JP5101251B2 - Voltage probe - Google Patents

Description

  The present invention relates to a technique relating to a voltage probe that can accurately measure the AC voltage of a plurality of wires to be measured having different outer diameters.

  Voltage measurement in the power line usually requires direct measurement using the contact pins and contact clips provided on the measuring device on the exposed metal part of the wire to be measured, but there is always a risk of short circuit or electric shock. There is a problem with it.

  As a means for solving such a problem, there is a voltage detector capable of confirming the live state of the AC voltage from the top of the sheath of the wire to be measured, thereby performing the electric work and the maintenance work of the electric equipment. It is possible to protect the safety of the workers at the time.

Some voltage detectors used for such applications employ a voltage detection method based on electrostatic induction as disclosed in Patent Document 1 below, and the capacitance coupling at that time should be as large as possible. However, the measurement accuracy is improved.
JP-A-6-3373

  For this purpose, it is necessary to increase the area of the electrode in a positional relationship facing the wire to be measured, and to reduce the separation distance from the wire to be measured as much as possible. However, even if the area of the electrode is simply increased under the flat electrode structure, it is only partially opposed to a part of the conductor part of the measured wire, so that the background noise around the area other than the measurement target It becomes easy to be affected by a strong electric field, and an error occurs in the measurement result.

  For this reason, in FIG.7 (b) in the said patent document 1, the contact end surface of a probe front-end | tip part is made into a curved surface so that it can contact | adhere as much as possible to a to-be-measured electric wire, and it follows along the curvature radius of this curved surface. A voltage detector incorporating the formed electrode is also disclosed.

  FIG. 3 is an enlarged explanatory view schematically showing the main part of the voltage detector shown in FIG. 7B in Patent Document 1, and the contact end surface 3 provided on the probe tip 2 by the voltage detector 1 is as follows. A curved surface 4 having a radius of curvature substantially corresponding to the outer diameter of a specific electric wire C to be measured is formed on the entire surface.

  Further, in the counter electrode 5 disposed in the probe tip 2, the surface 5 a facing the wire to be measured C is formed as a curved surface 6 having the same radius of curvature as the curved surface 4.

However, the contact end surface 3 provided in the probe tip 2 of the voltage detector 1 shown in FIG. 3 has a curved surface 4 whose curvature radius substantially matches the curvature radius of the outer diameter of the specific wire C to be measured. However , for example, when measuring a wire to be measured (not shown) having a larger diameter than this , a gap is formed between the curved surface 4 and the degree of capacitive coupling increases as the gap increases. There is a problem that the measurement result is weakened and an error is generated.

  In addition, it is difficult for a measurement operator who performs measurement using this to visually grasp the influence of the outer diameter of the electric wire to be measured on the measurement result. There is also an inconvenience that the measurement error caused by the size of the gap is not noticed.

In view of the above-mentioned problems seen in the prior art, the present invention reduces the gap formed between the contact end surface of the probe tip portion as much as possible even if the individual measured wires have different outer diameters. An object is to provide a voltage probe capable of improving measurement accuracy.

The present invention has been made to achieve the above object, and a first invention of the invention includes a contact end face that is in face-to-face contact with a part thereof along the length direction of the electric wire to be measured, In the voltage probe comprising at least a counter electrode built in a nearby region at the probe tip, the contact end surface is curved in one width direction under a predetermined radius of curvature, and the one of the measured objects A main curved surface that is brought into contact with the electric wire side, and at least one or more sub-curved surfaces that are curved toward the other width direction intersecting the main curved surface and are brought into contact with the other measured electric wire side ; The sub-curved surface is formed of a one-side concave portion and another-side concave portion that are divided into two with a boundary point intersecting at a substantially central position of the main curved surface as a common vertex. Is the difference between the one side open edge and the other side open edge. Song depth together with the most important feature that is recessed so gradually deeper from said boundary point so as to maximize. In this case, it is desirable to give electrical insulation to the contact end face.

