JP5337774B2 - Optoelectronic image enlargement system - Google Patents

Abstract

An opto-electronic image magnifying system. The magnifiying system includes: a light source (38, 39) which illuminates an object to be viewed; a miniaturized opto-electronic magnifier module (MOM), made of a lens (31) and a photodetector array (32), which receives the light from the illuminated object; an electronic circuit (34) which receives the signal from the MOM; a video-monitor (35) which receives the magnified signal from the electronic circuit and displays the image. The opto-electronic image magnifying system allows for small objects or features of small objects to be observed in which historically compound microscopes or specialized optical viewing systems were required to observe the small objects.

Description

Related applications

  The present applicant claims the benefit of US Patent Application No. 60 / 112,172, filed concurrently on December 14, 1998.

(Field of the Invention)
The present invention relates to an ever-increasing demand in the industrial, commercial and educational fields of observing and characterizing small objects or very small features of objects. Historically, such observations have been made with dual microscopes, or specialized optical observation systems.

(Background of the present invention)
Leeuwenhoek laid the foundation for microbiology around 1700 using a single lens microscope. His glass ball was 266x magnification. The compound microscope was already discovered 50 years ago. Leeuwenhoek's single-lens microscope gave an image with higher resolution and better quality than a compound microscope, but could not beat the passage of time. The system duplex microscope with objective lens and eyepiece has become the standard for all modern optical microscopes. The main reason for the success of the compound microscope was ease of handling. In order to use a Leeuwenhoek microscope, the sample and the microscope must be placed very close to the eye. This makes Leeuwenhoek's simple microscope difficult to use and in most cases unusable. Over the centuries, compound microscopes have been improved and enhanced in function, but in most cases the objective lens is used at a relatively long distance (at least 160 mm) relative to the image generating surface, and the eyepiece The second stage of enlargement was to present an image to the human eye.

  Lenses are used to create real images in many types of cameras or projectors, including video cameras, and the imaging part of a video camera, i.e. a television transmitter, creates a primary image created on the photosensitive material by the lens. Receive and convert it into an electrical signal. In standard usage, a video camera sends an image of a large object to the monitor screen. The image produced by the lens on the photosensitive material is reduced in size, ie reduced. As the object approaches the lens, it appears larger on the monitor screen, but the lens does not make the image larger than the object. Even in the macro mode, the image formed by the lens on the photosensitive material is not magnified.

  The lens creates an enlarged image as either a virtual or real image. When an object is placed closer to the lens than the focal length, an enlarged virtual image can be seen when the eye is brought closer to the lens. This is the Leeuwenhoek microscope.

  When the object to which light is applied is placed at a distance that is larger than the focal length of the lens but smaller than twice the focal length of the lens, an enlarged real image is projected. The objective lens of the compound optical microscope projects an enlarged real image. To see this real image, an eyepiece or screen is required. The eyepiece enlarges the real image and turns it into an enlarged virtual image that can be seen by the eye. A compound microscope is a combination of the objective lens and the eyepiece in this way.

Compound microscopes have been made the standard form for optical microscopes for over 200 years. Since then, duplex microscopes have been a major tool in science and technology. The height of a duplex microscope is typically greater than 16 inches and is often much larger. The sample must be placed on the sample stage, but a mechanical device is required to allow anyone using the microscope to focus on their eyes. People wearing corrective glasses often have difficulty using eyepieces. You may need a special “high eye” eyepiece.

  The optical microscope has a magnification in the range of 5 to 2,000 times. Most of this magnification is obtained by the objective lens, but the magnification of the objective lens is typically 0.5 to a maximum of 160 times. The objective lens projects an image of 160 mm or more from the objective lens (an infinite correction system uses a 180 mm telan lens to create a primary image). This projection distance (or length of the lens barrel) combined with the eyepiece is the main factor determining the physical size of the microscope. Since the magnification of the eyepiece is 5 to 20 times, and the eye must be brought close to the high-power eyepiece, it is difficult to use the high-power eyepiece. An eyepiece with a magnification of 10 is common, and most optical microscope applications use magnifications of 10 to 500 times.

  Video microscopy has become a useful technique in recent decades to extend the capabilities of dual optical microscopes. Initial usage is described by Inoue in Video Microscopy, published in Plenum Press 1986, New York, USA. The most common implementation of a video microscope is to attach a video camera to the accessory port of a trinocular microscope viewer. Several types of video cameras are used in video microscopes, but solid state charge coupled devices (CCDs) are used in the industry. When the light level is low, a cooled CCD video camera is used because of its high sensitivity. Although these cameras are very expensive, they have demonstrated particular sensitivity for certain biological applications. The most common use of a video microscope is to observe with the eye, record an image, create a digitized image, and use it as an auxiliary means for analysis using a digital computer.

