JP5127302B2 - Endoscope device for measurement and program - Google Patents

Description

  The present invention relates to a measurement endoscope apparatus that performs measurement processing of a measurement object based on an image captured using an electronic endoscope, and a program for controlling the operation thereof.

In a gas turbine mainly used for an aircraft, the edge of a turbine blade or a compressor blade may be damaged due to entry of foreign matter or the like. The defect size of the blade is one of the conditions for judging the replacement of the blade, and its inspection is extremely important. In such a situation, in the conventional measuring endoscope, the defect edge of the turbine blade or the compressor blade is approximated by a virtual curve and a virtual point, and the defect size is measured based on the approximation (for example, Patent Document 1).
JP-A-2005-204724

  However, in the conventional method, since the missing edge is approximated by a parametric curve, it is necessary to designate at least three reference points in order to calculate one virtual curve, and manually calculate the calculated virtual curve. There is a problem in that the operation becomes complicated because it is necessary to adjust the shape of the edge by adjusting the position. In addition, with respect to the defect formed at the corner of the measurement object including the vertex of the corner, the edge of the corner defect is approximated by one virtual curve and a virtual point on the curve. In this case, there is a problem that the operation becomes complicated.

  The present invention has been made in view of the above-described problems, and an object of the present invention is to provide an endoscope apparatus for measurement and a program that can reduce the troublesomeness of the operation and improve the operability.

The present invention has been made in order to solve the above-described problems. An electronic endoscope that images a measurement object and generates an imaging signal, an image processing unit that generates a video signal based on the imaging signal, In a measurement endoscope apparatus comprising a measurement processing unit that performs measurement processing of the measurement object based on the video signal, and a display unit that displays an image based on the video signal, the measurement processing unit includes: A reference point designating unit for designating two reference points on the measurement object, and a first contour approximation line that approximates the contour of the measurement object based on one of the two reference points. And a contour approximation calculating means for calculating a second contour approximation line that approximates the contour of the measurement object based on the other reference point, the two reference points, the first contour approximation line, and a second contour approximation line. based on the contour approximation line, the And defect structure point calculation means for calculating the defect configuration points forming the contour of the defect formed on the measured object, the defect in accordance with an angle between the first contour approximation line and the second contour approximation line A defect type determining means for determining a type; a defect measuring means for measuring the size of the defect based on the defect constituent points; and a gradation reducing means for reducing the gradation of an image based on the video signal. The display means is an endoscope apparatus for measurement, further displaying an image whose gradation is reduced by the gradation reducing means.

  Moreover, in the endoscope apparatus for measurement according to the present invention, the defect measuring means calculates the parameter corresponding to the type of defect as a parameter indicating the size of the defect.

Moreover, in the endoscope apparatus for measurement according to the present invention, the missing component point calculating means calculates an intersection point of the first contour approximate line and the second contour approximate line as one of the missing component points. It is characterized by that.

  In the measurement endoscope apparatus according to the present invention, the defect measurement means calculates at least two types of parameters as parameters indicating the size of the defect.

In the measuring endoscope apparatus according to the present invention, the contour approximate line calculation means calculates at least two feature points on the contour line of the measurement object around the one reference point, and the at least 2 The first contour approximate line is calculated based on one feature point, and at least two feature points on the contour line of the measurement object around the other reference point are calculated, and the at least two feature points The second contour approximation line is calculated based on the above .

  In the measurement endoscope apparatus according to the present invention, the gradation reduction unit converts the image based on the video signal into a binarized image in which the signal level is binarized.

In the measurement endoscope apparatus according to the present invention, a first state in which at least an image whose gradation is reduced by the gradation reduction means is displayed, and an image whose gradation is reduced by the gradation reduction means are displayed. The display means further includes a switching means for switching a display state between a second state in which an image before the gradation is reduced by the gradation reduction means is displayed without being displayed, and the display means includes the first The display state can be switched between the state and the second state, and an image is displayed in the display state switched by the switching unit .

  The measurement endoscope apparatus of the present invention further includes input means for a user to input timing for switching the display state, and the switching means switches the display state at the timing input to the input means. It is characterized by that.

In addition, the measuring endoscope apparatus according to the present invention further includes a time measuring unit that measures a preset time, and the switching unit starts from the first timing when the display state is switched by the time measuring unit. The display state is switched again at a second timing when the measured time has elapsed.
In the measurement endoscope apparatus of the present invention, the switching unit switches the display state to the first display state after the size of the defect is measured.

  In the measurement endoscope apparatus according to the present invention, the display means includes first and second image display areas in which an image can be displayed, and the gradation is reduced by the gradation reduction means. An image is displayed in one or both of the first and second image display areas.

Further, the present invention provides an electronic endoscope that images a measurement object and generates an imaging signal, an image processing unit that generates a video signal based on the imaging signal, and the measurement object based on the video signal. In a program for controlling an operation of a measurement endoscope apparatus including a measurement processing unit that performs measurement processing and a display unit that displays an image based on the video signal, the measurement processing unit includes the measurement target A reference point specifying means for specifying two reference points on the object, and calculating a first contour approximation line that approximates the contour of the measurement object based on one of the two reference points, A contour approximation calculating means for calculating a second contour approximation line that approximates the contour of the measurement object based on the other reference point; the two reference points; the first contour approximation line; and a second contour approximation. based on the line, the measuring And defect structure point calculation means for calculating the defect configuration points forming the contour of the defect formed on the elephant product, the type of the defect in accordance with an angle between the first contour approximation line and the second contour approximation line A defect type determining means for determining, a defect measuring means for measuring the size of the defect based on the defect constituent points, and a gradation reducing means for reducing the gradation of the image based on the video signal, The display means is a program further displaying an image whose gradation is reduced by the gradation reduction means.

  According to the present invention, since it is possible to measure the defect size by designating two reference points, it is possible to reduce the inconvenience of the operation and improve the operability.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 shows the configuration of a measuring endoscope apparatus according to an embodiment of the present invention. As shown in FIG. 1, the measurement endoscope apparatus according to the present embodiment includes an endoscope 2, a control unit 3, a remote controller 4 (input means), a liquid crystal monitor 5, and a face mount display (FMD). 6, an FMD adapter 6 a, optical adapters 7 a, 7 b and 7 c, an endoscope unit 8, a camera control unit 9, and a control unit 10.

  An endoscope 2 (electronic endoscope) that captures an image of a measurement object and generates an imaging signal includes an elongated insertion unit 20. The insertion portion 20 is configured by connecting, in order from the distal end side, a rigid distal end portion 21, a bending portion 22 that can be bent vertically and horizontally, and a flexible tube portion 23 having flexibility. A proximal end portion of the insertion portion 20 is connected to the endoscope unit 8. The distal end portion 21 is configured such that various optical adapters such as stereo optical adapters 7a and 7b having two observation fields or a normal observation optical adapter 7c having only one observation field can be attached and detached by, for example, screwing. Yes.