Further, the main curved surface is a surface curved under a radius of curvature substantially matching one of the measured wires having the largest outer diameter among the measured wires having different outer diameters, at least one or more of the sub-curved surface intersecting the main curved surface has a smaller other of the outer diameter of the face-to-face contact with each other under the curvature radius is corresponding to the measured electric wire is capable curved surface Is preferable.

  Furthermore, it is desirable that a surface of the counter electrode facing the contact end surface is provided with a curved surface that substantially meets the main curved surface and the sub-curved surface intersecting the main curved surface.

  Further, the present invention can be configured as a voltage detector, a voltmeter, or a wattmeter provided with the voltage probe according to any one of claims 1 to 4, or the voltage probe according to any one of claims 1 to 4. It can also be configured as an electric device provided with the voltage detecting means used.

According to the first aspect of the present invention, the contact end surface has a main curved surface that is curved under a predetermined radius of curvature, and at least one sub-curved surface that intersects the main curved surface. In addition, the sub-curved surface is formed by a one-side concave portion and an other-side concave portion that are divided into two with the boundary point intersecting at a substantially central position of the main curved surface as a common vertex. And the other-side recess are recessed so as to gradually become deeper from the boundary point so that the curved depths of the one-side open edge and the other-side open edge are both maximized. Even if the direction is, for example, a horizontal direction or a vertical direction, it can be easily adjusted without changing , and a function capable of accurately measuring a voltage while maintaining the capacitive coupling in a preferable state is provided. Can

  According to the second aspect of the present invention, the main curved surface at the contact end surface is curved under a radius of curvature substantially matching the measured wire having the maximum outer diameter among the individual measured wires having different outer diameters. And at least one or more sub-curved surfaces intersecting the main curved surface are curved surfaces that can be face-to-face contacted with each other under a radius of curvature corresponding to the electric wire to be measured having a small outer diameter. Therefore, even in the case of the electric wires to be measured having different outer diameters, it is possible to effectively improve the measurement accuracy by making the gap formed between the contact end faces as small as possible so as to face each other.

In addition, the measurement operator can easily see the proper use of the main curved surface and other sub-curved surfaces at the contact end surface of the probe tip in relation to the measured wires with different outer diameters. It is possible to prevent errors such as measuring other wires to be measured unnecessarily.

  According to the third aspect of the present invention, the surface facing the contact end surface of the counter electrode is provided with a curved surface that substantially matches the main curved surface and the sub-curved surface intersecting the main curved surface, Since it can be made to meet face-to-face in a more preferable state depending on the type of the wire to be measured, it can contribute more effectively by improving measurement accuracy.

  According to the invention which concerns on Claim 4, since a contact end surface has electrical insulation, a measurement operation | work can be performed more safely without accompanying the danger of a short circuit or an electric shock.

  According to the invention according to any one of claims 5 to 8, since the voltage probe according to any one of claims 1 to 3 is provided, it is suitably used as a voltage detector or the like capable of obtaining an effect corresponding to each. be able to.

  FIG. 1 is an explanatory diagram showing an enlarged main part of an example of the present invention, and FIG. 2 is an explanatory diagram showing an enlarged example of a counter electrode built in a probe tip.

  According to these figures, the voltage probe 11 is built in a contact end surface 13 that has a substantially rectangular shape in front view and is in contact with a part of the wire to be measured along the length direction of the wire to be measured, and in the vicinity of the contact end surface 13. The probe distal end portion 12 is provided with at least the counter electrode 23 having a substantially square shape in front view.

In this case, the contact end surface 13 of the probe tip portion 12 made of an insulating material has a radius of curvature substantially matching the measured outer wire C ₁ having the largest outer diameter among the individual measured wires having different outer diameters. It is formed by the main curved surface 14 which is curved the entire surface so as to face contact along a horizontal direction and a portion of the measured wire C ₁ and the main unit.

