JP5410534B2 - 位相シフトを入力波形に対して付与する装置 - Google Patents

位相シフトを入力波形に対して付与する装置 Download PDF

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Publication number
JP5410534B2
JP5410534B2 JP2011532209A JP2011532209A JP5410534B2 JP 5410534 B2 JP5410534 B2 JP 5410534B2 JP 2011532209 A JP2011532209 A JP 2011532209A JP 2011532209 A JP2011532209 A JP 2011532209A JP 5410534 B2 JP5410534 B2 JP 5410534B2
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Japan
Prior art keywords
dispersion
output
waveform
optical
input
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Japanese (ja)
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JP2012506072A (ja
JP2012506072A5 (enExample
Inventor
フォスター，マーク
ガエタ，アレキサンダー
ジェラウティ，デービッド
リプソン，マイケル
サレム，レザ
ターナー，エイミー
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Cornell University
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Cornell University
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06E—OPTICAL COMPUTING DEVICES
    • G06E3/00—Devices not provided for in group G06E1/00, e.g. for processing analogue or hybrid data
    • G06E3/001—Analogue devices in which mathematical operations are carried out with the aid of optical or electro-optical elements
    • G06E3/003—Analogue devices in which mathematical operations are carried out with the aid of optical or electro-optical elements forming integrals of products, e.g. Fourier integrals, Laplace integrals, correlation integrals; for analysis or synthesis of functions using orthogonal functions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0226—Fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46—Systems using spatial filters

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2011532209A 2008-10-14 2009-10-14 位相シフトを入力波形に対して付与する装置 Expired - Fee Related JP5410534B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10521708P 2008-10-14 2008-10-14
US61/105,217 2008-10-14
PCT/US2009/060656 WO2010045339A2 (en) 2008-10-14 2009-10-14 Apparatus for imparting phase shift to input waveform

Publications (3)

Publication Number Publication Date
JP2012506072A JP2012506072A (ja) 2012-03-08
JP2012506072A5 JP2012506072A5 (enExample) 2012-11-29
JP5410534B2 true JP5410534B2 (ja) 2014-02-05

Family

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Family Applications (1)

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JP2011532209A Expired - Fee Related JP5410534B2 (ja) 2008-10-14 2009-10-14 位相シフトを入力波形に対して付与する装置

Country Status (4)

Country Link
US (1) US9323284B2 (enExample)
EP (1) EP2344923A4 (enExample)
JP (1) JP5410534B2 (enExample)
WO (1) WO2010045339A2 (enExample)

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KR102021874B1 (ko) 2011-04-06 2019-11-04 클라인 메디칼 리미티드 분광 분석기
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DE102012104193B4 (de) 2012-05-14 2020-03-05 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Zeitlinsenaufbau mit variabler Vergrößerung und dessen Verwendung
US10209445B2 (en) * 2012-07-30 2019-02-19 Hewlett Packard Enterprise Development Lp Method of fabricating a compact photonics platform
US10094988B2 (en) * 2012-08-31 2018-10-09 Micron Technology, Inc. Method of forming photonics structures
GB201304491D0 (en) * 2013-03-13 2013-04-24 Shimadzu Corp A method of processing image charge/current signals
CN111352144B (zh) * 2020-03-27 2024-08-02 中国科学院西安光学精密机械研究所 一种x射线超快检测装置及方法
JP7760122B2 (ja) * 2021-12-20 2025-10-27 国立大学法人横浜国立大学 テラヘルツ波形検出装置、テラヘルツ波形の検出方法

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Also Published As

Publication number Publication date
JP2012506072A (ja) 2012-03-08
EP2344923A2 (en) 2011-07-20
US20120095711A1 (en) 2012-04-19
WO2010045339A3 (en) 2010-08-12
EP2344923A4 (en) 2017-05-03
US9323284B2 (en) 2016-04-26
WO2010045339A2 (en) 2010-04-22

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