JP4502430B2 - Solder wettability improving treatment agent and method for improving solder wettability of tin and tin alloy - Google Patents
Solder wettability improving treatment agent and method for improving solder wettability of tin and tin alloy Download PDFInfo
- Publication number
- JP4502430B2 JP4502430B2 JP28661799A JP28661799A JP4502430B2 JP 4502430 B2 JP4502430 B2 JP 4502430B2 JP 28661799 A JP28661799 A JP 28661799A JP 28661799 A JP28661799 A JP 28661799A JP 4502430 B2 JP4502430 B2 JP 4502430B2
- Authority
- JP
- Japan
- Prior art keywords
- tin
- solder wettability
- plating
- treatment agent
- improving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Description
【0001】
【発明が属する技術分野】
本発明は、はんだ濡れ性向上処理剤、及び錫及び錫合金のはんだ濡れ性の向上方法に関し、特に、半田付けにより他の部品や基板、信号線等に接続される電子部品の接続部に、予めめっき処理された錫及び錫合金めっき表面を処理するために用いられる。
【0002】
【従来の技術】
従来より半田付け性を重視した電子部品のはんだ付け部には、鉛を含有するめっき、いわゆる、はんだめっきが主に施されている。しかしながら、鉛を含有するはんだめっきは、めっき中に含まれる鉛による環境汚染の問題があり、鉛を実質的に含まない鉛フリーのめっきへ移行しているのが現状である。鉛フリーのめっきとしては、錫単独めっきや錫主体の錫合金めっき、即ち、錫−銅、錫−銀、錫−ビスマス、錫−亜鉛、錫−インジウム等の合金めっきがあげられるが、これらのめっきは鉛を含有するはんだめっきの場合に較べて、はんだ濡れ性、特に経時によるはんだ濡れ性が劣化するという問題があった。
【0003】
【発明が解決しようとする課題】
本発明は、はんだ用の鉛を含まない被膜のはんだ濡れ性向上処理剤を提供することを目的とする。本発明は、又、この濡れ性向上処理剤を用いて鉛を含まないはんだ用の被膜を処理する方法を提供することを目的とする。
【0004】
【課題を解決するための手段】
本発明は、ジテルペン酸またはその誘導体と脂肪族炭化水素を含む処理剤を、鉛を含まないはんだ用皮膜上にオーバーコート処理すると、めっき直後および経時のはんだ濡れ性を向上させることができるとの知見に基づいてなされたものである。
すなわち、本発明は、ジテルペン酸またはその誘導体と脂肪族炭化水素を含有することを特徴とするはんだ濡れ性向上処理剤を提供する。
本発明は、又、錫又は錫合金めっき表面層に、上記はんだ濡れ性向上処理剤を施すことを特徴とする該めっき表面のはんだ濡れ性の向上方法を提供する。
【0005】
本発明のはんだ濡れ性向上処理剤に用いるジテルペン酸としては、ルベニン酸、アガテンジカルボン酸、ピマル酸、アビエチン酸、ネオアビエチン酸、レボピマル酸、イソ−d−ピマル酸、ポドカルピン酸、アガリシン酸などの1種又は2種以上の混合物をあげることができる。また、天然ロジンもこのジテルペン酸の混合物であり、この中に含まれる。このうち、ピマル酸とアビエチン酸が好ましい。またジテルペン酸の誘導体化合物としては、メタノール、エタノール、プロパノール、ブタノール、ジエチレングリコール等の炭素数1〜18、好ましくは、炭素数1〜6のアルコールと、ジテルペン酸とのエステル化反応物を挙げることができる。具体的には、アビエチン酸メチル、アビエチン酸ジエチレングリコール、2−ヒドロアビエチン酸ジエチレングリコール等をあげることができる。
本発明のはんだ濡れ性向上処理剤は、これらジテルペン酸またはその誘導体を、任意の量で含むことができるが、これらを、0.01g/L〜0.5g/L含有するのが好まし、より好ましくは、0.1g/L〜0.4g/Lである。
【0006】
本発明のはんだ濡れ性向上処理剤に用いる脂肪族炭水化物としては、パラフィン系炭化水素を主成分とした常温で液状の油を挙げることができ、好ましくは、パラフィンワックスやマシン油である。本発明のはんだ濡れ性向上処理剤は、これらの脂肪族炭水化物を任意の量で含むことができるが、これらを、0.01g/L〜2g/L含有するのが好ましく、より好ましくは、0.1g/L〜0.5g/Lである。
本発明のはんだ濡れ性向上処理剤は、常温で液状であるのが好ましく、特に、上記成分を揮発性溶媒に溶解してなるのが好ましい。溶媒として、メタノール、エタノール、プロパノール、イソプロパノール等のアルコール類が好ましい。
