JP5403640B2 - Inspection device and inspection method for capacitive touch screen panel using LC resonance frequency shift - Google Patents

Description

  The present invention relates to an inspection apparatus and an inspection method for determining whether or not a capacitance type touch screen panel (hereinafter referred to as “CTSP”) is defective, and more particularly to a CTSP non-defective product. By accurately measuring the difference in capacitance between the ITO touch sensor electrodes existing between the CTSP and the defective CTSP using the LC resonance frequency shift difference measurement technique, the CTSP ITO electrode pattern can be obtained without a dedicated CTSP controller chip. The present invention relates to an inspection apparatus and an inspection method that can accurately determine a defect regardless of whether or not.

  Generally, a touch screen panel that is attached on a display screen such as a mobile phone or a kiosk and is used for inputting various buttons or information by hand touch is divided into a resistive film type and a capacitive type. Among these, the capacitive touch screen panel “CTSP” is generally constructed as shown in FIG. Lowermost lower grounding film 110, a sensor electrode film 120 on which a transparent ITO electrode pattern serving as a touch sensor is formed, and a dielectric film adhered on the ITO electrode with an adhesive 130 and the uppermost protective film 140. The pattern of the ITO electrode 150 pattern as a touch sensor electrode for each manufacturing company varies depending on its performance and the driving method of the dedicated controller chip, but the overall basic structure is as described above, especially between the ITO sensor electrodes. The method of maintaining the capacitance is common to all companies. That is, as shown in FIG. 2, all CTSPs have a series-parallel connection configuration such as a capacitor 210 existing between ITO electrodes in an equivalent circuit and a capacitor 220 generated by lower ground.

  When the FPC 320 with the built-in dedicated controller chip 310 shown in FIG. 3 is attached to the CTSP having the structure as described above, it becomes a touch screen module and is used for position measurement where a human hand is touched on the CTSP. Operation is possible.

  The operation principle of CTSP is as follows. When a human hand comes into contact with CTSP, the capacitance between the ITO electrodes at the contacted portion is different from the initial value. The change of this value is measured from the phase delay change of the electrical signal pulse applied to the ITO electrode in the dedicated controller chip 310, and analyzed by the algorithm built in the chip 310, thereby checking the position information where the hand touches the CTSP. It is a method. Therefore, the role of the dedicated controller chip is functionally very important in the operation of the touch screen module. If the design of the CTSP ITO electrode pattern changes, the capacitance between the electrodes changes according to the changed form, and a new dedicated controller chip designed and programmed accordingly must be used.

  Each CTSP manufacturing company must have a production stage until it reaches the state of the touch screen module, but the existing electrical property quality inspection is performed using a dedicated controller chip in the CTSP or touch screen module state. . Therefore, every time the CTSP model changes and the CTSP ITO electrode pattern changes, there is an inconvenience that an inspection apparatus on which another dedicated controller chip is mounted must be used each time. In addition, the capacitance between the ITO sensor electrodes that affects the electrical characteristics of CTSP cannot be confirmed by a method using an existing dedicated controller chip. In addition, since a dedicated chip discriminates a failure by a signal pulse phase delay time measurement technique, it is vulnerable to changes in external environmental conditions such as an electromagnetic interface (EMI), and there is a problem that measurement accuracy is inferior.

  The present invention has been devised in view of the above-mentioned problems, and its purpose is to accurately inspect the electrical characteristics of CTSP without using a CTSP dedicated controller chip and irrespective of the form of the ITO electrode pattern of CTSP. It is another object of the present invention to provide an inspection apparatus and an inspection method for a capacitive touch screen panel using LC resonance frequency shift, which can discriminate defective products.

  In order to achieve the above object, the present invention provides an LC resonance unit including an LC resonance circuit that causes electrical resonance by coupling with the capacitance between the ITO sensor electrodes of CTSP, and the LC resonance unit connected to the LC resonance unit. An OP amplifier driving unit that oscillates the LC resonance circuit of the resonance unit and converts the waveform of the resonance frequency into a rectangular wave, and the LC resonance circuit connected to the LC resonance unit and the ITO sensor electrode of the CTSP are connected in parallel as a pair. And a microcomputer unit that is connected to the OP amplifier drive unit and drives the relay unit, counts the rectangular wave output from the OP amplifier drive unit, measures the frequency, and determines whether CTSP is defective or not And a capacitive touch screen panel inspection device using LC resonance frequency shift.

