JP5329516B2 - Socket for contact probe and method for accommodating contact probe in the same - Google Patents

Description

  The present invention relates to a contact probe socket for accommodating a contact probe used for inspection of a printed circuit board or an electronic component, and a method for accommodating a contact probe therein, and in particular, a plurality of contact probes are individually detachably accommodated. The present invention relates to a contact probe socket and a method of accommodating a contact probe therein.

  Contact probe sockets used for inspection of printed circuit boards and electronic components are sockets for contact probes so that they can be inspected by simultaneously contacting multiple terminals or contacts of the printed circuit board or the like to be inspected for electrical connection. A plurality of them are housed side by side.

  For example, Patent Document 1 discloses a contact probe socket for housing such a contact probe. A contact probe is inserted into an insertion hole provided so as to penetrate the metal block, and an insulating substrate provided with a through hole for projecting an internal pin (plunger) of the contact probe is attached to both surfaces of the metal block. It has been. The insulating substrate abuts against the shoulder of the outer cylinder (metal pipe) of the contact probe, that is, surrounds the outer cylinder and prevents the contact probe from dropping from the insertion hole. In addition, the contact probe disclosed here is a type in which the internal pin protrudes outward at both ends in the longitudinal direction, which is referred to as a double type, but a single type that protrudes outward in only one of the longitudinal directions. There is also a contact probe called. Even in such a case, it is possible to prevent the contact probe from dropping out of the insertion hole by surrounding the outer cylinder as in the double type.

  By the way, as the contact probe is used, the protruding tip of the internal pin may be worn out or deformed, or an oxide film may be formed on the surface. Then, since it becomes difficult to perform an accurate test | inspection, the deteriorated contact probe will be replaced | exchanged. In such a case, in the contact probe socket as disclosed in Patent Document 1, it is necessary to remove the insulating substrate from the metal block and replace the metal block. In order to attach the insulating substrate to the substrate, it was necessary to perform a complicated operation to accurately align all the contact probes and the position of the insulating substrate.

  On the other hand, for example, Patent Document 2 discloses a contact probe socket that accommodates a plurality of contact probes individually and detachably. Degraded contact probes can be pulled out and replaced individually without disassembling the socket. Specifically, a coaxial spring contact probe is inserted into each of a plurality of through holes of a block body (socket) having a plurality of through holes arranged in a matrix. The inner wall of the through-hole is provided with a retaining projection, and the stop ring provided on the outer cylinder (shell) is locked to the retaining projection, thereby energizing the internal pin (plunger). That is, the contact probe does not move toward the back side of the block body. On the other hand, when exchanging the contact probe, the contact probe is pulled out toward the urging direction of the internal pin (plunger), that is, toward the front side of the block body, and can be removed.

JP 2010-175371 A JP 2009-103655 A

  As the number of contact probes per area increases, the alignment between the inspection object and the contact probe becomes very strict. Therefore, it is preferable that only the deteriorated contact probe can be replaced without removing the contact probe socket from the inspection device. In such a case, it is required that the contact probe can be exchanged in a narrow space, and that the contact probe can be easily detached.

  The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a contact probe socket for individually detachably accommodating a plurality of contact probes and a method for accommodating the same. That is.

  A socket for a contact probe according to the present invention includes an outer cylinder having a circumferential recess formed on the outer peripheral surface so as to form a circumferential projection toward the inside, and a spring body accommodated in the outer cylinder in the longitudinal direction of the outer cylinder. A socket for a contact probe for accommodating a plurality of contact probes composed of internal pins urged so as to protrude from one end along the line and comprising a pair of block plates combined with the main surfaces attached together The block plate body includes a plurality of side-by-side through holes that pass through the main surface substantially perpendicularly to the main surface and allow the contact probe to be inserted, and a counterbore portion around the through hole in the abutted main surface. The C-ring which can be fitted in the circumferential recess of the outer cylinder of the contact probe is accommodated in the counterbore and the contact probe in the through hole is provided. Wherein the can detachably hold the over drive.

  According to this invention, by moving the contact probe along the through-hole, the C-ring located at the counterbore and not movable along the through-hole moves relatively from the circumferential recess of the outer cylinder of the contact probe. The contact probe can be easily detached from the contact probe socket. That is, even in a narrow space, the contact probe can be easily replaced without removing the socket from the jig or the like.

