JP5418220B2 - Inlet inspection device - Google Patents

Description

  The present invention relates to an inlet inspection apparatus that inspects whether or not an inlet having an IC chip and an antenna can communicate.

  In recent years, an IC tag such as an RFID (Radio Frequency Identification) equipped with an IC chip has been attracting attention as a recording medium capable of reading and writing data without contact, and has already been put into practical use in various scenes. Here, the IC tag itself is a product itself that is marketed by itself or attached to other products, and cannot be handled as a product just by mounting an IC chip on an antenna formed on a long film. Those that are not available are called inlets or inlays (hereinafter referred to as “inlets”). That is, the inlet includes at least an IC chip and an antenna, which are basic parts constituting an IC tag, on a long film. The process of manufacturing an IC tag includes a process of inspecting whether each inlet formed at a predetermined pitch on a long roll inlet can communicate with a communication device (such as a reader / writer) in a non-contact manner. In this inlet inspection step, a communicable inlet and a non-communicable inlet are discriminated.

  As an inlet inspection device used in an inlet inspection process, Patent Document 1 discloses a communication device (a reader / writer in Patent Document 1) in a substantially box-shaped shield box made of a synthetic resin material such as acrylic or a metal material such as stainless steel. And each inlet (IC card in Patent Document 1) is conveyed into the shield box one by one using the slits formed on the opposing rising surfaces (for example, both the left and right side surfaces) of the shield box. An aspect in which an inspection is performed by communicating an inlet and a communication device is disclosed.

JP 2004-272437 A

  However, in the inspection apparatus disclosed in Patent Document 1, although the communication area between the inlet and the communication device can be formed in a space where the electromagnetic wave can be shielded (in the shield box), the electromagnetic wave passes from the slit to the outside of the shield box. If there is a leakage, it may be reflected by an electromagnetic wave reflective object such as metal around the inspection device and communicate with an uninspected inlet outside the shield box. There was a problem that could not be obtained. This also means that the inlet that has been inspected in the shield box and transported to the outside of the shield can communicate with the communication device again, and thus the same inlet can respond multiple times at different locations. After all, it is not possible to obtain appropriate test results. In the first place, before the identification data unique to the inlet IC chip is written, the same ID is generally recorded in the IC chips of all the inlets formed on the same roll inlet. It is difficult to grasp what number of inlets the communication device is communicating with on the roll inlet, and how to identify the inlet to be inspected is also solved in the aspect disclosed in Patent Document 1 This is not a problem.

  Moreover, if it is the aspect currently disclosed by patent document 1, when the antenna pattern of an inlet differs, it is necessary to change suitably the magnitude | size (internal space) of a shield box itself, and the opening shape of a slit, and a different shape There is also a problem that the inlets cannot be inspected with the same apparatus.

  The present invention has been made paying attention to such a problem, and its main purpose is to communicate with only the inlet to be inspected while avoiding erroneous communication with the inlet not to be inspected. It is an object of the present invention to provide an inlet inspection device capable of obtaining an accurate inspection result.

  That is, the inlet inspection apparatus of the present invention is a non-defective product in which each inlet can communicate with a long roll inlet that passes through the inspection area while being formed in a plurality of inlets having IC chips and antennas and conveyed in a predetermined direction. It is inspected whether or not.

The inlet inspection apparatus according to the present invention includes a microstrip line in which at least one communication device capable of communicating with the inlet is connected to one end, a microstrip line that is disposed on an upper surface of the microstrip line and functions as a transport path for the inlet. In addition, the conveyance path forming body mounted on a common support and the roll inlet that passes through the communication area of the microstrip line are in contact with or close to the inlet existing in the area outside the inspection area. The inspection area is an area defined by a slit formed in the metal body, and the upper surface of the transport path forming body, the upper side and the side of the support body are covered with a common metal body, Communication equipment via microstrip line and one that exists in the inspection area The inlet is characterized in that to determine whether non-defective by the communication state with the Nretto.

