measurement means, an input means for inputting an image signal, and the selection means. Light image forming means for causing the semiconductor light emitting element to emit light at a selected irradiation timing and forming a light image corresponding to an image signal input by the input means using light emitted from the phosphor layer of the rotating body; Optical image forming means The formed light image toward the projection target, characterized by comprising a projection means for projecting.

  According to a second aspect of the present invention, in the first aspect of the present invention, the optical image forming means distributes the direction of the reflected light that reflects the light emitted from the phosphor layer of the rotating body to form an optical image. The measuring means measures the intensity of the light using the reflected light that has not been reflected by the optical image forming means in the direction of the projection means.

  According to a third aspect of the present invention, in the first or second aspect of the present invention, an optical image corresponding to an image signal input by the input unit is projected toward the projection target by the projection unit. The measuring means measures the intensity of light emitted from the phosphor layer of the rotating body.

  According to a fourth aspect of the present invention, in the first or second aspect of the present invention, in the standby period of the projection apparatus in which the image signal is not input from the input means, the measuring means is the phosphor layer of the rotating body. It measures the intensity of the light emitted from.

  According to a fifth aspect of the present invention, in the invention according to any one of the first to fourth aspects, the rotating body is coated with a phosphor of the same color component over the entire circumference.

  The invention described in claim 6 is the invention described in any one of claims 1 to 5, wherein the phosphor layer is irradiated with blue light from the semiconductor light emitting element.

  The invention according to claim 7 is the invention according to any one of claims 1 to 6, wherein the light generated from the phosphor layer is green light.

  The invention according to claim 8 is the invention according to claim 8, wherein the phosphor layer is formed at the same peripheral position of the semiconductor light emitting element and the peripheral surface, and the phosphor layer is irradiated with light from the semiconductor light emitting element. , A rotating body that emits light generated from the phosphor layer, an input unit that inputs an image signal, and light that corresponds to the image signal input at the input unit using light emitted from the phosphor layer of the rotating body A projection method in an apparatus comprising: an optical image forming unit that forms an image; and a projection unit that projects an optical image formed by the optical image forming unit toward a projection target, the reference rotational position of the rotating body A detecting step for detecting the intensity, a measuring step for measuring the intensity of light emitted from the phosphor layer of the rotating body in association with a detection result in the detecting step, and the rotating body based on the measuring result in the measuring step Irradiation of light of the semiconductor light emitting device to the phosphor layer of The semiconductor light-emitting element emits light at the selection process selected at the selection process and at the irradiation timing selected in the selection process, and the light image forming unit responds to the image signal using the light emitted from the phosphor layer of the rotating body. And a light emission control step for forming a light image.

  According to a ninth aspect of the present invention, a phosphor layer is formed at the same peripheral position of the semiconductor light emitting element and the peripheral surface, and the phosphor layer is irradiated with light from the semiconductor light emitting element and is generated from the phosphor layer. A rotating body that emits light, an input unit that inputs an image signal, and an optical image forming unit that forms a light image according to the image signal input from the input unit using light emitted from the phosphor layer of the rotating body And a program executed by a computer built in an apparatus having a projection unit that projects the optical image formed by the optical image formation unit toward a projection target, the computer being a reference rotational position of the rotating body Detecting means for detecting the intensity, measuring means for measuring the intensity of light emitted from the phosphor layer of the rotating body in association with the detection result of the detecting means, and fluorescence of the rotating body based on the measurement result of the measuring means The above semiconductor Selecting means for selecting the light irradiation timing of the element, and causing the semiconductor light emitting element to emit light at the irradiation timing selected by the selecting means, and using the light emitted from the phosphor layer of the rotating body, Thus, it is characterized in that it functions as a light emission control means for forming a light image corresponding to the image signal.

  According to the present invention, even if a part of the color filter is damaged, the influence can be avoided and the projection operation in a normal state can be continued.

The figure which shows the structure of the electronic circuit and optical system of the data projector apparatus which concern on one Embodiment of this invention. The top view which shows the structure of the fluorescent wheel of FIG. 1 which concerns on the same embodiment. 9 is a flowchart mainly showing processing contents of an index delay check operation from when the power is turned on to when the power is turned off according to the embodiment. The timing chart which shows rotation of the fluorescence wheel which concerns on the embodiment, and operation | movement of each light emitting element. The timing chart which shows rotation of the fluorescence wheel which concerns on the embodiment, and operation | movement of each light emitting element.