  When using an optical microscope for photo or video microscopy, the camera device takes the place of the eye. These cameras include an additional lens that projects the real image onto a film or electronic video image generator. Video camera accessories require special eyepieces that reduce the effects of electronic scaling. In all cases, the addition of a photographic camera or video camera increases the size, complexity and price of the dual optical microscope. Adding a video camera to a compound optical microscope adds 6 to 10 inches in size.

  A video camera was incorporated into the microspectrophotometer system to produce images electronically. In the system described in US Pat. No. 5,677,096 (Refner and Wihlberg), an embedded video camera is used to create an electronic image for observing the sample and recording the image. In some micro-Raman spectrometer systems, video is used to generate an image to prevent the viewer from being exposed to the laser light used to obtain the Raman spectrum. All these systems use the principle of a compound optical microscope with one objective lens, one or more intermediate lenses and one video camera. These video microscope systems use a conventional microscope optical system with a long lens barrel and a video camera. The standard lens barrel length is 160 mm (6.3 inches), but with the addition of a video image generation system, it may be more than twice this length.

A method of performing chemical analysis of a small object or a small feature of an object by combining a microscope and a spectroscope, a spectrometer, or a spectrograph has a history of more than 125 years (see Non-Patent Document 1). Early microspectrometers were a combination of a visible light microscope and a dispersive spectrometer used for color analysis. In 1949, the first report of using infrared energy in microspectroscopy was R. C. Non-Patent Document 2 by Gore and Non-Patent Document 3 by Barer et al. In 1953, the first commercial infrared microspectrometer accessory was manufactured (Coats et al., Non-Patent Document 4). However, infrared microspectroscopy has not become a practical technique until the development of Fourier transform infrared (FT-IR) spectroscopy. The first microscope accessory for FT-IR was introduced in 1983. The design of these accessory microscopes follows the general technique and design of duplex optical microscopes for generating images and measuring their spectra.

  The wavelength of light (λ) and the aperture of the objective lens limit the spatial resolution of all microscopes. The spatial resolution (d) limited by diffraction of a microscope with a numerical aperture (NA) giving a limit is given by d = (0.67 λ / NA). As the spatial resolution limited by this diffraction decreases, the resolution of the microscope increases. In video microscopy, the resolution element of the photodetector array is another factor that can limit the resolution. To meet the Nyquest limit, two image elements are required for the particular resolution to be recorded.

  For the analysis of molecular compounds such as organic substances, certain ionic salts and silicate materials, light radiant energy in the mid-infrared region (2.5-25 μm) is most useful. is there. In this spectral region, the spatial resolution limited by normal diffraction is generally considered to be about 10 μm.

  In order to improve the spatial definition of the sample area in infrared microspectroscopy, Messerschmidt and Sting (US Pat. No. 5,637,049) applied the principle of confocal microscopy. In such a method, the confocal geometry introduced by Minsky (Patent Document 3) is obtained using a mask on the image generation surface. However, the use of a mask adds complexity and cost to the microscope used for infrared microscopy.

  Internal reflection analysis is accomplished by reducing the area of the sample in contact with the internal reflective element (IRE) as shown by Sting and Reffner (US Pat. According to the Sting patent (Patent Document 5), a mechanical slider in contact with the reflecting ATR microscope objective and aperture mask is presented to select different optical paths through the attached IRE. Yes. The ATR objective lens requires moving the aperture mask between viewing the sample through the IRE and recording its ATR spectrum. By choosing different optical paths, it is possible to collect ATR spectra, observe sample contact, or examine the sample. These three modes make microscopic analysis using ATR objectives easier, but the cost and complexity are significantly increased.

US Pat. No. 5,581,085 U.S. Pat. No. 4,877,960 US Patent 3,013,467 US Pat. No. 5,172,182 US Pat. No. 5,093,580

USA, New York, Harper & Row, published in 1985, Ford, Single Lens, The Story of the Simple Microscope. Science magazine, 110, 70 (1949) Nature magazine, 163, 198 (1949) J. et al. Opt. Soc. Am. Journal, 43, 984 (1953)

(Outline of the present invention)
The present invention is a miniaturized optoelectronic image magnifying system, i.e. part of the magnification is performed by one or more lenses or other optical elements and the rest of the magnification is performed by an electronic scaling system. The present invention relates to a system for creating an image of an enlarged object. This miniaturized optoelectronic system includes one or more lens systems, such as a zoom lens with a variable focal length (the term “lens” is used herein to refer to a single lens and multiple lenses. Equipped lens system, including both compound lenses and zoom lenses), arrays of solid state photodetectors, and electronic display devices such as televisions, video monitors or computer monitor screens The electronic circuit which provides is provided. A lens or lens system projects a magnified real image of an illuminated or emitting object, or part thereof, directly onto a small solid-state photodetector, which is projected onto it. An electrical signal representing the magnified real image is generated. This optical image is then electronically magnified and displayed on the screen of the display device. The focus of the image on the detector is the same for everyone looking at the screen. Viewing the image on the screen is a matter of convenience and the person viewing the image can wear corrective glasses.