  Here, the “communication area of the microstrip line” means “an area where electromagnetic waves output from the microstrip line reach”. Further, “communication of communication equipment via a microstrip line” means “communication of communication equipment using an electromagnetic wave output from the microstrip line”. In the following description, simply “communication of a microstrip line” May be described. In addition, “one inlet existing in the inspection area” means one inlet to be inspected, and for convenience of explanation, hereinafter referred to as “inlet to be inspected” and “inlet existing in an area outside the inspection area” Is referred to as “inlet not subject to inspection”. Further, the “metal body” may be made of metal, and may be a conductor, a magnetic body, a non-magnetic body, or the like. Furthermore, the “communication state” that is a criterion for checking whether or not the product is non-defective includes the presence / absence of communication, communication time, and the like.

  As described above, the inlet inspection apparatus of the present invention uses the microstrip line as an antenna of a communication device, and makes contact with or close to an inspection target inlet existing in an area outside the inspection area within the communication area of the microstrip line. Since the metal body is provided, even if there are a plurality of inlets in the communication area of the microstrip line, the non-inspection inlet is configured by the metal body contacting or approaching the non-inspection inlet. The impedance of the antenna is greatly changed, and the non-inspection inlet can be made incapable of communicating with the microstrip line. Therefore, the non-inspection inlet that is in contact with or close to the metal body does not respond to the electromagnetic wave from the microstrip line, and is one of the inspection target inlets that are not in contact with or close to the metal body, that is, one in the inspection region. Only the inlet can respond to electromagnetic waves from the microstrip line, and it is accurate whether the inspection target inlet is non-defective based on the presence or absence of communication between the inspection target inlet and the microstrip line or the communication state such as communication time. Can be determined. Furthermore, since the inlet inspection device of the present invention uses a microstrip line as an antenna of a communication device, impedance matching is easy to take, and if it is a microstrip line, communication caused by electromagnetic induction and communication by radio waves can be performed. For example, the same inspection apparatus can be applied to inlets having different antenna patterns.

  According to the present invention, a state in which a plurality of inlets are present in the communication area of the microstrip line, that is, a plurality of inlets formed on the long roll inlet at an equal pitch or an unequal pitch is within the communication area of the microstrip line. Even if it is present in the inspection area, it is possible to avoid a situation where the communication with the non-inspection inlet is erroneously performed, and it is possible to secure a situation where communication with only one inspection target inlet existing in the inspection area is possible. It is possible to provide an inlet inspection device capable of preventing / suppressing a situation where the inlets respond simultaneously or a situation where the same inlet changes the location (inspection area, outside the inspection area) and responds multiple times.

The cross-sectional schematic diagram of the inlet test | inspection apparatus which concerns on one Embodiment of this invention. The principal part enlarged view of FIG. The plane schematic diagram of the inlet test | inspection apparatus which concerns on the same embodiment. The whole schematic diagram of the microstrip line used for the inlet inspection apparatus concerning the embodiment. The figure which shows typically the communication range of an inlet (antenna pattern a). The figure which shows typically the communication range of an inlet (antenna pattern b). The figure which shows typically the communication range of an inlet (antenna pattern c).

  Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

  The inlet inspection apparatus 1 according to the present embodiment is an apparatus that determines whether or not the inlet X is communicable. For example, the inlet inspection apparatus 1 constitutes a part of an IC tag manufacturing apparatus (not shown). In addition, the inlet inspection apparatus 1 of this embodiment can also be utilized as an apparatus independent of the IC tag manufacturing apparatus.

  And the inlet test | inspection apparatus 1 which concerns on this embodiment communicates with respect to each inlet X formed on the roll inlet R which passes along the test | inspection area | region 1A, as shown in FIGS. 1-3. And whether or not the inlet X is a non-defective product is determined based on the communication state. In the present embodiment, as a communication medium (electromagnetic wave) between the inlet X and the inlet inspection device 1, for example, a radio wave in the UHF band is used.

