JP4658634B2 - Electroless plating catalyst solution and electroless plating method using the same - Google Patents

Electroless plating catalyst solution and electroless plating method using the same Download PDF

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JP4658634B2
JP4658634B2 JP2005034548A JP2005034548A JP4658634B2 JP 4658634 B2 JP4658634 B2 JP 4658634B2 JP 2005034548 A JP2005034548 A JP 2005034548A JP 2005034548 A JP2005034548 A JP 2005034548A JP 4658634 B2 JP4658634 B2 JP 4658634B2
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electroless plating
chloride
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palladium
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宣明 芳賀
健一 三森
正実 柴田
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Alps Alpine Co Ltd
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Description

本発明は、無電解めっきに用いられる無電解めっき用触媒液及びそれを用いた無電解めっき方法に関する。   The present invention relates to an electroless plating catalyst solution used for electroless plating and an electroless plating method using the same.

例えば、ガラスやセラミックス、プラスチックなどの非導電性物質は、無電解めっきに対する触媒活性がなく、この上に無電解めっきの被膜を直接形成することはできない。したがって、このような触媒活性のない被めっき物に無電解めっきを施す場合には、一般に触媒液でパラジウム(Pd)などの触媒を付与して被めっき物の表面を活性化した後に無電解めっきを施すことが行われている。しかしながら、従来の無電解めっき用触媒液では、被めっき物に対するめっき被膜の密着性が不足してしまうといった問題があった(例えば、特許文献1を参照。)。このため、例えば無電解めっき用触媒液のパラジウムの濃度やpHを管理することが行われているものの、密着性に優れためっき被膜を安定して得ることは困難であった。
特開平10−30188号公報
For example, non-conductive substances such as glass, ceramics, and plastics have no catalytic activity for electroless plating, and an electroless plating film cannot be directly formed thereon. Therefore, when electroless plating is applied to an object to be plated that does not have catalytic activity, electroless plating is generally performed after applying a catalyst such as palladium (Pd) with a catalyst solution to activate the surface of the object to be plated. It has been done. However, the conventional electroless plating catalyst solution has a problem that the adhesion of the plating film to the object to be plated is insufficient (see, for example, Patent Document 1). For this reason, for example, although the concentration and pH of palladium in the electroless plating catalyst solution are controlled, it has been difficult to stably obtain a plating film having excellent adhesion.
Japanese Patent Laid-Open No. 10-30188

本発明はかかる問題に鑑みてなされたもので、その目的は、密着性に優れためっき被膜を安定して得ることができる無電解めっき用触媒液及びそれを用いた無電解めっき方法を提供することにある。   The present invention has been made in view of such problems, and an object thereof is to provide an electroless plating catalyst solution capable of stably obtaining a plating film having excellent adhesion and an electroless plating method using the same. There is.