  In the above-described invention, the contact probe may be removable in a direction opposite to a biasing direction of the internal pin by the spring body. According to this invention, the contact probe can be easily detached from the contact probe socket by pushing it in the stress load direction to the internal pin of the spring body, and the replacement work can be facilitated even in a narrow space. is there.

  In the above-described invention, the contact probe may be detachable toward both sides of the main surface of the block plate. According to this invention, the contact probe can be dropped in the necessary direction on both sides of the contact probe socket, and the replacement work can be facilitated even in a narrow space.

  In the above-described invention, the C-ring may be made of a wire body having a substantially circular cross section. According to this invention, the contact probe can be easily detached from the contact probe socket, and the replacement work can be facilitated.

  In the above-described invention, the inner diameter and the outer diameter of the C-ring may be smaller than the outer diameter of the outer cylinder and larger than the diameter of the through hole. According to this invention, the C-ring is reliably positioned in the spot facing portion, the contact probe can be easily detached from the contact probe socket, the replacement work can be facilitated, and the contact probe can be securely fixed to the socket. is there.

  Furthermore, the housing method for arranging a plurality of contact probes according to the present invention in a contact probe socket includes an outer cylinder having a circumferential concave portion formed on the outer peripheral surface so as to form a circumferential convex portion toward the inside, and an inside thereof. A housing method in which a plurality of contact probes comprising internal pins that are housed and biased so as to protrude from one end along the longitudinal direction of the outer cylinder by a spring body are housed in a socket for contact probes. The block plate body comprises a pair of block plate bodies assembled together, and the block plate body passes through the main surface substantially perpendicular to the main surface and a plurality of aligned through holes into which the contact probes are inserted, and the main surface abutted against each other And a counterbore around the through hole, and a C-ring is fitted into the circumferential recess of the outer cylinder of the contact probe, The contact probe is accommodated in the other through hole of the block plate after the contact probe is accommodated in one of the through holes of the block plate so that the C-ring is positioned in the spot facing portion. As described above, the main surfaces of the pair of block plate bodies are combined and combined.

  According to this invention, after the C-ring is fitted in the circumferential concave portion of the outer cylinder of the contact probe, it can be easily arranged in the spot facing portion. That is, by moving the contact probe along the through-hole, the C-ring located at the spot facing portion and cannot move along the through-hole moves relatively from the circumferential recess of the outer cylinder of the contact probe and opens. The contact probe can be easily detached from the contact probe socket. That is, even in a narrow space, the contact probe can be easily replaced without removing the socket from the jig or the like.

  In the above-described invention, the C-ring is opened by applying a force larger than the force for moving the internal pin in the direction opposite to the biased direction, and the circumferential recess and the C-ring are fitted to each other. By eliminating the above, the contact probe may be allowed to drop in a direction opposite to the biasing direction of the internal pin. According to this invention, the contact probe can be easily detached from the contact probe socket. That is, even in a narrow space, the contact probe can be easily replaced without removing the socket from the jig or the like.

1 is a perspective view of a contact probe socket and a contact probe accommodated therein according to the present invention. It is (a) top view of the component which comprises the socket for contact probes by this invention, and (b) sectional drawing. It is (a) top view of the component which comprises the socket for contact probes by this invention, and (b) sectional drawing. It is (a) top view of the component which comprises the socket for contact probes by this invention, and (b) sectional drawing. It is the (a) side view of the contact probe of FIG. 1, and (b) sectional drawing. It is sectional drawing which shows the method of accommodating a contact probe in the socket for contact probes by this invention. It is sectional drawing of the socket for contact probes by this invention.

  The contact probe socket according to one embodiment of the present invention will be described in detail with reference to FIGS.

  In particular, as shown in FIG. 1, the socket 1 is a plate-like block body in which the main surfaces of two plate bodies of the upper plate 2 and the lower plate 3 are butted and combined, and the pin portion 23 of the contact probe 10 is connected to the socket 1. A plurality of contact probes 10 are arranged in a predetermined arrangement so as to protrude from the main surface. Although details will be described later, the pin portion 23 is electrically connected by being brought into contact with a substrate to be inspected or an object to be inspected (not shown) and functions as a meter reading. The lower plate 3 and the upper plate 2 can be selected from materials and shapes suitable for a target inspection application, and are, for example, substantially rectangular parallelepipeds made of PEEK (Polyetherethertone) resin mixed with ceramics.

