JP4987737B2 - 蛍光検出デバイス - Google Patents
蛍光検出デバイス Download PDFInfo
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- JP4987737B2 JP4987737B2 JP2007557624A JP2007557624A JP4987737B2 JP 4987737 B2 JP4987737 B2 JP 4987737B2 JP 2007557624 A JP2007557624 A JP 2007557624A JP 2007557624 A JP2007557624 A JP 2007557624A JP 4987737 B2 JP4987737 B2 JP 4987737B2
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- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
- 229910052709 silver Inorganic materials 0.000 claims description 5
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- 239000000463 material Substances 0.000 claims description 4
- 229920000642 polymer Polymers 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 239000000919 ceramic Substances 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Mathematical Physics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
Claims (20)
- サンプル(11)を支持するための支持手段(1)と、前記サンプル(11)によって蛍光が放出されるようにするサンプル励起手段(2)と、前記蛍光を検出するための検出手段(3)とを備える蛍光検出デバイスであって、前記支持手段(1)は、前記蛍光を複数の方向に向け直す粗い表面(15)を有する金属導電層を備え、前記検出手段(3)は、複数の方向に向け直された前記蛍光を収集する観測円錐をカバーすることを特徴とする蛍光検出デバイス。
- 前記観測円錐は、少なくとも10度の頂角により規定されることを特徴とする請求項1に記載の蛍光検出デバイス。
- 前記粗い表面(15)は、粗さの標準偏差(∂)により規定され、0ではなく、100nm未満である粗さを有することを特徴とする請求項1または2に記載の蛍光検出デバイス。
- 前記粗い表面(15)は、粗さの平均空間周期(λA)により規定される粗さを有し、前記粗さの平均空間周期(λA)は、前記粗い表面(15)のトポグラフィ画像のパワースペクトルの半径方向プロファイルから得られ、0ではなく、1000nm未満であることを特徴とする請求項1から3のいずれか一項に記載の蛍光検出デバイス。
- 前記粗い表面(15)は、粗さの空間周期のレンジ(Δλ)により規定される粗さを有し、前記粗さの空間周期のレンジ(Δλ)は、前記粗い表面(15)のトポグラフィ画像のパワースペクトルの半径方向プロファイルから得られ、0ではなく、1500nm未満であることを特徴とする請求項1から4のいずれか一項に記載の蛍光検出デバイス。
- 前記粗い表面(15)を有する前記層は、連続的又は準連続的であることを特徴とする請求項1から5のいずれか一項に記載の蛍光検出デバイス。
- 前記金属層は、銀、金、銅、アルミニウム、又は白金で形成されていることを特徴とする請求項1に記載の蛍光検出デバイス。
- 前記導電層(113)の厚さは、20nmよりも大きいことを特徴とする請求項1から7のいずれか一項に記載の蛍光検出デバイス。
- 前記支持手段(101)は、蛍光プロセスに伴う励起波長及び放出波長に対して透明なスペーシング層(112)を備えることを特徴とする請求項1から8のいずれか一項に記載の蛍光検出デバイス。
- 前記スペーシング層(112)は、ポリマーの層であることを特徴とする請求項9に記載の蛍光検出デバイス。
- 前記スペーシング層(112)は、セラミック層であることを特徴とする請求項9に記載の蛍光検出デバイス。
- 前記スペーシング層(112)の厚さは、20nmよりも大きいことを特徴とする請求項9から11のいずれか一項に記載の蛍光検出デバイス。
- 前記スペーシング層(112)の厚さは、約60nmであり、前記導電層(113)の厚さは、約60nmであり、前記導電層(113)の表面の粗さは、粗さの標準偏差(∂)によれば約20nmと規定され、粗さの平均空間周期(λA)によれば約350nmと規定され、粗さの空間周期のレンジ(Δλ)によれば約600nmと規定されることを特徴とする請求項9から12のいずれか一項に記載の蛍光検出デバイス。
- 前記スペーシング層(312)は、厚さ勾配を有するよう構成されていることを特徴とする請求項9から13のいずれか一項に記載の蛍光検出デバイス。
- 前記スペーシング層(312)の厚さは、前記支持手段の第1の端部から前記支持手段の第2の端部へと増加することを特徴とする請求項14に記載の蛍光検出デバイス。
- 前記励起手段(2)は、照明円錐をカバーすることを特徴とする請求項1から15のいずれか一項に記載の蛍光検出デバイス。
- 前記金属導電層の前記粗い表面は、前記蛍光のエネルギーを増大させるように、プラズモンと伝搬電磁波とを結合できるよう構成されていることを特徴とする請求項1から16のいずれか一項に記載の蛍光検出デバイス。
- 請求項1から17のいずれか一項に記載の蛍光検出デバイスの使用であって、サンプル中の蛍光物質をモニタするための前記蛍光検出デバイスの使用。
- 請求項1から17のいずれか一項に記載の蛍光検出デバイスの使用であって、蛍光物質間エネルギー移動の研究のための前記蛍光検出デバイスの使用。
- 請求項1から17のいずれか一項に記載の蛍光検出デバイスの使用であって、サンプルの厚さを測定するための前記蛍光検出デバイスの使用。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05290480.2 | 2005-03-03 | ||
EP05290480A EP1698886A1 (en) | 2005-03-03 | 2005-03-03 | Fluorescence detection device |
PCT/IB2006/000647 WO2006092735A1 (en) | 2005-03-03 | 2006-03-02 | Fluorescence detection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008532035A JP2008532035A (ja) | 2008-08-14 |
JP4987737B2 true JP4987737B2 (ja) | 2012-07-25 |
Family
ID=34941982
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007557624A Expired - Fee Related JP4987737B2 (ja) | 2005-03-03 | 2006-03-02 | 蛍光検出デバイス |
