JP4514374B2 - RF-ID inspection system - Google Patents

RF-ID inspection system Download PDF

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Publication number
JP4514374B2
JP4514374B2 JP2001269561A JP2001269561A JP4514374B2 JP 4514374 B2 JP4514374 B2 JP 4514374B2 JP 2001269561 A JP2001269561 A JP 2001269561A JP 2001269561 A JP2001269561 A JP 2001269561A JP 4514374 B2 JP4514374 B2 JP 4514374B2
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Prior art keywords
test piece
system
rf
inspection
id
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JP2003076947A (en
Inventor
孝之 林
貢 齋藤
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トッパン・フォームズ株式会社
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Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an RF-ID inspection system for inspecting the quality of manufactured RF-IDs.
[0002]
[Prior art]
In recent years, a technology related to a non-contact type identification medium (non-contact type IC card or the like) called RF-ID (Radio Frequency Identification) has been rapidly advanced, and its use is also various. Such an RF-ID has a communication distance that is determined according to performance between the reader / writer and an improvement in communication measurement and a yield are desired.
[0003]
Conventionally, in RF-ID, an antenna coil is formed on a film base, and an IC module is mounted on the film. As a general rule, a predetermined number of these are formed on a film base having a predetermined size at the manufacturing stage. It has become. And before making it a single unit, the communication distance is measured for each single IC module and antenna coil to be inspected, and the quality of the product is inspected. In the measurement of the communication distance, whether or not the communication distance determined according to the performance between the reader / writer and the reader / writer is secured is determined.
[0004]
[Problems to be solved by the invention]
However, since the communication distance inspection as described above is performed at a stage before the RF-ID is a single unit, the response to communication from the RF-ID reader / writer is the original inspection target inspection. The data from the one and the one from the adjacent RF-ID are received in a mixed manner, and not only the reliability of the received data is lost, but also when the inspection piece to be inspected is a defective product, it is adjacent. However, there is a problem in that the data from the RF-ID is received and the test piece is originally a defective product, but it is determined to be a non-defective product and the defective product flows out.
[0005]
Accordingly, the present invention has been made in view of the above problems, and an object of the present invention is to provide an RF-ID inspection system that prevents erroneous inspection by reliably specifying a target inspection piece to prevent outflow of defective products. To do.
[0006]
[Means for Solving the Problems]
In order to solve the above-described problem, in the invention of claim 1, a plurality of RF-IDs including an IC module and an antenna to be inspected are formed on the same surface, and a test piece for one RF-ID is used. RF-ID inspection system that performs communication and inspects pass / fail, and is interposed between a system-side antenna for performing communication, the system-side antenna, and the test piece, and is intended for the system-side antenna An opening is formed to face the test piece. In the peripheral portion, the distance from the test piece not to be inspected in the vicinity of the end portion is made larger than the surface on which the opening is formed. In order to communicate the shield member, the system-side antenna with the target test piece, a drive unit that moves the system-side antenna and the shield member, and a predetermined part of the test piece via the system-side antenna. A processing unit that transmits information and performs pass / fail determination of the test piece according to a response from the test piece.
[0007]
In the inventions of claims 2 and 3, " Electrically ground the shield member ”Configuration,
" A probe for measuring the electric field strength at the time of response from the test piece is provided in the vicinity of the system side antenna, and in the processing unit, a set electric field strength corresponding to the distance between the system side antenna and the test piece is stored in advance. The measured value of the electric field strength obtained by the probe is compared with the set electric field strength to determine whether or not the communicable distance is acceptable for determining whether or not the test piece to be inspected is acceptable. It is a configuration.
[0008]
In this way, between the test piece for one RF-ID and the system-side antenna for communication. An opening that allows the system-side antenna to face the target test piece is formed, and the distance from the test piece near the end that is not the test target is made larger than the surface on which the opening is formed. A shield member is interposed, the system side antenna is opposed to the target test piece from the opening formed in the shield member, and information is transmitted from the system side antenna to the test piece. Judge the quality. In other words, since the transmission information from the antenna on the system side is not received by the shield member by the RF-ID other than the target test piece, it is possible to make a pass / fail judgment for the response of only the target test piece. It becomes possible to specify the target test piece, prevent erroneous inspection, and prevent the outflow of defective products.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings. Here, the RF-ID according to the present invention is a medium capable of transmitting and receiving data such as identification information in a non-contact manner, such as a non-contact type IC card as well as a non-contact type label and tag.
