JP4635712B2 - Analysis equipment - Google Patents

Description

  The present invention relates to an analyzer for irradiating a sample subjected to separation, stirring, transfer, and reagent reaction with a flow path and chamber formed on an optical disk, and measuring the degree of reaction by transmitted light or reflected light. The present invention relates to a technique that favors the positional relationship between the lens position of an analyzer and the light intensity distribution of a semiconductor laser at a measurement position.

  A conventional analyzer will be described with reference to FIGS.

  In FIG. 5, an optical disk 1 has a spiral or concentric track, and a flow path and a chamber for performing sample separation, stirring, transfer, reagent reaction, and measurement. Moreover, as shown in FIG. 6, the trigger mark 3 for detecting each measurement position is printed on the outer edge portion. The trigger mark 3 is configured by a predetermined pattern including information on the circumferential position and order of the plurality of measurement chambers 2.

  The optical disk 1 is rotated by the rotation driving means 4. The sample inserted into the flow path of the optical disc 1 is subjected to separation, agitation, transfer, and reagent reaction processes under the control of acceleration / deceleration / stop / constant rotation / reverse rotation, etc. by the rotation driving means 4, and the measurement chamber 2 is inserted.

  The optical pickup unit 7 includes a semiconductor laser, an optical lens 5 and an actuator 6.

  The semiconductor laser is focused by the optical lens 5 and applied to the optical disc 1.

  The reflected light from the optical disk 1 is detected by a photodetector (not shown) mounted in the optical pickup unit 7. A detection signal from the photodetector is input to the servo error signal generation means 8. The servo error signal generation means 8 generates signals for following the focused light of the semiconductor laser to the reflection surface of the optical disc 1 and the track as a focus error signal and a tracking error signal, respectively.

  The focus error signal and the tracking error signal are signal-processed by the actuator control means 9 and controlled so that the focused light of the semiconductor laser follows the disk surface and track of the optical disk 1.

  Here, the actuator control means 9 includes signal processing means such as a PID servo filter and driving means for driving the actuator.

  The lens position detection means 10 generates a lens position detection signal from the low frequency component of the tracking error signal.

  The lens position detection signal is processed by the traverse filter 15 to generate an optical pickup unit control signal. The optical pickup unit 7 is driven by an optical pickup unit control signal. Here, for the traverse filter 15, for example, a notch filter that attenuates a component of the disc rotation period or a filter provided with a dead zone is used so that the optical pickup unit does not follow the eccentric component of the optical disc 1. Here, the light intensity distribution of the semiconductor laser is a Gaussian distribution, and the optical pickup unit 7 is controlled so that the optical lens 5 following the eccentricity operates centering on the light intensity distribution of the semiconductor laser.

  On the other hand, the trigger mark detection means 12 detects the position on the circumference of a predetermined measurement chamber, and acquires the measurement data of the light detection means 13 by the detection data acquisition means 14 at that timing.

As described above, the processed sample inserted into the predetermined measurement chamber is irradiated with the semiconductor laser, and the transmitted light or the reflected light is detected by the light detection means 13.
JP 2004-239790 A JP 2003-270128 A

  However, in the conventional configuration, when the focused light of the semiconductor laser follows the track of the optical disc 1, the focused light follows the eccentric component of the track of the optical disc 1. There is a problem that the amount of light is reduced and the measurement result is affected.

  Details of the problem will be described with reference to FIGS.

  FIG. 7 shows a schematic view of the optical disc 1 having eccentricity. The solid line indicates equidistant from the disk rotation center, and the measurement chamber 2 is on the solid line. Moreover, the broken line has shown the general track | orbit, and the eccentric component is included.

  FIG. 8 shows the positional correlation of the light intensity distribution (b) of the optical pickup unit 7, the optical lens 5, and the semiconductor laser in each measurement chamber.

  The focused light of the semiconductor laser follows the eccentric component of the optical disk 1 shown in FIG. On the other hand, the optical pickup unit 7 attenuates or eliminates the eccentric component by the traverse filter 15 so as not to follow the eccentric component of the optical disc 1.