  An embodiment in which the present invention is applied to a DLP (registered trademark) data projector apparatus will be described below with reference to the drawings.

FIG. 1 is a diagram showing a schematic functional configuration of a data projector apparatus 10 according to the present embodiment.
The input unit 11 includes, for example, a pin jack (RCA) type video input terminal, a D-sub 15 type RGB input terminal, and the like. Analog image signals of various standards input to the input unit 11 are digitized by the input unit 11 and then sent to the image conversion unit 12 via the system bus SB.

  The image conversion unit 12 is also referred to as a scaler, and the input image data is unified into image data of a predetermined format suitable for projection and sent to the projection processing unit 13.

  At this time, data such as symbols indicating various operation states for OSD (On Screen Display) is also superimposed on the image data by the image conversion unit 12 as necessary, and the processed image data is sent to the projection processing unit 13.

  The projection processing unit 13 multiplies a frame rate according to a predetermined format, for example, 60 [frames / second], the number of color component divisions, and the number of display gradations according to the transmitted image data. The micromirror element 14 that is a spatial light modulation element is driven to display by the time-division driving.

  This micromirror element 14 is turned on / off individually at a high speed for each inclination angle of a plurality of micromirrors arranged in an array, for example, WXGA (Wide eXtended Graphics Array) (horizontal 1280 pixels × vertical 800 pixels). By displaying the image, an optical image is formed by the reflected light.

  On the other hand, R, G, and B primary color lights are emitted cyclically from the light source unit 15 in a time-sharing manner. The primary color light from the light source unit 15 is totally reflected by the mirror 16 and applied to the micromirror element 14.

  Then, an optical image is formed by the reflected light from the micromirror element 14, and the formed optical image is projected and displayed on a screen (not shown) to be projected via the projection lens unit 17.

The light source unit 15 includes an LD 18 that emits blue laser light.
The blue laser light emitted from the LD 18 is irradiated on the peripheral surface of the fluorescent wheel 20 after passing through the dichroic mirror 19. The fluorescent wheel 20 is rotated by a wheel motor 21 and forms a phosphor layer 20g over the entire circumference of the peripheral surface irradiated with the blue laser light.

  FIG. 2 is a diagram illustrating a planar configuration of the fluorescent wheel 20. As shown in the drawing, a phosphor layer 20g is formed by applying a phosphor on the circumference of the phosphor wheel 20 on which the laser light is irradiated. A reflection plate (not shown) is provided on the back surface of the surface of the fluorescent wheel 20 where the fluorescent material layer 20g is formed so as to overlap the fluorescent material layer 20g. Further, a wheel marker 20m indicating a reference rotation position for synchronizing the rotation of the data projector device 10 is provided at one end of the peripheral surface of the fluorescent wheel 20.

  In the present embodiment, in synchronization with the period of one frame of the color image, the fluorescent wheel 20 is rotated exactly one round and 360 ° in the direction indicated by the arrow RT in the drawing, and the wheel is rotated at the start timing of the one frame. It is assumed that the marker 20m passes through the marker sensor 22 that is disposed close to the marker 20m.

  The projection processing unit 13 receives the detection output CWINDX of the marker sensor 22, and the timing when the wheel marker 20m of the fluorescent wheel 20 passes the marker sensor 22 is used as the start timing of one color image frame, and is given from the CPU 29 described later. After delaying by the index delay (ID), the LD 18 is driven to emit blue light.

  The index delay determines how much the fluorescent wheel 20 is rotated from the wheel marker 20m of the fluorescent wheel 20 to irradiate the fluorescent wheel 20 with the blue laser light from the LD 18. The tip of the wheel marker 20m is used as a reference rotational position. It is a predetermined rotation angle.

  By irradiating the phosphor layer 20g of the fluorescent wheel 20 with blue laser light, green light is excited as reflected light. The green light is reflected by the dichroic mirror 19, passes through the dichroic mirror 23, and reaches the mirror 16.

Furthermore, the light source unit 15 includes an LED 24 that emits red light and an LED 25 that emits blue light.
The red light emitted from the LED 24 is reflected by the dichroic mirror 26 and further reflected by the dichroic mirror 23 and then reaches the mirror 16.

  The blue light emitted from the LED 25 is reflected by the mirror 27, passes through the dichroic mirror 26, is reflected by the dichroic mirror 23, and reaches the mirror 16.