[0010]
FIG. 1 shows an exploded configuration diagram of a basic configuration in an RF-ID inspection system according to the present invention. In FIG. 1, the RF-ID inspection system 11 is roughly divided into a sheet 12, a shield member 13, and a drive unit 15 on which the system-side antenna 14 is mounted. It is omitted. In the sheet 12, a plurality of RF-IDs 21 including an IC module 21A and an antenna 21B are regularly formed on the same surface on a film base, for example, and each RF-ID 21 becomes an inspection piece 21X to be inspected.
[0011]
There are various methods for manufacturing the sheet 12. For example, a copper foil is bonded to polyethylene terephthalate (PET) with an epoxy adhesive, and each antenna 21B wound in a coil shape is formed by etching. The IC modules 21A are connected to each other by reflow soldering, and then are brought into a sheet state or a roll state, and are conveyed in the longitudinal direction above the driving device 15 by a conveying means (not shown). These RF-IDs 21 are each formed as a single unit after the inspection and are mounted on a card, for example, as a non-contact type IC card or the like.
[0012]
The shield member 13 is formed in a plate shape or a net shape from a conductive material such as metal or conductive resin, and is interposed between the system antenna 14 and the test piece 21X. The shield member 13 is formed with an opening 22 that causes the system-side antenna 14 to face the target test piece 21X, and the opening 22 forms a distance from the test piece 21X at a peripheral portion thereof. It is made larger than the surface to be done.
[0013]
Although not shown, the shield member 13 is integrally driven in the vertical direction and the width direction (horizontal direction) of the sheet 12 by a driving unit 15 on which the system-side antenna 14 is mounted. The And the said drive part 15 is arrange | positioned under the sheet | seat 12 and the said shield member 13, Y drive which mounts the system side antenna 14 and moves to the width direction of the said sheet | seat 12, Z drive to move up and down is performed.
[0014]
Here, FIG. 2 shows a side partial sectional view of FIG. FIG. 2A shows the positional relationship between the sheet 12 on which a predetermined number of RF-IDs 21 are formed, the shield member 13, and the system-side antenna 14 mounted on the driving unit 15. The shield member 13 is the sheet 12. The opening 22 is brought into contact with the back surface on which the RF-ID 21 is formed so as to correspond to the inspection piece 21X to be inspected.
[0015]
The system-side antenna 14 is located below the opening 22 and at a predetermined distance from the test piece 21X. Although the shield member 13 is shown in contact with the back surface of the sheet 12, the system side antenna 14 and the shield member 13 are moved together (up and down movement and horizontal movement). A gap may be generated between the sheet 12 and the sheet 12 by changing the distance between the side antenna 14 and the test piece 21X.
[0016]
Therefore, an example of the dimensional relationship in the above case will be described with reference to FIG. 2B. On the base material of the sheet 12 (for example, thickness 50 μm), for example, the antenna 21B (IC module 21A) is spaced at T1 (= 2 mm) intervals. For example, it is formed in the longitudinal direction R (= 60 mm) and the width direction 20 mm. For example, the opening 22 of the aluminum shield member 13 having a thickness of 5 mm has a length S (= 64 mm) that is slightly larger than the test piece 21X. And a depth of 24 mm. Here, the size of the opening 22 is set so as not to straddle the RF-ID 21 around the corresponding test piece 21X, and the interval T1 is set to 2 mm, so that each of the values is 4 mm larger than the size of the test piece 21X. It is said. The system-side antenna 14 is, for example, a size having a side A (= 60 mm) and a width of about 20 mm, and is positioned at a distance L (for example, 15 mm) below the test piece 21X.
[0017]
That is, the RF-ID 21 has a predetermined resonance frequency, and performs reception by resonating in response to radio waves from the system-side antenna 14. Therefore, when the shield member 13 exhibits a shielding function with respect to the RF-ID 21 around the inspection piece 21X to be inspected, these RF-IDs resonate due to changes in electrical characteristics (inductance L, capacitance C). Since the frequency changes, it does not react to the radio wave from the system antenna 14 and communication is impossible. Therefore, since only the test piece 21X reacts to the radio wave from the system-side antenna 14, the target test piece can be reliably identified.