この目的を達成するために、本発明の無電解めっき用触媒液は、少なくともパラジウム塩と、塩化物イオンとを含む水溶液からなり、且つ、この水溶液中の水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積が、10−13<[H・[Cl<10−8の範囲にあることを特徴とする。ここで、水素イオンの濃度[H]と塩化物イオンの濃度[Cl]とは、それぞれmol/Lで表される。
本発明において、前記水溶液中の水素イオンの濃度[H ]と塩化物イオンの濃度[Cl ]との積を、10 −11.8 <[H ・[Cl <10 −8 の範囲にすることができる。
また、本発明の無電解めっき用触媒液は、前記パラジウム塩が、塩化パラジウム(II)、塩化パラジウム(II)ナトリウム、塩化パラジウム(II)アンモニウムの中から選ばれる少なくとも1種又は複数種であることを特徴とする。
また、本発明の無電解めっき用触媒液は、更に金塩を含むことを特徴とする。
また、本発明の無電解めっき用触媒液は、前記金塩が、テトラクロロ金(III)酸、テトラクロロ金(III)酸ナトリウム、テトラクロロ金(III)酸カリウム、テトラクロロ金(III)酸アンモニウムの中から選ばれる少なくとも1種又は複数種であることを特徴とする。
また、本発明の無電解めっき用触媒液は、前記塩化物イオンが、パラジウム塩、金塩、塩酸、塩化ナトリウム、塩化カリウムの中から選ばれる少なくとも1種又は複数種に由来するものであることを特徴とする。
また、本発明の無電解めっき用触媒液は、前記水溶液のpH調整に水酸化ナトリウム又は水酸化カリウムを用いることを特徴とする。
本発明において、前記パラジウム塩は、塩化パラジウム(II)、塩化パラジウム(II)ナトリウム、塩化パラジウム(II)アンモニウムの中から選ばれる少なくとも1種又は複数種であり、前記塩化物イオンは、パラジウム塩、金塩、塩酸、塩化ナトリウム、塩化カリウムの中から選ばれる少なくとも1種又は複数種に由来するものであり、前記水溶液のpH調整に水酸化ナトリウム又は水酸化カリウムが用いられてなる無電解めっき用触媒液とすることができる。
また、本発明の無電解めっき方法は、前記何れかの無電解めっき用触媒液を用いて、被めっき物に触媒を付与した後に、前記被めっき物に無電解めっきを施すことを特徴とする。
また、本発明の無電解めっき方法は、前記被めっき物に無電解ニッケルめっきを施すことを特徴とする。
In order to achieve this object, the electroless plating catalyst solution of the present invention comprises an aqueous solution containing at least a palladium salt and chloride ions, and the concentration of hydrogen ions [H + ] and chloride in the aqueous solution. The product of the product ion concentration [Cl ] is in the range of 10 −13 <[H + ] 2 · [Cl ] 4 <10 −8 . Here, the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] are each expressed in mol / L.
In the present invention, the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] in the aqueous solution is 10 −11.8 <[H + ] 2 · [Cl ] 4 <10. It can be in the range of -8 .
In the electroless plating catalyst solution of the present invention, the palladium salt is at least one or more selected from palladium (II) chloride, sodium palladium (II) chloride, and ammonium palladium (II) chloride. It is characterized by that.
In addition, the electroless plating catalyst solution of the present invention further includes a gold salt.
Further, in the electroless plating catalyst solution of the present invention, the gold salt is tetrachlorogold (III) acid, sodium tetrachlorogold (III), potassium tetrachlorogold (III), tetrachlorogold (III). It is at least one or more kinds selected from ammonium acid.
In the electroless plating catalyst solution of the present invention, the chloride ion is derived from at least one or more selected from palladium salt, gold salt, hydrochloric acid, sodium chloride, and potassium chloride. It is characterized by.
The electroless plating catalyst solution of the present invention is characterized in that sodium hydroxide or potassium hydroxide is used for pH adjustment of the aqueous solution.
In the present invention, the palladium salt is at least one kind selected from palladium chloride (II), palladium chloride (II) sodium and palladium chloride (II) ammonium, and the chloride ion is a palladium salt. Electroless plating derived from at least one or more selected from gold salt, hydrochloric acid, sodium chloride, and potassium chloride, and using sodium hydroxide or potassium hydroxide to adjust the pH of the aqueous solution. Catalyst solution.
Further, the electroless plating method of the present invention is characterized in that after any of the above electroless plating catalyst solutions is applied to the object to be plated, electroless plating is performed on the object to be plated. .
Moreover, the electroless plating method of the present invention is characterized in that electroless nickel plating is applied to the object to be plated.

以上のように、本発明の無電解めっき用触媒液では、少なくともパラジウム塩と、塩化物イオンとを含む水溶液中の水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積を10−13<[H・[Cl<10−8の範囲にすることによって、被めっき物にめっき被膜の密着性に優れた触媒を付与することができる。したがって、本発明の無電解めっき方法では、前記無電解めっき用触媒液を用いて被めっき物に触媒を付与した後に無電解めっきを施すことによって、この被めっき物に密着性に優れためっき被膜を安定して形成することができる。 As described above, in the electroless plating catalyst solution of the present invention, the concentration of hydrogen ions [H + ] and the concentration of chloride ions [Cl ] in an aqueous solution containing at least a palladium salt and chloride ions. By setting the product to a range of 10 −13 <[H + ] 2 · [Cl ] 4 <10 −8 , a catalyst having excellent plating film adhesion can be imparted to the object to be plated. Therefore, in the electroless plating method of the present invention, a plating film having excellent adhesion to the object to be plated by applying the electroless plating after applying the catalyst to the object to be plated using the electroless plating catalyst solution. Can be formed stably.

以下、本発明を適用した無電解めっき用触媒液及びそれを用いた無電解めっき方法について詳細に説明する。
先ず、本発明を適用した無電解めっき用触媒液について説明する。
本発明を適用した無電解めっき用触媒液は、少なくともパラジウム(Pd)塩と、塩化物イオンとを含む水溶液からなり、本発明者らは、このような無電解めっき用触媒液がめっき被膜の密着性に与える影響を調べたところ、この水溶液中の水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積がめっき被膜の密着性に大きな影響を与えることを見出した。
Hereinafter, the electroless plating catalyst solution to which the present invention is applied and the electroless plating method using the same will be described in detail.
First, the electroless plating catalyst solution to which the present invention is applied will be described.
The electroless plating catalyst solution to which the present invention is applied is composed of an aqueous solution containing at least palladium (Pd) salt and chloride ions. As a result of investigating the influence on adhesion, it was found that the product of the concentration of hydrogen ions [H + ] and the concentration of chloride ions [Cl ] in this aqueous solution has a great influence on the adhesion of the plating film. .