  The control unit 3 includes an endoscope unit 8, a camera control unit (hereinafter referred to as CCU) 9 that is an image processing unit, and a control unit 10 that is a control device. The endoscope unit 8 includes a light source device that supplies illumination light necessary for observation, and a bending device that bends the bending portion 22 that constitutes the insertion portion 20. The CCU 9 receives an imaging signal output from the solid-state imaging device 2 a built in the distal end portion 21 of the insertion unit 20, converts this into a video signal such as an NTSC signal, and supplies the video signal to the control unit 10.

  The control unit 10 includes an audio signal processing circuit 11, a video signal processing circuit 12, a ROM 13, a RAM 14, a PC card interface (hereinafter referred to as PC card I / F) 15, and a USB interface (hereinafter referred to as USB). (Described as I / F) 16, an RS-232C interface (hereinafter referred to as RS-232C I / F) 17, and a measurement processing unit 18.

  An audio signal collected by the microphone 34, an audio signal obtained by reproducing a recording medium such as a memory card, or an audio signal generated by the measurement processing unit 18 is supplied to the audio signal processing circuit 11. The video signal processing circuit 12 generates a video signal from the CCU 9 under the control of the measurement processing unit 18 in order to display a composite image obtained by synthesizing the endoscopic image supplied from the CCU 9 and the graphic operation menu. A process of combining with a display signal for an operation menu or the like is performed. In addition, the video signal processing circuit 12 performs a predetermined process on the combined video signal and supplies it to the liquid crystal monitor 5 in order to display the video on the screen of the liquid crystal monitor 5.

  The PC card I / F 15 can freely attach and detach a memory card (recording medium) such as the PCMCIA memory card 32 and the flash memory card 33. By mounting the memory card, the control processing information and image information stored in the memory card are taken in, or the control processing information and image information are recorded on the memory card according to the control of the measurement processing unit 18. be able to.

  The USB I / F 16 is an interface for electrically connecting the control unit 3 and the personal computer 31 (input means). By electrically connecting the control unit 3 and the personal computer 31 via the USB I / F 16, various control instructions such as an instruction to display an endoscopic image on the personal computer 31 side and image processing at the time of measurement are performed. Can be performed. Also, various processing information and data can be input / output between the control unit 3 and the personal computer 31.

  The RS-232C I / F 17 is connected to the CCU 9 and the endoscope unit 8, and is connected to the remote controller 4 for controlling and operating the CCU 9 and the endoscope unit 8. When the user operates the remote controller 4, communication necessary for controlling the operation of the CCU 9 and the endoscope unit 8 is performed based on the operation content.

  FIG. 2 shows the configuration of the measurement processing unit 18. As shown in FIG. 2, the measurement processing unit 18 includes a control unit 18a, a reference point specifying unit 18b, a reference curve calculating unit 18c, a missing component point calculating unit 18d, a defect type determining unit 18e, and a defect size calculating unit. 18f, a storage unit 18g, a gradation reduction unit 18h, and a time measurement unit 18i. Each configuration in the measurement processing unit 18 may be configured as hardware dedicated to the measurement processing, or corresponds to each configuration in the measurement processing unit 18 by the CPU executing a program stored in the ROM 13. The function may be executed by the CPU.

  The control unit 18a (control unit, switching unit) controls each unit in the measurement processing unit 18. The control unit 18 a also has a function of generating a display signal for displaying a measurement result, an operation menu, and the like on the liquid crystal monitor 5 or the face mount display 6 (display unit) and outputting the display signal to the video signal processing circuit 12. Yes.

  The reference point specifying unit 18b (reference point specifying means) specifies a reference point (details of the reference point will be described later) on the measurement object based on a signal input from the remote controller 4 or the personal computer 31. When the user inputs two desired reference points while looking at the image of the measurement object displayed on the liquid crystal monitor 5 or the face mount display 6, the coordinates are calculated by the reference point designating unit 18b.

  The reference curve calculation unit 18c (contour approximate line calculation means) is based on the reference point designated by the reference point designation unit 18b, and the reference curve corresponding to the contour approximation line that approximates the contour of the measurement object (details of the reference curve) Is calculated later). The missing component point calculating unit 18d (missing component point calculating means) is configured to construct a defect outline (edge) formed on the measurement object based on the reference point and the reference curve. (To be described later).

  The defect type discriminating unit 18e (defect type discriminating means) calculates an angle formed by two reference curves corresponding to the two reference points designated by the reference point designating unit 18b, and determines the type of the defect according to the angle. Determine. The defect size calculation unit 18f (defect measurement means) measures the size of the defect based on the defect constituent points. The storage unit 18g stores various types of information processed in the measurement processing unit 18. Information stored in the storage unit 18g is appropriately read out by the control unit 18a and output to each unit.

  The gradation reduction unit 18h (gradation reduction means) executes processing for reducing the gradation of the image based on the video signal. More specifically, the gradation reduction unit 18h takes out luminance data from the image, generates a grayscale image having, for example, 256 levels of luminance, and converts the grayscale image into binary, quaternary, or 8-level. Convert to luminance image. In the following description, it is assumed that the gradation reduction unit 18h binarizes the signal level of the captured image and converts the image into a binarized image (monochrome image). The time measuring unit 18i (time measuring unit) performs time measurement according to an instruction from the control unit 18a.

  Next, the contents of terms used in the present embodiment will be described. First, a reference point, a reference curve, and a reference point area will be described with reference to FIG. The reference points 301 and 302 are points that the user actually designates on the displayed measurement screen, and are points on the edge that are located on both sides of the defect 300 and do not have a defect as shown in FIG.

  The reference curves 311 and 312 are curves that approximate the contour (edge) of the measurement object, and are calculated based on the two reference points 301 and 302. In the present embodiment, in particular, the imaging optical system installed at the distal end of the endoscope 2 (in the distal end portion 21) and the imaging optical system separately attached to the distal end of the endoscope 2 (optical adapters 7a, 7b, 7c). A reference curve is calculated as a distortion correction curve obtained by correcting the distortion.

  The reference point areas 321 and 322 are image ranges for extracting edges around the reference point when the reference curves 311 and 312 are obtained. The sizes of the reference point areas 321 and 322 are preferably set to values suitable for the calculation of the distortion correction curve.

  Next, with reference to FIG. 4 to FIG. 5, types of defects, defect start points / end points / vertices, and defect component points will be described. There are two types of defects to be measured in the present embodiment: edge defects and corner defects. The side defect is a defect formed on the edge of the measurement target edge like the defect 400 in FIG. 4, and the corner defect is the defect formed in the edge of the measurement target edge like the defect 500 in FIG. It is.

  The defect start points 401 and 501 are points that are first recognized as points constituting a defect in the defect calculation described later on the displayed measurement screen. The defect end points 402 and 502 are points that are finally recognized as points constituting the defect. The missing vertex 503 is a point that is recognized as an intersection of the two reference curves 521 and 522 in the corner defect 500. The missing component points 410 and 510 are points that constitute the edge of the defect formed on the measurement object, and include a defect start point, a defect end point, and a defect vertex.