[0018]
In this way, since the target test piece can be identified reliably, erroneous inspection is prevented and the outflow of defective products is prevented. In addition, all RF-IDs 21 can be inspected at the stage of the sheet 12 on the production line before the RF-ID 21 alone, enabling the early detection and correction of the occurrence of defects, and high-accuracy quality control by 100% inspection. Is something that can be done.
[0019]
If the shield member 13 has a laminated structure, the shielding effect can be improved. In other words, the layered structure creates a boundary surface between each layer, and the radio waves transmitted through the previous layer at each boundary surface are repeatedly reflected and absorbed by the next layer, thereby improving the seal and effect. It is something that can be done. Furthermore, the radio wave absorptivity can be improved by interposing a radio wave absorbing member between the predetermined layers of the laminated structure.
[0020]
By the way, since the radio wave absorbed by the shield member 13 propagates through the shield and is emitted from the end portion of the shield member 13, the RF-ID 21 in the vicinity of the end portion may react. In some cases, communication is also performed with an RF-ID other than the test piece 21X. Therefore, as shown in the figure, the peripheral portion of the shield member 13 is shaped so that the distance from the test piece 21X is larger than the surface on which the opening 22 is formed, so that radio waves do not reach other RF-IDs 21. On the other hand, as a method for preventing radio waves from reaching other RF-IDs 21, there is a method in which the shield member 13 is electrically grounded.
[0021]
FIG. 3 shows an explanatory diagram when the shield member according to the present invention is electrically grounded. FIG. 3 (A) shows a case where the shield member 13A has a planar shape and is electrically grounded. That is, even if the radio wave absorbed by the shield member 13 propagates through the shield due to electrical grounding, it is not emitted from the end portion, and the RF-ID 21 in the vicinity of the end portion does not react. FIG. 3B shows the shield member 13 having a peripheral portion shape as shown in FIGS. 1 and 2, and further electrically grounded. That is, this is to prevent the RF-ID 21 other than the test piece 21 </ b> X from reacting depending on the output level of the system-side antenna 14 and the arc size of the peripheral portion of the shield member 13.
[0022]
In this way, by electrically grounding the shield member 13 according to its shape and radio wave intensity, the target test piece can be specified more reliably, and erroneous inspection is prevented, thereby preventing the outflow of defective products. It is.
[0023]
In the above embodiment, the case where the shield member 13 and the system-side antenna 14 are disposed below the sheet 12 has been described. However, the shield member 13 and the system-side antenna 14 are disposed above the sheet 12, that is, on the surface side where the RF-ID 21 is formed. Also good.
[0024]
Next, FIG. 4 shows a block configuration diagram of the inspection system according to the present invention, and FIG. 5 shows a block configuration diagram of an example of the inspection processing unit of FIG. In FIG. 4, the RF-ID inspection system 11 </ b> A according to the first embodiment of the present invention includes a drive structure unit 31 and an inspection processing unit 32 for the inspection piece 21 </ b> X to be inspected in each RF-ID 21 of the sheet 12. Composed.
[0025]
The test piece 21X includes an IC module 21A including a processing unit 41, a memory 42, and a demodulation unit 43, and an antenna 21B. The antenna 21B is wound in a coil shape on a plane as described above, receives a signal from the inspection system 11A, or transmits data from the inspection piece 21X to the inspection system 11A (system-side antenna 14). To play a role.
[0026]
In the IC module 21A, the memory 42 is for storing various information as the card. The demodulator 43 demodulates the control signal and data from the radio wave received by the antenna 21B, and appropriately converts the code. And the process part 41 performs the process which memorize | stores the received control signal and data in the memory 42 with a program, and transmits the data memorize | stored in the memory.
[0027]
The drive structure means 31 includes a conveyance drive unit 51 and an antenna drive unit 52, and is equipped with a system-side antenna 14 that communicates with the test piece 21X. The conveyance drive unit 51 is used to convey and move the inspection piece 21X to the inspection position when the inspection piece 21X is in the sheet 12 state in which a predetermined number of inspection pieces 21X are formed on the film base in the manufacturing stage. is there. The antenna drive unit 52 moves the system side antenna 14 up and down in the direction of the test piece 21X as described above, and moves the Y between the test pieces 21X in the width direction of the sheet 12. The antenna driving unit 52 moves the shield member 13 (13A) and the system-side antenna 14.