具体的に、無電解めっき用触媒液に一般的に用いられる塩化パラジウム(II)は、水溶液中で下記化1に示す平衡状態となる。

Figure 0004658634
したがって、この場合の平衡定数Kは、下記数1で表される。
Figure 0004658634
また、この場合の水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積は、下記数2で表すことができる。
Figure 0004658634
Specifically, palladium (II) chloride generally used in the electroless plating catalyst solution is in an equilibrium state shown in the following chemical formula 1 in an aqueous solution.
Figure 0004658634
Therefore, the equilibrium constant K in this case is expressed by the following formula 1.
Figure 0004658634
In this case, the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] can be expressed by the following formula 2.
Figure 0004658634

本発明を適用した無電解めっき用触媒液では、上記数2で表される水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積が、10−13<[H・[Cl<10−8の範囲にあることが望ましい。すなわち、この積が10−13よりも小さくなると、上記化1中の水酸化パラジウムが沈殿してくるため、被めっき物の表面に付着する金属パラジウムの微粒子が粗大化してしまい、めっき被膜の密着性が悪くなる。一方、この積が10−8よりも大きくなると、pH値が低くなり且つ塩化物イオンが多くなり、パラジウム錯体が安定化して被めっき物に付着せず、同じくめっき被膜の密着性が悪くなる。 In the electroless plating catalyst solution to which the present invention is applied, the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] represented by the above formula 2 is 10 −13 <[H + ] 2 · [Cl ] 4 <10 −8 is preferable. That is, when this product is smaller than 10 −13 , palladium hydroxide in the chemical formula 1 is precipitated, so that the metal palladium fine particles adhering to the surface of the object to be plated become coarse, and the adhesion of the plating film is increased. Sexuality gets worse. On the other hand, when this product is larger than 10 −8 , the pH value is lowered and the chloride ions are increased, the palladium complex is stabilized and does not adhere to the object to be plated, and the adhesion of the plating film is also deteriorated.

したがって、この無電解めっき用触媒液では、その水溶液中に含まれる水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積が、10−13<[H・[Cl<10−8の範囲となるように、その水素イオンの濃度[H]と塩化物イオンの濃度[Cl]とを調整する。具体的に、この無電解めっき用触媒液では、パラジウム塩として、上述した塩化パラジウム(II)の他に、塩化パラジウム(II)ナトリウムや、塩化パラジウム(II)アンモニウムなどを用いることができ、これらの中から選ばれる少なくとも1種又は複数種を用いることができる。また、この無電解めっき用触媒液は、その水溶液中に金(Au)塩を含むものであってもよい。金塩としては、例えばテトラクロロ金(III)酸や、テトラクロロ金(III)酸ナトリウムや、テトラクロロ金(III)酸カリウム、テトラクロロ金(III)酸アンモニウムなどを用いることができ、これらの中から選ばれる少なくとも1種又は複数種を用いることができる。 Therefore, in this electroless plating catalyst solution, the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] contained in the aqueous solution is 10 −13 <[H + ] 2. The concentration of hydrogen ions [H + ] and the concentration of chloride ions [Cl ] are adjusted so as to be in the range of [Cl ] 4 <10 −8 . Specifically, in this electroless plating catalyst solution, palladium (II) sodium chloride, palladium (II) ammonium chloride, and the like can be used as the palladium salt in addition to the above-described palladium (II) chloride. At least one or more selected from among the above can be used. The electroless plating catalyst solution may contain a gold (Au) salt in the aqueous solution. Examples of the gold salt include tetrachlorogold (III) acid, sodium tetrachlorogold (III), potassium tetrachlorogold (III), ammonium tetrachlorogold (III), and the like. At least one or more selected from among the above can be used.