本発明のはんだ濡れ性向上処理剤には、上記成分を均一に分散させるために、ノニオン、カチオン、アニオン、両性界面活性剤を含有させるのが好ましい。これらのノニオン、アニオン、カチオン、両性界面活性剤の濃度は、0.01g/L〜5g/Lであるのが好ましく、より好ましくは、0.1g/L〜2g/Lである。また必要に応じ、ベンゾトリアゾール、ベンゾイミダゾール等の一般的な腐食抑制剤を添加することもできる。
【0007】
本発明のはんだ濡れ性向上処理剤は、例えば、リン青銅や42アロイなどの金属基材上、又はめっき処理により形成した下地めっき層(例えば、ニッケルめっきや銅めっきなど)の上に、めっき処理により錫及び錫合金めっきを形成し、その表面に施す。ここで、錫及び錫合金めっき方法は、例えば、特開昭06−340994号公報などに記載の方法により行うことができる。又、錫合金めっきが、錫を主体として、銅、銀、ビスマス、亜鉛、インジウムのいずれかを含有する合金のめっきであるのが好ましい。めっきの厚みは、任意とすることができるが、0.5〜20μであるのが好ましい。
尚、はんだ濡れ性の向上は、JIS−C0053−1990に記載のメニスコグラフ法により容易に測定できる。
次に、実施例により本発明を具体的に説明するが、本発明は下記の実施例に限定されるものではない。
【0008】
【実施例】
実施例1
ジテルペン酸誘導体として天然ロジン0.2g/L、マシン油としてJISK2238に規定されているISO VG 2 マシン油0.2g/L、分散剤としてノニオン界面活性剤ポリオキシエチレンノニルフェニルエーテル0.5g/Lをイソプロピルアルコールに溶解させて、本発明のはんだ濡れ性向上処理剤を調製した。
一方、3216サイズのチップ抵抗器外部銀電極部にめっき処理により下地ニッケルめっき2μm、その上に5μmの錫単独めっき皮膜を形成させた。この錫単独めっき皮膜を有する部分を、上記はんだ濡れ性向上処理剤に浸漬し、乾燥した。
【0009】
実施例2
ジテルペン酸誘導体としてアビエチン酸メチル0.2g/L、炭素数25のパラフィンワックス0.2g/L、分散剤としてノニオン界面活性剤ジペンチルスルホコハク酸エステル塩0.5g/をイソプロピルアルコールに溶解させて、本発明のはんだ濡れ性向上処理剤を調製した。
一方、1608サイズのチップ抵抗器外部銀電極部にめっき処理により下地ニッケルめっき2μm、その上に5μmの錫−ビスマス合金めっき皮膜を形成させた。この錫合金めっき皮膜を有する部分を、上記はんだ濡れ性向上処理剤に浸漬し、乾燥した。
【0010】
比較例1
3216サイズのチップ抵抗器外部銀電極部にめっき処理により下地ニッケルめっき2μm、その上に5μmの錫単独めっき皮膜を形成させた。 この皮膜の後処理は水洗のみにとどめた。
【0011】
比較例2
1608サイズのチップ抵抗器外部銀電極部にめっき処理により下地ニッケルめっき2μm、その上に5μmの錫−ビスマス合金めっき皮膜を形成させた。 この皮膜の後処理は水洗のみにとどめた。
【0012】
上記の実施例1及び2のチップ抵抗器と、比較例1及び2のチップ抵抗器をそれぞれ、メニスコグラフ法にてはんだ濡れ性試験を行ったところ、めっき直後で比較例1のチップ抵抗器は濡れ時間が0.9秒、比較例2では0.5秒であった。なお、この濡れ時間は時間が短いほど、濡れ性がよいことを示す。
一方、100℃−100%−16Hrの条件で、蒸気エージングした後の比較例1の濡れ時間が5秒、比較例2では1.8秒であった。
【0013】
これに対して、実施例1のチップ抵抗器のめっき直後の濡れ時間は0.7秒、実施例2のチップ抵抗器は0.3秒であった。又、100℃−100%−16Hrの条件で、蒸気エージングした後の実施例1のチップ抵抗器の濡れ時間は2.3秒、実施例2のチップ抵抗器の濡れ時間は1.5秒であった。
以上の結果から、本発明によれば、鉛を含まない錫又は錫合金めっき表面のはんだ濡れ性を向上させることができることがわかる。
【0014】
【発明の効果】
本発明によれば、金属基材上またはめっき処理により形成した下地めっき層の上にめっき処理により形成した鉛を含まない錫を主成分とする表面層のはんだ濡れ性を著しく向上させることができる。[0001]
[Technical field to which the invention belongs]
The present invention relates to a solder wettability improving treatment agent and a method for improving solder wettability of tin and tin alloy, in particular, in a connection part of an electronic component connected to another component, a substrate, a signal line, etc. by soldering, Used to treat pre-plated tin and tin alloy plated surfaces.