  Next, the defect size will be described with reference to FIGS. The defect size is a parameter representing the size of the detected defect. The defect size calculated in the present embodiment is the width, depth, and area of the defect in the defect of the side, and the width, length, and area of the defect in the defect of the corner. More specifically, the width of the defect is a spatial distance between the defect start point and the defect end point. The depth of the defect is a spatial distance from a predetermined defect constituent point to a straight line connecting the defect start point and the defect end point. The missing edges are the spatial distance between the missing vertex and the missing start point and the spatial distance between the missing vertex and the missing end point. The area of the defect is a spatial area of a region surrounded by all the defect composing points.

  FIG. 6 shows the defect size of the side, and the defect width 600 is calculated as a spatial distance between the defect start point 611 and the defect end point 612 by the defect calculation described later. The defect depth 601 is calculated as a spatial distance from a predetermined defect constituent point 613 to a straight line connecting the defect start point 611 and the defect end point 612. The area of the defect is calculated as a spatial area of a region 620 surrounded by all the defect component points including a defect component point (not shown).

  FIG. 7 shows a corner defect size, and a defect width 700 is calculated as a spatial distance between a defect start point 711 and a defect end point 712 by a defect calculation described later. The missing side 701 is calculated as the spatial distance between the missing vertex 713 and the missing start point 711, and the missing side 702 is calculated as the spatial distance between the missing vertex 713 and the missing end point 712. The area of the defect is calculated as a spatial area of a region 720 surrounded by all the defect component points including a defect component point (not shown).

  Next, measurement points and measurement point areas will be described with reference to FIG. The measurement point 801 is a point on the edge of the measurement object on the displayed measurement screen, and sequentially in the direction (direction T8) from the first reference point 802 to the second reference point 803 in the defect calculation described later. Searched. Furthermore, some of the searched measurement points are recognized as missing constituent points.

  The measurement point area 804 is an image range for extracting an edge around the measurement point when searching for the measurement point 801. The size of the measurement point area 804 is preferably set to a value suitable for edge extraction.

  Next, feature points will be described with reference to FIGS. The feature points 901 and 902 and the feature points 1001 and 1002 are characteristic points on the edge extracted in the reference point area 910 including the reference point 903 and the measurement point area 1010 including the measurement point 1003. The feature points 901 and 902 extracted in the reference point area 910 are used to calculate a reference curve by a defect calculation described later. Also, some of the feature points extracted in the measurement point area 1010 and the like are selected as measurement points in the defect calculation.

  Next, the procedure of defect measurement in this embodiment will be described. First, with reference to FIG. 11 to FIG. 12, a procedure for defect measurement and a measurement screen will be described. FIG. 11 shows a procedure for defect measurement, and FIG. 12 shows a measurement screen. In the measurement screen shown in FIG. 12 or the like used for the following description, the operation menu or the like may be omitted if it is not necessary for the description. In FIG. 12, measurement screens 1200, 1210, and 1220 are measurement screens when edge loss is a measurement target, and measurement screens 1230, 1240, and 1250 are measurement screens when corner loss is a measurement target. is there.

  In this embodiment, loss measurement by stereo measurement is performed. In stereo measurement, since the measurement object is imaged with the stereo optical adapter attached to the distal end portion 21 of the endoscope 2, an image of the measurement object is displayed in a pair on the measurement screen.

  In the defect measurement, first, when the user designates two reference points on the measurement screen displayed on the liquid crystal monitor 5 or the face mount display 6 by operating the remote controller 4 or the personal computer 31, the designated reference point is selected. Information is input to the measurement processing unit 18 (step SA). At this time, it is desirable for the user to select points on both sides of the defect and on the edge where the defect does not exist as reference points. In FIG. 12, reference points 1201 and 1202 and reference points 1231 and 1232 in the left image are designated.

  Subsequently, based on the coordinates of the designated reference point, the measurement processing unit 18 performs loss calculation (step SB). In the defect calculation, the coordinates of the defect component points and the defect size are calculated, and the defect type is determined. Measurement screens 1210 and 1240 are measurement screens being calculated. Details of the loss calculation will be described later.

  When the defect calculation is completed, the detected defect area is displayed on the measurement screen (step SC) and the defect type and the defect size are displayed (steps SD to SE) according to an instruction from the measurement processing unit 18. As shown in FIG. 12, the missing area is displayed on the left screen 1221 of the measurement screen 1220 and the left screen 1251 on the measurement screen 1250. More specifically, the calculated missing component points are connected by a line and displayed. Furthermore, among the missing component points, the missing start point, the end point, and the vertex are respectively displayed with the cursors ◯, *, and □.

  Further, the type of the detected defect is displayed as an image on the upper part of the result windows 1223 and 1253 on the right screens 1222 and 1252 of the measurement screens 1220 and 1250. Further, the size of the detected defect is displayed in characters at the bottom of the result windows 1223 and 1253 on the right screens 1222 and 1252 of the measurement screens 1220 and 1250.

  Next, with reference to FIG. 13, the procedure of the loss calculation in step SB of FIG. 11 will be described. When the position information of the two reference points in the left screen designated by the user is input to the measurement processing unit 18, the reference point designating unit 18b displays the image coordinates of the two reference points (on the liquid crystal monitor 5 or the face mount display 6). The two-dimensional coordinates on the displayed image are calculated (step SB1). Subsequently, the reference curve calculation unit 18c calculates two reference curves based on the image coordinates of the two reference points (step SB2).

  Subsequently, the defect type determination unit 18e calculates an angle formed by the two reference curves, and determines the type of the defect according to the angle (step SB3). Subsequently, the missing component point calculation unit 18d calculates the image coordinates of the missing component point based on the image coordinates of the two reference points (also using the reference curve in the case of a corner defect) (step SB4).

  Subsequently, the missing component point calculation unit 18d calculates the image coordinates of the matching point in the right screen corresponding to each calculated missing component point in the left screen (step SB5), the calculated missing component point and its matching Based on the image coordinates of the points, the spatial coordinates (three-dimensional coordinates in the real space) of each missing component point are calculated (step SB6).

  The method for calculating the spatial coordinates is the same as that described in Japanese Patent Application Laid-Open No. 2004-49638. Finally, the defect size calculation unit 18f calculates the defect size according to the defect type based on the calculated spatial coordinates of the defect component points (step SB7).

  Next, the procedure of the reference curve calculation process in step SB2 of FIG. 12 will be described with reference to FIG. When the image coordinates of the two reference points calculated by the reference point specifying unit 18b are input (step SB21), the reference curve calculating unit 18c is characterized for each reference point based on the input image coordinates of the reference point. Two points are calculated (step SB22).