  At the heart of the present invention is a combination of a lens or lens system and a small solid state photodetector. This combination will be referred to herein as a miniaturized optoelectronic expansion (MOM) module. In the miniaturized optoelectronic magnification system of the present invention, the microscope objective and eyepiece are omitted by using the MOM module in combination with the video display monitor. Therefore, the main problem is that the advantages of the Leeuwenhoek microscope, such as the compact size and simplicity of the optical system, are obtained, and at the same time the observer must be near both the eyepiece and the object being observed. Can be eliminated. Using the present invention, the eye can be moved from near the lens of the Leeuwenhoek microscope to a comfortable viewing position on a computer monitor or television screen. Viewing a magnified image on the screen and mounting a video camera are not new ideas, but the novelty of the present invention provides "visual access" that was not previously available at an affordable price This makes it possible to see magnified images of objects in an unexpected way with unique simplicity.

  The MOM module is typically substantially smaller than a standard duplex optical microscope with a barrel length of 160 mm. The MOM module of the present invention is miniaturized by selecting the appropriate focal length lens and combining it with a small array of photodetectors to have the desired size. This small MOM module has an overall height of about 25 to about 100 mm and can be placed in a device to create an enlarged image that can be remotely observed on another video monitor screen. .

The magnification of this optoelectronic image magnification system is the product of the optical magnification and the magnification from the electrical scaling operation. In most systems, the magnification by electrical scaling is about 20 to about 100 times, whereas the optical magnification by the lens or lens system is about 2 to 20 times. The optical magnification will typically be 2-10 times, and more typically 2-5 times. Thus, in most, if not all, magnifications are typically obtained by electrical scaling. In the preferred embodiment, the electrical scaling factor is a major part of the overall magnification and the optical factor accounts for a small percentage. The ratio of magnification due to electrical scaling to optical magnification is generally about 1.5: 1 to 30: 1, typically about 4: 1 to about 10: 1.

  The miniaturized optoelectronic image magnification system of the present invention eliminates the need to see objects through the microscope eyepiece and objective lens system and does not require high costs to connect the video camera to the dual microscope system. . Instead, an enlarged electronic image can be seen only on the screen of the monitor without the use of an attached compound microscope. This system alone also has the advantage of being in the form of a very small and inexpensive expansion system, for example an inverted microscope for observing insects, soil, plants and minerals. When combined with other sensing techniques such as FT-IR spectroscopy or Raman spectroscopy, there is a dramatic advantage in inspecting the sample, for example in the analysis of defects in packaging materials or in the analysis of trace amounts of forensic evidence. Will be obtained.

  In a preferred embodiment of the invention, magnified images of the sample can be observed continuously and ATR spectra can be collected simultaneously by internal reflection spectroscopy. This makes the internal reflection spectrometer more stable, easier to use and lowers in price. Observing the sample through the IRE is particularly valuable on microscopic analysis, and it is possible to visually confirm what object or feature is being analyzed. The internal reflection method is very useful for spectroscopic analysis of polymers and other organic objects, especially for analyzing the surface of thick and opaque materials. To find an area for spectral analysis on a thick opaque material, it is necessary to observe through the IRE.

  In another preferred embodiment of the miniaturized optoelectronic image magnification system of the present invention, a commercially available FT-IR spectrometer is used for internal reflection spectral analysis. The MOM module is fitted inside the internal reflection accessory to create an enlarged image of the sample (object) and at the same time analyzed by infrared spectroscopy. The internal reflection accessory is installed in the sample chamber of a general purpose FT-IR spectrometer. The spatial limitations of the sample chamber of the spectrometer limit the visual access (viewing with the eye) of the sample through the internal reflective element (IRE). By placing the MOM module inside the internal reflective accessory, it becomes possible to see through the IRE and examine the material in contact with the IRE. Viewing the light path and the light energy path by internal reflection is done separately in the internal reflection element, but the paths converge at the same point on the sample. Although these optical paths are separate, this allows the sample to be observed with the eye while recording the infrared spectrum.

