JP5030861B2 - 強誘電体フッ化物結晶 - Google Patents
強誘電体フッ化物結晶 Download PDFInfo
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- JP5030861B2 JP5030861B2 JP2008135885A JP2008135885A JP5030861B2 JP 5030861 B2 JP5030861 B2 JP 5030861B2 JP 2008135885 A JP2008135885 A JP 2008135885A JP 2008135885 A JP2008135885 A JP 2008135885A JP 5030861 B2 JP5030861 B2 JP 5030861B2
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- 239000013078 crystal Substances 0.000 title claims description 150
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 title claims description 69
- 238000002834 transmittance Methods 0.000 claims description 34
- 238000006243 chemical reaction Methods 0.000 claims description 28
- 230000003287 optical effect Effects 0.000 claims description 19
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 claims description 17
- 229910052708 sodium Inorganic materials 0.000 claims description 17
- 239000011734 sodium Substances 0.000 claims description 17
- 229910052765 Lutetium Inorganic materials 0.000 claims description 14
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 claims description 14
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 claims description 14
- 229910052700 potassium Inorganic materials 0.000 claims description 14
- 239000011591 potassium Substances 0.000 claims description 14
- 239000002994 raw material Substances 0.000 description 32
- 239000002516 radical scavenger Substances 0.000 description 16
- 239000007789 gas Substances 0.000 description 14
- 238000000034 method Methods 0.000 description 13
- 229910016036 BaF 2 Inorganic materials 0.000 description 12
- 239000000463 material Substances 0.000 description 12
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 11
- 229910052799 carbon Inorganic materials 0.000 description 11
- 239000000843 powder Substances 0.000 description 9
- 238000005259 measurement Methods 0.000 description 8
- 239000011812 mixed powder Substances 0.000 description 8
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 7
- 229910052731 fluorine Inorganic materials 0.000 description 7
- 239000011737 fluorine Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 150000001875 compounds Chemical class 0.000 description 5
- 239000008710 crystal-8 Substances 0.000 description 5
- 239000012535 impurity Substances 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 238000005498 polishing Methods 0.000 description 5
- 241000862969 Stella Species 0.000 description 4
- 230000005621 ferroelectricity Effects 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 238000001816 cooling Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 238000001095 inductively coupled plasma mass spectrometry Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000000411 transmission spectrum Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910004261 CaF 2 Inorganic materials 0.000 description 1
- 229910005269 GaF 3 Inorganic materials 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910008449 SnF 2 Inorganic materials 0.000 description 1