  At this time, for example, if the measurement chamber at the position shown in FIG. 7A or FIG. 7O is to be measured, the positional relationship between the optical pickup unit 7 and the optical lens 5 is as shown in FIG. E ') as shown. Further, the operating range of the optical lens 5 when the optical disk 1 is traced for one round is the range of the arrow shown in FIG. At this time, the light intensity distribution (b) of the semiconductor laser is in line with the optical lens 5 and the light amount does not decrease, but the measurement chamber at the position of FIG. 7 (c) or FIG. Then, the positional relationship between the optical pickup unit 7 and the optical lens 5 is as shown in FIG. 8C or FIG. 8G. At this time, the light intensity distribution (b) of the semiconductor laser and the optical lens 5 are as follows. It will come off and the light intensity will decrease.

  Similarly, when an attempt is made to measure the measurement chamber at the position shown in FIG. 7A, FIG. 7D, FIG. 7F or FIG. 7C, the positional relationship between the optical pickup unit 7 and the optical lens 5 is as follows. As shown in FIG. 8 (A ′), FIG. 8 (D ′), FIG. 8 (F ′) or FIG. 8 (K ′), the state of FIG. 8 (C ′) and FIG. However, the amount of light is reduced due to lens shift.

  That is, when the transmitted light or reflected light of a plurality of measurement chambers of the optical disc 1 is to be measured, the optical lens 5 is deviated from the center of the light intensity distribution of the semiconductor laser due to the positional relationship between the measurement chamber 2 and the eccentric component of the optical disc 1. In other words, there is a case where the lens shift state occurs, and there is a problem that the light amount of the focused light of the semiconductor laser is reduced and the measurement values in the respective measurement chambers are different.

  The present invention solves the above-described conventional problems, and an object thereof is to provide an analyzer capable of performing accurate measurement in each measurement chamber of the optical disc 1.

In order to solve the above-described conventional problems, the present invention irradiates a laser beam toward the optical disc in an analyzer for analyzing a sample contained in the chamber by rotating an optical disc provided with a chamber therein. An irradiating means, an optical lens for focusing the laser light emitted by the irradiating means on the optical disc, and the optical disc focused by the optical lens based on the reflected light emitted from the laser light focused by the optical lens First detection means for detecting a deviation between an irradiation position of the laser beam on the disk and a track position on the disk, and the optical so that the laser beam is focused on the track based on the deviation. moving means for moving the lens, the second detection hand for detecting a deviation between the position of the position and the optical lens of the irradiation unit The provided mark indicating the detected position of the second detection means detects said optical lens is being attached to the optical disc, the intensity of the laser beam converged by the optical lens so obtained is moved by said moving means Correction means for correcting the amount of change.

Further, the present invention relates to an analyzer for analyzing a specimen contained in the chamber by rotating an optical disc provided with a chamber therein, and an irradiating unit that irradiates a laser beam toward the optical disc, and the irradiating unit includes: An optical lens for focusing the laser beam to be irradiated on the optical disc, and the laser beam focused by the optical lens on the basis of the reflected light emitted from the optical disc based on the laser beam focused by the optical lens. Moving means for moving the optical lens so that the laser beam is focused on the track based on a deviation between the irradiation position on the disk and the position of the track on the disk, the position of the irradiation means, and the position of the optical lens a second detecting means for detecting a deviation between the detected position of the second detection means detects said optical lens Marks indicating is being attached to said optical disc, said correction means the on position and the displacement amount of the laser beam optical lenses to focus on the basis of the position of the optical lens becomes the maximum position of the irradiation unit The irradiation means is moved.

  The present invention further includes first storage means for storing deviation information including the deviation detected by the second detection means, and the first storage means stores the correction means at positions other than the detection position indicated by the mark. The irradiation means is moved based on the deviation information.