As described above, the dichroic mirror 19 transmits blue light while reflecting green light. The dichroic mirror 23 transmits green light while reflecting red light and blue light. The dichroic mirror 26 reflects red light while transmitting blue light.
Light that has not been reflected in the direction of the projection lens unit 17, so-called “off light”, is incident on the illuminance sensor 28 by the operation of distributing the reflected light by the micromirror element 14. The illuminance sensor 28 measures the illuminance of the incident light, and outputs a signal indicating the measurement result to the projection processing unit 13.

  The projection processing unit 13 forms a light image by displaying an image on the micromirror element 14, emits light from the LD 18 and LEDs 24 and 25, rotates the fluorescent wheel 20 by the wheel motor 21, and fluorescent wheel by the marker sensor 22. The detection of the rotation timing of 20 and the measurement of the illuminance by the illuminance sensor 28 are executed under the control of the CPU 29 described later.

  The CPU 29 controls all the operations of the above circuits. The CPU 29 is directly connected to the main memory 30 and the program memory 31. The main memory 30 is composed of, for example, an SRAM and functions as a work memory for the CPU 29. The program memory 31 is composed of an electrically rewritable nonvolatile memory, and stores an operation program executed by the CPU 29, various fixed data, and the like. The CPU 29 uses the main memory 30 and the program memory 31 to execute a control operation in the data projector device 10.

The CPU 29 executes various projection operations in accordance with key operation signals from the operation unit 32.
The operation unit 32 includes a key operation unit provided in the main body of the data projector device 10 and a laser light receiving unit that receives infrared light from a remote controller (not shown) dedicated to the data projector device 10. A key operation signal based on a key operated by the key operation unit or the remote controller is directly output to the CPU 29.

  The CPU 29 is further connected to the audio processing unit 33 via the system bus SB. The sound processing unit 33 includes a sound source circuit such as a PCM sound source, converts the sound data given during the projection operation into an analog signal, drives the speaker unit 34 to emit a loud sound, or generates a beep sound or the like if necessary.

Next, the operation of the above embodiment will be described.
As described above, all of the operations described below are executed after the CPU 29 develops and stores the operation program, fixed data, and the like read from the program memory 31 in the main memory 30.

  In order to simplify the explanation, when one frame of a color image is projected in synchronization with the rotation cycle of the fluorescent wheel 20, for example, the frame is represented by three fields of R (red), G (green), and B (blue). In each color field, an image of the color is projected using a time corresponding to 120 ° as the central angle when the fluorescent wheel 20 rotates.

  FIG. 3 is a flowchart mainly showing the processing contents of the index delay check operation from when the power source of the data projector apparatus 10 is turned on until the power source is turned off. In the present embodiment, the index delay check operation is performed while the image desired by the user is projected onto the screen by the data projector device 10.

  First, “0 °” is set as an initial value for the index delay (step S101), and an image having a frame structure corresponding to the set index delay is projected to the place where the power is turned on (step S102).

  In this case, when the index delay is “0 °”, one color image frame is represented by a rotation angle (0 ° to 360 °) from the reference rotation position where the tip of the wheel marker 20m of the fluorescent wheel 20 is located. The projection timing of each field is, for example, “0 °” to “120 °” for the G field, “120 °” to “240 °” for the R field, and “240 °” to “360 °” for the B field.

  In the projection processing unit 13, under the control of the CPU 29, the corresponding color image is displayed by the micromirror element 14 corresponding to the projection timing, and the light emission timings of the LD 18, LED 24, and LED 25 are controlled.

  At this time, the projection processing unit 13 measures the illuminance corresponding to the index delay timing with the illuminance sensor 28, and stores the value in association with the index delay “0 °” (step S103). In the present embodiment, among the color image frames corresponding to the index delay timing, only the illuminance of the light emitted from the fluorescent wheel 20 is measured by the illuminance sensor 28 and stored in association with the index delay. That is, in this embodiment, only the G light is measured by the illuminance sensor 28.

  If measurement is performed by the illuminance sensor 28, if the illuminance sensor 28 is arranged to measure the illuminance of a specific part of the image frame projected by the illuminance sensor 28, for example, the block area at the lower right corner, the measurement timing is adjusted. Thus, only the block area in the image displayed by the micromirror element 14 may be turned off so that the projection light is reflected to the illuminance sensor 28 side.