- 230000006750 UV protection Effects 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 150000002222 fluorine compounds Chemical class 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000010309 melting process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
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- Compounds Of Alkaline-Earth Elements, Aluminum Or Rare-Earth Metals (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Description
容器9に収容される混合原料7としては、フッ素系化合物としてBaF2とMgF2とを、BaMgF4の化学量論比又は化学量論比に極めて近い割合で混合した混合原料を用いることができる。さらにこの混合原料には、スカベンジャーを混合してもよい。
溶融工程では、上記混合原料7を専用の容器9に入れ、結晶成長炉11内のシャフト10の上に配置する。その後、チャンバー4を閉じ、油回転ポンプや油拡散ポンプなどから構成される真空システムを用いて結晶成長炉11内のガスを排気して真空にする。
容器9内で混合原料7が均一に溶融するまで静置したら、次いで、容器9を移動方向軸Aに沿って徐々に降下させていき、結晶成長炉11の下方の低温領域へ移動させる。この移動に伴って、容器9中の固液界面が上へと移動して、BaMgF4の単結晶が成長していく。なお、単結晶を成長させる段階において、シャフト10を水冷することにより、容器9内で凝固した単結晶から潜熱を効率よく奪うことができる。
透過率低下の割合(%)=(T1−T2)×100/T1 (1)
BaMgF4の原料として、BaF2にはステラケミファ製BaF2粉末(Grade1)を、MgF2にはステラケミファ製MgF2粉末(Grade1)をそれぞれ使用した。これらを、所定の化学量論比が得られるように、BaF2を368.91g、MgF2を131.09g秤量した。また、スカベンジャーとしてシグマアルドリッチ製(>99.99%)のBiF3粉末を、原料総重量に対して0.2重量%添加した。これらの原料およびスカベンジャーの混合粉末を、プラスチック製の容器に入れ、ロールミルを用いて回転数120rpmで2時間以上混合した。
BaMgF4の原料として、BaF2には添川理化学製BaF2粉末(無水99.999%)を、MgF2には添川理化学製MgF2粉末(無水99.99%)をそれぞれ使用した。これらを、所定の化学量論比が得られるように、BaF2を368.91g、MgF2を131.09g秤量した。また、スカベンジャーとしてシグマアルドリッチ製(>99.99%)のBiF3粉末を原料総重量に対して0.2重量%添加した。これらの原料およびスカベンジャーの混合粉末をプラスチック製の容器に入れ、ロールミルを用いて回転数120rpmで2時間以上混合した。
異なる原料および育成条件で作製された上記BaMgF4単結晶A及び単結晶Bを、図3に示す方法で評価した。
Claims (4)
- Ba 1−y (Mg 1−x Zn x ) 1+y F 4 (但し、0≦x≦1且つ−0.2≦y≦0.2である)で表されるフッ化物の結晶であり、
カリウム、ナトリウム及びルテチウムの総量が、質量濃度で30ppm以下であり、
エネルギー密度5〜100(mJ/cm 2 ・Pulse)のArFエキシマレーザーを10 4 パルス以上照射したときの、波長193nmの光に対する透過率低下が厚さ5mmあたり10%以下であることを特徴とする強誘電体フッ化物結晶。 - 前記カリウム、ナトリウム及びルテチウムの総量が、質量濃度で1ppm以上、30ppm以下であることを特徴とする、請求項1記載の強誘電体フッ化物結晶。
- 請求項1又は2記載の強誘電体フッ化物結晶からなることを特徴とする波長変換素子。
- 請求項1又は2記載の強誘電体フッ化物結晶からなることを特徴とする光学部品。
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JP5030861B2 true JP5030861B2 (ja) | 2012-09-19 |
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Cited By (1)
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JP2009281936A (ja) * | 2008-05-23 | 2009-12-03 | Hitachi Chem Co Ltd | 強誘電体フッ化物結晶のレーザー耐久性評価方法及び選別方法、並びに、強誘電体フッ化物結晶及び光学部品 |
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KR101303853B1 (ko) | 2011-02-01 | 2013-09-04 | 한국과학기술연구원 | 강유전체 박막의 형성방법 및 평면 구조 소자의 제조방법 |
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JP3337638B2 (ja) * | 1997-03-31 | 2002-10-21 | キヤノン株式会社 | フッ化物結晶の製造方法及び光学部品の製造方法 |
JP4569001B2 (ja) * | 2000-12-27 | 2010-10-27 | 株式会社ニコン | フッ化物結晶の製造方法 |
JP2003165723A (ja) * | 2001-11-28 | 2003-06-10 | Canon Inc | 結晶製造方法及びそれによって製造された光学素子を含む光学系、並びに、露光装置 |
WO2004083497A1 (ja) * | 2003-03-20 | 2004-09-30 | Riken | フッ化物単結晶の製造方法および波長変換素子 |
JP2005272219A (ja) * | 2004-03-25 | 2005-10-06 | Nikon Corp | 非線形光学結晶、非線形光学結晶の製造方法および波長変換素子 |
JP2007308349A (ja) * | 2006-05-22 | 2007-11-29 | Tokuyama Corp | BaLiF3結晶体の熱処理方法。 |
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JP2009281936A (ja) * | 2008-05-23 | 2009-12-03 | Hitachi Chem Co Ltd | 強誘電体フッ化物結晶のレーザー耐久性評価方法及び選別方法、並びに、強誘電体フッ化物結晶及び光学部品 |
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