  Further, according to the present invention, the correction means corrects the amount of change in the intensity of the laser beam converged by the optical lens moved by the moving means for each position of the optical lens on the optical disc. And a second correction unit that reads the correction information from the second storage unit and corrects the amount of change in the intensity of the laser beam converged by the optical lens moved by the moving unit. Means.

  Further, according to the present invention, the correction information is light quantity information of the reflected light before the specimen is accommodated in the chamber.

  Further, the present invention is based on the light amount information including the light amount of the laser light transmitted through any one of the chambers or reflected by any one of the chambers and the correction information stored in the second storage means. 2 correction means corrects the amount of change.

  Further, according to the present invention, the second detection means includes only a rotation period component of the optical disc among signals generated based on reflected light or transmitted light emitted from the optical disc based on the laser light. The position of the optical lens is detected based on the signal component.

  Further, according to the present invention, the second detection means detects the position of the optical lens by an optical sensor.

  Further, according to the present invention, the second detection means detects the position of the optical lens based on a signal component consisting only of a rotation period component of the optical disc among signals for controlling movement of the optical lens.

  According to the analysis apparatus of the present invention, even in an optical disc having a large track eccentricity, it is possible to prevent a reduction in the light amount of the focused light of the semiconductor laser in an arbitrary measurement chamber and improve the measurement accuracy.

  Further, according to the analysis apparatus of the present invention, it is possible to correct the amount of light detected in an arbitrary measurement chamber even on an optical disc having a large track eccentricity, thereby improving the measurement accuracy.

  Hereinafter, embodiments of the analyzer of the present invention will be described in detail with reference to the drawings.

  FIG. 1 shows a block diagram of an analyzer according to the first embodiment of the present invention.

  FIG. 2 shows an operation diagram of the control signal detecting means in the first embodiment of the present invention.

  FIG. 6 shows an external view of the optical disc 1.

  FIG. 7 shows a correlation diagram between the eccentric components of the measurement chamber and the optical disc.

  In FIG. 1, an optical disc 1 has a spiral or concentric track, and a flow path and a chamber for performing sample separation, stirring, transfer, reagent reaction, and measurement. Moreover, as shown in FIG. 6, the trigger mark 3 for detecting each measurement position is printed on the circumference. The trigger mark 3 is configured by a predetermined pattern including information on the circumferential position and order of the plurality of measurement chambers 2.

  The optical disk 1 is rotated by the rotation driving means 4. The sample inserted into the flow path of the optical disc 1 is subjected to separation, agitation, transfer, and reagent reaction processes under the control of acceleration / deceleration / stop / constant rotation / reverse rotation, etc. by the rotation driving means 4, and the measurement chamber 2 is inserted.

  The optical pickup unit 7 includes a semiconductor laser, an optical lens 5 and an actuator 6.

  The semiconductor laser is focused by the optical lens 5 and applied to the optical disc 1.

  The reflected light from the optical disk 1 is detected by a photodetector (not shown) mounted in the optical pickup unit 7. A detection signal from the photodetector is input to the servo error signal generation means 8. The servo error signal generation means 8 generates signals for following the focused light of the semiconductor laser to the reflection surface of the optical disc 1 and the track as a focus error signal and a tracking error signal, respectively.

  The focus error signal and the tracking error signal are signal-processed by the actuator control means 9 and controlled so that the focused light of the semiconductor laser follows the disk surface and track of the optical disk 1.

  Here, the actuator control means 9 includes signal processing means such as a PID servo filter and driving means for driving the actuator.

  The lens position detection means 10 generates a lens position detection signal from the low frequency component of the tracking error signal.

  The trigger mark detection means 12 outputs a measurement chamber detection signal (service) in a predetermined measurement chamber from the trigger mark detection signal (detection) detected from the trigger mark 3 of the optical disc 1. The control signal detection means 16 stores the value of the lens position detection signal (si) at the same timing as the measurement chamber detection signal (sa), and stores the stored value in the portion where the measurement chamber detection signal (sa) is not output. Output as an optical pickup unit control signal. The optical pickup unit control means 11 controls the optical pickup unit 7 based on the optical pickup unit control signal (s). That is, the optical pickup unit 7 is controlled so that the light intensity distribution of the semiconductor laser and the optical lens 5 are aligned in a predetermined measurement chamber.