  Referring to FIGS. 2 and 3 together, the upper plate 2 and the lower plate 3 have through-holes 5 that are combined with each other and penetrate perpendicularly or at an angle to the main surface. Specifically, the upper plate 2 is formed with a plurality of upper plate holes 5a having a cylindrical inner peripheral surface with an inner diameter U, and the lower plate 3 is formed with lower plate holes 5b with an inner diameter U, which communicate with each other. A through hole 5 having an inner diameter U is formed. In the vicinity of the opening of the upper plate hole 5a on the main surface of the upper plate 2 facing the lower plate 3, a counterbore portion 2a having an inner diameter U 'larger than the inner diameter U is formed.

  Referring also to FIG. 4, a C-ring 4 having flexibility is accommodated in the counterbore 2a of each upper plate hole 5a. The C ring 4 is accommodated between the counterbore 2a and the main surface of the lower plate 3, and deformation of the upper plate hole 5a in the direction of the axis P (see FIGS. 2 and 3) is restricted. It can be deformed only in a plane substantially perpendicular to the P direction. The C ring 4 is a spring body obtained by processing a steel wire having a substantially circular cross section into a C shape and applying heat treatment. The inner diameter 4a and outer diameter 4b of the C ring 4 are the inner diameter and outer diameter in a state where no force is applied from the outside when the C-shaped body is assumed to be an annular body by connecting one end and the other end with a line. Is the diameter. The inner diameter 4a of the C ring 4 is smaller than the outer diameter Q of the barrel 11 of the contact probe 10 described later, and the outer diameter 4b is larger than the inner diameter U of the upper plate hole portion 5a and the lower plate hole portion 5b.

  Next, as shown in FIG. 5, the contact probe 10 includes a tubular barrel 11 having an outer diameter Q, two plungers 13 accommodated therein, and a coil that biases them toward both ends of the barrel 11. And a spring 12 that is a spring body made of a spring. The barrel 11 has two throttle parts 21 whose outer peripheral surfaces are deformed so as to reduce the inner diameter in the vicinity of both ends in the longitudinal direction. The two narrowed portions 21 are plastic-worked (circumferential concave portion) from the outer peripheral surface to the inside along the circumferential shape, and are formed by projecting the inner peripheral surface to the inside along the circumferential shape (circular convex portion). ) That is, the two throttle portions 21 have an outer diameter Q ′ that is smaller than the outer diameter Q of the barrel 11. Here, the longitudinal section of the narrowed portion 21 is preferably a part of a circular arc (see FIG. 5B).

  The plunger 13 is a stepped round bar composed of a cylindrical main body portion 22 and a long pin portion 23 having a smaller diameter. The outer diameter of the cylindrical main body portion 22 is slightly smaller than the inner diameter of the barrel 11, and the main body portion 22 is accommodated in the barrel 11 with the protruding end portion of the pin portion 23 facing the end portion of the barrel 11. . Thereby, although the plunger 13 is movable along the longitudinal direction of the barrel 11, since the outer diameter of the cylindrical main body portion 22 is larger than the inner diameter of the throttle portion 21 whose inner diameter is reduced, the main body portion 22 is When it comes into contact with the throttle portion 21, the movement of the plunger 13 in the end portion direction is further restricted. The barrel 11 accommodates two plungers 13, and a spring 12 is provided between them, and the two plungers 13 are urged toward the opposite ends of the barrel 11, respectively. In normal times other than when the contact probe 10 is used for inspection, the main body portion 22 abuts on the throttle portion 21, and the two plungers 13 project the tip portions of the pin portion 23 from both end portions of the barrel 11. ing. On the other hand, at the time of inspection or the like, a force larger than the restoring force of the spring 12 is applied so as to push the pin portion 23 along the axis of the barrel 11 toward the inside of the barrel 11. It can be pushed and moved inward along the axis.

  The contact probe 10 is a contact probe called a double type that projects the pin portion 23 toward both ends of the barrel 11, but may be another contact probe such as a single type. Further, although the spot facing portion 2a is formed in the upper plate hole portion 5a, it may be formed in the lower plate hole portion 5b. Further, it may be formed across both the upper plate 2 and the lower plate 3.

