JP5364986B2 - Secondary battery protection semiconductor device - Google Patents

Secondary battery protection semiconductor device Download PDF

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JP5364986B2
JP5364986B2 JP2007238164A JP2007238164A JP5364986B2 JP 5364986 B2 JP5364986 B2 JP 5364986B2 JP 2007238164 A JP2007238164 A JP 2007238164A JP 2007238164 A JP2007238164 A JP 2007238164A JP 5364986 B2 JP5364986 B2 JP 5364986B2
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secondary battery
overcurrent
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JP2009071052A (en
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邦彰 荒井
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Ricoh Co Ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Description

本発明は、2次電池保護用半導体装置に関する。   The present invention relates to a secondary battery protecting semiconductor device.

携帯型の電子機器ではLiイオン2次電池が利用されていることが多い。Liイオン2次電池は、過充電すると金属Liが析出して事故を起こす危険性があり、また過放電すると繰り返し充放電使用回数が劣化するなどの問題点を有している。そのため、2次電池と機器本体の間の充放電経路に保護スイッチを設け、所定の電圧以上に過充電された場合や所定の電圧以下に過放電された場合に、これを検出し、保護スイッチをオフにし、それ以上の過充電,過放電を抑止するようにしている。   Li-ion secondary batteries are often used in portable electronic devices. Li-ion secondary batteries have a risk of causing an accident due to deposition of metallic Li when overcharged, and have a problem that the number of repeated charge / discharge cycles deteriorates when overdischarged. For this reason, a protection switch is provided in the charging / discharging path between the secondary battery and the device main body, and this is detected when the battery is overcharged over a predetermined voltage or overdischarged below the predetermined voltage. Is turned off to prevent further overcharge and overdischarge.

例えば、特許文献1には、2次電池の過充電、過放電、過電流を検出する保護回路が開示されている。一般に、電池電圧が放電動作を停止すべき終止電圧に近くなると、電圧マージンが小さくなり急激な負荷変動などによる誤動作を起こしやすくなる。従って終止電圧以下になっても直ちに保護スイッチをオフするのではなく、その状態が一定期間以上継続した場合にのみ保護スイッチをオフにする必要がある。上記保護回路ではそのために、内部発振回路と分周カウンタからなるタイマーを利用している。そして、過充電、過放電、過電流の検出時の遅延時間(即ち、保護スイッチをオフするまでの、終止電圧以下の状態の継続期間)は、すべて内部発振回路とカウンタで決定する。したがって、遅延時間を決定するための外付けコンデンサは必要無いので、保護回路基板の部品点数を少なくできる。   For example, Patent Document 1 discloses a protection circuit that detects overcharge, overdischarge, and overcurrent of a secondary battery. In general, when the battery voltage becomes close to the end voltage at which the discharge operation should be stopped, the voltage margin becomes small and malfunctions due to sudden load fluctuations are likely to occur. Accordingly, it is not necessary to turn off the protection switch immediately even if the voltage is lower than the end voltage, but it is necessary to turn off the protection switch only when the state continues for a certain period or longer. For this purpose, the protection circuit uses a timer comprising an internal oscillation circuit and a frequency dividing counter. The delay time at the time of detecting overcharge, overdischarge, and overcurrent (that is, the duration of the state below the end voltage until the protection switch is turned off) is all determined by the internal oscillation circuit and the counter. Therefore, an external capacitor for determining the delay time is not necessary, and the number of parts of the protection circuit board can be reduced.

また、特許文献2に開示される保護回路は、テスト用端子を追加することで遅延時間を作成するクロック回路を加速し、テスト時間を短縮して検査工程のコストを削減することを実現している。   Further, the protection circuit disclosed in Patent Document 2 realizes that the clock circuit for creating the delay time is accelerated by adding a test terminal, the test time is shortened, and the cost of the inspection process is reduced. Yes.

更に、特許文献3には、2次電池の過充電、過放電、放電過電流、及び充電過電流を検出する保護回路が開示されている。図2は、特許文献3に開示される保護回路に基づく従来技術の2次電池保護用半導体装置の概略の回路図である。   Furthermore, Patent Document 3 discloses a protection circuit that detects overcharge, overdischarge, discharge overcurrent, and charge overcurrent of a secondary battery. FIG. 2 is a schematic circuit diagram of a conventional secondary battery protection semiconductor device based on the protection circuit disclosed in Patent Document 3. As shown in FIG.