  For example, when the measurement chamber is at the position shown in FIG. 7A, the positional relationship between the optical lens 5 of the optical pickup unit 7 and the light intensity distribution (b) of the semiconductor laser is as shown in FIG. 8A. Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  For example, when the measurement chamber is at the position shown in FIG. 7A, the positional relationship between the optical lens 5 of the optical pickup unit 7 and the light intensity distribution (b) of the semiconductor laser is as shown in FIG. Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  For example, when the measurement chamber is at the position shown in FIG. 7C, the positional relationship between the optical lens 5 of the optical pickup unit 7 and the light intensity distribution (b) of the semiconductor laser is as shown in FIG. 8C. Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  For example, when the measurement chamber is at the position shown in FIG. 7D, the positional relationship between the optical lens 5 of the optical pickup unit 7 and the light intensity distribution (b) of the semiconductor laser is as shown in FIG. 8D. Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  For example, when the measurement chamber is at the position shown in FIG. 7 (e), the positional relationship between the optical lens 5 and the optical intensity distribution (b) of the semiconductor laser is as shown in FIG. 8 (e). Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  For example, when the measurement chamber is at the position shown in FIG. 7 (f), the positional relationship between the optical lens 5 and the light intensity distribution (b) of the semiconductor laser is as shown in FIG. 8 (f). Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  For example, when the measurement chamber is at the position shown in FIG. 7 (ki), the positional relationship between the optical lens 5 and the optical intensity distribution (b) of the semiconductor laser is as shown in FIG. 8 (ki ''). Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  For example, when the measurement chamber is at the position shown in FIG. 7C, the positional relationship between the optical lens 5 of the optical pickup unit 7 and the light intensity distribution (b) of the semiconductor laser is as shown in FIG. Thus, the light intensity distributions of the optical lens 5 and the semiconductor laser are in a straight line.

  On the other hand, the trigger mark detection means 12 detects the position on the circumference of a predetermined measurement chamber, and acquires the measurement data of the light detection means 13 by the detection data acquisition means 14 at that timing.

  As described above, the processed laser beam inserted into the predetermined measurement chamber is irradiated with the semiconductor laser, and the transmitted light or reflected light is detected.

  As described above, in the first embodiment, the optical pickup unit 7 is controlled by using the lens position detection signal at the position of the predetermined measurement chamber as the optical pickup unit control signal, so that the light intensity of the semiconductor laser in the predetermined measurement chamber is obtained. Control is performed so that the optical lens 5 is positioned at the center position of the distribution, so that accurate measurement can be performed without any decrease in the amount of light of the semiconductor laser due to eccentricity in any measurement chamber of the optical disc 1.

  In the first embodiment, an optical sensor can be used as the lens position detecting unit.

  In the first embodiment, the lens position detection unit can be configured to detect from a low frequency component of the actuator drive signal. Here, the low frequency component of the actuator drive signal means a signal component obtained by extracting only the rotation period component of the optical disc from the actuator drive signal.

  FIG. 3 shows a block diagram of an analyzer according to the second embodiment of the present invention.

  FIG. 6 shows an external view of the optical disc 1.

  FIG. 4 shows the amount of light detected in each measurement chamber.

  FIG. 7 shows a correlation diagram between the eccentric components of the measurement chamber and the optical disc.

  In FIG. 3, an optical disk 1 has a spiral or concentric track, and a flow path and a chamber for performing sample separation, stirring, transfer, reagent reaction, and measurement. Moreover, as shown in FIG. 6, the trigger mark 3 for detecting each measurement position is printed on the circumference. The trigger mark 3 is configured by a predetermined pattern including information on the circumferential position and order of the plurality of measurement chambers 2.

