JP4501519B2 - Manufacturing method of metal partition for PDP - Google Patents

Manufacturing method of metal partition for PDP Download PDF

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JP4501519B2
JP4501519B2 JP2004127888A JP2004127888A JP4501519B2 JP 4501519 B2 JP4501519 B2 JP 4501519B2 JP 2004127888 A JP2004127888 A JP 2004127888A JP 2004127888 A JP2004127888 A JP 2004127888A JP 4501519 B2 JP4501519 B2 JP 4501519B2
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metal
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pdp
polysilazane
etching
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祐介 小野田
龍二 上田
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Toppan Inc
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Description

本発明は、ウエットエッチング法を用いて、金属平板に貫通孔またはハーフエッチングの凹凸を形成するエッチング製品およびその製造方法に関する。特に、PDPやFEDなどフラットパネルディスプレイ、半導体パッケージ用部材などに用いるエッチング製品に関するものである。   The present invention relates to an etching product for forming through holes or half-etched irregularities on a metal flat plate using a wet etching method, and a method for manufacturing the same. In particular, the present invention relates to etching products used for flat panel displays such as PDP and FED, semiconductor package members, and the like.

画像表示装置に使用される隔壁、半導体パッケージ用部材等の電子部材の材料として金属を使用する事が検討されている。   The use of metals as materials for electronic members such as partition walls and semiconductor package members used in image display devices has been studied.

金属製部材は、ウエットエッチングによって大面積を一括に微細加工でき、放熱性が良いので冷却作用を持つ利点がある。   A metal member has the advantage of having a cooling action because it can finely process a large area at once by wet etching and has good heat dissipation.

一方、金属製部材は、他の種類の材料と接触、接着したときに熱膨張の差が問題になるが、金属の場合は、合金の組成の変化で熱膨張率を調整する事ができることに加えて、電子部材として使用する際には、電磁波や電気的ノイズのシールドとしての役割をも果たすことができる。   On the other hand, the difference in thermal expansion of metal members comes into contact with other types of materials when bonded, but in the case of metals, the coefficient of thermal expansion can be adjusted by changing the composition of the alloy. In addition, when used as an electronic member, it can also serve as a shield for electromagnetic waves and electrical noise.

金属製製品としては、例えば、メタルコアリブおよびその製造方法の用途として、PDPの金属隔壁が提案されている(特許文献1参照)。   As a metal product, for example, a metal partition of a PDP has been proposed for use as a metal core rib and a manufacturing method thereof (see Patent Document 1).

これまでPDP背面板材料として、ガラス基板を使用し、サンドブラスト法により製造するのが一般的であった。金属基板にウエットエッチングで隔壁を微細加工し、絶縁処理を施したリブ形状を形成する方法が一般的である。特許文献1では、電着法によってガラスを含む誘電体を形成する絶縁処理方法が開示されている。   Up to now, it has been common to use a glass substrate as a PDP back plate material and to manufacture by a sandblast method. In general, a method of forming a rib shape by finely processing a partition wall by wet etching on a metal substrate and performing an insulation treatment is performed. Patent Document 1 discloses an insulation processing method for forming a dielectric containing glass by an electrodeposition method.

特許文献1以外に、例えば、スプレー法、電着法によって絶縁処理を施すもの(特許文献2参照)、気相成長法を利用して基板表面に酸化物を形成する絶縁処理方法(特許文献3参照)、大気開放CVDを用いる方法(特許文献4参照)、粉体静電塗装によるガラスの成膜方法(特許文献5参照)が開示されている。   In addition to Patent Document 1, for example, an insulating process is performed by a spray method or an electrodeposition method (see Patent Document 2), and an insulating process method for forming an oxide on a substrate surface using a vapor deposition method (Patent Document 3) Reference), a method using atmospheric open CVD (see Patent Document 4), and a glass film forming method by electrostatic powder coating (see Patent Document 5).