[0028]
The inspection processing unit 32 includes a control unit 61, an inspection processing unit 62, and a data memory 63 as a processing unit that performs pass / fail determination of the test piece 21X, and includes a power amplification unit 64, a modulation unit 65, and a transmission unit 66. , A detection unit 67, a data conversion unit 68, a transport drive control unit 69, an antenna drive control unit 70, an interface (IF) unit 71, and a display means 72.
[0029]
The control unit 61 performs overall control of the entire inspection processing means 32, and a program corresponding to this is set. Although the details will be described with reference to FIG. 5, the inspection processing unit 62 performs inspection processing and determination on the reference piece 21 </ b> X by an inspection routine by a program. The data memory 63 stores various data and also serves as a temporary storage area (a buffer that may be provided in the inspection processing unit 62) for appropriate inspection determination. Examples of the various data include information (for example, identification information) to be stored in the memory 42 for each inspection piece 21X, various setting values for inspection, and the like.
[0030]
The data conversion unit 68 converts information when information is transmitted to the test piece 21X into, for example, “1” and “0”, and transmission data from the test piece 21X includes, for example, “1” and “0”. To "". The modulation unit 65 modulates the information converted by the data conversion unit 68 based on the transmission output from the transmission unit 66 into, for example, an FSK (frequency shift keying) modulated wave. The power amplifying unit 64 amplifies the power of the modulated wave modulated by the modulating unit 65, and the amplified modulated wave is transmitted from the system-side antenna 14. And the detection part 67 detects and demodulates the transmission radio wave from the test piece 21X received with the system side antenna 14. FIG.
[0031]
On the other hand, the transport drive control unit 69 generates a control signal for driving the transport drive unit 51 that transports the test pieces 21X in order to sequentially inspect the test pieces 21X based on a command from the control unit 61 to generate the IF unit 71. To the conveyance drive unit 51. Further, the antenna drive control unit 70 moves the shield member 13 (13A) and the system-side antenna 14 in the vertical direction with respect to the test piece 21X, and outputs a signal for controlling the distance (communication distance) with the target antenna 21B. It is generated based on a command from the control unit 61 and sent to the antenna drive unit 52 via the IF unit 71.
[0032]
Here, in FIG. 5, the inspection processing unit 62 includes a processing unit 81, a reception data acquisition unit 82, a transmission data acquisition unit 83, and a determination unit 84 as functions of program processing. The processing means 81 controls the entire processing of the inspection processing unit 62. The reception data acquisition means 82 is acquired when data transmitted from the test piece 21X is received, and is appropriately stored in the data memory 63 (if the reception data acquisition means 82 includes a buffer, the May be temporarily stored).
[0033]
The transmission data acquisition means 83 reads and acquires identification information or the like to be written in the memory 42 by communication with the test piece 21X from the data memory 63. Then, the determination unit 84 compares the acquired and transmitted transmission data with the reception data transmitted from the test piece 21X, and determines that it is a non-defective product if they match, and determines that it is a defective product if they do not match. Therefore, whether the transmission data is actually written in the memory 42 of the test piece 21X is regarded as the quality of the communication state by the data comparison.
[0034]
Next, FIG. 6 shows a flowchart of the inspection process in the inspection system of FIGS. In FIG. 6, first, the conveyance drive control unit 69 sends the conveyance amount for conveying a predetermined row in the width direction of the inspection target on the sheet 12 to the inspection position by the conveyance drive control unit 69 via the IF unit 71 according to a command from the control unit 61. Output (step (S) 1). Further, in the antenna drive control unit 70, a drive amount (Y) for positioning the shield member 13 (13 </ b> A) and the system-side antenna 14 downward with respect to the target test piece 21 </ b> X in the row of the test position according to a command from the control unit 61. Is the Y direction drive amount of the antenna drive unit 52, and the system side antenna 14 is a drive amount (Z) that is predetermined with respect to the test piece 21X (antenna 21B) and stored in the data memory 63 (L). ) As a Z-direction drive amount (S2).