  The optical disk 1 is rotated by the rotation driving means 4.

  The optical pickup unit 7 includes a semiconductor laser, an optical lens 5 and an actuator 6.

  The semiconductor laser is focused by the optical lens 5 and applied to the optical disc 1.

  The reflected light from the optical disk 1 is detected by a photodetector (not shown) mounted in the optical pickup unit 7. A detection signal from the photodetector is input to the servo error signal generation means 8. The servo error signal generation means 8 generates signals for following the focused light of the semiconductor laser to the reflection surface of the optical disc 1 and the track as a focus error signal and a tracking error signal, respectively.

  The focus error signal and the tracking error signal are signal-processed by the actuator control means 9 and controlled so that the focused light of the semiconductor laser follows the disk surface and track of the optical disk 1.

  Here, the actuator control means 9 includes signal processing means such as a PID servo filter and driving means for driving the actuator.

  The lens position detection means 10 generates a lens position detection signal from the low frequency component of the tracking error signal. Here, the low frequency component of the tracking error signal refers to a signal component obtained by extracting only the rotation period component of the optical disc from the tracking error signal.

  The light detection light quantity correction means 17 correlates the lens position of the optical lens 5 by the lens position detection means 10 and the light detection light quantity by the light detection means 13 in each measurement chamber in which no sample is inserted. For example, a correction coefficient for each measurement chamber is determined in advance so that the amount of light detected in each measurement chamber is the same depending on the lens position.

  Specifically, the light shown in FIG. 4 corresponding to the measurement chambers (a), (b), (c), (d), (e), (f), (g) and (g) shown in FIG. The detected light intensity is set to (A '' '), (I' ''), (U '' '), (E' ''), (O '' '), (F' ''), (K '' Assuming that the coefficient for the amount of light detected in the measurement chamber (A) is 1 and the measurement chamber (A), (C), (D), ( The photodetection coefficients for (e), (f), (ki) and (ku) are (A '' ') / (I' ''), (A '' ') / (U' ''), (A '' ') / (D' ''), (A '' ') / (O' ''), (A '' ') / (K' ''), (A '' ') / ( K '' '') and (A '' ') / (K' '').

  The sample inserted into the flow path of the optical disc 1 is subjected to separation, agitation, transfer, and reagent reaction processes under the control of acceleration / deceleration / stop / constant rotation / reverse rotation, etc. by the rotation driving means 4, and the measurement chamber 2 is inserted.

  The light detection light amount correction unit 17 multiplies the output of the light detection unit 13 in the measurement chamber in which the sample is inserted by a correction coefficient based on the correlation with the lens position by the lens position detection unit 10 described above.

  The trigger mark detection means 12 detects a position on the circumference of a predetermined measurement chamber, and the detection data acquisition means 14 acquires the output data of the light detection light quantity correction means 17 at that timing.

  As described above, the processed laser beam inserted into the predetermined measurement chamber is irradiated with the semiconductor laser, and the transmitted light or reflected light is detected.

  As described above, in the second embodiment, accurate measurement can be performed by correcting the output of the light detection unit 13 with the coefficient obtained in advance by the light detection light amount correction unit 17.

  In the second embodiment, an optical sensor can be used as the lens position detecting unit.

  In the second embodiment, the lens position detecting means can be configured to detect from the low frequency component of the actuator drive signal.

  The analyzer according to the present invention can prevent a reduction in the light amount of the focused light of the semiconductor laser in any measurement chamber on an optical disc having a large track eccentricity, and is useful for measuring a biochemical substance using optical characteristics.

  In addition, the analyzer according to the present invention can correct the focused light of the semiconductor laser in any measurement chamber on an optical disk having a large track eccentricity, and is useful for measurement of biochemical substances using optical characteristics.