しかしながら、特許文献1および2に記載された方法では、気泡が絶縁層中に残存する事や、焼成時のフローでエッチングで形成されたコーナー部の膜厚が薄くなるため、絶縁性にばらつきが生じてしまう。このため、絶縁性を保つためには、膜を全体的に厚くしなければならない。その結果エッチングで高精細な加工をしても結果的に開口部が狭くなってしまい、ディスプレイにおいては輝度の低下や、更なる高精細なパターンであった場合は絶縁物で孔が埋まってしまう事もある。   However, in the methods described in Patent Documents 1 and 2, bubbles remain in the insulating layer, and the film thickness of the corner portion formed by etching in the flow at the time of firing becomes thin, so the insulation varies. It will occur. For this reason, in order to maintain insulation, the film must be thickened as a whole. As a result, even if high-definition processing is performed by etching, the opening becomes narrow as a result, and in the case of a display, the brightness is reduced, or if the pattern is further high-definition, the hole is filled with an insulator. There is also a thing.

また、特許文献3に記載された気相成長法では、成膜速度が遅いため十分な絶縁耐圧を得るためには、生産性が悪い事などの問題がある。特許文献4に記載された大気開放CVDは通常の気相成長法とは違い、減圧プロセスがないため材料の搬入、搬出が容易で連続生産可能、大型サイズへの展開もできるが、成膜時に基板に高熱を加えるため基板表面に酸化による黒色化が起こりディスプレイとしたときに発光した光が吸収されてしまい輝度の低下につながる。   Further, the vapor phase growth method described in Patent Document 3 has problems such as poor productivity in order to obtain a sufficient withstand voltage because the film formation rate is low. Unlike the ordinary vapor phase growth method, open-air CVD described in Patent Document 4 is easy to carry in and out of materials because of no decompression process, can be continuously produced, and can be expanded to large sizes. Since high heat is applied to the substrate, blackening due to oxidation occurs on the substrate surface, and light emitted when the display is formed is absorbed, leading to a decrease in luminance.

さらに、特許文献5に記載された粉体静電塗装によるガラスの成膜では、焼成時に溶融して膜は緻密化するが、表面張力で凝集しコーナー部の膜が薄くなり耐電圧特性が十分でなくなってしまう。また、焼成時に金属板表面が酸化し、膜との密着性が得られないといった問題がある。したがって、PDPの金属隔壁についての絶縁膜技術としては製品化に至っていない。
特開2003−205738号公報 特開2000−277021号公報 特開2004−002204号公報 特開2003−132802号公報 特開2001−195978号公報
Furthermore, in the glass film formation by powder electrostatic coating described in Patent Document 5, the film melts at the time of firing, and the film becomes dense, but the film is agglomerated by the surface tension and the corner film becomes thin, so that the withstand voltage characteristic is sufficient. It will disappear. In addition, there is a problem that the surface of the metal plate is oxidized during firing, and adhesion with the film cannot be obtained. Therefore, it has not yet been commercialized as an insulating film technology for the metal partition walls of PDP.
JP 2003-205738 A JP 2000-277021 A JP 2004-002204 A Japanese Patent Laid-Open No. 2003-132802 JP 2001-195978 A

本発明は上記問題を解決するために考案されたものであり、絶縁信頼性が高く、容易な生産方法で安価な絶縁特性を有する金属エッチング製品を提供する事、また、絶縁性が良好なエッチング製品を得るための有効な製造方法を提供する事を目的とする。   The present invention has been devised to solve the above-mentioned problems, and provides a metal etching product having high insulation reliability, an inexpensive production characteristic with an easy production method, and etching with good insulation. The object is to provide an effective manufacturing method for obtaining products.