  In another form, the MOM module of the present invention is incorporated into a spectrometer system dedicated to internal reflection microscopic analysis. Either the internal reflection imaging accessory or this dedicated system can use a single or multiple IREs. By combining the magnified image with video and the internal reflection FT-IR instrument in this unique way, a wide range of materials including organic compounds, drugs, plastics, paints, and most minerals can be analyzed. A simple and inexpensive device that can be used is obtained.

  The present invention will now be described by way of example only with particular reference to the accompanying drawings.

FIG. 2 is a schematic diagram showing the current state of a conventional compound optical microscope technique used to directly view an enlarged image, showing the main elements. It is the schematic which shows the present condition of video microscope technology, and shows the main elements. 1 is a schematic diagram of a miniaturized opto-electronic magnification system of the present invention, showing the main elements. FIG. 2 is a block diagram of a miniaturized opto-electronic magnification system that highlights the parts used to implement the system of the present invention. 1 is a schematic diagram representing a miniaturized optical-electronic magnification system of the present invention placed in an internal reflection accessory for use in infrared spectral analysis. FIG. An enlarged image of the sample placed on the internal reflective element is displayed on the video-monitor screen. 1 is a schematic diagram representing the miniaturized opto-electronic magnification system of the present invention in an inverted microscope, which produces an enlarged image of a small object on a TV monitor. FIG. 2 is a schematic diagram representing a miniaturized photo-electron magnification system of the present invention placed in the sample section of an FT-Raman spectrometer to produce an enlarged image of the sample to be analyzed. FIG. 8a is a schematic diagram representing the miniaturized optical-electron magnification system of the present invention for viewing the region of the internal reflective element using controlled infrared illumination of the subject region for ART spectrum measurements. Yes; and FIG. 8b is an enlarged view of the probe tip of FIG. 8a, provided by a miniaturized opto-electronic magnification system in the ART probe apparatus of that figure.

(Detailed explanation)
FIG. 1 represents the main elements of a conventional composite optical microscope used to directly view an optically magnified image. The conventional compound optical microscope includes a light source 1 and a mirror 2 that directs light to a condenser lens 3 that directs light to irradiate an object 4. The objective lens 5 projects a real image 6 of the irradiated object onto the eyepiece 7, the eye 8 sees the virtual image 9, and the eye lens 10 forms a real image 11 of the object on the retina 17.

  The present technology for converting the compound optical microscope shown in FIG. 2 to a system for electronic imaging replaces the eye 8 of FIG. 1 with a video camera 12 comprising a lens 13 and an electronic image element 14. This video camera is usually attached to another mouth to maintain a normal direct field of view through a conventional eyepiece. The electronic image is displayed on the video display screen 15.

  While compound optical microscopes have been assembled in many shapes and sizes, today's microscopes are large, complex and versatile scientific instruments. The mechanical distance from the objective lens attached to the eyepiece lens sheet is referred to as the mechanical tube length 16. A standard optical microscope has a tube length of 160 mm or more. Adding video accessories to a conventional composite optical microscope adds size and complexity.

  Electronic images have had a major impact on conventional microscopes, particularly in the field of electronic image analysis, and have increased sensitivity to the detection of small contrast differences.

Because the present invention reduces the size and complexity of the microscope, it can be used to observe objects that are not seen with conventional microscopes or that are too high to be investigated. As described above, the heart of the present invention is a miniaturized opto-electronic image magnification module, ie, a combination of a lens and one or more small solid-state photo-detector arrays. The light-detector can be part of a charge-coupled device (CCD) camera. They can be simple board cameras, i.e. printed circuit or other parts of the base on which the light-detector is mounted, and the circuit receives a signal that is an image display on the light-detector. Generate. A 1/4 inch CCD camera and a 12 mm focal length lens are examples of MOM modules.

  Referring to FIG. 3, the lens 31 forms a real image of an emitted or irradiated object 32 on a solid-state light-detector array 33. Since the object can be either transparent or opaque, two visible light sources 38 and 39 are provided. The lens 31 and the light-detector array 32 form a MOM module. Each element of the array detector includes a magnified image pixel. The electronically generated signal from the MOM module is processed by the electronic circuit 34 and the magnified image is displayed on the video monitor 35. In many systems, the light detection array 32 and the electronic circuitry 34 will be combined in a system such as the CCD camera described above. However, in certain applications, the light-detection array 32 is combined with the lens 31 when the MOM module is placed in a small device such as a Fourier transform spectrometer, a thermal analysis system, and a miniaturized probe for visual inspection. The MOM module is formed and the electronic circuit 34 can be placed in another convenient location as described in FIG. For this type of application, a board camera is particularly advantageous.