  Here, the microcomputer unit measures the LC resonance frequency shift that is generated only by the value obtained by adding the capacitance between the ITO electrodes to the C value of the LC resonance circuit, and divides this by the average value to normalize the calculated value. It is preferable to determine whether or not CTSP is defective depending on whether or not is included in the range of the resonance frequency shift of non-defective products.

  Further, the range of the resonance frequency shift of the non-defective product is preferably determined by dividing the LC resonance frequency shift by the average value and normalizing it, and determining whether or not it exists within the range of the non-defective product designated by the user.

In order to achieve the above object, the present invention relates to a capacitance type touch screen panel (CTSP) inspection method using LC resonance frequency shift, which is electrically coupled with capacitance between ITO sensor electrodes of CTSP. LC resonance circuit causing resonance, reference using oscillation of pure LC using OP amplifier drive unit, relay unit and microcomputer unit that oscillates the LC resonance circuit and converts to rectangular wave so that the microcomputer unit can count the frequency at the same time In order to obtain the resonance frequency, the microcomputer unit measures the reference resonance frequency of only the LC resonance circuit without connecting the CTSP and the LC resonance circuit, and the microcomputer unit measures the LC resonance frequency value by the frequency count and stores the value. and one step, the relay unit that operates by a signal of the microcomputer unit is an ITO sensor electrode CTSP, LC resonance By sequentially changing the pair of ITO sensor electrodes for connecting the road, performs a parallel connection with the LC resonant circuit, this time, the resonance frequency shift value capacitance between ITO electrodes is generated applied to the C value of the LC resonant circuit The second stage of measuring and storing the microcomputer part, and the distribution of resonance frequency shifts of a plurality of non-defective CTSPs measured by the microcomputer part by repeating the second stage, and the good part based on the obtained distribution The third step of setting the range and storing it in the memory of the microcomputer unit, and the microcomputer unit calculates the resonance frequency shift value stored for the ITO sensor electrode pair by normalization and stores it in the microcomputer unit And a fourth stage for determining whether the product is within the resonance frequency shift range of the non-defective product as compared with the resonance frequency shift value of the non-defective product. It provides a test method for capacitive touch screen panel with a resonant frequency shift.

  Here, in the fourth step, the LC resonance frequency shift generated by the value obtained by adding the capacitance between the ITO electrodes to the C value of the LC resonance circuit is measured, and this is normalized by dividing this by the average value. It is preferable to determine whether or not CTSP is defective depending on whether or not the value falls within the range of the resonance frequency shift of a good product.

  In addition, the range of the resonance frequency shift of the non-defective product is preferably determined by dividing the LC resonance frequency shift by the average value and normalizing it, and whether or not it exists within the range of the non-defective product designated by the user.

  According to the inspection apparatus and the inspection method for the capacitive touch screen panel using the LC resonance frequency shift according to the present invention, the following effects can be obtained.

Since the presence or absence of an abnormality in the capacitance value between the CTSP's ITO electrodes is measured at the LC resonance frequency, the presence / absence of a CTSP defect is determined regardless of the type of the CTSP, regardless of the type of CTSP, even without a CTSP dedicated controller chip. be able to.
In addition, since an inspection circuit using the electrical resonance phenomenon is used, the inherent stability of the resonance phenomenon makes it resistant to electrical shocks such as electrostatic shock and external EMI, and causes external environmental change factors such as mechanical vibration and temperature / humidity changes. Very insensitive. Also in the measurement, the measurement accuracy of 1/1000 or more can be maintained by measuring not the voltage or the current but counting the frequency with a counter.

  Further, since the actual capacitance value between the ITO electrodes of CTSP can be obtained by the relational expression between the constant of the LC resonance circuit and the resonance frequency, it can be easily used for failure analysis.