請求項1に記載の発明は、PDP用金属隔壁の製造方法であって、Fe−Ni合金あるいはFe−Ni−Cr合金のいずれかからなる金属平板にウエットエッチングによる微細加工をしハーフエッチング面を有した凹凸形状の加工部を形成し、前記加工部を含む片面にポリシラザンのジブチルエーテル溶液を静電塗装法により塗布、乾燥後、300℃から500℃の温度で大気焼成して厚みが1μmより大きく3μm未満の絶縁層を形成することを特徴とするPDP用金属隔壁の製造方法である。
The invention according to claim 1 is a method of manufacturing a metal partition wall for PDP, wherein a metal flat plate made of either Fe-Ni alloy or Fe-Ni-Cr alloy is finely processed by wet etching to form a half-etched surface. A processed portion having an uneven shape is formed, and a dibutyl ether solution of polysilazane is applied to one side including the processed portion by an electrostatic coating method, dried, and then fired in the air at a temperature of 300 ° C. to 500 ° C. to have a thickness of 1 μm A method of manufacturing a metal partition wall for PDP, wherein an insulating layer having a large size of less than 3 μm is formed .

本発明によれば、金属エッチング製品に、高性能で優れた絶縁特性を示す絶縁層を有する金属製品提供でき、また、容易で、生産性の高い絶縁処理プロセスを提供する事ができた。   According to the present invention, it is possible to provide a metal product having an insulating layer exhibiting high performance and excellent insulating properties as a metal etching product, and to provide an easy and highly productive insulation treatment process.

本発明は、金属基板の、エッチング処理により形成された加工部を含む片面、または両面をポリシラザンを成膜した絶縁層を形成したエッチング製品である。   The present invention is an etching product in which an insulating layer in which polysilazane is formed on one side or both sides of a metal substrate including a processed portion formed by an etching process is formed.

ここで、本発明で用いるポリシラザンは、Si−N結合を持つシラザンを基本とする有機溶媒に可溶な無機ポリマーで、このポリマーの有機溶媒溶液を塗布液として用い、大気中、または水蒸気含有雰囲気中で焼成することにより、水分や水と反応し、非結晶である緻密な高純度シリカ層が得られるものである。
このポリシラザン、その成膜工程には以下の特長がある。
(1)表面に塗布し、300℃から500℃の温度で焼成することで非結晶である緻密な高純度シリカが得られる。
(2)ポリシラザンは炭素を含有していないため、金属材料との密着性が良く、熱分解中に膜の収縮や残留炭素の問題がなくクラックが発生しにくい。
(3)同上の理由で特殊な装置、成膜条件を必要としない。
(4)塗布し、大気焼成が可能なため連続生産ができる。
(5)塗布し基板表面がコートされた常態で焼成するため、金属板表面の酸化の問題がない。
(6)鉛などの環境を害する物質を使用しない。
Here, the polysilazane used in the present invention is an inorganic polymer that is soluble in an organic solvent based on silazane having a Si-N bond, and an organic solvent solution of this polymer is used as a coating solution in the atmosphere or in a steam-containing atmosphere. By firing in, a dense high-purity silica layer that is amorphous and reacts with moisture and water can be obtained.
This polysilazane and its film forming process have the following features.
(1) It is applied to the surface and baked at a temperature of 300 ° C. to 500 ° C. to obtain dense high-purity silica that is amorphous.
(2) Since polysilazane does not contain carbon, it has good adhesion to metal materials, and there is no problem of film shrinkage or residual carbon during thermal decomposition, and cracks are unlikely to occur.
(3) No special equipment or film forming conditions are required for the same reason.
(4) Since it can be applied and fired in the atmosphere, continuous production is possible.
(5) Since it is applied and fired in a normal state where the substrate surface is coated, there is no problem of oxidation of the metal plate surface.
(6) Do not use environmentally harmful substances such as lead.

以上のような特長があるため、本発明のポリシラザンを使用した絶縁膜の製造法では、従来の方法で製造した膜よりも金属との密着性が良く、高い膜質であり十分な絶縁耐圧特性を示すものである。   Because of the above features, the method for producing an insulating film using the polysilazane of the present invention has better adhesion to metal than a film produced by a conventional method, high film quality, and sufficient withstand voltage characteristics. It is shown.