  In this case, although only the block area of the originally projected image has a lower projection gradation (darker), the degree of G (green) component is “1 /” at the maximum even if expressed in terms of an angle ratio. 120 ”, and it is considered that the image quality of the projection content does not deteriorate so that a user or the like watching the projection image can visually recognize.

  Thereafter, it is determined whether or not the index delay set at that time is the maximum value “360 °” (step S104). If not, the index delay is updated and set to “+ 1 °”. (Step S105), the process returns to Step S103 again.

  By repeatedly executing the processes of steps S103 to S105 in this way, the illuminance corresponding to the index delay is continuously measured while the index delay is updated and set by 1 °.

  FIG. 4 shows the output CWINDEX of the marker sensor 22 when the index delay is, for example, “45 °”, the light emission timing (G-ON) of the LD 18, the light emission timing ′ (R-ON) of the LED 24, and the light emission timing of the LED 25. (B-ON) and the measurement output of the illuminance sensor 28 are illustrated.

  When this index delay is, for example, “45 °”, as shown in the figure, the color image 1 frame is rotated at a rotation angle (0 ° to 360 °) from the reference rotation position where the tip of the wheel marker 20m of the fluorescent wheel 20 is located. ), The projection timing of each field is, for example, the first B field (B1) from “0 °” to “45 °”, the G field from “45 °” to “165 °”, and “165 °”. ”To“ 285 ° ”is the R field, and“ 285 ° ”to“ 360 ° ”is the second B field (B2).

  In particular, as indicated by a broken line in FIG. 4 (3), there is a range BP in which the illuminance measured by the illuminance sensor 28 significantly decreases in the process of updating the index delay from “45 °” to “165 °”. It shall be. In this range BP, it is considered that the phosphor layer 20g of the fluorescent wheel 20 is damaged for some reason such as peeling or missing.

  Next, FIG. 5 shows the output CWINDEX of the marker sensor 22 when the index delay is “160 °”, the light emission timing (G-ON) of the LD 18, the light emission timing ′ (R-ON) of the LED 24, and the LED 25. The light emission timing (B-ON) and the measurement output of the illuminance sensor 28 are illustrated.

  When this index delay is, for example, “160 °”, as shown in the figure, the color image 1 frame is rotated from the reference rotation position (0 °) where the tip of the wheel marker 20m of the fluorescent wheel 20 is positioned (0 °). (° to 360 °), the projection timing of each field is, for example, “0 °” to “40 °” is the first R field (R1), and “40 °” to “160 °” is the B field. “160 °” to “280 °” is the G field, and “280 °” to “360 °” is the second R field (R2).

  In particular, as indicated by a broken line in FIG. 5 (3), the illuminance measured by the illuminance sensor 28 does not vary so much in the process of updating the index delay from “160 °” to “280 °”. To do. Therefore, although there may be some coating unevenness or the like in the phosphor layer 20g, it is considered that no damage due to peeling or missing occurs.

  After the processes in steps S103 to S105 are repeated 361 times for convenience, when it is determined in step S104 that the index delay is the maximum value “360 °”, the entire phosphor layer 20g of the fluorescent wheel 20 is thus processed. As a result of the measurement, the light emission period of the LD 18 is selected based on the measurement results so far, the phosphor is not affected by deterioration, and the brightness is not uneven, and the start timing is reached. The index delay is read (step S106).

  Here, while avoiding the range BP in which the illuminance is remarkably lowered as shown in FIG. 4 (3), the illuminance value is high overall and the illuminance unevenness is small (= the deviation from the average value of the range is small). When the range is represented by the rotation angle of the fluorescent wheel 20, it is selected by 120 °.

  In this case, the range for the 120 ° is not necessarily continuous, and may be divided into two ranges.

  By setting the range in this way, the index delay is read, and the remaining R field and B field are also set to a range of 120 ° (step S107).

  Thus, the initial setting at the time of power-on is terminated, and the normal projection operation is shifted based on the range of each R, G, B field set in step S107 (step S108).

  At the same time, the projection time integration count is executed (step S109). As for the cumulative projection time count, the cumulative projection time is stored in the program memory 31 composed of a nonvolatile memory as described above while being updated as needed. The stored contents even when the power of the data projector apparatus 10 is turned off. So that it is not lost.

Thereafter, it is determined whether or not an instruction to turn off the power of the data projector device 10 is given by an operation on the operation unit 32 (step S110).
If it is determined that the instruction has not been made, the cumulative count value of the projection time in the program memory 31 updated and stored in the immediately preceding step S109 is a predetermined timing for checking the index delay, for example, every 10 hours. If so, it is determined whether or not all the values of the first place of “time” are “0” (step S111).