上記半導体装置は、概略、過充電検出回路11、過放電検出回路12、放電過電流検出回路13、充電過電流検出回路21、短絡検出回路14、短縮回路30、発振回路16、カウンタ回路17、及び、異常充電器検出回路15から構成されている。   The semiconductor device generally includes an overcharge detection circuit 11, an overdischarge detection circuit 12, a discharge overcurrent detection circuit 13, a charge overcurrent detection circuit 21, a short circuit detection circuit 14, a shortening circuit 30, an oscillation circuit 16, a counter circuit 17, And it is comprised from the abnormal charger detection circuit 15.

上記半導体装置では、過充電、過放電、放電過電流、短絡、または、充電過電流を検出すると、発振回路16が動作し始め、カウンタ回路17が動き出す。そして、夫々の検出時に、予め設定されている遅延時間がカウントされると、ロジック回路20を通して、過充電、または充電過電流の場合にはCout出力端子(過充電検出出力端子)をローレベルにし、過放電、放電過電流、または短絡の場合にはDout出力端子(過放電検出出力端子)をローレベルにする。   In the semiconductor device, when overcharge, overdischarge, discharge overcurrent, short circuit, or charge overcurrent is detected, the oscillation circuit 16 starts to operate and the counter circuit 17 starts to operate. When a preset delay time is counted at each detection, the Cout output terminal (overcharge detection output terminal) is set to a low level in the case of overcharge or charge overcurrent through the logic circuit 20. In the case of overdischarge, discharge overcurrent, or short circuit, the Dout output terminal (overdischarge detection output terminal) is set to low level.

異常充電器検出回路15は、異常充電器等が接続されて大電圧がバッテリパックに印加された時に、過電流検出回路(13、21)の入力に、大電圧(V−電位)が掛からないようにスイッチSW2を切ることによって(同時に、スイッチSW1を繋ぐことによって)、トランジスタのVthの経時変化による過電流検出電圧値のシフトが起こらないようにするための回路である。   The abnormal charger detection circuit 15 does not apply a large voltage (V-potential) to the input of the overcurrent detection circuit (13, 21) when an abnormal charger or the like is connected and a large voltage is applied to the battery pack. In this way, the switch SW2 is turned off (at the same time by connecting the switch SW1) to prevent the overcurrent detection voltage value from shifting due to the change in Vth of the transistor over time.

ところで、図2に示すような保護用半導体装置では、逆充電時(即ち、充電器の+、−が図2とは逆に接続された時)、短絡時、または放電過電流時において、V−端子電圧やCout端子電圧が、Vdd端子電圧を上回ることがある。V−端子とVdd端子間、及び、Cout端子とVdd端子間は、一般的にPN接合されている。そのため、V−端子電圧やCout端子電圧が、Vdd端子電圧をVf(順方向電圧)分を超えて上回ると、いわゆるオン電流(ON電流)が流れる。この電流が、V−端子やCout端子の周辺回路、とりわけ放電過電流検出回路を誤動作させてしまうことが生じうる。
特開平9−182283号公報 特開2002−186173公報 特開2002−176730公報
By the way, in the protective semiconductor device as shown in FIG. 2, at the time of reverse charging (that is, when + and − of the charger are connected opposite to those in FIG. 2), at short circuit, or at discharge overcurrent, V -The terminal voltage or the Cout terminal voltage may exceed the Vdd terminal voltage. In general, a PN junction is provided between the V-terminal and the Vdd terminal and between the Cout terminal and the Vdd terminal. Therefore, when the V-terminal voltage or the Cout terminal voltage exceeds the Vdd terminal voltage by more than Vf (forward voltage), a so-called on-current (ON current) flows. This current may cause malfunction in peripheral circuits of the V-terminal and Cout terminal, particularly the discharge overcurrent detection circuit.
JP-A-9-182283 JP 2002-186173 A JP 2002-176730 A

本発明は、2次電池保護用半導体装置において、V−端子電圧やCout端子電圧がVdd端子電圧を上回るようなことが生じても、誤動作を生じさせないことを目的とする。   It is an object of the present invention to prevent malfunctions even when the V-terminal voltage or the Cout terminal voltage exceeds the Vdd terminal voltage in a secondary battery protection semiconductor device.