また、絶縁層を形成する装置自体を比較的簡単な構造とする事ができ、設備費も小さく、大型の処理材にも対応させる事ができる。従って本発明は、大型パネルを対象としているPDPやFEDの絶縁層形成への適用に特に有効である。   In addition, the device itself for forming the insulating layer can have a relatively simple structure, the equipment cost is small, and it can be used for large processing materials. Therefore, the present invention is particularly effective for application to the formation of insulating layers of PDPs and FEDs intended for large panels.

本発明のポリシラザンを使用した絶縁層の形成方法では、絶縁層の膜厚を任意の厚みに緻密に形成する事ができ、形成にかかる時間を以前の方法と比較して短縮する事ができる。   In the method for forming an insulating layer using the polysilazane of the present invention, the thickness of the insulating layer can be densely formed to an arbitrary thickness, and the time required for the formation can be shortened as compared with the previous method.

また、絶縁層の厚みは、厚みが0.5μm未満では十分な絶縁性を得られない場合もあり、反対に、膜厚が5μmを超えると金属基板との熱膨張差により絶縁層にクラックが発生する恐れがある。従って、0.5μm〜5μmの範囲が好ましく、更には1μm〜3μmの範囲が好ましい。   In addition, if the thickness of the insulating layer is less than 0.5 μm, sufficient insulation may not be obtained. On the contrary, if the thickness exceeds 5 μm, cracks are generated in the insulating layer due to a difference in thermal expansion from the metal substrate. May occur. Therefore, the range of 0.5 μm to 5 μm is preferable, and the range of 1 μm to 3 μm is more preferable.

本発明の絶縁層に用いるポリシラザンは、(SiH2−NH)を基本とする無機ポリマーで、分子量が600から1000の範囲である事が好ましい。前記ポリシラザンのSiO2は、(SiH2−NH)n中に炭素を含有していないため、金属材料との密着性も良く緻密であり、ゾルゲル法のように熱分解中に膜の収縮や残留酸素の問題がないため、焼成されたSiO2膜中にクラックが入ったりしない。 The polysilazane used in the insulating layer of the present invention is an inorganic polymer based on (SiH 2 —NH) n and preferably has a molecular weight in the range of 600 to 1,000. Since the SiO 2 of the polysilazane does not contain carbon in (SiH 2 —NH) n, the adhesion with the metal material is good and dense, and the film shrinks or remains during thermal decomposition as in the sol-gel method. Since there is no problem of oxygen, cracks do not occur in the fired SiO 2 film.

また、膜厚は、塗布方法によってもコントロールできるが、分子量の増減、溶媒の割合を変化させてコントロールする事ができる。特に、フォトエッチングにより金属材料に微細な加工をし、表面に凹凸面がある本発明のような構造には、有効な材料である。   The film thickness can also be controlled by the coating method, but can be controlled by increasing or decreasing the molecular weight and changing the ratio of the solvent. In particular, it is an effective material for a structure such as the present invention in which fine processing is performed on a metal material by photoetching and the surface has an uneven surface.

本発明の製品に使用する、金属材料にはFe-Ni合金、Fe-Ni-Cr合金を使用するのが好ましい。   It is preferable to use an Fe—Ni alloy or an Fe—Ni—Cr alloy as the metal material used in the product of the present invention.

例えばこのエッチング製品をPDPの金属隔壁として使用する場合、パネルの組立工程で450〜500℃の熱サイクルを受けるため、熱膨張差が大きい場合、熱応力が発生し、パネルが破損して画像表示装置として機能できなくなる。それを防ぐためには、隔壁は前面板および背面板と熱膨張係数を近似させる事が好ましい。   For example, when this etched product is used as a metal partition for a PDP, it undergoes a thermal cycle of 450 to 500 ° C. in the panel assembly process, so if the thermal expansion difference is large, thermal stress is generated and the panel is damaged, resulting in image display. Can no longer function as a device. In order to prevent this, it is preferable that the partition walls have a thermal expansion coefficient similar to that of the front plate and the rear plate.