また、この無電解めっき用触媒液では、上述したパラジウム塩や金塩の他に、塩酸(HCl)、塩化ナトリウム(NaCl)又は塩化カリウム(KCl)を水溶液に投入することによって、この水溶液中に含まれる水素イオンの濃度[H]と塩化物イオンの濃度[Cl]とを容易に調整することができる。すなわち、この水溶液中の水素イオン及び塩化物イオンは、上述したパラジウム塩や金塩の他にも、この水溶液に投入される塩酸、塩化ナトリウム又は塩化カリウムに由来するものであってもよい。さらに、この無電解めっき用触媒液のpH調整には、水酸化ナトリウム(NaOH)や水酸化カリウム(KOH)を用いることができる。 Further, in this electroless plating catalyst solution, in addition to the above-described palladium salt and gold salt, hydrochloric acid (HCl), sodium chloride (NaCl), or potassium chloride (KCl) is added to the aqueous solution. The concentration [H + ] of contained hydrogen ions and the concentration [Cl ] of chloride ions can be easily adjusted. That is, hydrogen ions and chloride ions in this aqueous solution may be derived from hydrochloric acid, sodium chloride, or potassium chloride introduced into this aqueous solution in addition to the palladium salt and gold salt described above. Furthermore, sodium hydroxide (NaOH) or potassium hydroxide (KOH) can be used to adjust the pH of the electroless plating catalyst solution.

以上のようにして、この無電解めっき用触媒液では、その水溶液中に含まれる水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積を10−13<[H・[Cl<10−8の範囲に保つことで、被めっき物にめっき被膜の密着性に優れた触媒を付与することができる。さらに、本発明では、このような無電解めっき用触媒液の管理を容易に行うことができる。 As described above, in this electroless plating catalyst solution, the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] contained in the aqueous solution is 10 −13 <[H + ] By keeping it in the range of 2 · [Cl ] 4 <10 −8 , a catalyst excellent in adhesion of the plating film can be imparted to the object to be plated. Furthermore, in the present invention, such a catalyst solution for electroless plating can be easily managed.

次に、上記無電解めっき用触媒液を用いた無電解めっき方法について説明する。
本発明の無電解めっき方法は、例えば図1に示すように、被めっき物である基板1の表面にニッケル(Ni)めっき被膜2を形成する場合に適用可能であり、この基板1には、例えば、ガラス基板やセラミックス基板、シリコン基板、樹脂基板上に金属被膜を形成したものなどを用いることができる。そして、この基板1に無電解ニッケルめっきを施す前には、基板1の表面にOH基を多く配置させるための処理として、酸(硫酸過水)やアルカリ、温水(純水)などを用いた超音波洗浄や、紫外線を用いた洗浄を基板1に対して行っておくことが望ましい。これにより、基板1の表面から密着性を阻害する油脂や塵埃などを取り除くと共に、後述するシランカップリング剤が基板1の表面に強固に付着し結合できる素地を形成しておくことができる。なお、このような基板1としては、例えばアルミナ(Al)を主体とするセラミック基板をアセトンで超音波洗浄した後に硫酸過水で洗浄したものや、ガラス基板を紫外線で洗浄した後に純水で超音波洗浄したもの、シリコン基板を硫酸過水で洗浄したものなどを挙げることができる。なお、被めっき物は、このような基板状のものに必ずしも限定されるものではなく、所定の形状に加工されたものであってもよい。
Next, an electroless plating method using the electroless plating catalyst solution will be described.
The electroless plating method of the present invention can be applied to the case where a nickel (Ni) plating film 2 is formed on the surface of a substrate 1 which is an object to be plated, for example, as shown in FIG. For example, a glass substrate, a ceramic substrate, a silicon substrate, a resin substrate on which a metal film is formed, or the like can be used. Before applying electroless nickel plating to the substrate 1, acid (sulfuric acid / hydrogen peroxide), alkali, warm water (pure water), or the like was used as a treatment for disposing a large amount of OH groups on the surface of the substrate 1. It is desirable to perform ultrasonic cleaning or cleaning using ultraviolet rays on the substrate 1 in advance. This removes oils and fats that impede adhesion from the surface of the substrate 1 and forms a substrate on which a silane coupling agent to be described later can firmly adhere to and bind to the surface of the substrate 1. As such a substrate 1, for example, a ceramic substrate mainly composed of alumina (Al 2 O 3 ) is ultrasonically cleaned with acetone and then cleaned with sulfuric acid / hydrogen peroxide, or a glass substrate is purified after being cleaned with ultraviolet rays. Examples include those obtained by ultrasonic cleaning with water and those obtained by cleaning a silicon substrate with sulfuric acid / hydrogen peroxide. The object to be plated is not necessarily limited to such a substrate shape, and may be processed into a predetermined shape.

そして、このような基板1の表面に無電解ニッケルめっきを施す際は、先ず、基板1の表面にシランカップリング処理を施す。このシランカップリング処理には、アミノシラン系のカップリング剤を用いることが望ましく、例えば、3−アミノプロピルトリエトキシシランや、N−2(アミノエチル)3−アミノプロピルメチルジメトキシシランなどの希薄溶液を用いることができる。これにより、密着性の要となるシランカップリング剤を基板1の表面に強固に結合させることができる。   When electroless nickel plating is performed on the surface of the substrate 1, first, silane coupling treatment is performed on the surface of the substrate 1. For this silane coupling treatment, it is desirable to use an aminosilane-based coupling agent. For example, a dilute solution such as 3-aminopropyltriethoxysilane or N-2 (aminoethyl) 3-aminopropylmethyldimethoxysilane is used. Can be used. Thereby, the silane coupling agent which becomes the key of adhesiveness can be firmly bonded to the surface of the substrate 1.