  A miniaturized solid state charge coupled device (CDD) video camera is a reduced size instead of a microscope used in the present invention. Commercially available CDD video cameras (such as CHUGAI BOYEKI (USA), Commac, New York, 11725, model CEC100) are small and have 1/4 inch CCD elements. This camera is small in size and is 1.25 inches square (3 bases) x 1.0 inches high. The CCD has 512 horizontal (H) × 492 vertical (V) elements, and its scan size is 3.69 (H) × 2.76 (V) mm. This camera has a TV line resolution of 330 (H) × 330 (V).

  The principle of electronic scaling with this CCD camera will be described in detail. The image formed on the CCD solid device array is displayed on a monitor screen. If the monitor screen vertical (H) size is 10 inches (254 mm), 254 / 3.69 = 68.8 is the electronic scaling factor for this system. If the lens (es) system forms a 3 × magnified image on the CCD element, the image seen on the monitor will be 3 × 68.8 or 206.4 ×. As readily envisioned, electronic scaling is a key element of the present invention.

  It is also possible to use other small video cameras and other video monitors having different external shapes and sizes than the CCD solid state device array. To match a commercially available lens that is well suited for the present invention, a camera or other solid-state light-detection array is a pixel that is less than 1 inch wide (measured along an angle) and equal to the resolution of the monitor screen. It should have a density of elements and detect a minimum luminance of less than 50 lux.

The lens is combined with a CCD solid state device array to form a miniaturized photocharge magnifier (MOM) module of the miniaturized photoelectron magnification system of the present invention. The lens creates a specially sized image and resolution to achieve the desired magnification in the final electronic image. The magnification power of this lens is calculated as the ratio of the image to the object size. The size of the image is equal to the size of the CCD solid state device array. Using a CCD solid state device array and the above monitor, the magnification and resolution of the lens is calculated with a final magnification of 3 × 68.8 = 206.4. Since this total magnification is equal to the product of the optical magnification and the electronic scaling factor, the optical power in this example is 3 times. For this CCD solid element array, the horizontal dimension is 3.69 mm. For a 3 × magnification, the maximum object size is 3.69 / 3 = 1.23 mm. This 1.23 mm object is imaged on 512 elements, so each CCD array element has an image element size equal to 1.23 / 512 = 0.024 mm (2.4 microns). For optical resolution equal to electronic resolution, the lens must produce an image with a resolution of 2.4 micrometers. This is because the numerical aperture (NA) of the lens must satisfy the Abbe criterion, where d = wavelength / NA (where d is the minimum separation distance that can be detected). For visible light, this relationship is N = (0.5E−3) / d, which in this example is d = 2.4E−3 and NA = 0.208.

  The total magnification of this optoelectronic system is the product of optical magnification and electronic scaling. The optical magnification is a ratio of the object distance 36 to the image distance 37. Electronic scaling is the ratio of the size of the video-monitor screen 35 to the size of the light-detecting element 33. Most but not all of the expansion typically comes from electronic scaling.

  Table 1 lists the characteristics of commercially available lenses as readily available examples that can be used to achieve the desired magnification, resolution and small total MOM module length. To accommodate commercially available solid state optoelectronic array detectors and achieve the benefits provided by the present invention, the lens has a fixed or variable focal length (zoom lens system) and an optical magnification of up to 20x Should be a single lens or lens system that can make The lens focal length should be in the range between 2 and 50 mm.

  As noted above, for most preferred combinations, electronic scaling will be the main factor of total magnification and the optical magnification factor will be small. For a system using a 0.25 inch solid state array in a MOM module that uses a 20 inch monitor and produces a total magnification of 400x, the electronic scaling factor is 80x and the optical magnification factor is 5x. Is double. In this example, the electronic scaling is 16 times greater than the optical magnification. This is in contrast to conventional compound optical microscopes where all magnifications are optical and the objective lens generally produces the majority of magnifications. Since the optical magnification in the MOM module is often less than 20 times, the lens is not expensive and few lens elements are needed to correct for aberrations.

Small element solid state photodetectors such as CCD board cameras have been developed commercially in palm camcorders and security surveillance cameras. This element is available in normal sizes from 1/4 to 3/4 inch. A conventional 1/4 inch camera has an array with dimensions of about 3.96 mm horizontal (H) x about 2.79 mm vertical (V). Video monitor screen sizes range from 5 to 20 inches, and home video screens are available up to 48 inches wide. This electronic scaling is very high. Currently, much of this electronic scaling is “empty magnification” in that the resolution is limited to pixel size and monitor screen resolution. Sky magnification is an enlargement that extends beyond detailed resolution; the image is large but does not reveal new details. Current video technology limits resolution, so the actual total magnification of the miniature opto-electronic magnifier of the present invention is 500 or less. However, with the development of high-definition TVs and future video technology advances, magnification values will rise to the optical diffraction limit of optical microscopes and magnifications of over 1,000 will be achievable.