The above and other objects, features and advantages of the present invention will be more clearly understood from the following description with reference to the accompanying drawings.
FIG. 1 is a structural diagram of each general CTSP layer. FIG. 2 is a diagram showing an equivalent circuit of a general CTSP ITO electrode. FIG. 3 is a view illustrating a general completed touch screen module structure. FIG. 4 is a circuit diagram of a CTSP inspection apparatus using LC resonance according to an embodiment of the present invention. FIG. 5 is a graph showing the resonance frequency shift of each channel of the non-defective CTSP according to one embodiment of the present invention. FIG. 6 is a graph showing normalization of the results of FIG. FIG. 7 is a graph showing an example (1) of defect determination. FIG. 8 is a graph showing an example (2) of defect determination. FIG. 9 is a graph showing actual capacitance measurement results between the ITO terminals of CTSP.

  Hereinafter, an inspection apparatus and an inspection method for a capacitive touch screen panel using LC resonance frequency shift according to embodiments of the present invention will be described in detail with reference to the accompanying drawings.

  For the purposes of this specification, like reference numbers in the figures refer to like parts unless otherwise indicated.

  Next, a CTSP inspection method according to the present invention will be described in detail with reference to the accompanying drawings.

  First, FIG. 4 shows a circuit of a CTSP inspection apparatus using LC resonance to which the inspection method of the present invention is applied. As shown in FIG. 4, the inspection circuit basically includes an LC resonance unit 410, an OP amplifier driving unit 420, a relay unit 430, and a microcomputer unit 440.

  In general, the LC resonance unit 410 has a very small value of several tens of pF in capacitance between the ITO electrodes of CTSP. Therefore, the LC resonance unit 410 has a reference capacitor of less than 100 pF and an inductance value of several hundred μH so as to be suitable for the measurement. By configuring the LC resonance circuit with coils, the reference resonance frequency is set to a value in the range of 600 kHz to 800 kHz.

  The OP amplifier driver 420 oscillates the LC resonance circuit and functions to facilitate the frequency counting of the microcomputer unit 440 by transforming the waveform of the resonance frequency from a sine wave to a rectangular wave.

  The relay unit 430 is a device for sequentially connecting the LC resonance circuit and the CTSP ITO sensor electrode as a pair in parallel. The relay unit 430 receives a signal from the microcomputer unit 440 and operates.

  The microcomputer unit 440 drives the relay unit 430, counts the resonance frequency pulse signal (rectangular wave) output from the OP amplifier drive unit 420, measures the frequency, and determines whether the capacitance is converted and CTSP is defective. Do the calculation function to do. In the inspection apparatus according to the present invention, no noise is generated on the circuit of the OP amplifier driving unit 420 that converts the analog signal generated in the LC resonance circuit of the LC resonance unit 410 by the digital pulse counter. When measuring, the accuracy is very high with an error range of 0.1%. Next, the process of measuring the capacitance between the ITO sensor electrodes that govern the electrical characteristics of CTSP using the above-described inspection circuit of FIG. 4 by the resonance frequency shift will be described.

  First, when all the relay units 430 are disconnected and the CTSP ITO sensor electrode is not connected to the LC resonance circuit, that is, the reference resonance frequency due to pure LC oscillation of the resonance circuit is measured by the microcomputer unit 440.

  After that, the relay 430 is driven by the operation signal of the microcomputer unit 440, and the CTSP ITO sensor electrodes are adjacent to each other on the touch surface, and the electrode terminals are vertically symmetrical pairs, that is, for example, 10 ITO electrodes exist. In this case, the capacitance between the ITO electrodes is added to the C value of the LC resonance circuit when the LC resonance circuit is connected to the LC resonance circuit in the order of No. 1 and No. 10, and then No. 2 and No. 9. However, when the resonance frequency shift value is measured using the microcomputer unit 440, the capacitance value between the ITO electrodes of the CTSP is converted into a one-to-one ratio according to the degree of the resonance frequency shift and measured. be able to. Since such a measurement method is not related to the pattern form of the CTSP ITO sensor electrode, it is a general-purpose method that can always be applied regardless of the type of CTSP. In addition, since measurement is performed using a frequency counting method instead of a voltage or current value in measurement accuracy, precise measurement that is not related to electrical noise that always adversely affects measurement is possible.