  By the way, the socket 1 accommodates a plurality of contact probes 10 and is attached to a jig (not shown), and the projected pin portion 23 of the contact probe 10 is connected to a plurality of terminals of a substrate to be inspected such as a printed board or an electronic component. The test can be performed by pressing the contacts simultaneously and electrically connecting them. In such a case, if the pin portion 23 is damaged by impact or the tip portion is deteriorated, the inspection cannot be performed accurately. Therefore, the contact probe 10 may need to be replaced.

  Next, in the above-described embodiment, details of a method for accommodating the contact probe 10 in the socket 1 and a method for attaching and detaching the contact probe 10 to and from the socket 1 will be described with reference to FIG.

  First, in the first case where the contact probe 10 is accommodated in the socket 1, the diameter of the C ring 4 is expanded and fitted around the outer peripheral surface of the barrel 11 of the contact probe 10. It is moved along the longitudinal direction. Thereby, the C-ring 4 is fitted to one of the two throttle parts 21 so that the expanded diameter is restored. Next, the contact probe 10 provided with the C ring 4 is seated in the upper plate hole portion 5a of the upper plate 2 with the other throttle portion 21 side of the throttle portion 21 into which the C ring 4 is fitted leading. The bore portion 2a is inserted from a given surface (see FIG. 6A). Since the outer diameter 4b of the C ring 4 is at least larger than the inner diameter U of the upper plate hole portion 5a, the C ring 4 is accommodated inside the counterbore portion 2a and the contact probe 10 is placed inside the upper plate hole portion 5a. No further progress is made (see FIG. 6B). At this time, the advancing end portion to the upper plate hole portion 5 a of the barrel 11 is inside the upper plate hole portion 5 a, while the tip portion of the pin portion 23 protrudes from the surface of the upper plate 2. Similarly, a plurality of contact probes 10 are accommodated in the upper plate holes 5a, and the lower plate holes 5b of the lower plate 3 are made to correspond to the respective contact probes 10, and the upper plate 2 and the lower plate 3 are attached by a predetermined fixing method. Fix in combination (see FIG. 6C). As described above, the contact probe 10 is completely accommodated in the socket 1, and the socket 1 is attached to a predetermined device (not shown) with a jig or the like.

  On the other hand, when the contact probe 10 is dropped from the socket 1, the pin portion 23 of the contact probe 10 is directed in the arrow direction X1 or the arrow direction X2 while the socket 1 is attached to a predetermined device (not shown). Pull like so. That is, when a force is applied in the arrow direction X1 or the arrow direction X2 urged by the spring 12 of each plunger 13, the plunger 13 abuts on the throttle portion 21, and the barrel 11 is pulled out from the through hole 5 of the socket 1. Try to move to. On the other hand, as described above, the C-ring 4 arranged in the spot facing portion 2a cannot move in the direction in which the barrel 11 is about to move within the socket 1. Therefore, the C ring 4 moves along the side surface of the narrowed portion 21 of the contact probe 10 and is deformed so as to open both ends of the C-shaped body. Subsequently, when a force is applied to the contact probe 10, the contact probe 10 comes out of the through hole 5 of the socket 1 and falls out of the socket 1. At this time, the C-ring 4 remains in the counterbore 2a in the socket 1 (see FIG. 7).

  Similarly, even if the barrel 11 is pushed in the arrow direction X1 or the arrow direction X2 (or the barrel 11 is pulled), the contact probe 10 can be dropped from the through hole 5 of the socket 1. That is, when a force is applied in a direction opposite to the direction urged by the spring 12 of each plunger 13, the spring 12 contracts, but when the force is further applied, one plunger 13 causes the other plunger 13 to move. It comes to push. When the pushed main body portion 22 of the plunger 13 comes into contact with the throttle portion 21 of the barrel 11 and is pushed further strongly, the C ring 4 is also deformed so as to open and open both ends of the C-shaped body, The contact probe 10 can be removed from the through hole 5 of the socket 1.