[0035]
Therefore, the transmission data (identification information) for the test piece is acquired from the data memory 63 and transmitted to the test piece 21X (S3), the reply data from the test piece 21X is received, and the determination means 84 as described above. Performs matching between the transmission data and the reception data (S4). In the matching result (S5), when they match, it is determined as a non-defective product (S6), and when they do not match, it is determined as a defective product (S7), and these determination results are stored in the data memory 63 (S8).
[0036]
Subsequently, when the next test piece 21X is measured in the same row, the determination results are stored in the data memory 63 by repeating S2 to S8 for all the test pieces 21X in the same row (S9). . If there is an inspection piece 21X in the next row, S1 to S9 are repeated to determine whether or not all the inspection pieces 21X in all rows are good and stored in the data memory 63 (S10). Then, when the quality of all the test pieces 21X in the sheet 12 is stored in the data memory 63, the test result is appropriately displayed on the display unit 72 (S11). The display of the inspection result may be performed for each inspection piece 21X or for each inspection result of a predetermined number of inspection pieces 21X.
[0037]
In this way, when performing inspection by sending and receiving data to each RF-ID (inspection piece 21X) in the sheet 12 stage, the transmission information from the system-side antenna 14 is obtained by the shield member 13 (13A). Since the RF-ID other than 21X is not received, it is possible to make a pass / fail judgment on the response of only the target test piece 21X, so that the target test piece 21X can be reliably identified, and erroneous inspection is prevented. Thus, it is possible to prevent the outflow of defective products. Further, as described above, it is possible to inspect all the RF-IDs (inspection pieces 21) at the stage of the sheet 12 on the production line before the RF-ID (inspection piece 21) is a single unit, and early occurrence of defects. Discovery and correction are possible, and high-precision quality control can be performed by 100% inspection.
[0038]
Next, FIG. 7 shows a block configuration diagram of another inspection system according to the present invention, and FIG. 8 shows a block configuration diagram of an example of the inspection processing unit of FIG. The RF-ID inspection system 11B as the second form shown in FIG. 7 is provided with a probe 91 for measuring electric field strength as radio wave strength in the vicinity of the antenna 14 of the drive structure means 31 in the inspection system 11A shown in FIG. However, the other configuration is the same as that of FIG. The configuration of the inspection processing unit 62 will be described with reference to FIG.
[0039]
The probe 91 detects the electric field intensity at the time of transmission data output from the test piece 21X, and the detected value is converted into data “1” and “0” by the data converter 68 and stored in the data memory 63. The Note that the probe 91 is driven and moved by a distance determined in advance with respect to the test piece 21X and stored in the data memory 63 in the same manner as the system-side antenna 14, and a measured value of the electric field strength is determined in advance. Whether the test piece 21X is good or bad is determined based on the set electric field strength stored in the data memory 63 as a reference to determine whether the distance is a communicable distance.
[0040]
Further, the inspection processing unit 42 shown in FIG. 8 includes electric field strength data acquisition means 92 in the inspection processing unit 42 shown in FIG. The electric field strength data acquisition unit 92 acquires electric field strength data set as a reference from the data memory 63. Further, the determination means 84 generates a reference electric field strength stored in the data memory 63 described in FIG. 9 or a stepwise electric field strength described in FIG. 10 based on the electric field strength measured through the probe 91. The quality of the test piece 21X is determined by comparison with the corresponding communication distance.
[0041]
FIG. 9 shows a flowchart of the inspection process in the inspection system of FIGS. In FIG. 9, first, the conveyance drive control unit 69 sends the conveyance amount for conveying a predetermined row in the width direction of the inspection target in the sheet 12 to the inspection position by the conveyance drive control unit 69 via the IF unit 71 according to a command from the control unit 68. Output (S21). Further, in the antenna drive control unit 70, a drive amount (Y) for positioning the shield member 13 (13 </ b> A) and the system-side antenna 14 downward with respect to the target test piece 21 </ b> X in the row of the test position according to a command from the control unit 61. Is the Y direction drive amount of the antenna drive unit 52, and the system side antenna 14 is a drive amount (Z) that is predetermined with respect to the test piece 21X (antenna 21B) and stored in the data memory 63 (L). ) As a Z-direction drive amount (S22).