The contact end face 13, a main substantially perpendicular position of the Ryakumen central position in the vertical direction of the curved surface 14 (angle of intersection substantially perpendicular) to, to face contact more other measured wire C ₂ of smaller outer diameter A sub-curved surface 15 is provided.

In this case, the sub-curved surface 15 needs to be brought into contact with a part of the wire C ₂ to be measured whose vertical direction is the length direction in the illustrated example because of the relationship with the main curved surface 14. The upper side concave portion 15a and the lower side concave portion 15b that are divided into two with the position as the boundary point P are formed.

That is, the one- side concave portion 15a and the other- side concave portion 15b formed as the sub-curved surface 15 in the main curved surface 14 are surfaces that face each other when folded up and down in the illustrated example via the boundary point P. It is formed with a shape.

More specifically, the one- side concave portion 15a and the other- side concave portion 15b are arranged in the direction from the boundary point P to the one- side open edge 13a positioned on the upper side in the illustrated example, and from the boundary point P to the lower side in the illustrated example. located toward a respective other side opening edge 13b direction be to gradually deeply recessed, face-to-face part of the measured wire C ₂ under the radius of curvature substantially coincident with the outer diameter of the measured electric wire C ₂ It will be formed as a by-bay curved 15 which can be contacted.

  On the other hand, the counter electrode 23 disposed in a state of being built in the vicinity of the contact end surface 13 in the probe distal end portion 12 is substantially arranged on the main curved surface 14 and the sub-curved surface 15 on the facing surface 24 side of the contact end surface 13. It is formed with a curved surface 25 having a surface shape that meets the surface.

Next, the operation and effect of the present invention configured as described above will be described below with reference to the illustrated example. First, when measuring the measured outer wire C ₁ having the maximum outer diameter in the measured wire, the main curved surface 14 on the contact end surface 13 of the probe tip 12 of the voltage probe 11 is the length of the measured wire C ₁ . Face-to-face contact along the direction.

At this time, the main curved surface 14 is formed under a radius of curvature that substantially matches the outer diameter of the measured electric wire C ₁ , so that the main curved surface 14 can be brought into intimate contact with the measured electric wire C _1. it can.

Therefore, the voltage probe 11, by-face contact without almost interposed a gap between the electric wire C ₁ to be measured through the main curved surface 14 at the contact end surface 13 of the probe tip 12, the capacitance coupling Therefore, it is possible to provide a function capable of accurately measuring the voltage.

On the other hand, when measuring the measured wire C ₂ having an outer diameter smaller than that of the measured wire C _1, the sub-curved surface 15 of the contact end surface 13 of the probe tip 12 of the voltage probe 11 is set to the length of the measured wire C ₂ . Face-to-face contact along the direction.

At this time, the sub-curved surface 15 is formed at the one side recess 15a and the other side recess 15b which is bisected through the boundary point P to obtain a radius of curvature substantially coincident with the outer diameter of the measured electric wire C ₂ since it is, it is possible to face contact so as to close the該被measurement wire C _2.

Therefore, the voltage probe 11, by-face contact without almost interposed a gap between the measured wire C ₂ via the auxiliary curved surface 15 at the contact end surface 13 of the probe tip 12, the capacitance coupling Can be maintained in a preferable state, so that a function of accurately measuring the voltage can be provided.

In addition, the counter electrode 23 built in the probe tip 12 includes a curved surface 25 having a surface shape that substantially matches the main curved surface 14 and the sub-curved surface 15 on the side of the facing surface 24 facing the contact end surface 13. cage, it is possible to face matched with a more preferred original state in accordance with another between the wire C ₁ to be measured and the measured electric wire C _2, can be effectively contribute the improvement of the measurement accuracy.