[0002]
[Prior art]
Conventionally, plating containing lead, that is, so-called solder plating, is mainly applied to a soldering portion of an electronic component that places importance on solderability. However, solder plating containing lead has a problem of environmental pollution due to lead contained in the plating, and the current situation is that it is shifted to lead-free plating that does not substantially contain lead. Examples of lead-free plating include tin single plating and tin-based tin alloy plating, that is, alloy plating of tin-copper, tin-silver, tin-bismuth, tin-zinc, tin-indium, and the like. Plating has a problem that solder wettability, particularly solder wettability with time, deteriorates as compared with the case of solder plating containing lead.
[0003]
[Problems to be solved by the invention]
An object of this invention is to provide the solder wettability improvement processing agent of the film which does not contain lead for solder. Another object of the present invention is to provide a method of treating a solder film that does not contain lead using the wettability improving agent.
[0004]
[Means for Solving the Problems]
According to the present invention, when a treatment agent containing diterpenic acid or a derivative thereof and an aliphatic hydrocarbon is overcoated on a solder film that does not contain lead, solder wettability immediately after plating and over time can be improved. It was made based on knowledge.
That is, this invention provides the solder wettability improvement processing agent characterized by containing diterpenic acid or its derivative (s), and an aliphatic hydrocarbon.
The present invention also provides a method for improving the solder wettability of the plating surface, wherein the solder wettability improving treatment agent is applied to a tin or tin alloy plating surface layer.
[0005]
Examples of the diterpenic acid used in the solder wettability improving treatment agent of the present invention include rubenic acid, agatendicarboxylic acid, pimaric acid, abietic acid, neoabietic acid, levopimaric acid, iso-d-pimalic acid, podocarpic acid, agaricic acid, etc. The 1 type (s) or 2 or more types of mixture can be mention | raise | lifted. Natural rosin is also a mixture of this diterpenic acid and is contained therein. Of these, pimaric acid and abietic acid are preferred. Examples of the derivative compound of diterpenic acid include an esterification reaction product of diterpenic acid with an alcohol having 1 to 18 carbon atoms, preferably 1 to 6 carbon atoms such as methanol, ethanol, propanol, butanol and diethylene glycol. it can. Specific examples include methyl abietic acid, diethylene glycol abietic acid, diethylene glycol 2-hydroabietic acid, and the like.
The solder wettability improving treatment agent of the present invention can contain these diterpenic acids or derivatives thereof in any amount, but preferably contains 0.01 g / L to 0.5 g / L of these, More preferably, it is 0.1 g / L to 0.4 g / L.
[0006]
Examples of the aliphatic carbohydrate used in the solder wettability improving treatment agent of the present invention include oils that are liquid at room temperature mainly composed of paraffinic hydrocarbons, and are preferably paraffin wax and machine oil. The solder wettability improving treatment agent of the present invention can contain these aliphatic carbohydrates in any amount, but preferably contains 0.01 g / L to 2 g / L, more preferably 0. .1 g / L to 0.5 g / L.
The solder wettability improving agent of the present invention is preferably in a liquid state at room temperature, and particularly preferably formed by dissolving the above components in a volatile solvent. As the solvent, alcohols such as methanol, ethanol, propanol and isopropanol are preferable.
In order to uniformly disperse the above components, the solder wettability improving treatment agent of the present invention preferably contains a nonion, a cation, an anion and an amphoteric surfactant. The concentration of these nonions, anions, cations and amphoteric surfactants is preferably 0.01 g / L to 5 g / L, more preferably 0.1 g / L to 2 g / L. Moreover, general corrosion inhibitors, such as benzotriazole and benzimidazole, can also be added as needed.