  Subsequently, the reference curve calculation unit 18c calculates a distortion correction curve obtained by correcting the distortion of the imaging optical system based on the two feature points (step SB23). Since there are two reference points, two distortion correction curves are calculated. Finally, the reference curve calculation unit 18c outputs the distortion correction curve information (the image coordinates of the points constituting the curve or the equation of the curve) to the control unit 18a as the reference curve information (step SB24).

  Hereinafter, the procedure of the feature point calculation process in step SB22 will be described with reference to FIG. The feature point calculation process is performed not only when the reference curve is calculated but also when the missing component points are calculated. The calculation process of the missing constituent points will be described later, but here, the calculation process of the feature points will be described together.

  16 to 17 schematically show the procedure of feature point calculation processing, and FIGS. 16 to 17 are also referred to as appropriate. FIG. 16 shows a procedure for calculating feature points around the reference point, and FIG. 17 shows a procedure for calculating feature points around the measurement point.

  When the image coordinates of the reference point or the image coordinates of the measurement point are input (step SF1), the area within the reference point area or the measurement point area is determined based on the input image coordinates of the reference point or measurement point. An image is extracted (step SF2). As a result, an area image 1601 in the reference point area including the reference point 1600 or an area image 1701 in the measurement point area including the measurement point 1700 is extracted.

  Subsequently, the extracted area image is grayscaled (step SF3), and edge extraction is performed on the grayscaled image (step SF4). Subsequently, an approximated straight line of the extracted edge is calculated (step SF5), and two intersections between the calculated edge approximated line and the area boundary line are calculated (step SF6). As a result, the edge approximate line 1602 or the edge approximate line 1702 is calculated, and the intersection points 1603 and 1604 between the edge approximate line 1602 and the area boundary line or the intersection points 1703 and 1704 between the edge approximate line 1702 and the area boundary line are calculated.

  Finally, the nearest neighbor point between each calculated intersection and the extracted edge is calculated (step SF7), and the two calculated nearest neighbor points are output to the control unit 18a as feature points (step SF8). As a result, the nearest points 1605 and 1606 corresponding to the intersection points 1603 and 1604 or the nearest points 1705 and 1706 corresponding to the intersection points 1703 and 1704 are output as feature points.

  Since the edge approximate straight line is calculated after the edge extraction in step SF4, it is preferable to use a process that generates as little noise as possible in the extracted image. For example, a primary differential filter such as a Sobel / Prewitt / Gradient filter or a secondary differential filter such as a Laplacian filter may be used.

  Alternatively, edge extraction may be performed using a process that combines expansion / contraction / difference processing and a noise reduction filter. At this time, it is necessary to binarize the grayscale image. However, a fixed value may be used as the binarization threshold, and the luminance of the grayscale image may be increased by a P-tile method, a mode method, a discriminant analysis method, or the like. You may use the method of changing a threshold based on this.

  Further, in the calculation of the edge approximate straight line in step SF5, the approximate straight line is calculated using, for example, the least square method based on the edge information extracted in step SF4. In the above description, linear approximation is performed on the shape of the edge, but curve approximation may be performed using a quadratic or higher function. When the edge shape is closer to a curve than a straight line, more accurate feature point calculation is possible by curve approximation.

  Next, the procedure of the distortion correction curve calculation process in step SB23 of FIG. 14 will be described. In the endoscope 2 applied to the measurement endoscope apparatus 1 according to the present embodiment, optical data of an imaging optical system unique to each endoscope 2 is measured. The measured optical data is recorded in the memory card 33, for example. By using this optical data, the measurement image can be converted into a distortion corrected image obtained by correcting the distortion of the imaging optical system.

  Hereinafter, a method for calculating a distortion correction curve will be described with reference to FIG. The original image 1800 is an image of the measurement object, and points P1 and P2 are the two feature points calculated in step SB22 in FIG. When the original image 1800 is converted using the optical data, a distortion corrected image 1801 is obtained. Points P1 'and P2' are points after conversion of points P1 and P2, respectively.

  When a straight line connecting the points P1 ′ and P2 ′ on the distortion corrected image 1801 is defined as a straight line L and each pixel point on the straight line L is inversely converted using optical data, the straight line L is converted into a curve L ′ on the original image 1802. Is converted to Information on the curve L 'is output to the control unit 18a as information on a distortion curve passing through the points P1 and P2. The contents of the optical data, the creation method thereof, and the distortion correction method are the same as those described in Japanese Patent Application Laid-Open No. 2004-49638.

  Next, with reference to FIG. 19, the procedure of the defect type determination process in step SB3 of FIG. 13 will be described. When information on two reference curves is input from the control unit 18a (step SB31), the defect type determination unit 18e calculates an angle formed by the two reference curves (step SB32). Subsequently, the defect type determination unit 18e determines whether or not the angle formed by the two reference curves is within a predetermined range (step SB33).

  When the angle formed by the two reference curves is within a predetermined range (for example, when the angle is a value close to 180 °), the defect type determination unit 18e determines that the defect is an edge defect, and determines the defect. The result is output to the control unit 18a. The control unit 18a stores the defect determination result in the storage unit 18g (step SB34). In addition, when the angle formed by the two reference curves is not within a predetermined range (for example, when the angle is a value close to 90 °), the defect type determination unit 18e determines that the defect is an angular defect, Is output to the control unit 18a. The control unit 18a stores the defect determination result in the storage unit 18g (step SB35).

  Next, the procedure of the missing component point calculation process in step SB4 in FIG. 13 will be described. The calculation process of the missing component point includes a missing vertex calculation process, a missing start point calculation process, two types of measurement point calculation processes, and a missing end point calculation process. First, the procedure of the missing vertex calculation process will be described with reference to FIG.

  When a defect determination result is input from the control unit 18a (step SB411a), the defect component point calculation unit 18d determines the type of defect based on the determination result (step SB411b). When the type of defect is a corner defect, information on two reference curves is input from the control unit 18a (step SB411c).

  The missing component point calculation unit 18d calculates the intersection of the two reference curves based on the input information (step SB411d), and outputs the calculated image coordinates of the intersection to the control unit 18a. The control unit 18a stores the image coordinates of the intersection of the two reference curves in the storage unit 18g as the image coordinates of the missing component point (missing vertex) (step SB411e). Subsequently, the process proceeds to a first measurement point calculation process illustrated in FIG. If the type of defect is an edge defect, the process moves to the first measurement point calculation process shown in FIG. 21 following step SB411b.

  Next, the procedure of the first measurement point calculation process will be described with reference to FIG. FIG. 22 schematically shows the procedure of the first measurement point calculation process, and FIG. 22 is also referred to as appropriate. When the image coordinates of the first reference point specified first among the two reference points specified by the user are input from the control unit 18a (step SB412a), the missing component point calculation unit 18d is shown in FIG. The feature point calculation process is executed, and two feature points are calculated (step SB412b). As a result, two feature points 2201 and 2202 corresponding to the first reference point 2200 are calculated.