現状では、例えばPDPの前面板・背面板として使用されているガラスは熱膨張係数が8×10-6/℃程度のソーダライムガラスや高歪点ガラスが用いられている。このため、金属隔壁用基板には、Niを質量%で40〜52%の範囲で含み、残部が実質的にFeからなるFe-Ni系合金を用いると良く、このうちNiが質量%で46%〜50%の範囲であるFe-Ni系合金が特に好ましい。   At present, for example, soda lime glass or high strain point glass having a thermal expansion coefficient of about 8 × 10 −6 / ° C. is used for the glass used as the front plate and the back plate of PDP. For this reason, it is preferable to use a Fe—Ni-based alloy containing Ni in the range of 40 to 52% by mass and the balance being substantially Fe, in which Ni is 46% by mass. Particularly preferred is an Fe—Ni alloy in the range of from 50% to 50%.

これらのFe-Ni系合金は、熱膨張係数を上記ガラスに近似させる事ができ、且つエッチング法により微細なパターンを容易に形成できるため、金属隔壁用基板に適している。   These Fe—Ni-based alloys can be made to have a thermal expansion coefficient close to that of the glass and can easily form a fine pattern by an etching method, and thus are suitable for a metal partition wall substrate.

また、半導体パッケージなどの部材として使用する場合は金属材料をシリコン基板の熱膨張率と合わせ使用する。   Further, when used as a member such as a semiconductor package, a metal material is used in combination with the thermal expansion coefficient of the silicon substrate.

次に、金属エッチング製品の製造方法を説明する。   Next, the manufacturing method of a metal etching product is demonstrated.

まず、金属平板表面の片面または両面に感光性レジストを塗布し、エッチングによって孔形状を形成させたい所望の箇所を開口させるようパターニングする。そして、塩化第二鉄液等のエッチング液をスプレーする事により、レジストが開口している部分をエッチングし、金属平板にハーフエッチング形状または貫通孔の加工部を有する形状を形成させる。   First, a photosensitive resist is applied to one or both surfaces of a metal flat plate surface, and patterning is performed so as to open a desired portion where a hole shape is to be formed by etching. Then, by spraying an etching solution such as ferric chloride solution, the portion where the resist is opened is etched to form a half-etched shape or a shape having a processed portion of a through hole on the metal flat plate.

その後使用したレジストを剥離し、脱脂、水洗処理を行った後、ディッピング法、スプレー法、静電塗装法などで、ポリシラザンを塗布する。ここで、溶媒にはキシレン、ターペン、ソルベッソ、ジブチルエーテルのいずれか、またはこれらの混合溶媒を用いる。   Thereafter, the resist used is peeled off, degreased and washed with water, and then polysilazane is applied by dipping, spraying, electrostatic coating or the like. Here, any one of xylene, terpene, solvesso, dibutyl ether, or a mixed solvent thereof is used as the solvent.

前記塗布するポリシラザン溶液は、ポリシラザン(SiH2−NH)nを、0.5重量%から40重量%の濃度に溶解させて使用する。塗布方法は、スプレー法、ディッピング法などでも溶解させる溶媒の割合や分子量を変化させる事によって塗布する事が可能であるが、エッチングによって形成された形状の凹凸の深さ方向が深いときは、静電塗装を行う方ががまわりこみもよく均一に塗布する事ができる。 The polysilazane solution to be applied is used by dissolving polysilazane (SiH 2 —NH) n to a concentration of 0.5 wt% to 40 wt%. The coating method can be applied by changing the ratio of the solvent to be dissolved and the molecular weight by the spray method, dipping method, etc., but if the depth direction of the unevenness formed by etching is deep, Electrocoating can be applied evenly with better coverage.

そして、ポリシラザンポリシラザン溶液が塗布された後、乾燥、大気中または水蒸気を含有する雰囲気中で焼成し、金属基板上にSiO2膜を形成する。SiO2への反応は、300℃から500℃で進行するが、膜を緻密にするには400℃以上の高温が好ましい。 Then, after the polysilazane / polysilazane solution is applied, it is dried, fired in the atmosphere or in an atmosphere containing water vapor, and an SiO2 film is formed on the metal substrate. The reaction to SiO 2 proceeds at 300 ° C. to 500 ° C., but a high temperature of 400 ° C. or higher is preferable to make the film dense.