  In addition to providing electronic scaling, solid state photodetectors are very sensitive and produce high quality images at low levels of light intensity. In the present invention, the increased sensitivity is used to simplify the light source and reduce its cost. Many applications are possible with ambient light. In other cases, a low power lamp provides sufficient light.

  In the generalized form of the MOM module unit of the present invention, this is one component of a miniaturized light-element expansion system. With reference to the block diagram of the system of FIG. 4, the MOM module 41 is arranged to view the object 42 illuminated by the light source 43 or 44, and the electrical signal from the MOM module 41 is sent to the video monitor 45 or computer 46. Sent. Furthermore, video recorder 47 and / or printer 48 are examples of additional components that can be added to record the magnified image.

  Currently available small board cameras produce NTSC, PAL or S-video output. Such commercial video standards are expected to change and improve TV quality, which will also be extended to applications of the present invention.

  The present invention provides a miniaturized opto-electronic magnification system that is a suitable accessory for internal reflection, infrared spectroscopy. An internal reflection device manufactured by ASI SensIR Technologies and sold as DuraSampIR (TM) is used as an example, but the invention is not limited thereto. FIG. 5 is a schematic representation of the miniaturized opto-electronic image magnifier module of the present invention mounted within the body of the DuraSampleI.

  Referring to FIG. 5, the infrared radiation energy 51 from the spectrometer 50 is directed by a mirror 52 to a zinc selenide (ZnSe) element 53 that transmits infrared radiation through a diamond-shaped window 54 attached to a fixture 55. To do. At the diamond-shaped surface 56, the radiant energy reflects inward so that the radiant energy returns through the diamond-shaped window 54 and the ZnSe element 53 and is directed to the mirror 57, which is then directed to the detector 58. Visible light source 500 illuminates surface 56 and this light is transmitted through diamond-shaped window 54 and ZnSe element 53 where it is collected by lens 501 and the image of surface 56 is a solid state photodetector 52. Formed on top. In FIG. 5, members 501, 502 and 504 are MOM modules 503. The electronic signal generated by the light-detector is processed by the camera electronics 504 and the electronic signal is sent to the video-monitor 505 for viewing an enlarged image of the surface 56. The image is magnified on the video-monitor screen. The image can have the same geometric direction as the sample, and movement from left to right and up and down is the same as the sample and the image. Power for the camera is provided by a power source 506. For the opaque sample, a visible light source 507 is disposed under the ZnSe element 53. Due to the high sensitivity of the CCD light-detector, all that is required is low power illumination.

  In this configuration, a 1/4 inch CCD element with a 12 mm focal length lens is preferred. With this combination in the DuraSamplIR, an IRE with a dimension of 1.5 mm will be enlarged to meet the vertical screen size of the monitor.

  Internal reflection spectroscopy is a very important method because it generates an ATR infrared spectrum for analyzing liquid or solid samples without the need for complete sample preparation. Only optical contact between the internal reflective element (IRE) and the sample is required. The use of a small IRE was a major advance in internal reflection spectroscopy. A small contact surface makes the analysis of solids more reproducible and quantitative. For transmission measurements in the mid-infrared spectral range, the sample must be thin (0.03 mm or less) and uniform. This requires special attention in preparing samples for analysis. For internal reflection, the sample thickness is established by the wavelength of radiation, the angle of incidence and the refractive index difference between the sample and the IRE. Large IRE elements are useful for quantitative analysis of liquids, but not for solids. A small IRE is only used when reproducible contact with a solid sample is possible. The present invention makes it possible to see the contact of a solid sample on a small IRE surface. While looking at this contact improves the reproducibility of the analysis, the analyst confirms that the correct sample is analyzed.