本発明は、上記の目的を達成するために為されたものである。本発明に係る請求項1に記載の半導体装置は、
2次電池の過充電、過放電、充電過電流、放電過電流、または短絡電流を検出して、前記2次電池を保護する2次電池保護用半導体装置であって、
過充電検出出力端子及び充電器マイナス電位入力端子と同電位となる素子の位置と、放電過電流検出比較器の位置とを、チップ(基板)の対角線両端の夫々の近傍に配置することを特徴とする。
The present invention has been made to achieve the above object. According to the first aspect of the present invention, there is provided a semiconductor device.
A secondary battery protection semiconductor device for detecting secondary battery overcharge, overdischarge, charge overcurrent, discharge overcurrent, or short circuit current to protect the secondary battery;
The position of the element having the same potential as the overcharge detection output terminal and the charger minus potential input terminal and the position of the discharge overcurrent detection comparator are arranged in the vicinity of each of the diagonal ends of the chip (substrate). And

本発明を利用することにより、2次保護用半導体装置において、逆充電/放電過電流/短絡/充電過電流の検出時に、V−端子電圧やCout端子電圧がVdd端子電圧を上回りオン電流が流れても、放電過電流回路の誤動作は生じにくくなる。   By utilizing the present invention, in the secondary protection semiconductor device, when reverse charge / discharge overcurrent / short circuit / charge overcurrent is detected, the V-terminal voltage and the Cout terminal voltage exceed the Vdd terminal voltage, and an on-current flows. However, malfunction of the discharge overcurrent circuit is less likely to occur.

以下、図面を参照して本発明に係る好適な実施形態を説明する。   DESCRIPTION OF EXEMPLARY EMBODIMENTS Hereinafter, preferred embodiments according to the invention will be described with reference to the drawings.

本発明の好適な実施形態に係る保護用半導体装置は、図2に示すような従来技術の2次電池保護用半導体装置を、概略基本とする。従って、本発明の好適な実施形態に係る保護用半導体装置は、概略、過充電検出回路11、過放電検出回路12、放電過電流検出回路13、充電過電流検出回路21、短絡検出回路14、短縮回路30、発振回路16、カウンタ回路17、及び、異常充電器検出回路15から構成されている。上記半導体装置が、過充電、過放電、放電過電流、短絡、または、充電過電流を検出すると、発振回路16が動作し始め、カウンタ回路17が動き出す。そして、夫々の検出時に、予め設定されている遅延時間がカウントされると、ロジック回路20によって、過充電または充電過電流の場合にはCout出力端子(過充電検出出力端子)がローレベルにされ、過放電、放電過電流または短絡の場合にはDout出力(過放電検出出力端子)がローレベルにされる。   A protective semiconductor device according to a preferred embodiment of the present invention is basically based on a conventional secondary battery protecting semiconductor device as shown in FIG. Therefore, the protective semiconductor device according to a preferred embodiment of the present invention is roughly composed of an overcharge detection circuit 11, an overdischarge detection circuit 12, a discharge overcurrent detection circuit 13, a charge overcurrent detection circuit 21, a short circuit detection circuit 14, The circuit includes a shortening circuit 30, an oscillation circuit 16, a counter circuit 17, and an abnormal charger detection circuit 15. When the semiconductor device detects overcharge, overdischarge, discharge overcurrent, short circuit, or charge overcurrent, the oscillation circuit 16 starts to operate and the counter circuit 17 starts to operate. When a preset delay time is counted at each detection, the logic circuit 20 sets the Cout output terminal (overcharge detection output terminal) to a low level in the case of overcharge or charge overcurrent. In the case of overdischarge, discharge overcurrent or short circuit, the Dout output (overdischarge detection output terminal) is set to low level.

