JP5473139B2 - Test equipment and test method - Google Patents

Description

  The present invention relates to a test apparatus and a test method for appropriately recording necessary log data.

  2. Description of the Related Art As a typical test apparatus, which is typically a secondary battery charge / discharge test apparatus, one that sequentially records log data in addition to test data during a test is known. If log data is recorded, it can be expected that a clue about the state of the test apparatus at the time of occurrence of an abnormality can be obtained even in an unexpected situation where an unexpected abnormality occurs in the test apparatus or the like during the test.

  In general, various test apparatuses often change electrical characteristics, durability, and the like of a test target sample such as a storage battery over a long period of several days to several weeks or more. For this reason, if digital data indicating the state of the apparatus such as log data is stored every short time of about several milliseconds, the data amount of the log data is extremely increased.

JP 2007-295760 A

  For the period during which the test apparatus performs the test without any abnormality, log data for grasping the state of the test apparatus is not required. Storing a large amount of unnecessary log data not only wastes memory capacity, but also causes a reduction in throughput, such as requiring excessive man-hours to sort and extract the target information at the time of data analysis.

  On the other hand, once an abnormality occurs in the test apparatus, it is required to grasp the detailed apparatus state as much as possible about the apparatus state before and after the abnormality occurs, and precise log data is required. And it can be said that precise information before and after the occurrence of an abnormality makes it easier to identify the mechanism and cause of the occurrence of the abnormality, leading to a reduction in the occurrence of the abnormality.

  The present invention has been made in view of the above-described problems, and effectively uses a limited memory capacity, and records log data indicating the device status and test status before and after the occurrence of an abnormality extremely efficiently. An object of the present invention is to provide a test apparatus and a log data recording method for the test apparatus.

  The test apparatus of the present invention is composed of a plurality of units, and in the test apparatus in which a test program for a sample is executed while constantly monitoring the status of each unit and the status of communication between the units, the status of each unit When at least one of the communication status between the units changes, the log data is recorded in the memory.

  In the test apparatus of the present invention, preferably, the memory is backed up by an uninterruptible power supply, and the log data is recorded in the memory together with the occurrence time of the state change.

  Further, the test apparatus of the present invention more preferably stores the log data stored after the stop based on the recording status of the log data before the stop when the test apparatus is abnormal and the execution of the test program is stopped. It is characterized by determining the quantity.

  The test apparatus of the present invention is more preferably characterized in that log data when an abnormality occurs in the test apparatus and execution of the test program is stopped is recorded in a memory.

  The test apparatus of the present invention is more preferably characterized in that, when execution of the test program is stopped, the storage data amount of the log data after the stop is determined based on the time when the occurrence of the abnormality is detected. To do.

  Further, in the test apparatus of the present invention, more preferably, when the log data is transferred from the memory to the backup memory, an abnormality is detected in the test apparatus until the transfer of the log data to the backup memory is completed. Even in this case, the transfer operation is continued without interruption.

  In addition, the test apparatus of the present invention more preferably includes at least two backup memories capable of transferring data for backup from the memory.

  The test apparatus of the present invention is more preferably characterized in that the transfer operation can be executed independently of the execution of the test program.

  Further, the test method of the present invention is a test method for a sample using any of the above-described test apparatuses, the step of acquiring the state data of the test apparatus, the previously acquired state data, and the current acquisition If there is a difference between the status data, the status data acquired this time is recorded as log data including the acquisition time. If there is no difference between the status data acquired last time and the status data acquired this time, the status data acquired this time is recorded. And a step of not performing.

  The test method of the present invention preferably includes a step of calculating a maximum data capacity of log data to be recorded after the detection of an abnormality when an abnormality of the test apparatus is detected, and a case where log data is to be recorded. The log data is recorded if the data volume already recorded after the abnormality is detected is smaller than the maximum data capacity, and the log data is not recorded unless the data capacity already recorded after the abnormality is detected is smaller than the maximum data capacity. .

  Further preferably, the test method of the present invention is characterized in that the log data includes a management number for managing the log data.

Further preferably, the test method of the present invention is characterized in that the log data includes at least information on voltage, current, temperature, and pressure of the sample. When the test apparatus includes, for example, a watchdog timer, a current meter relay, a voltage meter relay, or a temperature meter relay, the digital data output consisting of these high or low may be taken in as log data by the test apparatus digital data acquisition unit. .
Further preferably, in the test method of the present invention, the log data includes digital information generated corresponding to a voltage meter relay, a current meter relay, a temperature meter relay, and a watchdog timer for monitoring a sample. May be.