  Here, the roll inlet R applied in this embodiment will be briefly described. The roll inlet R has an antenna circuit for transmitting and receiving electromagnetic waves on a long base film (corresponding to the “antenna” of the present invention: not shown) at a predetermined interval (in the illustrated example, an equal interval) by printing, etching, or the like. Provided with an antenna sheet R1 (also referred to as a film substrate) formed with a non-uniform spacing) and an IC chip R2 mounted so as to be connected to a predetermined position of each antenna circuit It is. The IC chip R2 is provided with bumps made of metal such as copper or gold for connecting to the antenna circuit on the back surface. For example, an adhesive or metal made of insulating paste, anisotropic conductive paste or the like is used. The antenna circuit is connected by fusion or the like. And the inlet X is comprised by the group of one antenna circuit formed on the roll inlet R, and one IC chip R2. That is, the inlet X of the present embodiment indicates a product before being cut out as a product (IC tag).

  As shown in FIG. 1 and the like, the inlet inspection apparatus 1 for inspecting such an inlet X includes a microstrip line 3 having a reader / writer 2 (“communication device” of the present invention) connected to one end thereof, A transport path forming body 4 that is disposed on the upper surface side and functions as a transport path for the roll inlet R, and a metal body 5 that can cover at least the upper surface of the transport path forming body 4 are provided.

  The microstrip line 3 is connected to a reader / writer 2 (corresponding to “communication device” of the present invention) at one end and connected to a terminal (not shown) to be terminated. In the present embodiment, as shown in FIG. 4, as the microstrip line 3, for example, a linear conductor 32 that functions as a transmission line is formed on the upper surface of a flat dielectric substrate 31, and the lower surface of the dielectric substrate 31. The well-known thing which formed the conductor 33 which functions as a ground as a whole is applied. Each of the conductors 32 and 33 can be formed of a conductor foil (for example, a copper foil). The conductor 32 functioning as a transmission line extends in a straight line along the longitudinal direction of the dielectric substrate 31 having a long rectangular shape. Such a microstrip line 3 has a relative dielectric constant and thickness dimension of the dielectric substrate 31, thickness dimensions of the conductors 32 and 33, or a width dimension of the conductor 32 functioning as a transmission line (dimension in a direction perpendicular to the longitudinal direction). ) Etc., the characteristic impedance of the transmission line can be determined. In the present embodiment, the microstrip line 3 is placed in a posture in which the longitudinal direction of the microstrip line 3 is orthogonal or substantially orthogonal to the width direction of the roll inlet R (the dimension in the direction orthogonal to the longitudinal direction (conveying direction) of the roll inlet R). It is arranged. The longitudinal dimension of the microstrip line 3 only needs to be larger than the width dimension of the antenna pattern of the roll inlet R, and can be set, for example, to be approximately the same as the width dimension of the roll inlet R. Each of the conductors 32 and 33 is formed of an extremely thin film, and is schematically shown exaggerated in FIG. 1 and the like, and in FIG. 4, only the conductor 32 is provided with a pattern.

  The conveyance path forming body 4 is configured by using, for example, an acrylic resin panel, and the planar shape thereof is set to be larger than the longitudinal dimension and the width dimension (dimension in the direction perpendicular to the longitudinal dimension) of the microstrip line 3. doing. And in the state which has arrange | positioned the microstrip line 3 in the center thru | or the substantially center part in the lower surface of such a conveyance path formation body 4, the planar shape of the conveyance path formation body 4 is more than the communication area in planar view of the microstrip line 3. The microstrip line 3 is set to be large so that the microstrip line 3 can communicate with each inlet X of the roll inlet R that transports the upper surface side of the transport path forming body 4 from below. In this embodiment, the conveyance path formation body 4 and the microstrip line 3 are attached on a common support body 6 (frame) (see FIG. 1).

