JP5451630B2 - X線分析装置用の事前にフィルム化された精密サンプルセル - Google Patents
X線分析装置用の事前にフィルム化された精密サンプルセル Download PDFInfo
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- JP5451630B2 JP5451630B2 JP2010536153A JP2010536153A JP5451630B2 JP 5451630 B2 JP5451630 B2 JP 5451630B2 JP 2010536153 A JP2010536153 A JP 2010536153A JP 2010536153 A JP2010536153 A JP 2010536153A JP 5451630 B2 JP5451630 B2 JP 5451630B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
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- Life Sciences & Earth Sciences (AREA)
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- Analysing Materials By The Use Of Radiation (AREA)
Description
本出願は、2007年11月30日に出願された米国特許仮出願60/991,396の権益を主張し、この仮出願は完全に本明細書に参照により組み込まれる。
Claims (20)
- 分析装置のためのサンプルセルであって、
外部本体であって、前記外部本体の内部にサンプル貯留部を形成している、外部本体と、
前記外部本体の上端に配置されて前記サンプル貯留部の上端を形成している方向性充填バルブであって、前記充填バルブは充填中サンプルを受け入れ、充填後排出する間サンプル漏れを防ぐ、充填バルブと、
前記外部本体の下端を覆い、前記サンプル貯留部の底端部を形成するフィルムであって、前記フィルムは前記サンプルを前記分析装置の分析焦点に設置する、フィルムと
を含むことを特徴とするサンプルセル。 - 前記フィルムを前記外部本体の前記下端の周囲に固定して締めるためのリングであって、前記外部本体の前記下端の周囲を前記フィルムの上から締め続けているリングをさらに含むことを特徴とする請求項1に記載のサンプルセル。
- 前記リングの端は前記フィルムが覆って締めている前記外部本体の前記下端を越えて延び、前記サンプルセルは表面上に設置される際前記リングの前記下端上に置くことができ、したがって前記フィルムは前記延びのサイズに対応した距離だけ前記表面から離れることを特徴とする請求項2に記載のサンプルセル。
- 前記外部本体は内壁と外壁を含み、前記内壁と前記外壁の間に前記リングは摩擦によって留められ、前記内壁の下端は、周囲に前記フィルムが締められている前記外部本体の前記下端を含むことを特徴とする請求項2に記載のサンプルセル。
- 前記外壁は前記フィルムが覆って締めている前記内壁の前記下端を越えて延び、前記サンプルセルは表面上に設置される際前記外壁上に置くことができ、したがって前記フィルムは前記延びのサイズに対応した距離だけ前記表面から離れることを特徴とする請求項4に記載のサンプルセル。
- 前記充填バルブはサンプル充填の間ピペットを収容するための一方向、エラストマー充填バルブであり、前記ピペットを取り除く際に前記サンプルの漏れを防ぎ、同時に充填の際前記貯留部の排出を提供することを特徴とする請求項1に記載のサンプルセル。
- 前記サンプル貯留部内部に形成され、前記ピペットを前記充填バルブに挿入している間、前記ピペットが前記サンプル貯留部を通過して前記フィルムに届くのを妨げるように前記充填バルブに合わせて調整された遮断構造をさらに含むことを特徴とする請求項6に記載のサンプルセル。
- 前記遮断構造は前記遮断構造を越えて少なくともサンプルの1部が循環できる構造であることを特徴とする請求項7に記載のサンプルセル。
- 前記遮断構造は、所定のサイズの前記サンプルの粒子状の物質が前記遮断構造を越えて循環でき、同時に前記サイズを越えるサイズの粒子状の物質が前記遮断構造を越えて循環できないようにするための開口部を含むことを特徴とする請求項8に記載のサンプルセル。
- 前記遮断構造の前記開口部のうちの1つは、前記遮断構造の底に、前記サンプルが跳ねることなく下に流れるために十分大きく、前記ピペットを前記充填バルブに挿入している間、前記ピペットが前記遮断構造を通過して前記フィルムに届くのを妨げるために十分小さい穴を備えることを特徴とする請求項9に記載のサンプルセル。
- 前記フィルムは実質的に取り外せないように備え付けられたリングを使用して実質的に取り外せないように前記外部本体の周囲に取り付けられることを特徴とする請求項1に記載のサンプルセル。
- 前記充填バルブを適切な位置に保持するために、実質的に取り外せないように前記外部本体の上部に適合するキャップをさらに含むことを特徴とする請求項11に記載のサンプルセル。
- 前記充填バルブを適切な位置に保持するために、実質的に取り外せないように前記外部本体の上部に適合するキャップをさらに含むことを特徴とする請求項1に記載のサンプルセル。
- 請求項1に記載のサンプルセルとX線分析装置機関の組み合わせであって、前記X線分析装置機関は前記サンプルセル内の前記サンプルとのアライメントを要求する焦点を有する、組み合わせ。
- 励起および/または検出光路上に配置された少なくとも1つのX線光学素子をさらに含むことを特徴とする請求項14に記載の組み合わせ。