次に、基板1を上記無電解めっき用触媒液に液浸させることによって、この基板1のシランカップリング処理が施された面に触媒処理を施す。これにより、基板1のシランカップリング処理が施された面にパラジウム及び金の触媒を付与することができる。   Next, the substrate 1 is immersed in the electroless plating catalyst solution, whereby the surface of the substrate 1 that has been subjected to the silane coupling treatment is subjected to a catalyst treatment. Thereby, the catalyst of palladium and gold | metal | money can be provided to the surface by which the silane coupling process of the board | substrate 1 was performed.

次に、基板1をニッケルめっき浴に液浸させることによって、この基板1の触媒処理が施された面に無電解ニッケルめっきを施す。このニッケルめっき浴には、例えば硫酸ニッケルや、ホスフィン酸ナトリウム、グリシンなどを含むめっき液を用いることができる。以上のようにして、基板1上にNiめっき被膜2を形成することができる。   Next, electroless nickel plating is performed on the surface of the substrate 1 that has been subjected to the catalyst treatment by immersing the substrate 1 in a nickel plating bath. For the nickel plating bath, for example, a plating solution containing nickel sulfate, sodium phosphinate, glycine, or the like can be used. As described above, the Ni plating film 2 can be formed on the substrate 1.

本発明を適用した無電解めっき方法では、上述した無電解めっき用触媒液を用いて基板1に触媒を付与した後に無電解ニッケルめっきを施すことから、この基板1に密着性に優れたNiめっき被膜2を安定して形成することができる。   In the electroless plating method to which the present invention is applied, since the electroless nickel plating is performed after applying the catalyst to the substrate 1 using the above-described electroless plating catalyst solution, the Ni plating having excellent adhesion to the substrate 1 is applied. The film 2 can be formed stably.

なお、本発明の無電解めっき方法は、被めっき物に無電解ニッケルめっきを施す場合に必ずしも限定されるものではなく、例えば被めっき物に無電解銅めっきなどの無電解めっきを施す場合にも適用可能である。また、本発明の無電解めっき方法では、被めっき物に上記無電解ニッケルめっきを施した後に、無電解銅めっきなどの異なった無電解めっきを施すことも可能である。   In addition, the electroless plating method of the present invention is not necessarily limited to the case where electroless nickel plating is applied to an object to be plated, and for example, when electroless plating such as electroless copper plating is applied to an object to be plated. Applicable. In the electroless plating method of the present invention, it is also possible to perform different electroless plating such as electroless copper plating after the electroless nickel plating is applied to the object to be plated.