異常充電器検出回路15は、大電圧がバッテリパックに印加されたときの保護機能を遂行する回路部である。つまり、異常充電器検出回路15は、異常充電器等が接続されて大電圧がバッテリパックに印加された場合、過電流検出回路(13、21)の入力に大電圧(V−電位)が掛からないようにスイッチSW2を切ることによって(同時に、スイッチSW1を繋ぐことによって)、トランジスタのVthの経時変化による過電流検出電圧値のシフトが起こらないようにする。   The abnormal charger detection circuit 15 is a circuit unit that performs a protection function when a large voltage is applied to the battery pack. That is, the abnormal charger detection circuit 15 applies a large voltage (V-potential) to the input of the overcurrent detection circuit (13, 21) when an abnormal charger or the like is connected and a large voltage is applied to the battery pack. By switching off the switch SW2 so as not to occur (at the same time by connecting the switch SW1), a shift of the overcurrent detection voltage value due to the change of the Vth of the transistor with time is prevented.

更に、上記保護用半導体装置では、Cout端子やV−端子の位置についてのチップ対角線上の離れた位置に、放電過電流検出回路13を構成する放電過電流検出比較器が配置される。   Further, in the protective semiconductor device, a discharge overcurrent detection comparator constituting the discharge overcurrent detection circuit 13 is arranged at a position on the chip diagonal line with respect to the positions of the Cout terminal and the V− terminal.

前述のように、従来技術では、逆充電時(即ち、充電器の+、−が図2とは逆に接続された時)、短絡時、または放電過電流時において、V−端子電圧やCout端子電圧が、Vdd端子電圧をVf(順方向電圧)分を超えて上回ると、いわゆるオン電流(ON電流)が流れて、放電過電流検出回路13を誤動作させてしまうことがある。   As described above, in the prior art, the V− terminal voltage or Cout is determined during reverse charging (that is, when + and − of the charger are connected in the opposite direction to those in FIG. 2), short circuit, or discharge overcurrent. If the terminal voltage exceeds the Vdd terminal voltage by more than Vf (forward voltage), a so-called on-current (ON current) flows and the discharge overcurrent detection circuit 13 may malfunction.

したがって、本発明の好適な実施形態に係る保護用半導体装置では、Cout端子やV−端子と、放電過電流検出回路13を構成する放電過電流検出比較器とを、なるべく離して配置する。即ち、Cout端子やV−端子の位置と、放電過電流検出比較器の位置とを、チップ(基板)の対角線両端の夫々の近傍(36、38)に配置する。図1は、本発明の好適な実施形態に係る2次電池保護用半導体装置における、過充電検出出力端子(Cout端子)及び充電器マイナス電位入力端子(V−端子)と同電位となる素子の位置と、放電過電流検出比較器の位置との配置図である。   Therefore, in the protective semiconductor device according to the preferred embodiment of the present invention, the Cout terminal and V− terminal and the discharge overcurrent detection comparator constituting the discharge overcurrent detection circuit 13 are arranged as far as possible. That is, the positions of the Cout terminal and V-terminal and the position of the discharge overcurrent detection comparator are arranged in the vicinity (36, 38) of the diagonal ends of the chip (substrate). FIG. 1 is a circuit diagram of an element having the same potential as an overcharge detection output terminal (Cout terminal) and a charger minus potential input terminal (V− terminal) in a secondary battery protection semiconductor device according to a preferred embodiment of the present invention. It is an arrangement plan of a position and a position of a discharge overcurrent detection comparator.

図2に示す2次電池保護用半導体装置において、逆充電/放電過電流/短絡/充電過電流の検出時には放電過電流検出回路13が動作しているから、放電過電流検出回路13は特に誤動作を生じやすい状態にあるといえる。図1に示すように、保護用半導体装置内部を配置することにより、逆充電/放電過電流/短絡/充電過電流の検出時にV−端子やCout端子電圧がVdd端子電圧を上回りオン電流が流れても、放電過電流検出回路13の誤動作は生じにくくなる。   In the secondary battery protection semiconductor device shown in FIG. 2, since the discharge overcurrent detection circuit 13 operates when detecting reverse charge / discharge overcurrent / short circuit / charge overcurrent, the discharge overcurrent detection circuit 13 particularly malfunctions. It can be said that it is in the state which is easy to produce. As shown in FIG. 1, by disposing the inside of the protective semiconductor device, the V-terminal and Cout terminal voltages exceed the Vdd terminal voltage when reverse charge / discharge overcurrent / short circuit / charge overcurrent is detected, and an on-current flows. However, the malfunction of the discharge overcurrent detection circuit 13 is less likely to occur.