Moreover, the measurement operator using a voltage probe 11 facilitates the proper use of the main curved surface 14 and the sub-curved surface 15 at the contact end surface 13 of the probe tip 12 in relation to the wire C ₁ to be measured and the measured electric wire C ₂ Therefore, it is possible to prevent an error such as unnecessarily measuring other wires to be measured that are out of specification.

  The above is the description of the present invention based on the illustrated examples, and various modifications can be made to the specific contents without departing from the gist of the present invention. For example, the contact end surface 13 of the probe tip portion 12 is recessed in the facing contact surface toward the crossing direction in which the crossing angle is smaller than 90 degrees in order to correspond to three or more wires to be measured having different outer diameters. It can also be formed.

  In addition, the main curved surface 14 of the contact end surface 13 in the present invention and at least one or more sub-curved surfaces 15 intersecting the main curved surface 14 may be curved surfaces having the same curvature radius. . Furthermore, the contact end face 13 of the voltage probe 11 may be made of a conductive metal so that it can provide a function as a shield or a guard electrode.

  The present invention can also be configured as an electric device having a voltage detection means using the voltage probe 11 in addition to a voltage detector, a voltmeter, and a wattmeter incorporating the voltage probe 11.

  Furthermore, the counter electrode 23 built in the probe tip 12 can be formed so that the counter surface 24 is flat regardless of the surface shape on the contact end surface 13 side, if desired. Furthermore, the front-view shape of the contact end surface 13 of the probe tip 12 and the facing surface 24 of the facing electrode 23 is formed under an appropriate shape such as a circle or an ellipse other than a substantially rectangular shape as shown in the illustrated example. You can also

Explanatory drawing which expands and shows the principal part about an example of this invention. Explanatory drawing which expands and shows an example of the counter electrode incorporated in the probe front-end | tip part. The enlarged explanatory view which simplifies and shows the principal part of the voltage detector shown by FIG.7 (b) in patent document 1. FIG.

11 voltage probe 12 probe tip 13 contacts the end face 13a on one side open edge 13b other side open edge 14 main curved surface 15 sub curved surface 15a one side recess 15b other side recess 23 opposite electrode 24 facing surface 25 curved C _{1, C 2} the Measuring wire
P boundary point

Claims (8)

In a voltage probe comprising at least a contact end face that is in face-to-face contact with a part of the wire to be measured and a counter electrode that is built in the vicinity of the contact end face at the probe tip,
The contact end surface is curved toward one width direction under a predetermined radius of curvature, and has a main curved surface that is brought into face-to-face contact with the one of the wires to be measured, and the other width direction intersecting the main curved surface Comprising at least one or more sub-curved surfaces that are curved toward the other side to be in face-to-face contact with the other measured wire side ,
The sub-curved surface is formed of a one-side concave portion and another-side concave portion that are divided into two with a boundary point intersecting at a substantially central position of the main curved surface as a common vertex,
The one-side recess and the other-side recess are each recessed so as to gradually become deeper from the boundary point so that the curved depths of the one-side open edge and the other-side open edge are both maximum. To voltage probe. The main curved surface is a surface curved under a radius of curvature substantially matching one of the measured wires having the largest outer diameter among the measured wires having different outer diameters. at least one or more of the sub-curved surface intersecting the plane is the smaller the other of the outer diameter of the face-to-face contact with each other under the curvature radius is corresponding to the measured electric wire was capable curved surface The voltage probe according to claim 1. 3. The voltage according to claim 1, wherein a surface of the counter electrode facing the contact end surface is provided with a curved surface that substantially meets the main curved surface and the sub-curved surface intersecting the main curved surface. probe. The voltage probe according to claim 1, wherein the contact end face has electrical insulation. A voltage detector comprising the voltage probe according to any one of claims 1 to 4. A voltmeter comprising the voltage probe according to claim 1. A wattmeter comprising the voltage probe according to claim 1. An electrical apparatus comprising voltage detection means using the voltage probe according to claim 1.

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