以下、実施例により本発明の効果をより明らかなものとするが、以下の実施例は本発明の技術範囲を限定するものではない。
(実施例1)
実施例1では、先ず、被めっき物としてアルミナを主体とするセラミック基板を用意し、この基板をアセトンで超音波洗浄した後に硫酸過水で洗浄した。次に、基板を3−アミノプロピルトリエトキシシラン希薄溶液に液浸させてからリンスし、この基板表面にシランカップリング処理を施した。次に、基板をHAuClとPdClとを混合した無電解めっき用触媒液に液浸してリンスし、この基板表面に触媒処理を施した。また、この無電解めっき用触媒液には、−log([H・[Cl)=8.05となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整されたものを用いた。次に、基板を硫酸ニッケル、ホスフィン酸ナトリウム、グリシンなどを含む市販のニッケルめっき浴に液浸させることによって、無電解ニッケルめっきを施した。以上のような工程を経て、基板にNiめっき被膜を形成した。
(実施例2)
実施例2では、−log([H・[Cl)=10.05となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整された無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(実施例3)
実施例3では、−log([H・[Cl)=11.05となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整された無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(実施例4)
実施例4では、−log([H・[Cl)=11.83となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整された無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(実施例5)
実施例5では、−log([H・[Cl)=12.68となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整された無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(比較例1)
比較例1では、−log([H・[Cl)=7.05となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整された無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(比較例2)
比較例2では、−log([H・[Cl)=13.83となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整された無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(比較例3)
比較例3では、−log([H・[Cl)=16.83となるようにpH値、Pd塩のモル濃度、Au塩のモル濃度、Clイオンのモル濃度がそれぞれ調整された無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
Hereinafter, the effects of the present invention will be clarified by examples. However, the following examples do not limit the technical scope of the present invention.
Example 1
In Example 1, first, a ceramic substrate mainly composed of alumina was prepared as an object to be plated, and this substrate was ultrasonically washed with acetone and then washed with sulfuric acid / hydrogen peroxide. Next, the substrate was immersed in a dilute solution of 3-aminopropyltriethoxysilane and rinsed, and the substrate surface was subjected to silane coupling treatment. Next, the substrate was immersed in an electroless plating catalyst solution in which HAuCl 4 and PdCl 2 were mixed and rinsed, and the substrate surface was subjected to a catalyst treatment. Further, the electroless plating catalyst solution has a pH value, a molar concentration of Pd salt, a molar concentration of Au salt such that −log ([H + ] 2. [Cl ] 4 ) = 8.05, What adjusted the molar concentration of Cl < - > ion was used, respectively. Next, electroless nickel plating was performed by immersing the substrate in a commercially available nickel plating bath containing nickel sulfate, sodium phosphinate, glycine and the like. The Ni plating film was formed in the board | substrate through the above processes.
(Example 2)
In Example 2, the pH value, the molar concentration of the Pd salt, the molar concentration of the Au salt, and the molar concentration of the Cl ion are set so that −log ([H + ] 2 · [Cl ] 4 ) = 10.05. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that each adjusted electroless plating catalyst solution was used.
(Example 3)
In Example 3, the pH value, the molar concentration of the Pd salt, the molar concentration of the Au salt, and the molar concentration of the Cl ion were set so that −log ([H + ] 2. [Cl ] 4 ) = 11.05. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that each adjusted electroless plating catalyst solution was used.
Example 4
In Example 4, the pH value, the molar concentration of the Pd salt, the molar concentration of the Au salt, and the molar concentration of the Cl ion were set so that −log ([H + ] 2 · [Cl ] 4 ) = 11.83. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that each adjusted electroless plating catalyst solution was used.
(Example 5)
In Example 5, the pH value, the molar concentration of the Pd salt, the molar concentration of the Au salt, and the molar concentration of the Cl ion were set so that −log ([H + ] 2 · [Cl ] 4 ) = 12.68. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that each adjusted electroless plating catalyst solution was used.
(Comparative Example 1)
In Comparative Example 1, the pH value, the molar concentration of the Pd salt, the molar concentration of the Au salt, and the molar concentration of the Cl ion were such that −log ([H + ] 2 · [Cl ] 4 ) = 7.05. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that each adjusted electroless plating catalyst solution was used.
(Comparative Example 2)
In Comparative Example 2, the pH value, the molar concentration of Pd salt, the molar concentration of Au salt, and the molar concentration of Cl ion were set so that −log ([H + ] 2. [Cl ] 4 ) = 13.83. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that each adjusted electroless plating catalyst solution was used.
(Comparative Example 3)
In Comparative Example 3, the pH value, the molar concentration of the Pd salt, the molar concentration of the Au salt, and the molar concentration of the Cl ion were such that −log ([H + ] 2 · [Cl ] 4 ) = 16.83. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that each adjusted electroless plating catalyst solution was used.

そして、これら実施例1乃至実施例5、比較例1乃至比較例3の各基板に対するNiめっき被膜の密着力について測定を行った。なお、この密着力の測定には、QUAD GROUP社製のセバスチャンIV型を用い、標準のスタッドピンを接触して測定を行った。以下、これらをまとめたものを表1に示す。また、この表1に示す各測定結果を水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積を縦軸とし、基板に対するNiめっき被膜の密着力を横軸としてまとめたグラフを図1に示す。 And it measured about the adhesive force of the Ni plating film with respect to each board | substrate of these Examples 1 thru | or Example 5 and Comparative Examples 1 thru | or Comparative Example 3. In addition, the measurement of this adhesion force was performed by using a Sebastian IV type manufactured by QUAD GROUP and contacting a standard stud pin. Table 1 below summarizes these. The results of measurement shown in Table 1 are summarized with the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] as the vertical axis and the adhesion of the Ni plating film to the substrate as the horizontal axis. The graph is shown in FIG.

Figure 0004658634
Figure 0004658634

表1及び図1のグラフに示すように、実施例1乃至実施例5では、比較例1及び比較例3に比べて、密着力が20MPa以上となっており、Niめっき被膜が基板に対して十分な密着力を得ていることがわかる。   As shown in Table 1 and the graph of FIG. 1, in Examples 1 to 5, compared with Comparative Example 1 and Comparative Example 3, the adhesion is 20 MPa or more, and the Ni plating film is against the substrate. It can be seen that sufficient adhesion is obtained.