なお、図1に示す配置図では、Cout端子やV−端子の位置はチップ(基板)の右下38であり、放電過電流検出比較器の位置はチップ(基板)の左上36であるが、両者の位置は逆であってもよい。また、Cout端子やV−端子の位置と放電過電流検出比較器の位置は、図1に示すチップ(基板)の左下と右上であってもよい。   In the layout shown in FIG. 1, the position of the Cout terminal and the V− terminal is the lower right 38 of the chip (substrate), and the position of the discharge overcurrent detection comparator is the upper left 36 of the chip (substrate). Both positions may be reversed. Further, the position of the Cout terminal or V-terminal and the position of the discharge overcurrent detection comparator may be the lower left and upper right of the chip (substrate) shown in FIG.

本発明は、複合型の電源ICの電圧レギュレータや電圧検出器、特に携帯電子機器などに用いる2次電池のバッテリパックに内蔵されているLiイオン電池などを、過充電、過放電、充電過充電、放電過充電、短絡電流から保護する保護用半導体装置に利用され得る。   The present invention overcharges, overdischarges, charges overcharges a voltage regulator and voltage detector of a composite power supply IC, particularly a Li ion battery incorporated in a battery pack of a secondary battery used in a portable electronic device or the like. It can be used for a protective semiconductor device that protects against discharge overcharge and short-circuit current.

本発明の好適な実施形態に係る2次電池保護用半導体装置における、過充電検出出力端子及び充電器マイナス電位入力端子と同電位となる素子の位置と、放電過電流検出比較器の位置との配置図である。In the semiconductor device for secondary battery protection according to a preferred embodiment of the present invention, the position of the element having the same potential as the overcharge detection output terminal and the charger minus potential input terminal, and the position of the discharge overcurrent detection comparator FIG. 従来技術の2次電池保護用半導体装置の概略の回路図である。It is a schematic circuit diagram of the semiconductor device for secondary battery protection of a prior art.

符号の説明Explanation of symbols

11・・・過充電検出回路、12・・・過放電検出回路、13・・・放電過電流検出回路、14・・・短絡検出回路、15・・・充電器検出回路、16・・・発振回路、17・・・カウンタ回路、20・・・ロジック回路、21・・・異常充電過電流検出回路、30・・・短縮回路。 DESCRIPTION OF SYMBOLS 11 ... Overcharge detection circuit, 12 ... Overdischarge detection circuit, 13 ... Discharge overcurrent detection circuit, 14 ... Short circuit detection circuit, 15 ... Charger detection circuit, 16 ... Oscillation Circuit: 17... Counter circuit, 20... Logic circuit, 21... Abnormal charge overcurrent detection circuit, 30.

Claims (1)

2次電池の過充電、過放電、充電過電流、放電過電流、または短絡電流を検出して、前記2次電池を保護する2次電池保護用半導体装置であって、
過充電検出出力端子及び充電器マイナス電位入力端子と同電位となる素子の位置と、放電過電流検出比較器の位置とを、チップ(基板)の対角線両端の夫々の近傍に配置することを特徴とする半導体装置。
A secondary battery protection semiconductor device for detecting secondary battery overcharge, overdischarge, charge overcurrent, discharge overcurrent, or short circuit current to protect the secondary battery;
The position of the element having the same potential as the overcharge detection output terminal and the charger negative potential input terminal and the position of the discharge overcurrent detection comparator are arranged in the vicinity of the opposite ends of the diagonal line of the chip (substrate). A semiconductor device.
JP2007238164A 2007-09-13 2007-09-13 Secondary battery protection semiconductor device Expired - Fee Related JP5364986B2 (en)

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