  If it is determined that the total count value of the projection time has not reached the predetermined timing, the process returns to step S108, and the normal projection process is continued.

If it is determined in step S111 that the projection time integrated count value has reached a predetermined timing, the process proceeds to step S101 as in the case where the power is turned on, and the index delay is checked.
Further, when it is determined in step S110 that an instruction to turn off the power has been given, the power is turned off in accordance with the instruction, and the processing in FIG.

  As described above in detail, according to the present embodiment, even if a part of the phosphor layer 20g formed on the phosphor wheel 20 is damaged, the influence can be avoided and the projection operation in a normal state can be continued. It becomes possible.

  Moreover, in the said embodiment, by arrange | positioning the illumination intensity sensor 28 in the said irradiation position of the off-light, it does not affect the optical image formed in the micromirror element 14 and used for projection by the projection lens part 17, but a micromirror. The illuminance of the light source irradiated on the element 14 can be detected.

  In the above embodiment, the case where the light source unit 15 using the independent semiconductor light emitting elements for generating the primary colors is used as the light source for generating the three primary colors R, G, B is described. It is not limited to a simple configuration.

  For example, instead of the elements independent of the three primary colors, for example, instead of the above-described fluorescent wheel, the peripheral surface is divided into two in the circumferential direction, the phosphor is applied on one side, and the other is polished to form a glass-like transmitted light image. If a color wheel that obtains G (green) light and B (blue) light in a time-sharing manner from two LDs for B (blue) light is used, the present invention can be realized even with a two-color light source.

  In this case, for example, if the period of the G field is 120 ° when expressed by the rotation angle of the color wheel, and the region where the phosphor is applied is also expressed by 180 ° when expressed by the rotation angle of the color wheel, the case of the above embodiment Although the degree of freedom of the range to be selected is reduced, the projection operation in a normal state can be maintained up to 60 ° even if the phosphor layer is damaged.

  In the above embodiment, the period of the G field is 120 ° when expressed by the rotation angle of the color wheel. However, the present invention is not limited to this, and when projecting one frame of a color image in synchronization with the rotation cycle of the fluorescent wheel 20, If three fields of R (red), G (green), and B (blue) are configured with just one rotation of the fluorescent wheel, each field of R (red), G (green), and B (blue) The period may be set freely.

  In the above embodiment, the index delay check operation is performed while the image desired by the user is projected on the screen by the data projector device. For example, during the standby period when the image signal is not sent to the data projector, the index delay is performed. The light emitted from the fluorescent wheel to be inspected by the check operation or the white light to be displayed by simultaneously irradiating the R light, G light and B light is projected on the screen, and the index delay check operation is performed during the waiting period. It may be done.

  In this case, for example, if it is determined in step S111 that the predetermined timing for checking the index delay is reached, the index delay check operation may be performed when the data projector apparatus is on standby immediately after.

  By performing the index delay check operation as described above, it is possible to reliably prevent the image quality of the projection content from deteriorating.

  In step S103 of the index delay check operation, the projection processing unit 13 determines the illuminance of all light (R light, G light, and B light) emitted in one color image frame in accordance with the index delay timing. It may be measured at 28 and stored in association with the index delay.

  Even in that case, if a range BP in which the illuminance measured by the illuminance sensor 28 is significantly reduced is detected, it is considered that the phosphor layer 20g of the fluorescent wheel 20 is damaged for some reason such as peeling or missing. It is done.

  In addition, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention in the implementation stage. Further, the functions executed in the above-described embodiments may be combined as appropriate as possible. The above-described embodiment includes various stages, and various inventions can be extracted by an appropriate combination of a plurality of disclosed constituent elements. For example, even if some constituent requirements are deleted from all the constituent requirements shown in the embodiment, if the effect is obtained, a configuration from which the constituent requirements are deleted can be extracted as an invention.

  DESCRIPTION OF SYMBOLS 10 ... Data projector apparatus, 11 ... Input part, 12 ... Image conversion part (scaler), 13 ... Projection process part, 14 ... Micromirror element, 15 ... Light source part, 16 ... Mirror, 17 ... Projection lens unit, 18 ... ( Blue) LD, 19 ... Dichroic mirror, 20 ... Fluorescent wheel, 20g ... Phosphor layer, 20m ... Wheel marker, 21 ... Wheel motor (M), 22 ... Marker sensor, 23 ... Dichroic mirror, 24 ... (red) LED, 25 ... (blue) LED, 26 ... Dichroic mirror, 27 ... Mirror, 28 ... Illuminance sensor, 29 ... CPU, 30 ... Main memory, 31 ... Program memory, 32 ... Operation unit, 33 ... Audio processing unit, 34 ... Speaker unit SB ... System bus.