The block diagram of the analyzer in Example 1 of this invention Operational diagram in the control signal detecting means of the present invention The block diagram of the analyzer in Example 2 of this invention The figure which shows the light detection light quantity in each measurement chamber Block diagram of a conventional analyzer External view of optical disc Correlation diagram of eccentricity components of measurement chamber and optical disc Position correlation diagram of light intensity distribution of optical pickup unit, optical lens and semiconductor laser in each measurement chamber

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Optical disk 2 Measurement chamber 3 Trigger mark 4 Rotation drive means 5 Optical lens 6 Actuator 7 Optical pick-up unit 8 Servo error signal generation means 9 Actuator control means 10 Lens position detection means 11 Optical pick-up unit control means 12 Trigger mark detection means 13 Light detection Means 14 Detection data acquisition means 15 Traverse filter 16 Control signal detection means 17 Light detection light quantity correction means

Claims (9)

In an analyzer for analyzing a sample contained in the chamber by rotating an optical disc provided with a chamber therein, an irradiating unit that irradiates a laser beam toward the optical disc, and a laser beam emitted by the irradiating unit An optical lens for focusing on the optical disk, an irradiation position on the disk of the laser light focused by the optical lens based on reflected light emitted from the optical disk based on the laser light focused by the optical lens, and the disk First detection means for detecting a deviation from the position of the track on the upper side, a moving means for moving the optical lens so that the laser beam is focused on the track based on the deviation, and a position of the irradiation means. Second detection means for detecting deviation from the position of the optical lens is provided, and the second detection means is the optical lens. Mark indicating the detection position to be detected is being attached to the optical disc, comprising a correcting means for correcting the variation of the intensity of the converged the laser light by the optical lens has been moved by said moving means Analysis apparatus. Second memory for storing correction information for correcting a change amount of the intensity of the laser beam converged by the optical lens moved by the moving means for each position of the optical lens on the optical disc. And second correction means for reading the correction information from the second storage means and correcting the amount of change in the intensity of the laser beam converged by the optical lens moved by the moving means. The analyzer according to claim 1. The analyzer according to claim 1 , wherein the correction information is light amount information of the reflected light before the specimen is accommodated in the chamber. The second correction means changes the change based on the light quantity information consisting of the light quantity of the laser light transmitted through any chamber or the laser light reflected by any chamber and the correction information stored in the second storage means. The analyzer according to claim 1 , wherein the amount is corrected. In an analyzer for analyzing a sample contained in the chamber by rotating an optical disc provided with a chamber therein, an irradiating unit that irradiates a laser beam toward the optical disc, and a laser beam emitted by the irradiating unit An optical lens for focusing on the optical disk, an irradiation position on the disk of the laser light focused by the optical lens based on reflected light emitted from the optical disk based on the laser light focused by the optical lens, and the disk Based on a deviation from the position of the track on the upper side, a moving means for moving the optical lens so that the laser beam is focused on the track, and a deviation between the position of the irradiation means and the position of the optical lens are detected. a second detection means, mark indicating the detection position of the second detection means detects the optical lens before Will be subjected to an optical disk, moving the correcting means said illumination means to a position where the light amount becomes the maximum of the laser beam optical lenses to focus on the basis of a deviation between the position of said optical lens of the irradiation unit Analyzing device. First storage means for storing deviation information consisting of the deviation detected by the second detection means is provided, and the correction means is based on the deviation information stored by the first storage means except for the detection position indicated by the mark. The analyzer according to claim 5 , wherein the irradiation means is moved. The second detection means is based on a signal component consisting only of a rotation period component of the optical disc among signals generated based on reflected light or transmitted light emitted from the optical disc based on the laser light. 6. The analyzer according to claim 1 or 5 , wherein a position of the optical lens is detected. The analyzer according to claim 1 or 5 , wherein the second detection means detects the position of the optical lens with an optical sensor. Said second detection means, among the signals for controlling the movement of the optical lens, made by detecting the position of the optical lens based on a signal component consisting only rotation period component of the optical disc, according to claim 1 or claim 5. The analyzer according to 5 .

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