  Subsequently, the image coordinates of the second reference point are input from the control unit 18a (step SB412c). The missing component point calculation unit 18d calculates the two-dimensional distance between the two feature points and the second reference point, and sets the one closer to the second reference point out of the two feature points as the next measurement point (step SB412d). . When the direction in which the second reference point exists is the direction T22 in FIG. 22, the feature point 2202 of the feature points 2201 and 2202 becomes the next measurement point 2203.

  Subsequently, the missing component point calculation unit 18d outputs the calculated image coordinates of the measurement points to the control unit 18a. The control unit 18a stores the image coordinates of the measurement point in the storage unit 18g (step SB412e). Subsequently, the processing shifts to the missing start point calculation processing shown in FIG.

  Next, with reference to FIG. 23, the procedure of the missing start point calculation process will be described. FIG. 24 schematically shows the procedure of the missing start point calculation process, and FIG. 24 is also referred to as appropriate. First, the image coordinates of the measurement point obtained last time are input from the control unit 18a (step SB413a), and information on the first reference curve calculated from the first reference point of the two reference curves is received from the control unit 18a. Input (step SB413b).

  Subsequently, the missing component point calculation unit 18d calculates a two-dimensional distance between the first reference curve and the measurement point (step SB413c), and determines whether or not the calculated two-dimensional distance is a predetermined value or more (step SB413d). ). If the calculated two-dimensional distance is greater than or equal to the predetermined value, the missing component point calculation unit 18d calculates an edge approximate line that is a straight line that approximates the edge of the measurement target (step SB413e). For example, as shown in FIG. 24, when the two-dimensional distance D24 between the first reference curve 2410 calculated from the first reference point 2401 and the measurement point 2402 is greater than or equal to a predetermined value, an edge approximate straight line 2411 is calculated. .

  Subsequently, the missing component point calculation unit 18d calculates the intersection of the first reference curve and the edge approximate straight line (step SB413f). Thereby, the intersection 2403 of the first reference curve 2410 and the edge approximate straight line 2411 is calculated.

  Subsequently, the missing component point calculation unit 18d outputs the calculated image coordinates of the intersection to the control unit 18a. The control unit 18a stores the image coordinates of the intersection in the storage unit 18g as the image coordinates of the missing component point (missing start point) (step SB413g). Subsequently, the process proceeds to the second measurement point calculation process illustrated in FIG. If the two-dimensional distance calculated in step SB413c is less than the predetermined value, the process proceeds to the second measurement point calculation process shown in FIG. 25 following step SB413d.

  Next, the procedure of the second measurement point calculation process will be described with reference to FIG. FIG. 26 schematically shows the procedure of the second measurement point calculation process, and FIG. 26 is also referred to as appropriate. When the image coordinates of the measurement point obtained last time are input from the control unit 18a (step SB414a), the missing component point calculation unit 18d executes the feature point calculation process shown in FIG. 15 and calculates two feature points. (Step SB414b). As a result, two feature points 2601 and 2602 corresponding to the measurement point 2600 are calculated.

  Subsequently, the missing component point calculation unit 18d calculates a two-dimensional distance between the previously obtained measurement point and each of the two feature points, and the next of the two feature points that is far from the previously obtained measurement point is the next. A measurement point is set (step SB414c). When the direction in which the previously obtained measurement point is the direction T26 in FIG. 26, the feature point 2602 of the feature points 2601 and 2602 becomes the next measurement point 2603.

  Subsequently, the missing component point calculation unit 18d determines whether or not the image coordinates of the missing start point are already stored in the storage unit 18g (step SB414d). When the image coordinates of the defect start point are already stored in the storage unit 18g, the defect component point calculation unit 18d outputs the calculated image coordinates of the measurement point to the control unit 18a. The control unit 18a stores the image coordinates of the measurement point in the storage unit 18g as the image coordinates of the missing component point (step SB414e). Subsequently, the processing shifts to the missing end point calculation processing shown in FIG. Further, when the image coordinates of the missing start point are not yet stored in the storage unit 18g, the process shifts again to the missing start point calculation process illustrated in FIG.

  Next, with reference to FIG. 27, the procedure of the missing end point calculation process will be described. FIG. 28 schematically shows the procedure of the defect end point calculation process, and FIG. 28 is also referred to as appropriate. First, the image coordinates of the measurement point obtained last time are input from the control unit 18a (step SB415a), and information on the second reference curve calculated from the second reference point of the two reference curves is received from the control unit 18a. Input (step SB415b).

  Subsequently, the missing component point calculation unit 18d calculates a two-dimensional distance between the second reference curve and the measurement point (step SB415c), and determines whether the calculated two-dimensional distance is equal to or less than a predetermined value (step SB415d). ). When the calculated two-dimensional distance is equal to or smaller than the predetermined value, the missing component point calculation unit 18d calculates an edge approximate line that is a straight line that approximates the edge of the measurement target (step SB415e). For example, as shown in FIG. 28, when the two-dimensional distance D28 between the second reference curve 2810 calculated from the second reference point 2800 and the measurement point 2801 is equal to or smaller than a predetermined value, an edge approximate straight line 2811 is calculated. .

  Subsequently, the missing component point calculation unit 18d calculates the intersection of the second reference curve and the edge approximate straight line (step SB415f). As a result, the intersection 2803 of the second reference curve 2810 and the edge approximate straight line 2811 is calculated.

  Subsequently, the missing component point calculation unit 18d outputs the calculated image coordinates of the intersection to the control unit 18a. The control unit 18a stores the image coordinates of the intersection in the storage unit 18g as the image coordinates of the missing component point (missing end point) (step SB415g). With this process, the entire calculation process of the missing component point described above is completed. If the two-dimensional distance calculated in step SB415c exceeds a predetermined value, the process shifts again to the second measurement point calculation process shown in FIG. 25 following step SB415d.

  Next, with reference to FIG. 29, the procedure of the edge approximate straight line calculation process in step SB413e in FIG. 23 and step SB415e in FIG. 27 will be described. When the image coordinates of the measurement point are input (step SG1), the missing component point calculation unit 18d extracts an area image in the measurement point area based on the input image coordinates of the measurement point (step SG2).

  Subsequently, the missing component point calculation unit 18d grayscales the extracted area image (step SG3), and performs edge extraction on the grayscaled image (step SG4). Subsequently, the missing component point calculation unit 18d calculates an approximated straight line of the extracted edge (step SG5), and outputs information on the calculated edge approximated line to the control unit 18a (step SG6). The processing in steps SG1 to SG5 is the same as the processing in steps SF1 to SF5 in FIG.

  Next, a method for calculating a matching point in step SB5 in FIG. 13 will be described. The missing component point calculation unit 18d executes pattern matching processing based on the missing component points calculated by the above-described defect calculation, and calculates matching points that are corresponding points of the left and right two images. The pattern matching processing method is the same as that described in Japanese Patent Application Laid-Open No. 2004-49638.

  However, if the type of defect is a corner defect, the missing vertex is located in the background of the measurement object, and there is no characteristic pattern such as an edge on the image. Therefore, the matching point may not be calculated. Therefore, in the present embodiment, when the type of defect is a corner defect, the calculation of the matching point of the missing vertex is performed as follows.