  The metal body 5 is formed of, for example, a metal foil such as aluminum, and an opening that does not allow the metal body 5 to exist in a region corresponding to a position directly above the microstrip line 3 in a state where the upper surface of the transport path forming body 4 is covered. As a result, a slit 5S is formed. Thereby, the communication path | route of the microstrip line 3 from the lower surface side of the metal body 5 to an upper surface side can be limited only to the path | route which passes the slit 5S. That is, the region where the slit 5S is formed corresponds to the inspection region 1A of the present invention. Here, the opening dimension of the slit 5S along the conveying direction of the roll inlet R (hereinafter referred to as “the opening width of the slit 5S”) is the same as the width dimension of the conductor 32 of the microstrip line 3 or the conductor 32. It may be slightly larger than the width dimension, and the opening width of the slit 5S may be adjusted by an appropriate means. In the present embodiment, the entire upper surface (excluding the inspection region 1A) of the transport path forming body 4 is covered with the metal body 5, and the metal body 5 is also disposed above and to the side of the support body 6 to generate electromagnetic waves. A space that can be shielded is formed, and a situation in which communication with the inlet X in the vicinity of the support 6 is mistakenly avoided is avoided.

  Next, an inspection method and an operation of the inlet X by the inlet inspection apparatus 1 configured from each part will be described.

  When the roll inlet R in which the inlet X is formed at a predetermined pitch in the longitudinal direction through an appropriate process is transported to the inlet inspection device 1, the inlet inspection device 1 rotates the roll 7 to move the roll inlet R to the metal body 5. Transport along the transport direction while making contact or proximity. The inlet inspection apparatus 1 according to this embodiment outputs an electromagnetic wave from the microstrip line 3 when the inlet X passes through the inspection region 1A (slit 5S), and the electromagnetic wave is received by the antenna of the inlet X and responds. The inspection target inlet X at the position facing the slit 5S, that is, the inspection target inlet X (A) present in the inspection region 1A can communicate depending on whether or not the response state continues for a predetermined time. It is possible to determine whether the product is a non-defective product.

  In particular, in this embodiment, since the microstrip line 3 is applied as the antenna of the reader / writer 2, it is possible to output an electromagnetic wave having strength in a narrow range, and the inspection target inlet X (A ) Can be communicated appropriately. Furthermore, the inlet inspection apparatus 1 according to the present embodiment can use communication due to electromagnetic induction and communication using radio waves by using the microstrip line 3, and can also communicate with an inlet X having a different antenna pattern. Inspection can be performed.

  On the other hand, if the antenna pattern of the inlet X is changed, the communication area of each inlet X is naturally different as shown in FIGS. 5 to 7, and the microstrip line 3 exists in an area outside the inspection area 1 </ b> A. That is, there is a possibility of communicating with the non-inspection inlet X (B), but the inlet inspection device 1 according to the present embodiment brings the non-inspection inlet X (B) into contact with or close to the metal body 5. The impedance of each antenna in the non-inspection inlet X (B) is changed so that it cannot communicate with the microstrip line 3. 5 to 7 show the communication area and intensity of each inlet X having different antenna patterns a, b, and c as dotted lines and gradations (the darker gradation indicates the area where the electromagnetic wave intensity of the microstrip line is higher). This is schematically shown in FIG.

  As described above, the inlet inspection apparatus 1 according to the present embodiment applies the microstrip line 3 as the antenna of the reader / writer 2 so that impedance matching can be easily achieved, and communication caused by electromagnetic induction and communication by radio waves can be performed. This makes it possible to inspect the inlet X with different antenna patterns under the same conditions. And the inlet test | inspection apparatus 1 of this embodiment contacts or adjoins to the metal body 5 the non-inspection inlet X (B) which exists in the range (communication area) where the electromagnetic waves from the microstrip line 3 reach. The impedance of each antenna constituting the non-inspection inlet X (B) is greatly changed, so that these non-inspection inlets X (B) are temporarily removed from the communication matching state with the microstrip line 3 and the microstrip line 3 I can't communicate with it. Therefore, even when there are a plurality of inlets X in the communication area of the microstrip line 3, the microstrip line 3 can communicate only with the inspection target inlet X (A) existing in the inspection region 1A. Based on this communication state (communication status such as presence / absence of communication or communication time), it is possible to accurately determine whether or not the inspection target inlet X (A) is a non-defective product capable of communication. In addition, the inspection target inlet X (A) at the position facing the slit 5S contacts the metal body 5 at the same time or substantially simultaneously with the roll inlet R as it moves beyond the inspection area 1A beyond the opening edge of the slit 5S. ) Or close to each other, it becomes impossible to respond to communication from the microstrip line 3, so that the problem that the same inlet X responds multiple times at different locations can be solved. In addition, as a result of the inspection based on the communication state, the inlet X that is determined to be non-defective is marked on the inlet X by appropriate means (for example, print processing) or a process such as opening a hole (not a non-defective product). And so on).