Country Status (6)
Country | Link |
---|---|
US (1) | US7855785B2 (ja) |
EP (2) | EP1698886A1 (ja) |
JP (1) | JP4987737B2 (ja) |
CN (1) | CN101133318A (ja) |
CA (1) | CA2599665A1 (ja) |
WO (1) | WO2006092735A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101874388B1 (ko) * | 2017-02-14 | 2018-07-04 | 주식회사 이오테크닉스 | 형광체의 영상 획득 장치 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009147232A1 (de) * | 2008-06-05 | 2009-12-10 | Bohle Ag | Vorrichtung zur bestimmung der elementbelegung auf einer oberfläche mittels fluoreszenz |
US8648906B2 (en) * | 2010-10-13 | 2014-02-11 | Mitutoyo Corporation | Precision solder resist registration inspection method |
DE102011000090B4 (de) * | 2011-01-11 | 2016-03-24 | Leica Microsystems Cms Gmbh | Verfahren und Einrichtung zur rastermikroskopischen Abbildung eines Objektes |
CN102628985B (zh) * | 2012-04-13 | 2014-06-18 | 中国科学院光电技术研究所 | 一种利用超衍射离轴照明技术的纳米表层光学显微成像器件及成像方法 |
CN107976154B (zh) * | 2017-11-16 | 2020-03-13 | 北京工业大学 | 一种基于荧光强度的通道上/下壁面轮廓的测量方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4649280A (en) | 1985-05-10 | 1987-03-10 | The University Of Rochester | Method and system for the enhancement of fluorescence |
US5006716A (en) | 1989-02-22 | 1991-04-09 | Research Corporation Technologies, Inc. | Method and system for directional, enhanced fluorescence from molecular layers |
WO1994003774A1 (en) * | 1992-07-31 | 1994-02-17 | Biostar, Inc. | Devices and methods for detection of an analyte based upon light interference |
AT403961B (de) | 1995-03-17 | 1998-07-27 | Avl Verbrennungskraft Messtech | Optochemisches messsystem mit einem fluoreszenzsensor |
US5841143A (en) * | 1997-07-11 | 1998-11-24 | The United States Of America As Represented By Administrator Of The National Aeronautics And Space Administration | Integrated fluorescene |
US7075642B2 (en) * | 2003-02-24 | 2006-07-11 | Intel Corporation | Method, structure, and apparatus for Raman spectroscopy |
US20040246485A1 (en) * | 2003-06-09 | 2004-12-09 | Behzad Imani | Far-field measurement of properties of metallic thin films |
JP3952042B2 (ja) * | 2004-06-07 | 2007-08-01 | ソニー株式会社 | 凹状部位を有する電極を備えるハイブリダイゼーション検出部と該検出部を備えるdnaチップ |
-
2005
- 2005-03-03 EP EP05290480A patent/EP1698886A1/en not_active Withdrawn
-
2006
- 2006-03-02 JP JP2007557624A patent/JP4987737B2/ja not_active Expired - Fee Related
- 2006-03-02 CA CA002599665A patent/CA2599665A1/en not_active Abandoned
- 2006-03-02 WO PCT/IB2006/000647 patent/WO2006092735A1/en not_active Application Discontinuation
- 2006-03-02 US US11/817,664 patent/US7855785B2/en active Active
- 2006-03-02 EP EP06710581A patent/EP1869432A1/en not_active Withdrawn
- 2006-03-02 CN CNA2006800067005A patent/CN101133318A/zh active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101874388B1 (ko) * | 2017-02-14 | 2018-07-04 | 주식회사 이오테크닉스 | 형광체의 영상 획득 장치 |
Also Published As
Publication number | Publication date |
---|---|
JP2008532035A (ja) | 2008-08-14 |
EP1869432A1 (en) | 2007-12-26 |
US20080158559A1 (en) | 2008-07-03 |
CN101133318A (zh) | 2008-02-27 |
WO2006092735A1 (en) | 2006-09-08 |
CA2599665A1 (en) | 2006-09-08 |
US7855785B2 (en) | 2010-12-21 |
EP1698886A1 (en) | 2006-09-06 |
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