[0007]
The solder wettability improving treatment agent of the present invention is, for example, plated on a metal substrate such as phosphor bronze or 42 alloy, or on a base plating layer (for example, nickel plating or copper plating) formed by plating. Then, tin and tin alloy plating are formed and applied to the surface. Here, the tin and tin alloy plating method can be performed, for example, by the method described in JP-A No. 06-340994. The tin alloy plating is preferably plating of an alloy mainly containing tin and containing any of copper, silver, bismuth, zinc, and indium. Although the thickness of plating can be made arbitrary, it is preferably 0.5 to 20 μm.
In addition, the improvement of solder wettability can be easily measured by the meniscograph method described in JIS-C0053-1990.
EXAMPLES Next, although an Example demonstrates this invention concretely, this invention is not limited to the following Example.
[0008]
【Example】
Example 1
Natural rosin 0.2 g / L as diterpenic acid derivative, ISO VG 2 machine oil 0.2 g / L specified in JISK2238 as machine oil, nonionic surfactant polyoxyethylene nonylphenyl ether 0.5 g / L as dispersant Was dissolved in isopropyl alcohol to prepare the solder wettability improving treatment agent of the present invention.
On the other hand, a 3216-size chip resistor external silver electrode portion was plated with a base nickel plating of 2 μm, and a 5 μm tin single plating film was formed thereon. The portion having the tin plating film was immersed in the solder wettability improving agent and dried.
[0009]
Example 2
A diterpenic acid derivative, 0.2 g / L methyl abietic acid, a paraffin wax with 25 carbon atoms, 0.2 g / L, a nonionic surfactant dipentyl sulfosuccinate ester salt, 0.5 g / as a dispersant, are dissolved in isopropyl alcohol, The solder wettability improving treatment agent of the invention was prepared.
On the other hand, an external silver electrode portion of 1608 size chip resistor was plated to form a base nickel plating of 2 μm, and a 5 μm tin-bismuth alloy plating film was formed thereon. The portion having the tin alloy plating film was immersed in the solder wettability improving agent and dried.
[0010]
Comparative Example 1
A 3216-size chip resistor external silver electrode portion was plated with a base nickel plating of 2 μm, and a 5 μm tin single plating film was formed thereon. The post-treatment of this film was limited to washing with water only.
[0011]
Comparative Example 2
An external silver electrode portion of 1608 size chip resistor was plated to form a base nickel plating of 2 μm, and a 5 μm tin-bismuth alloy plating film was formed thereon. The post-treatment of this film was limited to washing with water only.
[0012]
When the chip resistors of Examples 1 and 2 and the chip resistors of Comparative Examples 1 and 2 were each subjected to a solder wettability test by the meniscograph method, the chip resistor of Comparative Example 1 was wet immediately after plating. The time was 0.9 seconds, and in Comparative Example 2, it was 0.5 seconds. In addition, this wet time shows that wettability is so good that time is short.
On the other hand, the wetting time of Comparative Example 1 after steam aging was 5 seconds under the condition of 100 ° C.-100% -16 Hr, and 1.8 seconds in Comparative Example 2.
[0013]
On the other hand, the wetting time immediately after plating of the chip resistor of Example 1 was 0.7 seconds, and the chip resistor of Example 2 was 0.3 seconds. Further, the wetting time of the chip resistor of Example 1 after steam aging under conditions of 100 ° C.-100% -16 Hr is 2.3 seconds, and the wetting time of the chip resistor of Example 2 is 1.5 seconds. there were.
From the above results, it can be seen that according to the present invention, the solder wettability of the lead-free tin or tin alloy plating surface can be improved.
[0014]
【The invention's effect】
ADVANTAGE OF THE INVENTION According to this invention, the solder wettability of the surface layer which has as a main component the tin which does not contain lead formed by the plating process on the metal base material or the base plating layer formed by the plating process can be improved significantly. .
