JP4671153B2 - Open window ionization chamber - Google Patents
Open window ionization chamber Download PDFInfo
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- JP4671153B2 JP4671153B2 JP2006066824A JP2006066824A JP4671153B2 JP 4671153 B2 JP4671153 B2 JP 4671153B2 JP 2006066824 A JP2006066824 A JP 2006066824A JP 2006066824 A JP2006066824 A JP 2006066824A JP 4671153 B2 JP4671153 B2 JP 4671153B2
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Description
従来の薄膜窓型電離箱は入射窓の薄膜やグリッドによる入射放射線の吸収があり真の値を 評価することができなかったが、本発明は入射窓に薄膜やグリッドがないので、入射放射 線の真の値を測定し評価のできる電離箱である。 While conventional thin film window ionization chamber could not be evaluated true value has absorption of incident radiation by thin film or grid entrance window, since the present invention does not thin or grid entrance window, the incident radiation It is an ionization chamber that can measure and evaluate the true value of.
従来の電離箱は外部からの静電誘導による擾乱を回避するために、入射窓には薄膜またはグリッドでシールドが必要であった。そのために約5keV以下のX線、またはα線の吸収が避けられず、真の放射線の量を評価することは困難であった。In the conventional ionization chamber, in order to avoid disturbance due to electrostatic induction from the outside, the entrance window needs to be shielded with a thin film or a grid. For this reason, absorption of X-rays or α rays of about 5 keV or less is unavoidable, and it has been difficult to evaluate the amount of true radiation.
薄膜による入射放射線の減衰が無視できない場合には膜無しの開放窓型電離箱が望まれていた。しかし、現実には薄膜を無くすると外部からの静電誘導の影響は避けられず、電離 電流を測定することは困難であった。When the attenuation of incident radiation by a thin film cannot be ignored, an open window ionization chamber without a film has been desired. However, reality is inevitable effect of the electrostatic induction from the outside when eliminating the thin film, it is difficult to measure the ionization current.
しかし、本発明のように薄膜またはグリッドを除外した開放窓型電離箱は入射窓から入る外部静電誘導を回避するために集電極をシールド効果のある高圧電極や補助電極の陰に退避させ、電離電流は電位勾配に沿って集電極に運ぶ方法でこれを解決した。本発明はα線測定の場合、空気中で発生したイオン対による電離電流は数cmの距離を電界に乗せて運ぶ方式である。However, it retracts the collector electrode to the negative of the high voltage electrode and the auxiliary electrode with shielding effect for an open window ionization chamber excluding the thin film or grid to avoid external electrostatic induction entering from the entrance window as in the present invention This was solved by a method in which the ionization current was carried along the potential gradient to the collector electrode. The present invention in the case of α-ray measurement, the ionization current due to the ion pairs generated in the air is a method of carrying put the distance of several cm to the electric field.
本発明はイオン対を電界の方向に乗せ集電極に運び検出する方法なのでイオン対の再結合 が無視できる。一方イオン対の収集効率は落ちるが、α線の存在する場所から数メートル離れていても発生したイオン対を空気流に乗せてグリッド電離箱に運び測定するLRAD 技術がある。
入射放射線により、空気または気体中に付与された真のイオン対の量を評価するために入射窓の薄膜またはグリッドを取り去り開放窓型電離箱とし、入射放射線の薄膜またはグリ ッドによる吸収を無くした。The incident radiation, and an open window ionization chamber removed and a thin film or grid entrance window to evaluate the amount of the true ion pair granted to air or gas, without absorption by thin film or grid of the incident radiation did.
入射窓の膜またはグリッドを無くしたことにより、外部からの静電誘導を受けないように集電極を配置する。 By eliminating the membrane or grid entrance window, placing the collector electrode so as not to undergo electrostatic induction from the outside.
入射窓の薄膜またはグリッドを無くしたことにより、外部からの静電誘導を受けないように集電極をシールド効果のある高圧電極、補助電極の陰に退避させた構造の電離箱とした。By eliminating the thin film or grid entrance window and the ionization chamber of the high-voltage electrode, it is retracted behind the auxiliary electrode structure collectors so not subject to electrostatic induction with the shielding effect of the external.