なお、ポリシラザンを大気中で焼成してSiO2を得る反応は次式で示される。 Incidentally, the reaction to obtain a SiO 2 polysilazane was fired in air is expressed by the following equation.

(SiH2−NH)+O2→SiO2+NH3 (SiH 2 -NH) + O 2 → SiO 2 + NH 3

以下、本発明の実施例1を説明する。   Embodiment 1 of the present invention will be described below.

厚み300μmのFe-50Ni合金からなる金属平板をアルカリ脱脂し、膜厚20μmの市販のドライフイルムレジストを前記金属平板表面に貼り合わせた。   A metal flat plate made of Fe-50Ni alloy having a thickness of 300 μm was alkali degreased, and a commercially available dry film resist having a thickness of 20 μm was bonded to the surface of the metal flat plate.

次いで、ピッチ270×810μmで、100×640μmが開孔しているスロットパターンのフォトマスクで露光し、アルカリ水溶液のスプレー現像で、前記金属平板に、フォトマスクと同寸法のフォトレジストパターンを形成した。   Next, exposure was performed with a slot pattern photomask having a pitch of 270 × 810 μm and 100 × 640 μm holes, and a photoresist pattern having the same dimensions as the photomask was formed on the metal flat plate by spray development of an alkaline aqueous solution. .

エッチングは、塩化第二鉄エッチング液でスプレーエッチングし、ドライフイルムレジストを残したハーフエッチング金属平板を作製した。次に、苛性ソーダ水溶液をスプレーしてフォトレジストを剥膜し、PDP用金属隔壁のリブ形状が作製できた。   Etching was spray-etched with a ferric chloride etchant to produce a half-etched metal flat plate leaving a dry film resist. Next, an aqueous solution of caustic soda was sprayed to remove the photoresist, and the rib shape of the metal partition wall for PDP could be produced.

この金属平板を再びアルカリ脱脂し、水洗後ポリシラザン溶液を塗布する。このポリシラザン溶液は、ポリシラザンをキシレンに溶解させ、38重量%の割合に調整した。   The metal plate is again degreased with alkali, washed with water, and coated with a polysilazane solution. This polysilazane solution was prepared by dissolving polysilazane in xylene to a ratio of 38% by weight.

塗布方法は、スプレー法を使用し、面内均一に、溶媒揮発前の膜厚が10μmになるように塗布した。その後、大気中で溶剤が十分揮発するまで乾燥させ、450℃で60分大気焼成を行い絶縁層を形成し、上記したPDP用金属隔壁のリブ形状に絶縁層を形成させる事ができた。   As a coating method, a spray method was used, and the coating was applied uniformly in the plane so that the film thickness before solvent evaporation was 10 μm. Then, it was dried until the solvent was sufficiently volatilized in the atmosphere, and was fired in the atmosphere at 450 ° C. for 60 minutes to form an insulating layer, and the insulating layer could be formed in the above-described rib shape of the metal partition for PDP.

この絶縁処理を施したPDP用金属隔壁をスロットの長手方向と垂直に切断し断面を観察すると、図1の様な形状となり、孔形状の側壁では1.5μm、隔壁のトップ平坦部では2.6μmの膜が形成されている事が確認できた。絶縁抵抗計で金属隔壁で孔のない平坦部の絶縁抵抗を測定したところ、体積低効率は9.02×108Ω・cm、面積低効率は5.48×1010Ω/mとなり、ともに絶縁物としての特性を示した。 When the insulating metal partition wall for PDP is cut perpendicularly to the longitudinal direction of the slot and the cross section is observed, the shape is as shown in FIG. 1. The hole-shaped side wall is 1.5 μm, and the top flat portion of the partition wall is 2. It was confirmed that a 6 μm film was formed. When the insulation resistance of a flat part without a hole was measured with a metal barrier, the volume low efficiency was 9.02 × 10 8 Ω · cm, and the area low efficiency was 5.48 × 10 10 Ω / m 2 . The characteristics were shown.