次に、上述したHAuClとPdClとを混合した無電解めっき用触媒液の代わりに、PdClからなる無電解めっき用触媒液を用いた場合の基板に対するNiめっき被膜の密着力について調べた。すなわち、
(実施例6)
実施例6では、−log([H・[Cl)=10.68となるようにpH値、Pd塩のモル濃度、Clイオンのモル濃度がそれぞれ調整されたPdClからなる無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(比較例4)
比較例4では、−log([H・[Cl)=7.05となるようにpH値、Pd塩のモル濃度、Clイオンのモル濃度がそれぞれ調整されたPdClからなる無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
(比較例5)
比較例5では、−log([H・[Cl)=14.83となるようにpH値、Pd塩のモル濃度、Clイオンのモル濃度がそれぞれ調整されたPdClからなる無電解めっき用触媒液を用いた以外は、実施例1と同様にして基板に無電解ニッケルめっきを施した。
Next, instead of the electroless plating catalyst solution in which HAuCl 4 and PdCl 2 were mixed, the adhesion of the Ni plating film to the substrate was investigated when the electroless plating catalyst solution made of PdCl 2 was used. . That is,
(Example 6)
In Example 6, PdCl 2 in which the pH value, the molar concentration of the Pd salt, and the molar concentration of the Cl ion were adjusted so that −log ([H + ] 2. [Cl ] 4 ) = 10.68 was obtained. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that the electroless plating catalyst solution made of was used.
(Comparative Example 4)
In Comparative Example 4, PdCl 2 in which the pH value, the molar concentration of the Pd salt, and the molar concentration of the Cl ion were adjusted so that −log ([H + ] 2. [Cl ] 4 ) = 7.05 was obtained. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that the electroless plating catalyst solution made of was used.
(Comparative Example 5)
In Comparative Example 5, PdCl 2 in which the pH value, the molar concentration of the Pd salt, and the molar concentration of the Cl ion were adjusted so that −log ([H + ] 2. [Cl ] 4 ) = 14.83. The substrate was subjected to electroless nickel plating in the same manner as in Example 1 except that the electroless plating catalyst solution made of was used.

そして、これら実施例6、比較例4及び比較例5の各基板に対するNiめっき被膜の密着力について上記表1に示す場合と同様の測定を行った。これらをまとめたものを以下の表2に示す。また、この表2に示す各測定結果を上記図1のグラフにまとめて示すものとする。   And the same measurement as the case shown in the said Table 1 was performed about the adhesive force of the Ni plating film with respect to each board | substrate of these Example 6, the comparative example 4, and the comparative example 5. FIG. A summary of these is shown in Table 2 below. The measurement results shown in Table 2 are collectively shown in the graph of FIG.

Figure 0004658634
Figure 0004658634

表2及び図1に示すように、実施例5では、比較例4に比べて、密着力が20MPa以上となっており、Niめっき被膜が基板に対して十分な密着力を得ていることがわかる。また、比較例5では、基板にNiめっき被膜を析出させることができなかった。   As shown in Table 2 and FIG. 1, in Example 5, compared with Comparative Example 4, the adhesion force is 20 MPa or more, and the Ni plating film has obtained sufficient adhesion force to the substrate. Recognize. In Comparative Example 5, a Ni plating film could not be deposited on the substrate.

以上のことから、無電解めっき用触媒液中の水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積を10−13<[H・[Cl<10−8の範囲することによって、基板に密着性に優れた無電解ニッケルめっきを安定して形成できることが明らかとなった。 From the above, the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] in the electroless plating catalyst solution is 10 −13 <[H + ] 2 · [Cl ] 4. It became clear that the electroless nickel plating excellent in adhesiveness can be stably formed on a board | substrate by being in the range of <10 < -8 >.

図1は、本発明を適用した無電解めっき方法によって無電解ニッケルめっきが施された基板を示す断面図である。FIG. 1 is a cross-sectional view showing a substrate on which electroless nickel plating has been applied by an electroless plating method to which the present invention is applied. 図2は、水素イオンの濃度と塩化物イオンの濃度との積と、基板に対するNiめっき被膜の密着力との関係を示すグラフである。FIG. 2 is a graph showing the relationship between the product of the hydrogen ion concentration and the chloride ion concentration and the adhesion of the Ni plating film to the substrate.