  Then, by setting the opening width of the slit 5S to be smaller than the distance between the antennas of the adjacent inlets X on the roll inlet R, it is possible to reliably prevent a situation where a plurality of inlets X respond simultaneously. it can.

  Furthermore, since the inlet inspection apparatus 1 according to the present embodiment covers the entire upper surface and the entire side surface except the slit 5S with the metal body 5, the inlet inspection apparatus 1 erroneously communicates with the inlet X present around the inlet inspection apparatus 1. Can be prevented. Further, by covering the entire upper surface and the entire side surface except for the slit 5S with the metal body 5, the electromagnetic components leaking from the inside to the outside of the metal body 5 through the slit 5S exist around the inlet inspection apparatus 1. The electromagnetic wave can be shielded by the metal body 5 even if it is reflected and returned. And the freedom degree of arrangement | positioning of the inlet test | inspection apparatus 1 improves by employ | adopting such a structure.

  In addition, this invention is not limited to embodiment mentioned above.

  For example, a microstrip line was provided in a box-shaped shield case (for example, the outer surface of an acrylic case covered with aluminum foil), and a slit functioning as an inspection area for the microstrip line was formed on the top surface of the shield case. It may be an inlet inspection device. In this case, the upper surface of the shield case functions as a transport path, and the communication characteristics change by bringing the inlet existing in the region away from the inspection region into contact with or close to a metal body (for example, aluminum foil) formed on the upper surface of the shield case. As in the above-described embodiment, it is possible to accurately inspect whether or not the inspection target inlet is a good product based on the communication state with only one inlet existing in the inspection region. In addition, with such an embodiment, it is possible to arrange a communication device connected to one end of the microstrip line via a cord outside the shield case.

  Moreover, the material and shape (thickness etc.) of a conveyance path formation body or a metal body can also be changed suitably. In the above-described embodiment, the inlet has been described. However, the present invention can also be applied to inspection of a tag.

  In addition, the specific configuration of each part is not limited to the above embodiment, and various modifications can be made without departing from the spirit of the present invention.

DESCRIPTION OF SYMBOLS 1 ... Inlet inspection apparatus 1A ... Inspection area 2 ... Communication apparatus (reader / writer)
3 ... Microstrip line 5 ... Metal body R ... Roll inlet R2 ... IC chip X ... Inlet X (A) ... Inspection inlet X (B) ... Uninspection inlet

Claims (1)

An inlet inspection apparatus that inspects whether or not each inlet formed on a long roll inlet passing through an inspection region while being conveyed in a predetermined direction is a non-defective product capable of communication,
A microstrip line in which a communication device capable of communicating with the inlet is connected to one end;
A transport path forming body which is disposed on the upper surface of the microstrip line and functions as a transport path for the inlet and is mounted on a common support together with the microstrip line;
Wherein one of said rolls inlet passing through the microstrip line communication area of contact or in close proximity to the inlet present in the region outside from the examination region and a metal body that changes the communication characteristics of the inlet,
The inspection area is an area defined by a slit formed in the metal body,
The upper surface of the transport path forming body, the upper side and the side of the support body are covered with the common metal body,
An inlet inspection device that determines whether or not the inlet is a non-defective product based on a communication state between the communication device via the microstrip line and one inlet existing in the inspection area.

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