以下、本発明の実施例2を説明する。   Embodiment 2 of the present invention will be described below.

厚み50μmのFe-42Ni合金からなる金属平板をアルカリ脱脂し、膜厚20μmの市販のドライフイルムレジストを基板表面に貼り合わせた。次いで、ピッチ140×140μmで、直径36μmが開孔している円形パターンのフォトマスクで、表裏面の位置あわせをを行い、表裏面を露光し、アルカリ水溶液のスプレー現像で、フォトマスクと同寸法のフォトレジストパターンを形成した。   A metal flat plate made of an Fe-42Ni alloy having a thickness of 50 μm was alkali degreased, and a commercially available dry film resist having a thickness of 20 μm was bonded to the substrate surface. Next, with a photomask having a circular pattern with a pitch of 140 × 140 μm and a diameter of 36 μm, the front and back surfaces are aligned, the front and back surfaces are exposed, and the same size as the photomask is obtained by spray development of an alkaline aqueous solution The photoresist pattern was formed.

次いで、エッチングは、塩化第二鉄エッチング液で、表裏面スプレーエッチングし、ドライフイルムレジストを残したハーフエッチング金属平板を作製した。次にドライフィルムを剥離後、ポジ型電着フォトレジスト(商品名 ゾンネEDUV P-500関西ペイント製)をハーフエッチング金属平板上に均一な膜厚でコーティングした。そして、ポジ用フォトマスクの位置合わせを行い、さらに露光し、炭酸ソーダ水溶液でスプレー現像し、ポジ型電着フォトレジストパターニングを形成した。最後に、二回目のエッチング工程として、塩化第二鉄エッチング液で、表裏面をスプレーエッチングし、苛性ソーダ水溶液をスプレーしてフォトレジストを剥膜し、板厚50μmで、円形パターン部分が50μmで、ピッチ140×140μmである円形パターンの貫通孔を有する金属エッチング製品が製造できた。   Next, etching was carried out with a ferric chloride etchant to perform front and back surface spray etching to produce a half-etched metal flat plate leaving a dry film resist. Next, after peeling off the dry film, a positive electrodeposition photoresist (trade name: Sonne EDUV P-500 manufactured by Kansai Paint) was coated on a half-etched metal flat plate with a uniform film thickness. Then, the positive photomask was aligned, further exposed, and spray-developed with a sodium carbonate aqueous solution to form a positive electrodeposition photoresist patterning. Finally, as the second etching step, the front and back surfaces are spray-etched with a ferric chloride etchant, the aqueous solution of caustic soda is sprayed to remove the photoresist, the plate thickness is 50 μm, and the circular pattern portion is 50 μm. A metal etched product having a circular pattern of through holes with a pitch of 140 × 140 μm could be produced.

この金属平板を再びアルカリ脱脂し、水洗後ポリシラザン溶液を塗布する。ポリシラザンはキシレンに溶解させ、30重量%の割合に調整した。塗布は、スプレー法を使用し、面内均一に、溶媒揮発前の膜厚が8μmになるように塗布した。   The metal plate is again degreased with alkali, washed with water, and coated with a polysilazane solution. Polysilazane was dissolved in xylene and adjusted to a ratio of 30% by weight. The application was performed using a spray method so that the film thickness was uniformly 8 μm before solvent evaporation.

その後、大気中で溶剤が十分揮発するまで乾燥させ、450℃で60分大気焼成を行い絶縁層を形成した。上記した円形パターンの貫通孔を有する金属エッチング製品に絶縁層を形成させる事ができた。   Then, it was dried until the solvent was sufficiently volatilized in the atmosphere, and was fired in the atmosphere at 450 ° C. for 60 minutes to form an insulating layer. An insulating layer could be formed on the metal etching product having the circular pattern through-holes described above.