  The present invention also provides a simple video image system for inspecting an enlarged object. In this implementation, a fixed focus miniature opto-electronic magnifier is manufactured so that any object placed in its viewing port can be viewed as magnified on a monitor, computer terminal or TV. FIG. 6 is a schematic diagram showing a miniaturized opto-electronic magnification system included in a fixture for investigating opaque objects. In FIG. 6, the fixture 60 is a mechanical enclosure having a viewing port 61 supported by the enclosure. The viewing port 61 is a transparent, scratch-resistant material with a flat polished surface. Although glass and several plastics may be used for this viewing aperture, quartz and sapphire are suitable scratch resistant transparent materials. The lens 62 forms a real image of the outer surface of the viewing port 61 on the light-detector element 63. Lens 62 is selected to have a focal length and numerical aperture to produce the desired magnification and resolution. Multiple lenses on a rotating disk or slider can be used as well as a zoom lens system for variable magnification. The light-detector 63 is a CCD or other solid state video image device that supplies information to video camera electronics 64 that generates an electronic signal to the video monitor 65. The power for the camera is supplied by a power source 68. The sample is placed on the viewing surface 61 for inspection. The sample is illuminated by illumination 66 and / or 67. For general use, a total magnification of 5 to 200 times is most realistic, but a total magnification of up to 1,500 is possible.

  In this aspect, the miniaturized opto-electronic magnifying system does not have other movable parts capable of changing the magnification. The sample is placed on the viewing port and examined on a monitor. The magnified image can be recorded on a standard video recorder or transported to a computer through a video port. In this form, the present invention is expected to have applications in education and industrial inspection.

  The FT-Raman spectrometer provides another example, in which inserting the miniaturized opto-electronic magnification system of the present invention into the sample section of the spectrometer has a unique advantage. In FT-Raman, a strong laser containing an invisible near-infrared wavelength (ie 1064 nm) is used to excite the Raman spectrum. When viewed directly, this light will cause serious damage to the eye tissue. Since the laser beam is small, it is important to look at the sample so that the laser beam can be placed in the desired area. It is very important to see that the rays are focused using a non-uniform solid.

FIG. 7 is a schematic representation of the miniaturized photo-electron magnification system of the present invention placed in the sample section of an FT-Raman spectrometer to produce a magnified image of the sample to be analyzed. Referring to FIG. 7, a laser beam 70 travels through a small aperture in an aspherical mirror element 71 and is incident on a sample 72 contained in a glass tube 73. The laser radiation 70 is Raman scattering and the scattered radiation 74 is collected by an aspherical mirror 71. This mirror directs the Raman scattered radiation to the Fourier-transform spectrometer 75. The lens 76, the solid-state photodetector array 77 and the camera electronics 78 constitute a MOM module 79. This electronic image is sent to a video monitor 701 to display an enlarged image of the sample. The camera power is provided by a power source 702. The mirror 71, sample 73, sample container 72, and MOM module 79 are all included in the sample section (703) of the FT-Raman spectrometer.

  Although the sample section of the Raman spectrometer is small, the MOM module fits inside and can see the sample placement in the laser beam. This small size is an important factor. The sample can be viewed at a magnification of 10 to 200 times and the near-infrared laser beam is weakly detected by the solid state photodetector array. In this aspect, the sensing element needs to be modified. The standard shape of a silicon-based CCD camera used for normal visible light images has a near-infrared blocking filter placed on the device. For Raman applications, this filter must be removed from the CCD camera.

  Another object of the present invention is that a MOM module is included in the ATR probe to provide a magnified image of the contact surface between the internal reflective element and the sample. In this embodiment, the image plane mask limits the area of the interface irradiated with infrared radiation. The system also has a coaxial visible illumination and provides a means of viewing the area of the sample being analyzed using the MOM module.

  FIGS. 8a and 8b are schematic views of an ATR probe attachment device that specifically illustrates this application. Infrared radiation energy 80 from the spectrometer 79 is reflected from the mirror 81 to the mirror 82. Infrared radiation is focused by the mirror 82 onto the variable mask 83 and then continues to focus on the mirror 84. The mirror 84 redirects this ray onto the composite Zn-Se-diamond IRE 85 mounted in the fixture 101. At the surface 86 of the diamond 100, the radiant energy is reflected internally. After reflection from the IRE-sample boundary 86, the IRE element directs infrared radiation back to the mirror 84. Upon reflection from the mirror 84, the infrared radiation is again focused on the variable mask 83 and continues to focus on the mirror 82. A light beam is directed from mirror 82 to mirror 87 and then to infrared radiant energy detector 88. The sample is illuminated with visible light from illumination 89 when mirror 90 is placed in the infrared light path by mechanical means 91. This visible light is coaxial with the infrared light, passes through the variable mask 83 and is redirected by the mirror 84 to the IRE-sample interface. Visible light from the mirror 84 is directed to the transparent internal reflective element 85 to illuminate the sample area defined by the variable mask 83. An enlarged image of the illuminated sample-IRE interface is generated by reflecting light from the mirror 92 to a MOM 95 consisting of a lens 93, a light-detection array 94 and an electronic interface 97. The electronic signal is displayed on the video-display screen 96. Camera power is provided by a power source 98. This probe device has applications in extending analysis by ATR into containers, and analyzing biological growth on surfaces or materials on a production line.