- 前記少なくとも1つのX線光学素子は湾曲単色光学素子および/またはポリキャピラリー光学素子を含むことを特徴とする請求項15に記載の組み合わせ。
- 前記X線分析装置機関は前記検出光路上に単色光学素子を有するWDXRF分析装置機関を含むことを特徴とする請求項15に記載の組み合わせ。
- 前記分析装置は硫黄分析装置であることを特徴とする請求項17に記載の組み合わせ。
- 前記X線分析装置機関は、前記励起光路上に少なくとも1つの光学素子、および前記検出光路上にエネルギー分散検出器を有するEDXRF分析装置機関を含むことを特徴とする請求項15に記載の組み合わせ。
- 前記サンプルセルは、前記サンプルセルの前記フィルムに接触している支持を利用して、前記組み合わせの中の前記フィルムによって支持され、よって前記サンプルの前記焦点へのアライメントが確実に行われることを特徴とする請求項15に記載の組み合わせ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US99139607P | 2007-11-30 | 2007-11-30 | |
US60/991,396 | 2007-11-30 | ||
PCT/US2008/084800 WO2009073499A1 (en) | 2007-11-30 | 2008-11-26 | Pre-filmed precision sample cell for x-ray analyzer |
Publications (2)
Publication Number | Publication Date |
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JP2011505563A JP2011505563A (ja) | 2011-02-24 |
JP5451630B2 true JP5451630B2 (ja) | 2014-03-26 |
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JP2010536153A Active JP5451630B2 (ja) | 2007-11-30 | 2008-11-26 | X線分析装置用の事前にフィルム化された精密サンプルセル |
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US (1) | US7729471B2 (ja) |
EP (1) | EP2223091A1 (ja) |
JP (1) | JP5451630B2 (ja) |
CN (1) | CN101918821B (ja) |
HK (1) | HK1152110A1 (ja) |
RU (1) | RU2479836C2 (ja) |
WO (1) | WO2009073499A1 (ja) |
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2008
- 2008-11-26 CN CN200880125181.3A patent/CN101918821B/zh active Active
- 2008-11-26 WO PCT/US2008/084800 patent/WO2009073499A1/en active Application Filing
- 2008-11-26 EP EP08857573A patent/EP2223091A1/en not_active Withdrawn
- 2008-11-26 US US12/323,590 patent/US7729471B2/en active Active
- 2008-11-26 JP JP2010536153A patent/JP5451630B2/ja active Active
- 2008-11-26 RU RU2010126726/28A patent/RU2479836C2/ru not_active IP Right Cessation
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2011
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11482052B2 (en) | 2014-10-22 | 2022-10-25 | IntegenX, Inc. | Systems and methods for biometric data collections |
Also Published As
Publication number | Publication date |
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WO2009073499A1 (en) | 2009-06-11 |
CN101918821B (zh) | 2012-05-09 |
EP2223091A1 (en) | 2010-09-01 |
RU2010126726A (ru) | 2012-01-10 |
US7729471B2 (en) | 2010-06-01 |
JP2011505563A (ja) | 2011-02-24 |
HK1152110A1 (en) | 2012-02-17 |
RU2479836C2 (ru) | 2013-04-20 |
US20090141867A1 (en) | 2009-06-04 |
CN101918821A (zh) | 2010-12-15 |
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