  By the way, the new contact probe 10 is inserted into the through hole 5 without providing the C ring 4. That is, a new contact probe 10 is inserted into the through hole 5 in the direction opposite to the direction in which the contact probe 10 is pulled out from the through hole 5 of the socket 1. When the barrel 11 of the contact probe 10 reaches the spot facing portion 2 a, the C ring 4 remaining in the spot facing portion 2 a is deformed so as to open both ends of the C-shaped body and open on the outer peripheral surface of the barrel 11. Wrap around. Further, when the contact probe 10 is pushed along the through hole 5, the C ring 4 moves relative to the barrel 11. The C ring 4 is deformed so as to close both ends of the C-shaped body at the narrowed portion 21. After this deformation, unless the contact probe 10 is pushed along the through hole 5 so as to open and deform both ends of the C-shaped body of the C ring 4, the movement of the contact probe 10 along the through hole 5 is Stop. As a result, the contact probe 10 is accommodated in the socket 1.

  As described above, according to the present embodiment, the contact probe 10 can be detached from both main surfaces of the upper plate 2 and the lower plate 3. Further, it is not necessary to disassemble the socket 1 into the upper plate 2 and the lower plate 3. Furthermore, it is not necessary to remove the socket 1 from a device (not shown). That is, the contact probe 10 can be exchanged efficiently even in a narrow space.

  In the first case where the contact probe 10 is accommodated in the socket 1, the C ring 4 is accommodated inside the counterbore 2 a of the upper plate 2, and then the upper plate 2 is fixed with a predetermined fixing method. The lower plate 3 may be combined and fixed, and then the contact probe 10 may be inserted into the through hole 5 as described above.

  As mentioned above, although the Example by this invention and the modification based on this were demonstrated, this invention is not necessarily limited to this, A person skilled in the art will deviate from the main point of this invention, or the attached claim. Various alternative embodiments and modifications could be found without doing so.

DESCRIPTION OF SYMBOLS 1 Socket 2 Upper board 2a Counterbore part 3 Lower board 4 C ring 5 Through-hole 5a Upper board hole part 5b Lower board hole part 10 Contact probe 11 Barrel 12 Spring 13 Plunger 21 Restriction part

Claims (7)

An outer cylinder having a circumferential concave portion formed on the outer peripheral surface so as to form a circumferential convex portion toward the inside, and a spring body that is housed in the outer cylinder and protrudes from one end portion along the longitudinal direction of the outer cylinder. A socket for contact probes for accommodating a plurality of contact probes composed of energized internal pins,
Consists of a pair of block plates combined with their main surfaces,
The block plate is
A plurality of aligned through-holes that pass through the main surface substantially perpendicularly and allow the contact probe to be inserted;
A counterbore around the through hole on the butted main surface,
A contact having a C-ring that can be fitted in the circumferential recess of the outer cylinder of the contact probe is accommodated in the counterbore, and the contact probe in the through-hole can be detachably held. Probe socket.   The contact probe socket according to claim 1, wherein the contact probe can be dropped in a direction opposite to a biasing direction of the internal pin by the spring body.   The contact probe socket according to claim 2, wherein the contact probe is detachable toward both sides of the main surface of the block plate.   The contact probe socket according to claim 1, wherein the C-ring is formed of a wire body having a substantially circular cross section.   The contact probe socket according to claim 4, wherein an inner diameter and an outer diameter of the C-ring are smaller than an outer diameter of the outer cylinder and larger than a diameter of the through hole. An outer cylinder having a circumferential concave portion formed on the outer peripheral surface so as to form a circumferential convex portion toward the inside, and a spring body that is housed in the outer cylinder and protrudes from one end portion along the longitudinal direction of the outer cylinder. An accommodation method for accommodating a plurality of contact probes composed of energized internal pins in a contact probe socket,
The block plate body is made up of a pair of through holes that pass through the main surface substantially perpendicularly to the main surface and insert the contact probe. A counterbore around the through hole in the main surface,
A C-ring is fitted into the circumferential recess of the outer cylinder of the contact probe, and the contact probe is accommodated in one through-hole of the block plate body so that the C-ring is positioned in the counterbore. After that, the housing method comprising combining the main surfaces of the pair of block plate bodies together so that the contact probe is housed in the other through hole of the block plate body. By applying a force larger than the force that moves the internal pin in the direction opposite to the biased direction, the C ring is opened, and the fitting between the circumferential recess and the C ring is eliminated. The accommodation method according to claim 6, wherein the contact probe can be detached in a direction opposite to a biasing direction of the internal pin.

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