[0042]
Therefore, the transmission data (identification information) for the test piece is acquired from the data memory 63 and transmitted to the test piece 21X (S23), and when the reply data from the test piece 21X is received, the electric field is transmitted via the probe 91. The intensity is measured (S24). Then, the electric field strength data acquisition unit 92 acquires the reference electric field strength setting value from the data memory 63, and the determination unit 84 collates the setting value of the reference electric field strength data with the measured electric field strength. It is determined whether or not the value is greater than or equal to (S25). As a result of the determination, when the measured value of the electric field strength is equal to or greater than the set value, it is determined as a non-defective product (S26), and when it is less than the set value, it is determined as a defective product (S27), and these determination results are stored in the data memory 63 ( S28).
[0043]
Subsequently, when there is a measurement of the next test piece 21X in the same row, S2 to S8 are repeated for all the test pieces 21X in the same row and the determination result is stored in the data memory 63 (S9). . If there is an inspection piece 21X in the next row, S1 to S9 are repeated to determine pass / fail for all the inspection pieces 21X in all rows and store them in the data memory 63 (S10). Then, when the quality of all the test pieces 21X in the sheet 12 is stored in the data memory 63, the test result is appropriately displayed on the display unit 72 (S11). The display of the inspection result may be performed for each inspection piece 21X or for each inspection result of a predetermined number of inspection pieces 21X.
[0044]
Even with such a configuration of the RF-ID inspection system 11B, the shield member 13 (13A) can reliably identify the target inspection piece 21X as described above, preventing erroneous inspection and causing defective products. It is possible to prevent outflow, enable early detection and correction of occurrence of defects, and perform high-accuracy quality control by 100% inspection.
[0045]
Next, FIG. 10 shows a flowchart of another inspection process in the inspection system of FIGS. Here, the electric field strength from the test piece 21X is measured stepwise according to the distance, and the quality is determined by the distance at the set electric field strength. The data of the stepwise distance and the set electric field strength are data in advance. This is stored in the memory 63.
[0046]
In FIG. 10, first, the conveyance drive control unit 69 sends the conveyance amount for conveying a predetermined row in the width direction of the inspection target in the sheet 12 to the inspection position by the conveyance drive control unit 69 via the IF unit 71 according to a command from the control unit 68. Output (S41). Further, in the antenna drive control unit 70, a drive amount (Y) for positioning the shield member 13 (13 </ b> A) and the system-side antenna 14 downward with respect to the target test piece 21 </ b> X in the row of the test position according to a command from the control unit 61. Is the Y-direction drive amount of the antenna drive unit 52, and the first distance (L () of the distances that are determined in advance and stored in the data memory 63 for the system-side antenna 14 with respect to the test piece 21X (antenna 21B). 1)) is output as the Z-direction drive amount (S42).
[0047]
Therefore, the transmission data (identification information) for the test piece is acquired from the data memory 63 and transmitted to the test piece 21X (S43), and when the return data from the test piece 21X is received, the electric field is transmitted via the probe 91. The intensity is measured (S44). Then, the electric field strength data acquisition unit 92 acquires the reference electric field strength setting value from the data memory 63, and the determination unit 84 collates the setting value of the reference electric field strength data with the measured electric field strength. It is determined whether or not the value is greater than or equal to (S45). As a result of the determination, if the measured value of the electric field strength is smaller than the set electric field strength, the next distance (L (x)) between the system antenna 14 (probe 91) and the test piece 21X (antenna 21B) is determined. The data is read from the data memory 63, and the drive amount (Z (x)) corresponding to this is output to the Z-direction drive mechanism 85 (S46).
[0048]
Subsequently, as described above, transmission data (identification information) for individual test pieces is acquired from the data memory 63 and transmitted to the test piece 21X (S47), and when reply data from the test piece 21X is received, The electric field strength is measured by the probe 91 (S48). Then, the determination means 84 compares the electric field intensity stored in the data memory 63 with the measured electric field intensity (S49). If the electric field intensity is smaller than the reference electric field intensity, all the set distances are used. If S46 to S49 are repeated and the electric field strength measured at all the set distances is smaller than the reference, the test piece 21X is determined to be defective as described later (S50).
[0049]
On the other hand, in S45 and S49, if the measured electric field strength is larger than the reference, the communication distance (L (x)) at that time is set in the data memory 63 and it is determined whether or not it is larger than the reference distance. (S51). If the communication distance (L (x)) is greater than the reference, the test piece 21X is determined to be a non-defective product (S52), and if the communication distance (L (x)) is small, it is determined to be a defective product (S53). Is stored in the data memory 63 (S54).