この絶縁処理を施した金属エッチング製品の断面を観察すると、図2のような形状となり、孔形状の側壁では1.2μm、孔形状のない平坦部では2.2μmの膜が形成されている事が確認できた。絶縁抵抗計で孔形状のない平坦部の絶縁抵抗を測定したところ、体積低効率は2.71×108Ω・cm、面積低効率は4.75×1010Ω/mとなり、ともに絶縁物としての特性を示した。 When the cross section of the metal etched product subjected to the insulation treatment is observed, a shape as shown in FIG. 2 is formed, and a 1.2 μm film is formed on the hole-shaped side wall and a 2.2 μm film is formed on the flat portion without the hole shape. Was confirmed. When the insulation resistance of a flat part without a hole shape was measured with an insulation resistance meter, the volume low efficiency was 2.71 × 10 8 Ω · cm, and the area low efficiency was 4.75 × 10 10 Ω / m 2 . showed that.

本発明の一実施例を示す断面図。Sectional drawing which shows one Example of this invention. 本発明他の実施例を示す断面図。Sectional drawing which shows the other Example of this invention.

符号の説明Explanation of symbols

101、201・・・金属平板
102、202・・・絶縁層
103、203・・・側壁
104、204・・・平坦部
101, 201 ... Metal flat plate 102, 202 ... Insulating layer 103, 203 ... Side wall 104, 204 ... Flat part

Claims (1)

PDP用金属隔壁の製造方法であって、Fe−Ni合金あるいはFe−Ni−Cr合金のいずれかからなる金属平板にウエットエッチングによる微細加工をしハーフエッチング面を有した凹凸形状の加工部を形成し、前記加工部を含む片面にポリシラザンのジブチルエーテル溶液静電塗装法により塗布、乾燥後、300℃から500℃の温度で大気焼成して厚みが1μmより大きく3μm未満の絶縁層を形成することを特徴とするPDP用金属隔壁の製造方法。
A method for manufacturing a metal partition wall for PDP, wherein a metal flat plate made of either an Fe-Ni alloy or an Fe-Ni-Cr alloy is finely processed by wet etching to form an uneven-shaped processed portion having a half-etched surface Then, a dibutyl ether solution of polysilazane is applied to one side including the processed part by an electrostatic coating method , dried, and then air-fired at a temperature of 300 ° C. to 500 ° C. to form an insulating layer having a thickness of more than 1 μm and less than 3 μm. A method for producing a metal partition for a PDP.
JP2004127888A 2004-04-23 2004-04-23 Manufacturing method of metal partition for PDP Expired - Fee Related JP4501519B2 (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5881995A (en) * 1981-11-09 1983-05-17 Mitsui Toatsu Chem Inc Formation of metal oxide film
JPH05151829A (en) * 1991-05-15 1993-06-18 Sumitomo Electric Ind Ltd Coating film member made of mineral material
JPH072511A (en) * 1993-02-05 1995-01-06 Dow Corning Corp Method for accumulation of silica coating from polysilazane
JPH09148696A (en) * 1995-11-16 1997-06-06 Gunze Ltd Board for printed wiring
JP2003073778A (en) * 2001-08-27 2003-03-12 Hitachi Metals Ltd Metal partitioning material for image display unit and metal partition for image display unit using the same
JP2004087624A (en) * 2002-08-23 2004-03-18 Ngk Spark Plug Co Ltd Process for manufacturing multilayer wiring board

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5881995A (en) * 1981-11-09 1983-05-17 Mitsui Toatsu Chem Inc Formation of metal oxide film
JPH05151829A (en) * 1991-05-15 1993-06-18 Sumitomo Electric Ind Ltd Coating film member made of mineral material
JPH072511A (en) * 1993-02-05 1995-01-06 Dow Corning Corp Method for accumulation of silica coating from polysilazane
JPH09148696A (en) * 1995-11-16 1997-06-06 Gunze Ltd Board for printed wiring
JP2003073778A (en) * 2001-08-27 2003-03-12 Hitachi Metals Ltd Metal partitioning material for image display unit and metal partition for image display unit using the same
JP2004087624A (en) * 2002-08-23 2004-03-18 Ngk Spark Plug Co Ltd Process for manufacturing multilayer wiring board

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