  As shown in FIG. 30A, first, matching points 3021 and 3022 of the right image 3020 corresponding to the reference points 3001 and 3002 of the left image 3000 are calculated. Subsequently, reference curves 3010 and 3011 passing through the reference points 3001 and 3002 and reference curves 3030 and 3031 passing through the matching points 3021 and 3022 are calculated.

  Subsequently, as shown in FIG. 30B, the intersection 3003 of the reference curves 3010 and 3011 of the left image 3000 is calculated as a missing vertex. Further, an intersection 3023 of the reference curves 3030 and 3031 of the right image 3020 is calculated and regarded as a matching point of the missing vertex.

  Next, with reference to FIG. 31, the procedure of the defect size calculation process in step SB7 of FIG. 13 will be described. When the spatial coordinates (three-dimensional coordinates) of the missing constituent points and the discrimination result of the missing are input from the control unit 18a (step SB71), the missing size calculating unit 18f displays the width of the missing (space distance between the missing start point and the missing end point). Is calculated (step SB72).

  Subsequently, the defect size calculation unit 18f determines the type of defect based on the defect determination result (step SB73). When the type of defect is an edge defect, the defect size calculation unit 18f calculates the defect depth (a spatial distance from a predetermined defect component point to a straight line connecting the defect start point and the defect end point) (step SB74). ). Further, the defect size calculation unit 18f calculates the area of the defect (the space area of the region surrounded by all the defect component points) (step SB75).

  Subsequently, the defect size calculation unit 18f outputs the calculated defect size to the control unit 18a. The control unit 18a stores the missing size in the storage unit 18g (step SB76). Further, when the type of defect is a corner defect, the defect size calculation unit 18f calculates a defect edge (a spatial distance between the defect vertex and the defect start point and a spatial distance between the defect vertex and the defect end point) ( Step SB77). Following this, the processing moves to step SB75. The above is the content similar to the content of the defect measurement disclosed in Japanese Patent Application No. 2007-20906.

  Next, the contents of processing newly disclosed in this embodiment will be described. The reference curve calculation process (step SB2 in FIG. 13) and the missing component point calculation process (step SB4 in FIG. 13) include the process of converting the image to gray scale. If a bright part due to reflection or the like exists in the background part, the part becomes noise and is erroneously recognized as a part of the subject, and the measurement accuracy may deteriorate.

  As shown in FIG. 32 (a), when the contrast between the background 3200 and the subject 3201 is clear in the captured image, as shown in FIG. There is no occurrence. In this case, the original defect start point 3210 and the defect end point 3211 are recognized with high accuracy, and the measurement accuracy is high.

  On the other hand, as shown in FIG. 33 (a), when a high brightness area 3300a due to reflection or the like exists in the background 3300 in the captured image, as shown in FIG. 33 (b), in the binarized image, A region 3301 corresponding to the high luminance region 3300a appears as noise. When defect measurement is performed using this binarized image, the points 3320, 3321, and 3322 become a defect start point, a defect end point, and a defect vertex as shown in FIG. Accuracy deteriorates.

  Therefore, in the present embodiment, the liquid crystal monitor 5 or the face mount display 6 displays the binarized image, so that the user can confirm the presence or absence of noise that is erroneously recognized as a part of the subject. Yes. 34 and 35 show display examples of the binarized image.

  FIG. 34 shows a display example before designation of the reference point, and shows a measurement screen displayed before the measurement screen 1230 of FIG. When the binarized image is displayed before the reference point is designated, the user can preliminarily image the measurement accuracy before starting the defect measurement. In FIG. 34A, the left image 3400 is a binarized image, and in FIG. 34B, both the left image 3410 and the right image 3420 are binarized images.

  FIG. 35 shows a display example when outputting a measurement result, and shows a measurement screen displayed after the measurement screen 1250 of FIG. In FIG. 35, only the left image 3500 is a binarized image, but both the left image 3500 and the right image 3510 may be binarized images. When the binarized image is displayed when the measurement result is output, the user can confirm whether or not the measurement has been performed as intended without any erroneous recognition due to noise after the completion of the defect measurement.

  Next, the procedure of the binarized image display process will be described. The processes shown in FIGS. 36 to 39 correspond to the process shown in FIG. 11, and the description of the contents of the processes already described is omitted. FIG. 36 shows a processing procedure for displaying a binarized image before designating the reference point. First, the control unit 18a monitors the operation of the remote controller 4 or the personal computer 31, and determines whether or not the output of a binarized image that is a measurement accuracy confirmation image has been set (step SG1).

  If the output of the binarized image is not set, the process proceeds to step SA. If the output of the binarized image is set, the binarized image is displayed (step SG2). Subsequently, the process proceeds to step SA, and the processes of steps SA to SE described above are executed in order.

  FIG. 40 shows the procedure of step SG2. First, the control unit 18a acquires the image data constituting the video signal from the video signal processing circuit 12, and outputs it to the gradation reduction unit 18h (step SG21). The gradation reduction unit 18h takes out the luminance data (signal level) from the image data to grayscale the image (step SG22), and further converts the luminance data into a binary value with a predetermined luminance as a threshold value, thereby converting the binary image into a binary image. Is generated (step SG23). In step SG23, for example, when the luminance value of each pixel takes any value from 0 to 255, the luminance value is converted to 0 or 255 using 128 as a threshold value.

  Subsequently, the control unit 18 a acquires a binarized image from the gradation reduction unit 18 h and outputs it to the video signal processing circuit 12. After the processing for synthesizing the binarized image and the operation menu is executed by the video signal processing circuit 12, the binarized image is displayed on the liquid crystal monitor 5 or the face mount display 6 (step SG24). As a result, at least a binarized image is displayed, but only the left image may be displayed as a binarized image as shown in FIG. 34 (a), or as shown in FIG. 34 (b). Both the left image and the right image may be displayed as a binarized image.

  FIG. 37 shows a processing procedure for displaying a binarized image when outputting the measurement result. First, the processes of steps SA to SE described above are executed in order. Subsequently, the processes of steps SG1 to SG2 shown in FIG. 36 are sequentially executed, and when the output of the binarized image is set, the binarized image is displayed.

  FIG. 38 shows a processing procedure when a binarized image and a normal image are alternately displayed before the reference point is designated. First, the control unit 18a sets a flag used to determine the image display form to 0 (step SG101). Subsequently, the control unit 18a determines the value of the flag (step SG102). The subsequent processing contents change according to the determination result. In parallel with this determination, the control unit 18a acquires image data constituting the video signal from the video signal processing circuit 12.

  When the flag value is 0, the control unit 18a outputs the image data to the gradation reduction unit 18h, causes the gradation reduction unit 18h to execute gradation reduction processing, and displays a binarized image. The process is executed (step SG103). The process of step SG103 is the same as the process shown in FIG.