  Structurally, since the measurement is performed using a PCB whose pitch matches the CTSP ITO electrode, unlike the probe using pins, the CTSP electrode is not damaged by the surface contact method, and the cell is measured by direct measurement. With low measurement impedance and low noise characteristics. Even if the type of CTSP changes, the inspection apparatus can be applied universally at low cost regardless of the type of all CTSPs by simply replacing and applying only the PCB.

  FIG. 5 is a graph showing the resonance frequency shift of each channel of the non-defective CTSP according to an embodiment of the present invention, FIG. 6 is a graph showing normalization of the result of FIG. 5 and setting of the non-defective range, and FIG. FIG. 8 is a graph showing an example (2) of defect determination, and FIG. 9 is a graph showing actual measurement results of capacitance between the ITO terminals of CTSP.

  Referring to FIGS. 5 to 9, an actual inspection process for performing the CTSP defect inspection will be described with an example. First, the reference resonance frequency of the CTSP inspection apparatus was measured by the microcomputer unit 440 and found to be 680 kHz. Next, the resonance frequency and average value of normal CTSP samples are obtained. FIG. 5 shows the actual result.

FIG. 5 is a graph showing 10 resonant samples shifted by the capacitance between symmetrical pairs of terminals using 10 normal CTSP samples for mobile phones having 32 terminals. In FIG. 5, the measured value 510 of channel 3 indicated by a dotted line is a value obtained when the 3rd terminal and the 30th terminal are connected to the inspection apparatus with 10 CTSP samples. The meanings of the remaining channels are also as described above. Next, normalization is performed by dividing the measured shift frequency by the average value. The results are shown in FIG. Referring to FIG. 6, since all the result data is within an error range within ± 1% indicated by the dotted line 610, this is set as a non-defective resonance frequency shift range and stored in the memory of the microcomputer. deep. In this way, the range of the frequency shift of the non-defective product is determined, and the microcomputer measures the resonance frequency shift between the specific channels at the time of CTSP inspection and calculates it by normalization, and compares it with the value of the pre-stored good product range. If this value is out of the non-defective range, it may be determined as defective. The following is an example of defect determination. 7 and 8 show the results of the CTSP sample determined as defective. In FIG. 7, it can be clearly seen that the two data displayed by the dotted line 710 and that in FIG. 8 a large number of data values greatly deviate from the non-defective range. FIG. 9 shows the measurement result of FIG. 7 converted by the actual capacitance of CTSP using Equation 1 which is a relational expression of the LC resonance circuit.

At this time, LC used for the inspection circuit was L = 1 mH and C _ref = 30 pF, respectively. That is, when the resonance frequency shift is measured, the actual capacitance can also be determined.

  As a result, all data is measured and stored for each channel, and it is possible to perform standard management of production by determining whether the measured value is good or bad from physical quantities such as frequency and capacitance.

  As described above, according to the inspection method and the inspection method for the capacitive touch screen panel using the LC resonance frequency shift according to the present invention, regardless of the type of the CTSP and the form of the ITO pattern using the LC resonance frequency shift. In addition, there is an effect that it is possible to determine the presence or absence of CTSP defects without a dedicated controller chip for CTSP.

  In addition, since an inspection circuit using the electrical resonance phenomenon is used, due to the inherent stability of the resonance phenomenon, it is resistant to electrical shocks such as electrostatic shock and external EMI, and external environmental changes such as mechanical vibrations and temperature and humidity changes There is an effect that the factor is very insensitive. Also in the measurement, there is an effect that measurement accuracy of 1/1000 or more can be maintained by measuring the frequency instead of the voltage or current while counting with a counter.

  Further, since the actual capacitance value between the ITO electrodes of CTSP can be obtained by the relational expression between the constant of the LC resonance circuit and the resonance frequency, there is an effect that it can be easily used for failure analysis.

  The preferred embodiments of the present invention have been described above, but the present invention is not limited to the specific embodiments described above. That is, a person having ordinary knowledge in the technical field to which the present invention belongs can make many changes and modifications to the present invention without departing from the spirit and scope of the appended claims. All appropriate changes and modifications equivalent thereto should be considered within the scope of the present invention.