Claims (9)

A semiconductor light emitting device;
A rotating body that forms a phosphor layer at the same peripheral position of the peripheral surface, and that emits light generated from the phosphor layer by irradiating the phosphor layer with light from the semiconductor light emitting element;
Detecting means for detecting a reference rotational position of the rotating body;
Measurement means for measuring the intensity of light emitted from the phosphor layer of the rotating body in association with the detection result of the detection means;
Selection means for selecting the irradiation timing of the light of the semiconductor light emitting element to the phosphor layer of the rotating body based on the measurement result of the measurement means;
An input means for inputting an image signal;
An optical image that causes the semiconductor light emitting element to emit light at the irradiation timing selected by the selection means and forms a light image corresponding to an image signal input by the input means using light emitted from the phosphor layer of the rotating body. Forming means;
A projection apparatus comprising: projection means for projecting the optical image formed by the optical image forming means toward a projection target. The light image forming means distributes the direction of the reflected light that reflects the light emitted from the phosphor layer of the rotating body to form a light image,
The projection apparatus according to claim 1, wherein the measuring unit measures the intensity of the light using the reflected light that has not been reflected by the optical image forming unit in the direction of the projecting unit.   In a state where an optical image corresponding to the image signal input by the input unit is projected toward the projection target by the projection unit, the measurement unit calculates the intensity of light emitted from the phosphor layer of the rotating body. The projection apparatus according to claim 1, wherein measurement is performed.   3. The measuring means measures the intensity of light emitted from the phosphor layer of the rotating body during a standby period of the projection apparatus in which the image signal is not inputted from the input means. The projection device described.   5. The projection apparatus according to claim 1, wherein the rotating body is coated with phosphors having the same color component over the entire circumference.   The projection apparatus according to claim 1, wherein the phosphor layer is irradiated with blue light from the semiconductor light emitting element.   7. The projection apparatus according to claim 1, wherein the light generated from the phosphor layer is green light. A semiconductor light emitting element, a rotating body that forms a phosphor layer at the same peripheral position on the peripheral surface, and the phosphor layer is irradiated with light from the semiconductor light emitting element, and emits light generated from the phosphor layer, an image An input unit for inputting a signal, an optical image forming unit for forming a light image according to an image signal input by the input unit using light emitted from the phosphor layer of the rotating body, and the optical image forming unit A projection method in an apparatus including a projection unit that projects a formed light image toward a projection target,
A detection step of detecting a reference rotation position of the rotating body;
A measurement step for measuring the intensity of light emitted from the phosphor layer of the rotating body in association with the detection result in the detection step;
A selection step of selecting the irradiation timing of the light of the semiconductor light emitting element to the phosphor layer of the rotating body based on the measurement result in the measurement step;
Light emission control in which the semiconductor light emitting element emits light at the irradiation timing selected in the selection step, and a light image corresponding to an image signal is formed by the light image forming unit using light emitted from the phosphor layer of the rotating body. A projection method comprising the steps of: A semiconductor light emitting element, a rotating body that forms a phosphor layer at the same peripheral position on the peripheral surface, and the phosphor layer is irradiated with light from the semiconductor light emitting element, and emits light generated from the phosphor layer, an image An input unit for inputting a signal, an optical image forming unit for forming a light image according to an image signal input by the input unit using light emitted from the phosphor layer of the rotating body, and the optical image forming unit A program executed by a computer built in an apparatus including a projection unit that projects a formed light image toward a projection target,
The above computer
Detecting means for detecting a reference rotational position of the rotating body;
Measuring means for measuring the intensity of light emitted from the phosphor layer of the rotating body in association with the detection result of the detecting means;
Selection means for selecting the irradiation timing of the light of the semiconductor light emitting element to the phosphor layer of the rotating body based on the measurement result by the measuring means, and the semiconductor light emitting element is caused to emit light at the irradiation timing selected by the selection means. A program that functions as light emission control means for forming a light image corresponding to an image signal in the light image forming unit using light emitted from the phosphor layer of the rotating body.

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