  After the process of step SG103 is completed, the control unit 18a sets a flag to 1 (step SG104), and further instructs the time measurement unit 18i to start measuring time (step SG105). The controller 18a monitors the measurement time and determines whether or not a predetermined time set in advance has elapsed (step SG106). If the predetermined time has not elapsed, the process returns to step SG106, and monitoring of the measurement time is continued. If the predetermined time has elapsed, the process proceeds to step SG111. In this case, the time measurement unit 18i ends the time measurement in accordance with an instruction from the control unit 18a.

  On the other hand, when the value of the flag is 1 in step SG102, the control unit 18a executes a process for displaying a normal image (step SG107). At this time, a normal image is displayed on the liquid crystal monitor 5 or the face mount display 6, and a binarized image is not displayed. After the process of step SG108 is completed, the control unit 18a sets a flag to 0 (step SG108), and further instructs the time measurement unit 18i to start measuring time (step SG109). The control unit 18a monitors the measurement time and determines whether or not a predetermined time set in advance has elapsed (step SG110). If the predetermined time has not elapsed, the process returns to step SG110, and monitoring of the measurement time is continued. If the predetermined time has elapsed, the process proceeds to step SG111. In this case, the time measurement unit 18i ends the time measurement in accordance with an instruction from the control unit 18a.

  Although not shown in FIG. 38, in parallel with the processing in steps S101 to S110 described above, processing related to designation of a reference point is also executed. In step S111, the control unit 18a determines whether or not the specification of the reference point has been completed (step SG111). If the reference point has not been specified, the process returns to step SG102. Further, when the designation of the reference point is completed, the above-described steps SB to SE are executed in order.

  FIG. 39 shows a processing procedure when a binarized image and a normal image are alternately displayed at the time of measurement result output. First, the processes of steps SA to SE described above are executed in order. Subsequently, processing relating to display of a binarized image or a normal image is executed (steps SG101 to SG110). Since the processing of steps SG101 to SG110 is the same as described above, the description thereof is omitted. In step SG112, the control unit 18a monitors the operation of the remote controller 4 or the personal computer 31, and determines whether the end of the process is instructed (step SG112). If the end of the process is not instructed, the process returns to step SG102. If the end of the process is instructed, the process ends.

  In the processing shown in FIGS. 38 and 39, the state of displaying a binarized image and the state of displaying a normal image are automatically switched at predetermined time intervals. In addition to this, the control unit 18a monitors the operation of the remote controller 4 or the personal computer 31, and switches the display state according to the operation state, thereby allowing the binarized image and the normal image at any timing desired by the user. May be displayed alternately.

  As described above, according to the present embodiment, if two reference points are specified, the defect size can be measured. Compared to the conventional case where three or four or more reference points are specified. Thus, the troublesome operation can be reduced and the operability can be improved. In addition, since a binarized image or the like with reduced gradation is displayed, it is possible for the user to confirm the presence or absence of noise that is misrecognized as part of the subject, and whether the measurement is being performed as intended. The user can confirm whether or not.

  Although it is possible to check the measurement accuracy from the measurement results displayed in the result windows 1223 and 1253 of the measurement screens 1220 and 1250 shown in FIG. 12, information that is not necessary for checking the measurement accuracy is also displayed. Since the display space for information necessary for checking the measurement accuracy is limited, it is not always possible for the user to intuitively understand the measurement accuracy. In contrast, by displaying an image with reduced gradation, the user can more intuitively understand the measurement accuracy from the image.

  Further, as described above, the image displayed for confirmation of measurement accuracy is not limited to the binarized image, but may be a quaternary image, an octanized image, or the like. It is desirable to display a binarized image that can be generated with a load.

  In addition, by enabling display switching between a binarized image and a normal image, the user can check the measurement accuracy in more detail by comparing the measurement image with the actual subject image. This enables measurement work to be performed efficiently. Furthermore, by switching between the two types of display states at the timing designated by the user input to the remote controller 4 or the personal computer 31, the measurement accuracy can be confirmed at any timing desired by the user. Furthermore, the user's operation burden can be reduced by automatically switching the display state again at a timing when a predetermined time has elapsed from the timing at which the display state is once switched.

  Further, by calculating a distortion correction curve obtained by correcting the distortion of the imaging optical system installed at the tip of the electronic endoscope as a reference curve, it is possible to improve the measurement accuracy of the defect size.

  Also, by determining the type of defect according to the angle formed by the two reference curves corresponding to the two reference points, it is possible to perform automatic measurement according to the type of defect, which is cumbersome to operate. Therefore, the operability can be improved. In particular, by automatically selecting and calculating a parameter according to the type of defect as a parameter indicating the size of the defect, it is possible to perform optimum automatic measurement even if the user is not particularly aware of the type of defect. Therefore, it is possible to reduce the troublesome operation and improve the operability.

  Further, in the conventional measuring endoscope apparatus, the edge of the missing corner formed at the corner of the measurement object including the vertex of the corner is approximated by one virtual curve and the virtual point on the curve. However, since the selection of the virtual point corresponding to the apex of the corner defect is performed manually, there is a problem that the measurement accuracy of the defect size may be lowered. On the other hand, as in this embodiment, by calculating the intersection of two reference curves corresponding to two reference points as one of the missing component points (missing vertex), the measurement accuracy of the missing size is improved. can do.

  Further, by calculating at least two kinds of parameters as parameters indicating the size of the defect, the size of the defect can be known in detail.

  In addition, by calculating at least two feature points on the edge of the measurement object for one reference point, and calculating a reference curve based on those feature points, the calculation accuracy of the reference curve is improved, and consequently the defect size The measurement accuracy can be improved.

  As described above, the embodiments of the present invention have been described in detail with reference to the drawings. However, the specific configuration is not limited to the above-described embodiments, and includes design changes and the like without departing from the gist of the present invention. .