請求項6のα線測定用電離箱において、高圧電極と集電極の中間の補助電極は省略することもできる。 In the ionization chamber for α ray measurement according to claim 6, the auxiliary electrode in the middle of the high voltage electrode and the collector electrode can be omitted.
補助電極によりイオン対の再結合特性を改善したり、電気力線を変位させたり、あるいは電気力線を整合させたりすることができる。The auxiliary electrode can improve the recombination characteristics of the ion pair, displace the electric lines of force, or match the electric lines of force.
本発明による電離箱は薄膜またはグリッドによる入射放射線の吸収のない開放窓型電離箱なので、空気または気体中に付与された、真の全エネルギー量の測定が可能となる。Ionization chamber according to the invention since no absorption window opening ionization chamber of the incident radiation by thin film or grid, granted to air or gas, it is possible to measure the true total energy.
以下、本発明の好適な実施形態を図面に基づいて説明する。 DESCRIPTION OF EXEMPLARY EMBODIMENTS Hereinafter, preferred embodiments of the invention will be described with reference to the drawings.
図1の集電極配置は単位体積中に発生したイオン対による電離電流を測定する場合の原理図で、高圧電極1、補助電極2、集電極3の電極間隔を同一にして抵抗Rにより分割接続した例である。The collector electrode arrangement in FIG. 1 is a principle diagram for measuring the ionization current due to ion pairs generated in a unit volume, and the electrode spacing of the high voltage electrode 1,
図1の集電極3は反転増幅器に接続したとき仮想的にガード電極4と同電位になる。高圧電極1とガード電極4間に高圧を印加して電気力線が平行になるようにする。なお、シールドケース7は増幅器のグランド端子に接続し、ガード電極4と同電位にする。集電極3は高絶縁物5により支持され電離電流が出力される。補助電極2とガード電極4は絶縁物6を介して抵抗に接続されている。高圧電極1の支持絶縁物は省略してある。 The
図1において、高圧電極1とガード電極4間に高電圧を印加して電気力線が一様に平行になったとき、照射放射線ビームの断面積と補助電極の穴形状からイオン対の生じた実効体積が算出でき、これにより単位体積当たりの電離電流が算定できる電離箱。 In FIG. 1, when a high voltage is applied between the high-voltage electrode 1 and the guard electrode 4 and the lines of electric force are uniformly parallel, ion pairs are generated from the cross-sectional area of the irradiation radiation beam and the hole shape of the auxiliary electrode. An ionization chamber that can calculate the effective volume and the ionization current per unit volume.
図2は単位面積当たりのイオン対による電離電流測定の原理図である。集電極3は高圧電極1の陰に退避していて、入射窓からの静電誘導による擾乱を受けないように配慮されている。FIG. 2 is a principle diagram of ionization current measurement by ion pairs per unit area. The collecting
図1の高圧電極1と補助電極2とガード電極4は抵抗RとRにより、図2の高圧電極1と補助電極2とグランドは抵抗R1とR2により分割接続されている。集電極3は反転増幅器に接続したとき仮想接地となりグランドと同電位になる。高圧電極1とグランド間に高電圧を印加する。集電極は高絶縁物5(図2では省略)により支持され電離電流が出力される。図2では補助電極2は高圧電極1から絶縁物6を介して絶縁され、また別の絶縁物6を介して抵抗R1,R2に接続されている。The high-voltage electrode 1,
図2では窓から入射したα線により電離箱内で発生したイオン対による電離電流は補助電極2に向かう電界に乗って移動する。電離電流が集電極3の影響の及ぶ領域に入ると電界は補助電極2から集電極3に向かい急激に曲げられ、更にこれに乗って集電極3に運ばれる。これにより入射窓面積から単位面積当たりの電離電流が算定できる。In FIG. 2, the ionization current due to the ion pairs generated in the ionization chamber due to the α rays incident from the window moves on the electric field toward the
1 高圧電極
2 補助電極
3 集電極
4 ガード電極
5 高絶縁物
6 絶縁物
7 シールドケース
1 High Voltage Electrode 2 Auxiliary Electrode 3 Collector Electrode 4 Guard Electrode 5 High Insulator 6 Insulator 7 Shield Case
Claims (7)
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JP4671153B2 true JP4671153B2 (en) | 2011-04-13 |