  According to the present invention, a test apparatus capable of effectively utilizing a limited memory capacity and recording log data indicating a device state and a test state before and after the occurrence of an abnormality can be recorded very efficiently. Method.

It is a block diagram explaining the outline | summary of the testing apparatus of embodiment. It is a block diagram explaining in detail the function of a status information storage control unit. It is a conceptual diagram explaining the process which the storage data capacity | capacitance calculation part after an abnormality performs. It is a block diagram explaining an outline | summary about the charging / discharging test apparatus which can apply the state information storage part of this embodiment. It is a figure explaining the judgment processing flow whether the test apparatus at the time of normal operation memorize | stores status information. It is a flowchart figure explaining the memory | storage process of state information when a test device alert | reports some abnormality.

  Various test apparatuses, typically charge / discharge test apparatuses such as storage batteries, may stop the execution of the test program if an unexpected abnormal situation occurs during the execution of the test program for testing the test object sample.

  In addition, when an abnormal situation occurs, the test apparatus not only stops the execution of the test program but also notifies the operator that an abnormality has occurred by issuing an alarm or the like. When it is necessary to analyze the cause of the abnormal situation, the operator estimates or identifies the cause while referring to the log data recorded in the test apparatus.

  The test apparatus described in this embodiment efficiently records log data before and after the occurrence of an abnormality and various digital data indicating the functional operation state in the device appropriately and without wasting a finite memory capacity. .

  For this reason, it becomes easy to grasp and analyze log data before and after the occurrence of an abnormality, thereby making it possible to accurately grasp the operating state and usage state of the test apparatus, and to quickly estimate the cause of failure.

  FIG. 1 is a block diagram illustrating an outline of a test apparatus 1000 according to the embodiment. The test apparatus 1000 includes a measurement unit 200 that captures measurement data such as voltage, current, temperature, and pressure of a test sample (not shown), and a test apparatus digital data acquisition unit 500 that acquires various digital data indicating the operation state of the test apparatus 1000. With.

  In addition, the test apparatus 1000 detects the occurrence of an abnormality such as a malfunction of the test apparatus 1000, and notifies the operator by issuing an alert or the like, and the apparatus abnormality notification unit 300 that stops or interrupts the execution of the test program. Prepare.

  In addition, the test apparatus 1000 includes a reset signal generation unit 400 that initializes the execution of the test program and outputs a reset signal for initializing the operation state of the test apparatus 1000 to the power-on state.

  Further, the test apparatus 1000 includes a state information storage unit 100 that stores the state information of the test apparatus 1000 acquired by the measurement unit 200 and the test apparatus digital data acquisition unit 500, respectively. The state information storage unit 100 is backed up by a separate uninterruptible power supply 600 different from the operating power supply of the test apparatus 1000.

  In addition, the state information storage unit 100 stores state information acquired by the measurement unit 200 and the test apparatus digital data acquisition unit 500, and stores state information storage unit 130 and state information that controls writing to the state information storage unit 130. A storage control unit 110. The state information storage unit 130 may be a circular buffer or the like that retains the latest stored data by sequentially overwriting data that is older in time.

  In addition, the state information storage unit 100 includes a post-abnormal storage data capacity calculation unit 120 that calculates the data capacity of the state information to be recorded after the trigger, using the operation abnormality of the test apparatus 1000 reported by the apparatus abnormality notification unit 300 as a trigger. Prepare.

  The post-abnormality storage data capacity calculation unit 120 can allocate the finite storable capacity of the state information storage unit 130 so as to be optimal with respect to the time of occurrence of the abnormality before and after the occurrence of the abnormality necessary for abnormality analysis or the like. The amount of state information recorded after the occurrence of an abnormality is calculated.

  In addition, the status information storage unit 100 stores the status information recorded in the status information storage unit 130 on the HDD (1) 150 (1), the HDD (2) 150 (2), periodically or in accordance with an instruction from an operator. A backup memory selection switching unit 140 for switching to any of the above and storing the backup.

  The state information storage unit 100 also detects whether or not there is an abnormality in the operation states of the HDD (1) 150 (1) and the HDD (2) 150 (2) that are backup memories. Is provided.