It is a block diagram which shows the structure of the endoscope apparatus for measurement by one Embodiment of this invention. It is a block diagram which shows the structure of the measurement process part with which the endoscope apparatus for measurement by one Embodiment of this invention is provided. It is a reference figure showing a reference point, a reference curve, and a reference point area in one embodiment of the present invention. It is a reference diagram showing a missing start point / end point and a missing component point of a missing edge in an embodiment of the present invention. FIG. 6 is a reference diagram illustrating a missing start point / end point / vertex of a corner defect and a missing component point according to an embodiment of the present invention. It is a reference figure which shows the width | variety of the defect | deletion of the edge | side in one Embodiment of this invention, a depth, and an area. It is a reference figure which shows the width | variety of the edge | corner defect | deletion in one Embodiment of this invention, the length of a side, and an area. It is a reference figure showing a measurement point and a measurement point area in one embodiment of the present invention. It is a reference figure showing the feature point in one embodiment of the present invention. It is a reference figure showing the feature point in one embodiment of the present invention. It is a flowchart which shows the procedure of the defect | deletion measurement in one Embodiment of this invention. It is a reference figure which shows the measurement screen displayed at the time of the defect | deletion measurement in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion calculation in one Embodiment of this invention. It is a flowchart which shows the procedure of the reference | standard curve calculation process in one Embodiment of this invention. It is a flowchart which shows the procedure of the feature point calculation process in one Embodiment of this invention. It is a reference figure which shows the procedure of the feature point calculation process in one Embodiment of this invention. It is a reference figure which shows the procedure of the feature point calculation process in one Embodiment of this invention. It is a reference diagram showing a calculation method of a distortion correction curve in one embodiment of the present invention. It is a flowchart which shows the procedure of the defect | deletion kind discrimination | determination process in one Embodiment of this invention. It is a flowchart which shows the procedure of the missing vertex calculation process in one Embodiment of this invention. It is a flowchart which shows the procedure of the 1st measurement point calculation process in one Embodiment of this invention. It is a reference figure which shows the procedure of the 1st measurement point calculation process in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion start point calculation process in one Embodiment of this invention. It is a reference figure which shows the procedure of the defect | deletion start point calculation process in one Embodiment of this invention. It is a flowchart which shows the procedure of the 2nd measurement point calculation process in one Embodiment of this invention. It is a reference figure which shows the procedure of the 2nd measurement point calculation process in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion end point calculation process in one Embodiment of this invention. It is a reference figure which shows the procedure of the defect | deletion end point calculation process in one Embodiment of this invention. It is a flowchart which shows the procedure of the edge approximation straight line calculation process in one Embodiment of this invention. It is a reference figure which shows the calculation method of the matching point in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion size calculation process in one Embodiment of this invention. In one Embodiment of this invention, it is a reference figure for demonstrating measurement precision. In one Embodiment of this invention, it is a reference figure for demonstrating measurement precision. It is a reference figure which shows the measurement screen (at the time of the display of a binarized image) in one Embodiment of this invention. It is a reference figure which shows the measurement screen (at the time of the display of a binarized image) in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion measurement in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion measurement in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion measurement in one Embodiment of this invention. It is a flowchart which shows the procedure of the defect | deletion measurement in one Embodiment of this invention. It is a flowchart which shows the procedure of the display of the binarized image in one Embodiment of this invention.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Measurement endoscope apparatus, 18 ... Measurement processing part, 18a ... Control part, 18b ... Reference point designation | designated part, 18c ... Reference curve calculation part, 18d ... Defect structure Point calculation unit, 18e ... defect type determination unit, 18f ... defect size calculation unit, 18g ... storage unit, 18h ... tone reduction unit, 18i ... time measurement unit

Claims (12)

An electronic endoscope that images a measurement object and generates an imaging signal, an image processing unit that generates a video signal based on the imaging signal, and a measurement process that performs measurement processing of the measurement object based on the video signal In a measurement endoscope apparatus comprising: means; and display means for displaying an image based on the video signal,
The measurement processing means includes
Reference point designating means for designating two reference points on the measurement object;
A first contour approximation line that approximates the contour of the measurement object is calculated based on one of the two reference points, and the contour of the measurement object is approximated based on the other reference point. Contour approximation calculating means for calculating two contour approximation lines;
Based on the two reference points, the first outline approximation line, and the second outline approximation line , a missing constituent point calculation means for calculating a missing constituent point that constitutes the outline of the defect formed on the measurement object. When,
A defect type discriminating means for discriminating the type of the defect according to an angle formed by the first contour approximate line and the second contour approximate line ;
A defect measuring means for measuring the size of the defect based on the defect constituent point;
Gradation reduction means for reducing the gradation of the image based on the video signal;
With
The measurement endoscope apparatus further characterized in that the display means further displays an image whose gradation is reduced by the gradation reduction means. 2. The measurement according to claim 1 , wherein the missing component point calculating unit calculates an intersection of the first contour approximate line and the second contour approximate line as one of the missing constituent points. Endoscopic device.   The measurement endoscope apparatus according to claim 1, wherein the defect measurement unit calculates a parameter corresponding to a type of the defect as a parameter indicating the size of the defect.   The measurement endoscope apparatus according to claim 1, wherein the defect measurement unit calculates at least two types of parameters as parameters indicating the size of the defect. The contour approximate line calculating means calculates at least two feature points on the contour line of the measurement object around the one reference point, and the first contour approximate line based on the at least two feature points. And at least two feature points on the contour line of the measurement object around the other reference point, and the second contour approximation line is calculated based on the at least two feature points. The measuring endoscope apparatus according to any one of claims 1 to 4, wherein the measuring endoscope apparatus is characterized in that:   The measurement device according to claim 1, wherein the gradation reduction unit converts an image based on the video signal into a binary image obtained by binarizing a signal level. Endoscopic device. A first state in which at least an image whose gradation has been reduced by the gradation reduction means is displayed, and a gradation by the gradation reduction means without displaying an image whose gradation has been reduced by the gradation reduction means. Switching means for switching the display state between the second state for displaying the image before being reduced ,
The display unit can switch a display state between the first state and the second state, and displays an image in the display state switched by the switching unit. The measurement endoscope apparatus according to any one of claims 1 to 6. It further comprises an input means for the user to input the timing for switching the display state,
The measurement endoscope apparatus according to claim 7, wherein the switching unit switches the display state at the timing input to the input unit. It further comprises a time measuring means for measuring a preset time,
The said switching means switches the said display state again at the 2nd timing when the time measured by the said time measurement means passed from the 1st timing which switched the said display state. Endoscope device for measurement. The measurement endoscope apparatus according to claim 7, wherein the switching unit switches the display state to the first display state after the size of the defect is measured.   The display means includes first and second image display areas capable of displaying an image, and images whose gradations are reduced by the gradation reduction means are displayed in the first and second image display areas. The endoscope apparatus for measurement according to any one of claims 1 to 10, wherein the display is performed on one or both. An electronic endoscope that images a measurement object and generates an imaging signal, an image processing unit that generates a video signal based on the imaging signal, and a measurement process that performs measurement processing of the measurement object based on the video signal In a program for controlling the operation of the measuring endoscope apparatus including means and a display means for displaying an image based on the video signal,
The measurement processing means includes
Reference point designating means for designating two reference points on the measurement object;
A first contour approximation line that approximates the contour of the measurement object is calculated based on one of the two reference points, and the contour of the measurement object is approximated based on the other reference point. Contour approximation calculating means for calculating two contour approximation lines;
Based on the two reference points, the first outline approximation line, and the second outline approximation line , a missing constituent point calculation means for calculating a missing constituent point that constitutes the outline of the defect formed on the measurement object. When,
A defect type discriminating means for discriminating the type of the defect according to an angle formed by the first contour approximate line and the second contour approximate line ;
A defect measuring means for measuring the size of the defect based on the defect constituent point;
Gradation reduction means for reducing the gradation of the image based on the video signal;
With
The display means further displays an image whose gradation is reduced by the gradation reduction means.

Images