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Families Citing this family (2)
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GB201219488D0 (en) * | 2012-10-30 | 2012-12-12 | Univ Sussex | Apparatus for sensing ionic current and ionising radiation |
JP7223728B2 (en) * | 2020-07-30 | 2023-02-16 | 三菱電機プラントエンジニアリング株式会社 | Radioactive contamination inspection device |
Citations (11)
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JPS4511109Y1 (en) * | 1966-08-23 | 1970-05-19 | ||
JPS61239185A (en) * | 1985-04-15 | 1986-10-24 | Rikagaku Kenkyusho | Low-speed electron measuring device |
JPS6361179A (en) * | 1986-08-30 | 1988-03-17 | Rikagaku Kenkyusho | Apparatus for measuring low speed electron |
JPH02120687A (en) * | 1988-10-31 | 1990-05-08 | Fuji Electric Co Ltd | Gas flow type radiation detector |
JPH11344572A (en) * | 1998-06-03 | 1999-12-14 | Takasago Thermal Eng Co Ltd | Ion detecting device and ionizing radiation detecting device |
JP2000193749A (en) * | 1998-12-28 | 2000-07-14 | Toshiba Corp | alphabeta DETECTOR AND alphabeta DETECTING DEVICE USING IT |
JP2000338252A (en) * | 1999-05-28 | 2000-12-08 | Toshiro Kawaguchi | Radiation-measuring device |
JP2001116844A (en) * | 1999-10-21 | 2001-04-27 | Aloka Co Ltd | Instrument for measuring radiation |
JP2003519388A (en) * | 1999-12-29 | 2003-06-17 | エックスカウンター アーベー | Method and apparatus for radiography and radiation detector |
JP2003194946A (en) * | 2001-12-25 | 2003-07-09 | Toshiba Corp | Method and apparatus for measurement of radioactivity and radioactive waste disposal system |
JP2004191179A (en) * | 2002-12-11 | 2004-07-08 | Hitachi Ltd | Geiger-muller counter |
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Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4511109Y1 (en) * | 1966-08-23 | 1970-05-19 | ||
JPS61239185A (en) * | 1985-04-15 | 1986-10-24 | Rikagaku Kenkyusho | Low-speed electron measuring device |
JPS6361179A (en) * | 1986-08-30 | 1988-03-17 | Rikagaku Kenkyusho | Apparatus for measuring low speed electron |
JPH02120687A (en) * | 1988-10-31 | 1990-05-08 | Fuji Electric Co Ltd | Gas flow type radiation detector |
JPH11344572A (en) * | 1998-06-03 | 1999-12-14 | Takasago Thermal Eng Co Ltd | Ion detecting device and ionizing radiation detecting device |
JP2000193749A (en) * | 1998-12-28 | 2000-07-14 | Toshiba Corp | alphabeta DETECTOR AND alphabeta DETECTING DEVICE USING IT |
JP2000338252A (en) * | 1999-05-28 | 2000-12-08 | Toshiro Kawaguchi | Radiation-measuring device |
JP2001116844A (en) * | 1999-10-21 | 2001-04-27 | Aloka Co Ltd | Instrument for measuring radiation |
JP2003519388A (en) * | 1999-12-29 | 2003-06-17 | エックスカウンター アーベー | Method and apparatus for radiography and radiation detector |
JP2003194946A (en) * | 2001-12-25 | 2003-07-09 | Toshiba Corp | Method and apparatus for measurement of radioactivity and radioactive waste disposal system |
JP2004191179A (en) * | 2002-12-11 | 2004-07-08 | Hitachi Ltd | Geiger-muller counter |
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