符号の説明Explanation of symbols

1…基板(被めっき物)、2…Niめっき被膜   1 ... Substrate (to be plated), 2 ... Ni plating film

Claims (10)

少なくともパラジウム塩と、塩化物イオンとを含む水溶液からなり、且つ、この水溶液中の水素イオンの濃度[H]と塩化物イオンの濃度[Cl]との積が、
10−13<[H・[Cl<10−8
の範囲にあることを特徴とする無電解めっき用触媒液。
The product of an aqueous solution containing at least a palladium salt and chloride ions, and the product of the hydrogen ion concentration [H + ] and the chloride ion concentration [Cl ] in the aqueous solution,
10 −13 <[H + ] 2. [Cl ] 4 <10 −8
A catalyst solution for electroless plating characterized by being in the range.
前記水溶液中の水素イオンの濃度[HHydrogen ion concentration in the aqueous solution [H + ]と塩化物イオンの濃度[Cl] And chloride ion concentration [Cl ]との積が、] Product with
1010 −11.8-11.8 <[H<[H + ] 2 ・[Cl・ [Cl ] 4 <10<10 −8-8 の範囲にあることを特徴とする請求項1に記載の無電解めっき用触媒液。The catalyst solution for electroless plating according to claim 1, wherein the catalyst solution is in the range.
前記パラジウム塩は、塩化パラジウム(II)、塩化パラジウム(II)ナトリウム、塩化パラジウム(II)アンモニウムの中から選ばれる少なくとも1種又は複数種であることを特徴とする請求項1または2に記載の無電解めっき用触媒液。 3. The palladium salt according to claim 1 or 2 , wherein the palladium salt is at least one or more selected from palladium (II) chloride, sodium palladium (II) chloride, and ammonium palladium (II) chloride. Catalyst solution for electroless plating. 前記水溶液は、更に金塩を含むことを特徴とする請求項1〜3のいずれか一項に記載の無電解めっき用触媒液。 The catalyst solution for electroless plating according to any one of claims 1 to 3 , wherein the aqueous solution further contains a gold salt. 前記金塩は、テトラクロロ金(III)酸、テトラクロロ金(III)酸ナトリウム、テトラクロロ金(III)酸カリウム、テトラクロロ金(III)酸アンモニウムの中から選ばれる少なくとも1種又は複数種であることを特徴とする請求項に記載の無電解めっき用触媒液。 The gold salt is at least one or more selected from tetrachlorogold (III) acid, sodium tetrachlorogold (III), potassium tetrachlorogold (III), and ammonium tetrachlorogold (III). The catalyst solution for electroless plating according to claim 4 , wherein 前記塩化物イオンは、パラジウム塩、金塩、塩酸、塩化ナトリウム、塩化カリウムの中から選ばれる少なくとも1種又は複数種に由来するものであることを特徴とする請求項1又はに記載の無電解めっき用触媒液。 The said chloride ion originates in at least 1 sort (s) or multiple types chosen from palladium salt, gold salt, hydrochloric acid, sodium chloride, and potassium chloride, The thing of Claim 1 or 5 characterized by the above-mentioned. Electrolytic plating catalyst solution. 前記水溶液のpH調整に水酸化ナトリウム又は水酸化カリウムを用いることを特徴とする請求項1に記載の無電解めっき用触媒液。   The catalyst solution for electroless plating according to claim 1, wherein sodium hydroxide or potassium hydroxide is used for pH adjustment of the aqueous solution. 前記パラジウム塩は、塩化パラジウム(II)、塩化パラジウム(II)ナトリウム、塩化パラジウム(II)アンモニウムの中から選ばれる少なくとも1種又は複数種であり、前記塩化物イオンは、パラジウム塩、金塩、塩酸、塩化ナトリウム、塩化カリウムの中から選ばれる少なくとも1種又は複数種に由来するものであり、前記水溶液のpH調整に水酸化ナトリウム又は水酸化カリウムが用いられてなる請求項1、2、4のいずれか一項に記載の無電解めっき用触媒液。The palladium salt is at least one or more selected from palladium (II) chloride, sodium palladium (II) chloride, and ammonium palladium (II) chloride, and the chloride ion includes a palladium salt, a gold salt, It originates in at least 1 sort (s) chosen from hydrochloric acid, sodium chloride, and potassium chloride, and sodium hydroxide or potassium hydroxide is used for pH adjustment of the said aqueous solution. The catalyst solution for electroless plating according to any one of the above. 請求項1〜8の何れか1項に記載の無電解めっき用触媒液を用いて、被めっき物に触媒を付与した後に、前記被めっき物に無電解めっきを施すことを特徴とする無電解めっき方法。 An electroless plating process comprising: applying a catalyst to an object to be plated using the electroless plating catalyst solution according to any one of claims 1 to 8; Plating method. 前記被めっき物に無電解ニッケルめっきを施すことを特徴とする請求項に記載の無電解めっき方法。 Electroless plating can Way Method according to claim 9, characterized by applying electroless nickel plating on the object to be plated.
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