  The backup memory state detection unit 160 feeds back the detected operation states of the HDD (1) 150 (1) and the HDD (2) 150 (2) to the backup memory selection switching unit 140, and the HDD (1) 150 (1). And one of HDD (2) 150 (2) is selected. For example, if the backup memory state detection unit 160 detects that a failure has occurred in the HDD (1) 150 (1), the backup memory selection switching unit 140 selects the HDD (2) 150 (2) based on the detection result. Select as backup memory destination.

  In addition, the backup memory state detection unit 160 notifies the reset standby signal generation unit 170 when any one of the HDD (1) 150 (1) and the HDD (2) 150 (2) is performing backup writing. A command for waiting for the reset of the test apparatus 1000 is generated, whereby the reset signal generating unit 400 waits for the output of the reset signal. That is, during the period when the test apparatus 1000 transfers the status information recorded in the status information storage unit 130 to the backup memory, even if the test apparatus 1000 itself is reset for some reason, the test apparatus 1000 Until the backup is completed, a reset is waited for, and the status information backup process can be performed securely and safely.

  FIG. 2 is a block diagram illustrating in detail the function of the state information storage control unit 110. As shown in FIG. 2, the state information storage control unit 110 compares the state information of the test apparatus 1000 input from the measurement unit 200 and the test apparatus digital data acquisition unit 500 with the state information stored last time. A comparison unit 111 is provided. For this reason, the state information storage control unit 110 includes a state information temporary storage unit 112 that temporarily stores the state information stored last time.

  Further, the state information storage control unit 110 includes a write instruction unit 113 that performs data recording after abnormality by the amount of data calculated by the storage data capacity calculation unit 120 after abnormality. Further, the state information comparison unit 111 gives a write permission to the write instruction unit 113 when there is a difference in the state information between the previous time and the current time as a result of the comparison processing.

  The write instruction unit 113 includes a write capacity integration unit 114 that integrates the total write capacity to the state information storage unit 130 after the abnormality is detected. Further, the write instruction unit 113 compares the maximum writable capacity calculated by the post-abnormal storage data capacity calculation unit 120 with the total write capacity after the abnormality accumulated by the write capacity accumulation unit 114, and the total write capacity can be written. A write capacity comparison unit 115 that records in the state information storage unit 130 until the maximum capacity is reached is provided.

  FIG. 3 is a conceptual diagram illustrating processing performed by the post-abnormality storage data capacity calculation unit 120. In FIG. 3, the horizontal axis is the management number assigned in order of time, but the horizontal axis may be the data acquisition time.

  When the apparatus abnormality reporting unit 300 reports the abnormality of the test apparatus 1000, the post-abnormality storage data capacity calculation unit 120 shows the time interval of each piece of state information recorded in the state information storage unit 130 immediately before that as shown in FIG. It is determined which of the three patterns of (b) corresponds.

  FIG. 3A illustrates a case where the time interval of the stored state information gradually increases as the latest state information (on the right side of the graph), and the state information data change gradually converges. It can be understood that this indicates a state estimated to be present. Therefore, it can be expected that this trend will continue even after notification of an abnormality, and that a relatively small amount of recording of state information will be necessary and sufficient thereafter.

  FIG. 3C illustrates a case where the time interval of the stored state information is gradually reduced as the latest state information is obtained, and the state information data changes gradually and frequently. Can be understood to indicate the estimated state. Therefore, it can be expected that this trend will continue even after notification of abnormality, and that a recording capacity for recording more state information will be required.

  Here, the state information storage control unit 110, with respect to the state information of the test apparatus 1000 sequentially acquired at a desired sampling time, only when there is a difference from the state information recorded last time, the state information storage unit 130 together with time data To record. For this reason, a long time interval between sequentially recorded data means that there is no change in the state information during that time, so that the operation status of the test apparatus 1000 is relatively stable. I can understand.

  FIG. 3B is a diagram for explaining a state in which the state information is sequentially recorded at substantially constant intervals, and is just a compromise between FIG. 3A and FIG. It is presumed that the state information is acquired at regular intervals. FIG. 4 is a block diagram illustrating an outline of the charge / discharge test apparatus 4000 to which the state information storage unit 100 of the present embodiment can be applied.

  FIG. 5 is a diagram illustrating a determination processing flow for determining whether or not the test apparatus 1000 during normal operation stores state information. Hereinafter, the determination process of the test apparatus 1000 will be sequentially described for each step shown in FIG.