[0050]
Subsequently, when the next test piece 21X is measured in the same row, S42 to S53 are repeated for all the test pieces 21X in the same row, and the determination result is stored in the data memory 63 (S54). . If there is an inspection piece 21X in the next row, S41 to S55 are repeated to determine whether or not all the inspection pieces 21X in all rows are good and stored in the data memory 63 (S56). Then, when the quality of all the test pieces 21X in the sheet 12 is stored in the data memory 63, the test result is appropriately displayed on the display unit 72 (S57). Similarly to the above, the display of the inspection result may be performed for each inspection piece 21X or for each inspection result of a predetermined number of inspection pieces 21X.
[0051]
With such a configuration of the RF-ID inspection system 11B, the target inspection piece 21X can be reliably identified in the same manner as described above by the shield member 13 (13A) by measuring the electric field strength stepwise according to the distance. Therefore, erroneous inspection can be prevented and leakage of defective products can be prevented, occurrence of defects can be detected and corrected at an early stage, and high-precision quality control can be performed by 100% inspection.
[0052]
【The invention's effect】
As described above, according to the present invention, between the test piece for one RF-ID and the system-side antenna for communication. An opening that allows the system-side antenna to face the target test piece is formed, and the distance from the test piece near the end that is not the test target is made larger than the surface on which the opening is formed. A shield member is interposed, the system side antenna is opposed to the target test piece from the opening formed in the shield member, and information is transmitted from the system side antenna to the test piece. By determining pass / fail, it is possible to reliably identify the target test piece, prevent erroneous inspection, and prevent the outflow of defective products.
[Brief description of the drawings]
FIG. 1 is an exploded configuration diagram of a basic configuration in an RF-ID inspection system according to the present invention.
FIG. 2 is a partial cross-sectional view of the side portion of FIG.
FIG. 3 is an explanatory diagram when the shield member according to the present invention is electrically grounded.
FIG. 4 is a block diagram of an inspection system according to the present invention.
5 is a block configuration diagram of an example of an inspection processing unit in FIG. 4;
6 is a flowchart of an inspection process in the inspection system of FIGS. 4 and 5. FIG.
FIG. 7 is a block diagram of another inspection system according to the present invention.
8 is a block configuration diagram of an example of an inspection processing unit in FIG. 7;
9 is a flowchart of an inspection process in the inspection system of FIGS. 7 and 8. FIG.
10 is a flowchart of another inspection process in the inspection system of FIGS. 7 and 8. FIG.
[Explanation of symbols]
11 RF-ID inspection system
12 sheets
13 Shield member
14 System antenna
15 Drive unit
21 RF-ID
21A IC module
21B antenna
22 opening
31 Drive structure means
32 Inspection processing means
61 Control unit
62 Inspection processing section
84 judgment means

Claims (3)

  1. An RF-ID inspection system in which a plurality of RF-IDs including IC modules and antennas to be inspected are formed on the same surface, communicate with an inspection piece targeted for one RF-ID, and inspect the quality. Because
    A system-side antenna for communication;
    A test piece that is interposed between the system antenna and the test piece, and that has an opening that opposes the system antenna to the target test piece. A shield member having a distance from the surface larger than the surface on which the opening is formed ,
    A drive unit that moves the system-side antenna and the shield member in order to cause the system-side antenna to communicate with the target test piece;
    A processing unit that transmits predetermined information to the test piece via the system-side antenna, and performs pass / fail determination of the test piece according to a response from the test piece;
    An inspection system for RF-ID, comprising:
  2. An inspection system for RF-ID according to claim 1 Symbol mounting test system of RF-ID for causing electrically grounding the shield member.
  3. The RF-ID inspection system according to claim 1 or 2,
    A probe for measuring the electric field strength at the time of response from the test piece is provided in the vicinity of the system-side antenna,
    In the processing unit, a set electric field strength corresponding to a distance between the system-side antenna and the test piece is stored in advance, and is a communicable distance by comparing the measured electric field strength value by the probe with the set electric field strength? An RF-ID inspection system, which is used to determine whether a test piece to be inspected is acceptable or not .
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