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28661799A JP4502430B2 (en) | 1999-10-07 | 1999-10-07 | Solder wettability improving treatment agent and method for improving solder wettability of tin and tin alloy |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28661799A JP4502430B2 (en) | 1999-10-07 | 1999-10-07 | Solder wettability improving treatment agent and method for improving solder wettability of tin and tin alloy |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2001105178A JP2001105178A (en) | 2001-04-17 |
JP4502430B2 true JP4502430B2 (en) | 2010-07-14 |
Family
ID=17706737
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28661799A Expired - Fee Related JP4502430B2 (en) | 1999-10-07 | 1999-10-07 | Solder wettability improving treatment agent and method for improving solder wettability of tin and tin alloy |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4502430B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3395772B2 (en) | 2000-11-20 | 2003-04-14 | 松下電器産業株式会社 | Method for producing tin-silver alloy plating film, tin-silver alloy plating film, and lead frame for electronic component provided with the same |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0377792A (en) * | 1989-08-16 | 1991-04-03 | Yuho Chem Kk | Additive for flux and solder paste |
JPH07132395A (en) * | 1993-11-15 | 1995-05-23 | Showa Denko Kk | Cream solder |
JPH08155675A (en) * | 1994-11-29 | 1996-06-18 | Sony Corp | Flux for forming solder bump |
JPH11179586A (en) * | 1997-12-16 | 1999-07-06 | Hitachi Ltd | Lead-free soldered structure, and electronic unit |
JPH11267884A (en) * | 1998-03-23 | 1999-10-05 | Mitsubishi Electric Corp | Flux and cream solder for solar battery module |
-
1999
- 1999-10-07 JP JP28661799A patent/JP4502430B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0377792A (en) * | 1989-08-16 | 1991-04-03 | Yuho Chem Kk | Additive for flux and solder paste |
JPH07132395A (en) * | 1993-11-15 | 1995-05-23 | Showa Denko Kk | Cream solder |
JPH08155675A (en) * | 1994-11-29 | 1996-06-18 | Sony Corp | Flux for forming solder bump |
JPH11179586A (en) * | 1997-12-16 | 1999-07-06 | Hitachi Ltd | Lead-free soldered structure, and electronic unit |
JPH11267884A (en) * | 1998-03-23 | 1999-10-05 | Mitsubishi Electric Corp | Flux and cream solder for solar battery module |
Also Published As
Publication number | Publication date |
---|---|
JP2001105178A (en) | 2001-04-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4168996A (en) | Soldering flux | |
KR102257405B1 (en) | Detergent composition for resin mask layer and manufacturing method of circuit board | |
EP0183705B1 (en) | Soldering flux | |
KR100805014B1 (en) | Cleaning agent for removing solder flux and method for cleaning solder flux | |
US20040074952A1 (en) | Method of controlling solder deposition utilizing two fluxes and preform | |
EP0710522B1 (en) | Flux formulation | |
US5064481A (en) | Use or organic acids in low residue solder pastes | |
JP4249164B2 (en) | Solder paste composition | |
US4194931A (en) | Soldering flux | |
US3305406A (en) | Method of fluxing an article to be soldered with noncorrosive fluxing compositions | |
US3730782A (en) | Non-activated soldering flux | |
US20070051774A1 (en) | Method of controlling solder deposition on heat spreader used for semiconductor package | |
JP2004176179A (en) | Water soluble treatment agent for improving solder wettability of electronic component terminal, and treatment method therefor | |
JP4502430B2 (en) | Solder wettability improving treatment agent and method for improving solder wettability of tin and tin alloy | |
US5092943A (en) | Method of cleaning printed circuit boards using water | |
JP2736304B2 (en) | Soldering method and solder flux | |
US6474536B1 (en) | Flux composition and corresponding soldering method | |
KR20120095482A (en) | Surface treatment agent for pd or alloy mainly composed of pd, and surface coating layer structure of copper surface | |
WO1999055935A1 (en) | Method for coating surfaces of copper or of a copper alloy with a tin or tin alloy layer | |
CN110842395A (en) | Halogen-free ball grid array flip chip soldering paste and manufacturing process thereof | |
CN114571138A (en) | Environment-friendly soldering flux and preparation method and application thereof | |
EP1952935B1 (en) | Solder paste composition and solder precoating method | |
JPH05185282A (en) | Flux composition for soldering | |
CN108754466B (en) | Anti-rat-bite tin deposition liquid for copper-based surface, chemical tin deposition method of anti-rat-bite tin deposition liquid and anti-rat-bite copper substrate | |
JP2004156094A (en) | SURFACE TREATING AGENT AND METHOD FOR Sn OR Sn ALLOY |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20061005 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20091126 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100125 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100408 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100420 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4502430 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130430 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130430 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140430 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
LAPS | Cancellation because of no payment of annual fees |