(Step S510)
The state information storage control unit 110 captures the state information of the test apparatus 1000 acquired by the measurement unit 200 and the test apparatus digital data acquisition unit 500. The measurement unit 200 and the test apparatus digital data acquisition unit 500 can acquire state information with a relatively short sampling time of about 10 milliseconds, for example. In addition, the state information storage control unit 110 may capture state information from the measurement unit 200 and the test apparatus digital data acquisition unit 500 at intervals equal to or longer than the sampling time described above.

(Step S520)
The state information acquired from the measurement unit 200 and the test apparatus digital data acquisition unit 500 is input to the state information comparison unit 111. The state information comparison unit 111 verifies whether or not the state information temporary storage unit 112 has the state information stored in the previous state information storage unit 130. If there is, the process proceeds to step S530; otherwise, the process proceeds to step S540. Proceed to

(Step S530)
The state information comparison unit 111 captures the previous saved data stored in the state information temporary storage unit 112 and compares it with the state information captured from the current measurement unit 200 and the test apparatus digital data acquisition unit 500.

If there is a difference, the process proceeds to step S540, and if there is no difference, the process returns to step S510.
(Step S540)
The write instruction unit 113 captures the state information to be stored from the state information comparison unit 111 and writes the captured state information into the state information storage unit 130 for storage. When the state information storage unit 130 is a circular buffer and there is no remaining storable capacity of the state information storage unit 130, the write instruction unit 113 returns to the first address of the state information storage unit 130, that is, the oldest New state information is sequentially written by overwriting data.

  As described with reference to FIG. 5, the test apparatus 1000 stores the state information only when there is a change in the monitored state information, and stores the state information when there is no change in the monitored state information. do not do. For this reason, it is possible to reliably record necessary state information and effectively utilize a finite memory capacity without storing unnecessary steady-state state information.

  FIG. 6 is a flowchart for explaining the state information storing process when the test apparatus 1000 issues an abnormality. Hereinafter, the storage process at the time of anomaly notification will be sequentially described for each step shown in FIG.

(Step S610)
The post-abnormality storage data capacity calculation unit 120 determines whether or not the test apparatus 1000 has issued an abnormal state. If the test apparatus 1000 detects an abnormal condition, the process proceeds to step S620. If the test apparatus 1000 does not detect an abnormal condition, the process waits in step S610.

  Here, the test apparatus 1000 does not immediately report an abnormality when there is an unexpected change in each piece of status information monitored to detect the abnormality. For about a second, it is preferable to output a report indicating an abnormal state after confirming whether or not unexpected fluctuations continue. As a result, it is possible to reduce the occurrence of false abnormality reporting processing due to noise components such as surges.

(Step S620)
The post-abnormality storage data capacity calculation unit 120 calculates the maximum data capacity (A) to be continuously recorded after the abnormality is issued by dividing the pattern as shown in FIG. Here, with respect to the state information data before and after the abnormality is issued, the state information storage unit 130 stores more state information necessary for the analysis of the cause of the abnormality, and the state that seems to be relatively stable in the steady state. By not storing information, the memory capacity of the state information storage unit 130 is effectively utilized.

(Step S630)
The write instruction unit 113 determines whether or not write permission is instructed from the state information comparison unit 111. When the permission of writing is instructed from the state information comparison unit 111, the process proceeds to step S640. When the permission of writing is not instructed from the state information comparison unit 111, the process waits in step S630.

(Step S640)
The write instructing unit 113 determines whether or not there is a written data capacity accumulated in the write capacity integrating unit 114 after the abnormality is reported. If there is a written data capacity (B) accumulated in the write capacity integrating unit 114 after the abnormal report is issued, the process proceeds to step S650, and the written data capacity (integrated in the write capacity integrating unit 114 after the abnormal report is issued) If there is no B), the process proceeds to step S660.

(Step S650)
The write capacity comparison unit 115 determines whether or not the maximum data capacity (A) to be continuously recorded after the abnormal report is larger than the written data capacity (B) accumulated in the write capacity integrating unit 114 after the abnormal report. Determine whether.

  If the maximum data capacity (A) to be continuously recorded after the abnormal report is larger than the written data capacity (B) accumulated in the write capacity integrating unit 114 after the abnormal report, the process proceeds to step S660. . Further, when the maximum data capacity (A) to be continuously recorded after the abnormal report is not larger than the written data capacity (B) accumulated in the write capacity integrating unit 114 after the abnormal report, this flow is performed. The process ends.