Claims (6)

An LC resonance unit including an LC resonance circuit that causes electrical resonance by coupling with capacitance between ITO sensor electrodes of a capacitive touch screen panel (CTSP);
An OP amplifier drive unit that is connected to the LC resonance unit, oscillates an LC resonance circuit of the LC resonance unit, and converts a waveform of a resonance frequency into a rectangular wave;
A relay unit connected in parallel to the LC resonant unit and the ITO sensor electrode of the CTSP as a pair;
A microcomputer unit that is connected to the OP amplifier driving unit, drives the relay unit, counts the rectangular wave output from the OP amplifier driving unit, measures the frequency, and determines whether there is a CTSP defect;
In the microcomputer unit, based on a shift from the reference resonance frequency that does not couple with the capacitance between the ITO sensor electrodes of the resonance frequency, the presence or absence of CTSP failure is determined.
Inspection device for capacitive touch screen panel using LC resonance frequency shift.   The microcomputer unit measures the LC resonance frequency shift generated by the value obtained by adding the capacitance between the ITO electrodes to the C value of the LC resonance circuit, and divides this by the average value to normalize the calculated value. 2. The capacitive touch screen panel inspection apparatus using LC resonance frequency shift according to claim 1, wherein the presence or absence of CTSP is determined based on whether the resonance frequency shift falls within a range of the resonance frequency shift.   The range of the resonance frequency shift of the non-defective product is determined by dividing the LC resonance frequency shift by the average value and normalizing it, and determining whether or not the non-defective product is within the range of the non-defective product designated by the user. Capacitance type touch screen panel inspection apparatus using the LC resonance frequency shift described. In the inspection method of the capacitive touch screen panel (CTSP) using the LC resonance frequency shift,
An LC resonance circuit that causes electrical resonance by coupling with the capacitance between the ITO sensor electrodes of CTSP, an OP amplifier drive unit that oscillates the LC resonance circuit and converts it into a rectangular wave so that the microcomputer unit can perform frequency counting, using a relay unit and the microcomputer unit,
In order to obtain a reference resonance frequency based on pure LC oscillation, the microcomputer unit measures the reference resonance frequency of only the LC resonance circuit in a state where CTSP and the LC resonance circuit are not connected, and calculates the value. A first stage of storing;
The relay unit that operates according to the signal of the microcomputer unit performs parallel connection with the LC resonance circuit by sequentially changing the ITO sensor electrode of CTSP and the pair of ITO sensor electrodes that are connected to the LC resonance circuit. A second stage of measuring and storing a resonance frequency shift value generated by adding the capacitance of the LC resonance circuit to the C value of the LC resonance circuit in the microcomputer unit;
The distribution of resonance frequency shifts of a plurality of non-defective CTSPs measured by the microcomputer unit by repeating the second step is determined, and a non-defective range is set based on the obtained distribution, and the non- defective range is determined by the microcomputer unit. A third stage stored in the memory of
The resonance frequency shift value stored for the pair of ITO sensor electrodes is calculated by the microcomputer unit by normalization, and compared with the range value of the non-defective product stored in the microcomputer unit. A method for inspecting a capacitive touch screen panel using an LC resonance frequency shift, comprising: a fourth stage in which good / bad is determined depending on whether or not the value is off.   In the fourth step, the LC resonance frequency shift generated by the value obtained by adding the capacitance between the ITO electrodes to the C value of the LC resonance circuit is measured, and the calculated value is normalized by dividing this by the average value. 5. The method for inspecting a capacitive touch screen panel using an LC resonance frequency shift according to claim 4, wherein the presence or absence of CTSP is determined based on whether or not the resonance frequency shift is within a range of the resonance frequency shift. .   The range of the resonance frequency shift of the non-defective product is determined by dividing the LC resonance frequency shift by the average value and normalizing it, and determining whether or not the non-defective product is within the range of the non-defective product designated by the user. A method for inspecting a capacitive touch screen panel using the LC resonance frequency shift described.

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