  Thus, the new miniaturized opto-electronic magnification system provided by the present invention achieves the above objectives and eliminates the difficulties encountered with the use of conventional devices and systems, solving the problems and cost. And obtained the desired results described herein.

In the foregoing description, certain terms have been used for brevity, clarity and understanding, but such terms are for illustrative purposes only and are intended to be broadly interpreted.
It does not imply unnecessary limitations from them. The description and specific examples are exemplary, and the invention as defined in the claims is not limited to the details shown and described.

Claims (8)

(A) an internal reflection element having a surface made in contact with the sample and having a first optical path for measuring the spectrum and a second optical path for viewing the sample;
(B) a lens designed, configured and positioned to produce an enlarged image of the sample on an array of one or more photodetectors; and (c) the array of photodetectors; An electronic scaling device having a device for displaying or recording a further magnified image of the sample on an electronic display device;
The magnification of the image from the sample to the display is created in part by the lens, and the greater part of the magnification of the image from the sample to the display is greater than the electronic scaling. A photoelectron device for infrared spectrum analysis, characterized in that it is made by a device and is sized so that it can be installed in a sample chamber of a general-purpose FT-IR spectrometer.   2. The optoelectronic device for infrared spectrum analysis according to claim 1, wherein the internal reflection element includes a diamond layer defining the surface and a support layer made of a second infrared transmitting material.   3. The infrared electronic device for infrared spectrum analysis according to claim 2, wherein the support layer made of the second infrared transmitting material is made of zinc selenide or KRS-5. (A) an internal reflection element made of a material having a high refractive index that is transparent to both infrared and visible radiation energy, the element having a surface made in contact with the sample, An internal reflective element having a first optical path for performing measurements and a second optical path for viewing the sample;
(B) comprising a lens and an array of one or more photodetectors, the lens focusing on the sample through the internal reflective element along the second optical path, and of the photodetector Designed and configured to create a magnified real image of the sample on the array, and the photodetector is designed and configured to create an electrical signal representative of the magnified real image, 25-100 mm A miniaturized optoelectronic image magnifying module made to a size with a height of
(C) an electronic display device; and (d) an electronic image scaling device designed and configured to perform scaling of the electrical signal to produce a further magnified image of the sample on the display device;
Comprising
The magnification of the image from the sample to the display is created in part by the lens, and the greater part of the magnification of the image from the sample to the display is greater than the electronic scaling. A photoelectron device for infrared spectrum analysis, characterized in that it is made by a device and is sized so that it can be installed in a sample chamber of a general-purpose FT-IR spectrometer . A Fourier transform infrared spectrometer for performing spectral analysis,
(A) an internal reflection element made of a material having a high refractive index that is transparent to both infrared and visible radiation energy, the element having a surface made in contact with the sample, An internal reflective element having a first optical path for performing measurements and a second optical path for viewing the sample;
(B) Infrared radiant energy light source, designed and configured to focus the infrared radiant energy beam on the sample, collect the infrared radiant energy, and concentrate the energy on the infrared radiant energy detector A first optical system and electronic circuitry designed and configured to process electrical signals from the detector and generate infrared spectral data, where the detector exits the internal reflective element A spectral analysis system designed and configured to generate an electrical signal proportional to the intensity of infrared radiation energy; and (c) a miniaturized optoelectronic image magnification module located within the sample chamber of the spectrometer The module comprises a lens and an array of one or more photodetectors, the lens being along the second optical path the internal reflection Designed and configured and positioned to view a sample through the element and to create an enlarged real image of the sample on an array of one or more of the photodetectors, the photodetector An optoelectronic image magnifier module designed and configured to generate an electrical signal representative of the magnified real image, an electronic display device, and scaling the electrical signal to further expand the sample on the display device. Optical observation system with an electronic image scaling device designed and configured to produce
Comprising
The magnification of the image from the sample to the display is made in part by the lens, and the larger portion of the magnification of the image from the sample to the display is larger than the electronic scaling. A Fourier transform infrared spectrometer characterized in that it is produced by a device.   6. The Fourier transform infrared spectrometer according to claim 5, wherein the internal reflection element contains diamond, zinc selenide or KRS-5.   6. A Fourier transform infrared spectrometer according to claim 5, further comprising a diamond layer defining the surface and a support layer made of a second infrared transmitting material.   8. The Fourier transform infrared spectrometer according to claim 7, wherein the support layer made of the second infrared transmitting material is made of zinc selenide or KRS-5.

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