(Step S660)
The write instruction unit 113 transmits state information to be stored in the state information storage unit 130, and the state information storage unit 130 stores this. The write instruction unit 113 transmits state information to be stored in the state information temporary storage unit 112, and the state information temporary storage unit 112 stores the state information. The state information temporary storage unit 112 can be configured by a volatile memory having a relatively small storage capacity that temporarily stores state information for one time.

(Step S670)
The write capacity integration unit 114 adds the data amount of the state information newly stored this time to the written data capacity (B) and integrates it. When the process in step S670 is completed, the process returns to step S630.

  As described above, the test apparatus 1000 described in the embodiment determines how much data amount of state information should be recorded after the abnormality is reported, immediately before the abnormality is reported. Determine by analyzing trends in time intervals of recorded status information. As a result, it is possible to estimate whether or not the status information is necessary, and it is possible to realize the test apparatus 1000 that can allocate and record memory resources more accurately for the necessary status information.

  Further, the test apparatus and the test method described in the embodiment are not limited to the description in the embodiment, and can be appropriately changed within the scope of the disclosed technical idea or applied in combination with a known technique. Also good.

  In addition, the test apparatus and the test method in the above-described embodiment can be used by appropriately changing the structure and configuration within the obvious range, and the test sample is not limited to the battery.

  The present invention can be widely applied to a test apparatus for testing a sample, a power source, and other general apparatuses.

  100 ... Status information storage unit 110 ... Status information storage control unit 120 ... Post-abnormal storage data capacity calculation unit 130 ... Status information storage unit 200 ... Measurement unit 300 ... Device error reporting unit, 400 .... Reset signal generator, 500 ... Test equipment digital data acquisition unit, 600 ... Uninterruptible power supply.

Claims (13)

A secondary battery charge / discharge test apparatus comprising a plurality of units, wherein a charge / discharge test program for a secondary battery as a sample is executed while constantly monitoring the state of each unit and the state of communication between the units. In
The log data is recorded in a memory when at least one of the state of each unit and the state of communication between the units changes. The test apparatus according to claim 1,
The memory is backed up by an uninterruptible power supply,
The log data is recorded in the memory together with the occurrence time of the state change. The test apparatus according to claim 1 or 2,
When an abnormality occurs in the test apparatus and execution of the test program is stopped, a storage data amount of the log data after the stop is determined based on a recording state of the log data before the stop. To test equipment. The test apparatus according to any one of claims 1 to 3,
The log data when the abnormality occurs in the test apparatus and the execution of the test program is stopped is recorded in the memory. The test apparatus according to claim 3, wherein
When the execution of the test program is stopped, the storage data amount of the log data after the stop is determined based on a time when the occurrence of the abnormality is detected. The test apparatus according to any one of claims 1 to 5,
When the log data is transferred from the memory to a backup memory,
Until the transfer of the log data to the backup memory is completed, even if an abnormality is detected in the test apparatus, the transfer operation is continued without interruption. The test apparatus according to claim 6, wherein
A test apparatus comprising at least two backup memories capable of transferring data for backup from the memory. The test apparatus according to claim 6 or 7, wherein
The transfer apparatus can execute the transfer operation independently of the execution of the test program. A test method for a sample using the test apparatus according to any one of claims 1 to 8,
Obtaining status data of the test apparatus;
When there is a difference between the state data acquired last time and the state data acquired this time, the state data acquired this time is recorded as log data including the acquisition time, and the state data acquired last time and the state data acquired this time And a step of not recording the status data acquired this time when there is no difference between the test data and the test method. The test method according to claim 9, wherein
Calculating a maximum data capacity of log data to be recorded after the detection of the abnormality when an abnormality of the test apparatus is detected;
When trying to record the log data,
If the data capacity already recorded after the detection of the abnormality is smaller than the maximum data capacity, the log data is recorded,
The test method, wherein the log data is not recorded unless the data capacity already recorded after the detection of the abnormality is smaller than the maximum data capacity. In the test method according to claim 9 or 10,
The log data includes a management number for managing the log data. In the test method as described in any one of Claim 9 thru | or 11,
The log data includes at least information on voltage, current, temperature, and pressure of the sample. The test method according to any one of claims 9 to 12,
The log data includes digital information generated corresponding to a voltage meter relay, a current meter relay, a temperature meter relay, and a watchdog timer for monitoring the sample.

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